Intro to FinFet

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    Introduction to FinFet

    Haiying Zhao

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    What does FinFet look like

    Source Drain

    Gate

    Source Drain

    Gate

    Source Drain

    Gate

    3D view of FinFET

    3D view of multi-fin

    FinFET

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    What does FinFet look like

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    Moores law and scaling theory

    Ideal scaling:

    Reduce W,L by a factor of a

    Reduce the threshold voltage and supply voltage by a factor of a

    Increasing all of the doping levels by a

    (W,L,tox,VDD,VTH, etc, are scaled down by a factor a)

    For a ideal square-law device, Id is reduced by a, but gm and intrinsic gain

    Gm* ro remain the same.

    As scaling into submicron region, Short Channel effects prevent further

    scaling.

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    Barrier lowering increases as channel length is reduced, even at zero applied drain bias,

    because the source and drain form pn junction with the body, and so have associated built-in

    depletion layers associated with them that become significant partners in charge balance at

    short channel lengths, even with no reverse bias applied to increase depletion width

    Short Channel Effects:DIBL

    DIBL: drain induced barrier lowering. DIBL = d(Vth)/d(Vds)

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    Short Channel Effects: Subthreshold swing

    Biasing a nmos in subthreshold resgion, Vgs < Vth, Vds is large enough.

    Id = u Cd W/L (KT/q)^2 (exp(Vgs Vth)/M))

    Cd is capacitance of the depletion layer under gate.

    M = (1 + Cd/Cox)*KT/q

    Id = f(Vgs-Vth)

    To turn off the transistor, How much reduction of (Vgs-Vth) could lead to a small

    enough Id.

    Subthreshold Swing S = d(Vgs)/d(log(Id)) = 2.3 KT/q( 1+ Cd/Cox)

    The smaller S is , the better it is.

    Bad Subthreshold Swing will result in higher off-state current if the Vgs appliedto turn off the transistor is the same.

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    V = u E ( E is small enough)

    V = Vsat ( E is strong enough)

    As Vgs increases , the drain current saturates well before pinch-off occurs.

    Short Channel Effects: Velocity Saturation

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    Barrier lowering increases as channel length is reduced, even at zero applied drain bias,

    because the source and drain form pn junction with the body, and so have associated built-indepletion layers associated with them that become significant partners in charge balance at

    short channel lengths, even with no reverse bias applied to increase depletion width

    Short Channel Effects:DIBL

    DIBL: drain induced barrier lowering. DIBL = d(Vth)/d(Vds)

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    Conclusion

    To reduce short channel effects, we need to reduce Xd(channel depletion

    layer thickness), Xj( Junction depletion width),Xox (oxide layer

    thickness under gate).

    The scale length of bulk MOSFET is an indication of Lg. Lg>

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    Dealing with Short Channel Effects in bulk MOSFET

    1.Increasing body doping concentration2.Using halo implant

    High doping density results in:

    Lower carrier mobility;high tunneling effect which increases off-state currents;

    Larger depletion capacitors leading to high subthreshold swing which

    increases off-state currents;

    Larger parasitic capacitance, Cgd, Cds.

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    Dealing with Short Channel Effects in Fully depleted

    Silicon on Insulator (SOI)

    Use ultra-thin film (tsi is small) as the conducting body, depletion layer

    is confined in the film.( Xd

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    From FD/SOI to FinFET

    Bend up the gate and narrow the gate. Fin width = 2* film thicknessThe effect body thickness is reduced by 2. Xd can be regarded as

    Fin width /2. To obtain good control of SCE, Leff > 1.5*Wfin ( Fin

    width).

    Finfet can operate at two mode, single gate and double gate.

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    FinFet characteristics

    Lg = 15nm

    Lg = 30nm

    Threshold Voltage = 0.196 V

    Subthreshold Slope = 72 mV/decade

    Off Current = 70 A/m

    DIBL = 64.67 mV/V

    Some values:

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    Approximate dc I-V equations?

    Square law?

    One way is using nth power law to computer the FinFet current.

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    FinFet: Challenges or Opportunities

    Carrier mobility:

    Lightly doped or undoped fin body increases carrier mobility.

    Short channel length enables velocity overshoot, which increases

    mobility.

    Low Vth decreases the vertical electric field ,which increases carrier

    mobility.

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    Tunneling effects:

    Gate to channel tunneling,

    Band to band tunneling atPN junction

    FinFet: Challenges or Opportunities

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    Parasitic resistance: a raised source/drain structure can be used to reduce

    the parasitic resistance.

    However, the overlap capacitance is increased.

    Prasitic resistance is the main adverse factor which prevents finfets

    application, which leads to lower speed and high noise.

    FinFet: Challenges or Opportunities

    Cds

    Source

    DrainGate

    rds

    rdCgd

    Cgs

    ri

    rg

    rs

    gm*vgs

    vgs+ Cds

    Source

    DrainGate

    rds

    rdCgd

    Cgs

    ri

    rg

    rs

    gm*vgs

    vgs+

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    FinFet: big advantages

    1. Having excellent control of short channel effects in submicronregime and making transistors still scalable. Due to this reason, the

    small- length transistor can have a larger intrinsic gain compared to

    the bulk counterpart.

    2. Much Lower off-state current compared to bulk counterpart.

    3. Promising matching behavior.

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    Applications

    1. Low power design in digital circuit, such asRAM, because of its low off-state current.

    2. Power amplifier or other application in analog

    area which requires good linearity.