Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253...

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Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 Fri 21 Feb: Burger 200-253 (§4.4-4.7) Reflection Data Processing : Migration return reflection energy to its “true” ation on the two-way travel-time image… Depth ration uses velocity structure from NMO correction convert travel time to depth (improving image resol oving e.g. velocity pull-ups/pull-downs) imes additional steps as well: Amplitude adjustments Frequency adjustments mission adjustments Depth Migration he latter especially is important for velocity effe eflection Interpretation collection: Huge quantities of data! Redundancy is ofiling still used for initial reconnaissance, but ustry standard for prospects

Transcript of Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253...

Page 1: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Geology 5660/6660Applied Geophysics

19 Feb 2014

© A.R. Lowry 2014For Fri 21 Feb: Burger 200-253 (§4.4-4.7)

Last Time: Reflection Data Processing• Step IV: Migration return reflection energy to its “true” location on the two-way travel-time image… Depth migration uses velocity structure from NMO correction to convert travel time to depth (improving image resolution; removing e.g. velocity pull-ups/pull-downs)• Sometimes additional steps as well: Amplitude adjustments Frequency adjustments Transmission adjustments Depth Migration (The latter especially is important for velocity effects!)

Seismic Reflection Interpretation• Data collection: Huge quantities of data! Redundancy is key!• 2D profiling still used for initial reconnaissance, but 3D is industry standard for prospects

Page 2: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

2D Seismic Data• 2D lines are long profiles that are processed independently

• Generally collected now for regional reconnaissance studies

• Covers large areas and gives an overall picture of the geology

Page 3: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Page 4: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Page 5: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Deep seismic profiling• Imaging depth range from 0-50 km

Strongest & most continuous impedance contrasts below sedimentary cover are lithologic changes ~mid-crust and at the Moho

Page 6: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Other reflectivity within crystalline crust can relate to lithologic changes (e.g. across a low-angle normal fault) but also often represents mineral alignment in ductile shear zones

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Haakon Fossen 2010

Page 8: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

• Better resolution

• Better positioning

• 3D view options

3-D seismic cubes

Page 9: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

3D seismic3D data: • collected by shooting many parallel lines ~25 m apart• migrated together to increase accuracy and to create a coherent data volume (cube) • collected over all offshore oil and gas fields• underpin the geometric understanding of an oil field

Page 10: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Page 11: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Data acquisition

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Haakon Fossen 2010

Resolution

• Vertical

• Lateral

Page 13: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Vertical resolution

Relationship between bedthickness and acousticimpedance contrast forseismic resolution of alayer.

Vertical seismic resolution in terms oftuning thickness: When top to baseof a layer is less than 1/4 wavelength,constructive/destructive interferenceresults in apparent single wavelet.

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Haakon Fossen 2010

Color convention: Blue for positive amplitude, red for negative…

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Haakon Fossen 2010

Page 16: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Page 17: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Page 18: Geology 5660/6660 Applied Geophysics 19 Feb 2014 © A.R. Lowry 2014 For Fri 21 Feb: Burger 200-253 (§4.4-4.7) Last Time: Reflection Data Processing Step.

Haakon Fossen 2010

Lateral positioning

• Choice of migration velocities affects horizontal positioning of signals• Horizontal resolution typically 50-100 m• Serious concern when drilling high-precision wells, e.g. close to faults. • Resolution may depend heavily on pilot wells

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Haakon Fossen 2010

Directional drilling/steering technology is another reason for accurate depth migration!

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Haakon Fossen 2010

Seismic qualityDepends on:

• Acoustic impedance contrast

• Depth ( frequency)

• Layer thickness ( interference)

• Properties of overlying layers

• Source energy

• Processing parameters

• Acquisition direction

• Instrumentation