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Articles Relevant to the Expression of Uncertainty in Measurement

The following citations are for information purposes but are not necessarily endorsed by themembers of JCGM/WG 1. This compilation is not meant to be exhaustive.

1993 1994 1995 1996 1997 1998 1999 2000 2001

2002 2003 2004 2005 2006 2007 2008 2009

1993

A Bayesian Theory of Measurement Uncertainty

K. Weise and W. Wger

Physikalisch-Technische Bundesanstalt, Braunschweig, Germany

Meas. Sci. Technol., 1993, 4, No. 1, 1-11.

1996

Simple Formula for the Propagation of Variances and Covariances

W. Bich

Istituto di Metrologia "G. Colonnetti", Turin, Italy

Metrologia, 1996, 33, 181-183. Erratum: Metrologia, 1996, 33, 505.

1997

Metrological timelines in traceability

C.D. Ehrlich and S.D. Rasberry

Technology Services, National Institute of Standards and Technology, Gaithersburg,USA

Metrologia, 1997, 34, 503-514.

A Distribution-Independent Bound on the Level of Confidence in the Result of aMeasurement

Tyler W. Estler

National Institute of Standards and Technology, Gaithersburg, USA

J. Res. Natl. Inst. Stand. Technol., 1997, 102, 587-588.
http://stacks.iop.org/met/33/181http://stacks.iop.org/met/33/181http://stacks.iop.org/met/33/505http://stacks.iop.org/met/34/503http://stacks.iop.org/met/34/503http://nvl.nist.gov/pub/nistpubs/jres/102/5/j25est.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25est.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25est.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25est.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25est.pdfhttp://stacks.iop.org/met/34/503http://stacks.iop.org/met/33/505http://stacks.iop.org/met/33/181


2/21

The Evaluation of Standard Uncertainty in the Presence of Limited Resolution of IndicatingDevices

Ignacio H. Lira and Wolfgang Wger

Pontificia Universidad Catlica de Chile, Santiago, Chile; Physikalisch-TechnischeBundesanstalt, Braunschweig, Germany

Meas. Sci. Technol., 1997, 8, 441-443.

Guidelines for Expressing the Uncertainty of Measurement Results Containing UncorrectedBias

Steven D. Phillips, Keith R. Eberhardt and Brian Parry

National Institute of Standards and Technology, Gaithersburg, USA; BoeingCorporation, Seattle, USA.


Uncertainty Treatment in Monte Carlo Simulation

K. Weise and H. Zhang

Physikalisch-Technische Bundesanstalt, Braunschweig, Germany

J. Phys. A: Math. Gen., 1997, 30, 5971-5980.

1998

Assessing Uncertainty in MeasurementLeon Jay Gleser

University of Pittsburgh, Pennsylvania, USA

Statistical Science, 1998, 13, No. 3, 277-290.

Evaluation of the Uncertainty Associated with a Measurement Result not Corrected forSystematic Effects



Meas. Sci. Technol., 1998, 9, 1010-1011.

The Evaluation of the Uncertainty in Knowing a Directly Measured Quantity



Meas. Sci. Technol., 1998, 9, 1167-1173.
http://nvl.nist.gov/pub/nistpubs/jres/102/5/j25phi.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25phi.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25phi.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25phi.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/102/5/j25phi.pdf


3/21

Least-squares Estimation using Lagrange Multipliers

Lars Nielsen

Danish Institute of Fundamental Metrology, Lyngby, Denmark


Calculation of Measurement Uncertainty Using Prior Information

S. D. Phillips et al.



Confidence-interval Interpretation of a Measurement Pair for Quantifying a Comparison

Barry M. Wood and Robert J. DouglasNational Research Council of Canada, Ottawa, Canada


1999

Measurement as Inference: Fundamental Ideas

Tyler W. Estler

Precision Engineering Division, National Institute of Standards and Technology,

Gaithersburg, USA

Annals of the CIRP, Keynote Paper, 1999, 48, No. 2, 611-632.

A Bayesian approach to the consumer's and producer's risks in measurement

I. Lira

Metrologia, 1999, 36, 397-402.

Uncertainty of Measurement and Error Limits in Legal MetrologyW. Schulz and Klaus-Dieter Sommer

Physikalisch-Technische Bundesanstalt, Braunschweig, Germany; Landesamt frMess- und Eichwesen Thringen, Ilmenau,Germany

OIML Bulletin, 1999, XL, No. 4, 5-15.

Comments on the Accuracy of Some Approximate Methods of Evaluation of ExpandedUncertainty

D. Turzeniecka

Technical University of Pozna, Pozna, Poland

Metrologia, 1999, 36, 113-116.
http://stacks.iop.org/met/35/115http://stacks.iop.org/met/35/115http://stacks.iop.org/met/37/183http://nvl.nist.gov/pub/nistpubs/jres/103/6/j36phi.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/103/6/j36phi.pdfhttp://stacks.iop.org/met/35/187http://stacks.iop.org/met/35/187http://stacks.iop.org/met/36/245http://www.bipm.org/utils/common/pdf/JCGM/MeasurementasInference.pdfhttp://www.bipm.org/utils/common/pdf/JCGM/MeasurementasInference.pdfhttp://stacks.iop.org/met/36/397http://stacks.iop.org/met/36/397http://stacks.iop.org/met/36/113http://stacks.iop.org/met/36/113http://stacks.iop.org/met/36/113http://stacks.iop.org/met/36/113http://stacks.iop.org/met/36/113http://stacks.iop.org/met/36/397http://www.bipm.org/utils/common/pdf/JCGM/MeasurementasInference.pdfhttp://stacks.iop.org/met/36/245http://stacks.iop.org/met/35/187http://nvl.nist.gov/pub/nistpubs/jres/103/6/j36phi.pdfhttp://stacks.iop.org/met/37/183http://stacks.iop.org/met/35/115


4/21

Quantifying Demonstrated Equivalence

Barry M. Wood and Robert J. Douglas

National Research Council of Canada, Ottawa, Canada

IEEE Transactions on Instrumentation and Measurement, 1999, 48, No. 2, 162.

2000

LImitations of the Welch-Satterthwaite Approximation for Measurement UncertaintyCalculations

M. Ballico

CSIRO National Measurement Laboratory, Lindfield, Australia

Metrologia, 2000, 37, 61-64.

Evaluation of Measurement Uncertainty in the Presence of Combined Random andAnalogue-to-digital Conversion Errors

Clemens Elster

Physikalisch-Technische Bundesanstalt, Berlin, Germany

Meas. Sci. Technol., 2000, 11, 1359-1363.

Cycles of Comparison Measurements, Uncertainties and Efficiencies

Michael GlserPhysikalisch-Technische Bundesanstalt, Braunschweig, Germany

Meas. Sci. Technol., 2000, 11, 20-24.

Propagation of Errors for Matrix Inversion

M. Lefebvre et al.

Department of Physics and Astronomy, University of Victoria, Victoria, Canada

N.I.M. Phys Res. A, 2000, 451, 520-528.

An Approach to Combining Results from Multiple Methods Motivated by the ISO GUM

M. S. Levenson et al.



Curve adjustment by the least-squares method

I. Lira

Metrologia, 2000, 37, 677-681.
http://stacks.iop.org/met/37/61http://stacks.iop.org/met/37/61http://stacks.iop.org/met/37/61http://nvl.nist.gov/pub/nistpubs/jres/105/4/j54lev.pdfhttp://stacks.iop.org/met/37/677http://stacks.iop.org/met/37/677http://stacks.iop.org/met/37/677http://nvl.nist.gov/pub/nistpubs/jres/105/4/j54lev.pdfhttp://stacks.iop.org/met/37/61http://stacks.iop.org/met/37/61


5/21

Uncertainty and Traceability in Calibration by Comparison

Emmanouil Mathioulakis and Vassilis Belessiotis

NCSR 'Demokritos', Agia Paraskevi Attikis, Greece

Meas. Sci. Technol., 2000, 11, 771-775.

Possible Advantages of a Robust Evaluation of Comparisons

Jrg W. Mller

Bureau International des Poids et Mesures, Svres, France

J. Res. Natl. Inst. Stand. Technol., 2000, 105, 551-555. Erratum: J. Res. Natl. Inst.Stand. Technol., 2000, 105, 781.

Removing Model and Data Non-Conformity in Measurement Evaluation

K. Weise and W. Wger

Parkstrasse 11, D-38 179 Schwlper, Germany; Physikalisch-TechnischeBundesanstalt, Braunschweig, Germany

Meas. Sci. Technol., 2000, 11, 1649-1658.

The Propagation of Uncertainty on Interpolated Scales, with Examples from Thermometry

D. R. White and P. SaundersMeasurement Standards Laboratory of New Zealand, Industrial Research Ltd, LowerHutt, New Zealand

Metrologia, 2000, 37, 285-293.

Accuracy of Error Propagation Exemplified with Ratios of Random Variables

Peter J. Winzer

Technische Universitt Wien, Vienna, Austria

Review of Scientific Instruments, 2000, 71, No. 3, 1447.

2001

Does "Welch-Satterthwaite" Make a Good Uncertainty Estimate ?

B. D. Hall and R. Willink

Measurement Standards Laboratory of New Zealand, Lower Hutt, New Zealand;Applied Mathematics Centre, Industrial Research Ltd, Lower Hutt, New Zealand

Metrologia, 2001, 38, 9-15.
http://nvl.nist.gov/pub/nistpubs/jres/105/4/j54mul.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/105/5/j55err2.pdfhttp://stacks.iop.org/met/37/285http://stacks.iop.org/met/38/9http://stacks.iop.org/met/38/9http://stacks.iop.org/met/38/9http://stacks.iop.org/met/37/285http://nvl.nist.gov/pub/nistpubs/jres/105/5/j55err2.pdfhttp://nvl.nist.gov/pub/nistpubs/jres/105/4/j54mul.pdf


6/21

Evaluation of cycles of comparison measurements by a least-squares method

I. Lira

Measurement Science and Technology, 2001, 12, 1167-1171.

Bayesian evaluation of the standard uncertainty and coverage probability in a simplemeasurement model

I. Lira and W. Wger

Meas. Sci. and Technol., 2001, 12, 1172-1179.

The Propagation of Uncertainty with Non-Lagrangian Interpolation

D. R. White

Measurement Standards Laboratory of New Zealand, Industrial Research Ltd, Lower

Hutt, New Zealand

Metrologia, 2001, 38, 63-69.

2003

Uncertainty and efficiency of correlated measurement cycles with periodically varyingpatterns

M. Glser

Meas. Sci. Technol., 2003, 14, 433438.

Calculating measurement uncertainty for complex-valued quantities

B. D. Hall

Meas. Sci. Technol., 2003, 14, 368375.

Uncertainty calculation for the ratio of dependent measurements

J. Hannig, C. M. Wang, H. K. Iyer

Metrologia, 2003, 40(4), 177-183.

On use of Bayesian statistics to make theGuide to the Expression of Uncertainty inMeasurement consistent

R. Kacker and A. Jones


Metrologia, 2003, 40, 235-248.
http://stacks.iop.org/met/38/63http://stacks.iop.org/met/38/63http://stacks.iop.org/met/40/177http://stacks.iop.org/met/40/177http://stacks.iop.org/met/40/235http://stacks.iop.org/met/40/235http://stacks.iop.org/met/40/235http://stacks.iop.org/met/40/235http://stacks.iop.org/met/40/235http://stacks.iop.org/met/40/235http://stacks.iop.org/met/40/235http://stacks.iop.org/met/40/177http://stacks.iop.org/met/38/63


7/21

The Guide to Expression of Uncertainty in Measurement Approach for EstimatingUncertainty: An Appraisal

J. Kristiansen

Clin. Chem., 2003, 49(11), 1822-1829.

Error analysis in the evaluation of measurement uncertainty

A. M. H. van der Veen and M. G. Cox

Metrologia, 2003, 40(2), 42-50.

2004

On the in-use uncertainty of an instrument

W. Bich, F. Pennecchi.

Advanced Mathematical & Computational Tools in Metrology, VI, 2004, pp. 159-169Editors: P. Ciarlini, M. G. Cox, E. Filipe, F. Pavese, D. Richter; World Scientific(Singapore).

Assigning probability density functions in a context of information shortage

R. R. Cordero and P. Roth

Metrologia, 2004, 41(4), L22-L25.

On the propagation of uncertainty in complex-valued quantities

B. D. Hall

Metrologia, 2004, 41(3), 173-177.

Bayesian inference of linear sine-fitting parameters from integrating digital voltmeter data

G. A. Kyriazis and M. L. R. de Campos

Meas. Sci. Technol., 2004, 15, 337346.

Erratum: Meas. Sci. Technol., 2004, 15, 1947.

Coverage intervals and statistical coverage intervals

R. Willink

Metrologia, 2004, 41(3), L5-L6.
http://stacks.iop.org/met/40/42http://stacks.iop.org/met/41/L22http://stacks.iop.org/met/41/L22http://stacks.iop.org/met/41/173http://stacks.iop.org/met/41/173http://stacks.iop.org/met/41/L5http://stacks.iop.org/met/41/L5http://stacks.iop.org/met/41/L5http://stacks.iop.org/met/41/173http://stacks.iop.org/met/41/L22http://stacks.iop.org/met/40/42


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2005

On the best fit of a line to uncertain observation pairs

A. Balsamo, G. Mana, F. Pennecchi

Metrologia, 2005, 42(5), 376-382.

On two methods to evaluate the uncertainty of derivatives calculated from polynomials fittedto experimental data

R. R. Cordero and P. Roth

Metrologia, 2005, 42(1), 39-44.

Revisiting the problem of the evaluation of the uncertainty associated with a single

measurementR. R. Cordero and P. Roth

Metrologia, 2005, 42(2), L15-L19.

A useful reflection

R. J. Douglas, A. G. Steele, B. M. Wood, K. D. Hill

Metrologia, 2005, 42(5), L35-L39.

Including correlation effects in an improved spreadsheet calculation of combined standarduncertainties

S. L. R. Ellison

Accred. Qual. Assur., 2005, 10, 338-343.

Monte Carlo-based estimation of uncertainty owing to limited resolution of digital instruments

R. B. Frenkel and L. Kirkup

Metrologia, 2005, 42(5), L27-L30.

Verification of uncertainty budgets

K. Heydorn and B. Stjernholm Madsen


A software package comparison for uncertainty measurement estimation according to GUM

J.M. Jurado and A. Alcazar

http://stacks.iop.org/met/42/376http://stacks.iop.org/met/42/376http://stacks.iop.org/met/42/39http://stacks.iop.org/met/42/39http://stacks.iop.org/met/42/39http://stacks.iop.org/met/42/L15http://stacks.iop.org/met/42/L15http://stacks.iop.org/met/42/L15http://stacks.iop.org/met/42/L35http://stacks.iop.org/met/42/L35http://stacks.iop.org/met/42/L27http://stacks.iop.org/met/42/L27http://stacks.iop.org/met/42/L27http://stacks.iop.org/met/42/L35http://stacks.iop.org/met/42/L15http://stacks.iop.org/met/42/L15http://stacks.iop.org/met/42/39http://stacks.iop.org/met/42/39http://stacks.iop.org/met/42/376


9/21

High order corrections to the Welch-Satterthwaite formula

Z. Liu

Metrologia, 2005, 42(5), 449-457.

Evaluation of the uncertainty of the degree of equivalence

G. Ratel

Metrologia, 2005, 42(2), 140-144.

Propagation of uncertainties in measurements using generalized inference

C. M. Wang and H. K. Iyer

Metrologia, 2005, 42, 145153.

On higher-order corrections for propagating uncertainties


Metrologia, 2005, 42(5), 406-410.

A procedure for the evaluation of measurement uncertainty based on moments

R. Willink

Metrologia, 2005, 42(5), 329-343.

2006

The expression of uncertainty in non-linear parameter estimation

A. Balsamo, G. Mana, F. Pennecchi

Metrologia, 2006, 43(5), 396-402.

Non-linear models and best estimates in the GUMW. Bich, L. Callegaro, F. Pennecchi

Metrologia, 2006, 43(4), S196-S199.

Evolution of the 'Guide to the Expression of Uncertainty in Measurement'

W. Bich, M. G. Cox, P. M. Harris

Metrologia, 2006, 43(4), S161-S166.
http://stacks.iop.org/met/42/449http://stacks.iop.org/met/42/449http://stacks.iop.org/met/42/140http://stacks.iop.org/met/42/140http://stacks.iop.org/met/42/145http://stacks.iop.org/met/42/145http://stacks.iop.org/met/42/406http://stacks.iop.org/met/42/406http://stacks.iop.org/met/42/329http://stacks.iop.org/met/42/329http://stacks.iop.org/met/43/396http://stacks.iop.org/met/43/396http://stacks.iop.org/met/43/S196http://stacks.iop.org/met/43/S196http://stacks.iop.org/met/43/S161http://stacks.iop.org/met/43/S161http://stacks.iop.org/met/43/S161http://stacks.iop.org/met/43/S196http://stacks.iop.org/met/43/396http://stacks.iop.org/met/42/329http://stacks.iop.org/met/42/406http://stacks.iop.org/met/42/145http://stacks.iop.org/met/42/140http://stacks.iop.org/met/42/449


10/21

Extending the discussion on coverage intervals and statistical coverage intervals

L.-A. Chen and H.-N. Hung

Metrologia, 2006, 43(6), L43-L44.

Effect of the resolution on the uncertainty evaluation

R. R. Cordero, G. Seckmeyer, F. Labbe

Metrologia, 2006, 43(6), L33-L38.

The generalized weighted mean of correlated quantities

M.G. Cox, C. Ei, G. Mana, F. Pennecchi

Metrologia, 2006, 43(4), S268-S275.

Measurement uncertainty and traceability

M. G. Cox and P. M. Harris

Meas. Sci. Technol., 2006, 17, 533540.

The use of a Monte Carlo method for evaluating uncertainty and expanded uncertainty

M. G. Cox, B. R. L. Siebert

Metrologia, 2006, 43(4), S178-S188.

A two-stage Monte Carlo approach to the expression of uncertainty with non-linearmeasurement equation and small sample size

S. V. Crowder and R. D. Moyer

Metrologia, 2006, 43(1), 34-41.

A new terminology for the approaches to the quantification of the measurement uncertainty

R. J. N. B. da Silva, J. R. Santos, M. F. G. F. C. CamesAccred. Qual. Assur., 2006, 10, 664-671.

An analytical method for calculating a coverage interval

P. Fotowicz

Metrologia, 2006, 43(1), 42-45.

Monte Carlo uncertainty calculations with small-sample estimates of complex quantities

B. D. Hall
http://stacks.iop.org/met/43/L43http://stacks.iop.org/met/43/L43http://metrologia%2C%202006%2C%2043%286%29%2C%20l33-l38/http://metrologia%2C%202006%2C%2043%286%29%2C%20l33-l38/http://stacks.iop.org/met/43/S268http://stacks.iop.org/met/43/S268http://stacks.iop.org/met/43/S178http://stacks.iop.org/met/43/S178http://stacks.iop.org/met/43/34http://stacks.iop.org/met/43/34http://stacks.iop.org/met/43/34http://stacks.iop.org/met/43/42http://stacks.iop.org/met/43/42http://stacks.iop.org/met/43/220http://stacks.iop.org/met/43/220http://stacks.iop.org/met/43/220http://stacks.iop.org/met/43/42http://stacks.iop.org/met/43/34http://stacks.iop.org/met/43/34http://stacks.iop.org/met/43/S178http://stacks.iop.org/met/43/S268http://metrologia%2C%202006%2C%2043%286%29%2C%20l33-l38/http://stacks.iop.org/met/43/L43


11/21

Metrologia, 2006, 43(3), 220-226.

Computing uncertainty with uncertain numbers

B. D. Hall

Metrologia, 2006, 43(6), L56-L61.

A novel method of estimating dynamic measurement errors

J. P. Hessling

Meas. Sci. Technol., 2006, 17, 27402750.

Bayesian alternative to the ISO-GUM's use of the Welch-Satterthwaite formula

R. N. Kacker

Metrologia, 2006, 43(1), 1-11.

Comparison of ISO-GUM, draft GUM supplement 1 and Bayesian statistics using simplelinear calibration

R. N. Kacker, B. Toman, D. Huang

Metrologia, 2006, 43(4), S167-S177.

Coefficient of contribution to the combined standard uncertainty

R. Kessel, R. N. Kacker, M. Berglund

Metrologia, 2006, 43(4), S189-S195.

Resolution revisited

I. Lira

Metrologia, 2006, 43(3), L14-L17.

Implementation of a generalized least-squares method for determining calibration curvesfrom data with general uncertainty structures

M. J. T. Milton, P. M. Harris, I. M. Smith, A. S. Brown, B. A. Goody

Metrologia, 2006, 43(4), S291-S298.

Exact calculation of the coverage interval for the convolution of two Student's t distributions

S. Nadarajah

Metrologia, 2006, 43(5), L21-L22.
http://stacks.iop.org/met/43/L56http://stacks.iop.org/met/43/L56http://stacks.iop.org/met/43/1http://stacks.iop.org/met/43/1http://stacks.iop.org/met/43/S167http://stacks.iop.org/met/43/S167http://stacks.iop.org/met/43/S167http://stacks.iop.org/met/43/S189http://stacks.iop.org/met/43/S189http://stacks.iop.org/met/43/L14http://stacks.iop.org/met/43/L14http://stacks.iop.org/met/43/S291http://stacks.iop.org/met/43/S291http://stacks.iop.org/met/43/S291http://stacks.iop.org/met/43/L21http://stacks.iop.org/met/43/L21http://stacks.iop.org/met/43/L21http://stacks.iop.org/met/43/S291http://stacks.iop.org/met/43/S291http://stacks.iop.org/met/43/L14http://stacks.iop.org/met/43/S189http://stacks.iop.org/met/43/S167http://stacks.iop.org/met/43/S167http://stacks.iop.org/met/43/1http://stacks.iop.org/met/43/L56


12/21

Estimation of the modulus of a complex-valued quantity

L. Oberto and F. Pennecchi

Metrologia, 2006, 43(6), 531-538.

Optimised measurement uncertainty and decision-making when sampling by variables or byattribute

L. R. Pendrill

Measurement, 2006, 39, 829-840.

Between the mean and the median: the Lp estimator

F. Pennecchi, L. Callegaro

Metrologia, 2006, 43(3), 213-219.

Visualization technique for uncertainty budgets: Onion charts

K. W. Pratt and D. L. Duewer


Systematic approach to the modelling of measurements for uncertainty evaluation

K. D. Sommer and B. R. L. Siebert

Metrologia, 2006, 43(4), S200-S210.

Instrument resolution and measurement accuracy

G. Taraldsen

Metrologia, 2006, 43(6), 539-544.

Linear statistical models in the presence of systematic effects requiring a Type B evaluationof uncertainty

B. Toman

Metrologia, 2006, 43(1), 27-33.

Uncertainty analysis for vector measurands using fiducial inference


Metrologia, 2006, 43(6), 486-494.

Principles of probability and statistics for metrology

R. Willink

Metrologia, 2006, 43(4), S211-S219.
http://stacks.iop.org/met/43/531http://stacks.iop.org/met/43/531http://stacks.iop.org/met/43/213http://stacks.iop.org/met/43/213http://stacks.iop.org/met/43/S200http://stacks.iop.org/met/43/S200http://stacks.iop.org/met/43/539http://stacks.iop.org/met/43/539http://stacks.iop.org/met/43/27http://stacks.iop.org/met/43/27http://stacks.iop.org/met/43/27http://stacks.iop.org/met/43/486http://stacks.iop.org/met/43/486http://stacks.iop.org/met/43/S211http://stacks.iop.org/met/43/S211http://stacks.iop.org/met/43/S211http://stacks.iop.org/met/43/486http://stacks.iop.org/met/43/27http://stacks.iop.org/met/43/27http://stacks.iop.org/met/43/539http://stacks.iop.org/met/43/S200http://stacks.iop.org/met/43/213http://stacks.iop.org/met/43/531


13/21

On using the Monte Carlo method to calculate uncertainty intervals

R. Willink

Metrologia, 2006, 43(6), L39-L42.

Uncertainty analysis by moments for asymmetric variables

R. Willink

Metrologia, 2006, 43(6), 522-530.

The uncertainty associated with the weighted mean of measurement data

N. F. Zhang

Metrologia, 2006, 43(3), 195-204.

Calculation of the uncertainty of the mean of autocorrelated measurements

N. F. Zhang

Metrologia, 2006, 43(4), S276-S281.

2007

Statistical techniques for assessing the agreement between two instruments

Astrua M., Ichim D., Pennecchi F., Pisani M.[INRIM, ISTAT]

Metrologia, 2007, 44(5), 385-392.

Recent developments in uncertainty evaluation

W. Bich

Procs. of the International School of Physics "Enrico Fermi", Course CLXVI, Metrologyand Fundamental Constants, T. W. Haensch, S. Leschiutta and A. J. Wallard, editors,IOS Press, Amsterdam, 2007, ISBN 978-1-58603-784-0, pp.81-94.

Why always seek the expected value? A discussion relating to the Lpnorm

Callegaro L., Pennecchi F.[INRIM]

Metrologia, 2007, 44(6), L68-L70.

Parametric coverage interval

L.-A. Chen, J.-Y. Huang, H.-C. Chen

Metrologia, 2007, 44(2), L7-L9.
http://stacks.iop.org/met/43/L39http://stacks.iop.org/met/43/L39http://stacks.iop.org/met/43/522http://stacks.iop.org/met/43/522http://stacks.iop.org/met/43/195http://stacks.iop.org/met/43/195http://stacks.iop.org/met/43/S276http://stacks.iop.org/met/43/S276http://stacks.iop.org/met/44/385http://stacks.iop.org/met/44/385http://stacks.iop.org/met/44/L68http://stacks.iop.org/met/44/L68http://stacks.iop.org/met/44/L68http://stacks.iop.org/met/44/L68http://stacks.iop.org/met/44/L7http://stacks.iop.org/met/44/L7http://stacks.iop.org/met/44/L7http://stacks.iop.org/met/44/L68http://stacks.iop.org/met/44/L68http://stacks.iop.org/met/44/L68http://stacks.iop.org/met/44/385http://stacks.iop.org/met/43/S276http://stacks.iop.org/met/43/195http://stacks.iop.org/met/43/522http://stacks.iop.org/met/43/L39


14/21

Evaluating the uncertainties of data rendered by computational models

R. R. Cordero, G. Seckmeyer, F. Labbe

Metrologia, 2007, 44(3), L23-L30.

The area under a curve specified by measured values

Cox M.G.[NPL]

Metrologia, 2007, 44(5), 365-378.

The identification of the measurand can have an effect on the magnitude of themeasurement uncertainty

P. De Bivre

Accreditation and Quality Assurance, 2007, 12(12), 613-614.

Analysis of dynamic measurements and determination of time-dependent measurementuncertainty using a second-order model

C. Elsteret al.

Meas. Sci. Technol., 2007, 18, 3682-3687.

Calculation of uncertainty in the presence of prior knowledge

C. Elster

Metrologia, 2007, 44(2), 111-116.

Draft GUM Supplement 1 and Bayesian analysis

C. Elster, W. Wger, M. G. Cox

Metrologia, 2007, 44(3), L31-L32.

Using Bayesian inference for parameter estimation when the system response andexperimental conditions are measured with error and some variables are considered asnuisance variables

A. F. Emery, E. Valenti and D. Bardot

Meas. Sci. Technol., 2007, 18, 1929.

A Monte Carlo method for uncertainty evaluation implemented on a distributed computingsystem

Esward T.J., de Ginestous A., Harris P.M., Hill I.D., Salim S.G.R., Smith I.M.,Wichmann B.A., Winkler R., Woolliams E.R. [NPL, Heriot-Watt Univ.]
http://stacks.iop.org/met/44/L23http://stacks.iop.org/met/44/L23http://stacks.iop.org/met/44/365http://stacks.iop.org/met/44/365http://www.springerlink.com/content/33t46711127g104l/?p=1c41dc76178042f2884c8a0d151bda92&pi=0http://www.springerlink.com/content/33t46711127g104l/?p=1c41dc76178042f2884c8a0d151bda92&pi=0http://www.springerlink.com/content/33t46711127g104l/?p=1c41dc76178042f2884c8a0d151bda92&pi=0http://stacks.iop.org/met/44/111http://stacks.iop.org/met/44/111http://stacks.iop.org/met/44/L31http://stacks.iop.org/met/44/L31http://stacks.iop.org/met/44/319http://stacks.iop.org/met/44/319http://stacks.iop.org/met/44/319http://stacks.iop.org/met/44/319http://stacks.iop.org/met/44/319http://stacks.iop.org/met/44/L31http://stacks.iop.org/met/44/111http://www.springerlink.com/content/33t46711127g104l/?p=1c41dc76178042f2884c8a0d151bda92&pi=0http://www.springerlink.com/content/33t46711127g104l/?p=1c41dc76178042f2884c8a0d151bda92&pi=0http://stacks.iop.org/met/44/365http://stacks.iop.org/met/44/L23


15/21

Metrologia, 2007, 44(5), 319-326.

Fiducial approach to uncertainty assessment accounting for error due to instrumentresolution

Hannig J., Iyer H.K., Wang C.M.[NIST, Colorado State Univ]

Metrologia, 2007, 44(6), 476-483.

Measurement uncertainty for multiple measurands: characterization and comparison ofuncertainty matrices

W. Hsselbarth, W. Bremser

Metrologia, 2007, 44(2), 128-145.

Trapezoidal and triangular distributions for Type B evaluation of standard uncertainty

R. N. Kacker and J. F. Lawrence

Metrologia, 2007, 44(2), 117-127.

Evolution of modern approaches to express uncertainty in measurement

Kacker R., Sommer K.-D., Kessel R.[NIST, PTB, Metrodata]

Metrologia, 2007, 44(6), 513-529.

Probabilistic and least-squares inference of the parameters of a straight-line model

Lira I., Elster C., Wger W.[PUC, PTB]

Metrologia, 2007, 44(5), 379-384.

Uncertainty propagation in non-linear measurement equations

G. Mana, F. Pennecchi

Metrologia, 2007, 44(3), 246-251.

Optimised Measurement Uncertainty and Decision-Making in Conformity Assessment

L. R. Pendrill

NCSLI Measure, 2007, 2, 76-86.

Assessment of measurement uncertainty via observation equations

Possolo A., Toman B.[NIST]

Metrologia, 2007, 44(6), 464-475.
http://stacks.iop.org/met/44/476http://stacks.iop.org/met/44/476http://stacks.iop.org/met/44/476http://stacks.iop.org/met/44/128http://stacks.iop.org/met/44/128http://stacks.iop.org/met/44/128http://stacks.iop.org/met/44/117http://stacks.iop.org/met/44/117http://stacks.iop.org/met/44/513http://stacks.iop.org/met/44/513http://stacks.iop.org/met/44/379http://stacks.iop.org/met/44/379http://stacks.iop.org/met/44/246http://stacks.iop.org/met/44/246http://stacks.iop.org/met/44/464http://stacks.iop.org/met/44/464http://stacks.iop.org/met/44/464http://stacks.iop.org/met/44/246http://stacks.iop.org/met/44/379http://stacks.iop.org/met/44/513http://stacks.iop.org/met/44/117http://stacks.iop.org/met/44/128http://stacks.iop.org/met/44/128http://stacks.iop.org/met/44/476http://stacks.iop.org/met/44/476


16/21

Towards a new edition of the Guide to the expression of uncertainty in measurement

S. Rabinovich


Uncertainty from sampling, in the context of fitness for purpose

M. H. Ramsey, M. Thompson


Repeatability: some aspects concerning the evaluation of the measurement uncertainty

M. Rsslein, S. Rezzonico, R. Hedinger, M. Wolf


A forgotten fact about the standard deviation

M. Rsslein, M. Wolf, B. Wampfler, W. Wegscheider


COMMENT: A comment on: A forgotten fact about the standard deviation

B. D. Hall, R. Willink


The propagation of uncertainty with calibration equations

D. R. White, P. Saunders

Meas. Sci. Technol., 2007, 18, 21572169.

On the uncertainty of the mean of digitized measurements

R. D. Willink

Metrologia, 2007, 44(1), 73-81.

On the Lp estimation of a quantity from a set of observations

R. D. Willink

Metrologia, 2007, 44(2), 105-110.

Uncertainty and data-fitting procedures

R. D. Willink

Metrologia, 2007, 44(3), L33-L35.
http://www.springerlink.com/content/620271721173426r/?p=767ba2c9e4d24b2c9b524899d2a56843&pi=7http://www.springerlink.com/content/v7447q6425760237/?p=aff577be974a4b889d9e4f5ccd417c19&pi=1http://www.springerlink.com/content/j378u51561625745/?p=c6241b63fe41404b8d9f62453fb06fdd&pi=7http://www.springerlink.com/content/t788u13r2117u620/?p=156c9fafe1e14a069ac05437c21335f5&pi=9http://www.springerlink.com/content/kl406j509m340l13/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=0http://www.springerlink.com/content/kl406j509m340l13/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=0http://stacks.iop.org/met/44/73http://stacks.iop.org/met/44/73http://stacks.iop.org/met/44/105http://stacks.iop.org/met/44/105http://stacks.iop.org/met/44/L33http://stacks.iop.org/met/44/L33http://stacks.iop.org/met/44/L33http://stacks.iop.org/met/44/105http://stacks.iop.org/met/44/73http://www.springerlink.com/content/kl406j509m340l13/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=0http://www.springerlink.com/content/t788u13r2117u620/?p=156c9fafe1e14a069ac05437c21335f5&pi=9http://www.springerlink.com/content/j378u51561625745/?p=c6241b63fe41404b8d9f62453fb06fdd&pi=7http://www.springerlink.com/content/v7447q6425760237/?p=aff577be974a4b889d9e4f5ccd417c19&pi=1http://www.springerlink.com/content/620271721173426r/?p=767ba2c9e4d24b2c9b524899d2a56843&pi=7


17/21

Uncertainty of functionals of calibration curves

R. D. Willink

Metrologia, 2007, 44(3), 182-186.

A generalization of the WelchSatterthwaite formula for use with correlated uncertaintycomponents

R. D. Willink

Metrologia, 2007, 44(5), 340-349.

2008

Measurement uncertainty evaluation for a non-negative measurand: an alternative to limit of

detectionAnalytical Methods Committee, The Royal Society of Chemistry


Revisiting the example of 'comparison loss in microwave power meter calibration' - arigorous, simple approach

Baratto A.C., Garcia G.A.[INMETRO]

Metrologia, 2008, 45(2), 241-248.

How to revise the GUM?

W. Bich

Accreditation and Quality Assurance, 2008, 13(4-5), 271-275.

The coverage factor in a Flatten-Gaussian distribution

Blzquez J., Garca-Berrocal A., Montalvo C., Balbs M.[CIEMAT, AMERPREM]

Metrologia, 2008, 45(5), 503-506.

A probabilistic approach to the analysis of measurement processes

Cox M.G., Rossi G.B., Harris P.M., Forbes A.[NPL, Univ. Studi Genova - DIMEC]

Metrologia, 2008, 45(5), 493-502.

COMMENT: Comment on 'A probabilistic approach to the analysis of measurementprocesses'

Lira I.[Pontificia Univ. Catlica de Chile]

Metrologia, 2009, 46(1), L8.

REPLY: Reply to the comment on 'A probabilistic approach to the analysis ofmeasurement processes'
http://stacks.iop.org/met/44/182http://stacks.iop.org/met/44/182http://stacks.iop.org/met/44/340http://stacks.iop.org/met/44/340http://stacks.iop.org/met/44/340http://www.springerlink.com/content/e17509803p255778/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=7http://www.springerlink.com/content/e17509803p255778/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=7http://www.springerlink.com/content/e17509803p255778/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=7http://stacks.iop.org/met/45/241http://stacks.iop.org/met/45/241http://www.springerlink.com/content/r466441365387237/?p=c2dcefd7913549f7bbcdca64a7552c8d&pi=11http://stacks.iop.org/met/45/503http://stacks.iop.org/met/45/493http://stacks.iop.org/met/46/L8http://stacks.iop.org/met/46/L8http://stacks.iop.org/met/46/L9http://stacks.iop.org/met/46/L9http://stacks.iop.org/met/46/L9http://stacks.iop.org/met/46/L9http://stacks.iop.org/met/46/L8http://stacks.iop.org/met/46/L8http://stacks.iop.org/met/45/493http://stacks.iop.org/met/45/503http://www.springerlink.com/content/r466441365387237/?p=c2dcefd7913549f7bbcdca64a7552c8d&pi=11http://stacks.iop.org/met/45/241http://stacks.iop.org/met/45/241http://www.springerlink.com/content/e17509803p255778/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=7http://www.springerlink.com/content/e17509803p255778/?p=f771beccc38d4cb38f0449bcf2dfc395&pi=7http://stacks.iop.org/met/44/340http://stacks.iop.org/met/44/340http://stacks.iop.org/met/44/182


18/21

Cox M.G., Rossi G.B., Harris P.M., Forbes A. [NPL, Univ. degli studi diGenova - DIMEC]

Metrologia, 2009, 46(1), L9-L10.

Usage of the uncertainty of measurement by accredited calibration laboratories when statingcompliance

M. Czaske

Accred. Qual. Assur., 2008, 13, 645651.

Measurement uncertainty is not synonym of measurement repeatability or measurementreproducibility...

P. De Bivre


A comparison of location estimators for interlaboratory data contaminated with value anduncertainty outliers

D. L. Duewer


Uncertainty evaluation for dynamic measurements modelled by a linear time-invariant system

Elster C., Link A.[PTB]

Metrologia, 2008, 45(4), 464-473.

Evaluating methods of calculating measurement uncertainty

Hall B.D.[MSL]

Metrologia, 2008, 45(2), L5-L8.

Application of consistency checking to evaluation of uncertainty in multiple replicatemeasurements

R. Kessel, M. Berglund, R. Wellum


Design of experiment for evaluation of uncertainty from sampling in the framework of thefitness for purpose concept: a case study

I. Kuselman

http://www.springerlink.com/content/b26328177g613015/?p=db336034870645148a8733436362b97a&pi=7http://www.springerlink.com/content/b26328177g613015/?p=db336034870645148a8733436362b97a&pi=7http://www.springerlink.com/content/c82kl7xht11mx073/?p=ea60be6f5d194cd4b1720c50c0d2004f&pi=2http://www.springerlink.com/content/c82kl7xht11mx073/?p=ea60be6f5d194cd4b1720c50c0d2004f&pi=2http://stacks.iop.org/met/45/464http://stacks.iop.org/met/45/L5http://stacks.iop.org/met/45/L5http://www.springerlink.com/content/45p5u353jq25654m/?p=b06e06c6217f43ba8a854d862be7518d&pi=2http://www.springerlink.com/content/45p5u353jq25654m/?p=b06e06c6217f43ba8a854d862be7518d&pi=2http://www.springerlink.com/content/e0517413168011u4/?p=db336034870645148a8733436362b97a&pi=5http://www.springerlink.com/content/e0517413168011u4/?p=db336034870645148a8733436362b97a&pi=5http://www.springerlink.com/content/e0517413168011u4/?p=db336034870645148a8733436362b97a&pi=5http://www.springerlink.com/content/e0517413168011u4/?p=db336034870645148a8733436362b97a&pi=5http://www.springerlink.com/content/45p5u353jq25654m/?p=b06e06c6217f43ba8a854d862be7518d&pi=2http://www.springerlink.com/content/45p5u353jq25654m/?p=b06e06c6217f43ba8a854d862be7518d&pi=2http://stacks.iop.org/met/45/L5http://stacks.iop.org/met/45/464http://www.springerlink.com/content/c82kl7xht11mx073/?p=ea60be6f5d194cd4b1720c50c0d2004f&pi=2http://www.springerlink.com/content/c82kl7xht11mx073/?p=ea60be6f5d194cd4b1720c50c0d2004f&pi=2http://www.springerlink.com/content/b26328177g613015/?p=db336034870645148a8733436362b97a&pi=7http://www.springerlink.com/content/b26328177g613015/?p=db336034870645148a8733436362b97a&pi=7


19/21

Comparison of GUM Supplement 1 and Bayesian analysis using a simple linear calibrationmodel

Kyriazis G.A.[INMETRO]

Metrologia, 2008, 45(2), L9-L11.

A non-parametric coverage interval

Lin S.-H., Chan W., Chen L.-A.[Nat Chiao Tung Univ, The University of Texas]

Metrologia, 2008, 45(1), L1-L4.

Use of uncertainty information for estimation of certified values. Comparison of fourapproaches using data from a recent certification exercise

T. P. J. Linsinger, A. Lamberty


The generalized maximum entropy trapezoidal probability density function

Lira I. [PUC]

Metrologia, 2008, 45(4), L17-L20.

On the long-run success rate of coverage intervals

Lira I. [PUC]Metrologia, 2008, 45(4), L21-L23.

MUSE: computational aspects of a GUM supplement 1 implementation

Mller M., Wolf M., Rsslein M. [ETH, Empa]

Metrologia, 2008, 45(5), 586-594.

Uncertainty on differential measurements and its reduction using the calibration bycomparison method

Ospina J., Canuto E. [Politecnico Torino]

Metrologia, 2008, 45(4), 389-394.

Uncertainty evaluation for complex propagation models by means of the theory of evidence

M. Pertile, M. De Cecco

Meas. Sci. Technol., 2008, 19, 055103 (10pp).
http://stacks.iop.org/met/45/L9http://stacks.iop.org/met/45/L9http://stacks.iop.org/met/45/L9http://stacks.iop.org/met/45/L1http://stacks.iop.org/met/45/L1http://www.springerlink.com/content/p4t236l1h371377l/?p=723f7b304da04529b6905005d7232472&pi=6http://www.springerlink.com/content/p4t236l1h371377l/?p=723f7b304da04529b6905005d7232472&pi=6http://www.springerlink.com/content/p4t236l1h371377l/?p=723f7b304da04529b6905005d7232472&pi=6http://stacks.iop.org/met/45/L17http://stacks.iop.org/met/45/L21http://stacks.iop.org/met/45/586http://stacks.iop.org/met/45/389http://stacks.iop.org/met/45/389http://stacks.iop.org/met/45/389http://stacks.iop.org/met/45/389http://stacks.iop.org/met/45/586http://stacks.iop.org/met/45/L21http://stacks.iop.org/met/45/L17http://www.springerlink.com/content/p4t236l1h371377l/?p=723f7b304da04529b6905005d7232472&pi=6http://www.springerlink.com/content/p4t236l1h371377l/?p=723f7b304da04529b6905005d7232472&pi=6http://stacks.iop.org/met/45/L1http://stacks.iop.org/met/45/L9http://stacks.iop.org/met/45/L9


20/21

Evaluating expanded uncertainty in measurement with a fitted distribution

Sim C.H., Lim M.H.[Univ. Malaya]

Metrologia, 2008, 45(2), 178-184.

An inconsistency in uncertainty analysis relating to effective degrees of freedom

Willink R.[IRL]

Metrologia, 2008, 45(1), 63-67.

Estimation and uncertainty in fitting straight lines to data: different techniques

Willink R. [IRL]

Metrologia, 2008, 45(3), 290-298.

Evaluation of measurement uncertainty and its numerical calculation by a Monte Carlomethod

G. Wbbeleret al.

Meas. Sci. Technol., 2008, 19, 084009 (4pp).

2009

An introduction to Bayesian methods for analyzing chemistry data. Part 1: An introduction toBayesian theory and methods.

N. Armstrong, D.B. Hibbert

Chemometrics and Intelligent Laboratory Systems2009, 97(2), 194-210.

Non-parametric estimation of reference intervals in small non-Gaussian sample sets

J. Bjerner, E. Theodorsson, E. Hovig, A. Kallner


An uncertainty evaluation for multiple measurements by GUM, III: using a correlationcoefficient

Gyeonghee Nam, Chu-Shik Kang, Hun-Young So, JongOh Choi


An introduction to Bayesian methods for analyzing chemistry data. Part II: A review of

applications of Bayesian methods in chemistry.D.B. Hibbert, N. Armstrong
http://stacks.iop.org/met/45/178http://stacks.iop.org/met/45/63http://stacks.iop.org/met/45/63http://stacks.iop.org/met/45/290http://stacks.iop.org/met/45/290http://stacks.iop.org/met/45/63http://stacks.iop.org/met/45/178


21/21

Chemometrics and Intelligent Laboratory Systems2009, 97(2), 211-220.

Contribution to a conversation about the Supplement 1 to the GUM

Possolo A., Toman B., Estler T. [NIST]

Metrologia, 2009, 46(1), L1-L7.

Implementation in MATLAB of the adaptive Monte Carlo method for the evaluation ofmeasurement uncertainties

M. Solaguren-Beascoa Fernandez, J. M. Alegre Calderon, P. M. Bravo Diez


Fiducial intervals for the magnitude of a complex-valued quantity

Wang C.M., Iyer H.K. [NIST, University of Colorado]

Metrologia, 2009, 46(1), 81-86.
http://stacks.iop.org/met/46/L1http://stacks.iop.org/met/46/81http://stacks.iop.org/met/46/81http://stacks.iop.org/met/46/L1

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