J.Ye / SMU Sept.4, 2007 Joint ATLAS CMS Opto-electronics working group, subgroup C 1 Report from...
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Transcript of J.Ye / SMU Sept.4, 2007 Joint ATLAS CMS Opto-electronics working group, subgroup C 1 Report from...
![Page 1: J.Ye / SMU Sept.4, 2007 Joint ATLAS CMS Opto-electronics working group, subgroup C 1 Report from sub-group C, Optical Link Evaluation Criteria and Test.](https://reader036.fdocuments.us/reader036/viewer/2022082613/5697bfbd1a28abf838ca1f56/html5/thumbnails/1.jpg)
Joint ATLAS CMS Opto-electronics working group, subgroup C
1J.Ye / SMU Sept.4, 2007
Report from sub-group C, Report from sub-group C, Optical Link Evaluation Criteria Optical Link Evaluation Criteria
and Test Proceduresand Test ProceduresJoint ATLAS/CMS NOTE 2007/002
Checcucci Bruno3, K.K.Gan5, Suen Hou1, Cigdem Isserver6, Roger Rusack5,
Alexander Singovski4, P.K. Teng1, Jan Troska2, Francois Vasey2, Jingbo Ye7
1. Department of Physics, Academia Sinica, Taiwan.2. CERN, Geneva, Switzerland.
3. INFN Perugia & Department of Physics, Perugia University, Italy.4. The University of Minnesota.
5. Department of Physics, the Ohio State University, Columbus, OH, USA.6. Department of Physics, Oxford University, U.K.
7. Department of Physics, Southern Methodist University, Dallas TX 75275, USA
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Joint ATLAS CMS Opto-electronics working group, subgroup C
2J.Ye / SMU Sept.4, 2007
Table of ContentsTable of Contents
1. Introduction2. The laboratory tests 3. Definitions and procedures
3.1 BER3.2 Jitter3.3 Eye mask3.4 Optical power budget 3.5 Other tests
4. The irradiation tests (refer to subgroup B doc).5. The reference optical link and a standardized
test setup 6. A list of suggested instruments7. Summary
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Joint ATLAS CMS Opto-electronics working group, subgroup C
3J.Ye / SMU Sept.4, 2007
IntroductionIntroduction
This document proposes the evaluation criteria and test procedures for optical data links that are developed to read out the detector front-end electronics in ATLAS and CMS for the LHC upgrade (SLHC). These optical links need to be radiation resistant to the requirement of the detectors’ operational lifetime in the SLHC. The goal of this document is to develop standardized test procedures and evaluation criteria for future designs and tests to follow, and to make our testing work for optical link R&D projects simpler and more effective.
A short history:The discussions of a standardized testing procedure and evaluation criteria started shortly after the joint working group was formed. Past experiences in ATLAS and CMS show that we need to put more thinking into tests at the beginning of the R&D projects. In these tests, there are many things we did before in each individual institutes can now be put in a joint common project for the SLHC. After the ATLAS CMS joint workshop on common electronics projects in March this year at CERN, serious efforts in the joint optoelectronics working group were spent to create a standardized testing procedure and evaluation criteria for optical link development work. This document is the result of these efforts.
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Joint ATLAS CMS Opto-electronics working group, subgroup C
4J.Ye / SMU Sept.4, 2007
The laboratory tests .1/3.The laboratory tests .1/3.
At the link system level:
The input and output (parallel) data timing diagram with respect to the reference (input case) or recovered (output case) clock.
The range of data transmission rate and associated reference clock frequency.
System latency (excluding fiber propagation delay). Eye diagrams at TP1, TP2, TP3 and TP4 and the eye mask tests at TP2, TP3
and TP4. Electrical signals at TP1 and TP4 (usually LVDS) need to be checked against their design specifications. From the eye diagram the following information needs to be extracted: the rise and fall times (20%-80%) of the signal waveform, the jitter in the serial bit stream triggered with the reference (frame) clock, the optical power levels (high, low and average) at TP2 and TP3.
data
control
data
clkcontrol
seria
lizer
dese
rializ
er
TP1TP2 TP3
Laser driver
Laser PIN
TIA+LA
fiber
TP4 TP5
ref clk
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Joint ATLAS CMS Opto-electronics working group, subgroup C
5J.Ye / SMU Sept.4, 2007
The laboratory tests .2/3.The laboratory tests .2/3.
At the link system level:
5. The BER as a function of the input optical power to ORx.6. The maximum transmission range (the length of the fiber) at the specified
bit error rate (BER) or mask margin over a certain type of fiber at the specified data rate.
7. The reference clock jitter tolerance as a function of the bit error rate (BER).
8. Other general system parameters: power supply voltages and consumption of each component, optical power margins and a powering up/reset scheme.
9. The measurement of the system should cover a range of operational conditions such as temperature, humidity, vibration, magnetic field, if applicable.
data
control
data
clkcontrol
seria
lizer
dese
rializ
er
TP1TP2 TP3
Laser driver
Laser PIN
TIA+LA
fiber
TP4 TP5
ref clk
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Joint ATLAS CMS Opto-electronics working group, subgroup C
6J.Ye / SMU Sept.4, 2007
The laboratory tests .3/3.The laboratory tests .3/3.
At component or subassembly level 1. The serializer reference clock jitter transfer function. 2. The latency introduced at each component (serializer,
OTx, etc) level. 3. The serial bit stream jitter measurements at TP1, TP2,
TP3 and TP4, hence to learn the jitter contribution from the OTx and the ORx and the signal dispersion introduced by the fiber.
4. The optical power output of the OTx.5. The optical power attenuation of the fiber.
6. The sensitivity of the ORx (for example at BER of 10-12), hence the optical power budget is measured.
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Joint ATLAS CMS Opto-electronics working group, subgroup C
7J.Ye / SMU Sept.4, 2007
The reference optical link and a The reference optical link and a standardized test setup .1/3.standardized test setup .1/3.
Reference optical link: Three boards:
the FPGA board: data generation, error detection (BERT), ser-des, PC interface (USB).
The OTx board: laser driver, laser. The ORx board: PIN diode, trans-impedance-
amplifier, limiting amplifier.
Stratix II GX based
Ser-Des.+ PC USB interface
OTx ORx
Stratix II GX based
Ser-Des.+ PC USB interface
50ohm cables
fiber
50ohm cables
data
clock
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Joint ATLAS CMS Opto-electronics working group, subgroup C
8J.Ye / SMU Sept.4, 2007
The reference optical link and a The reference optical link and a standardized test setup .2/3.standardized test setup .2/3.
Function blocks inside the FPGA:
Data pass through or generation
LVDS input
CMOS input
SER
Ref. clk
DES
Error detection and logging or data pass through
LVDS output
CMOS output
output clk
USB PC interface
Error detection scheme:1. With frame locked.
a) Single bit flip. Time stamp, flipped bit location and flip type (1 to 0 or 0 to 1)
b) Multiple bit flips.Time stamp and number of flips.
2. Frame loss error.Defined as bit flips in two+ consecutive words.Record the length of frame loss.
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Joint ATLAS CMS Opto-electronics working group, subgroup C
9J.Ye / SMU Sept.4, 2007
Examples of using Examples of using the reference link .3/3.the reference link .3/3.
As a reference to a custom link at system or component evaluation level.
Constructing optical links with custom components for in-lab and irradiation tests. Test the LOC:
Test the GBT and/or Versatile Link (VL):
LOC+LaserCarrier board
FPGA board:Data generationDeserializerError detectionPC interface ORx
FPGA board:Data generationError detectionPC interface
GBT carrier board
VL/TX
VL/RX
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Joint ATLAS CMS Opto-electronics working group, subgroup C
10J.Ye / SMU Sept.4, 2007
SummarySummary
Test procedures and evaluation criteria for radiation resistant optical links for the SLHC upgrade are discussed. The in-lab functional tests are described in this document, while the irradiation evaluation and tests are discussed in the subgroup B report. A specially designed reference optical link is proposed to benchmark the developed links, to standardize their testing, and to simplify the test preparations. Based on this reference link, standardized test systems can be constructed for component and subassembly tests.