Laser Induced Plasma

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    RI C A

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    PED

    OFENERGY

    ETATS

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    S OFA

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    Idaho National Engineering and Environmental Laboratory

    The INEEL is a facility operated for the U.S. Department of Energy GA00 017

    L

    LASER-INDUCED PLASMAA VERSATILE TOOL FOR CHEMICAL ANALYSIS

    (over

    aser-Induced Plasma, such asLaser Induced Breakdown

    Spectroscopy (LIBS) and

    Laser Induced Fluorescence

    (LIF), makes real-time and

    in-situ analysis possible.

    LIBS Uses Laser toInduce Plasma

    In principle, LIBS is

    similar to ICP (InductivelyCoupled Plasma). The

    difference is that instead of

    using an electrode, LIBS useslaser to induce plasma. LIBS

    has been an active research

    topic since the 1960s, and isbeing moved to a variety of

    field applications since the

    introduction of dependablecompact pulsed lasers,

    sensitive high speed detector

    arrays, and low loss opticalfiber cables.

    As shown in Figure 1, a

    basic LIBS system consists ofa sufficiently power laser, a

    fiber optic cable, a

    spectrometer, and aphotodiode. The laser

    commonly used is of

    neodymium yttrium garnet

    (Nd:YAG) type, which

    produces up to 420millijoules of energy at 1.064microns in a 5-7 nanosecond

    pulse with a repetition rate of20 Hz.

    LIBS Has AdvantagesOver ICP

    As given in Table 1, LIBSare superior to ICP in many

    respects. Those unique

    features make LIBS apromising technique for filed-

    based and industrialapplications:

    Real-time analysis for

    process control

    In-situ analysis ininaccessible locations and

    hostile environments

    Field sorting analysis suchas for geological samples

    LIF (Laser InducedFluorescence)Enhances Sensitivity

    One of the disadvantages of

    LIBS is thesignificant matrix

    effect, which lowers thesensitivity of LIBS. LIF,

    Figure 1.Schematic

    diagram of LIBS.

    The plasma is

    formed by

    focusing optical

    pulses from a

    sufficiently power

    laser.

    Field Portable DeviceNo Sample Preparation

    Small Sample Size (mili- to nano- gram)High Spatial Resolution

    Works on Solids, Liquids, and Gases

    Laboratory DeviceSample Dissolved and Nebulized

    Relative Large Sample SizeRelative low Spatial Resolution

    Works on Aqueous Aerosol

    LIBS ICP

    Table 1. Comparison of LIBS and ICP. The Crater produced by laser shot is only about 1 mm in diameterand about 70-80 micron in depth.

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    however, can improve thedetectability by one order. In

    LIF, a second pulsed-laserbeam is used to selectively

    excite the metal atoms

    causing them to emit a pulseof fluorescent light at a

    characteristic wavelength.

    INEEL (Idaho NationalEngineering andEnvironmentalLaboratory)

    - A Leader in LIBSTechnology

    The Plasma and Applied

    Optics Department at INEEL

    has extensive experience in

    the development and

    application of optical

    instrumentation.

    INEEL Is the Scene ofSome of the MostAdvanced ResearchPrograms in The World

    INEEL, being operated byBechtel BWXT Idaho for theU. S. Department of Energy,

    is the home of the largestconcentration of technical

    professionals in the northern

    Rocky Mountain region.Founded in 1949, INEEL has

    made strong technical

    contributions to regional andnational programs in the

    areas of energy availability,

    waste management, defensesystems, earth sciences, and

    engineered systems. TheINEEL site covers nearly

    570,000 acres and it currentlyhas about 9,000 employees,

    among them more than 3,000

    with engineering and sciencedegrees.

    INEEL Has the LeadingEdge in OpticalInstrumentationDevelopment AndApplication

    The INEEL Plasma and

    Optics ApplicationDepartment is specialized in

    the following fields:

    High speed gratingspectroscopy

    Pulse laser spectroscopy

    Radiometry

    Specialized imaging system

    Here are two examples offield-based and miningrelated applications:

    Real-Time Transuranic

    Dust Monitoring (RTDM)

    - An in-situ device uses

    optically-based

    measurements to rapidlyestablish size and density

    of particles, andconcentrations of heavymetal species in the dust

    generated in theremediation activities.

    Preliminary Study of anOn-Line Copper Cathode

    Analyzer- A project toassess the feasibility of

    using LIBS for on-line

    analyzing contaminants incopper cathode. Six

    contaminants including Ni,

    Pb, Ag, Sn, Fe and Te weredetected to low ppm levels

    (see Figure 2 and Table 2).Although the sensitivitiesare not very satisfactory,

    LIBS is certainly apromising technique in thisfield and several

    modifications will be

    probed for improvement.

    Figure 2. ASpectral Scanof Lead. Thesamplecontained 114ppm Pb and thescan wasperformed with

    a 2400 l/mmgrating.

    Nickel

    LeadTin

    SilverIron

    Tellurium

    19.6

    1.42.2

    1.03.0

    0.75

    Contaminants

    Detection Level

    (ppm)

    Table 2. DetectionLimits. All thedetection levels arein ppm exceptNickel.

    (continued)

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    INEEL is Willing toWork Together with Youfor Implementing theState-of-Art LIBSTechnique in YourSystem

    INEEL will work closely

    with you to develop theLIBS/LIF method and

    instrument based on yourneeds. Different procedureswill be tailed to fit into

    different situations of yours.

    The following example is astep by step procedure for

    developing a on-line LIBS to

    measure lanthanide inoperation control:

    1. Develop detailed systemoperating requirements

    2. Prepare samples for

    testing

    3. Perform scope tests toselect the best analytical

    wavelengths

    4. Conduct interferencetesting

    5. Optimize operational

    parameters and produce acalibration curve for each

    sample stream

    6. Define the best methodand relative accuracy for

    total lanthanidedetermination of each andall streams

    7. Establish method forreading samples from

    moving belt and movingslurries

    8. Define instrument

    configuration, cost,installation, and service

    requirements

    9. Prepare a summary report

    For informationcontact:

    Jerry L. May

    e-mail: [email protected]: (208) 526-6674

    John Alexander

    e-mail: [email protected]: (208) 526-0849

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