'International Symposium. Society for Information …SOCIETY FOR INFORMATION DISPLAY First Edition...

12
1998 SID INTERNATIONAL SYMPOSIUM DIGEST of TECHNICAL PAPERS she SOCIETY FOR INFORMATION DISPLAY First Edition May, 1998 ISSN 0098-966X Publisher: Society for Information Display 1526 Brookhollow Dr., Suite 82 Santa Ana, CA 92705-5421

Transcript of 'International Symposium. Society for Information …SOCIETY FOR INFORMATION DISPLAY First Edition...

Page 1: 'International Symposium. Society for Information …SOCIETY FOR INFORMATION DISPLAY First Edition May, 1998 ISSN0098-966X Publisher: Societyfor InformationDisplay 1526BrookhollowDr.,

1998

SID INTERNATIONAL SYMPOSIUM

DIGEST of TECHNICAL PAPERS

sheSOCIETY FOR INFORMATION DISPLAY

First Edition

May, 1998

ISSN 0098-966X

Publisher: Society for Information Display1526 Brookhollow Dr., Suite 82

Santa Ana, CA 92705-5421

Page 2: 'International Symposium. Society for Information …SOCIETY FOR INFORMATION DISPLAY First Edition May, 1998 ISSN0098-966X Publisher: Societyfor InformationDisplay 1526BrookhollowDr.,

Table of Contents

1: ANNUAL SID BUSINESS MEETING

PresidingAnthony C. Lowe President, Society for Information Display

SID Honors and Awards PresentationAndras I. Lakatos Chair, SID Honors and Awards Committee

2: FORMAL OPENING

5.3:

5.4:

Reflective AMLCD for Projection Displays: D-ILA 33H. Kurogane, K. Dof, T. Nlshlhata, A. Honma, M. Furuya,

S. Nakagaki, I. Takanashi Victor Company of Japan, Ltd.,Kanagawa, Japan

Silicon-Chip-Based Reflective PDLC Light Vaive for ProjectionDisplay 37

T. Nagata, I. Takemoto, T. Miyazawa, A. Asano, K. Yanagawa,S. Nakamura, H. Nakagawa, K. Saltou, N. Okabe HitachiElectron Tube & Devices, Chiba, Japan

K. Matsumoto, A. Iguchl Hitachi Device Engineering Co.,Ltd., Chiba, Japan

Welcoming Remarks

Russel A. Martin SID '98 General Chair

Mary Tllton SID '98 Technical Program Chair

Opening Ceremonies

Steve Somers Vice President of Engineering, Extron

Electronics, Anaheim, CA (Local SID member and

Technical Advisor for the Display Technology showcase)

3: KEYNOTE ADDRESSES

3.1:

3.2:

DVD In a Multi-Source, Multimedia EraDr. Hisashi Yamada, Chief Fellow Toshiba Corp., Kawasaki,

JapanThe Future of Displays in EntertainmentDr. Eric Haseltine, VP and Chief Scientist Creative

Technology, Disney Imaginaering, Walt Disney Corp.,Glendale, CA

6.1:

6.2:

6.3:

6.4L

6: POLYMER LAMINATES FOR LCDs

Invited Paper: Recent Developments on Optical Films for

LCDs

N. Kurata Sumitomo Chemical Co., Ltd., Osaka, Japan

A High-Performance Novel Polarizer Based on DyestuffN. Hayashi, K. Ogino, N. Kurata, F. Fujita Sumitomo

Chemical Co., Ltd., Ehime, Japan

Plastic VGA Reflective Cholesterio LCDs with Dynamic Drive.

G. M. PodoJII, D. J. Davis, X.-Y. Huang, N. Miller, J. W. DoaneKent Displays, Kent, OH

Late-News Paper: A Cost-Effective Method for ProducingAnti-Reflection Films

H. C. Choi, R. L. Jones, P. Nagarkar, W. Smyth, J. WangPolaroid Corp., Waltham, MA

43

47

51

55

4: ORGANIC DISPLAYS

4.1:

4.2:

4.3:

4.4L:

Invited Paper: Full-Color Organic EL DisplayC. Hosokawa, M. Matsuura, M. Elda, K. Fukuoka, H. Tokailin,

T. Kusumoto Idemitsu Kosan Co., Ltd., Chiba, Japan

Design of an Improved Pixel for a Polysilicon Active-Matrix

Organic LED DisplayR. M. A. Dawson, Z. Shen, D. A. Furst, S. Connor, J. Hsu,

M. G. Kane, R. G. Stewart, A. Iprl Sarnoff Corp.,Princeton, NJ

C. N. King, P. J. Green, R. T. Flegal, S. Pearson, W. A. Barrow,

E. Dickey, K. Ping Planar America, Beaverton, OR

C. W. Tang, S. Van Slyke, F. Chen, J. Shi Eastman Kodak

Co., Rochester, NYJ. C. Sturm, M. H. Lu Princeton University, Princeton, NJ

Polymer LED Displays: Device Performance and Applications .

I. D. Parker, E. Baggao, P. Bailey, Y. Cao, S. Draeger, A. J. Heeger,J. Kamlnski, C. Knudson, J. Long, T. Marx, B. Nilsson,

J. Peltola, R. PHanzer, M. Raffetto, T. Ronnfeldt, B. Webber,

G. Yu, C. Zhang UNIAX Corp., Santa Barbara, CA

Late-News Paper: Ink-Jet Printing Technology and Its

Application in Polymer Multicolor EL DisplaysY. Yang, J. Bharathan UCLA, Los Angeles, CA

15

19

7: AVIONICS DISPLAYS

7.1: Invited Paper: Application of Backlit AMLCDs to Avionics 61

L. E. Tannas, Jr. Tannas Electronics, Orange, CA

7.2: Helmet-Mounted-Display CRT Developments ,...65

S. 0. K. Agyare, S. T. Darlington, C. Saunders Brimar Ltd.,Manchester, UK

7.3L: IPS-Mode TFT-LCDs for Aircraft Applications 70

K. Kobayashi, Y. Masutanl, K. Nakashima, Y. Nlwano,

M. Nishlmura, S. Tahata, Y. Morll Mitsubishi Electric

Corp., Kumamoto, JapanL. Lamberth, R. Laddu, M. Coyle, V. Komenda, C. Esposito,

K. Sarma Honeywell, Phoenix, AZ

8: COLOR CRTs

5: REFLECTIVE LIGHT VALVES

5.1: Invited Paper: High-Information-Content Projection DisplayBased on Reflective LC on Silicon Light Valves 25

R. L. Melcher IBM T. J. Watson Research Center, Yorktown

Heights, NY

M. Ohhata, K. Enaml IBM Display Business Unit, Shiga,Japan

5.2: Invited Paper: Grating Light Valve Technology: Update and

Novel Applications 29

D. T. Amm, R. W. Corrlgan Silicon Light Machines,

Sunnyvale, CA

8.1: Invited Paper: Recent and Future Trends of CRT Technology.. 77

N. Arlmoto Matsushita Electronics Corp., Osaka, Japan

8.2: Flat-Face 46-cm Color Display Tube: DIAMONDTRON NF 81

A. Inoue, M. Ho|o, K. Maklno, N. Hlnomoto, T. Yazu, S. Okuda,K. Shono Mitsubishi Electric Co., Kyoto, Japan

8.3: A High-Deflection-Sensitivity CDT with Rectangular Yoke 85

Y. Sano, M. Yokota, T. Kojlma, H. Murata, H. Mori Toshiba

Corp., Saitama, Japan

8.4: Development of a 100° 41-cm CDT With NEAT-MDF Electron

Gun 89

G. Iwata, H. Yoshioka, S. Shlrai Hitachi Ltd., Chiba, Japan

III

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9:FEDsl 12: APPLICATIONS: BACKLIGHT TECHNOLOGY

9.1: Development of a 5.1 -in. FED 95

S. J. Newman, R. T. Smith, C. Penn Motorola Flat Panel

Display Division, Tempe, AZ

9.2: ThinCRT Flat-Panel-Display Construction and Operating'Characteristics 99

C. J. Spindt, T. Fahlen, J. M. Macaulay, C. J. Curtin, R. M. Duboc

Candescent Technologies Corp., San Jose, CA

9.3: High-Resolution 5-ln. Full-Color FEDs with New AgingTechnique 103

J. M. Kim, N. S. Park, J. H. Choi, H. W. Lee, J. W. Kim, S. S. HongSamsung Advanced Institute of Technology, Suwon, Korea

S. Choe Samsung Display Devices, Suwon, Korea

9.4: Residual Gas Effects on the Emission Characteristics of Active

Mo Field-Emission Cathode Arrays 107

B. R. Chalamala Motorola Flat Panel Display Division,Tempe, AZ

R. M. Wallace Texas Instruments, Dallas, TX

B. E. Gnade DARPA/ETO, Arlington, VA

12.1: LED Backlight for LCDs 149F. Yamada, Y. Sakagulchi IBM Research, Tokyo Research

Laboratory, Yamato, Japan

12.2: High-Efficiency and High-Visual-Quality LCD BacklightingSystem 153

A. Horibe, M. Baba, E. Nihel, Y. Koike Keio University,Yokohama, Japan

12.3: Novel Backlight with High Luminance and Low Power

Consumption by Prism-on-Light-Pipe Technology 157

Y. Oki Stanley Electric Co., Ltd., Kanagawa, Japan

12.4L: Late-News Paper: Polymer LEDs for Edge-Lighting Reflective

LCDs 161

C. C. Bowley, S. Atirotpunya, D. T. Tuan, C. M. Collce,G. P. Crawford Brown University, Providence, Rl

Y. Yang UCLA, Los Angeles, CA

12.5L: Late-News Paper: Single-Stage CCFL-Backlight Resonant

Inverter Using PWM Dimming Methods 165

C. Coles Micro Linear Corp., San Jose, CA

10: PROJECTION SYSTEMS 13: VISUAL PERFORMANCE ISSUES IN CRTs

10.1: Invited Paper: Illumination Optics for LC Projection Displays .113

Y. Honguh Toshiba Corp., Kawasaki, Japan

10.2: High-Resolution High-Brightness LCD Projectors 117

H. Nagal, S. Kamizawa, H. Koizumi Mitsubishi Electric Corp.,Kanagawa, Japan

K. Nishno, F. Suzuki Mitsubishi Electric Corp., Kyoto, JapanH. Shlmomura Nikon Co., Kanagawa, Japan

10.3: White Enhancement for Color-Sequential DLP 121

A. Kunzman, G. Pettitt Texas Instruments, Dallas, TX

10.4: Phased Reset Timing for Improved Digital Mlcromirror Device

(DMD) Brightness 125

D. Doherty, G. Hewlett Texas Instruments, Piano, TX

13.1: A Psycophysical Analysis of the Effects of CRT Mask Structure

on Image Quality 171

A. Kojima Sony Motomiya Corp., Fukushima, JapanN. Shiramatsu Mitsubishi Electric Corp., Amagasaki, Japan

13.2: A Fourier Analysis of CRT Displays Considering the Mask

Structure, Beam Spot Size, and Scan Pattern 175

Y. Kato, A. Yasuda, K. Ichida Sony Display Co., Kanagawa,Japan

13,3: A Theoretical Analysis and Empirical Evaluation of the Effects

of CRT Mask Structure on Character Readability 179

A. A. S. Sluyterman Philips Components, Eindhoven, The

Netherlands

14: FEDs II

11: LC ALIGNMENT

11.1: Polyimide Films Designed to Produce High Pretilt Angles with a

Single Linearly Polarized UV Exposure 131

M. Nlshlkawa Liquid Crystal Institute, Kent State University,Kent, OH and JSR Co., Ltd., Yokkaichi, Japan

B. Taheri and J. L. West Liquid Crystal Institute, Kent State

University, Kent, OH

11.2: Withdrawn

11.3: Chemically Imidlzed Polyimide as an Alignment Material for

LCDs 135

V. G. Nazarenko Liquid Crystal Institute, Kent State

University, Kent, OH and Institute of Physics, Ukrainian

Academy of Sciences, Ukraine

A. K. St. Clair, R. Klouda, R. D. Polak, Yu. Nastishln,

0. D. Lavrentovlch Liquid Crystal Institute, Kent State

University, Kent, OH

11.4L: Late-News Paper: Very High Pretilt Alignment and Its

Application In Pi-Cell LCDs 139

M. Xu, D.-K. Yang, P. J. Bos Liquid Crystal Institute, Kent

State University, Kent, OHX. Jin, F. W. Harris, S. Z, D. Cheng The University of Akron,

Akron, OH

11.5L: Late-News Paper: A Novel Wide-Viewing-Angle Motion-Picture

LCD 143

H. Nakamura, K. Mlwa, M. Noguchi, Y. Watanabe, J. MamlyaIBM Japan, Ltd., Kanagawa, Japan

J. Watanabe, Y. Nishlura, Y. Shinagawa Fuji Photo Film Co.,Ltd., Kanagawa, Japan

14.1: Invited Paper: Electron Trajectory Analysis of Surface

Conduction Electron Emitter Displays (SEDs) 185

M. Okuda, S. Matsutani, A. Asal, A. Yamano, K. Hatanaka,

T. Hara, T. Nakagirl Canon Research Center, Kanagawa,

Japan

14.2: Monolithic Integration of Poly-Si FEA and TFT for Active-Matrix

FEDs 189

Y.-H. Song, J. H. Lee, S.-Y. Kang, J.-M. Park, K. I. Cho ETRI,

Taejon, Korea

14.3: Luminance Improvement of Low-Voltage Full-Color FEDs 193

M. Tanaka, Y. Nohara, K. Tamura, Y. Sato, H. Sakurada

Futaba Corp., Chiba, Japan

15: LARGE-AREA DISPLAYS

15.1: A New LC Rear-Projection Display Based on the "Color-GratingMethod" 199

H. Kanayama, D. Takemori, Y. Furuta, T. Hachlya, T. Mlwa,

K. Yamauchi, K. Terada, Y. Funazou, S. Klshimoto

Sanyo Electric Co., Ltd., Osaka, Japan

15.2: A 42-in. PALC Display with Wide-Viewing-Angle Using ASM

Mode 203

N. Yamada, K. Hlmejima, T. Akal, H. Uede Sharp Corp., Nara,

JapanM. Imal, K. Endo, T. Kaklzakl Sony Mizunami Corp., Gifu,

JapanR. van Gelder, C. van Winsum Philips Components,

Eindhoven, The Netherlands

iv

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Table of Contents

15.3: Switching Characteristics of the PALC Display., 207K. J. Ilclsin Technical Visions, Inc., Beaverton, OR

K. E. Kuljk Philips Research Laboratories, Eindhoven, TheNetherlands

15.4: A Large-Area Tiled Gyricon Display 211

B. Preas, F. Vest, E. Richley, N. Sheridon, R. Sprague Xerox

PARC, Palo Alto, CA

18.4: Improvement of Contrast and Brightness by Using Crystal

Pigment Phosphor Screens 266

M. Kawasaki, N. Tanl, R. Onlshl Matsushita Electric Corp.,

Osaka, Japan

18.5: Invited Paper: Vacuum Issues and Gettering Conventional and

Flat CRTs 270

B. Ferrarlo SAES Getters S.p.A., Lainate, Italy

16: REFLECTIVE LCDs 19:C0L0R PLASMA DISPLAYS!

16.1: Invited Paper: The Trends of Reflective LCDs for Future

Electronic Paper 217

T. Ogawa, S. Fujlta, Y. Iwal, H. Kosekl Matsushita Electric

Industrial Co., Ltd., Ishikawa, Japan

16.2: Influence of Rough Surface on the Optical Characteristics of

Reflective LCD with a Polarizer 221

Y Itoh, S. Fujiwara, N. Klmura, S. Mlzushlma, F. Funada,

M. Hljiklgawa Sharp Corp., Nara, Japan

16.3: A Reflective Full-ColorTN-LCD with a Single Polarizer UsingLow-Temperature Poly-Si TFTs 225

Y. Iwai, H. Yamaguichi, T. Seklme, H. Klnoshlta, S. Fujita,H. Mlzuno, T. Hatanaka, T. Ohtanl, T. Ogawa Matsushita

LCD Division, Ishikawa, Japan

17: BACKLIGHTING SYSTEMS

17.1: Invited Paper: Resonant-Cavity Electroluminescent Backlights 231

L. J. Rothberg University of Rochester, Rochester, NY

R. H. Jordan Eastman Kodak Research Labs, Rochester, NY

A. Dodabalapur, R. E. Slusher Lucent Technologies, Murray

Hill, NJ

17.2: A Backlight System Providing Variable Viewing Angles for

Transmissive LCDs 235

W. Sautter, T. Kallfass, G. Bader, E. Lueder University of

Stuttgart, Stuttgart, GermanyW. Koenig NCR Augsburg, GermanyK. R. Knight NCR Scotland, Ltd., Dundee, Scotland

17.3: Optimized Photoluminescent Phosphors for UV-Exclted

Light-Emitting LCD Systems 239

A. C. Newport and A. Vecht University of Greenwich,

London, UK

P. A. Bayley Screen Technology Ltd., Cambridge, UK

W. A. Crossland Cambridge University, Cambridge, UK

17.4: A High-Efficiency Cold-Cathode Fluorescent Lamp for a

Backlighting Unit 243

H. Noguchl Harrison Electric Co., Ltd., Ehlme, Japan

17.5: Rapid-Response Fluorescent Lamps for Field-SequentialFull-Color LCDs 247

T. Fukuzawa, T. Toyooka, Y. Sakaguchl, K. Takeda, F. Yamada

IBM Tokyo Research Laboratory, Kanagawa, Japan

19.1: Invited Paper: High-Contrast 50-in. Color ac Plasma Display

with 1365 x 768 Pixels 275

Y. Sano, T. Nakamura, K. Mumomura, T. Konlshi, M. Usui,

A. Tanaka, T. Yoshida, H. Yamada, O. Olda, R. FuJImuraNEC Corp., Kanagawa, Japan

19.2: Cell Structure and Driving Method of a 25-in. (64-om) DiagonalHigh-Resolution Color ac Plasma Display 279

H. Hirakawa, T. Katayama, S. Kuroki, T. Kanae, H. Nakahara,

T. Nanto, K. Yoshlkawa, A. Otsuka, M. Wakltani FujitsuLtd., Hyogo, Japan

19.3: Reducing the Number of Scan Drivers in ACPDPs by an Order

of Magnitude Using Gas-Discharge AND Logic 283

M. Ishil, T. Aikawa, K. Igarashi, S. Mikoshiba The University

of Electro-Communications, Tokyo, JapanJ. D. Ryeom, K. Y. Park, C. B. Park Samsung Display

Devices Co., Ltd., Chonan, Korea

19.4: Improvement of Moving-Video Image Quality on PDPs by

Reducing the Dynamic False Contour 287

T. Shigeta, N. Saegusa, H. Honda, T. Nagakubo, T. AklyamaPioneer Electronic Corp., Kofu, Japan

20: NOVEL AMLCDs

20.1: Invited Paper: AMLCD on Plastic Substrates.t

293

J. N. Sandoe PW//ps Research Laboratory, Redhill, UK

20.2: A Simple Reflective TFT-LCD Fabrication Using Four

Photomask Processes 297

Y. Yamaguichi, M. Kanoh, M. Mukalnari, H. Ikeno, N. Ikeda,

H. Hayama NEC Corp., Kanagawa, Japan

20.3: A MIM-Addressed 16-in. EWS PDLC Display with Decreased

Capacitance301

M. Koeberle, G. Maler, E. Lueder, T. Kallfass University of

Stuttgart, Stuttgart, Germany

20.4 A New Pixel Structure: Storage Capacitor Utilizing the Adjacent

Pixel Electrode as the Reference Electrode 305

B. S. Bae, J. H. Lee, J. H. Huh, W. K. Lee, S. Y. Joo, J. H. Souk

Samsung Electronics Co., Kyungkl-Do, Korea

K. N. Kim, J. I. Ryu, K. H. Yoo, J. Jang Kyunghee University,

Seoul, Korea

18: CRT TECHNOLOGY I

18.1: Invited Paper: Recent Developments In Surface Coatings for

CRTs 253

H.-S. Tong, C.-M. Hu Chunghwa Picture Tubes, Ltd.,

Taoyuan, Taiwan

18.2: Thin Coating of Anti-Smudge Layer for AR Film on CRTs 258

H. Hanaoka Sony Display Co., Kanagawa, Japan

O. Ito, K. Kaneko Sony Mizunami Corp., Gifu, Japan

H. Kondo Sony Recording Media & Energy Co., Miyagi,

Japan

18.3: A New Layer System for Wideband Anti-Reflection Coatings

Designed for CRTs 262

T. Oyama, H. Ohsakl, Y. Hayashl, Y. Tachlbana Asahi Glass

Co., Ltd., Yokohama, Japan

21: REFLECTIVE AND WIDE-VIEWING-ANGLE DISPLAYS

21.1: Invited Paper.' Reflective-Slngle-Polarizer Low- and High-TwistLCDs 311

M. D. Tlllin, M. J. Towler, K. A. Saynor, E. J. Beynon Sharp

Laboratories Europe, Ltd., Oxford, UK

21.2: Optimum Film Compensation Modes for TN and VA LCDs 315

J. Chen, K.-H. Kim, J.-J. Jyu, J. H. Souk SamsungElectronics Co., Kyungki-Do, Korea

J. R. Kelly, P. J. Bos Liquid Crystal Institute, Kent State

University, Kent, OH

21.3: Electro-Optical Performance of a Vertically Aligned LCD Mode

Using Electrically Controlled Self-Compensation 319

W. Liu, J. Kelly Liquid Crystal Institute, Kent State

University, Kent, OH

J. Chen Samsung Electronics Co., Kyungki-Do, Korea

V

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22: NAVIGATION AND VEHICLE DISPLAY SYSTEMS 26: MATERIALS FOR LCDs

22.1: Invited Paper: Automotive Navigation Display Systems 325

Y. Utsui, H. Aral, S. Washlno, H. Ideno Mitsubishi Electric

Corp., Hyogo, Japan22.2: Evaluation of Flat-Panel-Display Technologies for an

Automotive Night-Vision HUD System 329

A. Stevens, C. Breslln Pilkington Optronics, Glasgow,Scotland

R. Jonas Pilkington Optronics, Denbighshire, Wales

P. Mulvanny Jaguar Cars Ltd., Coventry, UK

22.3: Tilting Disc: A Real Scale Interface for Cyberspace 333

M. Kobayashi, S. Shiwa, A. Kitagawa, S. Ichinose NTT

Human Interface Laboratories, Kanagawa, Japan

26.1: Invited Paper: Materials and Components Optimization for IPS

TFT-LCDs 389K. Kondo Hitachi Research Laboratory, Ibaraki, JapanS. Matsuyama, N. Konlshi, H. Kawakaml Hitachi Electron

Tube and Devices, Chiba, Japan

26.2: Liquid-Crystal Material Development of IPS TFT Displays 393D. Klement, K. Taruml Merck KGaA, Darmstadt, GermanyH. Numata, H. Ichinose, S. Naemura Merck Japan, Ltd.,

Kanagawa, Japan

26.3: A Novel Method for the Formation of Polymer Walls in

LC/Polymer Displays 397Y. Kim, J. Francl, B. Taheri, J. L. West Liquid Crystal

Institute, Kent State University, Kent, OH

23:CRTTECHNOLOGYII27: IMAGE RESOLUTION

23.1:

23.2:

23.3:

23.4:

IR Radiative Heating of CRTs

L. van der Tempel Philips Research Laboratories,

Eindhoven, The Netherlands

H. Galenkamp Philips Display Components, Elndoven, TheNetherlands

339

343Development of New Ferrite Material for Deflection Yoke Core.

Y. Masuda, T. Aklyama, M. Kltaoka, S. Otobe, H. Takei FDK

Corp., Shizuoka, Japan

Vibration Analysis of Trinitron Aperture Grille 347

H. Taguchi Sony Corp., Kanagawa, Japan

K. Seto Nlhon University, Tokyo, JapanF. Dol, M. Ren Vibration Control Laboratory, Kanagawa,

JapanThe Camel CRT 351

A. A. S. Sluyterman Philips Components, Eindhoven, The

Netherlands

27.1: Invited paper: Hybrid System Combined with Digital Camerasand Hardcopy 403

J. Okada Se/7co Epson Corp., Nagano, Japan

27.2: Motion Dithering for Increasing Perceived Image Quality forLow-Resolution Displays 407

D. R. Beck Stanford University, Stanford, CA

27.3: Increased Resolution on an ICFLCD Display throughField-Sequential Subpixel Illumination 411

J. Elchenlaub, M. Kataflaz Dimension Technologies,Rochester, NY

27.4: Investigation into Variable Addressibllity Image Sensors and

Display Systems 415K. Kubala, A. Hatch, R. B. Hooker University of Colorado,

Boulder, CO

L. Lewis Ball Aerospace & Technologies Corp., Boulder, CO

24: COLOR PLASMA DISPLAYS II

24.1: Microbridge Plasma-Display Panel 357

K. C. Choi, B. Hallock, R. A. Johnson, G. Dick HyundaiPlasma Display Division, Hawthorne, NY

24.2: Direct Observation of VUV Rays for Surface-Discharge ac

Plasma Displays by Using an Ultra-High-Speed Electronic

Camera 361M. Sawa, H. Uchiike, S. Zhang, K. Yoshlda Hiroshima

University, Higashi-Hiroshima, Japan24.3: Analysis of He-Xe Discharge Kinetics in an ACPDP Cell 365

H. S. Jeong, J. H. Seo, C. K. Yoon, J. K. Kim, K.-W. WhangSeoul National University, Seoul, Korea

25: a-Si AMLCD DEVICES AND PROCESSES

25.1: Similarities between TFT Arrays for Direct-Conversion X-RaySensors and High-Aperture AMLCDs 371

W. den Boer, S. Aggas, T. Gu, Y. H. Byun, C.-B. Qlu, S. V. Thomsen

OIS Optical Imaging Systems, Northville, Ml

25.2: Simple Process of Hillock-Free Ai-Gate Metallization withoutITO/AI Contact Problems for Large-Area TFT-LCDs 375

H. S. Seo, J. B. Choi, D. C. Yun, C. D. Kim, H. S. SohLG Electronics, Kyongki-Do, Korea

25.3: A Novel Self-Aligned Coplanar a-Si TFT 379

S. K. Kim, Y. J. Choi, S. I. Cho, K. S. Cho, J. Jang KyungHee University, Seoul, Korea

25.4: High-Performance Top-Gate a-Si:H TFTs for AMLCDs 383

C.-S. Chiang, S. Martin, J.-Y. Nahm, J. Kanicki University of

Michigan, Ann Arbor, Ml

Y. Ugal, T. Yukawa, S. Takeuchl Hosiden and Philips DisplayCorp., Hyogo, Japan

28.1:

28.2:

28.3:

28.4:

P-1:

P-2:

P-3:

28: CRT ELECTRON GUNS

A New Electron Gun with Active Convergence Lens System ... 421N. Kikuchl, N. Suml, M. Natorl, Y. Amano Sony Corp., Atsugl,

Japan

Analysis of Electron-Gun Focus Tracking Using Emittance

Techniques 425

D. A. New Sarnoff Corp., Princeton, NJ

Projection CRT Electron Gun with High-Resistive-Layer Focus

Lens 429R. Mural, M. Aoki, M. Ohtanl, K. Yamashlta, T. Hlratanl

Matsushita Electric Industrial Co., Ltd., Osaka, JapanM. Konda, H. Ohmae, T. Hoshl, M. Ohmori Matsushita

Electronics Corp., Osaka, Japan

Electron-Gun Simulator including Work Function and Cathode

Potential Barrier 433K. Oku, K. Oshita, S. Shlrai Hitachi Electron Tube and

Devices, Chiba, JapanH. Mlyazaki Hitachi Device Engineering Co., Chiba, Japan

POSTER SESSION

Active-Matrix LCDs

The Application of Tetraethooxysllane (TEOS) Oxide to a-Si:HTFTs as the Gate Insulator 439

J. K. Lee, J. B. Choi, S. M. Seo, C. W. Han, H. S. SohLG Electronics, Kyongki-Do, Korea

Withdrawn

The Effect of Plasma Treatment on the Off-CurrentCharacteristics of a-Si TFTs 443

S. Yamakawa, S. Yabuta, A. Ban, M. Okamoto, M. Katayama, Y. Ishll,M. Hljlklgawa Sharp Corp., Nara, Japan

VI

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P-4: A High-Performance Bi-Directional Super-MIM Diode with

Symmetrical and Shift-Free l-V Characteristics 447

S. Zhang, J. K. 0. Sin The Hong Kong University of Scienceand Technology, Clear WaterBay, Hong Kong

P-5: Threshold-Voltage Control of Short-Channel Poly-Si TFT byFlourine and Hydrogen Plasma Treatment 451

J. S. Yoo, C. M. Park, H. B. Choi, M. K. Han Seoul National

University, Seoul, Korea

B. S. Bae, H. J. Kim Samsung Electronics Co., Kiheung,Korea

P-6: Al-Nd-Ti-Alloy Films and Its Application to 6.7-in. SVGA

High-Aperture a-Si TFT-LCDs 455

K. Kamiya, J. Shiota, H. Ishli, T. Mlyashlta, S.-l. Sato, H. Aokl

Casio Computer Co., Ltd., Tokyo, Japan

P-7: Dual-Branch MIM Array Technology for Low-Cost AMLCDs 459

W. den Boer, V. Veerasamy, Y. Baron, M. Boyd, M. Friends, P. Voisin

OIS Optical Imaging Systems, Northville, Ml

LP-A: Late-News Poster: A Low-Temperature Poiy-Si TFT Reflective

XGA Array for LCPC Light Valve 463

M. Kunigita, N. Kato, K. Masumo, M. Yuki Asahi Glass Co.,

Ltd., Yokohama, Japan

LP-B: Late-News Poster: A 60-in. HDTV Rear-Projector with

Continuous-Grain-Silicon Technology 467

H. Ohtani, Y. Ogata, T. Mitsuki, M. Hirokl, S. Yamazakl

Semiconductor Energy Laboratory Co., Ltd., Atsugi, Japan

M. HIJIklgawa Sharp Corp., Tenri, Japan

Applications

P-8: Wide-Viewing-Angle AMLCD Optimized for Gray-Scale

Operation 471

R. Brlnkley, G. Xu, A. Abileah, J. Vanderploeg OIS Optical

Imaging Systems, Northville, Ml

P-9: TN-LCD Wide-Viewing-Angle Optimization 475

M. Jones, G. Xu OIS Optical Imaging Systems, Northville, Ml

P-10: Low-Cost 3-D Visualization for Collaborative Mission Rehearsal

Applications 479

J. Vinarub, D. Gonthler, H. Veron The MITRE Corp.,

Bedford, MA

P-11: Analysis of Light-Guide Warp in a 14.1-in. LCD Backlight for

Notebook PCs 483

M. Ono, T. Tsunekawa IBM Japan, Ltd., Kanagawa, Japan

P-12: Holographic Reflectors for Enhanced Reflective LCDs 487

A. G. Chen, Q. Gao, R. Fan, A. Harton, K. Wyatt, Motorola,

Schaumburg, IL

G. Heldt Krystal Holographies International, Logan, UT

T. C. Felder, W. J. Gambogi, Jr., S. R. Mackara, K. W. Steijn,

S. H. Stevenson, T. J. Trout DuPont Holographic

Materials, Wilmington, DE

P-13: Characterizing Thin Films in the Flat-Panel-Display Industry

with Variable-Angle Spectroscopic Ellipsometry (VASE®) ..491

J. N. Hilfiker, R. A. Synowicki, J. S. Hale, C. BungayJ. A. Woollam Co., Lincoln, NE

P-14: Monte Carlo Modeling of Glare in CRTs for Medical Imaging... 495

A. Badano, M. J. Flynn Henry Ford Health System, Detroit, Ml

P-15: Local LC Alignment Near the Surface Defects 499

M. G. Tomilln S. I. Vavllov State Optical Institute,

St. Petersburg, Russia

P-16: Lamp Life Predictive Model for Avionics Backlights 503

R. P. Webster, L. Y. Nelson Korry Electronics, SeattlB, WA

P-17: Surface Profiler for 1100-mm Flat Panels: Dektak OSP1100

Overhead Scanning Stylus Profiler 508

W. Naumann, L. Bland, T. Cunningham, J. Grossman Veeco

Process Metrology, Santa Barbara, CA

P-18: Electrically Addressed Smectic-A LCDs and Their

Liquid-Crystal Microstructure 512

R. Fagerberg, L. Johnson, J. S. Rambech, S. Neegard,A. A. Dyrseth, B. Nossum SINTEF Electronics &

Cybernetics, Trondheim, NorwayL. Williams SINTEF Applied Chemistry, Olso, Norway

B. Holler PolyDisplay ASA, Sandefjord, Norway

LP-C:

P-19:

P-20:

P-21:

Late-News Poster: Influence of Electromagnetic Interference

on LCD Operation 516

A. Smlrnov, 0. Shadura, A. Pinaev, S. Bondarenko State

University of Informatics and Radioelectronics, Minsk,Belarus

Panichev, G. Vyrko Special Design Bureau Nemlga,Minsk, Belarus

M

Optimization of Deflection-Yoke Design Parameters 520

M. Maeda, H. Ohno, A. Murata Sony Display Co., Kanagawa,Japan

Polyimide Materials for Vacuum-Tube Applications 524

X. LI Southeast University, Nanjing, P. R. China

Investigation of a Low-Ohmic Hybrid One-Layer Coating 528

G. V. A. Aben, M. J. M. Somers, P. H. C. Hanssen, L. M. Schrooten

Philips Display Components, Eindhoven, The Netherlands

Display Manufacturing

P-22: Withdrawn

P-23: Novel Topcoat Planarization Derived from Cardo Resin 532

S. Kazama, Y. Mlyagawa, Y. Uchimiya, K. Fujlshlro, N. Yokoyama

Nippon Steel Chemical Co., Ltd., Electronic Materials

R&D Center, Chiba, Japan

T. Teramoto Nippon Steel Chemical Co., Ltd., Advanced

Materials Div., Tokyo, Japan

P-24: Run-to-Run Control of ITO Deposition Process 536

K. Khan, V. Solakhlan, J. Moyne University of Michigan, Ann

Arbor, Ml

A. Riccl, T. Gu OIS Optical Imaging Systems, Northville, Ml

P-25: Practical Machine-Vision-Based Automatic Optical Inspection

for ITO-Coated Thin Glass 540

N. R. Van Lieu Applied Films Corp., Boulder, CO

LP-M: FED Manufacturing Technology 544

X-Y. Dou, H-X. Wang, L-J. Song IRICO Group Co., XianYang,P. R. China

L-J. Huangfu, Y-J. Hual, C-C. Zhu Institute of Microelectronics,

Xl'an Jiaotong University, ShaanXi, P. R. China

LP-N: High-Optical-Density Ultra-Thin Black-Matrix System 548

R. W. Sabnis, M. D. Stroder, R. E. Nichols, E. G. Hays

Brewer Science, Rolla, MO

A. Yanagimoto, Y. Sone, Y. Watanabe, K. Ema Nissan

Chemical Industries, Ltd., Tokyo, Japan

P-26:

Display Measurement

A New Method to Measure the Twist Angle and Cell Gap of

Liquid-Crystal Cells 552

S. T. Tang, H. S. Kwok The Hong Kong University of Science

and Technology, Clear Water Bay, Hong Kong

P-27:

P-28:

P-29:

P-30:

Display Systems

A Small-Area Backlight Employing Divergent-Angle Beam

Rotator and Unique Double-Layer Micro-Prisms 556

C.-Y. Tal Clio Technologies, Holland, OH

Digital Zone Control for Geometry, Convergence, and

Uniformity Correction 560

J. R. Webb, R. Simpson Display Laboratories, Boulder, CO

Line-Image-Scanning Head Mounted Display 564

T. M. Aye, K. Yu, A. Kostrzewskl, G. Savant, J. Jannson

Physical Optics Corp., Torrance, CA

Liquid-Crystal Tunable Diffuser for Display Applications 569

T. M. Aye, S. Qlan, K. Yu, G. Savant, J. Jannson Physical

Optics Corp., Torrance, CA

VII

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Table of Contents

i Emissive Displays:

FEDs

P-31: Characterization of Emitting Carbon Films and Their Depositionon Glass Substrates 572

R. L. Fink, Z. Li Tolt, Z. Yanlv FEPET, Inc., Austin, TX

P-32: Cathodoluminescent Field-Emission Flat-Panel-DisplayPrototype Built Using Arrays of Diamond-Coated Silicon Tips 577

T. E. Felter, A. A. Talln, D. A. A. Ohlberg Sandia National

Laboratories, Llvermore, CA

A. G. Chakhovskoi University of California at Davis, Davis, CA

E. I. Glvargizov Instltutute of Crystallography, Russian

Academy of Sciences, Moscow, Russia

N. I. Chubun SRPC Istok, Moscow, Russia

P-33: A Blue Phosphor in the ZnO-Ga203-Li20 System for FED

Applications 581

A. O. Dmitrienko, N. V. Niklshin, V. P. Dmltrienko, S. A. Bukesov

Saratov Sfafe University, Saratov, Russia

J. M. Kim Samsung Advanced Institute of Technology,

Suwon, Korea

P-34: The Influence of Chemical Modification of the Surface of RGB

Phosphors on Their Low-Voltage CL Properties 585

S. A. Bukesov, N. V. Niklshin, A. O. Dmltrienko, S. L. Shmakov

Saratov State University, Saratov, Russia

J. M. Kim Samsung Advanced Institute of Technology,Suwon, Korea

P-35: Vacuum Sealing of Field-Emission Arrays Using Field-Assisted

Bonding Method 589

D.-J. Lee, B. K. Ju, Y. H. Lee, M. H. Oh KIST, Seoul, Korea

N. Y. Lee Orion Electric Co. Ltd., Suwon, Korea

J. I. Han Korea Electronics Technology Institute, Pyungtaek,Korea

K. 1. Cho Electronics and Telecommunications Research

Institute, Taejon, Korea

J. Jang Kyung Hee University, Seoul, Korea

P-36: In-SItu Vacuum Packaging Method for FEDs in

Ultra-High-Vacuum Chamber 593

W. B. Choi, B. K. Ju, Y. H. Lee, J. W. Jeong, M. H. Oh

KIST, Seoul, Korea

S. J. Jeong, N. Y. Lee Orion Electric Co., Suwon, Korea

J. I. Han KETI, Pyungtaek, Korea

K. I. Cho ETRI, Taejon, Korea

M. Y. Sung Korea University, Seoul, Korea

P-37: Effect of N-Doped Hydrogen-Free DLC Coatings on Mo-TipFEAs

.. . . .

597

H. Kim, J. H. Jung, B. K, Jill M. H. Oh KIST, Seoul, Korea

S. J. Chung, J. Jang Kyung Hee University, Seoul, Korea

P-38: Electron Field Emission from a-C:F:N Films Deposited by

Inductively Coupled Plasma Chemical Vapor Deposition ...601

S. J. Chung, E. J. Han, J. H. Moon, J. Jang Kyung Hee

University, Seoul, KoreaM. H. Oh KIST, Seoul, Korea

PhosphorsP-39: Deposition of Maganese-Doped Zinc Silicate for

Plasma-Display Panels Using a Charged Liquid Cluster

Beam Technique 605

K. Kim, M. Cich, H. Choi, S. T. Hwang University of Illinois at

Urbana-Champaign, Urbana, IL

P-40: Red, Green, and Blue Silicate Phosphor Thin Films by Laser

Deposition 608

X. W. Sun, H. S. Kwok The Hong Kong University of Science

and Technology, Clear Water Bay, Hong Kong

P-41: Improvement of Low-Voltage Phosphors by Ar-Gas SputteringTreatments after Electron Bombardment: ZnS:Cu,AI and

ZnGa204:Mn 612

Y. W. Jin, J. E. Jang, J. E. Jung, Y. S. Ryu, Y. J. Park, S. N. Cha,

J. M. Kim Samsung Advanced Institute of Technology,Suwon, Korea

Plasma Displays

P-42: Design and Implementation of PDP Driving System Based on

Irregular Addressing Scheme 616

S. Kim, I. Son Dankook University, Seoul, Korea

D. Myoung Soosan Star Co., Ltd., Seoul, Korea

P-43: Evaluation of Moving-Picture Quality on 42-ln. PDP 620

T. Koura, T. Yamamoto, K. Ishli, Y. Takano, H. Kokubun,

T. Kurita, K. Kobayashl, H. Murakami, K. YamaguchiNHK Science and Technical Research Labs, Tokyo, Japan

P-44: Gas-Discharge Simulation and Experiments for ImprovingLuminous Efficiency of Color Plasma-Display Panels 624

H.-G. Park LG Electronics, Kyungsang buk-do, Korea

S.-H. Lee Inha University, Inchon, Korea

P-45: Fast Addressing in Color PDPs by Multiple-Erase-Scanningand Picture-Quality-Enhancement Techniques 628

Y. B. Song, J. H. Lee, M. S. Chung, B. Y. Park, M. H. Park,N. K. Lee LG Electronics, Kyungsang buk-do, Korea

P-46: 3-D Simulations of a Single-Substrate ACPDP Cell with Barrier

Ribs 632

P. J. Drallos, V. N. Khudlk, V. P. Nagorny Plasma DynamicsCorp., Hazel Park, Ml

P-47: A 20-cm-Diagonal DCPDP Having Positive Column Cells and

dc Memory Mode Operation 636

T. Sakal, E. Nagasaka, H. ShoJI Hyundai Electronics Japan

Co. Ltd., Kawasaki, Japan

P-48: Development of a 25-in.-Diagonal SXGA Full-Color PDP 640

Y. Awata, F. Asaml, N. Matsui Fujitsu Ltd., Kanagawa, Japan

F. Namiki, Y. Hashimoto Fujitsu Laboratories, Ltd., Akasht,

Japan

P-49: Improvement of Contrast Ratio in Bright-Ambient Color ACPDP

with High Resolution 644

N. Awajl, T. Kosaka, K. Betsul, F. Namiki, K. Irie, T. Shlnoda

Fujitsu Labs, Ltd., Akashi, Japan

Organic and Inorganic Electroluminescence

P-50: Investigation of Rare-Earth-Doped Thiogallates as Potential

Phosphors for TDEL Dispalys 648

G. Liu, K. Lobban Trie Westaim Corp., Fort Saskatchewan,

Alberta, Canada

P. Bailey Uniax Corp., Santa Barbara, CA

P-51: Red and Blue Thin-Film Electroluminescence in Eu-Doped

Orthophosphates 652

T. Xiao, A. H. Kital, J. Barbier McMaster University, Hamilton,

Ontario, Canada

P-52: Experimental Determination of the Space Charge in ACTFEL

Devices 655

B. Soenen, K. Neyts, G. Stuyven, P. De Vlsschere ELIS,

University of Gent, Gent, Belgium

P-53: An Improved Understanding of the Relationship between

Interface Roughness of ZnS:Pr,Ce Phosphor-Ta20sInsulating Film and Electrical Characteristics of TFEL

Devices 659

Y.-S. Kim, Y.-H. Lee, B.-K. Ju, M.-H. Oh KIST, Seoul, Korea

M.-Y. Sung Korea University, Seoul, Korea

D.-K. Shin Orion Electric Co., Suwon, Korea

P-54: Full-Color Light-Emitting Devices Based on %- and

o-ConJugated Polymer Materials 663

R. Hattori, Y. He, J. Kanicki University of Michigan, Ann

Arbor, Ml

T. Sugano Osaka University, Osaka, Japan

T. Fujlki Osaka Gas Co., Ltd., Kyoto, Japan

P-55: Light-Emitting Diodes Based on Polymer/InorganicHeterostructures 667

H.-S. Tan, J.-Q. Yao Tianjin University, Tianjin, China

L.-C. Chen, X.-J. Wang Tianjin Institute of Technology,Tianjin, China

H.-Q. Xle, G.-H. Gao Huazhong University of Science &

Technology, Wuhan, China

Large-Area Displays

P-56: Improving the Image Quality of a Liquid-Crystal Projector byDiffractive Gratings 671

C.-K. Wu, F.-J. Ko, H.-P. D. Shleh National Chiao TungUniversity, Taiwan, ROC

VIII

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Table of Contents

P-57: High-Resolution Projection Screen with Adjustable DiffusingAngles 675

M. Maxfield, J. Wilson, H. Zou, R. Rodrlquez, R. Beasley, K. Battell,B. Shewareged, J. Hou AlliedSignal Optical Devices

Business, Morristown, NJ

P-58: Reflectors with Phase Compensation for a Reflective LC Color

Projection System 679

P. Baumelster Consultant, Sebastopol, CA

P-59: Developments in Videowall Image Processing 682

R. Simpson Electrosonic Ltd., Dartford, UK

LP-D: Late-News Poster: High-Efficiency LCD Projection Displayswith Novel Thin-Film Polarizing Beam Splitters 686

L. Li, J. A. Dobrowolskl, B. T. Sullivan, G. Marshall, Z. PangNational Research Council of Canada, Ottawa, Ontario,Canada

LP-O: High-Contrast-Ratio Broad-Angle LC Polarizing Beamsplitter.. 690

K. Vinokur, I. Sharlv, N. Gorbatov, N. Pllossof Fabia

Engineering Ltd., Soreq, Israel

E. Chelfetz Weizmann Institute of Science, Rehovot, Israel,

and Fabia Engineering Ltd., Soreq, Israel

Liquid-Crystal Technology

Wide-Viewing Angle

P-60: Improvement of the Optical Characteristics of a Twisted-

Nematio Display Using Negative In-Plane and SplayedDiscotic Films 694

T. A. Sergan, J. R. Kelly Liquid Crystal Institute, Kent State

University, Kent, OH

P-61: Optical Design for Wide-Viewing-Angle TN-LCD with Hybrid

Aligned Nematic Compensation Films 698

T. Toyooka, E. Yoda, Y. Kobori, T. Yamanashl, H. Itoh NipponOil Co., Ltd., Yokohama, Japan

P-62: Multi-Domainlike Homeotropic Nematic LCD 702

S. H. Lee, H. Y. Kim, S. C. Kim, Y. H. Lee, I. C. Park, B. G. Rho,

J. S. Park, C. H. Lee Hyundai Electronics Industries Co.,

Ltd., Kyungki-Do, Korea

H. G. Galabova, D. W. Allender Liquid Crystal Institute, Kent

State University, Kent, OH

P-63: Optically Compensated In-Plane-Switching-Mode TFT-LCD

Panel 706

Y. Saitoh, S. Klmura, K. Kusafuka, H. Shlmlzu IBM DisplayBusiness Unit, Kanagawa, Japan

LP-E: Late-News Poster: Wide-Viewing-Angle LCD Using

Voltage-Controlled Twist Effect 710

G. P. Bryan-Brown, C. V. Brown, I. C. Sage, V. C. Hul, E. L.

Wood DERA, Malvern, UK

LP-F: Late-News Poster: Wide-Viewing-Angle TFT-LCDs Optimized

for Desktop and Avionics Applications 714

H. Yuan, T. Fiske, A. Lewis dpIX, Palo Alto, CA

L. D. Silversteln VCD Sciences, Scottsdale, AZ

LP-G: Late-News Poster: Hybrid Switching Mode for

Wide-Viewing-Angle TFT-LCDs 718

H. H. Shin, H.-C. Lee, J.-J. Park, S.-B. Kwon LG Electronics,

Kyongki-Do, Korea

AlignmentP-64 UV-Light-Modified Polyimide Films for Liquid-Crystal Alignment 722

S. Gong, J. Kanlcki University of Michigan, Ann Arbor, Ml

L. Ma, J. Z. Z. Zhong OIS Optical Imaging Systems,

Northville, Ml

P-65: LC Alignment Mechanism for Polarized UV-Exposed Polyimide

Films726

K. Ha, W. Ann Keimyung University, Taegu, Korea

J. L. West Liquid Crystal Institute, Kent State University, Kent, OH

P-66: A Photo-Di'merized Monolayer as a Non-Rubbed Alignment

Layer for LCDs 730

D. Shenoy, K. Grueneberg, J. Naciri, M.-S. Chen, R. Shashidhar

Naval Research Laboratory, Washington, DC

P-67: Development of a Dual-Domain TFT-LCD by Optical Patterning 734

E. Hoffmann, H. Klausmann, E. Glnter, P. M. Knoll

Angewandte Display Technologie GmbH, Stuttgart,

GermanyH. Selberle, M. Schadt ROLIC Research Ltd., Basel, Switzerland

P-68: Influence of Polyimide Structures on Electrical Properties of

Active-Matrix Liquid-Crystal Cells 738

T. Sato, K. Sawahata, H. Endo, H. Fukuro Nissan Chemical

Industries, Ltd., Chiba, Japan

Materials

P-69: Characterization of Liquid-Crystal Materials for Low-

Voltage-Operation TFT-TN and IPS LCDs 742

Y. Nakazono, T, Takagi, H. Ichinose, A. Sawada, S. Naemura

Merck Japan Ltd., Kanagawa, JapanK. Taruml Merck KGaA, Darmstadt, Germany

P-70: New Dichroic Azo Dyes for Guest-Host Liquid-Crystal

Composites 746

H. Sato, H. Ishio, T. Yoneyama, M. Kaneko Mitsubishi

Chemical Corp., Yokohama, Japan

LP-H: Late-News Poster. New Photo-Alignment Materials with High

Sensitivity to Near-UV Light 750

Y. Makita, T. Natsui, S. Klmura, S. Nakata, M. Klmura,

Y. Matsukl, Y. Takeuchl

Reflective

P-71: A Chiral-Homeotropic Cell for 2.5-V TFT-LCD Operation 754

S. T. Wu HRL Laboratories, Malibu, CA

P-72: A New Polymer-LC Dispersed Structure for Reflective Color

LCDs 758

S. Yamada, Y. Tsuchiya, M. Yazaki, H. Sakata, T. Sonehara

Seiko-Epson Corp., Nagano, Japan

P-73: Reflective Color LCD Composed of Stacked Films of

Encapsulated Liquid Crystal (SFELIC) 762

K. Sunohara, K. Nalto, S. Shlmlzu, M. Aktyama, M. Tanaka,

Y. Nakal, A. Sugahara, K. Talra, H. Iwanaga, T. Ohtake,

A. Hotta, S. Enomoto, H. Yamada Toshiba Corp.,

Yokohama, Japan

P-74: Development of Reflective Color STN-LCD Using a New

Optimizing Method of Retarders and a Polarizer 766

O. Itou, S. Komura, K. Kuwabara, K. Funahata, K. Kondo

Hitachi Research Laboratory, Ibaraki, JapanK. Kubo Hitachi Electron Tube & Devices, Chiba, Japan

P-75: A Biaxial Film-Compensated Thin Homogenous Cell for

Reflective Displays 770

S.-T. Wu, C.-S. Wu HRL Laboratories, Malibu, CA

P-76: Optical Design of R-OCB Mode Full-Color Reflective LCD with

Wide Viewing Angle and High Contrast 774

T. Ishlnabe, T. Mlyashlta, T. Uchlda Tohoku University,

Sendai, Japan

Ferroelectric and Anti-Ferroelectric LCDs

P-77: FLC Materials with Fast Response Time and High Contrast

Ratio for the x-Vmin Mode FLCDs 778

M. Koden, T. Furukawa, M. Kabe, S. Okamoto, A. Sakaigawa,

T. Sako, M. Sugino, A. Tagawa Sharp Corp., Chiba, Japan

J. C. Jones, M. H. Anderson, P. E. Dunn, J. R. Hughes,

K. P. Lymer, V. Minter, K. G. Russell, A. J. Slaney DERA,

Malvern, UK

P-78: Characteristics and Driving Scheme of Polymer-StabilizedMonostable FLCD Exhibiting Fast Response Time and High

Contrast Ratio with Gray-Scale Capability 782

H. Furue, S. Kobayashl Science University of Tokyo in

Yamaguchi, Yamaguchi, JapanY. Ilmura Tokyo University of Agriculture & Technology,

Tokyo, JapanH. Hasebe, H. Takatsu Dainlppon Ink & Chemicals, Saitama,

Japan

P-79: Electro-Optical Properties of Phase-Separated Composite

Organic Films of FLCs 786

V. Vorflusev, T. Sergan, S. Kumar Kent State University,

Kent, OH

P-80: Controlling the Threshold Voltage of SSFLCDs Using Polymer

Networks 790

H. Matsul, T. Mlyata, Y. limura Tokyo University of Agriculture

& Technology, Tokyo, JapanS. Kobayashl Science University of Tokyo in Yamaguchi,

Yamaguchi, JapanH. Hasebe, H. Takatsu Dainippon Ink & Chemicals, Saitama,

Japan

IX

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Table of Contents

Cholesterics

P-81: Temperature Compensation of the Dynamic Drive Scheme for

Bistable Cholesteric Displays 794

J. Gandhi, D.-K. Yang Liquid Crystal Institute, Kent State

University, Kent, OH

P-82: Cumulative Drive Schemes for Bistable Reflective Cholesteric

LCDs 798

Y.-M. Zhu, D.-K. Yang Liquid Crystal Institute, Kent State

University, Kent, OH

P-83: White Reflective Displays from Polymer-Stabilized Cholesteric

Textures 802

J. Kim, N. Leroux, L.-C. Chlen Liquid Crystal Institute, Kent

State University, Kent, OH

P-84: A Fast Frame-Rate Bistable Cholesteric Reflective Display 806

J. Anderson, P. Watson, J. Ruth, V. Sergan, P. J. Bos Liquid

Crystal Institute, Kent State University, Kent, OH

P-85: Withdrawn

LP-I: Late-News Poster: Gray Scale of Bistable Reflective

Cholesteric Displays 810

X.-Y. Huang, N. Miller, A. Khan, D. Davis, J. W. Doane Kent

Displays, Kent, OH

D.-K. Yang Liquid Crystal Institute, Kent State University,Kent, OH

Modeling

P-86: A Jones Matrix for Uniformly Twisted Crystals at ArbitraryAngles of View 814

B. W. Walker Honeywell, Phoenix, AZ

P-87: Analytic 4 x 4 Propagation Matrices for Homogeneous Media.. 818

H. Yuan, T. Kosa, P. Palffy-Muhoray Liquid Crystal Institute,Kent State University, Kent, OH

E. Welnan New York University, New York, NY

P-88: Apodization Method for the Fast Elimination of Interface

Fringes in the 4 x 4 Matrix Optics 822

T.-H. Yoon, H.-l. Baek, K.-H. Park, S.-M. Park, S.-l. Woo, G.-D.

Lee, J. C. Kim Pusan National University, Pusan Korea

P-89: 3-D Computer Simulations of Nematic and Cholesteric Cells..

826

S. V. Shlyanovskii, O. D. Lavrentovlch Liquid CrystalInstitute, Kent State University, Kent, OH

LP-J: Late-News Poster: Designing Concepts of the Discotlc

Negative Birefringence Compensation Films 830

H. Mori Fuji Phofo Film Co., Ltd., Kanagawa, Japan

P. J. Bos Liquid Crystal Institute, Kent State University, Kent,

OH

General

P-90: Polymer-Stabilized Diffraction Gratings from Cholesteric Liquid

Crystals 834

S. N. Lee, L.-C. Chlen, S. Sprunt Liquid Crystal Institute,

Kent State University, Kent, OH

P-91: Wide-Viewing-Angle Dual-Domainlike Vertical-Alignment LCD .838

S. H. Lee, H. Y. Kim, 1. C. Park, Y. H. Lee, S. L. Lee, W. H. Choi,W. G. Lee, J. Y. Lee, H. S. Park, C. H. Lee HyundaiElectronics Industries Co., Ltd., Kyungki-do, Korea

P-92: High-Speed-Addressing Method of a Bistable Twisted-Nematic

LCD 842

G.-D. Lee, H.-S. Kim, T.-H. Yoon, J. C. Kim Pusan National

University, Pusan, Korea

E.-S. Lee Samsung Display Devices Co., Kyungki-do, Korea

LP-L:

29.1:

29.2:

29.3:

30.1:

30.2:

30.3:

P-93: A Novel jt/2 and Sit/2 Twist Bistable TN Cell 846

Z. L. Xle, H. J. Gao Tsinghua University, Beijing, P. R. China

H. S. Kwok The Hong Kong University of Science and

Technology, Clear Water Bay, Hong Kong

P-94: LCP-Retarder Films with Improved Temperature-MatchedCompensation 850

M. Bosma Akzo Nobel Central Research, Arnhem, The

Netherlands

LP-K: A Bistable Twist Cell Exhibiting Long-Term Bistability Suitablefor Page-Sized Displays 854

C. D. Hoke, P. J. Bos Liquid Crystal Institute, Kent State

University, Kent, OH

Late-News Poster: Novel Configuration of the Zenithal

Bistable Nematic Liquid-Crystal Device 858J. C. Jones, E. L. Wood, G. P. Bryan-Brown, V. C. Hui DERA,

Malvern, UK

29: MANUFACTURING EMISSIVE DISPLAYS

MgO Coating by Reactive Magnetron Sputtering for

Large-Screen Plasma Display Panels 865

C. Pan, P. O'Keefe, J. J. Kester Applied Films Corp., Boulder,CO

High-Rate Deposition of MgO Films for ACPDPs by Activated

Reactive Evaporation Using Hollow-Cathode Discharge(HCD-ARE) 869

M. Hakomori, K. Matsuzakl, T. Kurauchi, M. Matsuura,H. Yamakawa ULVAC, Japan, Ltd., Ibaraki, Japan

Performance Evaluation of a Glass-Packaged FED Panel 873

S. J. Kwon, K. S. Ryu, T. H. Cho Kyungwon University,Kyunggi-Do, Korea

H. S. Uh, J. D. Lee Seoul National University, Seoul, Korea

Y. B. Kwon Korea Diavac Ltd., Daegu-Clty, Korea

30: POLY-Si AMLCD DEVICES AND PROCESSES

A 6-bit-Color VGA Low-Temperature Poly-Si TFT-LCD with

Integrated Digital Data Drivers 879

Y. Matsueda, T. Ozawa, M. Klmura, T. Itoh, K. Kitawada,

T. Nakazawa, H. Ohslma Seiko-Epson Corp., Nagano,Japan

A 4.5-in. Full-Color VGA Poly-Si TFT-LCD with IntegratedDrivers 883

J. Koyama, S. Nakajlma, H. Ohnuma, Y. Shlonoirl, S. Nagao,S. Yamazaki Semiconductor Energy Laboratory Co., Ltd.,

Kanagawa, Japan

An Ultra-Low-Temperature Poly-Si TFT with Stacked

Composite ECR-PECVD Gate Oxide 887

Y.-J. Tung, X. Meng, T.-J. King University of California at

Berkeley, Berkeley, CA

P. G. Carey, P. M. Smith, S. D. Thelss Lawrence Livermore

National Laboratory, Livermore, CA

R. Weiss, G. A. Davis, V. Aebl Intevac, Santa Clara, CA

30.4: Short-Channel Effect of Sub-Micron Poly-Si TFTs with LargePoly-Si Grains 891

H. Akimoto, M. Hatano Hitachi Central Research Laboratory,Tokyo, Japan

T. Sakai Hitachi Device Engineering Corp., Chiba, Japan

31: CHOLESTERIC LCDs

31.1: Invited Paper: Reflective Color Display Using Cholesteric

Liquid Crystals 897

K. Hashimoto, M. Okada, K. Nlshiguchl, N. Masazumi, E. Yamakawa,

T. Tanlguchi Minolta Co., Ltd., Osaka, Japan

31.2: Eight-Color High-Resolution Reflective Cholesteric LCDs 901

D. Davis, A. Kahn, X. Y. Huang, J. W. Doane Kent Displays,Kent, OH

C. Jones Liquid Crystal Institute, Kent State University, Kent,OH

31.3: A Study of the Dynamics of Reflection Color, Helical Axis

Orientation, and Domain Size in Cholesteric LCDs 905P. Watson, V. Sergan, J. E. Anderson, J. Ruth, P. J. Bos

Liquid Crystal Institute, Kent State University, Kent, OH

31.4: Cell Designs for Fast Reflective Cholesteric LCDs 909

X.-D. Mi, D.-K. Yang Liquid Crystal Institute, Kent State

University, Kent, OH

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32: 3-D DISPLAY SYSTEMS

32.1: Invited Paper: A Display System with 2-D/3-D Compatibility ..915

G. Hamaglshi, M. Sakata, K. Mashitanl, M. Inoue, K. Talma, K. Oyamada,S-l. Kishimoto Sanyo Electric Co., Ltd., Osaka, Japan

32.2: A Real-Time 2-D to 3-D Image Conversion Technique UsingComputed Image Depth gi9

H. Murata, Y. Mori, S. Yamashita, A. Maenaka, S. Okada, K. Oyamada,S. Kishimoto Sanyo Electric Co., Ltd., Osaka, Japan

32.3: An Eyeglass-Free Rear-Cross-Lenticular 3-D Display 923H. Morlshama, H. Nose, N. Tanlguchl, K. Inoguchi, S. Matsumura

Mixed Reality Systems Laboratory, Inc., Yokohama, Japan

32.4: A Lightweight 3-D HMD with Accommodative Compensation... 927

T. Suglhara, T. Mlyasato ATR Media Integration &Communications Research Labs, Kyoto, Japan

33: DISPLAY MEASUREMENT

33.1: Invited Paper: Application of Sub-Pixel Edge Detection to

Generate Flash Correction Waveforms 933

P. Meade, J. R. Webb Display Laboratories, Boulder, CO

33.2: Viewing Angle: A Matter of Perspective 937

T. G. Flske dpiX, Palo Alto, CA

L. D. Sllversteln VCD Sciences, Inc., Scottsdale, AZ

C. Penn Motorola Flat Panel Display Division, Tempe, AZ

E. F. Kelley NIST, Gaithersburg, MD

33.3: Small-Area Black Luminance Measurements on a White

Screen Using Replica Masks 941

P. A. Boynton, E. F. Kelley NIST, Gaithersburg, MD

33.4: Reflection Measurement Problems Arising from Haze 945

G. R. Jones, E. F. Kelley NIST, Gaithersburg, MD

35.5: A Four-Mask Process for an Ion-Implanted 14-in. a-Si:H TFT

Display with High Fabrication YieldG. Maier, S. Maresch, B. Sautter, T. Kallfass, E. Lueder

University of Stuttgart, Stuttgart, Germany

M LC MODELING

36.1: Accurate Modeling of the Dynamics of TN Devices with Flow

S. H. Jamal Honeywell, Phoenix, AZJ. R. Kelly Liquid Crystal Institute, Kent State University,

Kent, OH

36.2 Viewing-Angle Improvement Based on Polncare SphereRepresentation

K. Vermelrsch, J. Fornler ELIS, University of Gent, Gent,

BelgiumA. De Meyere Barco Projection Systems, Kuurne, Belgium

36.3: A Faster Switching Regime for Zenithal Bistable Nematic

DisplaysJ. C. Rudin Hewlett-Packard Laboratories, Bristol, UK

979

985

989

993

36.4L: Late-News Paper: Propagation and Optimization of Stokes

Parameters for Arbitrary Twisted-Nematic Liquid Crystals... 997

S.-W. Suh, Z. Zhuang, J. S. Patel The Pennsylvania State

University, University Park, PA

36.5L: Late-News Paper: Cholesteric Polarizers: Simulated

Performance in PL-LCDs 1001

I. D. Springle Screen Technology Ltd., Cambridge, UK

Th. L. Welzen Welzen Associates, Maastricht, The

Netherlands

A. B. Davey, W. A. Crossland Screen Technology Ltd.,Cambridge, UK and Cambridge University, Cambridge, UK

37: NOVEL DISPLAYS

34.1:

34.2:

34.3:

35.1:

35.2:

35.3:

35.4:

34: ELECTROLUMINESCENT DISPLAYS

100-MHz Active-Matrix Electroluminescent Displays 949

J. Hsu, F. L. Hsueh, R. G. Stewart, A. Iprl, S. Connor Sarnoff

Corp., Princeton, NJ

L. Arbuthnot, W. Sproull, M. Aguilera, P. Green, T. NguyenPlanar Systems, Beaverton, OR

T. Keyser, S. Schlesinger, G. Becker, D. Kagey AlliedSlgnal,

Columbia, MD

High-Luminance Thin-Film EL Devices Using Mn-Activated

Multicomponent Oxide Phosphors 953

T. Mlnaml, Y. Kubota, T. Mlyata, H. Yamada Kanazawa

Institute of Technology, Ishikawa, Japan

Invited Paper: New Display Technology: The Photocathode

Display (PCD) 957

B. Culkin New Logic, Emeryville, CA

35: DIRECT-VIEW a-Si AMLCDs

Simulation Method to Calculate Effective Mobility of

Pixel-Switching TFT Devices for QXGA TFT-LCD Monitors.

963

S. Kawamoto, K. Kobayashl, K. Morishlta Mitsubishi Electric

Corp., Kumamoto, Japan

Sub-Notebook a-Si Color SVGA Display with Integrated Drivers 967

F. P. Cuomo, R. G. Stewart, R. Huq, B. Greening, M. G. Kane,

D. Jose, T. Meyer, A. C. Iprl Sarnoff Corp., Princeton, NJ

A High-Aperture and High-Reliability Full-Color TFT-LCD 971

J. Z. Z. Zhong, W. den Boer, Y. H. Byun, T. Gu, R. Brlnkley,S. V. Thomson OIS Optical Imaging Systems, Northville,

Ml

Development of a 6 x 8-in. 1344-Row AMLCD for Avionics

Applications 975

J. C. Terrien, J. M. Vlgnolle, C. Serbutovlez, C. Cason

Thomson-LCD, Moirans, France

O. Pernla, F. Delauzun Sextant Avionque, St. Me'dard en

Jalles, France

37.1: Optical Approaches to Incorporation of Displays within

Eyeglasses 1007

M. B. Spitzer, P. D. Aquilino, R. W. McClelland, M. H. Olson,N. M. Rensing The MicroOptical Corp., Boston, MA

C. A. DiMarzio, P. M. Zavracky, A. Lemoncelll, J. Hilliar

Northeastern University, Boston, MA

37.2: Gyricon Electric Paper 1010

M. E. Howard, E. A. Rich ley, R. Spraque, N. K. Sherldon

Xerox PARC, Palo Alto, CA

J. Crowley Electrostatic Applications, Morgan Hill, CA

37.3: Development of Eiectrophoretic Display Using MicrocapsulatedSuspension 1014

E. Nakamura, H. Kawal, N. Kanae, H. Yamamoto NOK Corp.,

Kanagawa, JapanH. Yamamoto NOK Corp., Ibaraki, Japan

37.4: Reverse-Emulsion Eiectrophoretic Display (REED) 1018

M. Bryning, R. Cromer Zikon Corp., Campbell, CA

37.5: Waveguide Panel Display Using Electromechanical SpatialModulators 1022

X. Zhou University of Michigan and Xeotron Corp., Ann

Arbor, Ml

E. Gularl University of Michigan, Ann Arbor, Ml

38: SPATIO-TEMPORAL VISUAL INTERACTIONS

38.1: Invited Paper: Combining Stereopsts and Motion in Human

Vision 1029

S. P. McKee Smith-KetUewell Eye Research Institute, San

Francisco, CA

J. M. Harris University of Edinburgh, Edinburgh, UK

38.2: The Detection of Moving Features on a Display: The

Interaction of Direction of Motion, Orientation, and DisplayRate 1033

E. Peli, A. T. Labianca The Schephens Eye Research

Institute, Boston, MAE. M. Fine The Wilmer Eye Institute, Johns Hopkins

University, Baltimore, MD

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38.3: Predicting Color Breakup on Field-Sequential Displays: Part 2. 1037

D. L. Post Air Force Research Laboratory, Wright-PatersonAFB, OH

A. L. Nagy, P. Monnler Wright State University, Dayton, OH

C. S. Calhoun Logioon Technical Services, Inc., Dayton, OH

39: FEDs III

39.1: Invited Paper: Submicron Spherical Phosphors for FED

Applications 1043

A. Vecht, X. Jing, C. Gibbons, T. Ireland, D. Davis, P. Marsh, A. Newport

University of Greenwich, London, UK

39.2: New Family of Bright Phosphors for FEDs 1048

A. M. Nakua, A. H. Kltal, T. Xiao McMaster University,

Hamilton, Ontario, Canada

39.3: Carbon Nanotube FED Elements 1052

S. Uemura, T. Nagasako, J. Yotanl, T. ShimojoIse Electronics Corp., Ise, Japan

Y. Saito Mle University, Tsu, Japan

42: DISPLAY MANUFACTURING: THIN-FILM COATING AND

42.1: High-Rate Deposition of Clear and Hard Oxide Coatings on

Plastic Films and Sheets 1095

M. Fahland, H. Morgner, N. Schiller Fraunhofer institut fuer

Elektronenstrahl und Plasmatechnik, Dresden, GermanyS. Mutialu, R. Bunshah Aultimut International, Inc.,

Capistrano Beach, CA

42.2: A New Conductor Structure for Plastic LCD ApplicationsUtilizing "All Dry" Digital Laser Patterning 1099

P. Y. Z. Chu, H. C. Choi, L. S. Heath, C. S. Ko, J. Mack,P. Nagarkar, J. Richard, W. Smyth, T. Wang Polaroid

Corp., Waltham, MA

42.3: Development of a New HDP Source for LCD Etching Process.. 1102

H. Takel, H. Kawamura, Y. Ohta Institute for Super Materials,ULVAC Japan Ltd., Chiba, Japan

R. Gardner ULVAC Technologies, Andover, MA

43: IMAGE QUALITY

40: AMLGD PR0JECTI0N?LIGHT VALVES

40.1: A 2.6-in. Poly-Si TFT-LCD HDTV Display with Monolithic

Integrated 8-bit Digital Data Drivers 1059

M. Osame, M. Azaml, J. Koyama, Y. Ogata, H. Ohtanl, S. Yamazaki

Semiconductor Energy Laboratory Co., Ltd., Kanagawa,

Japan

40.2: A 2.25-in. Poly-Si TFT-LCD HDTV/XGA Display with

Area-Efficient Source Driver Circuits 1063

B. D. Choi, 0. K. Kwon Hanyang University, Seoul, Korea

H. S. Jang, Y. G. Kim, M. J. Soh LG Corporate Institute of

Technology, Seoul, Korea

40.3: Ultra-High-Brightness 1.8-in. XGA Poly-Si TFT-LCD 1067

K. Uchino, T. Kashlma, F. Abe, M. Hirano, M. Satoh, T. Maekawa

Sony Corp., Kanagawa, Japan

40.4: Optimization of Light-Valve Mirrors 1071

E. G. Colgan, F. Doany, M. Lu, A. Rosenbluth, K.-H. YangIBM T. J. Watson Research Center, Yorktown Heights, NY

M. Uda, M. Shinohara IBM Microelectronics Division, Yasu,

JapanT. Tomooka, T. Tsukamoto IBM Display Business Unit, Yasu,

Japan

41: WIDE-VIEWING-ANGLE LCDs

41.1: A Super-Hlgh-lmage-Quallty Multi-Domain Vertical AlignmentLCD by New Rubbing-Less Technology 1077

A. Takeda, S. Kataoka, T. Sasaki, H. Chida, H. Tsuda, K. Ohmuro,Y. Koike Fujitsu Ltd., Atugi, Japan

T. Sasabayashi, K. Okamoto Fujitsu, Ltd., Kawasaki, Japan

41.2: A Wide-Viewing-Angle Polymer-Stabilized HomeotropicallyAligned (PSHA) LCD 1080

C.-K. Wei, Y.-H. Lu, C.-L. Kuo, C.-Y. Liu, H.-D. Liu, W.-C.

Chang, H.-P. Huang, C.-M. Cheng, D.-C. Yan ERSO/ITRI,Taiwan, ROC

41.3: New LCD Modes for Wide-Viewing-Angle Applications 1085

K.-H. Kim, S.-B. Park, J.-U. Shim, J.-H. Souk SamsungElectronics, Kyungki-Do, Korea

J. Chen Liquid Crystal Institute, Kent State University, Kent, OH

41.4: Advanced ASM Mode: Improvement of Display Performance by

Using a Negative-Dielectric Liquid Crystal 1089

Y. Kume, N. Yamada, S. Kozaki, H. Klsishlta, F. Funada,

M. Hijlklgawa Sharp Corp., Tend, Japan

43.1: A Simple Vision Model for Inhomogeneous Image-QualityAssessment 1109

A. J. Ahumada, Jr., B. L. Beard NASA Ames Research

Center, Moffett Field, CA

43.2: Visual Scaling of Image Quality for CRT Displays 1112

T. Kusunoki Sony Corp., Kanagawa, JapanR. S. Berns Rochester Institute of Technology, Rochester, NY

43.3: How Fill Factor Affects Display Image Quality 1116

S. Yu, C. W. Penn, K. Jachimowlcz Motorola Flat Panel

Display Division, Tempe, AZ

L. D. Silverstein VCD Sciences, Inc., Scottsdale, AZ

44: LATE-NEWS PAPERS

44.1 L: Ridge and Fringe-Field Multi-Domain Homeotropic LCD 1123

A. Lien, R. Nunes, R. A. John, E. Galllgan, E. Colgan, J. Wilson

IBM T. J. Watson Research Center, Yorktown Heights, NYC. Cal Polytechnic University, Brooklyn, NY

44.2L Multi-Domain Vertically Aligned Mode 1127

V. A. Konovalov, A. A. Muravskl, S. N. Tlmofeev, S. Ye

Yakovenko Institute of Applied Physics Problems, Minsk,

Belarus

44.3L: A Printed and Roilable Bistable Electronic Display 1131

P. Drzaic, B. Comlskey, J. D. Albert, L. Zhang, A. Loxley, R. FeeneyE Ink Corp., Cambridge, MA

J. Jacobson MIT Media Laboratory, Cambridge, MA

44.4L: FLC Polymer and Plastic Substrates for Use in a Large-Area

Optical Shutter for 3-D TV 1135

K. Okoshl, K. Yuasa Idemitsu Kosan Co., Ltd,, Chiba, Japan

F. Morlwakl, T. Kofujl Idemitsu Kosan Co., Ltd., Tokyo, Japan

44.5L: Design of Hologram for Brightness Enhancement In Color LCDs 1139

G. T. Valliath, Z. A. Coleman, J. L. Schlndler, R. Polak, R. B. Aklns,

K. W. Jelley Motorola Corporate Manufacturing Research

Center, Schaumburg, IL

45: DISPLAY INTERFACES AND DRIVERS

45.1: Analog Interface LSI for UXGA Color TFT-LCDs 1145

K. Nishimura, M. Ito, Y. Hori, T. Watanabe NEC Color LCD

Division, Kanagawa, JapanT. Murata, T. Watanabe NEC C&C LSI Development Division,

Kanagawa, Japan

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45.2:

45.3:

45.4:

45.5:

A New Multi-Scan Driver LSI for TFT-LCD Monitor 1149

H. Nitta, T. Furuhashl, H. Mano Hitachi SystemsDevelopment Laboratory, Yokohama, Japan

S. Tsunekawa Hitachi Semiconductor & Integrated Circuits

Div., Tokyo, Japan

M. Nakamura Hitachi Device Engineering Co., Ltd., Chiba,

Japan

Automatic Adjustment Method of Parameters in CRT Interface

Circuit for LCD Monitor 1153

S. Nishitanl, N. Kasal, T. Furuhashi Hitachi Systems

Development Laboratory, Yokohama, Japan

H. Kurihara Hitachi Electron Tube & Devices Division,

Mobara, JapanT. Mori Hitachi Office Systems, Ebina, Japan

High-Performance System-on-Sllicon Pixelated DisplayController IC 1157

R. Y. Greenberg, M. G. West Pixelworks, Tualatin, OR

Invited Paper: Characterization of Column Driver for TFT-LCD 1161

T. Amemlya IBM Display Business Unit, Kanagawa, Japan

45.6L: Late-News Paper: A21.3-ln. UXGA TFT-LCD with New DrivingMethod 1165

M. Nishimura, Y. Kohno, T. Takabayashl, Y. Masutanl, A. Tamatani,

H. Shinohara Mitsubishi Electric Corp., Kumamoto, Japan

46: FERROELECTRIC LC DEVICES

46.1: Invited Paper: A 15-in. XGATFT-AFLCD with Quasi-dc Driving

Scheme for Monitor Applications 1171

H. Okumura, M. Aklyama, K. Takatoh, Y. Uematsu Toshiba

Corp., Yokohama, Japan

46.2: Analytical Model for Thresholdless Anti-Ferroelectric LCDs— 1175

H. Pauwels, B. Verwelre, K. D'havS, J. Fornier ELIS,

University of Gent, Gent, Belgium

46.3: The Effect of Surface Structure on the Performance of a

Ferroelectric LCD 1179

J. C. Jones, A. B. J. Smout, R. W. Bannister, P. E. Dunn,

S. D. Haslam, R. Heath, A. J. Pldduck DERA, Malvern, UK

N. (ton, M. Kabe, M. Koden, S. Miyoshl, M. Shigeta Sharp

Corp., Chiba, Japan

47; DISPLAY MANUFACTURING: AMLCDs

47.1: Invited Paper: Excimer-Laser-Based Ultra-Large-Grain Growth

Technology: Towards Single-Crystal Si TFTs, SOIs, and

Solar Cells 1185

M. Matsumura, C.-H. Oh Tokyo Institute of Technology,

Tokyo, Japan

47.2: Invited Paper: TFT Application of Low-Temperature DepositedCat-CVD Polysilicon Films 1189

H. Matsumura JAIST, ishikawa, Japan

47.3: Withdrawn

47.4: Cost and Yield Model forComparing a-Si and Poly-Si Displays. 1193

B. E. Young, R. Young DisplaySearch, Austin, TX

48: VISUAL FACTORS AND DISPLAY PERFORMANCE

48.1: Specification and Assessment of the Visual Aspects of Cockpit

Displays1199

K. Vassle British Aerospace Defence Ltd., Hampshire, UK

48.2: Slant Perception as a Function of Size Disparity and ImageMotion 1203

K. F. Arrington Raytheon Training and Services, Inc., Mesa, AZ

B. J. Pierce Air Force Research Laboratory, Mesa, AZ

M. A. Moreno Arizona State University, Tempe, AZ

48.3: Interaction between Size and Eccentricity in Motion Detection

at Far Periphery1207

B. H. Tsou Air Force Research Laboratory, Wright-Patterson

AFB, OH

H. S. Bautsch Logicon Technical Services, Dayton, OH

48.4: The Effect of JPEG Coding Scheme on the Perceived Quality

of 3-D Images1211

J.-Y. Chen, Z. Llwei Beijing Institute of Technology, Beijing,China

S.-Q. Ding Nankai University, Tianjin, China

SID '98 Seminar Highlights: Seminar Topics/Speakers 1215

SID '98 Tutorials and Applications Seminars 1217

SID "98 Honors and Awards 1221

SID '97 Best Paper Awards1225

SID '98 Profiles of Speakers1227

SID '98 Executive Committee 1234

SID '98 Program Committee 1235

SID '98 Session Chairmen/Co-Chairmen 1238

SID '98 List of Exhibitors/Exhibit Hall Floor Plan 1241

SID '98 Convention Center Floor Plans 1249

SID '98 Timetable Inside Back Cover

xiii