Measurement Uncertainty for Single Particle Counting ... May 22-25, 2005 Measurement Uncertainty for...

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May 22-25, 2005 Measurement Uncertainty for Single Particle Counting Systems Droplet size distributions obtained using single particle counting require Reliable uniform detection of the drops for all size classes Reliable measurement of the size for each size class May 22-25, 2005 Measurement Uncertainty for Single Particle Counting Systems Categories Uncertainty from random effects (Type A) Sizing Counting/detection Uncertainty from systematic effects (Type B) Sizing Counting/detection

Transcript of Measurement Uncertainty for Single Particle Counting ... May 22-25, 2005 Measurement Uncertainty for...

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May 22-25, 2005

Measurement Uncertainty for Single Particle Counting Systems

Droplet size distributions obtained using single particle counting require

Reliable uniform detection of the drops for all size classes Reliable measurement of the size for each size class

May 22-25, 2005

Measurement Uncertainty for Single Particle Counting Systems

CategoriesUncertainty from random effects (Type A)

SizingCounting/detection

Uncertainty from systematic effects (Type B)Sizing Counting/detection

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May 22-25, 2005

Measurement Uncertainty for Single Particle Counting Systems

CategoriesUncertainty from random effects (Type A)

Sizing• Low SNR• Local light wave front distortion• Trajectory errors• Droplet shape/deformation

Counting/detection• High number density, coincidence, loss of particles• Low SNR

May 22-25, 2005

Measurement Uncertainty for Single Particle Counting Systems

CategoriesUncertainty from systematic effects (Type B)

Sizing • Faulty calibration• Faulty optical alignment• Improper instrument setup, instrument processing

parameters• Low SNR

Counting/detection• Trajectory errors• Improper detector gain, • Inadequate laser power, light beam attenuation• Improper setup, instrument parameters• Sample volume vs. size effects

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May 22-25, 2005

Basic Phase Doppler Interferometer (PDI) System

Photodetectors

Receiver LensLaser

BeamsplitterTransmitter Lens

Probe Volume

Frequency and PhaseSignal Processor

θ1

2

3FringeSpacing

Droplet

May 22-25, 2005

Various Debye Terms

i2 (Plot#1) i2 (Plot#2) i2 (Plot#3)

Sca

ttere

d In

tens

ity

Scattering Angle (Degrees)

1.0e+10

1.0e-01

1.0e+00

1.0e+01

1.0e+02

1.0e+03

1.0e+04

1.0e+05

1.0e+06

1.0e+07

1.0e+08

1.0e+09

0 10 20 30 40 50 60 70 80 90

50 µm water drop

Mie Scattering (green)

Refraction (p = 1)

Diffraction + Reflection

PDI Receiver

Various Light Scattering Orders

Separation

(Light source has a Gaussian Intensity Distribution)(Light source has a Gaussian Intensity Distribution)

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May 22-25, 2005

Phase Doppler Interferometer

Method Key CharacteristicsMeasurements are based on the wavelength of light that is known to high accuracy and does not change due to environmental conditionsSignals have a unique sinusoidal character making them easily detectable with high reliability using digital techniquesSignal characteristics allow application high level processing logic to minimize measurement uncertaintySimultaneously measures the size, velocity, and time-of-arrival of every drop and forms a direct measurement of the size distribution

May 22-25, 2005

Calibration

• Drop Diameter is determined bythe Flow Rate and the Frequency at which the Drops are Formed

• Accuracy to within 0.5% for generated drop size

• Since phase response to drop size is linear, only one or two points are needed for calibration

MONODISPERSED DROP GENERATOR

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May 22-25, 2005

Photograph of the Monodisperse Drop Stream

Expected Value based on flow rate and droplet formation frequency – 160 µm

May 22-25, 2005

Phase Doppler InterferometerCalibration and measurement validation

0.1 µm bin widths

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May 22-25, 2005

Phase Calibration

Laser diode injects identical signals to each detectorUsed to zero phase delays in the system componentsTests reliable operation of the system before acquiring dataVerifies proper setup of the system

Automated calibration Invisible to the userActivated when system setup parameters are changedEnsures reliable data acquisition for every test

May 22-25, 2005

Uncertainty for small droplet measurements due to Instrument Response Function Instrument

Potential Size ambiguity due to nonlinear response

Comparison of the Lorenz-Mie Theory and Geometrical Optics Theories

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May 22-25, 2005

Effect of Receiver f# on Phase Response

f# = 7 f# = 3.5

May 22-25, 2005

VARIATION OF THE SAMPLE VOLUME WITH DROP SIZE

LASER BEAMINTENSITY PROFILE

bo

• Causes a change in the effective sampling cross-section as a function of drop size

• Must be accurately characterized to normalize the sampling statistics

• Partially achieves desired affect of reducing sample volume size with decreasing drop size

Gaussian Beam Effect

• Complicates definition of sampling cross-sectional area

Affects size distribution, number density and fluxmeasurements

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May 22-25, 2005

INCIDENT LASER BEAMS

GENERATION OF NON-SPHERICAL DROPS

MONODISPERSED DROP GENERATOR

May 22-25, 2005

RESPONSE TO NON-SPHERICAL DROPS

MEASUREDSPHERICALDIAMETER

Radius of curvature Measured in this

plane

DEFORMED DROP

PROLATE SPHEROID

DEFORMEDDROP

OBLATE SPHEROID

MEASURED SPHERICAL DIAMETER

Radius of curvature Measured in this

plane

Probe Volume

Probe Volume

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May 22-25, 2005

Measurement Response to Deformed Drops

0.6 0.8 1.0 1.2 1.4 1.6

200

150

100

50

Diameter of Spherical Particle

TheoryData of Alexander, et al.

dmin / dmax

Dia.

May 22-25, 2005

PDI SIGNAL PROCESSING• Not all Signals are Easy to Process• Signals Produced by Small Particles and Particles Passing

Near the Edge of the Beam will Have Low SNR• Burst Detection and Signal Processing Systems Based on

SNR Are Able to Detect and Recover These Signals Using Their Unique Sinusoidal Character

• Being Able to Detect and Measure all Drops Maintains the Dynamic Range Capability

Noisy Doppler Signal:

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May 22-25, 2005

Noisy SignalsNoisy Signals

Time

Vol

tage

Filtered Signals

May 22-25, 2005

Signal Detection based on Sinusoidal Character And Signal-to-Noise Ratio (SNR) of the Signal

Advanced Signal Detection Methods• Based on the Sinusoidal character of the signal• Uses Signal Coherence and SNR for detection/rejection• Requires no adjustment• Reliably separates signal from noise• Capable of 10 million detections per second• No part of the incoming record is missed

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May 22-25, 2005

PARTICLE NUMBER DENSITY LIMITATIONS

First Two Signal Show Partial Coincidence

Non- Coincident Condition

May 22-25, 2005

Oscilloscope Trace of the Signal and Gate SignalsBeam waist Beam waist DDww = 60= 60µµm, With Splitterm, With Splitter

Time (usec)-500 -400 -300 -200 -100 0 100 200 300 400 500

Sig

nal (

Vol

ts)

-0.02

0.00

0.02

0.04

0.06

0.08Signal

Gate

From Strakey, Talley, Sankar, and Bachalo, ILASS-98

Dense spray problem:

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May 22-25, 2005

Time (usec)-500 -400 -300 -200 -100 0 100 200 300 400 500

Sig

nal (

Vol

ts)

-0.02

0.00

0.02

0.04

0.06

0.08Signal

Gate

Oscilloscope Traces of Signals and the Signal Processor Burst Detector Gate Signal

From Strakey, Talley, Sankar, and Bachalo, ILASS-98

Dense spray problem:

May 22-25, 2005

Coping with High Drop Number Density Environments

Sample Volume for 2 to 100 µm particles

D(d)

W(d)

100 µm

W(d)

D(d)

Sample Volume for0.5 to 25 µm particles

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May 22-25, 2005

Particles Have Different• Sizes• Velocities• Trajectories• Inter-Particle Arrival Times

PARTICLE NUMBER DENSITY LIMITATIONS

• Multiple Particles In Sample Volume• Multiple Particles In Sample Volume

d2

V2

d1

V1

Sample Volume

May 22-25, 2005

PARTICLE NUMBER DENSITY LIMITATIONS

• Coherent Scattering by Multiple Particles in Sample Volume• Coherent Scattering by Multiple Particles in Sample Volume

d2

V2

d1

V1

Sample Volume

Reduced Size of Sample VolumeAutomatically to Handle Dense Spray Region

Reduced Size of Sample VolumeAutomatically to Handle Dense Spray Region

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May 22-25, 2005

REFRACTED RAY

REFLECTED RAY

DROP

LASER BEAMINTENSITY PROFILE

bo

Light Scattering Trajectory Errors• Three Cases:

Γ = d/Dw<<1, drop approximately uniformly illuminatedΓ ~ 1, nonuniform illumination, Refraction ~ reflection on

certain trajectories, complex interferenceΓ > 1, scattering eithereither by refraction or reflection

REFRACTED RAY

REFLECTED RAY

DROP

LASER BEAMINTENSITY PROFILE

bo

REFRACTED RAY

REFLECTED RAYDROP

LASER BEAMINTENSITY PROFILE

bo

REFRACTED RAY

The phenomena also depends on the angle The phenomena also depends on the angle of trajectory. of trajectory.

May 22-25, 2005

D ia m e te r ( µ m )

0 1 0 2 0 3 0 4 0 5 0 6 0

Pha

se D

iffer

ence

(deg

ree)

0

2 0

4 0

6 0

8 0

1 0 0

η = 0 . 0η = − 0 . 5η = − 0 . 8η = − 1 . 0

PHASE DIAMETER CURVE FOR DIFFERENT TRAJECTORIES

Transmitter

Receiverη

1

-1

waist

Phas

e D

iffer

ence

, deg

rees

Diameter, (µm)

Undersized

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May 22-25, 2005

Diameter ( µ m)

0 20 40 60 80 100 120 140 160

Phase Difference (degree)

0

50

100

150

200

250

300

350

400

η = 0.8η = −0.8η = −1.0

PHASE DIAMETER CURVE FOR DIFFERENT TRAJECTORIES

Transmitter

Receiverη

1

-1

waist

Phas

e D

iffer

ence

, deg

rees

Diameter, µm

Undersized

Oversized

May 22-25, 2005

Scatter Plot of Light Scattering Intensity vs. Drop Diameter

D p(um )

0 50 100 150 200 250 300

Inte

nsity

(mv)

0

100

200

300

400

500

From Strakey, Talley, Sankar, and Bachalo, ILASS-98

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May 22-25, 2005

Strategies for Dealing With Dense Sprays

OpenPassage

ProbeBeams

ScatteredLight

Signal

Optical Path Shielding

From Strakey, Talley, Sankar, and Bachalo, ILASS-98

DenseSpray

May 22-25, 2005

Adequate number of samples to obtain statistical significance onthe largest drops measured

13,792 drops measured

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May 22-25, 2005

Example of the Droplet Size-Velocity Correlation for a Pressure Atomizer

Each dot represents a single drop measurement,~14,000 drops measured

Low NumberOf Samples

May 22-25, 2005

Summary and Conclusions

Single particle counting allows the direct measurement of the spray drop size distributionsPDI provides the greatest information content leading to drop size and velocity distributions, volume flux, number density, and drop dynamics informationSeveral sources of measurement uncertainty existCareful system design and complex logic has been incorporated into the instruments to minimize the measurement uncertainty