Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

10

Click here to load reader

description

Instrument Usage Statistics – Electrical Lab

Transcript of Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Page 1: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Micro and Nano Characterization Facility

Girish KunteMay 28th 2014

Page 2: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Agenda

• Equipment Usage Statistics

• MNCF – User Satisfaction Survey

• MNCF - Updates

Page 3: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Instrument Usage Statistics – Electrical Lab

DC PS1 Non-office DC PS 2 Non-office DC PS 3 Non-office RF PS Non Office0

50

100

150

200

250

300

350

400

450

500

Equipment Utilization Chart

Tota

l hrs

Page 4: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Instrument Usage Statistics – Mechanical Lab

AFM - B

ruker

Non-office

AFM Bruke

r 2

Non-office

AFM Agile

nt

Non-officeUTM

Non-officeSA

M

Non-office

Opt Profilometer

Non-office0

50

100

150

200

250

300

350

400

450

500

Equipment Utilization Chart

Tota

l hrs

Page 5: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Instrument Usage Statistics – Materials Lab

SEM - E

DS

Non-office

SEM - C

L

Non-office FIB

Non-office

Zeta PALS

Non-office XPS

Non-office0

50

100

150

200

250

300

350

400

450

500 Equipment Utilization ChartTo

tal h

rs

Page 6: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Instrument Usage Statistics – Optical Lab

mRaman & PL

Non-office

Solar S

imulator

Non-officeFT

_IR

Non-office SPM

Non-office

XRD-powder/Thin Fi

lm

Non-office

XRD-four c

ircle

Non-officeUV-Vis

Non-office0

50

100

150

200

250

300

350

400

450

500

Equipment Utilization Chart

Tota

l hrs

Page 7: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

MNCF User Satisfaction Survey

• User Satisfaction Survey conducted in April• 60 responses from ~ 500 requests sent• Average score = 8.49

14

1322

54 1

10 9

8 7

6 3

Page 8: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

• Specific Recommendations:– AFM tips should be supplied by MNCF– Slot booking to be allowed only for 1 week in

advance– Extension of operation on Saturdays – especially

for SEM, etc.

MNCF User Satisfaction Survey

Page 9: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

MNCF – Updates• PPMS and MPMS at Physics Dept included in MNCF booking

system• Invoicing for both instruments to be done by MNCF

• MNCF Facelift– Vinyl flooring in corridor needs to be relaid – stains not

removable– New shoeracks to replace old ones– Painting of the Shoe-changing room – washable paint

Page 10: Micro and Nano Characterization Facility Girish Kunte May 28 th 2014.

Thank You!