High-Performance STM Probes -...
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SEM image of tip of nickel probe Tungsten Probes Type: P-100WS Example STM image of HOPG with nickel probe Example STM image of Au(111) with nickel probe Platiniridium Probes Type: P-100PtIr (S) SEM Image SEM Image SEM Image Ni Probes Type: P-100Ni (S) Shape: Cone Wire Rod: Polycrystalline tungsten 0.25mm diameter Curavant Radius of a Tip: <35nm Shape: Cone Wire Rod: Polycrystalline Ni 0.25mm diameter Curavant Radius of a Tip: <25nm Shape: Cone Wire Rod: Polycrystalline Platiniridium 0.5mm diameter Curavant Radius of a Tip: <20nm Grind Process: Electro-polishing after mechanical grind High-Performance STM Probes High-Performance STM Probes Enables Reliable STM Measurement Without Requiring Troublesome Probe Treatment 2 ～ 3ｍｍ Total 10ｍｍ 1 ～ 1.5ｍｍ Total 10ｍｍ 2.5 ～ 3ｍｍ Total 10ｍｍ 20130516 The stability of STM measurements is greatly influenced by the quality of the probe. Namely, good STM measure- ment results often cannot be obtained due to variances in the probe tip diameter, contamination of the probe sur- face, or cleaning process errors. UNISOKU has successfully developed nickel and plati- niridium STM probes using an electropolishing method that is able to solve these problems by yielding fine tip di- ameters with minimal contamination. Our metal probes allow you to experience a higher level of stability than was possible in the past. Our conventional tungsten probes are also still available. UNISOKU has confirmed that atomic images can be reliably obtained, without the need for high-temperature heat treatment, when observing HOPG in air and gold in an ultra- high vacuum. *2: Applies only to nickel and platiniridium probes. However, when observing active surfaces, heating is recommended for degassing. *Noble metal (Au, Ag) coating for nickel probes are being developed. Contact UNISOKU for details. *Due to the detrimental accumulation of carbon that accompanies SEM observation, inspected probes should not be used for STM observations. Tel +81-72-858-6456 Fax +81-72-859-5655 e-mail [email protected] URL http://www.unisoku.com UNISOKU Co., Ltd. 2-4-3 Kasugano, Hirakata, Osaka 573-0131 Japan
Transcript of High-Performance STM Probes -...
SEM image of tip of nickel probe
Tungsten ProbesType: P-100WS
Example STM image of HOPG with nickel probe
Example STM image of Au(111) with nickel probe
Platiniridium ProbesType: P-100PtIr (S)
SEM Image SEM Image SEM Image
Ni ProbesType: P-100Ni (S)
Shape: ConeWire Rod: Polycrystalline tungsten
0.25mm diameterCuravant Radius of a Tip: <35nm
Shape: Cone Wire Rod: Polycrystalline Ni
0.25mm diameterCuravant Radius of a Tip: <25nm
Shape: ConeWire Rod: Polycrystalline Platiniridium
0.5mm diameterCuravant Radius of a Tip: <20nmGrind Process: Electro-polishing after mechanical grind
High-Performance STM ProbesHigh-Performance STM Probes
Enables Reliable STM Measurement Without Requiring Troublesome Probe Treatment
2 ～ 3ｍｍ
Total 10ｍｍ
1 ～ 1.5ｍｍ
Total 10ｍｍ
2.5 ～ 3ｍｍ
Total 10ｍｍ
20130516
The stability of STM measurements is greatly influenced by the quality of the probe. Namely, good STM measure-ment results often cannot be obtained due to variances in the probe tip diameter, contamination of the probe sur-face, or cleaning process errors. UNISOKU has successfully developed nickel and plati-niridium STM probes using an electropolishing method that is able to solve these problems by yielding fine tip di-ameters with minimal contamination. Our metal probes allow you to experience a higher level of stability than was possible in the past. Our conventional tungsten probes are also still available.
UNISOKU has confirmed that atomic images can be reliably obtained, without the need for high-temperature heat treatment, when observing HOPG in air and gold in an ultra-high vacuum.*2: Applies only to nickel and platiniridium probes.
However, when observing active surfaces, heating is recommended for degassing.*Noble metal (Au, Ag) coating for nickel probes are being developed. Contact UNISOKU for details.*Due to the detrimental accumulation of carbon that accompanies SEM observation, inspected probes should not be used for STM observations.
Tel +81-72-858-6456 Fax +81-72-859-5655e-mail [email protected] URL http://www.unisoku.com
UNISOKU Co., Ltd.2-4-3 Kasugano, Hirakata, Osaka 573-0131 Japan
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