Investigating Impact of Soft Errors in Advanced Encryption Standard (AES) Circuits
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Investigating Impact of Soft Errors in Advanced Encryption Standard (AES) Circuits Author - Connor Reed Advisor – Dr. Qiaoyan Yu, Department of Electrical and Computer Engineering, UNH Introduct ion Bit-Flip # Test Reference s - This research was supported with funding from the National Science Foundation’s Research Experience for Teachers in Engineering Grant (ENG-1132648). Image Test - [2] http://en.wikipedia.org/wiki/Block_cipher_mode_of_operation - [1] https://www.nufo.org/meetings/files/2012_Laura_Dominik.pdf https://www.nufo.org/meetings/files/2012_Laura_Dominik.pdf - [3] Ibe, E.; Toba, T.; Shimbo, K.; Taniguchi, H. "Fault-based reliable design- on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons", On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International, On page(s): 49 - 54 -Soft errors are caused by transient charge from radiation entering sensitive areas in computing devices. -These errors can effect system operations, stored data in memory, or other hardware components. On chip, transistor s are vulnerable to radiation [1] - Base AES Code - http://buchholz.hs-bremen.de/aes/aes.htm - Special thanks to Dr. Yu, her team of graduate students, and the UNH Leitzel Center Method s CFB ECB O FB CBC 0.0000 10.0000 20.0000 30.0000 40.0000 50.0000 60.0000 70.0000 AES Averages by Rounds Round 1-7 Round 8 Round 9 Round 10 AES M ode Average N um berof Bit-Flips Radiati on types by energy level [3] Result s -Soft errors can be caused by certain types of radiation environments due to transistor use in computing devices. -AES can be vulnerable even with a single bit-flip. -Encrypting/Decrypting images using single error injected AES shows potential risks for storage of high profile data. Acknowledgmen ts [2] What AES Practically does [4] - [4] http://bityard.blogspot.com/2010/10/symmetric-encryption-with-pycrypto- part.html CBC CFB Faulty Normal CFB Zoomed In [2] Organizations use AES to encrypt data on hardware like this [5] - [5] http://www.net-security.org/secworld.php?id=6531 OFB No Fault (top) vs Fault (bottom) Original Encrypted Decrypted Summary Injected single errors during first round of AES (red circles) at various locations to 128 bit blocks (6200 unique fault locations) using Matlab Simulation
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Investigating Impact of Soft Errors in Advanced Encryption Standard (AES) Circuits Author - Connor Reed Advisor – Dr. Qiaoyan Yu, Department of Electrical and Computer Engineering, UNH. Results. Image Test. Introduction. Bit-Flip # Test. FaultyNormal. - PowerPoint PPT Presentation
Transcript of Investigating Impact of Soft Errors in Advanced Encryption Standard (AES) Circuits
Investigating Impact of Soft Errors in Advanced Encryption Standard (AES) CircuitsAuthor - Connor Reed
Advisor – Dr. Qiaoyan Yu, Department of Electrical and Computer Engineering, UNH
Introduction Bit-Flip # Test
References
- This research was supported with funding from the National Science Foundation’s Research Experience for Teachers in Engineering Grant (ENG-1132648).
Image Test
- [2] http://en.wikipedia.org/wiki/Block_cipher_mode_of_operation
- [1] https://www.nufo.org/meetings/files/2012_Laura_Dominik.pdfhttps://www.nufo.org/meetings/files/2012_Laura_Dominik.pdf
- [3] Ibe, E.; Toba, T.; Shimbo, K.; Taniguchi, H. "Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons", On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International, On page(s): 49 - 54
-Soft errors are caused by transient charge from radiation entering sensitive areas in computing devices.
-These errors can effect system operations, stored data in memory, or other hardware components.
On chip, transistors are vulnerable to radiation [1]
- Base AES Code - http://buchholz.hs-bremen.de/aes/aes.htm
- Special thanks to Dr. Yu, her team of graduate students, and the UNH Leitzel Center
Methods
CFB ECB OFB CBC0.0000
10.0000
20.0000
30.0000
40.0000
50.0000
60.0000
70.0000
AES Averages by Rounds
Round 1-7 Round 8 Round 9 Round 10
AES Mode
Ave
rag
e N
um
be
r o
f Bit-
Flip
s
Radiation types by energy level [3]
Results
-Soft errors can be caused by certain types of radiation environments due to transistor use in computing devices.
-AES can be vulnerable even with a single bit-flip.
-Encrypting/Decrypting images using single error injected AES shows potential risks for storage of high profile data.
Acknowledgments
[2]
What AES Practically does [4]
- [4] http://bityard.blogspot.com/2010/10/symmetric-encryption-with-pycrypto-part.html
CBC
CFB
Faulty Normal
CFB Zoomed In
[2]
Organizations use AES to encrypt data on hardware like this [5]
- [5] http://www.net-security.org/secworld.php?id=6531
OFB No Fault (top) vs Fault (bottom)
Original Encrypted Decrypted
Summary
Injected single errors during first round of AES (red circles) at various locations to 128 bit blocks (6200 unique fault locations) using Matlab Simulation
Qiaoyan Yu
use the same font in this section.Sperate reference and acknoledgement
Qiaoyan Yu
you may want to zoom in this piece specifically. i.e. add anothre small zoom in picture on the left.It is not noticable
Qiaoyan Yu
soft error does not affect software.
Qiaoyan Yu
put reference IDs for each pictures that you borrowed.Reference section add [1], [2], etc. Then use reference ID here
Qiaoyan Yu
why you highlight all encryption units? one is enoughPlus, you do not need add all modes here.In stead, you may want to add how AES works.
