KP Technology System · PDF fileKP Technology USA Inc. The Kelvin Probe Specialists KP...

KP Technology USA Inc. The Kelvin Probe Specialists

www.airphotoemission.com www.kelvinprobe.com

KP Technology System CatalogueWinter 2013-2014

-1070

-1055

-1040

8486889092

Al Relative Humidity Ramp Test (10% steps) @ 2 Hr/step 09-10/Nov/2013

RH (%) WF (mV) 30 per. Mov. Avg. ( WF (mV) )

-1145

-1130

-1115

-1100

-1085

687072747678808284

WF(m

V)

RH(%

)

Sample: Al Tip: 2mm S/SSig Ave: 60 WF Ave: 2T: 18.9°C Gain: 4

-1220

-1205

-1190

-1175

-1160

525456586062646668

-1250

-1235

485052

0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21

Time (Hours)

0

5

10

15

20

25

30

4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4

Phot

oem

issi

on c

urre

nt [1

/3] (

AU

)

Ep (eV)

Air Photoemission - Si

Sample : Si Gradient : 5 Averaging : 3 RH : 42% T : 19.9oC CPD : -749.2mV WF : 4.983eV R2 : 0.9981 Yield : 9.7

4.983eV



Photoemission in Air SystemsAPS01, APS02, APS03, APS04

Work Function by Photoemission in Air

Density of States Measurements

<3.3eV to >7.0eV Energy Range

Measurement of all Semiconductor Bands

Contact Potential Di�erence by Kelvin Probe

Organic and Non-Organic Semiconductors

Metals

Thin Films

Solar Cells and Organic Photovoltaics

Corrosion

Features Applications

System DescriptionThe Photoemission in Air Systems are KP Technology’s newest addition to our large surface analysis range. The Air-PE systems measure the absolute work function of a material by Photoemission in Air, no vacuum required. With an excitation range of 3.3eV to over 7eV, the Air-PE systems are capable of measuring the absolute Work Function of Metals and with the addition of an SPV and SPS source, the full bands of Semicondcutors can be measured in one system, no other product can do this.

Each APS system comes with our gold-standard Kelvin Probe system, capable of Contact Potential Di�erence Measure-ments, backed-up by the APS’ Absolute measurements. Photoemission in Air measurement of a Silicon Sample

Air Photoemission system APS02 - Scanning Kelvin Probe with Air Photoemission Spectrometry

0

5

10

15

20

25

30

4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4

Phot

oem

issi

on c

urre

nt [1

/3] (

AU

)

Ep (eV)

Air Photoemission - Si


4.983eV




Measurement PrincipleWhen light is incident on a material such as a metal or a semiconductor, the photons may have enough energy to liberate electrons from the surface, a process known as the Photoelectric E�ect. Photons having insu�cient energy will not liberate electrons, while photons of just enough energy will liberate a few electrons; photons of much more energy than the work function will liberate a lot of electrons.

The energy required for electrons to escape the material is termed the work function. By varying the energy of the incoming light, the absolute work function can be established. Based on Fowler’s analysis of photoemission, the square root (cube root for Semicondcutors) of the photoelectron yield is plotted on a graph versus the incident photon energy (image right).

Air Photoemission Measurements of a Selection of Metals.

Each metal is measured with the PE Mode and Kelvin Probe Mode of an APS02 system.The Contact Potential is measured with the Kelvin Probe and the Work Function is measured by the air Photoemission Mode.

When Work Funciton is plotted against CPD, a straight line is formed. A line is drawn at 0V CPD to the line and when traced down revealsthe absolute Work Function of the Tip.

Air Photoemission Curve of Copper Sample

0

10

20

30

40

50

60

3.4 3.6 3.8 4 4.2 4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4

Phot

oem

issi

on c

urre

nt [1

/2] (

AU

)

Energy (eV)

Air Photoemission - Cu

Sample : Cu Gradient : 4 Averaging : 3 RH : 44% T : 20.7oC CPD : -103.8mV WF : 4.565eV R2 : 0.9842 Yield : 11.8

4.565eV

-1.2

-1

-0.8

-0.6

-0.4

-0.2

0

0.2

0.4

3.4 3.5 3.6 3.7 3.8 3.9 4 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 5 5.1 5.2

Cont

act P

oten

tial D

i�er

ence

(V)

Photon Energy (eV)

Au Ag

Cu

Fe

Zn

Ti

Al

Material WF (eV) WF Literature (eV) CPD (V) Ag 4.709 4.73 0.0403 Au 4.856 4.82 0.1779 Al 3.585 4.28 -1.137 Cu 4.565 4.65 -0.1038 Fe 4.558 4.50 -0.116 Ti 3.998 4.02 -0.6902 Zn 3.587 3.63 -1.039

y = 1.0028x - 4.6939 R2 = 0.927

Tip Work Function = 4.6939 eV




System Overview

Density of States

The properties of many materials are governed by the Density of States (DOS) near the Fermi Level. The Air Photoemssion system is capable of probing the DOS by di�erentiating the detected photoelectron yields by the incident photon energy. The DOS measurement can thus be compared to molecular orbital calculations for the material under investigation. DOS data collected with the APS in air is shown to the right for Copper. The data for all measured samples is consistent with literature.

0

0.2

0.4

0.6

0.8

1

3.4 3.6 3.8 4 4.2 4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4

DO

S (A

U)

Energy (eV)

Air Photoemission - Density of States - Cu

Sample : Cu Gradient : 4 Averaging : 3 RH : 44% T : 20.7oC CPD : -103.8mV WF : 4.565eV R2 : 0.9842 Yield : 11.8

Copper Sample Denisty of States

0

0.2

0.4

0.6

0.8

1

4.4 4.6 4.8 5 5.2 5.4 5.6 5.8 6 6.2 6.4 6.6 6.8 7 7.2 7.4

DO

S (A

U)

Energy (eV)

Air Photoemission - Density of States - Si


Silicon Sample Denisty of States

e e

UV Lamp UV Lamp PSUSpectrometer

PC and Monitor

Digital Controller

XYZ stage(APS02/03/04)

Optical Fiber

Optical Enclosure and Measurement System

Sample

Air Photoemission Light Source

Photoelectron Detector

The Optical Enclosure houses the sample in complete darkness prior to

measurement. The Photoelectron detector measures the liberated

electrons driven o� by the UV Light emitted by the Spectrometer.

The UV Bulb is powered by an external PSU and is controlled by software. The UV light is injected into the Spectrom-

eter and a variable wavelength of light is produced. The energy range of this

light is <3.3eV to >7.0eV.

The Digital Controller controls every aspect of the system and is controlled

by the dedicated software GUI. The measurement from the Photoelectron

Detector is passed to the Digital Controller, to the PC and plotted in software, producing the PE curve.


KP Technology was founded with the aim of bringing to the market new surface research tools. These tools would �rstly allow specialists to investigate surface phenomena, secondly provide equipment pathways for non-specialists, and �nally educate scientists, engineers and technologists in the capabilities of these emerging technologies.KP Technology also performs a signi�cant amount of material research and training consultancy, mostly based upon the Work Function or Surface Potential evaulation of client samples. Along with a strong Research and Developement Division and over 300 systems shipped worldwide, this has placed KP Technology as the Number one supplier of Kelvin Probes in the world.



KP Technology was the proud winner of the Queens Award for Enterprise:

International Trade 2013

For quotation requests, further inforamtion or to discuss any research or particular measurements, please feel free

to contact us:

Email: [email protected]: +44 1955 602 777

Or visit our websites www.kelvinprobe.com

www.airphotoemission.com

The Company Contact

System Speci�cations

APS04 Photoemission system with surface Photovoltage Spectroscopy

620 mm

836 mm1459 mm1249 mm

836 mm

620 mm

APS02 Photoemission system

APS01 APS02 APS03 APS04Kelvin Probe 3-Axis ScanningSurface PhotovoltageSurface Photovoltage SpectroscopyTip Material / DiameterWork Function ResolutionHeight Control (Auto)Kelvin Probe ModeCPD Measurement TimePE ModeWF Measurement TimeDOS MeasurementsOptical SystemOscilloscopeTest SampleFaraday Enclosure Base (mm)Control SuppliedWarranty

PC Control with Dedicated Software12 Months

Full CPD measurements

2mm Gold Tip<3meV

Colour Camera with Zoom Lens and Monitor for positioningDigital TFT Oscilloscope for Real Time Signal

Gold, Aluminium and Silver Test Samples

25mm Automatic

450 x 450mm Optical Enclosure

Full access to DOS Information

Full Photoemission measurementCPD measurements in <1 min

PE measurement in <5 mins



Scanning Kelvin Probe SystemsSKP5050, ASKP100100, ASKP200250, ASKP350350

Work Function Measurement by Kelvin Probe

Work Function Resolution of <3meV

Scanning Area from 5mm to 300mm

Scanning Resolution from 317.5nm

Automatic Height Regulation


Metals

Thin Films


Corrosion


System DescriptionOur large range of Scanning Kelvin Probes gives the user full access to 2D and 3D Work Function plots of samples ranging in size from 5mm to 300mm. With Work Function resolution at less than 3meV, and the resolution of the 3-axis scanning stages as low as 317.5nm, the Scanning Kelvin Probe gives reliable, repeatable measurements.

A high performance Faraday and optical enclosure shields all of our scanning systems from unwanted fast changing envi-ronmental conditions, electromagnetic interference and providing the perfect platform for our Photoemission and Surface Photovoltage add-on modules.

Silicon substrate modi�ed by a layer of small ‘Bumps’.Sample is scanned using SKP5050 advanced 2D and 3D techniques

Scanning Kelvin Probe SKP5050 Pictured Inside Standard Optical Enclosure

Scanning Kelvin Probe SystemsSKP5050, ASKP100100, ASKP200250, ASKP350350

Air Photoemission System

Surface Photovoltage (QTH or LED)

Surface Photovoltage Spectroscopy (400-1000nm)

Tips in Gold or S.Steel from 0.05mm to 20mm

Relative Humidity Control and Nitrogen Environmental Chamber






For quotation requests, further information or to discuss any research or particular measurements, please feel free

to contact us:




The Company

Upgrades and Add-Ons

Contact


12” Silicon Wafer Measured Using the ASKP350350 Scanning Kelvin Probe

SKP5050 ASKP100100 ASKP200250 ASKP350350Tip Material / DiameterWork Function ResolutionSample Scan Size 50mm x 50mm 100mm x 100mm 200mm x 250mm 300mm x 300mm3D Sample Area Square Square Square Square & CircularHeight Control (Auto) 25mm 50mm 50mm 50mmVisualisationOptical SystemOscilloscopeTest SampleFaraday Enclosure Base (mm) 450 x 450 300 x 300 450 x 450 450 x 600Control SuppliedDetection SystemWarranty

PC Control with Dedicated SoftwareO�-Null with Parasitic Capacity Rejection

12 Months

3D Maps of Surface Potential

2mm Gold Tip<3meV

Colour Camera with Zoom Lens and MonitorDigital TFT Oscilloscope for Real Time Signal

Gold and Aluminium Test Sample



Environmental Kelvin Probe SystemsRHC010, RHC020, RHC030, RHC040



Automatic Control of Relative Humidity

Atmospheric Control to <1% Oxygen

Modular System for Upgrades and Add-Ons


Metals

Thin Films


Corrosion


System Description

-1070

-1055

-1040

8486889092

Al Relative Humidity Ramp Test (10% steps) @ 2 Hr/step 09-10/Nov/2013

RH (%) WF (mV) 30 per. Mov. Avg. ( WF (mV) )

-1145

-1130

-1115

-1100

-1085

687072747678808284

WF(m

V)

RH(%

)

Sample: Al Tip: 2mm S/SSig Ave: 60 WF Ave: 2T: 18.9°C Gain: 4

-1220

-1205

-1190

-1175

-1160

525456586062646668

-1250

-1235

485052

0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21

Time (Hours)

The Relative Humidity Kelvin Probe Systems are the ideal solution for monitoring samples in a controlled atmosphere. The RHC systems have the ability to automatically control the Relative Humidity within the chamber from 5% to 95% using the easily programmable software. As well as RH control, the RHC020 and 040 Kelvin Probe Systems come with the KP Technology gold-standard Scanning Kelvin Probe platform, perfect for plotting the e�ect of corrosion over the surface of a sample. The RHC030 and 040 come with the added bene�t of Nitrogen atmosphere control with the ability to go down to <1% Oxygen within the System.

E�ect of Relative Humidity on Aluminium Sample over time

Relative Humidity System RHC040 with 3-Axis Scanning Capabilities

Environmental Kelvin Probe SystemsRHC010, RHC020, RHC030, RHC040




Upgrade to Scanning Kelvin Probe System

Sample Heating to 115˚C







to contact us:




The Company


Contact


Relative Humidity System RHC020 with 3-Axis Scanning

RHC010 RHC020 RHC030 RHC040Tip Material / DiameterWork Function ResolutionSample Scanning Single-Point 50mm x 50mm Single-Point 50mm x 50mmRelative Humidity ControlAtmospheric Control RH Only RH Only Oxygen to <1% Oxygen to <1%Optical SystemOscilloscopeTest SampleBreadboard FootprintControl SuppliedDetection SystemWarranty

PC Control with Dedicated SoftwareO�-Null with Parasitic Capacity Rejection

12 Months

2mm Stainless Steel Tip<3meV

Digital TFT Oscilloscope for Real Time SignalGold and Aluminium Test Sample

Automatic: 5% to 95%

Colour CameraFront Window

900 x 600 mm

0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.00.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

mm

mm

4439 -- 4450 4429 -- 4439 4418 -- 4429 4408 -- 4418 4397 -- 4408 4387 -- 4397 4376 -- 4387 4366 -- 4376 4355 -- 4366 4345 -- 4355 4334 -- 4345 4324 -- 4334 4313 -- 4324 4303 -- 4313 4292 -- 4303 4282 -- 4292 4271 -- 4282 4261 -- 4271 4250 -- 4261 4239 -- 4250 4229 -- 4239 4218 -- 4229 4208 -- 4218 4197 -- 4208 4187 -- 4197 4176 -- 4187 4166 -- 4176 4155 -- 4166 4145 -- 4155 4134 -- 4145 4124 -- 4134 4113 -- 4124 4103 -- 4113 4092 -- 4103 4082 -- 4092 4071 -- 4082 4061 -- 4071 4050 -- 4061



UHV Kelvin Probe SystemsUHVKP020, UHVKP030



UHV, Gas or Ambient Measuring


Automatic Height Regulation


Metals

Thin Films


Corrosion


System DescriptionOur range of Ultra High Vacuum Kelvin Probes gives the user full access to Work Function measurements under vacuum. Each UHV Kelvin Probe comes with a High Quality Manual or Motorised Translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system holds the tip separation constant at all times during the measurement. Even under vacuum, the Work Function resolution is less than 3meV.

The UHV Kelvin Probe can be mounted to the user’s existing UHV Chamber with no fuss. If the user does not have a cham-ber, KP Technology o�ers an elegant UHVKP Cell System (UHVKP030) that can be used for Ambient, UHV or Gaseous measurements. This Cell is completely modular and a host of additional extras can be added-on. With a small chamber size, pumping-down the Cell, or injecting Gas, takes no time at all, resulting in fast, reliable measurements.

Ultra High Vacuum Kelvin Probe, UHVKP030, mounted on breadboard. UHV Cell with Heater Stage, Gas Inlet and UHV Kelvin Probe mounted vertically.

Work Function of Metals versus Temperature under Vacuum

UHV Kelvin Probe SystemsUHVKP020, UHVKP030

Photoemission System



Motorised or Manual Translators (50mm to 200mm)

Heater Stage and/or Sample Translation







to contact us:




The Company


Contact


Tips in Gold or S.Steel from 0.05mm to 20mm UHVKP020 Kelvin Probe with Manual TranslatorPhotographed on desk before mounting on to User’s Chamber

UHVKP020 UHVKP030Tip Material / DiameterWork Function ResolutionStandard TranslatorTranslator Sizes PossibleHeight Control (Auto)VisualisationOscilloscopeTest SampleControl Supplied USB Control with Dedicated Software PC Control with Dedicated SoftwareDetection SystemUHV Cell Not Included 2.75" 6 Port CellWarranty

Available on Request

<3meV4mm Stainless Steel Tip

O�-Null with Parasitic Capacity Rejection

12 Months

50mm Manual Translator50mm or 100mm Manual or Motorised Translators

Digital TFT Oscilloscope for Real Time Signal

Approximately 1-5mm by DC O�set (unless Motorised)Single-Point Work Function / Contact Potential Di�erence Scans



Single Point Kelvin Probe SystemKP020




Economical, Entry System

USB Version Plug-and-Play


Metals

Thin Films


Corrosion


System DescriptionOur Single-Point Kelvin Probe System is the introductory system to the KP Technology range. The economical system enables users to quickly record non-scanning data in a numner of di�erent modes to match the exact requirement of the sample under investigation. For rapid events, the KP020 can record work function at a rate of 1000 work func-tion measurements per minute, or, alternatively, the system will track slow work function evolution over a number of days.

The KP020 provides the perfect platform for upgrades to Scanning, Air Photoemission and Surface Photovoltage add-on modules. Platinum Work Function over time after cleaning

Single-Point Kelvin Probe KP020 Pictured on the right without the included Optical Enclosure

Single Point Kelvin Probe SystemKP020




Upgrade to Scanning Kelvin Probe System

Relative Humidity Control and Nitrogen Environmental Chamber







to contact us:




The Company


Contact


The KP Technology Kelvin Probe

Tip Material / DiameterWork Function ResolutionProbe TranslationVisualisationOscilloscopeTest SampleControl SuppliedControl PossibleDetection SystemEnclosureOptical SystemWarranty

USB Control with Dedicated Software available upon request

450mm x 450mm Optical Enclosure IncludedColour Camera with Zoom Lens and Monitor

Gold on Aluminium Sample

<3meV2mm Gold Tip

KP020

PC Control with Dedicated Software

O�-Null with Parasitic Capacity Rejection

12 Months

25mm Manual Translator

Digital TFT Oscilloscope for Real Time SignalSingle-Point Work Function / Contact Potential Di�erence Scans



Surface Photovoltage ModulesSPS030, SPS040

SPS030 - 400 to 700nm Range

SPS040 - 400 to 1000nm Range

Intense White Light QTH Source

DC and AC Measurement Modes

Compatible with all Kelvin Probe Systems


Metals

Thin Films


Corrosion


System Description

0

50

100

150

200

250

300

350

1.2 1.4 1.6 1.8 2 2.2 2.4 2.6 2.8 3 3.2

Photon Energy (eV)

SPV

(mV

)

mc-Si, Si3N4

CdTe

The surface Photovoltage Spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as Organic Semiconductors, Solar Cells or Light Sensitive Dyes.

The modules o�er a comprehensive range of measurement modes including DC and AC surface photovoltage studies utilising the built-in Optical Chopper. Total digital control of all parameters including light intensity and wavelength (400-700nm or 400-1000nm) gives the oppurtunity to investigate the quality of samples , characterise interface and bulk defect states. SPS Response of mc-Si, Si3N4 and CdTe Samples

Surface Photovoltage Spectroscopy SPS030 Pictured with Silicon Solar Cell Sample



Surface Photovoltage ModulesSPV010, SPV020

SPV010 - White LED Light Source

SPV020 - QTH Variable Light Source

Intense Light Sources

Automatic Software Control

Compatible with all Kelvin Probe Systems


Metals

Thin Films


Corrosion


System DescriptionTThe SPV010 or SPV020 module is the ideal upgrade to any of our Kelvin Probe Systems, for any one with an interest in light sensitive materials such as solar cells and light sensitive dye. Vary the light intensity of the 150W DC regulated Quartz Tungsten Halogen bulb to achieve open circuit potential or investigate the quality of your latest roll-to-roll silicon solar cells.

The modules come in two forms; SPV010 is an intense White LED that is a simple on/o� DC measurement; SPV020 is an extremely intense Quartz Tungsten Halogen Light source that has a variable light intensity from softare control.

FSE and BSE Coated, Defective, measured with SPV020 QTH Light Pulse

Quartz Tungsten Halogen SPV020 Source and SPV010 LED Source with Electronics Control Box

-720

-700

-680

-660

-640

-620

-600

-580

-560

-540

-520

0 100 200 300 400 500 600 700 800 900 1000

Time (s)

chan

ge in

sur

face

pot

entia

l (m

V)

Back Side Grounded Front Side Grounded

1

2

3

4

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