Fig.: 12.1

17
Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition Fig.: 12.1

description

Fig.: 12.1. Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds .): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition. a. F. b. 1. strength or. N. yield criterion. nominal strength s. D. LEBM. D'. specimen dimension (log D). Fig.: 12.2. - PowerPoint PPT Presentation

Transcript of Fig.: 12.1

Page 1: Fig.: 12.1

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.1

Page 2: Fig.: 12.1

F

1

D'

specimen dimension (log D)

strength or

yield criterion

a b

nom

inal

str

engt

h N

LEBM

D

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.2

Page 3: Fig.: 12.1

a b

c

d

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.3

Page 4: Fig.: 12.1

17.6

2 0.1

0.1

IN TRON MODEL 1362

load cell

adapter

micro-tensile testing device

internal load cell

specimen

0.1

2

1.17

2

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.4

Page 5: Fig.: 12.1

0 0.2 0.4 0.6 0.8 1.0

60

50

40

30

20

10

0

standard specimenl = 50 mm0

25 °C

100 °C

175 °C

225 °C

25 °C

100 °C

175 °C

microspecimenl = 10 mm0

(%)

(M

Pa)

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.5

Page 6: Fig.: 12.1

q

l

specimen correlated video image data aquisition

-0.20

-0.15

-0.10

-0.05

0.00

0.05

0.10

0.15

0.20

0.25

0.30

0.35

0.40

0.45

0.50

(%

)

a

b

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.6

Page 7: Fig.: 12.1

0 0.1 0.2 0.3 0.4

0.50

0.45

0.40

0.35

0.30

0.25

0.20

0.15

0.10

EP + filler (SiO ) = 0.27PP + chalk = 0.20PVC + filler = 0.22

2

l (%)

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.7

Page 8: Fig.: 12.1

standard CTmini CT

0 20 40 60 80 100 120

100

80

60

40

20

0

v (µm)

F (

N)

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.8

Page 9: Fig.: 12.1

PEIPC

PSUPF

ceramicsPMMA

epoxy resinceramics

0 30 60 90 120 150

150

120

90

60

30

0

K (MPamm ) for mini CTQ1/2

K

(M

Pam

m

)

for

sta

ndar

d C

TQ

1/2

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.9

Page 10: Fig.: 12.1

aload

PMMA

PS

glass

interface crack

0 h (nm)

A

BD

C

E

b

F (

mN

)

indenter

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.10

Page 11: Fig.: 12.1

a b

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.11

Page 12: Fig.: 12.1

a b

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.12

Page 13: Fig.: 12.1

F

loading module

scan deviceoptical device

CT specimen

a

F

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.13

Page 14: Fig.: 12.1

200160120

0 10 20 30µm

180140100

0 10 20 30µm

0.36

10

10

crack crack

10

10

crack

height profile height profile

0.28

polishing trace

a bnm nm

line of height profile evaluation

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.14

Page 15: Fig.: 12.1

30

25

20

15

10

5

00 5 10 15 20 25 30

µm

0.1

30

5 10 15

20 25 30

µm

crack flank left

crack flank rigth

a b

µm

disp

lace

men

tpe

rpen

dicu

lar

to t

he

crac

k

µm

µm

0.0-0.1

2520

1510

5

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.15

Page 16: Fig.: 12.1

y

r

x

u (x)yu

u (x)yl

u (x)yr

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.16

Page 17: Fig.: 12.1

a4.5

4.0

3.5

3.0

2.5

2.0

1.5

1.0

0.5

00 1 2 3 4

x coordinate (µm)

displacement u (µm)y

0 1 2 3 4

7 10

6 10

5 10

4 10

3 10

2 10

1 10

.

.

.

.

.

.

.

-4

-4

-4

-4

-4

-4

-4

y = 2.1 10 x + 6.9 10. -4 -4.

x coordinate (µm)

y co

ord

inat

e (µ

m)

b

Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

Fig.: 12.17

((u

− u

)/

2)

(µm

)

ul

yy

22