Measurement of Li thickness on Mo tiles by Rutherford Back Scattering of alpha particles

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NSTX NSTX Physics Meeting 4/18/11 1 Measurement of Li thickness on Mo tiles by Rutherford Back Scattering of alpha particles Dennis Mueller, Lane Roquemore (PPPL) Priya Raman (U of Illinois) College W&M Colorado Sch Mines Columbia U Comp-X General Atomics INL Johns Hopkins U LANL LLNL Lodestar MIT Nova Photonics New York U Old Dominion U ORNL PPPL PSI Princeton U Purdue U SNL Think Tank, Inc. UC Davis UC Irvine UCLA UCSD U Colorado U Maryland U Rochester U Washington U Wisconsin Culham Sci Ctr U St. Andrews York U Chubu U Fukui U Hiroshima U Hyogo U Kyoto U Kyushu U Kyushu Tokai U NIFS Niigata U U Tokyo JAEA Hebrew U Ioffe Inst RRC Kurchatov Inst TRINITI KBSI KAIST POSTECH ASIPP ENEA, Frascati CEA, Cadarache IPP, Jülich IPP, Garching ASCR, Czech Rep U Quebec NSTX Physics Meeting April 18, 2011 PPPL, Princeton, NJ

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College W&M Colorado Sch Mines Columbia U Comp-X General Atomics INL Johns Hopkins U LANL LLNL Lodestar MIT Nova Photonics New York U Old Dominion U ORNL PPPL PSI Princeton U Purdue U SNL Think Tank, Inc. UC Davis UC Irvine UCLA UCSD U Colorado U Maryland U Rochester - PowerPoint PPT Presentation

Transcript of Measurement of Li thickness on Mo tiles by Rutherford Back Scattering of alpha particles

Page 1: Measurement of Li thickness on Mo tiles by Rutherford Back Scattering of alpha particles

NSTX NSTX Physics Meeting 4/18/11 1

Measurement of Li thickness on Mo tiles by Rutherford Back Scattering of alpha

particles

Dennis Mueller, Lane Roquemore (PPPL)

Priya Raman (U of Illinois)

College W&MColorado Sch MinesColumbia UComp-XGeneral AtomicsINLJohns Hopkins ULANLLLNLLodestarMITNova PhotonicsNew York UOld Dominion UORNLPPPLPSIPrinceton UPurdue USNLThink Tank, Inc.UC DavisUC IrvineUCLAUCSDU ColoradoU MarylandU RochesterU WashingtonU Wisconsin

Culham Sci CtrU St. Andrews

York UChubu UFukui U

Hiroshima UHyogo UKyoto U

Kyushu UKyushu Tokai U

NIFSNiigata UU Tokyo

JAEAHebrew U

Ioffe InstRRC Kurchatov Inst

TRINITIKBSI

KAISTPOSTECH

ASIPPENEA, Frascati

CEA, CadaracheIPP, Jülich

IPP, GarchingASCR, Czech Rep

U Quebec

NSTX Physics Meeting

April 18, 2011PPPL, Princeton, NJ

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NSTX NSTX Physics Meeting 4/18/11 2

Routine in situ measurement of the thickness of coatings Mo tiles

• Use Rutherford Back Scattering of alpha particles

• Am241 source• Solid state detector• Probe inserted to 10 cm

above Mo divertor tiles

Desire measurement to be possible at least on a daily basis (few hour counting duration)

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Simulated alpha particle spectrum

•Energy spectrum of alpha particles from Am241 source scattered from 0.5 m thick C over Mo tile•SIMNRA simulation Matej Mayer, Max-Planck-Institut fu r Plasmaphysik, Garching, ̈Germany

Alphas scattered from Mo

Alphas scattered from C

High energy edge

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Estimate of count rates

• Commercially Am241 sources are available in the mCi range. – For DE ~ .3 MeV. – stopping power for 5 MeV alphas in Am is about 300 keV/mg/cm2 – 1 cm2 source with thickness of 1 mg /cm2 is about 3 mCi – 108 a/s ~ 106 a/s onto 1 cm2 at distance of 10 cm

• ds/dW = 1.296 (mb/sr)(Z1Z2/Ea)2 [sin-4(q/2)-2(M/A)2] for– Ea = 5 MeV, M = 4, A = 96, Z1 = 2, Z2 = 42, q = 160°– ds/dW = 387 mb/sr

• Stopping power for 5 MeV a in Mo is 368 keV/mg/cm2

– 100 keV in 0.27 mg/cm2 6.022e23 atoms/96g => 100 keV in 1.69e20atoms/cm2

– 387 (mb/sr)10-27(cm2/mb) 0.1sr 1.69e20 (/cm2) – 6.54e-5 fraction scattered into 0.1sr/100 keV

• Scattered a from Mo would be ~5/s in a 100 keV wide bin for a 1 cm2 detector at 10 cm in flattop.

– Modest optimization of geometry could increase rate 2-5 times without significantly affecting energy resolution (for example an annular detector)

– Counting for a hour would be enough to measure Li coating thickness of 1 to 15 m on Mo

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Requirements

• Short term: test viability– Suitable Am source– Solid state detector and multichannel analyzer (or

other data acq. System)– Vacuum chamber– Mounting hardware– Mo sample and Mo sample with thin coatings (C for

simplicity)• Implementation

– Valve on NSTX with manual probe assembly (port with access to lower divertor at proper height exists)

– Mounting hardware for source, detector and electronics

• Source is nothing special, radiation safety requirements are nothing unusual

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9. Thickness of LiO=5um

Note: peak due to scattering from O is broadened by energy loss in layer

Scattering from O

Scattering from Mo

Energy loss in LiO

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LiO on molyMax energy vs thickness plot for different angles

• Atomic ratio LI:O = 80:20

0 5 10 15 20

1500

2000

2500

3000

3500

4000

4500

Max

ene

rgy

of m

oly

edge

(keV

)

Thickness (um)

10,10,160 0,20,160 20,0,160 15,15,150(5um) 5,5,170 (5um)

LiO on moly

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LiO on MoPeak count vs thickness plot for different angles

• Atomic ratio LI:O = 80:20

0 2 4 6 8 10 12 14 16

50

100

150

200

250

300

350

Pea

k co

unts

(keV

)

Thickness(um)

10,10,1600,20,160 20,0,160 15,15,150 (5um) 5,5,170(5um)

LiO on moly

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C on MoMax moly energy vs thickness plot for different angles

0 5 10 15 201000

1500

2000

2500

3000

3500

4000

4500

M

ax e

nerg

y of

the

mol

y ed

ge (K

eV)

Thickness (um)

10,10,160 0,20,160 20,0,160

C on moly

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C on MoPeak count vs thickness plot for different angles

0 1 2 3 4 5

160

170

180

190

200

210

220

P

eak

coun

t

Thickness (um)

10,10,160 0,20,160 20,0,160

C on moly

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LiOC on MoMax moly energy vs thickness plot for different angles

• Atomic ratio LI:O:C = 90:5:5

0 5 10 15 20

2000

2500

3000

3500

4000

4500

Max

ene

rgy

of m

oly

edge

(KeV

)

Thickness (um)

10,10,160 0,20,160 20,0,160

LiOC on moly

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Could be used to measure Fe on graphite lower limit of thickness is about 1 nm

• Orient source and detector to point towards graphite• Midplane probe would need long stroke• A few times during the run• Manual probe to minimize cost and risk

Fe (0.001um)on CarbonRate in Fe peak is ~0.5 counts/hr

~5e-4 concentration of Fe in 5 m C

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Summary

• It appears feasible to measure the thickness of Li on a Mo substrate from 1 to 20 m thick (C coating up to about 10 m) – Technically since alpha particles slow down primarily on electrons, it is the

areal density of electrons that is measured• If the fraction of C or O exceeds about 10% of Li, the relative amount

of can be inferred, subject to uncertainties due do resonant nuclear reactions.

• Remains to be done:– Investigate effects of geometry– Finalize source strength and detector size/shape – Design collimator

• Port for inserting a probe holding the scattering assembly about 10 cm above the Mo tiles exists and will have a valve.

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8. Thickness of LiO = 1um

Note: peak at about 1800 keV is due to scattering from O

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33. Thickness of C=5um

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41.Thickness of LiOC = 15um

Note: Low concentration of O (5%) is barely visible at 1900 keV