G.M.Fihtenholt - Curs de calcul diferential si integral - vol.3
Micro Electronic Circuit Gallery (Samples) Diferential ...srv-sicard/emccompo/phd_seminar/DeA… ·...
Transcript of Micro Electronic Circuit Gallery (Samples) Diferential ...srv-sicard/emccompo/phd_seminar/DeA… ·...
EMC for Integrated Circuits in Automotive Enviroment: EMC Setups
for IC Tests
Humberto Xavier de Araújo ([email protected])
D�LPHI Automotive Systems
UNICAMP
RF Microelectronics and Antenna GroupDept. of Microwave and Optics - DMO
School of Electrical and Computer Engineering - FEECUNIVERSITY OF CAMPINAS – UNICAMP
Av. Albert Einstein - 400Campinas, State of Sao Paulo, Brazil
Advisor: Prof. Dr. Luiz Carlos Kretly ([email protected])
November 17, 2009.
Micro Electronic Circuit Gallery (Samples)
MEMS SWITCH Test Jig MLNA CascadeDiferential ring oscilator
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VCO in Quadrature Dual Gate RF Mixer OPAMP - nMOSCurrent Source
Memory Cell Voltage multiplier Tri-State-Buffer
PhD Context
� EMC and EMI analysis of automotive Integrated Circuit (GSM/GPRS/GPS Modulator, for example).
� Propose new shielding techniques for automotive Integrated Circuit.
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p g q g� Use EMC setups known in the literature for Pre Compliance as GTEM
Cell (IEC 61967-2), OATS (Open Area Test Site), Near Field Scan (IEC 61967-3/6), and 1/150 ohm (IEC 61967-4).
– Construction of a GTEM Cell (500 MHz – 18GHz).
– Construction of a Open Area Test Site.
EMC Analysis - GTEM
absorberseptumseptum
apex
apex
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21 cmdoor
30 cm 25 cm
septum
7,1 cm
1,95
cm
septum
12 cm
apex
EMC Analysis - GTEM
A B C D E F
1170 660,2 120 19,5 790 416,2
G H I J K
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G H I J K
78 13 966,5 966,5 177
AB
CD
H
IJK
EFG
39 cm
13 cm
10 cm
11,5 cm
34,5 cm
hfarhnearh1
h2
TV
EMC Analysis - OATS
Absorbers
Integrated CircuitHorn Antenna
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(-45o, 0o e 45o)
EMC Analysis - OATS 7/10
EMC Analysis – Near Field
Scan table
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Pre-amplifier
Near field probe
IC
Conclusions
� Our group is traditional on CMOS integrated circuits and RF design, with several graduates and undergraduates students. We recently initiated researches on Electromagnetic Compatibility. Unfortunately, untill the EMC Compo deadline, we do not have any expressive result, considering
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EMC Compo deadline, we do not have any expressive result, considering that our test setups were in manufacture process.
� We are using EMC setups known in the literature for Pre Compliance as GTEM Cell (IEC 61967-2), OATS (Open Area Test Site), Near Field Scan (IEC 61967-3/6), and 1/150 ohm (IEC 61967-4), with the development and building of a GTEM cell and the Open Area Test Site.
� Our target is make a roadmap of the frequencies which the IC radiates, and then, propose an adequate shielding.