Instrumentation systems
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Transcript of Instrumentation systems
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Instrumentation systems
Long slit geometryKratky cameraBonse-Hart setup
Others Simple pinhole cameraHuxley Holmes cameraFranks setupNanoSTAR with Göbel mirrors
+ many others
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Instrumentation systems
Long slit geometry
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Instrumentation systems
Long slit geometry
long slitpinholeconstant
q contours
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Instrumentation systems
long slitpinhole
q distributions
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Instrumentation systems
Kratky instrument
incident beam slit system
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Instrumentation systems
Kratky instrument
incident beam slit system
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Instrumentation systems
Kratky instrument
incident beam slit system
q range to 0.003 Å-1 sealed tube 107-108 ph/snon-oriented oriented sample - or perfectly oriented
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Instrumentation systems
Slit smearing
wλ(qλ)
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Instrumentation systems
Slit smearing
is desired cross section
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Instrumentation systems
Slit desmearing (Read Roe, Section 5.6)
a. Measure slit-length weighting fcn w/ no specimen or beam stop
b. Calculate this fcn from slit geometry - then invert relationship betwn measured smeared data and unsmeared results (desired)
c. Don't desmear - use infinite slit approx.
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Instrumentation systems
Slit desmearing
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Instrumentation systems
SAXSess
Improved Kratky cameraRotating anode + Göbel mirrors ––> 1010 ph/s Monochromatic beamShort acquisition times
(deadtime effects)Image plate detector
≤0.1 mm resolution
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Instrumentation systems
Göbel mirrors
Si-W multi-layers on parabolic substrate
Multilayer spacing varies w/ position -divergent beam comes out parallel
Length - about 5 cm - Bragg angle a few degrees
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Instrumentation systems
Simple pinhole camera
Lower flux - use 2D detector
qmin=0.01-0.005 Å-1� at lab sources
qmin=0.001 Å-1 at synchrotron sources
Any specimen configuration
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Instrumentation systems
Huxley-Holmes SAXS
EMBL Hamburg, bending magnet,100 mA - 1012 ph/secRotating anode - 107 ph/sec
2 mm x 5 mm specimen
1 meter
10 meters
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Instrumentation systemsBruker/Paar SAXS
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Instrumentation systemsBruker NanoSTAR SAXS