LTE and LTE-A Products

A passion for performance.

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LTE TEST CHALLENGES

LTE (Long Term Evolution) has been chosen by operators globally for the next generation of

cellular technology. A number of operators and vendors have also already committed to the

next major step, LTE-Advanced. Manufacturers of LTE and LTE-Advanced infrastructure and

devices need reliable test instruments capable of addressing the challenges introduced by

this fast growing standard. Aeroflex has the solutions.

The LTE E-UTRAN places considerable demands on the architecture of UEs and eNodeBs

such as higher data rates, multi-band support, wider bandwidths, reduced latency, more

complex modulation and antenna configurations. These all need to be thoroughly tested to

deliver the quality of service customers expect. LTE-Advanced further adds to this

complexity by introducing carrier aggregation, integration of advanced antenna techniques

and downlink data rates reaching 1 Gbps in low mobility conditions. Additionally,

interoperability with legacy radio access technologies must be factored into the design to

enable a seamless user experience.

For the next generation of mobile devices to achieve the ambition of providing a mobile

broadband experience to match fixed broadband – including services such as high

definition video streaming – it is necessary to test new devices using a layer-by-layer

approach. A complete end-to-end test scenario must emulate real-world signal conditions.

Ensuring good cell-edge performance is another challenge, especially as the number of

users in the cell grows and, with it, the signal-to-noise level. To thoroughly and efficiently test

LTE devices requires comprehensive test coverage: RF, baseband and protocol. Aeroflex

addresses these challenges with a growing test portfolio that spans R&D, production and

manufacturing.

“The inherent complexities of LTE require equipment to be thoroughly tested to deliver thevalue customers expect”.

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Aeroflex delivered the world’s first LTE test mobile in 2007 and has since

established itself as a leader in LTE test with an in-depth understanding of

the LTE standards, the essential elements that define system performance,

and the key test requirements that guarantee flawless deployment. Aeroflex has also worked with major vendors to publicly

demonstrate carrier aggregation – a key feature of LTE-Advanced. Aeroflex’s complete portfolio of LTE solutions addresses

all aspects of LTE test. With test solutions ranging from R&D through to manufacturing, Aeroflex tests everything from

chipsets and handsets to base stations and end user services.

The Aeroflex TM500 is the industry’s defacto test mobile fully supporting LTE network development, verification and

optimization. It is also widely used for operator pre-commercial launch trials and benchmarking. The Aeroflex 7100 UE test

system is tested against and interoperable with the TM500 and supports the same 3GPP releases. This enables mobile

device and chipset vendors to have a high level of confidence in the successful operation of their devices on a live network.

The PXI 3000 Series Test System, already widely used for 2G and 3G handset production, extends coverage to the pro-

duction floor. The S-Series Digital Signal Generators and Vector Analyzers further complement the R&D and manufacturing

tools by providing class-leading modulation and phase noise performance with intuitive touch-screen control to enable the

most demanding LTE measurements to be made simply, quickly and accurately.

Synergies in Aeroflex’s Portfolio

Infrastructure Terminal Testing

Testing

Development Stage TM500 7100 PXI 3000 S-Series

R&D X X X X

IOT X X

Conformance X X

Production X X X

7100 Digital Radio Test Set

Covering All Phases of LTE Terminal TestingThe 7100 Digital Radio Test Set is an LTE network emulator for testing the RF, baseband, and protocol

layers of wireless devices. The 7100 is the ideal solution for RF design and verification, functional test,

integration and regression test groups. These teams benefit from the ease of use, comprehensive test

capability, speed and low cost of ownership offered by the 7100.

The 7100 simulates the E-UTRAN and EPC (Enhanced Packet Core) to provide a realistic test environ-

ment for LTE terminals. Test procedures control the characteristics of the simulated network to allow a

wide range of repeatable test scenarios to be created. An optional integrated Fading Simulator and

AWGN source is available, allowing real-world signal conditions to be created in the lab.

LTE Call Box Mode for functional and application testsAll the key measurements are provided for characterizing the performance of LTE mobile devices, both

at the radio interface and throughout the protocol stack, including the PDCP core network and IMS

layers. End-to-end performance can be accurately assessed, along with correct idle mode and

connected mode behavior with the 7100's Network Simulation mode. Call Box mode features a test

campaign manager facility, which enables test sequences to be defined and run from the 7100

touch-screen GUI.

LTE RF Parametric TestingThe 7100 provides a comprehensive set of LTE RF measurements,

performed in both signaling and non-signaling modes. The 7100 call

box provides an easy interface for measuring and monitoring RF behavior of LTE devices

while the device is interacting with the emulated network. A built-in spectrum analyzer

provides measurement tools for complex problem solving. Additionally, 3GPP 36.521-1 LTE

FDD and TDD RF test cases can be run using the test campaign manager.

Performance Tests and Data Throughput Tests Under Real-world ConditionsThe 7100 combines LTE baseband fading and AWGN to enable simulation of a wide variety

of real-world signal conditions in the lab. The innovative software-defined radio techniques

employed not only reduce the cost of adding fading to a test environment, but also allow

testing to be completed earlier in the design cycle, to reduce expensive redesigns later on

and to reduce the cost and time spent on field trials.

LTE Development Mode for Detailed Protocol Logging and AnalysisAimed at protocol stack development and integration, the 7100 Development Mode

provides advanced logging capabilities for L1, L2 and L3 protocol layers to debug and

resolve issues during development. Message filtering and search functions are provided to

facilitate navigation. Customized test scenarios using all LTE sub-layers can be easily creat-

ed with the Scenario Wizard using the simple drag-and-drop graphical interface.

Handover and Inter-RAT TestingThe 7100 Digital Radio Test Set enables emulation of Inter-Radio Access Technology (Inter-

RAT) system selection and system reselection procedures, circuit switched fall back and

handover. Inter-RAT testing can be performed between LTE and WCDMA, HSPA, 1xRTT,

eHRPD, GSM, and TD-SCDMA with a single 7100 Radio Test Set.

Service TestThe 7100 Service Mode provides support for LTE Go/No-Go call mode service testing

covering all of the required transmitter and receiver tests. This solution is integrates the

well-established Lector/Scriptor application which offers the perfect test environment for

service and reverse logistics testing of mobile devices. The 7100 provides LTE test

capabilities that, in conjunction with the Aeroflex service products 2201/4400, to provide

complete testing for all RATs supported by the modern smartphone, e.g. WCDMA, GERAN,

CDMA and TD-SCDMA

PXI 3000 Series LTE Manufacturing Test Equipment

LTE UE Manufacturing ThroughputThe PXI 3000 Series offers LTE device and component manufacturers a proven, fast and flexible

solution that addresses the challenges of LTE production testing. Aeroflex designed its LTE

manufacturing test solution to maximize the benefits the Aeroflex PXI 3000 Series delivers to leading

mobile device and chipset manufacturers worldwide.

Built upon the success and experience gained from pioneering R&D test systems from Aeroflex, the

PXI 3000 LTE measurement suite achieves similar measurement performance with the benefits of

increased speed and flexibility derived from the modular PXI platform. This enables a smooth transition

from product development to volume production for LTE manufacturers seeking to rapidly respond to

the ramp to volume in LTE devices while maintaining quality and reducing costs.

The PXI 3000 Series uses several techniques to maximize manufacturing throughput and yield in

device testing, enhancing the ability to rapidly respond to market demand.

The PXI 3000 Series LTE Test CapabilitiesLTE analysis is supported for both FDD and TDD uplink (SC-FDMA) transmissions for all bandwidths,

1.4 MHz to 20 MHz, and modulation types, QPSK, 16QAM and 64QAM. Using any combination of

Aeroflex PXI RF digitizers and signal generators enables LTE testing covering all 3GPP frequency bands.

In addition to numerical measurement results, the LTE measurement suite provides trace displays for

spectrum emission mask, CCDF, constellation plots, EVM vs. Carrier and EVM vs. Symbol.

Fully programmable software interfaces using VB, C++ or .NET enable users to easily modify and adapt

the test systems to particular requirements. Uplink and downlink LTE FDD and TDD stimulus response

measurements on components used in LTE-based products can also be performed using IQCreator®

wave generation software. IQCreator® is an additional offering with all Aeroflex PXI digital RF signal gen-

erator modules.

The modularity of the the PXI 3000 platform facilitates gradual capacity expansions as the need aris-

es. Initial systems can be deployed for single antenna devices and when production of UEs with multi-

ple transmit antennas is initiated, the system can be expanded for MIMO support with a simple

upgrade.

Parametric testing Accurate characterization of RF functionality achievinghigh first pass yield

Parallel testing Draw upon the power of multi-core processors to perform concurrent processing and data capture forsystem test

Multi-standard support Complete the entire range of tests required for LTE and legacy standards co-existing in the device to increase production throughput

Multi-Standard SupportThe consequences of the success of LTE as the point of convergence

from most legacy standards means devices will need to

simultaneously support older wireless protocols.

Devices that integrate LTE and one or more of the multiple legacy standards will inevitably

extend the time required for testing, impacting throughput. The modularity of the PXI 3000

software architecture enables testing multiple standards in a single operation, preserving

production output.

Further improvements in throughput are achieved using the same system to test

connectivity interfaces such as Bluetooth® and wireless LAN in the same test cycle. Given

current market trends, and the compatibility of LTE with legacy standards, devices will

continue to support a larger number of cellular and connectivity interfaces for some time to

come.

The increased complexity of testing brought forward by the LTE standard requires a flexible

and accurate solution capable of improving productivity. The PXI 3000 Series is ideally suit-

ed for LTE device manufacturing tests, achieving remarkable throughput improvements with-

out sacrificing accuracy and performance.

“Testing devices that integrate LTE and one or more of themultiple legacy standards can be achieved in a single operation due to the PXI 3000 software architecture.”

PXI 3000 Measurement Suites

GSM/EDGE

UMTS/HSPA+

CDMA2000/1xEVDO

WLAN 802.11a/b/g/n

WiMAX

Bluetooth

LTE FDD and TDD

ZigBee®

Generic demodulation

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S-Series Digital Signal Generators and Vector Signal Analyzers

SGD and SVA

SGD – Digital Signal GeneratorsThe SGD employs a large touch-screen user interface to provide a digital signal generator with

unparalleled ease of use. The small form-factor and light weight ensure a minimum

footprint on the bench or test system and maximum portability. The wide bandwidth IQ

modulator exhibits excellent dynamic range enabling the most demanding amplifier and receiver

selectivity measurements to be performed. The use of Aeroflex’s Fast Low Noise Synthesis (FLNS)

technology, added to the experience gained through decades of developing leading-edge signal

source products, ensures that signal purity and integrity have not been sacrificed in the quest for

speed. With a comprehensive range of features and options, the SGD meets the needs for a general

purpose signal generator while offering the high performance required of demanding, critical receiver

measurements or rapid manufacturing.

The SGD features an embedded version of IQCreator that is capable of supporting the different LTE

bandwidth settings – 1.4 MHz, 3 MHz, 5 MHz, 10 MHz and 20 MHz – in accordance with the standard.

The default full carrier allocation can be overridden by customizing the resource block to carrier level.

Parameters for the physical channels and physical signals can be configured on a frame and subframe

basis. In particular, the PDSCH channel modulation can be set to be QPSK, 16QAM or 64QAM. Further

testing flexibility is allowed by setting up different data sources to any of the uplink or downlink

channels. Choices are available for using the PRBS, all zeros, all ones, random bits, repeating patterns,

or any type of user data from a file.

Key features are:

• Wide band cover:

SGD-3 - 100 kHz to 3 GHz

SGD-6 - 100 kHz to 6 GHz

• +13 dBm output (+20 dBm option)

• 3GPP ACLR -71 dBc

• IQ modulator with 300 MHz RF bandwidth

• Up to 250 MS/s dual channel arbitrary waveform generator with

memory options up to 1 GSample

• Low SSB phase noise: –135 dBc/Hz at 1 GHz

• Fast frequency settling time: 100 μs

SVA – Vector Signal AnalyzersThe SVA converts RF signals into digital IF or I&Q sampled data,

providing vector signal analysis of RF signals with functionality and

performance required in the laboratory or the manufacturing test system. With high linearity,

low noise and excellent level accuracy, the SVA is ideally suited for the analysis of LTE and

WLAN, WMAN, WPAN, 2G, 3G, 4G cellular radio signals, as well as general purpose analog and

digitally modulated signal analysis. A spectrum analyzer mode provides the features and con-

trols you would expect from a conventional spectrum analyzer. Key features are:

• Wide band cover:

SVA-6 - 250 kHz to 6 GHz

SVA-13 - 250 kHz to 13 GHz

• Maximum instantaneous bandwidth: 90 MHz

• Digital downconverter with sample rates up to 250 MS/s

• List mode for fast frequency and level settling time: <250 μs

• Displayed Average Noise Level: typ. -148 dBm/Hz

• Spurious free dynamic range: 75 dB

• Intermodulation free dynamic range: 75 dB

• Up to 512 MByte sample memory

LTE FDD and LTE TDDSVA – LTE measurement suite options 107 and 108

The LTE TDD and FDD measurement suites provide a library of measurement functions

designed to characterize LTE TDD and FDD signals respectively in accordance with the

requirements of ETSI TS 36.521-1.(3GPP release 8.4.0).

• Power

• Transmit signal quality:

• Frequency error

• Error Vector Magnitude (EVM)

• IQ skew/gain imbalance

• Symbol clock error

• IQ-component (carrier leak)

• In-band emissions for non allocated RB

• Spectrum flatness

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• Output RF spectrum emissions:

• Occupied bandwidth

• Spectrum emission mask

• Adjacent channel leakage power ratio

• CCDF

• Fast Sequence Tuning (FST)

TM500 LTE Test Mobile

LTE Infrastructure TestingThe TM500 LTE product range is a major development by Aeroflex to support the current and future

technologies based around 3GPP’s LTE and LTE-A programs. Based upon a scalable software

defined radio platform, the TM500 Test Mobile provides a set of product options targeting devel-

opment, testing and demonstration of 3GPP LTE and LTE-A infrastructure equipment. The first LTE

TM500 product was launched in 2007 and since then the product range has expanded in order to

address all the critical aspects of the LTE network testing. Single UE, multiple UEs (targeting sched-

uler, load and capacity test) and multiple cell capabilities are now provided across the product

range. FDD and TDD 3GPP standards are fully covered, and full test coverage capabilities (from RF

to protocol) are provided. LTE-A support has recently been added, while timely 3GPP specification

tracking continues to be provided.

Support for all the 3GPP specified RF bands is provided through dedicated radio cards per band

(supporting lab and over the air operations) or multi-band radio card (covering the

frequency range 400 MHz – 4 GHz and suitable for lab operations only). The TM500 is now used

by all the major infrastructure vendors worldwide and is the leading E-UTRA base station test

equipment. With its layered operation and automation interfaces, the TM500 LTE and LTE-A can

operate within an automated or wrap-around test configuration.

LTE Layer 1 Layer 2 The TM500 LTE FDD Layer 1/Layer 2 product provides full 3GPP LTE functionality of PHY, MAC, and

RLC layers supporting 3GPP category 2, 3, 4, 5 for LTE UEs and 6 (2 layers) for LTE-A UEs. These

provide up to 4x4 DL MIMO for LTE UEs and carrier aggregation of 2 carriers (2x2 per carrier) on

LTE-A UEs with data rates up to 300 Mbps DL, 75 Mbps UL. The TM500 Single UE and Multi UE

incorporate test modes for an incremental, layered approach to development and testing of the LTE

stack. Specific test modes targeting HARQ, MAC, RLC and PDCP operation are provided. These

modes enable detailed functionality to be

tested at a modular level and, thus, very

early testing of eNode B features.

Operation of the TM500 LTE is via the

Aeroflex integrated and flexible control

and logging user interface (the TMA). The

TMA provides a set of comprehensive

control, measurement, data logging,

display, and analysis tools for use at all

layers.

The TM500 LTE can also be operated via an external automated or wrap-around test system. The

TM500 additionally supports enhanced test features, including the scripted override of

Layer1/Layer2 control information, enabling early test of closed control loops or to simulate error

or fault conditions.

Control override of DL HARQ operation

LTE Higher LayersA “single box” solution is available

for 3GPP LTE testing with Higher

Layers supporting Release 10 features. This adds full PDCP, RRC,

NAS and USIM functionality to the baseline TM500 LTE Layer

1/Layer 2 product. The full 3GPP LTE compliant stack is

embedded within the TM500 LTE platform thereby removing the

need for an external or third party Layer 3 solution, and more-

over minimizing Layer 3 latencies. The TM500 LTE simulates the

behavior of a real handset with USIM and AT command

interfaces, but with the added advantage of full control and

logging of all Layer 1, 2, and 3 operations via a single common

front end GUI for configuration. There are also test features

including scripted control of measurement reports, handover,

Self Organizing Network (SON) features such as Automatic

Neighbour Relations (ANR) and negative test scenarios. The

TM500’s modular software design also enables it to be

incorporated into automated and wrap-around test systems with

control either at PDCP level or via AT commands at NAS level.

LTE Multiple UE Solutions

Aeroflex’s TM500 product family includes multiple UE test solutions capable of functionality,

system and capacity testing whereby thousands of UEs are supported to stress test scheduling

algorithms, handover performance of eNodeBs and the network in high load conditions. The E500 is a

capacity tester capable of end-to-end testing with Evolved Packet Core and EUTRAN emulation

attributes. The multiple UE solutions can emulate ‘Real World’ scenarios from mobility to real data

applications such as HTTP, P2P, FTP and VoIP. Moreover, Aeroflex’s multiple UE solutions are

scalable to support thousands of UEs and more cells with excellent diagnostics, comprehensive

measurements with high visibility of key UE to cell KPI’s beneficial for faster troubleshooting and

network optimization.

Aeroflex’s LTE TM500 platform is designed to be future-proof and currently supports the

latest 3GPP functionality for Release 9, 10 with readiness for Release 11. Current support includes

eMBMS [enabling the broadcast] of IP based services such mobile TV and localized news, dual layer

beamforming, which enhances data throughputs, and support for higher data rates up to DL 300 Mbps

and UL 75 Mbps using 4x4 DL MIMO. Release 10 capabilities include LTE-A carrier aggregation

technology, which enables the use of additional carriers to achieve greater than 1 Gbps in the DL, and

eICIC, which is an interference management technology to enhance data throughputs. Aeroflex con-

stantly monitors 3GPP developments and closely works with its customers to aligns its roadmap in order

to develop new options, tools and test features as cellular technology advances. The TM500 LTE

provides a clear migration path through the powerful and scalable Software Defined Radio platform. This

not only supports the future LTE/LTE-A technology roadmap, but also provides value to users by

allowing the maximum re-use of hardware to support new features.

TM500 LTE higher layers

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E500 Capacity Test System

The E500 provides true end-to-end LTE load testing over an RF connection to an LTE

eNodeB (eNB). A scalable number of UEs are provided that can simulate from hundreds to

tens of thousands of active wireless subscribers per cell.

The E500 benefits from the Aeroflex RF TM500 LTE Test Mobile technology, the defacto

industry standard used by network equipment vendors for base station development. The

use of Aeroflex’s LTE RF solution provides access to the most widely deployed UE RF test

solution worldwide that reduces E500 integration time from months to days. Furthermore, it

enables E500 customers to benefit from a leading-edge 3GPP roadmap delivering critical

functionality as required to roll out LTE and LTE-A.

ApplicationsE500 can be used for:

• Base station and LTE network load test

• Base station and LTE network regression test

• Demonstrating capability and understanding the impact of new 3GPP functionality

including LTE-A

• Replicating field issues in a controlled lab environment

• LTE end-to-end quality of service measurement

• Base station scheduler testing under varying UE load conditions

• ‘Real-world’ RF channels and data testing in a lab environment

• Real LTE data bearer services such as VoIP calls, FTP data, web browsing and video

broadcasts can be verified by using sophisticated application data generation features of

the E500. This enables end-user quality of experience measurements to be made based

upon real data application traffic.

Quick Facts1. Leading 3GPP functionality from Aeroflex TM500 Test Mobile

2. Supports true LTE load testing over the RF interface in FDD and TDD environments

3. Simulates from hundreds to thousands of LTE UEs over one to multiple cells

4. Comprehensive measurements for trouble-shooting from Layer 1 to NAS

5. Mobility and traffic simulation scripting for easy simulation of thousands UEs with

different traffic and mobility scenarios.

6. Generate different traffic profiles using real data services and applications

7. Supports remote access and multiple users

8. Capable of simulating a user plane load exceeding the capacity of an eNodeB

9. Based on a high-performance hardware platform ready for 4x4 MIMO and extendable for

LTE-A

Capacity HardwareA dedicated cabinet hardware system has been designed to support capacity testing.

Two cabinet sizes are supported;

1. 29U Cabinet supports 2 or 3 cells

2. 38U Cabinet supports 6 cells

The cabinets include front panel connectors for both RF and control.

Each individual cell connection is capable of supporting the maximum cell throughput: up

to 150 Mbps for 2x2 MIMO and 300 Mbps for 4X4 MIMO. They have been designed to be

able to internally accommodate the additional hardware required to support 4X4 MIMO with

Category 5 UEs.

Existing TM500 Platform C bench top units may also be upgraded for use as part of an LTE

capacity test system, for example to provide additional cell capability to supplement an

existing Cabinet system.

Upgraded TM500 bench top units may be used to form capacity systems of up to 3 cells,

where it is important to be able to physically relocate bench top units if required (e.g. for

drive testing using Single-UE software).

All hardware remains capable of operating Aeroflex single-UE and multi-UE software using

the PC-based Aeroflex Test Mobile Application, subject to the necessary software licensing.

Please refer to the functionality matrix document for further details of the technical

capabilities of each hardware form factor and current supported usage configurations.

Aeroflex’s extensive commitment to LTE reflects the decision of both GSM/UMTS and CDMA-

based network operators worldwide to implement LTE as the mobile broadband technology of

choice for their next-generation networks.

Aeroflex has already demonstrated its ability to deliver early solutions for the design, development,

and deployment of both LTE terminals and network infrastructure with the Aeroflex 7100 and the

TM500, respectively.

At Aeroflex, we have clearly demonstrated that we have the pedigree to meet the LTE test

challenge, having already delivered a comprehensive portfolio of solutions designed to satisfy a

variety of LTE test requirements. However, our commitment does not end here. We are continuing

to futher the development of solutions covering all aspects of LTE/LTE-A test to achieve our

objective of being the most complete global supplier of LTE test equipment.

Technical ExpertiseBeing a key player in the development of testing systems for the LTE standard since its inception,

Aeroflex boasts a strong network of expert engineers with the ability to address the technical

challenges of LTE testing. Such broad resources and technical expertise are available to

customers worldwide to guarantee the test system performs at optimal levels and time-to-market

is not jeopardized.

Success Stories and Technical Expertise

“With the aggressive LTE technology demonstration and roll-outplans of both equipment suppliers and network operators, theneed for the early availability of these test systems has become paramount.”

7100 Key Features• LTE FDD and TDD signalling network emulation

• Multi-cell and Inter-RAT handover support

• Multi-functional testing for RF, performance, protocol

• 6 GHz frequency range, covering all LTE spectrum allocations and bandwidths

• Integrated protocol stack

• Comprehensive logging, control, display, and analysis tools

PXI 3000 Key Features• High speed, scalable modular architecture

• Comprehensive parametric characterization of LTE FDD and TDD signals

• Support for multi-standard tests (2G, 3G, Bluetooth and WLAN)

• Standard programmable interfaces (VB, C++ and .NET)

• Concurrent asynchronous processing with multi-core processors

• 3 GHz or 6 GHz frequency range

S-Series Key Features• IQ modulator with 300 MHz RF bandwidth

• Up to 250 MS/s dual channel arbitrary waveform generator

with memory options up to 1 GSample

• Embedded IQCreator waveform generation tool

• Fast frequency settling time: 100 μs

TM500 Key Features• 3GPP LTE FDD and TDD

• L1, L2, RRC and full system level modes

• Single UE, multi-UE and capacity test solutions

• 150 Mbps, 20 MHz, MIMO, multiple RF bands, and CPRI

• Cabled or over the air operation

• Comprehensive logging, control, display, and analysis tools

E500 Key Features• In use globally with multiple major operators and vendors

• The most realistic LTE capacity test platform available

• Easy to use, KPIs to measure network performance

• Benefits from leading edge TM500 3GPP roadmap

Summary of Key Features

Part No. 46891/580Issue 409/13

Our passion for performance is defined by three attributes represented by these three icons:

solution-minded, performance-driven and customer-focused.

w w w . a e r o f l e x . c o mi n f o - t e s t @ a e r o f l e x . c o m

As we are always seeking to improve our products, the information in this document gives only a general indication of the product capacity, performance and suitability, none of whichshall form part of any contract. We reserve the right to make design changes without notice. All trademarks are acknowledged. Parent company Aeroflex, Inc. ©Aeroflex 2013.

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