IPC D-36 Subcommittee - HATS-Tester.com · Microsoft PowerPoint - test_methods.ppt Author: Timothy...
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Via Reliability Test Methods Timothy A. Estes Conductor Analysis Technologies, Inc. Vicka E. White Honeywell, Inc. October 24, 2005 IPC D-36 Subcommittee
Transcript of IPC D-36 Subcommittee - HATS-Tester.com · Microsoft PowerPoint - test_methods.ppt Author: Timothy...
Via Reliability Test Methods
Timothy A. EstesConductor Analysis Technologies, Inc.
Vicka E. WhiteHoneywell, Inc.
October 24, 2005
IPC D-36 Subcommittee
Page 2
Acknowledgements
Vicka WhiteDewey WhittakerBob Neves
Page 3
Introduction
Experimental detailsBackgroundCoupon designsPreconditioningTest methods
Comparison dataCross-sectionsObservationsDiscussions
Page 4
Background
Compare three test methodsDual chamberHighly Accelerated Thermal Shock (HATS™)Current induced (IST)
Perform each test method as intendedTwo manufacturers
Coupons from same production lotSame material for all coupons (Tg = 175C)
Same assembly simulation (pre-conditioning) for all coupons
Page 5
Coupon Designs
General specification
Net specification
Dual Chamber / HATS nets
Page 6
Assembly Simulation (6x)
Note: PCQR2 Profile A
Page 7
Test Methods
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Box Plot
Box plots are used to display the distribution of the data. The box extends from the first quartile (25th percentile) to the third quartile (75th percentile), encompassing 50 percent of the population. A line extends from the first quartile to the minimum value and encompasses 25 percent of the population. Similarly, a line extends from the third quartile to the maximum value and encompasses 25 percent of the population. The median is indicated by an open circle.
Page 9
Data Analysis
Removed early failures from Manufacturer ADid not include nets that did not fail before 1000 cycles
Page 10
Initial Resistance Data
Page 11
Cycles to 10% Change in Resistance
Page 12
Dual Chamber / HATS Data
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Dual Chamber / HATS / IST Data
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HATS Manufacturer A
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HATS Manufacturer A
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IST Manufacturer A
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IST Manufacturer A
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HATS Manufacturer B
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IST Manufacturer B
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Observations
HATS and dual chamber showed the same trend by via size for both manufacturersAll three methods showed separation in capability between the two suppliers
B outperformed A for the 12-mil via
Dual chamber required fewer cycles than HATS which required fewer cycles than IST
