Lecture 2 7 Atomic Force Microscopy

8/10/2019 Lecture 2 7 Atomic Force Microscopy

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AFM - atomic force microscopy

A 'new' view of structure (1986)

AlGaN/GaN quantum well waveguideCD stamper

polymer growth

surface atoms on Si single crystal

See Vocabulary of Surface Crystal lograph y,

Journal of Applied Physics 35, 1306 (1964), byElizabethA. Wood


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http://roilbilad.files.wordpress.com/2010/11/afm.jpghttp://roilbilad.wordpress.com/2010/11/09/atomic-force-microscopy-afm/http://roilbilad.wordpress.com/2010/11/09/atomic-force-microscopy-afm/http://roilbilad.wordpress.com/2010/11/09/atomic-force-microscopy-afm/http://roilbilad.wordpress.com/2010/11/09/atomic-force-microscopy-afm/http://roilbilad.wordpress.com/2010/11/09/atomic-force-microscopy-afm/http://roilbilad.wordpress.com/2010/11/09/atomic-force-microscopy-afm/


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Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material.

The image space is (x,y,z) = (20um x 20um x 420nm). The AFM used was the Veeco

di CP-II, scanned in contact mode. Constructed at the Nanorobotics Laboratory at

Carnegie Mellon University (http://nanolab.me.cmu.edu).
http://nanolab.me.cmu.edu/http://nanolab.me.cmu.edu/


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AFM merupakan peralatan sangat canggih untukmempelajari struktur permukaan secara atomik,fenomena fouling pada BRM (Bioreaktor material)atau proses-proses pemisahan membran lainnya.

AFM bisa memberikan gambar 3 dimensi denganresolusi setara atomik serta memberikan informasikuantitatif mengenai morfologi permukaan.

Untuk yang kedua diperlukan bantuan softwareanalisis lainnya .

Berbeda dengan SEM, Alat ini tidak memerlukanperlakukan pendahuluan pada sampel.
http://roilbilad.wordpress.com/2010/10/21/visualisasi-fouling-scanning-electron-microscopy-sem/http://roilbilad.wordpress.com/2010/10/21/visualisasi-fouling-scanning-electron-microscopy-sem/


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3-dimensional topography of IC device Roughness measurements for chemical

mechanical polishingAnalysis of microscopic phase distribution in

polymers Mechanical and physical property measurements

for thin films Imaging magnetic domains on digital storage

media

Imaging of submicron phases in metals Defect imaging in IC failure analysis Microscopic imaging of fragile biological samples


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AFM terdiri dari cantilever dengan probeyang tajam pada ujungnya.

Ketika probe tersebut dekat dengan

sample, medan gaya antara probe dansample akan menghasilkan defleksi padacantilever.

Berdasarkan prinsip ini, bisa diperolehinformasi mengenai: gambar 3D,kehalusan/kekasaran permukaan, dankekuatan tarik-menarik (adhission force).


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Single molecules of poly(2-

vinylpyridine) recorded using

an AFM operating in tappingmode under water media of

different pH. Single chains are

0.4 nm thick. Molecule

conformation changes

drastically at a very small

change of medium pH. At

giving attribution, the following

reference should be cited: Y.

Roiter and S. Minko,AFM

Single Molecule Experiments

at the Solid-Liquid Interface: InSitu Conformation of Adsorbed

Flexible Polyelectrolyte

Chains, Journal of the

American Chemical Society,

vol. 127, iss. 45, pp. 15688-15689 2005 .
http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239http://dx.doi.org/10.1021/ja0558239


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Surface Profile of

Crystalline Material
http://mee-inc.com/hamm/HAMM%202006%20300dpi_img_3.jpg


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AFM Image of Defect on

Coated Glass
http://mee-inc.com/hamm/HAMM%202006%20300dpi_img_5.jpg


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Height and Phase Mode Image of a Polymer Sample
http://mee-inc.com/hamm/HAMM%202006%20300dpi_img_6.jpghttp://mee-inc.com/hamm/HAMM%202006%20300dpi_img_7.jpg


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Top View AFM Image ofSteel Microstructure

AFM Images of Gold

Plating for Wire Bond

Failure Analysis
http://mee-inc.com/hamm/HAMM%202006%20300dpi_img_9.jpghttp://mee-inc.com/hamm/HAMM%202006%20300dpi_img_7.jpg


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Profil 3D dua membran yang tersumbat: (A) dari reaktor

thermofilik, (B) dari reaktor mesophilik
http://roilbilad.files.wordpress.com/2010/11/struktur-3-dimensi-permukaan-membran-yang-tersumbat.jpg


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Perbandingan kekasaran dua membran yang tersumbat: dua

membran dengan material berbeda
http://roilbilad.files.wordpress.com/2010/11/perbandingan-kekasaran-dua-membran-yang-tersumbat.jpg


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Perbandingan kekasaran

membran yang tersumbat

pada dua proses berbeda: (A)MBR dan (B) AGMR)

Berdasarkan analisis menggunakan AFM beberapa fenomena
http://roilbilad.files.wordpress.com/2010/11/perbandingan-kekasaran-membran-yang-tersumbat-pada-dua-proses-berbeda-mbr-dan-agmr.jpg


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Berdasarkan analisis menggunakan AFM, beberapa fenomenafouling pada membran BRM dapat diringkas sebagai berikut:

Membran yang tersumbat terdeteksi memiliki tingkat kekasaranyang lebih tinggi. Perubahan kekasaran ini menandakan adanyadeposisi foulan pada permukaan membran dan distribusi yangtidak merata dari foulan pada permukaan membran.

Kekasaran permukaan dapat juga digunakan untukmengidentifikasi tingkat kemampatan sumbatan. Sumbatan yangmampat cenderung memiliki kekasaran yang lebih rendah.Akibatnya porositas sumbatan juga cenderung menyempit.

Perbedaan tingkat kekasaran juga sangat tergantung pada kondisiumpan (feed) atau lumpur aktif.

Profil daya (force profile) antara sumbatan-membrane, sumbatan-sumbatan juga dapat dihitung. Dengan demikian, kita dapatmenghitung potensi tersumbatnya membran yang satu denganlainnya, terhadap foulan tertentu. Informasi ini dapat digunakan

sebagai data awal untuk mendesin membran yang resistanterhadap penyumbatan.


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Atomic Force Microscope images of lipid membranes. The picture on the lef t

shows the decomposition of a membrane under the inf luence of a l ipid-

degrading enzyme. The picture on the r ight shows the structure of a membrane

formed by a mixture


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Dependence of scattered light intensity and surfaceroughness on etching time. The four panels abovethe graph show digitized AFM images at etchingtimes of 0, 10, 20 and 30 minutes (from left to right).

a Synthetic scheme for the gold


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a, Synthetic scheme for the goldnanobridged nanogap particles(Au-NNPs) using DNA-modifiedgold nanoparticles as templates.b, UV-vis spectra for the probes.Inset: gradual change in the

colour of the solution as thereaction proceeds from seeds(DNA-AuNPs) to intermediates1, 2 and 3 and product 4.c, HRTEM images ofintermediate (panels 13) and

Au-NNPs (panels 4 and 5).Nanobridges within the Au-NNP

are indicated by red arrows inpanel 5, and element linemapping and the ~1.2 nm gap inthe Au-NNP structure are shownin panel 6.d, Comparison betweenmultimeric inter-nanogapstructure that has a less uniform,

multiple point gap junctions (left)and monomeric interior-nanogapstructure with a more uniformsurface gap junction (right).

I t t t f AFM


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a, Instrument setup for AFM-correlated nano-Ramanspectroscopy and precisetip-matching proceduresfor accurate single-particle

addressing (see textandSupplementaryInformationfor moredetails).

be, Representative AFMimages of Au-NNPs indifferent positions.

fh, Distribution diagrams ofthe measuredelectromagneticenhancement factors at1,190 cm1(f),1,460 cm1(g) and1,580 cm1(h). All

measurements for EFcalculations wereperformed with a 633 nmexcitation laser, 10 sexposure, 650 W laserpower and 100 objectivelens.
http://www.nature.com/nnano/journal/v6/n7/full/nnano.2011.79.htmlhttp://www.nature.com/nnano/journal/v6/n7/full/nnano.2011.79.htmlhttp://www.nature.com/nnano/journal/v6/n7/full/nnano.2011.79.htmlhttp://www.nature.com/nnano/journal/v6/n7/full/nnano.2011.79.htmlhttp://www.nature.com/nnano/journal/v6/n7/full/nnano.2011.79.html


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Lecture 2 7 Atomic Force Microscopy

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