MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and...

22
A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen 1,* , J. Hallmann 1 , T. Roth 1 , G. Ansaldi 1 , W. Lu 1,2 1 European XFEL 2 Technische Universität Berlin * [email protected] XFEL User Meeting 2014

Transcript of MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and...

Page 1: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

MID: Materials Imaging and

Dynamics Instrument

A. Madsen1,*, J. Hallmann1, T. Roth1, G. Ansaldi1, W. Lu1,2 1 European XFEL

2 Technische Universität Berlin

* [email protected]

XFEL User Meeting 2014

Page 2: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

MID Keywords 2

Scattering and imaging with hard X-rays

Micro- and nano focused beams

Windowless operation

Use of a maximum number of pulses

Versatile experimental chamber and sample environment

Optical pump laser

Ultrafast science & X-ray split-delay techniques

Coherence & speckle

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A. Madsen, XFEL.EU

Facility Outline 3

MID @ SASE-2

Page 4: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

MID beamline overview 4

CR

L-1

CR

L-2

un

du

lator

mo

no

-1: Si(1

11

)

mo

no

-2

Si(22

0)

X-ray sp

lit- d

elay line

samp

le

detecto

r

93

1 m

92

9 m

0 m

29

0 m

22

9 m

94

6.5

m

96

7 m

95

0 m

95

9 m

ho

rizon

tal o

ffset mirro

r

attenu

ator

attenu

ator

attenu

ator

nan

ofo

cusin

g CR

L

mirro

r(s)

30

1 m

72

7 m

88

0 m

94

9 m

94

8 m

95

5 m

88

7.5

m

slit-1

slit-2

slit-3

21

0 m

24

4 m

40

0 m

72

9 m

88

8.5

m

92

0 m

93

6.5

m

95

7.5

m

96

9 m

22

7.5

m

94

8.5

m

2D

-imager

imager-2

imager-3

imager-4

imager-5

imager-6

diagn

ostic

end

stand

XB

PM

& in

tensity-1

XB

PM

& in

tensity-2

Not shown:

MCP at 303m (fine tuning of SASE)

Distribution mirror(s) at 390m and 395m (MID on central branch)

Beam loss monitors

λ

22

0 m

tim

e-o

f-flight P

ES

common SASE-2 beamline (MID/HED)

MID photon beamline

MID experimental hutch

MID optics hutch

93

3 m

h

igh en

ergy CR

L

high

-energy m

on

o

30

6 m

17

1 m

1

98

m

transm

issive im

ager sp

on

t. rad. ap

erture

30

5 m

im

ager-1

t

95

6 m

9

57

m

diff. p

um

pin

g tim

ing d

iagno

stic

26

4 m

sh

utter-1

shu

tter-3

shu

tter-2

95

2 m

94

0 m

λ

38

0.5

m

HR

-SSS

20

0 m

K

-mo

no

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A. Madsen, XFEL.EU

Beryllium Optics for the MID Station

Compound Refractive Lenses (CRL) in Beryllium

5

5 10 15 20 25 30500

1000

1500

2000

2500

3000

3500

Energy [keV]

m

Deff

3 x beamsize (FWHM)

effective lens diameter

and beam size

B. Lengeler, RXOPTICS, Aachen

f = R/(2Nd)

- Be is an excellent material to avoid ablation

- Beam collimation or focusing in the range from ~5 – 25 keV

- CRL efficiency below ~5 keV not good

- Chromatic focusing Sweet spots in energy

- Allows 7s (~3*FWHM) to be transported

Large radii lenses, up to R > 5mm

Page 6: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Beryllium Optics for the MID Station 6

CRL-1 transfocator CRL-2 transfocator

Allows beam sizes on sample from 5 – 200 m and 80-100% efficiency

Range from ~5 to 25 keV (sweet spots every ~500 eV)

~700 m

Page 7: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

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7 Beryllium Optics for the MID Station CRL-2

Allows beam sizes 1 – 3 m with 20-40% efficiency

Nano focus option: CRL-3 placed 50-500 mm upstream of sample

inside the sample chamber. BMBF project, C. Schroer - TU Dresden

CRL-3

Setup for MEC, LCLS

C. Schroer, D. Samberg, TU Dresden

Calculation for

f=300 mm

Efficiency ~50%

with prefocusing

~10 nm focus for

f=50 mm at 12 keV

Page 8: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Wave field Simulations: Impact of Be

imperfections and impurities 8

Acknowledgement:

L Samoylova, XFEL.EU Optics group

Laminography data,

ID19, ESRF (L. Helfen)

Be lens

model

sample

at 959 m

A B C D

CRL-1 CRL-2

-0.005

0.005

0

-0.005 0.005 0 x (mm)

-0.2 0.2 0 x (mm)

-0.2

0.2

0

-0.5 0.5 0 x (mm)

-0.5

0.5

0

y (

mm

)

-0.5 0.5 0 x (mm)

-0.5

0.5

0

y (

mm

)

before CRL-1 after CRL-1

in focus,

at sample pos. A B C

y (

mm

)

after CRL-2 D

Reconstructed planes Void volume

fraction 10-4

Poster #213 (Friday poster session)

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A. Madsen, XFEL.EU

Windowless Operation 9

XFEL.EU - ESRF collaboration

Differential pumping section

Must allow two beams to pass

with a vertical separation of ~25 mm

(from Split-Delay Line)

1e-2 mbar

sample chamber

HV side (mirrors and crystals):

1e-7 - 1e-8 mbar

Differential pumping apertures

inside made from B4C

Page 10: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Experimental Setup 10

Diagnostics

chamber

Sample

chamber Differential

pumping

AGIPD

detector

Transfer pipe to

end diagnostics

Close configuration: AGIPD 0.5 m from sample chamber center

Beam transmitted to end diagnostics via central hole and transfer pipe

XFEL.EU - ESRF collaboration

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A. Madsen, XFEL.EU

Experimental Setup 11

Hi-Res setup: AGIPD up to 8 m from sample chamber.

Telescope pipe between chamber and AGIPD. Motion concept under study

Differential

pumping

Diagnostics

chamber

Sample

chamber

Telescope

pipe to AGIPD

XFEL.EU - ESRF collaboration

Page 12: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Experimental Setup 12

17.25 m

2q up to ~60 deg in Hi-Res mode.

Diagnostics end-station (spectrum, intensity, position) and beam stop

2q

optical laser

X-rays

Page 13: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Experimental chamber 13

nano-CRL stage

sample

stage

AGIPD

Min. dist. sample-detector: ~225 mm

Qmax ~5Å-1 (l=1Å)

Page 14: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Experimental chamber 14 14

sample

stage

AGIPD

Min. dist. CRL-sample: 50 mm

Min. focal spot: ~10 nm (ideal case)

Ports for sample

delivery

Page 15: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Sample delivery 15

10 Hz sample changer/scanner for solid samples

Flexible mount (hexapod) for

user’s sample environments

Possibility to work in air

(window inserted upstream)

X-Rays

liquid jet installed in test chamber

(XFEL sample env. group)

Aerosol injector, liquid jet Furnace, cryostat

Full-field microscope:

S. Köster & T. Salditt

Univ. Göttingen (BMBF project)

Microfluidic sample delivery

Pulsed high B magnet

Page 16: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Hard X-Ray Split-Delay Line 16

Goal: To modify the time-structure of XFEL (fs-ps delays). Spatial offset (inclination)

between split beams can be introduced. New possibilities for time-resolved experiments

(PP, wave mixing, holography, speckle, dynamics,..).

Inspiration:

Hard X-ray Split Delay line at LCLS (Roseker & Grübel, DESY)

Device under construction at SACLA (Tono, Yabashi, SACLA)

Soft X-ray delay lines operating at FLASH (mirror based)

Co-linear beams Inclined beams

1m 3.3 fs

Page 17: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Hard X-Ray Split-Delay Line 17

Two images on detector:

1st beam

2nd beam

2ai sample

2nd pattern

1st pattern

Optical

laser

X-ray X-ray Optical

X-ray X-ray Optical

XOX

OXX

X-ray X-ray

XX

Dt

Beams from

split-delay line

Upwards deflecting mirror ai

Page 18: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Hard X-Ray Split-Delay Line 18

X-Rays

In-vacuum setup

High position precision and stability

Laser interferometry to control delay

Beam diagnostics

Delay given by upper branch (0 – 800 ps)

Energy tunable (5 - 10 keV)

Collaboration: S. Eisebitt, T. Noll, TU Berlin (BMBF project)

Page 19: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

SASE-2: Hutches and Infrastructure 19

Page 20: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

SASE-2: Hutches and Infrastructure 20

Work in progress…

Page 21: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

21 MID Technical Design Report (TDR)

http://www.xfel.eu/documents/technical_documents/

or

https://bib-pubdb1.desy.de/record/154260 Poster #108, Friday poster session

Page 22: MID: Materials Imaging and Dynamics Instrument · A. Madsen, XFEL.EU MID: Materials Imaging and Dynamics Instrument A. Madsen1,*, J. Hallmann 1, T. Roth , G. Ansaldi1, W. Lu1,2 1

A. Madsen, XFEL.EU

Main specs of MID (from TDR) 22

Commissioning and first user experiments in 2017!