Ion milling, or Substrate cleaning.
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Transcript of Ion milling, or Substrate cleaning.
ConfidentialNovember 2008 1
Nordiko Technical Services Limited
500/550 Nest Business Park
Martin Road
Havant
Hampshire PO9 5TL
United Kingdom
Corporate Member
Confidential 1
Location 50° 51’ 54.67”, 0° 58’ 15.49”
Nordiko Technical Services
Limited
Nest Business Park
500 m2 (5,380 ft2)
70 m2 (750 ft2) cleanroom
Confidential 2
Introduction
Nordiko Limited Founded in 1972.
Sputtering - magnetron and RF diode sputtering.
Ion Beam technology - introduced in 1989.
First commercially available RF ion source.
Ion Beam Deposition.
Ion Beam Milling.
Nordiko Limited Acquired by Shimadzu Corporation 1998.
Shimadzu decided to close Nordiko in 2003.
•Nordiko Technical Services Limited - May 2003.
• Acquired by Anelva Corporation - June 2005.
• Anelva 100% owned subsidiary of NEC.
• NEC sold Anelva to Canon - October 2005.
• Bought out Canon - October 2011.
Ion MillingI can tell you from personal experience that not only does the
Nordiko Ion Source outperform the Veeco in terms of etch rate and
etch uniformity, the Nordiko source design /technology outperforms
Veeco with regards to maintenance intervals. The Veeco ion source
requires maintenance about two times per week, where the Nordiko
Source will go weeks or months in comparable production
environments.
I was the Headway Technology Equipment Engineer for the Veeco
ion mills in the very beginning, then later at Read-Rite. While
working at Read-Rite I was also responsible for the Veeco and
Nordiko Ion Beam Deposition systems. I've not been responsible for
the Nordiko ion mills, but I know the few who have and they agree,
the Nordiko system far outperforms in all categories.
Kevin Potts
3Confidential
5
Alpha 120Liner Load Lock Version
15, 20, or 25 cm ion source
150 mm wafer capability
MESC standard interface
Wafer Handling Platform
Random access
vacuum elevator
150 mm wafer
capbility
4
Confidential 5
7000 Etch - Oxidation Rectangular chamber with full
aperture access door.
Single axis substrate table
providing on-axis wafer rotation,
continuous, 0 to 60 rpm.
25 cm RF ion source.
Filamentless neutraliser.
Shutter.
Magnetically levitated turbomolecular pump, 1400 l.s-1.
Dry mechanical roughing pump.
Confidential 7
7500 Ion Mill
36 cm ion
source
Neutraliser
Rotary Work Table
Wafer Clamp
200 mm wafer SIMS Probe
11
RF Ion Source
FeaturesRF ion source.
Filamentless current neutralisation.
Magnetically confined glow discharge.
Embedded DC HT feedthroughs.
Good maintenance access.
Sources 5, 10, 15, 20, 25, 30 and 36 cm.
Benefits13.56 MHz plasma excitation.
High efficiency sources.
Rapid process qualification.
High performance beam accelerator.
Reliable operation in Oxygen.
Precision - Control.
+ve-ve
RF ion source
plasma bridge neutraliser
accelerator
ion beam
AcceleratorTriode.
Graphite or
Molybdenum
grids.
Stainless steel
support rings.
Confidential
12
Ion Source and Neutraliser
15 cm Ion Source Mk IIIRF excited.
Proven technology.
Production engineered.
Triode AcceleratorMolybdenum grids.
Robust.
Simple assembly.
Compact NeutraliserDC excited.
Confidential
13
Ion Extraction - Child-Langmuir
I = α a
D (
)
2
V 3/2
ex
4πε0
9
2
e m √
a = aperture radius
m = ion mass (amu)
V = V + V -+
D = electrode separation
Confidential
14
Triode Accel - Decel Extraction
+
+
+
-
-
glow
discharge
Vp
Vex = Vp + V+ + ∣V-∣
Eg:
Vp = 20
V+ = 500
V- = 1500
Vbeam = 520
V=0
V=2000
Accel Decel Output Beam
Vbeam = Vp + V+ + (V- - V-)
Vbeam = Vp + V+
Vbeam ≃ V+
Confidential
Rotary Substrate Table
15
FeaturesDual Axis Table
Rotation on sample axis.
Rotation to provide a variable inclination to the ion beam
or material deposition flux. Configurable for different
wafers/substrate sizes 150 to 300 mm.
Water cooled table.
OptionsHigh speed rotation, 1000 rpm.
Substrate heating.
Magnetic field projection, in the plane of the substrate.
Water cooled table.
Substrate cooling is key for pattern transfer in milling.
16 Confidential
Confidential 16
Random access vacuum cassette load lock/s.
Standard 25 wafer cassette.
Optical sensors for slide out detection.
Optical sensors for cassette mapping.
700 l.s-1 turbomolecular pump.
30 m3.hr-1 dry mechanical pump.
Combined vacuum gauge covering he range from
atmosphere to 1E-08 Torr.
VAT series 02.
VAT series 62 pipeline isolation valve.
Vacuum Cassette Load Lock
Confidential 17
Static cassette load lock.
Static four (4) wafer cassette.
Vertical travel of the transfer arm (35 mm) is used to pick
from four wafer slots within a static cassette.
Common vacuum environment to the robot transfer chamber.
No isolation valve between the load lock and the transfer
chamber.
700 l.s-1 turbomolecular pump.
28 m3.hr-1 dry mechanical pump.
Combined vacuum gauge covering he range from
atmosphere to 1E-08 Torr.
VAT series 02.
VAT series 62 pipeline isolation valve.
Ideal for research applications where small batches are often
processed
Vacuum Load Lock - Static Cassette
Confidential 18
Transfer Chamber
Transfer chamber.
Six port or Eight port.
Six port; two load ports and four
process ports.
Eight port; two load ports and six
process ports.
Optical sensors for wafer
tracking.
700 l.s-1 turbomolecular pump.
30 m3.hr-1 dry mechanical pump.
Three axis robot.
SCARA style - single end
effector.
Rotary vacuum seal, magnet
fluid feedthrough.
Z-axis seal, edge welded
bellows.
Aligner.
Optical CCD aligner.
Operates in concert with the robot.
Wafer centre alignment ±0.25 mm.
Angular alignment ±0.1 degree.
Control Automation System
FeaturesSystem is not a PLC.
• Modular computer with industrial I/O.
• Intel micro-processor.
• OS is Windows CE.
• HMI on a separate PC.
InstallationsFourteen installations.
• Three new systems +.
• Eleven field retro-fits.• Ten in USA.
• One in Japan. ⎬production tools.
Confidential 1920
Control Automation System
Confidential20
FeaturesCPU - only Ethernet &
COM1 ports.
• No video, no keyboard,
no mouse.
• Networked PC for user
interface, HMI.
• Flash storage, no
rotating hard disc.
• Low power CMOS - no
fans.
• Serial, digital & analogue
I/O modules.
• No back-plane - I/O
modules build the bus.
• Intelligent
Instrumentation.