February 2011 CLASSIFICATION DEFINITIONS 356 - 1 CLASS 356, … · 2019-10-22 · or configurations...

February 2011 CLASSIFICATION DEFINITIONS 356 - 1

February 2011

CLASS 356, OPTICS:MEASURING AND TEST-ING

SECTION I - CLASS DEFINITION

A. This class includes methods and apparatus (a) foranalyzing light to measure or test its characteristics,such as intensity, color and polarization; (b) for deter-mining the optical or nonoptical properties of materialsor articles by noting, as by inspection, measurement, ortest the effect produced by the materials or articles onlight associated therewith; and (c) for measuring thedimensions of structures or the spatial relationships suchas distances or angle bearings of spaced points by com-parison of the respective properties (usually direction orspatial position) of the light from these points or bycomparison of the properties of these lights with somescale or standard. The light analyzing includes or is forspectroscopy, interference, polarization, beam directionor pattern, focal position of a light source, shade orcolor, and photometers. The material or article proper-ties determined are or involve crystal or gem examina-tion, material strain analysis, blood analysis, opticalpyrometers, egg candling, cutting blade sharpness, oiltesting, document verification, flatness, lens or reflectortesting, refraction testing, monitoring moving webs orfabrics, light transmission or absorption, light reflection,inspection for flaws or imperfections in materials, andthread counting.

The dimensioning and spatial relationship determinationincludes triangulation by a light beam, contour plotting,range or height finders, motion stopping, velocity orvelocity/height measuring, sighting where the opticalelement or reticle moves with the sighted object, particlesize determination, particle light scattering, electro-phoresis, angle measuring or axial alignment, mensura-tion or configuration comparison, alignment in a lateraldirection, and fiducial instruments.

B. Included also are apparatus and methods to facilitatethe viewing of structure as for flaws and imperfections.The structure is usually optically significant such astransparent sheets or bottles or semi-transparent cloth;or the structure is inaccessible as a bore requiring a borescope. Included also are methods and structure for pre-paring the sample for an optical test, and optical teststandards.

C. Included also are apparatus and methods involving aplurality of measurements or tests each within the scopeof this class; and also included are a measurement or testwithin the scope of this class together with a measure-ment or test or other art structure provided, per se, else-

where, but where no provision for the combination ismade elsewhere.

SECTION II - LINES WITH OTHER CLASSESAND WITHIN THIS CLASS

A. OPTICAL MEASURING OR TESTING CLASSI-FIED ELSEWHERE

Class 33 provides for optical measurements of the lightray type within the scope of this class. See “Geometri-cal Instruments in This Class and in Class 33,” sectionC, below, for the subject matter placed in Class 33 andClass 356. Class 73 includes optical measuring and test-ing within the scope of its subclasses. See “Measuringand Testing in This Class and Class 73,” section D,below, for the line between Class 73 and Class 356.Signal and indicating apparatus which may involveoptics are classified elsewhere. See, for example, tem-perature, radiant energy, smoke, or gas indicators. Surgi-cal diagnostic instruments which may involve opticalmeasuring or testing on or in the body are elsewhere.Television systems for measuring and testing which mayinclude optical elements are classified elsewhere. Pho-tocells and associated circuitry together with opticalstructure which may involve measuring or testing areclassified elsewhere. However, this Class 356 includesoptical testing with a photoelectric light detector andusually claiming either an indicator or structure to sup-port or contain the specimen or sample under test.Lamp and discharge device testing is classified else-where. Eye examining and testing instruments whichmay include optical measuring or testing are else-where. (See Subclass References to the Current Classand References to Other Classes, below, for subclassreferences of subject matter above.)

B. TESTING AND MEASURING SUBCOMBINA-TIONS PROVIDED FOR ELSEWHERE

Optical elements which may be used in measuring andtesting apparatus are classified elsewhere as are the con-ventional optical elements such as lenses, prisms, andmirrors. Subclasses relating to scale or indicia readingshould be particularly noted. Photocell circuits andapparatus are elsewhere. Photo-sensitive dischargedevices are classified elsewhere. Mechanical scales andgauges which may be part of optical measuring systemsare elsewhere. Mechanical indicators which may bepart of optical measuring systems classified elsewhere.Electrical indicating and measuring devices which maybe part of optical measuring systems are classified else-

356 - 2 CLASSIFICATION DEFINITIONS February 2011

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where. (See References to Other Classes, below, forclass/subclass references to these art areas.)

(1) Note. Telemetric signaling means useful intransmitting a measured quantity, not lim-ited to any particular measuring instrumentprovided for in other classes, is classifiedelsewhere, while Class 356 takes such tele-metric signaling means in combination witha particular measuring means of the typeprovided for in Class 356. (See Referencesto Other Classes, below.)C. GEOMETRICAL INSTRUMENTS INTHIS CLASS AND IN CLASS 33This class (356) provides for measuringdevices which are used for determiningspatial relationships, and which involve theestablishment of an optical axis betweenthe observer’s station and a remote pointand which include significant optical struc-ture. This includes certain types of range-finders, angle or azimuth measuring instru-ments and velocity measuring devices asqualified below. In this subject matter therecitation of specific optical details such aslens, prism, or mirror details is sufficientfor classification in this class (356). Excep-tions which remain in Class 33 are bombsights with specific optical line sightinginstruments with a telescope or microscoperecited even in some detail, and as a view-ing aid to but not a part of the sightinginstrument. Also where a plurality of opti-cal functions are recited as, for example,plural reflections of a line of sight, classifi-cation is in this Class 356. Where optic isonly recited broadly as, for example, “anoptical axis,” a “telescope,” or a “deflectionof the line of sight,” the subject matter isgenerally classified in Class 33, as opposedto Class 356.Also included in this Class 356 are instru-ments for visual sighting which in additionto having a field of view, perform an aim-ing or alignment function or establish a lineof sight by means of an artificial referenceand which include significant optical struc-ture.The geometrical instruments of this Class356 usually either involve the determina-tion of the direction of a point remote froman observer with respect to some referencedirection where the two directions may beviewed and compared simultaneously; or

the determination of the relative directionof two points remote from an observerwhere the two directions may be viewedand compared simultaneously. Opticalstructure is usually provided to facilitatethis simultaneous viewing. The subjectmatter of Class 33 relates more to the direc-tion determination by aiming an instrumenton a point and later noting the direction ofthe aimed instrument with respect to somereference such as a level, compass, or otherpoint. A mere single deflection of a line ofsight as by a mirror or lens to facilitate theviewing is not precluded from Class 33. Inthe mensuration or figure comparison, thepatents in this class (356) include structureto facilitate the viewing (usually simulta-neously) of the specimens, or configura-tions to be compared with other specimensor configurations or with scales, masters, orpatterns.A single sight line optical instrument suchas a transit with structure for indicating thedirection is classified in Class 33. Howeverwhere such an instrument includes a sight-ing mark or scale at an optically criticalposition such as in the focal plane classifi-cation is in Class 356.Comparison instruments which merge therays from diverse directions for commonviewing as in a split image range finder areclassified in Class 356. However pluralsighting instruments which merely aim onangularly separated points (even simulta-neously) with mechanical reading of thedirections are classified in Class 33. Spacemeasuring instruments whose operation isessentially optical such as optical interfer-ometers are classified in Class 356 asopposed to Class 33. Reticles and crosshairs generally are classified in Class 33.However, optical reticles which reflect orrefract light are classified in Class 356.D. MEASURING AND TESTING INTHIS CLASS AND CLASS 73This class (356) provides for optical mea-suring and testing as defined above. Class73 provides for measuring and testingwhich may include optical measuring andtesting as defined, combined with somenonoptical limitations beyond the scope ofthis class (356) and specifically providedfor in Class 73. Specific provision exists inClass 73 when the measurement or test is of


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the type provided for by the subclasses ofClass 73 definitions. For example, Class 73provides for gas chromatography involvingcolor determination of the Class 356 typetogether with some manipulation of the gasbeyond the scope of Class 356. AgainClass 73 provides for engine testing involv-ing optical tests of the Class 356 typetogether with some mechanical manipula-tion of the parts beyond the scope of Class356. In general Class 73 provides for mea-suring and testing of the type indicated byits subclass titles and definitions which mayinclude optical steps together with othermechanical measuring and testing stepsbeyond the scope of Class 356. There aresome patents presently in Class 73 whichrelate to measuring and testing as there pro-vided, but which claim only optical subjectmatter within the scope of Class 356. Com-binations of optical measuring or testingwith other structure or methods is classifiedin Class 356 if no provision for such combi-nations exists elsewhere. (See Referencesto Other Classes, below.)An exception to the above involves cuttingblade sharpness testing where Class 356provides for the optical type with theremainder in Class 73. Another exceptioninvolves stress analysis where Class 356provides for the optical type absent inten-tional loading of the specimen. The remain-der is classified in Class 73, particularly foroptical stress analysis with intentional load-ing of the specimen. (See Subclass Refer-ences to the Current Class and Referencesto Other Classes, below.)E. NONVISIBLE RADIATIONThis class is restricted to measuring andtesting involving visible light. Howeverwhere the measuring or testing involvesinfrared or ultraviolet radiation with appa-ratus optical in nature and nothing peculiarto such infra red and ultra violet radiation,classification is in this class. For example,optical equipment where the radiation wasclaimed as ultraviolet or infra red would beclassified in this class, especially methodsand apparatus for the inspection of solid orliquids by charged particles and invisibleradiation responsive electric signallingmethods and apparatus. See also THER-MOCOUPLES AND BOLOMETERS,

below. (See Subclass References to theCurrent Class, below.)F. FLUORESCENCE AND PHOSPHO-RESCENCE TESTINGThe examination of fluorescent and phos-phorescent material or organisms to deter-mine their fluorescent or phosphorescentproperties or the examination of invisibleenergy including ultraviolet light by sub-jecting fluorescent or phosphorescent mate-rial to invisible radiation is classifiedelsewhere even though the fluorescent orphosphorescent radiation is in the visiblelight range and the intensity and the fre-quency of the fluorescent or phosphores-cent light is examined. Methods ofdetermining oil presence, contamination orconcentration, methods and apparatus usingluminophor test material or a luminophordetector in combination with an electricsignalling device responsive to the lightemitted by the luminophor, methods andapparatus to irradiate a luminophor andluminscent devices, per se, are classifiedelsewhere. (See References to OtherClasses, below.)Fluorescent or phosphorescent apparatusused as a visible light standard and claimedas part of a visible light testing apparatus asof a comparator type and which is basicsubject matter of Class 356 is classified inClass 356. The examination of the visiblelight, per se, emitted by fluorescent orphosphorescent materials would be classi-fied in Class 356 when the fluorescent orphosphorescent materials or source produc-ing the visible light is not included in theclaims.G. LASERS AND RESONANCE RADIA-TIONThe testing with optical apparatus of a laserbeam for the intensity or frequency of thevisible light, per se, emitted by the laser isin Class 356 (see Subclass References tothe Current Class, below). However, lasersand similar devices when they function asan amplifier of light in the visible range andlaser modulator, per se, are classified else-where. For optical elements which controllight intensity or direction on a molecularlevel, see classification elsewhere; for mod-ulation involving polarized light and forlight control by altering an optical medium


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or surface see elsewhere. Coherent lightgenerators, per se, are classified elsewhere.H. THERMOCOUPLES AND BOLOME-TERSWhere the intensity or the frequency ofinvisible radiation is determined by meansof a thermal detector, classification is else-where. Where the intensity or the fre-quency of visible light radiation isdetermined by means of a thermal detector,classification is in Class 356. Where thetotal energy or power in a beam of radiationis measured by a thermal detector classifi-cation is elsewhere; and where thermallyemitted radiation is measured to determinethe temperature of the emitting source,classification is also elsewhere, exceptwhere the radiation is limited to light,where the classification is in Class 356.(See Subclass References to the CurrentClass and References to Other Classes,below.)I. BURNINGAlthough the burning of a combustiblematerial is a chemical reaction, the combi-nation of the burning of combustible mate-rial for visible light examination purposeswith visible light analyzing structures ofthis class is in this Class 356. See Refer-ences to Other Classes, below for “Com-bustion” and for all combustion reactionsnot provided for elsewhere. See also Sub-class References to the Current Class,below. (See References to Other Classes,below.)J. COUNTINGClaims to the counting of discrete particlessuch as blood particles, bacteria colonies,or dust particles, one at a time by numericalcounting apparatus which registers thecounts corresponding to the respective par-ticles will be found elsewhere. However,the visual counting with a scale or spacer toaid the eye is classified in this Class (356).Claims to the sizing and counting of parti-cles such as blood particles, bacteria colo-nies, or dust particles, one at a time bynumerical counting apparatus will be foundelsewhere. The counting of undulations bymeans of visible light or indeterminatelength material such as a web of fabric orthreads, per se, for testing the weave of theweb for evenness, or the thread for uneven-ness, or for flaws, or for optical properties

or physical dimensions where the measure-ment is affected only by the variations ofthe light caused by the web or thread willbe in Class 356 rather than elsewhere. Thecounting of particles with visible light bystatistical analysis procedures instead of aone by one numerical particle count as else-where will be in Class 356. The sizing andcounting of particles with visible light bystatistical analysis procedures instead of aone by one numerical particle count as else-where will be in Class 356. The countingor the sizing and counting of particles withvisible light by statistical methods in Class356 involves for example, polarized light,light scattering, color testing, and reflectivediffusion of light. Where a microscope isutilized to count particles, one by one, suchas blood particles or bacteria colonies, seeelsewhere. Where an optical element suchas a lens for magnification is used in com-bination with a support for counting bacte-ria colonies, or particles such as dust seeclassification elsewhere for one by onecounting. Where no optical element is uti-lized and only a support is used see thisClass (356). Where a microscope having agraticule rather than a cross hair or a reticleis used to count particles one by one seethis class (356). See this class (356) forsupports for bacteria counters where only alight and a support for the one by one countis involved. (See Subclass References tothe Current Class and References to OtherClasses, below.)K. READING AND RECORDINGThe combination of an optical test of thisclass with a qualitative or quantitativemarker or recorder is in this class. Class356 provides for the reading visually of theinformation or data cards where not else-where provided.Pattern or character recognition of a docu-ment or a record is classified elsewhere.Where the document analysis or verifica-tion is limited to the intrinsic properties ofthe record, classification is in Class 356.Systems controlled by a record and coderecord sensors, respectfully, are classifiedelsewhere. Apparatus to check hole typecards for errors in the punching or in thesorting of cards where the error checkequipment is not part of a business machineis classified elsewhere. (See Subclass Ref-


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erences to the Current Class and Referencesto Other Classes, below.)

SECTION III - SUBCLASS REFERENCES TOTHE CURRENT CLASS

SEE OR SEARCH THIS CLASS, SUBCLASS:3+, 28, 139.01+, 141.1+, 152.1+, 218, and 442 for

optical testing with a photoelectric light detec-tor and usually claiming either an indicator orstructure to support or contain the specimen orsample under test.

32+, for stress analysis where Class 356 provides forthe optical type absent intentional loading ofthe specimen.

43+, where radiation is limited to light, classifica-tion is here; where thermally emitted radiationis measured to determine the temperature of theemitting source, classification is elsewhere.

51, where measuring or testing involves infrared orultraviolet radiation with apparatus optical innature and nothing peculiar to infra red andultra violet radiation.

69, for cutting blade sharpness testing where Class356 provides for the optical type.

71, where document analysis or verification is lim-ited to the intrinsic properties of the record.

213, and 402+ for testing with optical apparatus of alaser beam for the intensity or frequency of thevisible light, per se, emitted by the laser.

244, for supports for bacteria counters where only alight and a support for the one by one count isinvolved.

306, for methods and apparatus for the inspection ofsolid or liquids by charged particles.

315, see Search Class and the notes in reference to aflame producer whose flame heats or burns asample to cause the emission of radiation to beanalyzed. (See Lines With Other Classes,“Burning”, above.)

335+, for the sizing and counting of particles withvisible light by statistical analysis proceduresinstead of a one by one numerical particlecount.

336, for invisible radiation responsive electric sig-nalling methods and apparatus.

438+, and 441+ for the counting of particles with vis-ible light by statistical analysis procedures.

SECTION IV - REFERENCES TO OTHERCLASSES

SEE OR SEARCH CLASS:15, Brushing, Scrubbing, and General Cleaning,

subclass 3.1 for machines to clean eggs, ormachines to clean and assort or screen eggs.

26, Textiles: Cloth Finishing, subclass 70 fordevices facilitating the inspection of cloth.

33, Geometrical Instruments, subclass 1 forplanimeter type calculators such as moment ofinertia of areas, subclasses 18.1+, for scribers,subclass 121, for area integrators, subclass 125,for distance measuring, subclasses 501+, forgauges of the fixed or adjustable type, and sub-class 227, for means and methods utilizingnonreflected light rays and direct sighting fordetermining the characteristics and mutualrelationships of points, lines, angles, etc.

33, Geometrical Instruments, provides formechanical scales and gauges which may bepart of optical measuring systems. (See LinesWith Other Classes, B, “Testing and MeasuringSubcombinations Provided for Elsewhere.”)

33, Geometrical Instruments, provides in subclass227 for optical measurements of the light raytype within the scope of this class. (See LinesWith Other Classes, A, “Optical Measuring orTesting Classified Elsewhere.”)

40, Card, Picture, or Sign Exhibiting, subclasses446+ for changeable exhibitors, and subclasses361+ for transparent film viewers.

53, Package Making, subclass 52 for automatic ortriggered control of a package making machinein response to a test which may be optical, andsubclasses 507+ for visual inspection meanscombined with package making machines.

65, Glass Manufacturing, subclasses 377+ for pro-cesses of glass making with a step of visually,chemically or physically determining a chemi-cal or physical property, subclass 38 for theprocess of forming a lens with a fusion bondingstep, and subclass 158 for inspection meanswhich may be optical.

72, Metal Deforming, subclass 37 for metaldeforming with use of optical or transparent(e.g., viewing) means.

73, Measuring and Testing, subclass 23.1 for theexamination of the effluent of a mixture ofgases which has contacted a solvent or sorbentwhich separates the mixture into fractionalcomponents and for gas chromatographyinvolving color determination of the Class 356type together with some manipulation of thegas beyond the scope of Class 356, subclass 28for analysis of solid matter in gases, subclass


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29 for analysis of moisture content or vaporpressure by physical means, subclass 30 fordensity tests by physical means, subclass 32 forspecific gravity or density testing of liquids orsolids, subclass 37 for fluid pressure tests, sub-classes 53.01+ for the testing of liquids or a liq-uid suspension of solids including sediment orforeign content, subclass 73 for determiningmoisture content or absorption characteristicsof material, subclass 78 for hardness testing,subclasses 760+ for stress or strain testing ofmaterial generally, particularly subclass 800for optical stress analysis with intentional load-ing of the specimen, subclass 104 for surfaceand cutting edge testing generally, subclass114.08 for using an optical measurement fordetermining irregular combustion (e.g., mis-fire), and subclass 114.29 for using microwaveenergy to determine piston position in combi-nation with a rotational position sensor in aninternal combustion engine, subclass 156 forstatistical record verifying, subclass 157 forrecord strip sprocket hole testing, subclasses861+ for volume or rate of flow meters, sub-class 290 for liquid level or depth gauges, sub-class 488 for speed or acceleration testinggenerally, subclasses 700+ for fluid pressuresgauges, and subclass 421 for samplers and tol-lers. (See Lines With Other Classes, sectionsA and D, above.)

73, Measuring and Testing, subclass 156 for appa-ratus to check hole type cards for errors in thepunching or in the sorting of cards where theerror check equipment is not part of a businessmachine. (See Lines With Other Classes, K,“Reading and Recording.”)

74, Machine Element or Mechanism, subclass 20for mechanical movement apparatus, subclass640 for gearing arrangements, subclass 469 forcontrol lever and linkage systems, and subclass567 for machine elements, per se.

91, Motors: Expansible Chamber Type, subclass 1for signals, indicators or inspection meansincluding visual inspection devices wherebythe motor operation or the condition of somepart may be ascertained.

92, Expansible Chamber Devices, subclass 5 forsignals, indicators, or inspection meanswhereby the expansible chamber operation orthe condition of some part of the device may beascertained.

95, Gas Separation: Processes, subclasses 1+ forprocesses of gas separation with controlresponsive to sensed condition which may

involve an optical test and subclasses 82+ forprocesses of gas separation using chromatogra-phy.

96, Gas Separation: Apparatus, subclasses 101+for chromatography type apparatus for gas sep-aration, subclass 413 for gas separation appara-tus having sampling means, and subclasses417+ for gas separation apparatus having sig-nals, indicators, measuring, or testing means.

100, Presses, subclass 99 for alarm, signal, indica-tor, or test means which may be of an opticalcharacter.

101, Printing, subclass 2 for printing devices com-bined with sorting devices which may utilizean optical test.

116, Signals and Indicators, for mechanical signalsand indicators, particularly subclasses 200+ formechanical indicators which may be part ofoptical measuring systems and subclass 137 forcompressional wave generators. (See LinesWith Other Classes, B, “Testing and MeasuringSubcombinations Provided for Elsewhere.”)

116, Signals and Indicators, for signal and indicat-ing apparatus which may involve optics. (SeeLines With Other Classes, A, “Optical Measur-ing or Testing Classified Elsewhere.”)

118, Coating Apparatus, subclasses 663+ for auto-matic control of coating apparatus which mayinclude an optical test, subclasses 712+ fortesting, inspecting or measuring which mayinvolve visual inspection or an optical testdevice, and subclasses 712+ for signals andindicators responsive to a condition.

119, Animal Husbandry, subclass 6.8 for egg can-dling methods and apparatus combined withthe treating of fertilized eggs, and subclass 311for incubators which include candling opera-tions.

125, Stone Working, subclass 30 for working pre-cious stones.

131, Tobacco, subclasses 280+ for cigar and ciga-rette making machinery which include lighttesting devices to control the operation of themachinery.

134, Cleaning and Liquid Contact With Solids, sub-class 113 for such apparatus with an alarm, sig-nal, indicating, inspecting, illuminating, or dis-play means.

136, Batteries: Thermoelectric and Photoelectric, subclasses 243+ for photoelectric primary bat-teries.

137, Fluid Handling, subclass 2 for processes offlow control by a condition or characteristic ofa fluid which may be of an optical nature, and


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subclass 93 for self-proportioning or correlat-ing systems responsive to an optical property,and subclass 551 for indicators, registers,recorders, alarms, or inspection means includ-ing visual inspection means.

141, Fluent Material Handling, With Receiver orReceiver Coacting Means, subclass 83 for test-ing or weighing receiver content, and subclass94 for signals, indicators, recorders, inspectionmeans, and exhibitors permitting inspection ofthe material handling means.

156, Adhesive Bonding and Miscellaneous Chemi-cal Manufacture, subclass 64 for methods withmeasuring, testing or inspecting, subclass 378for apparatus with testing, measuring alone orin combination with indicating means involv-ing the properties, dimensions, or a conditionof the work or apparatus, and subclass 379 forinspecting with or without illuminating meansfor observing normally nonvisible machine orwork parts.

162, Paper Making and Fiber Liberation, subclass198 for processes involving measuring,inspecting alone or in combination with testingor visual inspection of the product, and sub-class 263 for apparatus to detect some condi-tion of the machine or the material includinginspection of the material undergoing treatmentfor some chemical or physical characteristic.

165, Heat Exchange, subclasses 11.1+ for exchangeapparatus having an alarm, indicator, signal,register, recorder, test or inspection means.

166, Wells, subclasses 250.01+ for processesincluding indicating, testing, measuring, locat-ing, or recording a well condition, and subclass64 for well apparatus including time, distance,temperature, or counting apparatus.

171, Unearthing Plants or Buried Objects, subclass15 for apparatus including separation by size,subclass 18 for apparatus for separating buriedobjects based upon physical differences, andsubclass 20 including visual inspection of theburied object.

173, Tool Driving or Impacting, subclass 20 forapparatus including means to indicate or signala condition including position or movement ofthe driving or impacting tool.

174, Electricity: Conductors and Insulators, sub-class 11 for electrical apparatus including afluid or vacuum with structure to signal or indi-cate some condition of the fluid or vacuum.

175, Boring or Penetrating the Earth, subclass 40for apparatus with signalling, indicating, test-ing or measuring including invisible radiation

examination in subclass 41 and visual inspec-tion means in subclass 49.

177, Weighing Scales, appropriate subclasses forbalances, per se, and automatic weighingdevices, particularly subclass 45 for apparatusincluding alarms or signals in addition to theweight indicator, and subclass 50 for apparatusfor performing an additional test including sizegauging not provided for elsewhere.

193, Conveyors, Chutes, Skids, Guides, and Ways,appropriate subclasses for nonpowered typematerial transporting apparatus including sub-class 2 for chutes and subclass 35 for roller-ways.

194, Check-Actuated Control Mechanisms, sub-class 207 including apparatus for the testing ofpaper currency for genuineness and otheranomalous checks in automatic dispensingmachines and including apparatus in subclasses224 and 304+ for coin in circuit operatedswitches, subclasses 219+, 230+, and 239+ forcoin operated switches, and subclasses 302+for fraud preventive devices.

198, Conveyors: Power-Driven, subclass 502 for aconveyor having signalling or indicating meansor means for measuring the conveyed load,subclasses 504+ for a conveyor having loadweighing means, and appropriate subclassesfor different types of conveyors or systems ofconveyors having operation control meansusing a photo-optics system.

200, Electricity: Circuit Makers and Breakers, sub-class 61.02 for light actuated switches.

204, Chemistry: Electrical and Wave Energy, sub-classes 450+ and 600+ for processes and appa-ratus, respectively, dealing with electrophoresisand electro-osmosis; subclasses 400+ for elec-trolytic analysis and testing apparatus; and sub-classes 242+ for electrolytic cells, in general.

209, Classifying, Separating, and Assorting Solids,particularly subclasses 510+ for the combina-tion of a candling operation with a weighingoperation of the sorting type; subclasses 556+for diverse condition responsive testing means;subclasses 525 and 586 for light-type gaugingapparatus; subclasses 580+ for apparatus forsorting on the basis of an optical property of amaterial including the color and polarizationeffects of the material; subclasses 512+, 592+,and 645 for automatic weighers; and subclasses702+ and 939 for manual candling and assort-ing apparatus.

210, Liquid Purification or Separation, subclass 635and 656+ for processes involving chromatogra-


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phy, and subclass 85 for apparatus includingalarms, indicators, registers, recorders, signalsor inspection means including sight glasses.

211, Supports: Racks, appropriate subclasses forsupports for plural articles particularly sub-class 10 for racks to facilitate the sorting ofarticles by hand, and subclass 14 for racksdesigned to support eggs.

221, Article Dispensing, subclass 2 for apparatusincluding recorders, registers, indicators, sig-nals or exhibitors for noting a condition orposition of a dispenser part, and subclass 155for apparatus with transparent inspecting orviewing means.

225, Severing by Tearing or Breaking, subclass 41for manual severing devices which have ahousing for the work supply with an inspectionwindow or transparent panel.

226, Advancing Material of Indeterminate Length, subclass 100 for apparatus with an alarm, sig-nal, or indicator to sense a condition in themovement of indefinite length material.

228, Metal Fusion Bonding, subclass 56.5 for appa-ratus to note the physical state or location ofthe work, flux, filler, or product.

235, Registers, subclasses 419+ for record con-trolled electromechanical calculators, subclass61 for mechanical digital and analogue calcula-tors.

235, Registers, subclasses 375+ and 435+ for sys-tems controlled by a record and code recordsensors, respectfully. (See Lines With OtherClasses, K, “Reading and Recording.”)

239, Fluid Sprinkling, Spraying, and Diffusing, subclass 71 for apparatus having means to indi-cate a condition, indicate the extent of motionor position of a part, or perform a quantitymeasurement or an inspection to determineflow conditions.

242, Winding, Tensioning, or Guiding, subclasses357, 472.9+, 479.9+, 484.8, 484.9, 534+, 563+for detector or stop for controlling variouswinding or unwinding operations, and subclass912 for an alarm or indicator.

246, Railway Switches and Signals, subclass 20 forblock signal systems, subclass 111 for gradecrossing track protection, subclass 120 for thedetection of defects in the roadway, subclass122 for train position indicating apparatus, sub-class 125 for electric automatic highway signalapparatus, and subclass 169 for train defectindicating apparatus including infrared hot boxdetectors.

248, Supports, appropriate subclasses for single arti-cle supports in general.

249, Static Molds, subclass 53 for apparatus includ-ing static gauges, levels, plumbs or scale mark-ings on molding apparatus.

250, Radiant Energy, subclass 200 for photoelectriccircuits to control the illumination falling uponthe photocell or to follow a pattern or to followa point, and for apparatus, subclass 206 forphotoelectric controlled circuits, particularlysubclass 216 for optical or prephotocell sys-tems which includes in subclass 221 for systemcontrolled by articles, persons or animals, insubclass 225 polarizing optical system, in sub-class 226 optical systems including visiblelight filters, prisms, and diffraction gratingsand in subclass 229 the control of light by opti-cal shutters and attenuators, and subclasses 250to 422 for methods and apparatus dealing withthe production of invisible radiant energy, itsdetection or utilization. (See Lines With OtherClasses, B, “Testing and Measuring Subcombi-nations Provided for Elsewhere.”)

250, Radiant Energy, subclass 200 provides forphotocells and associated circuitry togetherwith optical structure which may involve mea-suring or testing. (See Lines With OtherClasses, A, “Optical Measuring or TestingClassified Elsewhere.”)

250, Radiant Energy, subclass 301 for methods ofdetermining oil presence, contamination orconcentration, subclass 361 for methods andapparatus using luminophor test material or aluminophor detector in combination with anelectric signalling device responsive to thelight emitted by the luminophor, subclasses458.1+ for methods and apparatus to irradiate aluminophor and subclasses 453.11+ for lumins-cent devices, per se. The examination of fluo-rescent and phosphorescent material ororganisms to determine their fluorescent orphosphorescent properties or the examinationof invisible energy including ultraviolet lightby subjecting fluorescent or phosphorescentmaterial to invisible radiation is in Class 250even though the fluorescent or phosphorescentradiation is in the visible light range and theintensity and the frequency of the fluorescentor phosphorescent light is examined. (SeeLines With Other Classes, F, “FluorescenceAnd Phosphorescence Testing.”)

250, Radiant Energy, where the intensity or the fre-quency of invisible radiation is determined bymeans of a thermal detector. (See Lines With


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Other Classes, H, “Thermocouples AndBolometers.”)

252, Compositions, subclass 62.3 for barrier layerdevice compositions, subclass 501.1 for lightsensitive emissive or conductive composi-tions, subclass 299 for liquid crystal containingoptical filter compositions and subclasses 582+for other optical filter compositions, and sub-classes 301.16 through 301.6 for fluorescent orphosphorescent compositions.

264, Plastic and Nonmetallic Article Shaping orTreating: Processes, subclasses 1.1+ for meth-ods for forming articles producing opticaleffects including light polarization, and sub-class 40 for methods with measuring, testing,or inspecting some variable condition in theshaped article, the mold, the molded materialor shaping surface.

269, Work Holders, subclass 8 for magnetic workholders, subclass 11 for holders provided withilluminating means, and subclass 19 for hold-ers provided with gage means such as verticalor horizontal position indicators for the work orthe holder.

313, Electric Lamp and Discharge Devices, sub-class 94 for photo-sensitive discharge devices.(See Lines With Other Classes, B, “Testing andMeasuring Subcombinations Provided forElsewhere.”)

318, Electricity: Motive Power Systems, subclass18 for follow-up systems of motor control, par-ticularly subclass 28 for self-balancing networkcontrols, subclass 480 for apparatus whichincludes the radiant energy control of a motor,and subclass 490 for motor systems with sig-nals, meters, recorders and testing devices.

324, Electricity: Measuring and Testing, appropri-ate subclasses for the measurement or the test-ing of electric properties, particularly sub-classes 300+ for measurements or tests relatingto nuclear or electronic induction, subclasses403+ for the testing of lamps, vacuum tubes,and discharge devices, subclass 200 for testswhich rely on magnetic phenomenon, sub-classes 600+ for the measurement of imped-ance, admittance, inductance, resistance,conductance, and susceptance, subclasses76.11+ for measuring or testing electricity, perse, including subclass 96 for tests utilizingoptical principles to determine electrical quan-tities, and subclass 121 for cathode-ray typeindicators. (See Lines With Other Classes, A,“Optical Measuring or Testing Classified Else-where.”)

324, Electricity: Measuring and Testing, for electri-cal indicating and measuring devices whichmay be part of optical measuring systems.(See Lines With Other Classes, B, “Testing andMeasuring Subcombinations Provided forElsewhere.”)

329, Demodulators, appropriate subclasses for ademodulator of signals of less than infrared fre-quency which may contain an optical device(e.g., an optical isolator).

330, Amplifiers, subclass 4.3 for lasers and similardevices when they function as an amplifier oflight in the visible range and laser modulator,per se. (See Lines With Other Classes, G,“Lasers and Resonance Radiation.”)

338, Electrical Resistors, subclass 15 for photocon-ductive resistors responsive to infrared, ultravi-olet or visible light.

340, Communications: Electrical, subclass 146.2for digital comparator systems, subclasses 5.1-5.92 for intelligence comparison of informa-tion, subclasses 870.01-870.44 for telemetricsig means useful in transmitting a measuredquantity, not limited to any particular measur-ing instrument provided for in other classes,and also 870.01-870.44 for quantitative teleme-tering systems including subclasses 870.28-870.29 whereby the telemetering is transmittedby means of radiant energy, subclasses 870.16-870.17 wherein the telemetering system isresponsive to a condition, subclasses 500-892for condition responsive indicating systems,particularly subclasses 577-579 for a flameindicator; subclasses 603-634 for a fluent mate-rial indicator; subclass 670 for a velocity indi-cator; subclass 675 for a web, film, or stripindicator; subclass 678 for a geometric gaugeindicator, and subclass 265 for geogage typeresponsive systems. (See Lines With OtherClasses, B, “Testing and Measuring Subcombi-nations Provided for Elsewhere,” (1) Note.)

340, Communications: Electrical, for electrical indi-cating and measuring devices which may bepart of optical measuring systems. (See LinesWith Other Classes, B, “Testing and MeasuringSubcombinations Provided for Elsewhere.”)

340, Communications: Electrical, for signal andindicating apparatus which may involve optics.See, for example, subclasses 584+, 600, 630,and 632, for temperature, radiant energy,smoke, or gas indicators, respectively. (seeLines With Other Classes, A, “Optical Measur-ing or Testing Classified Elsewhere.”)


1February 2011

342, Communications: Directive Radio Wave Sys-tems and Devices (e.g., Radar, Radio Naviga-tion), subclasses 1 through 205 for radar sys-tems involving electromagnetic radiation in theradio wave frequency.

345, Computer Graphics Processing and SelectiveVisual Display Systems, subclasses 418through 475 for computer graphics processingand subclasses 326 through 358 for computeroperator interface.

346, Recorders, for the generic class of recordingthe movements of machines or making a recordof any phenomenon, particularly subclass 33for recorders combined with external recorderoperating means, subclasses 150.1+ for electricrecording including spark and electrochemi-cal, subclasses 107.1+ for light or beam record-ing.

347, Incremental Printing of Symbolic Information, subclasses 112+ for electrostatic marking, par-ticularly subclasses 129+ for photo scanning;subclasses 224+ for light or beam marking pro-cesses or apparatus.

348, Television, subclasses 135+ for television sys-tems utilized to effect a measurement and sub-classes 180+ for measuring and testing devicesutilized in television systems which mayinclude optical elements.

348, Television, subclasses 135+ and 180+ for tele-vision systems for measuring and testing whichmay include optical elements. (See Lines WithOther Classes, A, “Optical Measuring or Test-ing Classified Elsewhere.”)

351, Optics: Eye Examining, Vision Testing andCorrecting, subclass 204 for interpupillary dis-tance measuring and lens positioning examina-tion instruments, and subclasses 239+ for testcharts and targets for the subjective testing ofvision for astigmatism and chromaticity.

351, Optics: Eye Examining, Vision Testing andCorrecting, subclasses 200+ for eye examin-ing and testing instruments which may includeoptical measuring or testing. (See Lines WithOther Classes, A, “Optical Measuring or Test-ing Classified Elsewhere.”)

352, Optics: Motion Pictures, appropriate sub-classes for methods and apparatus dealing withcameras for taking of pictures and projectorswhich show the motion pictures, especiallysubclass 39 for methods of utilizing motionpictures for time and motion studies or forother uses other than the creation of the illusionof motion.

353, Optics: Image Projectors, appropriate sub-classes for projection apparatus which may beused to facilitate optical measuring and testing.

358, Facsimile and Static Presentation Processing,subclasses 1.1 through 1.18 for data process-ing for static presentation on fixed medium(e.g., for printer).

359, Optical: Systems and Elements, subclasses350+ for optical elements usable in the infraredor ultraviolet range, subclasses 362+ for com-pound lens systems including telescopes,microscopes, or periscopes, subclasses 396+for microscope slides, subclasses 436+ forscale or indicia reading, subclasses 483.01through 494.01 for polarization type devices,subclasses 290+ for light control systemswhich after an optical medium surface, orinterface, subclasses 566+ for diffractions grat-ings subclasses 557+ for light interference sys-tems, subclass 615 for light dispersion systems,subclasses 645+ lenses, particularly subclass801 for lenses combined with illumination anda viewed object support, subclasses 227+ forlight control systems using an opaque elementor medium movable in or through the lightpath, subclasses 831+ for prisms and theirmounts, subclasses 838+ for reflectors, andsubclasses 885+ for optical filters. (See LinesWith Other Classes, B, “Testing and MeasuringSubcombinations Provided for Elsewhere.”)

359, Optical: Systems and Elements, for opticalelements which may be used in measuring andtesting apparatus. The conventional opticalelements such as lenses, prisms, and mirrorsare there. (See Lines With Other Classes, B,“Testing and Measuring Subcombinations Pro-vided for Elsewhere.”)

359, Optical: Systems and Elements, for opticalelements which control light intensity or direc-tion on a molecular level, subclasses 246+,281+, and 301+ for modulation involvingpolarized light, and subclasses 290+ for lightcontrol by altering an optical medium or sur-face. (See Lines With Other Classes, G,“Lasers and Resonance Radiation.”)

359, Optical: Systems and Elements, for utilizing amicroscope to count particles, one by one, suchas blood particles or bacteria colonies, and forwhere an optical element such as a lens formagnification is used in combination with asupport for counting bacteria colonies, or parti-cles such as dust; see Class 359 for one by onecounting. (See Lines With Other Classes, J,“Counting.”)


February 2011

361, Electricity: Electrical Systems and Devices, subclasses 173+ and 211 for electric circuitsfor relays and electromagnets controlled by aphotosensitive device.

362, Illumination, appropriate subclasses for gen-eral purpose lighting devices, particularly sub-classes 3+ for photographic lights, subclasses138+ for inspection lamps, and subclass 293for signal lanterns.

365, Static Information Storage and Retrieval, appropriate subclass for static information stor-age and retrieval systems, per se. Static storagesystems which include testing or measuring areexcluded from this class.

372, Coherent Light Generators, for coherent lightgenerators, per se. (See Lines With OtherClasses, G, “Lasers and Resonance Radia-tion.”)

374, Thermal Measuring and Testing, subclass 32for thermal measurement of total energy orpower radiated from a source; and subclasses121+ for emitted radiation, in general.

374, Thermal Measuring and Testing, subclass 32where the total energy or power in a beam ofradiation is measured by a thermal detector;and subclasses 121+ where thermally emittedradiation is measured to determine the temper-ature of the emitting source, except where theradiation is limited to light, where the classifi-cation is in Class 356. (See Lines With OtherClasses, H., “Thermocouples And Bolome-ters.”)

376, Induced Nuclear Reactions: Processes, Sys-tems, and Elements, subclasses 245+ for thetesting, sensing, measuring, monitoring ordetecting of a reactor condition including con-trol of the reactor as a result of the testing orsensing.

377, Electrical Pulse Counters, Pulse Dividers, orShift Registers: Circuits and Systems, sub-class 6 for article counters of the electricaltype.

377, Electrical Pulse Counters, Pulse Dividers orShift Registers: Circuits and Systems, sub-class 10 for counting of discrete particles suchas blood particles, bacteria colonies, or dustparticles, one at a time by numerical countingapparatus which registers the counts corre-sponding to the respective particles. (SeeLines With Other Classes, J, “Counting.”)

382, Image Analysis, appropriate subclasses for theapplication of image analysis or pattern recog-nition systems.

382, Image Analysis, for pattern or character recog-nition of a document or a record. (See LinesWith Other Classes, K, “Reading and Record-ing.”)

385, Optical Waveguides, appropriate subclasses forfiber optics, per se.

396, Photography, subclass 563 for a sensitometerwhich may produce an optical wedge havingvarying light transmission characteristics bythe controlled exposure of a photographicmedium to light.

399, Electrophotography, subclasses 9+ for diag-nostics of electrophotographic devices.

414, Material or Article Handling, appropriate sub-classes for the generic class of article handling,particularly subclasses 431+ for engaging anarticle between its ends for rotation andadvancement, and subclass 433 for article rota-tors, roller type.

422, Chemical Apparatus and Process Disinfecting,Deodorizing, Preserving, or Sterilizing, sub-classes 50+ for analytical and analytical-con-trol apparatus involving an optical test; sub-class 44 for viable blood-treating apparatus;and subclass 500 for miscellaneous laboratoryapparatus. An alternative electronic search ofU.S. Patents based upon a modification of theEuropean Patent Office Classification (ECLA)System for certain subject matter in this sub-class may also be found in Class 422 Cross-Reference Art Collections 908-948. (There areno definitions associated with these Cross-Ref-erence Art Collections. The most available dis-closure as to the types of documents containedherein is given in any notes associated with thetitles.)

423, Chemistry of Inorganic Compounds, for allcombustion reactions not provided for else-where. (See Lines With Other Classes, I,“Burning.”)

424, Drug, Bio-Affecting and Body Treating Com-positions, subclasses 9.1+ for compositionsand methods of diagnosing a body condition byan in vivo test.

427, Coating Processes, subclass 162 for processesof coating, per se, wherein the product is anoptical element.

428, Stock Material or Miscellaneous Articles,appropriate subclasses, for a stock materialproduct in the form of a single or plural layerweb or sheet which may possess a critical lighttransmissive or reflective property; and espe-cially subclass 426 for nonstructural compositeweb or sheet embodying a layer of glass.


1February 2011

430, Radiation Imagery Chemistry: Process, Com-position, or Product Thereof, subclass 24 forradiation imagery chemistry process involvingcontrol feature responsive to a test or measure-ment.

431, Combustion, subclass 13 for gas burners withsignal, alarm or indicator for controlling thecombustion ingredients or any other functionrelating to the burning of the gas, and subclass355 for laboratory type burners including thoseused in sample excitations dealing with spec-troscopy and flame photometers of Class 356.

431, Combustion, subclass 4 for feeding a substanceto the flame additional to the normal fuel andoxidizing material to act as a protective agentor to give the flame some special characteristic,subclass 126 for apparatus with ornamentalforms, surface ornamentation or an additive oradditive means producing flame coloration,and subclass 355 for apparatus comprising avertical tube of constant cross section with afuel gas feed means and an opening for airadmission at its lower end, the fuel being fedupwardly and vertically into the tube, mixingair, and discharging from the upper end to burnthereabove. (See Lines With Other Classes, I,“Burning.”)

433, Dentistry, subclass 6 for the visual comparisonof tooth forms with the shape or coloring of aperson’s face or teeth.

434, Education and Demonstration, subclasses 298and 303 for apparatus and processes relating tochemistry and physics which could includelight testing devices, subclasses 98+ for colorcomparison charts which are used for displayand instruction purposes, and subclasses 322+for examination devices and methods whichmay include as a part thereof reflection andtransmission tests similar to those found inClass 356.

435, Chemistry: Molecular Biology and Microbiol-ogy, subclasses 4+ for the quantitative or quali-tative testing of fermentation processes.

436, Chemistry: Analytical and ImmunologicalTesting, subclasses 1+ for analytical and ana-lytical control methods which could involve anoptical test.

445, Electric Lamp or Space Discharge Componentor Device Manufacturing, subclasses 4 and 64for methods and apparatus for adjusting elec-trodes by means of optical operations.

451, Abrading, subclasses 42+ for a lens grindingprocess which may include optical tests as part

of the grinding process and subclass 325 for astationary tool type of lens grinder.

505, Superconductor Technology: Apparatus,Material, Process, subclasses 150+ for hightemperature (Tc > 30 K) superconductingdevices, and particularly subclasses 160+ formeasuring or testing system or device.

600, Surgery, subclasses 310+ for surgical diagnos-tic instruments which may involve optical mea-suring or testing on or in the body, including invivo light examination of a body process,including metabolism, spirometers, and endo-scopes. (See Lines With Other Classes, A,“Optical Measuring or Testing Classified Else-where.”)

604, Surgery, subclasses 20+ for subject matterrelating to administration or removal of mate-rial from the body by means responsive to opti-cal diagnostic means.

606, Surgery, subclasses 2+ for subject matter relat-ing to surgical instruments, or their use, forapplying light to the body.

607, Surgery: Light, Thermal, and Electrical Appli-cation, subclasses 1+ for therapeutic instru-ments which utilize light.

700, Data Processing: Generic Control Systems orSpecific Applications, subclasses 90 through306 for particular application of data process-ing systems or calculating computers.

706, Data Processing, Artificial Intelligence, appro-priate subclasses for artificial intelligence pro-cessing.

709, Electrical Computers and Digital ProcessingSystems: Multicomputer Data Transferring,appropriate subclasses for multicomputer datatransferring.

SECTION V - GLOSSARY

DIFFRACTION

The bending of a light ray in passing the edge formed bycontiguous opaque and transparent edges.

DIFFUSE

Pertaining to the scattering or random deviation oftransmitted or reflected light.

ELECTROPHORESIS

The effect in which charged particles suspended in a liq-


February 2011

uid are moved under the influence of an electrostaticfield.

FIDUCIAL

A reference direction formed as by a light ray, level,compass, or scale from which another direction is mea-sured or compared.

LIGHT, VISIBLE LIGHT

Visible light is radiation, which stimulates the opticalreceptors of the eye, and has a wavelength from 3850 to7600 Angstrom units. The term light in these defini-tions refers to radiation in the above mentioned range,and when qualified by the terms ultraviolet and infraredrefers to the corresponding radiation ranges adjacent thevisible range.

MEASURING-TESTING

Measuring usually involves a more precise and quantita-tive determination of the characteristic or property inquestion. Testing may be a mere indication of the pres-ence or absence of the characteristic or property, andmay involve only a mere inspection or viewing of thephenomenon or specimen. It should be recognized thatthe two terms overlap to some extent in meaning.

MENSURATION

Measurement of lengths, areas, or volumes.

MONOCHROMATOR

An instrument for producing a narrow band of the spec-trum by dispersing a radiation beam into its componentsor colors, and isolating the narrow band desired as bypassing the components or colors through a narrow slit.

OPTICAL ELEMENT

A structure which performs a basic optical function. SeeClass 359 for a more specific definition.

OPTICAL SYSTEM

A combination of two or more similar or diverse opticalelements which are optically related, or an optical ele-ment combined with nonoptical structure where theoverall function performed is optical in nature. Theoptical systems in this class are for measuring or testingpurposes.

OPTICS, OPTICAL

The science of light and vision and the construction ofoptical instruments.

REFLECTION

The return of light striking a surface back into themedium from which it came.

REFRACTION

The deviation of light which results when a ray of lightpasses obliquely from a medium of one density to amedium of another density.

SPECTRUM

The band of colors produced by separating white lightinto its component frequencies. The term also denotesradiation arrayed over a frequency range where the fre-quency of the radiation continuously increases ordecreases over the range.

SUBCLASSES

2 CONTOUR PLOTTING:This subclass is indented under the class defini-tion. Subject matter including structureresponsive to two stereoscopic images as pho-tographed or otherwise viewed at spaced pointsover a surface (usually of the earth) and fur-nishing a contour plot of the surface based onthe distinctions in these images.

(1) Note. The subject matter of this subclassusually involves a photodetecting appa-ratus such as a photocell system whichscans or otherwise responds to the ste-reoscopic images or records, togetherwith apparatus to compare the photocelloutputs to operate some form of indica-tor such as a recorder. If the indication isby a scriber, classification is in Class 33;and if the output is an error signal as foralignment purposes classification is inClass 250, especially subclass 558.

SEE OR SEARCH THIS CLASS, SUB-CLASS:138, for general alignment inspection.


1February 2011

SEE OR SEARCH CLASS:33, Geometrical Instruments, subclasses

20.1+ for sight line controlled geo-metrical scribers.

250, Radiant Energy, subclass 220 for pho-tocell systems with plural photocellsresponsive to plural related imageswhere the measuring is lacking.

348, Television, subclass 26 for televisionsystems including means to generatecontours based on features in thescene viewed.

353, Optics: Image Projectors, subclass 5for projection involving mapping oraerial photograph rectifying.

359, Optical: Systems and Elements, sub-class 470 for stereoviewers with com-pensation for camera positions, as ofthe plotting or mapping type.

3 RANGE OR REMOTE DISTANCE FIND-ING:This subclass is indented under the class defini-tion. Subject matter comprising instruments tomeasure the distance between an observer anda remote point or to measure the distancebetween two points remote from the observer.

(1) Note. Height is a distance that may bemeasured.

SEE OR SEARCH THIS CLASS, SUB-CLASS:496, for interferometric dimensional mea-

surement of small structure or spaces.

SEE OR SEARCH CLASS:235, Registers, subclass 414 for means to

calculate the range of a target and notemploying a particular sightingmeans.

348, Television, subclasses 135+ for televi-sion systems utilized to determinerange.

396, Photography, subclasses 89+ forrange finders which operate in con-junction with camera structure.

3.01 Triangulation ranging to a point with oneprojected beam:This subclass is indented under subclass 3.Subject matter including the following: (a) thedistance to any single remote target point is

determined in accordance with the principles oftriangulation; (b) the target may include severalpoints requiring more than one beamed mea-surement; and (c) a light beam or its reflectionfrom the target point is oriented and projectedto form at least one side of a triangle.

(1) Note. Triangulation involves, for exam-ple, establishing a triangle where oneside (i.e., the base) and the angles, whichthe two other sides form with the base,are determined.

(2) Note. This subclass does not necessarilyrequire the use of a photodetector, butrequires a projected beam.

(3) Note. This subclass includes, for exam-ple, apparatus that utilizes together anonfixed axial source and a nonfixedaxial line of sight for the sensing that isnot found elsewhere, but that stillrequires only a single source for eachpoint.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.09, where scanning is required to achieve

angular measurement to a singlepoint.

3.12, for photodetection remote from atleast two source locations that aretransmitting beams to be received by aphotodetector.

9+, for triangulation with no projectedbeam and no photodetection.

625, for distance measurement to definethe dimensions of an adjacent, asopposed to remote, article that mayinvolve triangulation to any one point.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 201.6 for

triangulation used to establish dis-tance-related focus of the source ontoa triangulating photodetector.

342, Communications: Directive RadioWave Systems and Devices (e.g.,Radar, Radio Navigation), for the useof similar circuitry not requiring thesame wavelength or radiation distinc-tions.


February 2011

367, Communications, Electrical: Acous-tic Wave Systems and Devices, forthe use of similar circuitry not requir-ing the same wavelength or radiationdistinctions.

396, Photography, subclasses 89+ wheretriangulation may be employed in thefocus of a separate photographic cam-era.

3.02 Using photodetection with a fixed axial lineof sight:This subclass is indented under subclass 3.01.Subject matter that determines an angle of thetriangle with respect to a known base line byestablishing a fixed viewing direction and fieldof view for a photodetector to generate an elec-trical signal upon the coincidence of the targetalong a photodetector’s line of sight.

(1) Note. This subclass would include appa-ratus that utilizes a moving detector withrespect to a fixed optical viewing axis todetermine the direction of light from atargeted source.

3.03 Using a source beam with a fixed axial direc-tion or plane:This subclass is indented under subclass 3.01.Subject matter that includes a beam or plane oflight from the target that has a fixed angularorientation with respect to a baseline to estab-lish an angle of the triangle.

(1) Note. The use of a photodetector is notrequired for this subclass, but the use ofa vidicon-type detector is found here.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.05, for a system that includes a moving

optical axis in the receiver optics anda fixed detector.

3.04 With a single staring photodetector havingone element:This subclass is indented under subclass 3.03.Subject matter wherein a detector produces anelectrical signal related to the angular positionof the source based on the instantaneous outputof or differential output across a single detect-ing element that is not subdivided for its opera-tion.

(1) Note. A one-element photodetector mayconsist of a lateral effect or photoresis-tive element.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.03, for vidicon-type detection.3.06+, for use of detectors that define the

position of incidence of received lightby the difference in the outputs ofmore than two detector elements (e.g.,at least three separate photodetectors).

3.05 Having moving receiver optics:This subclass is indented under subclass 3.04.Subject matter wherein an image of the sourceis moved with respect to the detector’s axialline of sight to achieve an effective movementof the photodetector’s angular field of viewacross the source.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.02, for systems that may include a mov-

ing detector element with respect to afixed optical line of sight.

3.06 With a single photodetector having multipleelements:This subclass is indented under subclass 3.03.Subject matter wherein a detector produces anelectrical signal related to the angular positionof the source based on the output of a particu-larly positioned one of an array of at least threesubelements in the focused field of view of asingle detector structure.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.03, for vidicon-type detection.3.07, for CCD-type multi-element detectors

that are electronically scanned.3.08, for two separated detectors that are

paired.

3.07 Having electronic scanning of the photode-tector:This subclass is indented under subclass 3.06.Subject matter that includes electronic regularsampling through time of the elements of thedetector array in order to determine the posi-tion or angle associated with a particular ele-ment illuminated by the target.


1February 2011

(1) Note. This subclass includes, for exam-ple, CCD-type detectors.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.03, for vidicon-type detection.

3.08 With at least one paired set of staring photo-detectors:This subclass is indented under subclass 3.03.Subject matter wherein any two separateddetectors produce electrical signals related totwo angular positions detected from the singlesource.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.06, for a single detector subdivided into at

least three subelements.

3.09 Requiring scanning of a source beam:This subclass is indented under subclass 3.01.Subject matter wherein the source comprises abeam of light that is moved at some angularrate that can be detected and associated withany one target’s angular position.

(1) Note. The target may be at the sourceposition or reflected by the source, butscanning is required to generate theangular information.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.02, for moved but not necessarily spa-

tially scanned sources that define atarget with respect to a fixed axial lineof sight of a photodetector.

3.1 Triangulation ranging to a point with two ormore projected beams:This subclass is indented under subclass 3.Subject matter wherein a target distance isdetermined in accordance with the principles oftriangulation, and two light beams, separatedby a known baseline distance, are oriented andprojected to define the other two legs of the tri-angle.

(1) Note. The two beams may be scannedover angularly related time across thetarget or moved at least once to orienttheir coincidence on the target.


(3) Note. This subclass does not necessarilyrequire the use of a photodetector, butrequires projected beams.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.09, where scanning is required to achieve

angular measurement to a singlepoint.

3.12+, for photodetection remote from atleast two source locations transmittingbeams to be received by a photodetec-tor.


625, for distance measurement to definethe dimensions of an adjacent, asopposed to remote, article that mayinvolve triangulation to any one point.



342, Communications: Directive RadioWave Systems and Devices (e.g.,Radar, Radio Navigation) for the useof similar circuitry not requiring thesame wavelength or radiation distinc-tions.



3.11 Using photodetection at the source sta-tion(s):This subclass is indented under subclass 3.1.Subject matter wherein an electrical signal isgenerated based on the reflection of the twobeams from the target back to the plane, plat-


February 2011

form, or station(s) that supports the beams andthe photodetector.

3.12 Using photodetection remote from thesource station(s):This subclass is indented under subclass 3.1.Subject matter wherein an electrical signal isgenerated based on the incidence of the twosources onto a photodetector that is not locatedon the same plane, platform, or station(s) as thetwo sources.

(1) Note. The detector may be located at thetarget to receive direct unreflected direc-tional beams of illumination from thesources.

3.13 Triangulation ranging with photodetection,but with no projected beam:This subclass is indented under subclass 3.Subject matter wherein the distance to any sin-gle remote target point is determined in accor-dance with the principles of triangulation,wherein at least one passive image of a targetpoint (which may be formed by arbitrary targetpoint illumination) forms at least one side of atriangle.


(2) Note. The target point may be an activeomnidirectional beacon source or maybe actively illuminated where the activebeam does not form one side of the trian-gle measured.

(3) Note. Sequential views of a moving tar-get with a known speed may comprisethe target.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.12, for photodetection remote from at

least two source locations transmittingdirected beams to be received by aphotodetector.


372+, for distance measurement to definethe dimensions of an adjacent, as

opposed to remote, article that mayinvolve triangulation to any one point.



342, Communications: Directive RadioWave Systems and Devices (e.g.,Radar, Radio Navigation), for the useof similar circuitry not requiring thesame wavelength or radiation distinc-tions.



3.14 Using at least a pair of viewing axes:This subclass is indented under subclass 3.13.Subject matter which includes two optical axesrelating to the target directed to at least twophotodetectors or detector arrays in the genera-tion of a pair of electrical signals related to thetriangle that defines the distance to the target.

(1) Note. The detector(s) may be mono- ormulti-element, and further scanned orstaring.

(2) Note. This subclass includes passiveimage correlation of two images from asingle target source in establishing twoangles to the target.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.08, for a pair of staring mono- or multi-

element detectors used where a singlesource maintains a fixed axial direc-tion.

3.15, for image correlation where a photo-detector views images of a target andwhere one of the images is establishedalong a fixed line of sight.

4.04, for split-image separation detection of“focus” quality where there is nobaseline separation between the sepa-


1February 2011

rate image viewing axes as here insubclass 3.14.

SEE OR SEARCH CLASS:348, Television, subclass 139 for triangula-

tion of range derived from two ormore picture images generated andcompared based on their baseline sep-aration.

3.15 With one viewing axis fixed:This subclass is indented under subclass 3.14.Subject matter wherein one optical axis thatviews the target is fixed relative to the otherone of the pair of viewing axes.

3.16 With moving optical elements in all viewingaxes:This subclass is indented under subclass 3.14.Subject matter that includes movement of eachviewing axis in order to achieve measurementof the target point.

4.01 With photodetection:This subclass is indented under subclass 3.Subject matter that includes the generation ofan electrical signal in response to light associ-ated with the distance being measured.

(1) Note. This subclass includes first anyapparatus or method that includes ageneric capability applicable to any oneof pulse, phase, or frequency rangingsystems.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.01+, for a system that involves triangula-

tion, even though that term is notmentioned, but is evidenced by abaseline or trigonometric techniqueand contains either photodetectionand/or the use of a projected lightbeam.

9+, for a system that uses neither a projected beam nor photodetection.

625, for distance measurement to definethe dimensions of an adjacent, asopposed to remote, article that mayinvolve similar ranging techniques toany one point.

SEE OR SEARCH CLASS:342, Communications: Directive Radio

Wave Systems and Devices (e.g.,Radar, Radio Navigation), for the useof similar circuitry not requiring thesame wavelength or radiation distinc-tions.


4.02 Of a simulation or test:This subclass is indented under subclass 4.01.Subject matter that includes a predefined rangepath for the light used to measure range inorder to calibrate or test a range finder.

(1) Note. The simulation in this subclass isnot considered the same as the alternatereference path used in subclasses 5.12and 5.13 used during the regular opera-tion of those range finders.

SEE OR SEARCH THIS CLASS, SUB-CLASS:72+, for other optical tests not specifically

dedicated to range or distance finders.

4.03 Of focused image size or dimensions:This subclass is indented under subclass 4.01.Subject matter that includes a determination ofthe distance of or to an observed object by therelative focused size of the object or dimen-sional spread of reference points on the focalplane of the photodetector with respect to a cal-ibrated size and corresponding distance.

(1) Note. The image size must be derivedfrom a focused image as opposed to ablur circle size.

SEE OR SEARCH THIS CLASS, SUB-CLASS:4.04, for blur circle size or edge detection.21, for the same, but without photodetec-

tion.

SEE OR SEARCH CLASS:348, Television, subclass 140 where a pic-

ture image signal is analyzed for size.


February 2011

4.04 Of degree of defocus:This subclass is indented under subclass 4.01.Subject matter that includes a determination ofthe distance of a remote point or observedobject by the degree of image focus throughrelative characteristics of in-and-out-of-focusintensity, blur circle size, lateral split imagedisplacement, etc., of an image generated atsome fixed location from focusing optics alongits optical axis relative to the same characteris-tic under a focused condition at the same loca-tion along the optical axis.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.14, for split images of a single object

directed to two detectors separated bya baseline, unlike split-image focusdetection here in subclass 4.04 wherethere is no baseline separation.

4.03, for a focused image feature measure-ment(s).

4.05, for mechanically searching for thefocal point based on the same or othercharacteristics as in subclass 4.04.

22, for split images without photodetec-tion.

4.05 Of focal point search:This subclass is indented under subclass 4.01.Subject matter that includes a way to mechani-cally, or otherwise, sample the “image” alongthe optical axis of a fixed focus lens or scan thefocus of a transmitted beam to determine thepoint of maximum focus of the image or reflec-tion of the source which is proportional to thedistance to the targeted remote point.

SEE OR SEARCH THIS CLASS, SUB-CLASS:4.04, for determining range based on the

focus characteristics of an image atsome fixed point from the focusinglens.

4.06 Of differential amplitude at two source ordetector distances:This subclass is indented under subclass 4.01.Subject matter that includes either two sourcesat different distances from a target alternatelyilluminating the target at the remote point that afixed detector views or includes two detectorsat different distances receiving focused images

of the target illuminated by a single sourcefrom which distance is determined based on therelative intensities detected.

4.07 Of intensity proportional to distance:This subclass is indented under subclass 4.01.Subject matter that includes a measure of therelative intensity of the received focused targetimage from which distance may be determinedby the fact that intensity varies by the inversesquare of the distance or the like.

4.08 Of height relative to a light plane:This subclass is indented under subclass 4.01.Subject matter that includes some apparatusbetween two remote points being measuredthat defines the height between the ground anda detector or reflector moved to intersect a lightbeam or beam plane that may be scanned orfanned.

(1) Note. The apparatus may define a pathfor the light beam to traverse from themirror intersecting the plane to theground.

4.09 Of light interference fringes:This subclass is indented under subclass 4.01.Subject matter wherein the photodetection is inresponse to an interference pattern formed bythe interaction of coherent light waves whichrelate to range by a fringe pattern or fringecount.

SEE OR SEARCH THIS CLASS, SUB-CLASS:5.09, for a system that detects frequency of

modulation to determine range wherethe beat frequency of a mixed or com-pared beam is not directly related to acoherent interference fringe count.

5.11, for phase change counting betweenknown frequencies of modulation thatare unrelated to coherent carrier mix-ing in the production of fringes.

5.15, for a system that demodulates a returnbeam by coherent or incoherent mix-ing in order to shift the return to a dif-ferent IF operating frequencyunrelated to counting of fringes.

28.5, for a system where frequency isdetected from the mixing of coherentwaves that produce a moving, inter-


1February 2011

ference pattern or just a difference fre-quency, which is related to velocity.

4.1 Having different frequency sources:This subclass is indented under subclass 4.09.Subject matter that includes at least two lightbeams from the same or different sources, butwhich have different frequencies.

5.01 Of pulse transit time:This subclass is indented under subclass 4.01.Subject matter including means for measuringthe time delay of a discrete light pulse in itstime of flight (transit time) from an observingstation to a remote point and back to theobserving station.

5.02 Having return coincide with swept displayor detector:This subclass is indented under subclass 5.01.Subject matter wherein the return pulse’sreception time is related to transit time by ref-erence to where it appears in time on a cali-brated sweep of a display screen, detector, orfilm which begins a sweep at the instant oftransmission.

5.03 Having one or more return pulse gates orwindows:This subclass is indented under subclass 5.01.Subject matter including means at the receiverfor accepting return signals to be processed ifthey occur during specified (gate or window)periods after the transmission of a light pulse.

5.04 Including a displayed image:This subclass is indented under subclass 5.03.Subject matter wherein the return pulseincludes image data of a reflecting object at theremote point and is displayed as at least a two-dimensional image that does not include reflec-tion signals outside the gate period.

SEE OR SEARCH CLASS:348, Television, subclass 31 for backscat-

ter reduction of an image that mayinvolve range gating, but does notinvolve range indicating.

5.05 Having pulse transmission trigger signifi-cance:This subclass is indented under subclass 5.01.Subject matter including details of the mannerin which the transmitted pulse instant is deter-

mined for measuring the transit time of thelight pulse.

5.06 Including optical pick-off of transmissionstart:This subclass is indented under subclass 5.05.Subject matter wherein the instant of pulsetransmission is determined by optically detect-ing the transmission pulse in order to beginmeasuring the transit time.

5.07 With specific counter type timing of returns:This subclass is indented under subclass 5.06.Subject matter including an electronic elementthat counts timing pulses associated with travelof the optical pulse to and from the target.

5.08 Including specific counter type timing ofreturns:This subclass is indented under subclass 5.05.Subject matter including an electronic elementthat counts timing pulses associated with travelof the optical pulse to and from the target.

(1) Note. This subclass includes electricalinitiation of the counter controlled inde-pendently of the optical pulse itself.

5.09 Of frequency difference:This subclass is indented under subclass 4.01.Subject matter that either sends a defined fre-quency beam or frequency modulates an outgo-ing pulse or continuous wave optical beam inorder to compare the detected return frequencyto the transmitted frequency for determiningrange calibrated frequency differences.

SEE OR SEARCH THIS CLASS, SUB-CLASS:4.09+, where frequency is detected from the

mixing of coherent waves that pro-duce an interference pattern, whichincludes moving or static fringeswhich are counted.

5.15, where optical demodulation by het-erodyning or homodyning is used toreduce the processed signal frequency.

28.5, where frequency is detected from themixing of coherent waves that pro-duce a moving interference pattern orjust a difference frequency, which isrelated to velocity.


February 2011

5.1 Of CW phase delay:This subclass is indented under subclass 4.01.Subject matter that incorporates a continuouswave (CW) of modulated or unmodulated opti-cal signal that is transmitted to and reflectedfrom a target, such that the relative phase posi-tion of the returned wave is compared to thephase of the transmitted wave in order to deter-mine the distance-proportional transit time toand from the target.

(1) Note. Phase nulling techniques areincluded in this subclass.

5.11 Having multiple carrier or modulation fre-quencies:This subclass is indented under subclass 5.1.Subject matter including more than one fre-quency of modulation or carrier frequency forthe transmitted optical signal to further definethe distance-proportional phases comparison.

5.12 Including an alternating reference path:This subclass is indented under subclass 5.11.Subject matter that incorporates a path ofknown distance through which the transmittedsignal is alternately sent in order to phase cali-brate the receiver circuity for the received mea-suring signal from the target.

5.13 Having an alternating reference path:This subclass is indented under subclass 5.1.Subject matter that incorporates a path ofknown distance through which the transmittedsignal is alternately sent in order to phase cali-brate the receiver circuity for the received mea-suring signal from the target.

5.14 Having polarization discrimination:This subclass is indented under subclass 5.1.Subject matter that incorporates polarized opti-cal elements in the optical path.

5.15 Having specific IF mixing of returns:This subclass is indented under subclass 5.1.Subject matter that incorporates demodulationby optically or electrically heterodyning thereceived signals to an intermediate frequency(IF) for further processing.

SEE OR SEARCH THIS CLASS, SUB-CLASS:4.09+, for systems that mix the return with

another beam to produce a fringe pat-tern to be counted and frequency ana-lyzed as a direct measurement ofrange.

5.09, for systems that detect frequency ofmodulation to determine range wherethe beat frequency of a mixed or com-pared beam is not directly related to acoherent interference fringe count orto CW phase delay.

6 Instrument condition testing or indicating:This subclass is indented under subclass 3.Subject matter comprising means for testing orindicating the condition of the range or heightfinder with regard to its adjustment, alignment,or calibration.

SEE OR SEARCH THIS CLASS, SUB-CLASS:124, for lens or reflective image former

testing generally.

7 Periscope or offset type:This subclass is indented under subclass 3.Subject matter wherein the instrument has twoaxis which are offset from each other in adirection perpendicular to the base line so thatthe device may function as a periscope.

SEE OR SEARCH CLASS:359, Optical: Systems and Elements, sub-

classes 540+ for periscopes, per se.

8 With view finder:This subclass is indented under subclass 3.Subject matter wherein the range or heightfinder is combined with a view finder.

(1) Note. Where the operation of the rangefinder is coordinated with the operationof some other element of the camera(usually the objective lens) classificationis not here but in Class 396, subclasses148+.

SEE OR SEARCH CLASS:396, Photography, subclasses 148+ for

camera structure combined with a


1February 2011

rangefinder and viewfinder; see also(1) Note above.

9 Base line instrument (i.e., base is a part ofinstrument):This subclass is indented under subclass 3.Subject matter wherein the range or heightfinder includes a base line as a part of theinstrument with plural lines of sight directedfrom the extremeties of the base line to thepoint whose range is to be measured, at leastone of the lines of sight being deviated.

10 With filter or light valve:This subclass is indented under subclass 9.Subject matter wherein filters or light valvesare employed to aid the eye as in determiningcoincidence of the right and left images.


classes 227+ for diaphragms and shut-ters, and subclasses 885+ for filters ofthe color and neutral density type.

11 Range finder combined with height finder:This subclass is indented under subclass 9.Subject matter wherein the range finder is com-bined with means to determine the height of theobject whose range has been determined.

12 Stereoscopic:This subclass is indented under subclass 9.Subject matter wherein the observer sees thefield of view in three dimensions, the rangebeing determined by comparing the depth ofthe object whose range is to be measured withthe apparent depth of a mark or marks superim-posed upon the field of view.


classes 462+ for stereoscopic systemsgenerally.

13 Ortho-pseudo type:This subclass is indented under subclass 12.Subject matter where the observer sees animage in true perspective and also one inreverse perspective.

14 Stationary measuring marks:This subclass is indented under subclass 12.Subject matter where the measuring mark ormarks are stationary.

15 Length of base line variable:This subclass is indented under subclass 9.Subject matter wherein the range measurementis made by varying the length of the base line.

16 Image displaced by moving refracting ele-men:tThis subclass is indented under subclass 9.Subject matter wherein the range measurementis made by deviating one of the lines of sightby means of an adjustable refracting element.

17 Image displaced by rotating reflecting ele-ment:This subclass is indented under subclass 9.Subject matter wherein the range measurementis made by deviating one of lines of sight bymeans of the rotation of a reflecting element.

18 With mounting, supporting, adjusting, orfolding structure:This subclass is indented under subclass 9.Subject matter comprising structural detailsincluding means for mounting, supporting oradjusting the range finder or its components.

SEE OR SEARCH THIS CLASS, SUB-CLASS:6, for testing the alignment or calibration

of the instrument.

19 Prism structure for determining coinci-dence:This subclass is indented under subclass 9.Subject matter including prism structure fordisplacing relative to each other the two imagesof a coincidence type range finder.

(1) Note. Such prism structure is appropri-ately classified here as a pertinent sub-combination even though no other rangefinder structure is recited.

20 External basis type:This subclass is indented under subclass 3.Subject matter wherein the complete measure-ment requires the knowledge of some distance


February 2011

or interval external to the measuring instru-ment.

SEE OR SEARCH CLASS:33, Geometrical Instruments, appropriate

subclasses, particularly subclasses262, 276, and 284, for similar subjectmatter with no significant optical fea-ture.

21 Object size or distance known:This subclass is indented under subclass 20.Subject matter where there is an interval ofknown size (e.g., height of an object) at aremote point, the distance to which point is tobe determined; or where the distance to aremote point is known and the size of someinterval at the remote point is to be determined.

22 With displaced images:This subclass is indented under subclass 21.Subject matter where the instrument providestwo displaced images of the same object forviewing by the observer.

23 MOTION STOPPING (E.G., STROBO-SCOPES):This subclass is indented under the class defini-tion. Subject matter comprising meanswhereby the relationship between periodicchanges in light intensity or direction and themotion of a body are utilized in observing thebody or performing some measurement withregard to the body or some means controllingthe light source.

(1) Note. Where a specific test is providedfor in another class, classification is inthat class even though the subject mattermay include a stroboscope. See SearchClass notes below.

SEE OR SEARCH CLASS:73, Measuring and Testing, subclass 1.56

for timing apparatus for watches,camera shutters and the like whichmay utilize stroboscopic principles.

315, Electric Lamp and DischargeDevices: Systems, appropriate sub-classes for electric lamp and dischargedevice systems in general.

324, Electricity: Measuring and Testing, subclass 75 for calibration of electricmeters using stroboscopic principles,

and subclasses 76.11+ for measuringelectric properties using stroboscopes.

24 Periodically moving light interrupting ele-ment:This subclass is indented under subclass 23.Subject matter including reflecting or refract-ing means which are moved periodically tovary the direction of a light beam.


classes 196.1 through 226.3 for scan-ning means in general which use aperiodically moving reflecting orrefracting element.

25 Vibrating or oscillating element:This subclass is indented under subclass 23.Subject matter wherein the periodic motion ofan element containing alternate opaque andtransparent areas is used to interrupt a lightsource.


classes 227+ for light valves utilzingan opaque element movable through alight path.

26 Vibrating or oscillating element:This subclass is indented under subclass 25.Subject matter where the opaque elementvibrates or oscillates.

27 VELOCITY OR VELOCITY/HEIGHTMEASURING:This subclass is indented under the class defini-tion. Subject matter including means to mea-sure the velocity or the velocity to altitude ratioof a vehicle by sighting from the vehicle on aremote object, or including means to measurethe velocity or the velocity to altitude ratio of amoving object remote from an observer bysighting on the object.

(1) Note. The vehicle may be a surfacevehicle or an aircraft. The term “sight-ing” includes aiming an optical instru-ment with a photocell. This subjectmatter includes timing the passage of asighted object over grids.


1February 2011

SEE OR SEARCH THIS CLASS, SUB-CLASS:459, for interferometric measurement of

angular velocity.

SEE OR SEARCH CLASS:235, Registers, subclass 413 for means to

calculate the velocity of an object andnot employing a particular sightingmeans.

28 With light detector (e.g., photocell):This subclass is indented under subclass 27.Subject matter wherein the measuring systemincludes means responsive to the receivedlight.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3+, for range or height finders with light

detectors.139.01+,for devices measuring the angle with

respect to a remote point having spec-ified applications with photodetec-tion.

141.1+, for devices measuring the apex of anangle at a photodetection station withrespect to a remote point.

152.1+, for devices measuring the apex of anangle at a point remote from a photo-detection station.

SEE OR SEARCH CLASS:343, Communications: Radio Wave Anten-

nas, subclass 8 for systems for mea-suring velocity by means of reflectedradio wave energy.

28.5 Of light interference (e.g., interferometer):This subclass is indented under subclass 28.Subject matter wherein the detection means isresponsive to an interference pattern formed bythe interaction of coherent light waves.

(1) Note. This subclass includes heterodyneinterferometers which measure a dop-pler-shifted beam reflected from a mov-ing object.

SEE OR SEARCH THIS CLASS, SUB-CLASS:4.09, and 4.1, for light interference mea-

surement of displacement or distanceover large distances.

35.5, for material strain analysis by lightinterference measurement.

450, for light interference measuring andtesting, per se.

SEE OR SEARCH CLASS:73, Measuring and Testing, subclass 71.3

for vibration sensing with a lightbeam indicator.

29 OPTICAL ELEMENT OR RETICLERESPONDS TO RELATIVE VELOCITYOF REMOTE OBJECT:This subclass is indented under the class defini-tion. Subject matter comprising meanswhereby a device for determining a line ofsight relative to a remote point includes anoptical element or reticle which is moved rela-tive to the device in accordance with the rela-tive velocities of the device and remote point.

(1) Note. This subclass includes in generalsighting devices containing optical ele-ments which move relative to the deviceas a whole for the purpose of tracking arelatively moving object and also opticalelements or reticles which are moved inaccordance with information obtained bytracking the object by means of movingthe sighting device as a unit.

SEE OR SEARCH THIS CLASS, SUB-CLASS:27, for optical devices which actually

measure velocity.

30 CRYSTAL OR GEM EXAMINATION:This subclass is indented under the class defini-tion. Subject matter including a support for acrystal or gem for examination by visible light,a light source passing light through or reflect-ing light from the crystal or gem and usuallystructure to view, mark, or locate the light pat-terns correlated to some condition of the crystalor gem.

(1) Note. Included in this subclass are appa-ratus and method claims which include


February 2011

nominal cutting or etching structure orsteps to prepare the crystal for examina-tion in addition to the claimed test.

(2) Note. The optical testing of piezoelec-tric and semiconductor crystals areincluded in this subclass.

SEE OR SEARCH THIS CLASS, SUB-CLASS:36, for sample preparation wherein the

novelty is in the preparation of thesample for an optical test and not pro-vided for elsewhere.

72, for an optical test combined withanother are device and not providedfor elsewhere.

SEE OR SEARCH CLASS:29, Metal Working, subclass 25.35 for

piezoelectric device making methods,which include cutting and etchingsteps.

125, Stone Working, subclasses 12 and13.01 for apparatus and methods forcutting crystals which include the stepof first examining optically and mark-ing the crystal for axis orientation.Also, see subclass 35 for work sup-ports for cutting the crystal.

156, Adhesive Bonding and Miscella-neous Chemical Manufacture, sub-classes 625+ for methods including achemical etching step.

378, X-Ray or Gamma Ray Systems orDevices, subclasses 73+ for methodsand apparatus for X-ray analysis ofcrystals which may include a supportfor the crystal.

31 Axes determination:This subclass is indented under subclass 30.Subject matter wherein the properties of crys-tals or gems are examined for one of the threeprinciple axis of the crystal, the left or righthandedness of the crystal, the polarity or thecrystal faces, or twinning, if present, in thecrystal.

SEE OR SEARCH CLASS:216, Etching a Substrate: Processes, for

the etching of a crystal or gem.

32 MATERIAL STRAIN ANALYSIS:This subclass is indented under the class defini-tion. Subject matter for examining an article ormaterial by noting the effect of the strain in thestressed article on light associated with the arti-cle or material.

(1) Note. The light may be passed throughor reflected from the article or material,or may be modified by changes in thecontour or the position of markingsthereon. The modification of the lightmay be in intensity, direction, polariza-tion, color, or interference patterns pro-duced thereby.

(2) Note. Stress strain measuring generallyis provided for elsewhere (see the SearchClass notes below). However, where thechanges in the material tested operate tomodify the characteristics of the lightassociated with the test, absent inten-tional loading of the specimen, classifi-cation is in this class (356).

SEE OR SEARCH CLASS:33, Geometrical Instruments, subclass

125 for extensiometers. See the (2)note of this subclass.

73, Measuring and Testing, subclasses763+ for testing the stress or strain ofmaterial, particularly subclass 800 foroptical stress analysis with intentionalloading of the specimen, and sub-classes 862+ for dynamometers whichare not provided for elsewhere andwhich do not involve the modificationof the associated light. See also (2)Note above.

33 With polarized light:This subclass is indented under subclass 32.Subject matter wherein the light utilized in theexamination or analysis is polarized light, or ispolarized as a result of the examination or anal-ysis.

(1) Note. Class 359, subclasses 240+ and483.01 through 494.01, provides forpolarizing structure generally whoselight polarizing properties are modifiedby mechanical stress; while the subjectmatter of this subclass is restricted to the


1February 2011

measuring or analyzing of the strain inthe stressed article or material from theeffect of the strain on polarized light orfrom the polarizing effect of light.

(2) Note. This class (356) provides forstress-strain determinations in articles ormaterials where the light is directly orindirectly associated with the article ormaterial stressed as by direct reflectionfrom or transmission through the articlesor materials, and for transmissions of thelight through detectors attached to arti-cles or materials which are naturally orforced by stress to be light birefringentas a result of the strain on the articles ormaterials; while Class 73, subclasses760+, provides for stress-strain determi-nations generally.

SEE OR SEARCH THIS CLASS, SUB-CLASS:30, for crystal or gem examination

wherein polarized light testing may beinvolved.

SEE OR SEARCH CLASS:73, Measuring and Testing, subclass 133

and 763+ for stress-strain testingapparatus and dynamometers gener-ally where no polarized light isinvolved. See also (2) Note above.

34 Attached detector:This subclass is indented under subclass 33.Subject matter wherein the test apparatus uti-lized in examining articles or materialsincludes a detector which is naturally birefrin-gent or forced by stress to be birefringent, andmeans to attach the detector to the articles ormaterials so that the strain placed on the arti-cles or materials is imparted to the detector sothat the modification of the light associatedwith the detector is indicative of the strain inthe stressed article or material.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, where infrared and ultraviolet light is

involved in the test.364, for polarized light examination appa-

ratus which produces interference pat-terns created by the interaction ofbeams of polarized light.


classes 483.01 through 494.01 forpolarizing structure generally. Seealso (1) Note of subclass 33.

35 Sheet material:This subclass is indented under subclass 33.Subject matter wherein there is means to sup-port transparent sheet material, statically or inmotion, which exhibits birefringent propertiesnaturally or when under strain, means to directpolarized light through the sheet material, andgenerally polarized light analyzing means toexamine the sheet material.

SEE OR SEARCH THIS CLASS, SUB-CLASS:429+, for monitoring of webs for optical

properties or flaws.

35.5 By light interference detector (e.g., interfer-ometer):This subclass is indented under subclass 32.Subject matter including means responsive toan interference pattern produced by the interac-tion of coherent light waves with the stressedarticle or material.

SEE OR SEARCH THIS CLASS, SUB-CLASS:4.5, for light interference measurement of

displacement or distance over largedistances.

28.5, for light interference measurement ofvelocity.

450, for light interference measurement,per se.

36 WITH SAMPLE PREPARATION:This subclass is indented under the class defini-tion. Subject matter involving preparation orconditioning of an article or substance or asample of the article or substance to facilitateor enable the later optical test and in combina-tion with such an optical test, wherein the prep-aration or conditioning is significant and is notprovided for in any other class.

SEE OR SEARCH CLASS:73, Measuring and Testing, particularly

subclass 23 for gas analysis and53.01+ for the testing of liquid or liq-


February 2011

uid suspension of solids, and subclass421 for samplers and tollers for gasesand liquids including closed conduittype samplers.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 50+ for analyti-cal control apparatus and apparatuswhich use sorbents or in which chemi-cal reactions are produced.

436, Chemistry: Analytical and Immuno-logical Testing, subclasses 1+ for pro-cesses involving analytical controland use of sorbents or chemical reac-tions.

37 Condensation nuclei detector:This subclass is indented under subclass 36.Subject matter wherein moisture or other liq-uids are deposited on particles to enlarge themor optically modify them (e.g., improve reflec-tion) to facilitate optical study of the particles.

(1) Note. Generally the apparatus includespump structure to deliver a gas samplecontaining particles, expand the sampleunder a constant volume to obtain asupersaturated condition with respect tothe gas, deliver the expanded gas sampleto a chamber to optically test the gaswith moisture precipitated as a result ofthe gas expansion on the particlespresent in the gas, and exhaust the sam-ple from the apparatus.

(2) Note. The particles examined includeionized particles and molecular types.

SEE OR SEARCH THIS CLASS, SUB-CLASS:335+, for the determining of the size of par-

ticles by optical methods.337+, for particle light scattering generally

including the concentration or numberof particles by statistical methods.

437+, for transmission tests through gasesfor the determination of the concen-tration of particles present in the gasesgenerally and visual inspection equip-ment.


for the determination of the amount of

solid matter in the analysis of gasesgenerally, subclass 29 for moisturecontent of gases, and subclass 421 forreciprocating and rotary samplersinvolving gases and liquids.

340, Communications: Electrical, sub-classes 227 and 237 for methods andapparatus which may involve thedetection of condensation nuclei, perse, or the use of condensation nucleito detect the dew point of gases.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 50+ for analyti-cal apparatus having a condensationnuclei detector.

436, Chemistry: Analytical and Immuno-logical Testing, subclasses 1+, forprocesses involving the testing of con-densation nuclei for traces of chemi-cal elements wherein a chemicalreaction is precedent to an optical testto determine the presence or amountof the elements present.

38 Depositing particles on optical surface:This subclass is indented under subclass 36.Subject matter wherein the means to prepare orcondition includes a movable member whichserves as a support to receive successivelysamples of particulate material from a gaseousstream or from a pulverent supply of material,the member supporting the particulate matterfor the optical test.

SEE OR SEARCH THIS CLASS, SUB-CLASS:335, for the determination of the size of

particles by optical procedures.337+, for the determination of particle light

scattering including polarizationeffects.

429+, for the monitoring of webs generally.438+, for light transmission tests of dust or

smoke.625, for the mensuration of substances or

articles by light tests generally.

SEE OR SEARCH CLASS:340, Communications: Electrical, sub-

classes 627+ for the testing of fluentor pulverized material in a gas or liq-uid wherein an electrical signal isinvolved.


1February 2011

39 BLOOD ANALYSIS:This subclass is indented under the class defini-tion. Subject matter wherein a specimen ofblood or tissue is tested in vitro (i.e., outsidethe body) for various conditions by means ofvisible light apparatus, and the blood testingapparatus is not elsewhere classified.

SEE OR SEARCH THIS CLASS, SUB-CLASS:246, for fluid specimen containers.335+, for the determination of particle size,

or particle size and the number of par-ticles for each size when determinedby statistical methods.

337+, for the determination of the number ofparticles in a fluid medium by lightscattering procedures using statisticalmethods.

441+, for the determination of the number ofparticles in a fluid medium by lightabsorption using statistical methodsand the determination of turbidity ofliquids generally.

SEE OR SEARCH CLASS:377, Electrical Pulse Counters, Pulse

Dividers, or Shift Registers: Circuitsand Systems, subclass 10 for particlecounters with or without the sizing ofthe particles counted by arithmeticalmethods.

382, Image Analysis, subclasses 128+, foran image analyzing system designedspecifically for, or utilized in micro-scopic cell analysis or other biomedi-cal applications, where there issignificant claim recitation of animage analyzing system and no claimrecitation of significant structure to anexternal art environment.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 44+ for appara-tus for testing blood externally of ablooded animal

435, Chemistry: Molecular Biology andMicrobiology, subclass 2 for pro-cesses and compositions for the main-tenance of blood (cells) in aphysiologically active state or for thein vitro separation or treatment ofblood cells; and subclasses 4+ for pro-

cesses measuring or testing involvingenzymes or measuring or testinginvolving enzymes or micro-organ-isms (e.g., bacteria, protozoa, actino-mycetales, cyanobacteria, fungi,animal cells, plant cells, or virus); andsubclasses 287+ for claimed or solelydisclosed as a Class 435 process.

436, Chemistry: Analytical and Immuno-logical Testing, appropriate sub-classes for processes and composi-tions for determining qualitatively orquantitatively the chemical propertyor composition of a sample and for invitro antigen-antibody analysis orcomposition, especially subclasses66+ for processes or compositions fortesting for hemoglobin, myo-globin,or trace blood; subclass 68 for pro-cesses or compositions for determin-ing gases in the blood, and subclass70 for processes and compositions fordetermining sedimentaion rate orhematocrit.

600, Surgery, subclasses 310+ for diagnos-tic medical apparatus which may uti-lize visible light to test or inspectblood in vivo.

40 Hemoglobin concentration:This subclass is indented under subclass 39.Subject matter which includes visual and pho-toelectric apparatus to examine the specimenfor the percentage of hemoglobin.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for infrared or ultraviolet testing of

materials generally where opticalmethods are utilized.

300+, for spectroscopic apparatus.402+, for colorimetric apparatus of the

visual and photoelectric type.441+, for liquid turbidity testing generally.445+, for reflective material testing gener-

ally.


for testing the settling rate of the liq-uid suspension of solids.


February 2011

41 Oximeters:This subclass is indented under subclass 40.Subject matter to determine the percentage ofoxyhemoglobin in the specimen whichincludes a transmissive or reflective opticaltests.

SEE OR SEARCH THIS CLASS, SUB-CLASS:42, for standards utilized in a comparison

test with a blood sample.

SEE OR SEARCH CLASS:600, Surgery, subclasses 310+ for diagnos-

tic apparatus and methods includingsubcombinations, for in vivo, i.e.,directly measuring properties of theliving body which may include anoptical test.

604, Surgery, subclasses 20+ for subjectmatter relating to administration orremoval of material from the body bymeans responsive to optical diagnos-tic means.

42 Standards:This subclass is indented under subclass 40.Subject matter wherein there is included gener-ally means to support a light reflective or trans-missive standard or a light emissive standardformed as part of the test apparatus wherebythe standard is compared simultaneously sideby side with the specimen either for equality ofshade of color and light intensity or for inten-sity of light alone.

SEE OR SEARCH THIS CLASS, SUB-CLASS:46, for light standards, per se.243.1+, for optical standards generally.403, for the merging of colors or patterns

generally.413, for colorimeters generally of the

Duboscq type.414+, for colorimeters testing colored liq-

uids generally which utilize a solid orliquid transmissive standard, andincluding standard optical wedges,Nessler tubes and micro-colorimeters.

420, for a colored light source, per se,which may be utilized as standards.

421+, for reflective colored standards whichinclude discs, drums, tapes or plates.

425, for the determination of color gener-ally by light intensity comparison.


classes 831+ for prisms which may beused as standards.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, appropriate subclasses,especially subclasses 50+ for labora-tory devices or apparatus of quantita-tive or qualitative analysis involvingeither a physical or a chemical reac-tion, not elsewhere provided for.

43 OPTICAL PYROMETERS:This subclass is indented under the class defini-tion. Subject matter for analyzing the lightemitted from a body for properties such asintensity or color components as an indicationof the temperature of the body.

(1) Note. The body may be heated in turnby another mass which may be either agas, liquid, or solid; and the purpose herewould be to ultimately determine thetemperature of such a mass by the deter-mination of its heating effect on thebody.

(2) Note. Both temperature devices for met-allurgical and photographic use areincluded herein when the indication is ina unit of temperature.

SEE OR SEARCH THIS CLASS, SUB-CLASS:213, for photometry devices.300+, for optical test devices which utilize a

light dispersing system rather than fil-ters to selectively detect variouswavelengths of visible light.

402+, for shade or color optical test devices,and particularly subclass 404 for suchtest devices involving photography,and subclasses 416+ for such testdevices which utilize one or more col-ored filters.

SEE OR SEARCH CLASS:219, Electric Heating, subclass 502 for the

control of an electric heater by means


1February 2011

of a light responsive temperaturedetector.

236, Automatic Temperature and HumidityRegulation, subclass 15 for the mea-surement of the temperature of a fur-nace for the control of the heating ofthe furnace.

250, Radiant Energy, subclass 226 forradiant energy detectors utilizing fil-ters or dispersing means, and subclass229 for light modulator detection sys-tems.

266, Metallurgical Apparatus, subclasses78+ and 99+, for metallurgical fur-naces combined with temperaturedetermination means.

374, Thermal Measuring and Testing, sub-class 32 for measuring the totalenergy emitted from a source; andsubclasses 121+ for subject mattersimilar to that in this subclass wherethe emitted radiation is not limited tolight.

44 With sample engaging rod or tube:This subclass is indented under subclass 43.Subject matter wherein there is structure suchas a rod or tube to contain and contact a heatedsolid or fluid or to be immersed into a heatedfluid whereby there is a heat exchange from theheated solid or fluid, which causes the structureto emit light or the structure allows the lightemitted from a heated solid or fluid to bedirectly transmitted to a detector which ana-lyzes this light in terms of temperature.

SEE OR SEARCH THIS CLASS, SUB-CLASS:216, for heat absorbing radiometers of the

revolving vane type.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 227 for light

conducting rods conducting light to aphotocell.

374, Thermal Measuring and Testing, sub-class 126 for a rod or tube with a par-ticular radiating surface combinedwith a radiation thermometer; andsubclass 131 for a radiation conduct-ing rod or fiber bundle combined witha radiation thermometer.

45 Plural color responsive:This subclass is indented under subclass 43.Subject matter which includes means to selec-tively detect at least two different bands of vis-ible radiation simultaneously or sequentiallyfrom an emission source, and means respon-sive to the detection means to indicate the colortemperature of the emissive source.

(1) Note. Where the indication of the test isnot stated in the claims in terms of tem-perature, classification is in subclass 404when photography is involved or in sub-class 407 when plural colors are simulta-neously tested, or in subclass 408 forsequential comparison tests of a sampleand a standard.

SEE OR SEARCH THIS CLASS, SUB-CLASS:405, for tristimulus test devices.406, for shade or color tests involving three

colors.419, for devices which sequentially utilize

plural color filters.

SEE OR SEARCH CLASS:374, Thermal Measuring and Testing, sub-

class 127, for nonoptical radiationtype pyrometers which may beresponsive to purals ranges of electro-magnetic radiation.

46 With incandescent standard:This subclass is indented under subclass 43.Subject matter including a standard incandes-cent source of radiation together with structureto compare or facilitate the comparison of theunknown light radiation from a hot body orother emissive source with the visible radiationemitted from the incandescent standard.

(1) Note. Patents claiming electrical cir-cuitry to cause current to flow throughelectric incandescent lamps which arelight standards are placed here, whetherthe standard lamp is used for a tempera-ture test or a light intensity test.

SEE OR SEARCH THIS CLASS, SUB-CLASS:218+, for photoelectric photometers.


February 2011

230+, for visual photometers utilizing a lightstandard.

243.1+, for standards generally.

SEE OR SEARCH CLASS:313, Electric Lamp and Discharge Devices,

subclass 271 for support or spacingstructure for incandescent filamentsused for light emission, and subclass315 for incandescent lamps.

47 Automatic intensity control:This subclass is indented under subclass 46.Subject matter which includes means to com-pare and control automatically the intensity ofthe illumination of the incandescent standard.

(1) Note. Systems utilizing radiant energydetectors to balance by means of opticalelements the detectors controlled by theintensity of light emitted by pluralsources of light are elsewhere. Systemswhere the intensity of a light source isadjusted by optical means controlled bya radiant energy detector responsive tothe light source intensity are also else-where classified. See the Search Classnotes below.

(2) Note. A system utilizing a radiantenergy detector to control an electricallamp by electrical means where no sig-nificant optical structure is in the pathbetween the light source tested and theradiant energy detector of the system,and no indication relating to the lightemitted by the lamp is claimed and thelamp is the ultimate load of the system iselsewhere. See the Search Class notesbelow.

(3) Note. The testing of lamps, per se, todetermine the lamp characteristicsbefore actual use, including the intensityof light emitted per watt input is classi-fied elsewhere (see the Search Classnotes below). However, where the lampis utilized in a testing environment of usefor illumination or where temperature orintensity of light of some unknownsource or other optical test is involvedwhich includes a measurement or a sub-combination not elsewhere provided,even though the measurement is of cur-

rent or voltage, classification will be inClass 356.

SEE OR SEARCH THIS CLASS, SUB-CLASS:130, for refractive tests which utilize a

servo-controlled device to adjust thelight intensity of a beam of light usedin the test.

321+, for plural beam absorption spectro-photometers which have structure toadjust the light intensity of one of thebeams by automatic means.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 204 takes

systems utilizing radiant energydetectors to balance by means of opti-cal elements the detectors controlledby the intensity of light emitted byplural sources of light; subclass 205for systems where the intensity of alight source is adjusted by opticalmeans controlled by a radiant energydetector responsive to the light sourceintensity. No indicator related to theoptical properties of the light includedin the claims should be classifiedthere. See also (1) Note above.

315, Electric Lamp and DischargeDevices: Systems, subclasses 149+will take a system utilizing a radiantenergy detector to control an electricallamp by electrical means where nosignificant optical structure is in thepath between the light source testedand the radiant energy detector of thesystem, and no indication relating tothe light emitted by the lamp isclaimed and the lamp is the ultimateload of the system. subclass 151 forradiant energy systems responsive to alamp to control the intensity of lightfrom the lamp by electrical means;also see subclasses 129+. See (2) Noteabove.

318, Electricity: Motive Power Systems, subclasses 18+ for follow-up systemsutilizing radiant energy which have astheir ultimate purpose the control ofan electric motor.

324, Electricity: Measuring and Testing, subclasses 403+ will take the testingof lamps, per se, to determine the


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lamp characteristics before actual use,including the intensity of light emittedper watt input. See the (3) Note above.

48 Modulating (e.g., flicker beam):This subclass is indented under subclass 46.Subject matter wherein the means to compareor facilitate the comparison of the standard andunknown radiation includes means to modulatemechanically or optically the standard or theunknown radiation.

(1) Note. The modulated unknown or stan-dard radiation may include portions ofother radiation.

(2) Note. Color discrimination and opticalattenuation means may be part of thecombination claimed.

SEE OR SEARCH THIS CLASS, SUB-CLASS:217, for modulation type photometers

where temperature is not involved.418, for shade or color tests where color

and intensity of light is included andan incandescent standard may beinvolved but temperature is notinvolved and modulation of the lighttakes place.

425, for light intensity comparison ofshade where temperature is notinvolved but modulation may beinvolved.

SEE OR SEARCH CLASS:250, Radiant Energy, subclasses 232+ for

optical modulators or flickering beamphotocell circuits of general usage.

374, Thermal Measuring and Testing, sub-classes 121+ for radiation pyrometerswhich utilize modulating means.

49 Telescopic:This subclass is indented under subclass 46.Subject matter including a telescope for pass-ing unknown visible radiation and having anobjective and ocular lens system, and means tolocate, physically or optically, the incandescentstandard in the optical path of the lens systemso that visible radiation of the standard and theunknown radiation may be viewed simulta-neously.

(1) Note. Herein are those telescopicpyrometers which attenuate the intensityof the light or the color of the unknownsource or the standard by optical means.

SEE OR SEARCH THIS CLASS, SUB-CLASS:46, for calibrated light standard systems,

per se, used for comparison withunknown visible light for tempera-ture, colorimetry or photometry pur-poses.

230, for photometers which visually com-pare light intensities by means of anincandescent standard.

364+, for tests which utilize polarized lightfor examination purposes where tem-perature is not involved.

404, for color or shade determination forphotographic purposes where colortemperature is not involved.

416+, for shade or color tests involving opti-cal filters where temperature is notinvolved.

417, for flame detecting photometers notconcerned with temperature whichutilize color filters rather than dispers-ing or diffracting elements to separatethe radiation into discrete colors.

425, for color determination by light inten-sity comparison where color tempera-ture is not involved.


class 738 for lens systems havinglight limiting or controlling means.

50 Current control:This subclass is indented under subclass 49.Subject matter wherein the incandescent stan-dard is an electrically heated filament andmeans are provided to control the currentthrough the filament.

(1) Note. These instruments may includeoptical elements to change the color andintensity of the unknown radiation or thestandard radiation.


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SEE OR SEARCH THIS CLASS, SUB-CLASS:46, for the electrical circuits, per se,

which power the electrical incandes-cent standard.

231, for photometers which utilize an elec-trical incandescent lamp whichincludes means to vary filament cur-rent.

SEE OR SEARCH CLASS:315, Electric Lamp and Discharge

Devices: Systems, subclasses 129+for electrical circuits supplying cur-rent to a lamp, which is not an electri-cal test standard, which circuitincludes an electrical indicator.

374, Thermal Measuring and Testing, sub-class 129 for radiation pyrometerswhich include an electrically variableincandescent standard.

51 INFRARED AND ULTRAVIOLET:This subclass is indented under the class defini-tion. Subject matter involving nonvisible radi-ation such as infrared and ultraviolet radiationnot provided for elsewhere.

(1) Note. The subject matter of this subclassrelates to apparatus and methods similarto that provided for in the other sub-classes of this class, i.e., subject matterof an optical nature as would be opera-tive with visible radiation. However, inthis subclass the operation has beenextended to involve the nonvisible spec-trum but in an optical manner, such asrefraction and reflection in accordancewith optical principles, and not providedfor elsewhere, e.g., Class 374, subclasses121+ for radiation thermometers. Class250, especially in subclasses 336.1+ pro-vides for apparatus with significant non-visible radiation structure includingmeasuring and testing of invisible radia-tion. Examples of significant nonvisibleradiation structure for classification inClass 250 are a source of invisible radia-tion such as infrared or ultraviolet, par-ticular material operative only in theinvisible radiation range, the applicationof the measuring or testing to subjectmatter or specimens responsive only to

invisible radiation to carry out the mea-surement or test. It is emphasized that asbetween this Class 356 and Class 250 thegeneral requirements for Class 356 mustbe also met for classification here. Forexample, photocell measuring circuitsmust claim the meter or indicator or thespecimen holder for classification here.A lesser combination such as a photocellcircuit would be classified in Class 250.See (1) Note under subclass 218.

(2) Note. Where one claim to measuringand testing uses only visible light in thetest and another claim to measuring andtesting uses only invisible radiation, theoriginal classification is in Class 356,appropriate subclass and cross-refer-ences in Class 250, appropriate subclass.

SEE OR SEARCH CLASS:250, Radiant Energy, subclasses 336.1+

for methods and apparatus includingan electric signalling device fordetecting infraviolet radiation andsubclasses 472.1+ for nonelectric sig-nalling methods and apparatusresponsive to infrared or ultravioletlight. See also the (1) Note to thissubclass.

374, Thermal Measuring and Testing, sub-classes 121+ for the detection ofinfrared and visible light energy todetermine the temperature of a bodyfrom which the radiation is thermallyemitted.

378, X-Ray or Gamma Ray Systems orDevices, appropriate subclasses formeasuring and testing using X-rays.

52 EGG CANDLING:This subclass is indented under the class defini-tion. Subject matter which involves lighttransmission through eggs, which light may bephotoelectrically or visually detected to deter-mine the fertility, freshness or other conditionsof the eggs.

(1) Note. Included in this subclass are allhand or bodily held devices used for can-dling eggs.

(2) Note. The combination of candling ofeggs and the incubation of the eggs is in


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Class 119, Animal Husbandry. Howeverthe heating of the eggs to perfect a can-dling operation is in Class 356, subclass36.

SEE OR SEARCH THIS CLASS, SUB-CLASS:432+, for tests involving light transmission

tests through translucent and transpar-ent articles.

SEE OR SEARCH CLASS:15, Brushing, Scrubbing, and General

Cleaning, subclass 3.11 for machinesto clean and sort eggs or screen outdirt from eggs.

53, Package Making, subclass 147 for thegroup forming of articles and the sub-sequent packaging of the articles inportable receptacles and subclass 167for the combination of a visual test ofan article and the filling of portablereceptacles with the tested articles.

119, Animal Husbandry, subclass 6.8 formethods and apparatus for hatchingeggs including the step of candling ofeggs, and subclasses 311+ for incuba-tors.

221, Article Dispensing, appropriate sub-class for releasing articles one at atime from a supply apparatus.

53 Photoelectric:This subclass is indented under subclass 52.Subject matter which includes a photosensitivedetector to receive the light transmitted throughthe egg, and which may include an optical filterin the visual range to restrict the characteristicof the light transmitted through the egg.

SEE OR SEARCH THIS CLASS, SUB-CLASS:36, for sample preparation of the tested

egg in addition to the candling step.51, for infrared, ultraviolet and visible

light transmission through the egg.407, for color tests responsive to plural col-

ors simultaneously.418, for color tests including rotating fil-

ters.419, for color tests including multicolored

filters.

SEE OR SEARCH CLASS:209, Classifying, Separating, and Assort-

ing Solids, subclasses 510+ for auto-matic egg candlers and sorters.

250, Radiant Energy, subclasses 336.1+for egg candlers utilizing an infraredor ultraviolet responsive electric sig-nalling device.

359, Optical: Systems and Elements, sub-classes 350+ for optical elements usedin the infrared or ultraviolet portion ofthe electromagnetic spectrum, andsubclasses 885+ for optical filters.

54 With counting, marking, or weighing:This subclass is indented under subclass 52.Subject matter wherein a visual candling appa-ratus is combined with counting, marking orweighing apparatus which is used in conjunc-tion with the candling operation, when not pro-vided for in any other class.

SEE OR SEARCH THIS CLASS, SUB-CLASS:72, for the general combination of a

visual optical test and a diverse artdevice.

SEE OR SEARCH CLASS:101, Printing, subclass 2 for the combina-

tion of printing and sorting, sub-classes 212+ for rolling contactprinting machines and subclass 327for printing members and inkers.

177, Weighing Scales, subclasses 50+ forthe combination of scale with a testingdevice other than a candling operationand subclass 245 for weighing devicescombined with a diverse art device.

209, Classifying, Separating, and Assort-ing Solids, subclasses 510+ for thecombination of visual candling meanswith an automatic egg weighing andsorting device; and subclass 939 forilluminating means facilitating visualinspection.

235, Registers, subclass 91 for counting ofarticles mechanically.

377, Electrical Pulse Counters, PulseDividers, or Shift Registers: Circuits,and Systems Using Pulse Counters,Pulse Divider Systems, subclass 6 forcounting articles electrically.


February 2011

55 With egg transfer:This subclass is indented under subclass 52.Subject matter wherein transporting or convey-ing means is combined with a visual candlingdevice to move eggs in a predetermined or ran-dom manner from one location into, through,or over the visual candling device and beyondthe candling device to a second location by thesame or a second transfer means.

(1) Note. The first location may include dis-pensing means and the second locationmay include an egg holding containersuch as a portable receptacle where noprovision is made for this combination inanother class.

(2) Note. Egg supply and/or conveyingstructure may be included to bring eggsto the candling apparatus and receivingapparatus; and additional conveyingstructure may also be claimed with thecandling apparatus where there is noprovision for the combination in anotherclass.

(3) Note. The transfer means may be grav-ity and motorized conveyors includingthose of the endless belt and disc type.

(4) Note. Subcombinations of a photoelec-tric candling apparatus will be foundhere when there is no photoelectric cir-cuitry claimed.

(5) Note. Inverting structure which merelyinverts an egg or a group of eggs is notconsidered to be a transfer apparatus forthis group of subclasses unless there isadditionally movement of the egg fromone location to another. See subclasses56 and 65 for egg turning or jarringstructure.

56 With egg turning or jarring:This subclass is indented under subclass 55.Subject matter wherein structure, which maybe hand, motor, or gravity actuated, is includedwith the egg transfer and candling apparatus toturn or jar the eggs during the candling opera-tion.

SEE OR SEARCH THIS CLASS, SUB-CLASS:62, for egg turning and jarring means

combined with a light shading can-dling chamber.

65, for egg turning and jarring meanscombined with a light candling box.Also see (5) Note of subclass 55.

SEE OR SEARCH CLASS:414, Material or Article Handling, sub-

class 433 for article rotators of theroller type, and subclass 431 for therotation and a simultaneous advance-ment of articles which are concur-rently engaged at the ends of thearticles.

57 Endless conveyor:This subclass is indented under subclass 56.Subject matter wherein there are manually ormotor driven endless conveyors which includestructure which causes eggs placed sequen-tially on the conveyor to turn or somehowmove while passing through, over, or on thevisual candling apparatus.

(1) Note. Automatic structure to place theeggs on the conveyor from a supplystructure and structure to remove theeggs from the conveyor may be includedin the claimed combination. See also theSearch Notes under subclass 58.

SEE OR SEARCH CLASS:53, Package Making, subclass 167 for the

combination of candling, conveying,and the filling of portable receptacles.

198, Conveyors: Power-Driven, sub-classes 343.1+ and 373+ for an end-less conveyor having means for turn-ing or orienting the conveyed load asthe conveyor advances, and subclass631 for an endless conveyor havingmeans to jar the load as the conveyoradvances.

58 Endless conveyor:This subclass is indented under subclass 55.Subject matter wherein the transfer means is anendless conveyor of the manually or motordriven type and which includes endless beltand disc type to sequentially bring eggs singu-


1February 2011

larly or in groups, up to, over, or through thecandling device; and usually to convey theeggs beyond the candling structure to broadreceiving means.

(1) Note. Inverting structure may beincluded in the conveying structure.

SEE OR SEARCH CLASS:198, Conveyors: Power-Driven, sub-

classes 373+, 418+, and 434+ forarranging articles on conveyorsincluding the orienting of articles onor between conveyors; subclasses606+ for endless conveyors succes-sively conveying a load; subclass 779for traveling roll type conveyors; andsubclasses 688+ and 804+ for endlessbelt conveyors.

209, Classifying, Separating, and Assort-ing Solids, subclasses 510+ for eggsorting apparatus; subclasses 702+ formanual sorting apparatus; and sub-class 912 for endless feed conveyorshaving means for holding items sepa-rately.

59 Manual transfer:This subclass is indented under subclass 55.Subject matter wherein the transfer means is ahand manipulative support which may containthe eggs in a random or predetermined manner,and which may function separately as a handheld conveyor to move the supported eggsfrom one location to another and as a completecandling unit with the light source.

(1) Note. Included herein with the manualtransfer supports are the light box can-dling devices.

(2) Note. Pivoted egg support trays attachedto the candling box for the purpose ofinverting the eggs are not consideredconveyors and are placed in subclass 64.

SEE OR SEARCH THIS CLASS, SUB-CLASS:64, for light candling boxes. See also (2)

Note above.

60 With light shading chamber:This subclass is indented under subclass 59.Subject matter wherein the candling device is alight shading chamber, and the hand manipu-lated transfer device is inserted within the lightshading chamber for the candling operation.

(1) Note. The transfer device may be sta-tionary or manually movable during thecandling operation.

SEE OR SEARCH THIS CLASS, SUB-CLASS:62, for light shading chambers generally

in candling apparatus.

61 Portable receptacles:This subclass is indented under subclass 59.Subject matter including portable receptaclesor hand carried trays, per se, which are adaptedas by an opening or transparency to pass lightto or from the egg and which when used withlight box and light shading chamber structureform visual candling devices.

SEE OR SEARCH THIS CLASS, SUB-CLASS:244+, for sample, specimen, or standard

holders or supports generally.

SEE OR SEARCH CLASS:229, Envelopes, Wrappers, and Paperboard

Boxes, subclass 29 for folded blankboxes of the compartment type with awrapper to completely cover the cellsdesigned to candle or inspect eggsheld therein.

294, Handling: Hand and Hoist-LineImplements, subclass 87.12 for multi-ple egg hand transfer devices with lift-ers or grapples, and subclass 137 forhand-held article carriers.

62 With light shading chamber:This subclass is indented under subclass 52.Subject matter including an enclosure, adaptedto be joined to a light box by an aperture whichpasses the candling illumination from the box,to darken the viewing field adjacent the eggs.


February 2011

SEE OR SEARCH CLASS:312, Supports: Cabinet Structure, sub-

class 223.5 for enclosures having illu-minating means.

63 Hood type:This subclass is indented under subclass 62.Subject matter wherein the enclosure is a hoodwhich is attached externally to the enclosure toaid in the observation of the candling light.

SEE OR SEARCH CLASS:362, Illumination, subclasses 351+ for

shades and their supports for prevent-ing the further distribution of light.

64 With light box:This subclass is indented under subclass 52.Subject matter wherein there are enclosures ofcandling illumination (including natural lightdirectors) which have an aperture or aperturesto support or locate exteriorly on the surface ofthe enclosures an egg or eggs to be candled.

(1) Note. This subclass includes thoseenclosures which utilize sunlight as thesource of candling illumination andwhich require an additional aperture orapertures on the periphery of the enclo-sure to allow the illumination transmit-ted through the egg or eggs to be visuallyobserved exteriorly of the enclosure.

(2) Note. These enclosures include opticalelements such as mirrors to direct theillumination radiated through the egg oreggs to the outside of the enclosurethrough the additional aperture or aper-tures so that a visual observation can bemade.

SEE OR SEARCH CLASS:40, Card, Picture, or Sign Exhibiting,

subclasses 564+ for lamp boxes, andsubclasses 361+ for transparencyviewers.

211, Supports: Racks, subclasses 14+ forplural egg supports generally.

248, Supports, subclasses 176+ for articlestand type supports where only a sin-gular article is supported and subclass346 for supporting bases.

65 With egg turning or jarring:This subclass is indented under subclass 64.Subject matter wherein structure is included tomove or jar the eggs during the candling opera-tion.

SEE OR SEARCH THIS CLASS, SUB-CLASS:56, for egg candling with egg transfer

including turning or jarring.

SEE OR SEARCH CLASS:414, Material or Article Handling, sub-

class 431 for the rotation and simulta-neous advancement of articles whichare concurrently engaged at the endsof the articles and subclass 433 forarticle rotators, roller type.

66 With particular illumination means:This subclass is indented under subclass 64.Subject matter wherein the enclosure internallycontains significant illumination means orwhere the illuminating means is significantlyrelated to the remaining candling structure.

(1) Note. The illumination means may be ofthe electrical or combustible type whichmay or may not be of the self containedpower type.


for an irradiated object and subclasses458.1+ for methods and apparatus forirradiating luminescent material gen-erally.

67 With particular electrical switching:This subclass is indented under subclass 66.Subject matter including electrical illuminationcontrolled by a significant electrical switch orswitch operating structure to connect the illu-mination means to a power source, or wherethe switch and the switch operator are signifi-cantly related to the remaining candling struc-ture.

SEE OR SEARCH CLASS:200, Electricity: Circuit Makers and

Breakers, subclasses 52+ for switchesof special application, particularlysubclasses 61.41 and 61.42 where the


1February 2011

motion or presence of an article actu-ates a mechanical feeler to close anelectrical switch and subclass 61.58for switches actuated concurrentlywith the operation or use of an artdevice.

68 Lamp attachments:This subclass is indented under subclass 52.Subject matter including structures attachableto illuminating lamps to convert the illuminat-ing lamps into candling boxes or light shadingchambers of the visual type.

(1) Note. Included are devices to convertportable and other type light sources intoegg candling structure.

SEE OR SEARCH THIS CLASS, SUB-CLASS:72, for convertible subject matter not

classified elsewhere.

SEE OR SEARCH CLASS:313, Electric Lamp and Discharge Devices,

subclass 315 for incandescent lamps.315, Electric Lamp and Discharge

Devices: Systems, particularly sub-classes 32+ for incandescent lampswhich are structurally combined witha circuit element, and for systems forsupplying electrical energy to lamps.

362, Illumination, subclasses 138+ forinspection lamps, subclasses 157+ forportable electric lamps, and sub-classes 257+ for lanterns includinglight projectors not specificallydesigned for testing purposes.

69 CUTTING BLADE SHARPNESS:This subclass is indented under the class defini-tion. Subject matter including a light sourcefor shining light on a blade edge together withoptical or photoelectric means for determiningthe reflectivity and thus the sharpness of theblade.

SEE OR SEARCH THIS CLASS, SUB-CLASS:445+, for reflection testing generally.

SEE OR SEARCH CLASS:73, Measuring and Testing, subclasses

104+ for testing surfaces and cuttingedges where not elsewhere classified.

209, Classifying, Separating, and Assort-ing Solids, subclasses 511, 524+, 536,and 576+ for testing articles with radi-ant energy including means to sort thearticles.

70 OIL TESTING (E.G., CONTAMINATION):This subclass is indented under the class defini-tion. Subject matter including structure fordetermining the physical properties of liquidoil by the optical response, such as producedby visible light transmitted through or reflectedfrom the oil.

(1) Note. The optical response may involvethe examination of the oil for color,polarization effects, or for foreign con-tent such as sediment in the oil. Bothvisual and photoelectric devices are here,and the test may be of oil samples or ofoil moving in a closed system.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for tests of oil which may involve

infrared radiation.128+, for refraction test devices which may

be applicable for testing of oil.364+, for polarization test devices which

may be applicable for the testing ofoil.

402+, for color test devices which may beapplicable for the testing of oil.

432+, for transmission test devices particu-larly for comparison tests, and

441+, for liquid particle suspension tests.445+, for reflection test devices which may

be applicable to the testing of oil.


for testing for solid matter entrainedin a gas, subclasses 61.41+ for thetesting of a liquid for sediment or for-eign content where more than a visualor photoelectric test of the color or theamount of visible radiation transmit-ted through or scattered from the liq-uid is involved, and subclasses 53.05+


February 2011

for lubricant testing, subclasses152.18+ for a fluid analysis in testinga borehole, a casing, or a drill riggingwherein the test is not purely electri-cal or purely magnetic, in particularsubclass 152.42 for determining therelative proportion of fluid constitu-ents by a test which is not purely elec-trical or purely magnetic.

116, Signals and Indicators, subclasses200+ for visual indicators, per se,where no color or other optical com-parison test is involved and for levelindicators of the mechanical type.

71 DOCUMENT PATTERN ANALYSIS ORVERIFICATION:This subclass is indented under the class defini-tion. Subject matter for the analysis of intrin-sic properties of documents which includes asupport for the document to be tested andmeans to examine and compare visually or toexamine photoelectrically the properties of thedocument by means of visible light for the con-formance of any given property with a standardor for the conformance of the pattern or writinggenerally with a standard pattern or writing asto form or configuration.

(1) Note. A document for this subclass is asheetlike article and may be an informa-tion document having writing or printingor containing a pattern. A document is,however, excluded from this subclasswhen any writing, printing, or patterncontained on the document is examinedfor the information it conveys.

(2) Note. The analysis of the intrinsic prop-erties of a document by means of radiantenergy (nonvisible light), is classified inClass 250, Radiant Energy.

(3) Note. The analyzing of coded cards,having perforations, magnetic markingsand visible markings, one at a time inbusiness machines as well as the cards,per se, are in Class 235, Registers.

(4) Note. Termatrix Systems (peekaboos)are found in Class 235, Registers, sub-class 1; Class 250, Radiant Energy, sub-classes 211 and 219. Also see Class 355,

Photocopying, for projectors involvingpeekaboo systems.

SEE OR SEARCH THIS CLASS, SUB-CLASS:2, for contour plotting apparatus involv-

ing stereoscopic images of topograph-ical maps.

389, for mensuration or configuration com-parison generally where a photographis taken of the standard or object to becompared.

391, for configuration comparison gener-ally of an article with a standardwhere light projection is involved.

394, for configuration comparison gener-ally of an article with a desired shape.


for statistical record verifying ofpunched or marked cards.

194, Check-Actuated Control Mecha-nisms, subclass 207 for the testing ofcurrency for genuineness combinedwith a check controlled machine.

209, Classifying, Separating, and Assort-ing Solids, subclasses 576+, 603, and659+ for one or more tests involvingdocuments for length, width, thick-ness, color, light transmission testsand pattern analysis where a physi-cal separation of a document fromother documents is based upon one ormore of these tests.

235, Registers, subclasses 375+ for sys-tems controlled by a record, sub-classes 435+ for the analysis orrecognition of a coded documentwhich does not include reading orsensing of alphanumeric characters orpattern recognition.

250, Radiant Energy, subclasses 556 and233 for the light detection of patternson documents and the light detectionunits, per se, which involve rotatingmasks and shutters and subclass 271for coded record recorders responsiveto invisible radiation or invisible radi-ation modified by the code. See also(4) Note above.


1February 2011

340, Communications: Electrical, sub-class 146.2 for the comparison electri-cally of information where not else-where classified.

382, Image Analysis, subclasses 119+ and124+ for signature and fingerprintanalysis which include informationcontents.

72 WITH PLURAL DIVERSE TEST OR ART:This subclass is indented under the class defini-tion. Subject matter wherein the subject matterof this class is combined with the subject mat-ter of another class where not elsewhere pro-vided.

(1) Note. Included is convertible subjectmatter involving subject matter ofanother class not provided for elsewherewhich converts an optical test apparatusto a test apparatus of another test class orto another art device.

(2) Note. Where the subject matter ofanother class prepares the substancetested for an optical test of this class, seesubclass 36.

SEE OR SEARCH THIS CLASS, SUB-CLASS:68, for structures to convert regular lamps

to egg candlers.

73 PLURAL TEST:This subclass is indented under the class defini-tion. Subject matter which includes optical testapparatus to perform simultaneously orsequentially at least two different optical testswhich are both a part of the basic subject mat-ter of this class.

(1) Note. Two identical optical tests whichare part of the subject matter of thisclass, performed simultaneously orsequentially will be classified here pro-viding each test has its own indicator ormanner of determining its test individu-ally rather than both tests collectivelyoperating a single indicator.

(2) Note. Included here is convertible sub-ject matter which would permit an opti-cal test device which is part of the basicsubject matter to be changed into a opti-

cal test device which is also the basicsubject matter of this class.

(3) Note. Light meters which by a change inthe galvanometer scale or by addition ofa color filter to become a pyrometer or acolored light meter are not considered tobe convertible for this subclass. See thesection on pyrometers, spectroscopy, orshade or color for proper classificationof this subject matter.

(4) Note. Visual inspection simultaneouslyor sequentially with a optical test of theclass will be classified here.

73.1 FOR OPTICAL FIBER OR WAVEGUIDEINSPECTION:This subclass is indented under the class defini-tion. Subject matter wherein there is means toexamine one or more transparent elongatedstructures (e.g., rods, fibers, or pipes) whichare used to transmit light rays from one point toanother within the confines of their outer sur-face, and involving internal reflections ormodal transmission.

SEE OR SEARCH THIS CLASS, SUB-CLASS:384+, for measurement or tests of nonoptical

fibers, width or diameter.429+, for optical inspection of nonoptical

fibers, per se.


for circuits for evaluating a web,strand, or strip; and for detection ofdefects or flaws in a web, strand, orstrip.

385, Optical Waveguides, appropriate sub-classes for optical fibers, per se.

121 LAMP BEAM DIRECTION OR PAT-TERN:This subclass is indented under the class defini-tion. Subject matter including structure toindicate or otherwise determine the directionthe axis of a light beam from a headlight orother light projector; or including structure todetermine at selected and fixed points theintensity of a light beam projected from a head-light or other light projector throughout the


February 2011

space where the light is projected, i.e., the con-tour pattern of the light beam.

(1) Note. This class provides for the directanalysis of the beam which is emittedfrom the light producer, as by determin-ing the direction pattern, or focusing ofthe beam. Class 33 provides for themechanical sensing of the direction of aheadlight without involving the lightbeam. However, where the mechanicalsensing device involves some opticalmeasuring, classification is in this Class356. Class 362 provides for lampswhere significant lamp structure isclaimed in combination with a built-inoptical structure. Class 324 provides fortesting the electrical operating character-istics of electric lamps alone or in com-bination with light intensity, direction,pattern, or focusing tests of this Class356.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3+, for optical range finders in combina-

tion with light beam alignment orfocusing apparatus.

124+, for the testing of a lens or reflectiveimage former where apparatus similarto that used in these subclasses is uti-lized to determine the quality of thelens or the reflective image former.

138+, for determining generally the twodimensional alignment of an axis orline with respect to a plane, and par-ticularly subclasses 141.1+ and152.1+ for the photoelectric apparatusand subclass 154 for the viewingscreen type of apparatus.

213+, for photometers generally and particu-larly subclasses 218 for the photoelec-tric type, and 229 for the visualcomparison type.


subclasses, particularly subclass 264,for lamp alignment device of the lightray type and subclass 335, for meansused in aligning an automobile head-light by establishing its relationship tothe horizontal or the vertical.

324, Electricity: Measuring and Testing, subclasses 20+ for the combination ofoptical alignment or focusing test of alamp with an electrical operatingcharacteristic test of the lamp. See (1)Note above.

359, Optical: Systems and Elements, sub-classes 443+ for projection screensgenerally.

362, Illumination, subclasses 459+, for sig-nificant illumination apparatus forvehicle lighting purposes. Also see(1) Note above.

445, Electric Lamp or Space DischargeComponent or Device Manufacturing, subclasses 4 and 64, for methods andapparatus for the positioning of fila-ments by optical projection meansduring the manufacture of lamps andelectronic tubes.

122 With lamp focusing:This subclass is indented under subclass 121.Subject matter including structure to indicatethe proper focus of a light source, or the devia-tion or extent of deviation from proper focus ofthe light source.

(1) Note. The proper focus usually existswhen the light source is located at thefocus of a parabolic reflector or lens. Forclassification here there must be a dis-tinct disclosure of focusing structure inthe specification or claims as opposed toa mere inherent focusing function whichis classified in the generic subclass.

SEE OR SEARCH THIS CLASS, SUB-CLASS:123, for the focusing of a filament with

respect to some optical elementwherein no light pattern is involved.


lamps with a built-in sighting devicefor focusing the filament of the lampwith respect to the optical projectionelements of the lamp.

123 FOCAL POSITION OF LIGHT SOURCE:This subclass is indented under the class defini-tion. Subject matter including structure toestablish and determine the proper focal posi-


1February 2011

tion of a concentrated light source with respectto optical elements, such as a parabolic lightreflector or a lens; or to indicate the coinci-dence of a concentrated light source at the focalpoint of a lens or parabolic reflector; or thedeviation from such coincidence.

SEE OR SEARCH THIS CLASS, SUB-CLASS:122, for head light focusing with direction

or pattern determining.


lamps with a built-in sighting devicefor focusing the filament of the lampwith respect to the optical light pro-jection elements of the lamp.

124 LENS OR REFLECTIVE IMAGEFORMER TESTING:This subclass is indented under the class defini-tion. Subject matter for measuring or other-wise determining the optical properties of alens or reflective image former.

(1) Note. Measuring means for establishinglines or points on a lens blank for thepurpose of grinding or cutting are notincluded in this subclass. However,means for determining the optical centeror the cylinder axis of a finished lenswould be classified here. The formersubject matter is classified in Class 33, ifthe measurement is made mechanically;or in other subclasses of this class partic-ularly subclasses 138+ and 372+, if sig-nificant optical features are involved.

(2) Note. Subject matter for visuallyinspecting a lens for flaws or imperfec-tions is excluded from this subclass.Such subject matter is classified in sub-class 239.

(3) Note. The subject matter of this subclassinvolves testing lenses or reflectors hav-ing curved surfaces. For flatness testinggenerally see subclass 371.

(4) Note. This subclass includes ophthalmiclens testing. However, Class 351 pro-vides for eye testing and examination.

SEE OR SEARCH THIS CLASS, SUB-CLASS:359, for determining the surface configura-

tion of a lens or reflector by means oflight interference.

SEE OR SEARCH CLASS:351, Optics: Eye Examining, Vision Test-

ing and Correcting, subclasses 200+for instruments for examining eyes ortesting vision.

124.5 For optical transfer function:This subclass is indented under subclass 124.Subject matter including means to determinethe ratio of the Fourier spectrum of the lensimage to the one of the object.

125 Focal length measuring:This subclass is indented under subclass 124.Subject matter for measuring the focal lengthof a lens or reflector.


classes 383 and 425+ for focusingmeans for compound lens systems;and subclasses 676+ and 823+ forlens focusing means.

126 Deflecting or interrupting optical path:This subclass is indented under subclass 125.Subject matter including means for deflectingor interrupting the optical path between a targetand the observer or detector.

127 Optical center, cylinder axis, or prism mea-suring or determining:This subclass is indented under subclass 124.Subject matter comprising means for determin-ing the optical center of a lens, the prism ordeviation of the optical center from the geo-metrical center of a lens, or the axis of the cyl-inder of a lens.

(1) Note. See (1) Note under subclass 124with reference to related subject matter.

128 REFRACTION TESTING (E.G., REFRAC-TOMETERS):This subclass is indented under the class defini-tion. Subject matter for testing the refractionof a fluid or solid wherein there is generally


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means to contain the fluid or support the solidstatically or in motion; generally means, whichmay include a light source and which may bemonochromatic light, to cause a diffused or acollimated beam of light to be transmittedthrough the fluid or solid under test or to betransmitted and reflected internally from thesurface of an optically transmissive membercontiguous to the fluid or solid under test; anda visual or photoelectric device to note or mea-sure the intensity of the light transmittedthrough the fluid or solid or the change inangle, direction, or the displacement of thelight traversing the fluid or solid as a result ofthe light being refracted by the fluid or solidtested.

(1) Note. Comparison tests are includedunder this and the indented subclass.

SEE OR SEARCH THIS CLASS, SUB-CLASS:124, for the testing of optical elements

such as lenses and prisms, and partic-ularly subclass 127 for prismatic andfocal power tests which may includerefraction testing.

450, for interference tests which mayinvolve the refraction of light.

496, for interference tests for determiningthe thickness of films which mayinvolve refraction test.


classes 642+ for lenses, and sub-classes 831+ for prisms and prismmounts.

129 Schlieren effect:This subclass is indented under subclass 128.Subject matter including means blocking thenormal light refraction from a fluid or a solid ina fluid, and passing the light bent due to local-ized changes in the refractive index of the fluidor the solid in a fluid; or including means caus-ing a light pattern to vary as a result of thechanges in the refractive index of the fluid orthe solid in a fluid.

(1) Note. The localized changes in therefraction are caused by variations in thedensity of the fluid caused by the solidsin the fluid, temperature changes in the

fluid, or other forces which affect thefluid.

SEE OR SEARCH THIS CLASS, SUB-CLASS:344, for electrophoresis apparatus which

detects a Schlieren pattern.517, for the combination of an interference

system with a Schlieren arrangementwhere a refraction test is involved.


for Schlieren apparatus combinedwith the testing of objects in wind tun-nels.

130 Differential:This subclass is indented under subclass 128.Subject matter wherein the support for the test-ing of substances, usually fluids, includes atleast two prismatic containers each containinga similar fluid and each capable of transmittinga collimated beam of light through the con-tainer and its contained fluid, the beam of lightbeing transmitted serially through both fluidsor passed simultaneously through both fluids.

131 With servo controlled optical member:This subclass is indented under subclass 130.Subject matter including an optical member inthe path of the light beam, and servo-controlledmeans responsive to the photoelectric device tocontrol the optical member in response to thelight received by the photoelectric device.

SEE OR SEARCH CLASS:137, Fluid Handling, subclasses 2+ and 93

for processes and apparatus whichmay control the flow of the fluids han-dled by means of a refraction testupon the fluid controlled.

250, Radiant Energy, subclass 204 foroptical elements which are adjusted tobalance light brightness in pluralpaths to a photoelectric servo-system.

318, Electricity: Motive Power Systems, subclasses 18+ for motors controlledby servo systems not elsewhere pro-vided, and subclass 480 for motorscontrolled by radiant energy.


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132 Reflective optical member:This subclass is indented under subclass 131.Subject matter wherein the controlled opticalmember is of the reflective type.

133 Refractive rod engages specimen:This subclass is indented under subclass 128.Subject matter which includes a solid lighttransmissive member whose periphery touchesa fluid under test, which transmits light to thedetecting and indicating means, the refractiveindex of the fluid being directly related to theamount of light received by the detecting andthe indicating device.

(1) Note. The type or refraction test classi-fied herein can be found in Class 73,Measuring and Testing, in subclasses 73and 705. The difference is that in Class73 the quantitive meter will register theresult of the test in moisture units orpressure units, while in this class (356)the registration is in index of refractionmeasurements.

134 Prism forming fluid specimen container:This subclass is indented under subclass 128.Subject matter wherein the support or containerfor the fluid specimen to be tested allows thefluid specimen to assume a prismatic shape forthe purpose of testing the specimen for refrac-tive index.

SEE OR SEARCH THIS CLASS, SUB-CLASS:130, for serially placed fluid prismatic con-

tainers wherein the light is serially orsimultaneously passed through bothfluids.

246, for fluid containers, per se.

135 Prism engaging specimen:This subclass is indented under subclass 128.Subject matter wherein there is a prism and asolid or fluid medium to be examined forrefractive index and forming an interface sur-face with the prism, this prism being part of thedetecting and indicating means, whereby themodification of the light transmitted across orreflected at the interface surface due to therefraction of the medium is shown in thedetecting and indicating device.

(1) Note. Included herein are immersiontype refractometers.

SEE OR SEARCH CLASS:203, Distillation: Processes, Separatory,

subclass 3 for processes of distillingfluids which may include a refractiontest of the fluid.

359, Optical: Systems and Elements, sub-classes 831+ for prisms, per se.

136 Internally reflecting prism:This subclass is indented under subclass 135.Subject matter wherein the visible light used inthe test is transmitted through and reflectedinternally of the prism at its surface formingthe interface with the medium tested, and isthen passed to the detecting and indicatingmeans.

137 Plural prisms:This subclass is indented under subclass 135.Subject matter wherein there is a second opti-cal member usually a prism associated with thefirst prism and the fluid or solid medium to beexamined, and wherein the light is transmittedthrough the second optical member to cause thelight to be dispersed before it enters themedium and the first prism.

(1) Note. Included herein are Abbe typerefractometers.

138 ANGLE MEASURING OR ANGULARAXIAL ALIGNMENT:This subclass is indented under the class defini-tion. Subject matter including means to mea-sure an angle by determining the direction ofrelated light; or including means for determin-ing the alignment of two axes by light raysrelated as by coincidence with such axes.

(1) Note. Where two objects are laterallyaligned by displacing one relative toanother and alignment involves no rota-tion about an axis classification is in sub-class 399.

(2) Note. The axes may be imaginary as, forexample, an axis along the length of avehicle or normal to a surface. Also dif-ferent parts of a continuous line may beconsidered as plural axes as, for exam-


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ple, in testing the straightness of a rail ora gun barrel.

(3) Note. Alignment occurs when the twoaxes form a common axis or are parallel.

SEE OR SEARCH THIS CLASS, SUB-CLASS:399+, for alignment in a lateral direction.

See also (1) Note above.


subclasses for a light ray type axialalignment device and subclasses276+, 281, 282+, and 285, for a lightray type angle measuring device,without any significant optical fea-ture.

139 Plural scales or different portions of samescale simultaneously observable:This subclass is indented under subclass 138.Subject matter including means whereby twodifferent angle measuring scales or two differ-ent portions of the same angle measuring scaleare simultaneously observable.

139.01 Star/Sun/Satellite position indication withphotodetection:This subclass is indented under subclass 138.Subject matter including means responsive tolight received directly from a star or stars, thesun, or other astronomical objects (includingmanmade satellites) in order to determine andindicate at least relative angular position withrespect to an optical axis of a measuring instru-ment.


for alternative outputs of measuredcoordinates that are not displayed, perse, and do not include tracking of theoptics; subclasses 203.1+ for trackingof the pre-photodetector system.

139.02 With reticle or slot:This subclass is indented under subclass139.01. Subject matter including a reticle oraperture slot in an optical path of the photode-tector that enables the determination of theangle.

139.03 Relative attitude indication along three axeswith photodetection:This subclass is indented under subclass 138.Subject matter wherein the measured anglesdefine and indicate the yaw, pitch, and roll ori-entation or the like in space of a detected objector of a photodetecting instrument relative to anarbitrarily chosen axis or axes or to geophysi-cal planes.

SEE OR SEARCH THIS CLASS, SUB-CLASS:141.1+, for angle measurement that defines an

angle at the detecting station withrespect to a beam in terms other than 3axes of orientation.

152.2+, for angle measurement that defines anangle at the object with respect to abeam in terms other than 3 axes of ori-entation.

SEE OR SEARCH CLASS:244, Aeronautics and Astronautics, sub-

class 171 for attitude sensors that mayinvolve optics.

250, Radiant Energy, subclasses 206.1+for alternative outputs of measuredcoordinates that are not displayed, perse.

139.04 Automatic following or aligning while indi-cating measurement:This subclass is indented under subclass 138.Subject matter including means to maintain anoptical axis in register with a movable object ormovable photodetecting station, while indicat-ing relative angular position with respect to theoptical axis.

(1) Note. For classification in this subclass,there must be claimed some means toindicate angle or relative alignmentwhich is effectively measured as con-trasted with Class 250, subclasses203.1+ where there is no indicationrequired.

(2) Note. The object must be either self-luminous or must reflect ambient light;otherwise, it will be found in subclasses139.07+.


1February 2011

(3) Note. Examples of automatic followingor aligning found in this subclass, andnot below, involve remote missile con-trol, robot control, or table platformalignment of an imaged object with indi-cation of a measurement.

SEE OR SEARCH THIS CLASS, SUB-CLASS:139.01+,for techniques that may be used in star

or sun angle measurements.139.07+,for objects that reflect a unidirectional

beam of illumination from whichbeam angle is determined.

139.09+,for techniques that may be used inwheel alignment with photodetection.

141.1, for objects that reflect a unidirectionalbeam of illumination from which anapex of an angle at the detecting sta-tion is determined, but where there isno automatic following or aligning.

141.2+, for objects that follow or align on aunidirectional beam that is notreflected.

152.2+, for objects that reflect a unidirectionalbeam of illumination from whichalignment or the apex of an angleremote from the detecting station isdetermined and there is no automaticfollowing or aligning.

399+, for parallel nonangular alignment of abeam to the detecting station.

SEE OR SEARCH CLASS:244, Aeronautics and Astronautics, sub-

classes 3.13 and 3.16 for optical angu-lar orientation of a viewed missilewith respect to an optical axis.

250, Radiant Energy, subclasses 203.1+for following a self-luminous orremotely illuminated target withoutany indication of angle or misalign-ment; subclasses 206.1+ for alterna-tive outputs of measured coordinatesthat are not displayed, per se.

318, Electricity: Motive Power Systems, subclass 640 for photoelectric mea-suring instrument control of a servomechanism.

398, Optical Communications, subclass156 for optical communication align-ment that does not technically indicatea measurement.

139.05 With optical elements moving relative tofixed housing to follow or align:This subclass is indented under subclass139.04. Subject matter including optical ele-ments in a housing that reorient the optical axisto follow or align the object independently ofthe housing.

(1) Note. Gimballed optical elements whichmay be in a subhousing that follows oraligns falls within the concept of thissubclass.

139.06 With optical housing moving to follow oralign:This subclass is indented under subclass139.04. Subject matter having a housing thatcontains all of the measuring optics and movesto follow or align the optical axis on the object.

139.07 With photodetection of reflected beam anglewith respect to a unidirectional sourcebeam:This subclass is indented under subclass139.04. Subject matter including a sourcebeam directed along one axis to the object fromwhich its reflected direction, with respect to itsprojected direction, is indicated and either fol-lowed or aligned.

(1) Note. This subclass may include deviceswhere the reflection plane or the detectorapparatus is servoed to follow or alignthe reflected beam from a fixed source tothe detector.

SEE OR SEARCH THIS CLASS, SUB-CLASS:141.1, for measurement of the apex of the

angle made at the detecting stationwithout means to follow or align thereceived or transmitted beam on theobject.

152.2+, for measurement of a remote apexangle without means to follow oralign the received or transmitted beamon the object.

139.08 With source beam moving to follow or align:This subclass is indented under subclass139.07. Subject matter under wherein the uni-directional beam moves to follow or align theobject.


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139.09 Wheel alignment with photodetection:This subclass is indented under subclass 138.Subject matter including apparatus to attach toa wheel or wheels to determine and indicaterelative angular direction of their planes ofrotation by using photodetection.

SEE OR SEARCH THIS CLASS, SUB-CLASS:150, for alignment of a wheel running axis

which is transverse to the angle of themeasuring axis.

153, for wheel alignment of subclass 138without photodetection.


203+ and 288 for wheel alignmentthat does not claim optical detection.

250, Radiant Energy, subclasses 206.1+for alternative outputs of measuredcoordinates that are not displayed, perse.

139.1 Photodetection of inclination from level orvertical:This subclass is indented under subclass 138.Subject matter that includes the use of photode-tection to measure and indicate the angular ori-entation of a surface with respect to gravitylevel or vertical reference.

(1) Note. This subclass includes some refer-ence to gravity level that is used to alterlight beam position with respect to adetector to determine and indicate anangle of at least one axis of a plane withrespect to level or zenith vertical.


366.16 for photoelectric detection ofattainment of a horizontal level or ver-tical orientation using a fluid absentsignificant light modifying structure;subclass 366.23 for photoelectricdetection of attainment of a horizontallevel or vertical orientation using asolid element absent significant lightmodifying structure other than gravityresponsive structure.

250, Radiant Energy, subclasses 206.1+for alternative outputs of measured

coordinates that are not displayed, perse.

140 Apex of angle at observing or detecting sta-tion:This subclass is indented under subclass 138.Subject matter comprising means to furnish ameasure of the angle between two optical axesintersecting at a common point at the observingor detecting station and passing through twopoints remote from this station; or between onesuch axis and a reference line or plane passingthrough the station.

(1) Note. Devices which only determine alevel line of sight are classified in sub-classes 248+ even though, from onepoint of view, they might be consideredas measuring an angle of zero degrees.

141.1 With photodetection of reflected beam anglewith respect to a unidirectional sourcebeam:This subclass is indented under subclass 140.Subject matter including a source beamdirected along one axis to an object from whichthe beam’s reflected angular direction withrespect to its projected direction is measuredand where the apex of the measured angle is atthe detecting station.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.01+, for angle determination during the tri-

angulation of an object’s distance.139.01+,for techniques that may be used in star

or sun angle measurements.139.09, for techniques that may be used in

wheel alignment with photodetection.152.2+, for instances where the apex of the

desired angle being measured is not atthe detecting station, even though thedetecting station apex angle may beinvolved in some way in the determi-nation.

399+, for lateral alignment of a beam thatdoes not follow an angular path to thedetecting station.


angle determination during the trian-gulation of an object; and subclasses206.1+ for alternative outputs of mea-


1February 2011

sured coordinates that are not dis-played, per se.

396, Photography, subclasses 89+ wherean angle is determined in the triangu-lation of an object’s distance.

141.2 With photodetection:This subclass is indented under subclass 140.Subject matter that includes photodetection formeasuring and indicating the angle to a lumi-nous object (e.g., beacon, missile, ambientlyilluminated object) not found in subclass 141.1above.

(1) Note. The luminous radiation from theobject is considered to be radial.

(2) Note. Shaft angle encoding with orwithout indication claimed or shown isfound in Class 250, subclasses 231.13+.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.01+, for angle determination found in the

triangulation of an object’s distance.139.01+,for techniques that may be used in star

or sun angle measurements.139.03, for measuring attitude characteristics

along 3 axes.139.04+,for the same concepts plus automatic

following.139.09, for techniques that may be used in

wheel alignment with photodetection.139.1, for specifically measuring angle of

inclination.152.1, for measuring and indicating any

angle other than that at the detectingstation.


for shaft angle encoding with or with-out display; subclass 201.6 for angledetermination during the triangulationof an object’s distance; subclasses206.1+ for alternative outputs that donot include any display, per se; sub-class 342 for determining the locationof an IR (infrared) source that mayinclude angle information.

396, Photography, subclasses 89+ for thedetermination of any angle in the tri-angulation of an object’s distance.


141.3 With unidirectional or planar source beamdirected at the photodetecting station:This subclass is indented under subclass 141.2.Subject matter that includes a unidirectionalbeam source or a directed plane light sourcethat is remotely located with respect to theobserving or detecting station.

(1) Note. The plane of light may be gener-ated by a scanned beam.

141.4 With optical scanning of light beam ordetector:This subclass is indented under subclass 141.2.Subject matter that includes means for continu-ously optically moving the photodetecting sta-tion field of view to enable the determinationand indication of angle apex at the detectingstation.

(1) Note. Subject matter in this subclassdoes not define a scanning at the sourceof light.

141.5 With at least two-dimensional sensitivity:This subclass is indented under subclass 141.2.Subject matter that specifically includes meansfor measuring at least two spatial coordinates(e.g., x and y coordinates or azimuth and eleva-tion).

SEE OR SEARCH THIS CLASS, SUB-CLASS:139.01, for measuring and indicating angle

(e.g., declination and hour angle to thesun, stars, or other astronomicalobjects).

139.03, for measuring and indicating yaw,pitch, and roll relative to an arbitrarilychosen axis or to geophysical planes.

142 Scale and remote point simultaneouslyobservable:This subclass is indented under subclass 140.Subject matter including means whereby theangle measuring scale and the remote targetpoint are simultaneously observable.


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SEE OR SEARCH THIS CLASS, SUB-CLASS:139, for means for simultaneously observ-

ing plural scales or different portionsof the same scale.

143 Artificial reference:This subclass is indented under subclass 142.Subject matter including, for the purpose ofestablishing a reference line or plane fromwhich the angle can be measured, means whichtends to maintain its orientation in space irre-spective of changes in the orientation of thesupporting structure for this means.

SEE OR SEARCH THIS CLASS, SUB-CLASS:148, for angle measuring means in general

combined with artificial referencedetermining means.

248, for artificial reference determiningmeans in general combined with opti-cal features.

144 With plural images:This subclass is indented under subclass 140.Subject matter including means whereby anobserver sees plural images of subject matterremote from the observer.

(1) Note. The images can, for example, bedisplaced images of the same subjectmatter or they can be superimposedimages of different subject matter suchas the horizon and a star.

145 Lines of sight relatively adjustable with twodegrees of freedom:This subclass is indented under subclass 144.Subject matter where plural lines of sight areadjustable relative to each other with twodegrees of freedom.

146 Two or more lines of sight deflected:This subclass is indented under subclass 144.Subject matter wherein the lines of sight fromat least two objects are each deflected in theviewing instrument.

147 Measurement in two planes (e.g., azimuthand elevation; hour angle and declination):This subclass is indented under subclass 140.Subject matter where angles are measured intwo different planes.

148 Artificial reference:This subclass is indented under subclass 140.Subject matter including, for the purpose ofestablishing a reference line or plane fromwhich the angle can be measured, means whichtends to maintain its orientation in space irre-spective of changes in the orientation of thesupporting structure for this means.

SEE OR SEARCH THIS CLASS, SUB-CLASS:143, for similar subject matter where a

scale and a remote point are simulta-neously observable.

248+, for artificial reference determiningmeans in general combined with opti-cal features.

149 Gyroscope or pendulum stabilized opticalelement:This subclass is indented under subclass 148.Subject matter where an optical element or ret-icle is stabilized by a gyroscope or pendulum.

SEE OR SEARCH CLASS:74, Machine Element or Mechanism, sub-

classes 5+ for gyroscopes, per se.

150 Sides of angle or axes being aligned trans-verse to optical axis (e.g., drift meter):This subclass is indented under subclass 138.Subject matter where the axes being aligned orlines determining the angle being measured liein a plane transverse to the optical axis of themeasuring or aligning device.

(1) Note. One of the lines or axes may bethe line generated as the result of the rel-ative motion of a vehicle and an objectas, for example, in a drift meter.

151 With light pulsing or interrupting means:This subclass is indented under subclass 150.Subject matter including means wherebypulses are produced by alternately interruptingand transmitting a light beam.


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152.1 With photodetection remote from measuredangle:This subclass is indented under subclass 138.Subject matter including photodetection andindication of the apex of an angle or the degreeof angular misalignment formed at a locationother than at a detecting station.

(1) Note. This subclass would include thedegree of misalignment or measure withrespect to a given axis of the remoteangle of a remote self-luminous source,not found in subclasses 152.2 and 152.3,where the angle apex is not at the detect-ing station and where there is no auto-matic following or alignment.

(2) Note. This subclass may include anglesat a detecting station which facilitate themeasurement of a different remote anglesuch as in the triangulation of beams orlook angles converging on a target.

(3) Note. This subclass does not includeshaft angle encoding found elsewhere(see search notes below).

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.01+, for angle determination found in the

triangulation of an object’s distance.139.01+,for techniques that may be used in star

or sun angle measurements.139.03, for attitude determination along 3

axes.139.09, for techniques that may be used in

wheel alignment with photodetection.139.1, for angular inclination, per se.399+, for parallel alignment of a beam to the

detecting station.


for shaft angle encoding with or with-out display; subclass 201.6 for angledetermination during the triangulationof an object’s distance.

396, Photography, subclasses 89+ for thedetermination of any angle in the tri-angulation of an object’s distance.


152.2 With reflection of a unidirectional sourcebeam from a planar or nonretroreflectivesurface:This subclass is indented under subclass 152.1.Subject matter including a planar, spherical,etc., reflecting surface at a remote object fromwhich a source beam directed along one axiswill reflect at different angles to be measuredalong at least one plane.

SEE OR SEARCH THIS CLASS, SUB-CLASS:139.03, for attitude in yaw, pitch, and roll of

either a remote planar reflector or thedetecting station.

139.07+,for the same plus automatic followingor aligning while indicating the angleor misalignment.

141.1, for apex of angles strictly at thedetecting station and where there is noautomatic following or alignment.

152.3 With reflection of a unidirectional sourcebeam from a retroreflector:This subclass is indented under subclass 152.1.Subject matter including a reflective surface ata remote object from which a source beamdirected along one axis reflects back to asource and photodetecting station colinearly orin parallel with respect to the source direction.

SEE OR SEARCH THIS CLASS, SUB-CLASS:139.03, for attitude in yaw, pitch, and roll of

either a remote planar reflector or thedetecting station.

139.07+,for the same plus automatic followingor aligning while indicating the angleor misalignment.

141.1, for apex of angle strictly at the detect-ing station and where there is no auto-matic following or alignment.

153 Alignment of axes nominally coaxial:This subclass is indented under subclass 138.Subject matter for aligning or testing the align-ment of two axes where the axes in theiraligned position are coaxial or form different


February 2011

parts of a continuous straight line lying in asurface.

(1) Note. This subclass includes, for exam-ple, optical means for testing thestraightness of items such as rails or gunbores and the aligning of the optical axisof a lens with the mechanical axis of atube.

154 With screen:This subclass is indented under subclass 138.Subject matter including a viewing screen orsurface upon which an image or spot of lightmay be projected.

SEE OR SEARCH CLASS:353, Optics: Image Projectors, for projec-

tors generally.359, Optical: Systems and Elements, sub-

classes 443+ for projection screens,per se.

155 Wheel alignment:This subclass is indented under subclass 154.Subject matter including means for aligning thewheels of a vehicle.

(1) Note. The term “alignment” as used inthis subclass denotes the determinationof the relationship between the axes ofrotation of wheels, or the relationshipbetween such rotation axes and somevehicle axis.

213 PHOTOMETERS:This subclass is indented under the class defini-tion. Subject matter for determining the inten-sity or quantity of light emanating from a par-ticular location or direction.

(1) Note. This and the indented subclassesprovide for both the photocell type andthe visual type of photometers, the visualtype being where the eye makes thedetection as opposed to the automaticdetection of the photocell in this photo-cell type. The light whose intensity is tobe determined may be natural light suchas the sun or moon or artificial sourcessuch as light bulbs or gas lamps. Thisand the indented subclasses provide foractinometers, per se, but actinometers

with camera structure are provided forelsewhere.

SEE OR SEARCH THIS CLASS, SUB-CLASS:43, for optical pyrometers where the

intensity of emitted light is correlatedto temperature of the substance emit-ting the light.

51, for measuring the intensity of invisi-ble radiation involving only opticalprinciples and no significant invisibleradiation structure. See also (1) Note.

432+, for measuring the intensity of the lighttransmitted through substances.

445+, for measuring the intensity of thereflected light from substances.


for methods and apparatus includingelectric signalling devices to detect ormeasure invisible radiant energy andsubclasses 472.1+ for methods ofnonelectric detection of radiantenergy and invisible radiant energyresponsive nonelectric signallingdevices.

324, Electricity: Measuring and Testing, subclasses 403+ for measuring andtesting the electrical operating charac-teristics of electric lamps with orwithout optical measuring or testing.

342, Communications: Directive RadioWave Systems and Devices (e.g.,Radar, Radio Navigation), subclasses417+ for direction finding radioreceivers which detect the intensityand direction of beams of electromag-netic radiation.

374, Thermal Measuring and Testing, sub-class 32 for thermal measurement ofthe power or energy emitted from aradiation emissive source; and sub-classes 121+ for radiation type ther-mometers.

396, Photography, subclasses 213+ for act-inometers combined with cameras.See (1) Note above.

214 Pupillary:This subclass is indented under subclass 213.Subject matter wherein the light to be mea-sured falls on the pupil of an observer to con-


1February 2011

trol the size of the pupil as by contraction ordilation of the iris, together with means to per-mit the observer to see his pupil and to com-pare or measure the size or tangent of the pupilas the light to be measured falls thereon.

SEE OR SEARCH THIS CLASS, SUB-CLASS:372+, for structure to measure articles for

some type of dimensional size.

SEE OR SEARCH CLASS:33, Geometrical Instruments, for devices

which visually measure by means ofscales or standards or markings a lin-ear dimensional size.

351, Optics: Eye Examining, Vision Test-ing and Correcting, subclasses 205+for objective eye testing instruments.

215 Integrating:This subclass is indented under subclass 213.Subject matter including structure for deter-mining the quantity of light as by integratingthe intensity of the light against time.

SEE OR SEARCH THIS CLASS, SUB-CLASS:236, for integrating spheres.

216 Heat absorbing (e.g., radiometers):This subclass is indented under subclass 213.Subject matter including a movable mechanicalelement having areas or volumes of differentheat absorbing characteristic, the elementbeing moved by the infringing radiation pro-ducing a temperature differential in the respec-tive areas or volumes, as by the gas adjacentthe warmer area or volume producing greaterpressure thereon.


for invisible radiation responsive non-electric signalling devices.

340, Communications: Electrical, sub-classes 189+ where this phenomenonis used to transmit signals such asmessages; subclasses 540+ to noteconditions other than measurement ofthe intensity of light, particularly sub-class 592.

374, Thermal Measuring and Testing, sub-classes 121+ for radiometer typedevices for measuring the temperatureof hot bodies by measuring the heatradiation therefrom.

217 Modulating (e.g., flicker beam):This subclass is indented under subclass 213.Subject matter including structure for modify-ing the intensity or frequency of the input lightor electric current responsive to the light, as byinterrupting the current or chopping the light.

SEE OR SEARCH THIS CLASS, SUB-CLASS:23, for stroboscopes.48, for incandescent standard type optical

pyrometers which use modulatedlight.

126, for lens or reflective image testingdevices which use light modulators infocal length measurements.

151, for angle sides or axes alignmenttransverse to an optical axis typedevice which utilizes light modula-tors.

319+, for plural beam spectrophotometerswhich interrupt the light mechani-cally, electrically, or electro-optically.

322, for flicker beam absorption spectro-photometers.

323+, for modulation type spectrophotometers.

387, for width or diameter of threads orweb type measuring devices with lightmodulators.

418, for light modulating type colorime-ters.

447, for light reflection from materialwhich involves light modulation.

SEE OR SEARCH CLASS:332, Modulators, for electrical current

modulators.359, Optical: Systems and Elements, sub-

classes 227+ for light controlled by anopaque element or medium movablein or through the light path.

218 Photoelectric:This subclass is indented under subclass 213. Subject matter including a light responsivedevice which may be photo-resistive or photo-voltaic together with an electrical meter or


February 2011

other electrical indicating device electricallycoupled to the light responsive device to indi-cate quantitatively the change produced bylight infringing on the light responsive device.

(1) Note. This subclass provides for thecombination of the photocell, electricalcoupling between the photocell andmeter, and the meter. Class 250, RadiantEnergy, subclasses 206+ provides forphotocells and their controlled circuits,and subclasses 216+ for photocellstogether with optical systems. Class324, Electricity: Measuring and Testing,especially subclasses 92 through 157provides for galvanometer type meterswith or without associated circuitry.Class 340, Communications: Electrical,subclass 600 provides for radiant energyindicators of the presence or absencetype as opposed to the quantitative val-ues furnished by the patents in this sub-class 218. Class 116, Signals andIndicators, subclasses 284+ provides forrotary indicators generally, and sub-classes 327+ for pointers and indicatorarms.

SEE OR SEARCH THIS CLASS, SUB-CLASS:52+, for photoelectric egg candlers.124+, for optical element or device testing

of the photoelectric type.139.01+,for devices measuring the angle with

respect to a remote point having spec-ified applications with photodetec-tion.

141.1+, for devices measuring the apex of anangle at a photodetection station withrespect to a remote point.

152.1+, for devices measuring the apex of anangle at a point remote from a photo-detection station.

237.1+, for photoelectric flaw detection.364+, for polarization testing devices of the

photosensitive type.402+, for colorimeters of the photoelectric

type.432+, for photoelectric devices testing light

transmission through substances.445+, for photoelectric devices testing light

reflection from surfaces.625, for photoelectric mensuration or con-

figuration comparison devices.

SEE OR SEARCH CLASS:116, Signals and Indicators, see (1) Note

above.136, Batteries: Thermoelectric and Photo-

electric, subclasses 243+ for photo-electric type primary batteries.

250, Radiant Energy, see (1) Note above.313, Electric Lamp and Discharge Devices,

subclasses 94+ for photosensitivedevices, and subclasses 103+ for pho-tosensitive devices having secondaryemitters.

324, Electricity: Measuring and Testing, subclasses 96+ for photometers todetermine electric quantities. See (1)Note above.

340, Communications: Electrical, see (1)Note above.

219 Simultaneous sighting and reading measure-ment:This subclass is indented under subclass 218.Subject matter wherein there is structure toprovide a field of view toward the area whoselight intensity is to be determined and whereinthe indications of the meter are presented inthis field of view, to permit simultaneous sight-ing of the view and reading of the meter.

(1) Note. The photometers classified hereare essentially view finders with themeter scale and indicator in the opticalpath of the view finder.

SEE OR SEARCH CLASS:396, Photography, subclasses 213+ for act-

inometers which include viewfinders,and subclasses 373+ for viewfinders.

220 Multiple housings:This subclass is indented under subclass 218.Subject matter wherein the detector and themeter or indicator are placed in separate hous-ings.

(1) Note. The housings may be mechani-cally or electrically connected as by ahinge or separable electrical connectorrespectively.


1February 2011

221 Responsive to incident or back lighting:This subclass is indented under subclass 218.Subject matter wherein optical structure isassociated with the light responsive device tocollect light coming from a direction other thanthat reflected from the viewed object.

(1) Note. The optical structure is usuallyeither a hemispherical light diffusingmember or a reflector.

SEE OR SEARCH THIS CLASS, SUB-CLASS:225+, for photocell type photometers with

light modifiers.


photocell circuits with pre-photocellor optical devices.

222 Plural detectors:This subclass is indented under subclass 218.Subject matter including a plurality of lightresponsive devices.

(1) Note. The detectors may be simulta-neously or selectively operable.

SEE OR SEARCH THIS CLASS, SUB-CLASS:221, for photometers having plural detec-

tors responsive to incident or diffusedback lighting.


for photocell circuits which includeplural photocells, and subclass 578 foroptical or pre-photocell systems withplural photosensitive elements.

223 Logarithmic:This subclass is indented under subclass 218.Subject matter wherein the readings of themeter or indicator bear a logarithmic relation tothe variations of the light sensed by the lightresponsive device.

(1) Note. The logarithmic relationship maybe obtained by a logarithmic amplifica-tion or attenuation of the electrical cou-pling between the detector and indicator,

or by a logarithmic variation in the mag-netic circuit of the galvanometer indica-tor.

SEE OR SEARCH THIS CLASS, SUB-CLASS:224, for multi-sensitivity range photome-

ters.

224 Multisensitivity range:This subclass is indented under subclass 218.Subject matter including an optical elementwhich is adjustable or removable to selectivelyvary the light transmission to the light respon-sive device or including an adjustable resis-tance in the electrical coupling between thedevice and the meter or indicator to absorb aportion of the energy otherwise passing to themeter or indicating device to provide selectivesensitivity and thus a plurality of operatingmeter or indicator ranges.

SEE OR SEARCH THIS CLASS, SUB-CLASS:226, for electrical circuitry coupling the

detector and indicator.228, for photoelectric type photometers

with movable scales.

SEE OR SEARCH CLASS:324, Electricity: Measuring and Testing,

subclass 115 for electrical meters withplural ranges.

225 With predetector light modifier (e.g., dia-phragm):This subclass is indented under subclass 218.Subject matter including an optical elementsuch as a lens, shutter, diaphragm, or mirror inthe light path to the light responsive device tomodify the light coming to the device.

SEE OR SEARCH THIS CLASS, SUB-CLASS:221, for photoelectric type detectors with

optical structure rendering the detec-tors responsive to incident or backlighting.

224, for multi-range photometers whosesensitivity is controlled by an adjust-able optical element in the detectorlight path.

233, for visual type photometers with vari-able light apertures.


February 2011

432+, for testing the light transmission prop-erties of materials.


photocells with pre-photocell opticalelements.

359, Optical: Systems and Elements, sub-classes 227+ for light control byopaque elements movable in a lightpath, subclasses 483.01 through494.01 for light polarization devices,subclasses 558+ for light diffractionelements, subclass 615 for light dis-persion elements, subclasses 642+ forlenses, subclass 831 for light reflec-tors, subclasses 885+ for light filters,and subclasses 894+ for optical aper-tures and tubes.

385, Optical Waveguides, appropriate sub-classes for fiber optics, per se.

226 Detector and indicator electrical coupling(e.g., amplifying or attenuating):This subclass is indented under subclass 218.Subject matter including some details of theelectrical coupling or connection between thelight responsive device and the meter or indi-cating device.

(1) Note. Examples of such coupling orconnection are amplifiers, attenuators,and electrical connectors.

SEE OR SEARCH CLASS:340, Communications: Electrical, sub-

class 600 for electrical signalling sys-tems, generally, which are responsiveto light, such as vision tones to aid theblind.

227 With particular indicator:This subclass is indented under subclass 218.Subject matter including significant indicatingdevice structure such as scales and pointers orsuch indicating structure bearing a particularstructural relationship with the light responsivedevice.

(1) Note. The patents here are often directedto placing the light responsive deviceand the meter or indicator in particularrelated positions in the housing as to pro-vide a compact arrangement.

SEE OR SEARCH CLASS:116, Signals and Indicators, subclasses

200+, for indicators generally, andespecially subclasses 284+ for rotaryindicators and subclasses 327+ forpointers and indicator arms.

235, Registers, subclass 64.7 for photo-graphic calculators.

324, Electricity: Measuring and Testing, subclasses 76.11+ for galvanometertype meters, and especially subclasses151+ for such meters with permanentmagnets.

228 Movable scale (e.g., calibrating):This subclass is indented under subclass 227.Subject matter wherein a scale of the meter orindicating device is movable or adjustable asfor calculating purposes.

SEE OR SEARCH CLASS:235, Registers, subclass 64.7 for photo-

graphic calculators.

229 Comparison:This subclass is indented under subclass 213.Subject matter including two optical paths,there being an optical element having knownlight absorbing properties in one of the paths orthere being a light source in one of the opticalpaths having a known illumination characteris-tic (which may be dependent on the position ofthe light source), together with structure tofacilitate comparison of the light in the twopaths.

SEE OR SEARCH THIS CLASS, SUB-CLASS:222, for photocell type photometers with

plural photodetectors involving com-parison.

402+, for comparison type colorimeters.

230 With light standard:This subclass is indented under subclass 229.Subject matter including a source of lightwhich constitutes a standard (known intensity)with which the light whose intensity is to bedetermined is compared.


1February 2011

SEE OR SEARCH THIS CLASS, SUB-CLASS:46, for variable light standards whether

the standard is used for temperature orlight intensity tests.

243, for optical testing standards generally.

SEE OR SEARCH CLASS:324, Electricity: Measuring and Testing,

subclasses 403+ for lamp testing aswhere the efficiency of the electricalto light conversion of the lamp isdetermined. However, this Class 356provides for the mere measurement ofthe radiation intensity from the lamp.

231 Variable incandescent standard:This subclass is indented under subclass 230.Subject matter wherein the light standard is ofthe incandescent type and wherein the incan-descence may be varied as by a variable resis-tance in series with the power supply to thefilaments of the incandescent lamp.

(1) Note. In this subclass the lamp is usuallyadjusted to proper incandescence and thelight intensity determined from a scalereading of the variable resistance.

SEE OR SEARCH THIS CLASS, SUB-CLASS:46+, for an optical pyrometer with an elec-

trically variable incandescent stan-dard.

232 Standard movable:This subclass is indented under subclass 230.Subject matter wherein the light standard ismovable with reference to the comparisonstructure which includes a comparison partitionor screen, or with reference to the sample tomodify the intensity of the effective illumina-tion from the light standard.

(1) Note. A scale is usually associated withthe movable light standard to provide ameasure of the illumination.

233 With variable light aperture size:This subclass is indented under subclass 213.Subject matter including an aperture in theoptical path whose aperture size may be con-trolled to vary the illumination passing there-

through from a location whose light intensity isto be determined or including a plurality ofapertures of different sizes one of which maybe selected to pass a predetermined quantity oflight, the purpose in both cases being to reducethe visible illumination to render the viewedobject or indicia markings barely visible.

(1) Note. The subject matter classified heremay include scales for indicating theillumination intensity for general illumi-nation purposes or for photographic pur-poses. The photometers classified hereare of the visual type in the sense that theeye itself is the detector.

SEE OR SEARCH THIS CLASS, SUB-CLASS:43+, for optical pyrometers of the visual

type.

SEE OR SEARCH CLASS:235, Registers, subclass 64.7 for photo-

graphic calculators.352, Optics: Motion Pictures, subclass

139 for visual photometers combinedwith motion picture cameras.

396, Photography, subclasses 213+ forvisual photometers combined withcameras.

234 Light absorbing:This subclass is indented under subclass 213.Subject matter including an optical light atten-uating member or members in the optical pathwhich is illuminated from a location whoselight intensity is to be determined, the mem-bers being adjustable or selectively placed inthe optical path to control the illuminationreaching the eye, the purpose being in bothcases to reduce the visible illumination to ren-der the viewed object or indicia markingsbarely visible.

(1) Note. See also (1) Note and the SearchNotes under subclass 233 above.


class 888 for neutral density filters,subclass 889 for filters movable in orout of the optical path, subclass 890for filters superposed in series, and


February 2011

subclass 891 for filters in optical par-allel.

235 Absorber continuously variable (e.g.,wedge):This subclass is indented under subclass 234.Subject matter wherein the optical light attenu-ating member has a variable light attenuatingcharacteristic in a physical direction along themember to permit variation in the light passingthrough the member by movement of the mem-ber through the optical path.


class 888 for optical wedges.

236 Integrating spheres:This subclass is indented under subclass 213.Subject matter including a hollow body ofspherical interior and having an interior surfaceof highly reflecting and also diffusing materialand having relatively small openings in theshell of the body to admit light for the purposeof raising the interior illumination to a levelwhich depends only upon the amount of lightentering the openings and not upon the reflec-tion or diffusion of the incident light flux.

SEE OR SEARCH THIS CLASS, SUB-CLASS:215, for photometers which integrate the

light intensity in general and usuallywith respect to time.

432+, for transmission testing devices whichmay include integrating spheres.

445+, for reflection testing which mayinclude integrating spheres.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 228 for inte-

grating spheres with photocells.324, Electricity: Measuring and Testing,

subclasses 403+ for electric lamp test-ing including the electric operatingcharacteristics and which may includean integrating sphere.

237.1 INSPECTION OF FLAWS OR IMPURI-TIES:This subclass is indented under the class defini-tion. Subject matter wherein the presence ofan imperfection, or foreign substance is deter-

mined using light reflected from or passingthrough a viewed specimen.

(1) Note. Art residing in this subclass mayinclude nominally claimed conveyors tosupport and transport the specimen beinginspected. For details to a conveyor, seeSEARCH CLASS below.

(2) Note. This subclass provides for theinspection of flaws, imperfections, andimpurities having a human perceivableoutput. See SEARCH CLASS below.

(3) Note. This subclass provides for theinspection of flaws, imperfections, andimpurities. See SEARCH CLASS below.

SEE OR SEARCH THIS CLASS, SUB-CLASS:426+, for flaw or imperfection inspection

with agitation or rotation of theinspected material.

432+, for determining the light transmissionproperties of materials.

445+, for determining the specular and dif-fuse light reflecting properties ofmaterials.

SEE OR SEARCH CLASS:198, Conveyors: Power-Driven, for power

conveyors, per se, used in the trans-portation of material or articles pastand beyond an optical test point of thevisual or photosensitive type.

209, Classifying, Separating, and Assort-ing Solids, subclasses 702+ which forthe visual inspection of material orarticles with structure to facilitate aphysical separation of the articles ormaterials based upon physical differ-ences of appearance.

250, Radiant Energy, particularly sub-classes 200+ provide for photocellsand associated circuitry with opticalstructure which may include measur-ing and testing and subclasses559.01+ for a photocell responsive tolight from a material having a cross-sectional dimension which is smallcompared to length, and through addi-tional structure (i.e., a circuit) pro-duces an electrical or mechanicaloutput indicative of some characteris-


1February 2011

tic of the material. See also (2) Noteabove.

324, Electricity: Measuring and Testing, subclasses 216+ for flaw testinginvolving magnetization, as withmagnetized iron filings where thearrangement of the filings is viewedoptically.

353, Optics: Image Projectors, for appro-priate subclass for the projection of animage for viewing.

359, Optical: Systems and Elements, forsubject matter for the general viewingof an object subclasses 385+ formicroscopes with viewed object illu-mination, and 798+ for lenses withviewed object or viewed field illumi-nation. See (3) Note above.

362, Illumination, subclasses 138+ forinspection lamps.

414, Material or Article Handling, sub-classes 134+ for manually controlledselective delivery systems whichinvolve visual inspection of articles orsheet type material.

237.2 Surface condition:This subclass is indented under subclass 237.1.Inspection of imperfections or impuritieswherein the exterior or interior veneer of anarticle is examined.

SEE OR SEARCH THIS CLASS, SUB-CLASS:239.7, for the inspection of the surface con-

dition of a transparent or translucentspecimen.

243.4, for surface condition standards.


for circuitry responsive to a photocell,and wherein the photocell is arrangedrelative to the material so that the cir-cuit provides an output indicating thepresence or absence of the material orsome indicia on the material in somepredefined location.

237.3 Detection of object or particle on surface:This subclass is indented under subclass 237.2.Inspection of surface condition wherein an arti-cle is examined for the existence of a contami-nant residing on the veneer of the article.

SEE OR SEARCH THIS CLASS, SUB-CLASS:238.3, for the detection of foreign particles

on or within a textile product.239.5, for the detection of an object or parti-

cle in or on a transparent container.239.8, for the detection of a foreign particle

or object on the surface of a transpar-ent article.

243.6, for a foreign object standard.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 559.41 for a

photocell with associated circuitrycapable of identifying the presence ofa foreign substance on or embedded ina material from variations in adetected light signal.

237.4 On patterned or topographical surface (e.g.,wafer, mask, circuit board):This subclass is indented under subclass 237.3.Detection of an object or particle wherein theinspected article further includes a motif orraised three dimensional configuration.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.5, for the inspection of a topographical

surface.243.7, for a standard for a surface further

comprising texture.


photocell having a circuit producingan output indicating the presence orabsence of a marking, pattern, or indi-cia on the surface of the material.

237.5 On patterned or topographical surface (e.g.,wafer, mask, circuit board):This subclass is indented under subclass 237.2.Inspection of surface condition wherein theinspected article further includes a motif orraised three dimensional configuration.

SEE OR SEARCH THIS CLASS, SUB-CLASS:243.7, for a standard for a surface further

comprising texture.


February 2011



237.6 Having predetermined light transmissionregions (e.g., holes, aperture, multiple mate-rial articles):This subclass is indented under subclass 237.1.Inspection of surface condition wherein theinspected article further comprises a designfeature, characteristic, or area permitting thetransmission of light.

SEE OR SEARCH THIS CLASS, SUB-CLASS:241.1, for the inspection of the interior of a

hole or passage.

238.1 Textile inspection:This subclass is indented under subclass 237.1.Inspection of imperfections or impuritieswherein the specimen being viewed is a fiberor yarn for weaving or knitting into fabric or awoven or knitted fabric.

(1) Note. This class provides for subjectmatter with detailed optical structure ofthe inspection of a textile specimen. SeeSEARCH CLASS below.

SEE OR SEARCH THIS CLASS, SUB-CLASS:243.1, for thread counters. 432+, for measuring the light transmission

or absorption of material.

SEE OR SEARCH CLASS:26, Textiles: Cloth Finishing, for the

nominal recitation of a device or pro-cess of cloth examination or inspec-tion. subclass 70 for inspection andexamination of cloth.

73, Measuring and Testing, subclass 159for fabric testing other than mereinspection or visual examination.

223, Apparel Apparatus, subclass 39 formovable supports for garments com-bined with illumination to facilitatethe visual inspection of the supportedgarment.

238.2 Elongated textile product (e.g., thread, yarn,etc.):This subclass is indented under subclass 238.1.Textile inspection wherein the specimen beingexamined is fibrous.

238.3 Detection of foreign material (e.g., trash,splinters, contaminants, etc.):This subclass is indented under subclass 238.1.Textile inspection designed specifically todetect the presence or absence of an uncharac-teristic substance on or within the specimen.

(2) Note. This subclass provides generallyfor detection of localized foreign parti-cles or dirt.

SEE OR SEARCH THIS CLASS, SUB-CLASS:239.5, for the detection of an object on or in

a transparent or translucent container.239.8, for the detection of foreign matter on

the surface of a transparent or translu-cent article

432+, for the testing of materials where theparticles are uniformly distributedthrough the material.



239.1 Transparent or translucent material:This subclass is indented under subclass 237.1.Inspection of imperfections or impuritieswherein the material being inspected allows thetransmittance of light.

(1) Note. For classification here the lightmust pass completely through the mate-rial and be viewed on the issuing side.Mere internal reflecting within the mate-rial is not sufficient for classificationhere.

SEE OR SEARCH THIS CLASS, SUB-CLASS:73.1, for the optical inspection of an optical

fiber or waveguide.


1February 2011

432+, for measuring light transmissionthrough a material.

SEE OR SEARCH CLASS:108, Horizontally Supported Planar Sur-

faces, subclass 23, for illuminatedviewing tables.

239.2 Optical element (e.g., contact lens, prism, fil-ter, lens, etc.):This subclass is indented under subclass 239.1.Inspection of transparent or translucent mate-rial specifically designed to manipulate or alterlight to achieve a particular result.

SEE OR SEARCH CLASS:359, Optical: Systems and Elements,

appropriate subclass for an opticalelement or system per se.

239.3 Patterned surface:This subclass is indented under subclass 239.1.Inspection of transparent or translucent mate-rial further comprising an applied design orthree dimensional configuration.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.4, for the detection of a foreign particle

or object on a patterned surface.237.5, for the inspection of a patterned sur-

face.



239.4 Containers (e.g., bottles):This subclass is indented under subclass 239.1.Inspection of transparent or translucent mate-rial wherein the inspected object is a recepta-cle.

(1) Note. The most common subject matterhere is bottle testing devices.

SEE OR SEARCH THIS CLASS, SUB-CLASS:239.6, for examination of container contents.240.1, for the inspection of an opaque con-

tainer.

239.5 Detection of foreign matter on or in con-tainer:This subclass is indented under subclass 239.4.Transparent or translucent container furthercomprising a means for sensing undesired mat-ter contained in or residing on the examinedarticle.

SEE OR SEARCH THIS CLASS, SUB-CLASS:240.1, for the inspection of an opaque con-

tainer.



239.6 Of container contents:This subclass is indented under subclass 239.4.Inspection of transparent or translucent con-tainer wherein the specimen being detected orexamined is an article or substance confinedwithin the transparent or translucent container.

239.7 Surface condition:This subclass is indented under subclass 239.1.Inspection of transparent or translucent mate-rial wherein the specimen being detected is anexterior or an interior veneer of the container.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.2, for the inspection of a surface condi-

tion.243.4, for a surface condition standard.


for circuitry responsive to a photocell,and wherein the photocell is arrangedrelative to the material so that the cir-cuit provides an output indicating thepresence or absence of the material orsome indicia on the material in somepredefined location.


February 2011

239.8 Detection of an object or particle on surface:This subclass is indented under subclass 239.7.Inspection of surface condition wherein thespecimen being detected is a contaminantresiding on the veneer of the article.

SEE OR SEARCH THIS CLASS, SUB-CLASS:238.3, for the detection of foreign matter on

or within a textile product.239.5, for the detection of an object on or in

a transparent or translucent container.



240.1 Containers or enclosures (e.g., packages,cans, etc.):This subclass is indented under subclass 237.1.Inspection of imperfections or impuritieswherein the specimen is an opaque receptaclefor holding or carrying materials.

SEE OR SEARCH THIS CLASS, SUB-CLASS:239.4, for the inspection of a transparent or

translucent container.239.6, for the inspection of the contents of a

transparent or translucent container.

241.1 Bore inspection (e.g., borescopes, intrascope,etc.)This subclass is indented under subclass 237.1.Inspection of imperfections or impuritieswherein the specimen is a hole, passage, orgenerally tube-like structure having a proximalend and a distal end, wherein light is directedto the distal end providing a view of the inte-rior of the specimen from the distal or proximalend.

SEE OR SEARCH THIS CLASS, SUB-CLASS:138+, for optical alignment devices for

checking the correlation of the bore ofa gun with its sighting means.

154, for optical testing devices for check-ing the straightness of a bore.


152.01+ for a process or apparatus fordetermining a physical characteristicof a borehole, a casing, or a drill rig-ging.

250, Radiant Energy, subclasses 358.1+for instruments which include nonvis-ible radiation sources and filters forchecking cracked interior surfaces inbores by means of phosphorescent orfluorescent substances.

324, Electricity: Measuring and Testing, subclass 220 for borescopes used inthe testing of ferrous metal pipe whichadditionally includes means to dis-pense iron filings and magnetic meansto magnetize the pipe so that the ironpipe filings will adhere magneticallyto the pipe in a pattern conforming tothe condition of the pipe.

359, Optical: Systems and Elements, sub-classes 362+ for borescopes whichinclude compound lens systems in theclaims.

600, Surgery, subclasses 101+ and 184+for endoscopes inserted into a naturalor surgically constructed body orificefor viewing or treating functional dis-orders of the body with or without aself-contained illuminating means.

241.2 Firearm bore inspection:This subclass is indented under subclass 241.1.Bore inspection wherein the inspected bore isthat of a firearm.

SEE OR SEARCH THIS CLASS, SUB-CLASS:138+, for optical alignment devices for

checking the correlation of the bore ofa gun with its sighting means.

SEE OR SEARCH CLASS:42, Firearms, appropriate subclass for

firearms.

241.3 With adjustable head:This subclass is indented under subclass 241.1.Bore inspection wherein the borescope head ismovable.


1February 2011

241.4 Flexible:This subclass is indented under subclass 241.1.Bore inspection wherein the borescope is con-structed to possess pliable or elastic qualities.

SEE OR SEARCH THIS CLASS, SUB-CLASS:241.3, for a borescope having an adjustable

head.

241.5 Specific construction of distal end:This subclass is indented under subclass 241.1.Bore inspection wherein the bore scope hasdetailed structure at the tip of its insertable por-tion.

241.6 Having guiding means:This subclass is indented under subclass 241.1.Bore inspection further comprising a means tonavigate, pilot, or route the inspection meanswithin the cavity, bore or hole.

242.1 THREAD COUNTING:This subclass is indented under the class defini-tion. Subject matter for determining the num-ber of elements, cords, or strands in a fabric orweb article.

SEE OR SEARCH THIS CLASS, SUB-CLASS:23+, for stroboscopes utilized to monitor

moving webs or threads. 237.1+, for cloth inspection for flaws. 247+, for fiducial instruments which

involves reticles with significant opti-cal structure.

395, for the measurement of lengths bymeans of “moire” patterns.

429, for the monitoring of webs or threadsfor optical properties or flaws.

450, for testing apparatus involving lightinterference effects generally includ-ing diffraction patterns.


297+, for a reticle for a sight lineinstrument having no significant opti-cal feature.

377, Electrical Pulse Counters, PulseDividers, or Shift Registers: Circuitsand Systems, subclass 10, for numeri-cal counting of individual objects oneby one.

243.1 STANDARD:This subclass is indented under the class defini-tion. Subject matter wherein the testing pro-cess results form a basis for optical comparisonwith a specimen, article, or portions thereofunder test.

SEE OR SEARCH THIS CLASS, SUB-CLASS:46, for electrical lamp circuits which uti-

lize the lamp as a standard for pho-tometry or for optical pyrometrymeasurements.

421+, for color charts.


photocell and associated circuitry forevaluating a material comparing thecircuit output to a reference or storedvalue.

243.2 For liquid suspended particles:This subclass is indented under subclass 243.1.Standard wherein the specimen is a nonhomogenous mixture of an analyzed compo-nent in a dispersion medium.

SEE OR SEARCH CLASS:73, Measuring and Testing, for a process

or apparatus for detecting or deter-mining the composition of, a constitu-ent of, or a property of a liquid or aliquid suspension of a solid.

243.3 Flying height testers:This subclass is indented under subclass 243.1.Standard wherein a gap formed by a read/writehead and a record carrier element is opticallycompared to a basis.

243.4 Surface standard:This subclass is indented under subclass 243.1.Standard wherein an exterior or interior veneerof an article or specimen is optically comparedto a basis.


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243.5 Color:This subclass is indented under subclass 243.4.Surface standard further comprising the opticalcomparison of a hue, pigment, or tint of thearticle veneer.

243.6 Foreign object:This subclass is indented under subclass 243.4.Surface standard further comprising the opticalcomparison for the existence of a contaminantresiding on the veneer of the article with abasis.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.3, for the detection of a foreign object on

the surface of an article.238.3, for the detection of foreign particles

on or within a textile product.239.5, for the detection of an object or parti-

cle in or on a transparent container.239.8, for the detection of a foreign particle

or object on the surface of a transpar-ent article.

243.7 Texture:This subclass is indented under subclass 243.4.Surface standard further comprising the opticalcomparison of the three dimensional character-istics or features of the article veneer with abasis.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.5, for topographical surface flaw inspec-

tion.

243.8 Light intensity:This subclass is indented under subclass 243.4.Surface standard further comprising the com-parison of a light intensity measurement with abasis.

244 This subclass is indented under the class defini-tion. Subject matter including holding struc-ture for maintaining the article or material(solid, liquid, or gas) to be inspected, measuredor tested in the desired inspection, measuringor testing position; or for maintaining the stan-dard in the desired position.

(1) Note. This subclass includes means tosupport the holding structure when not

otherwise classifiable. Usually the hold-ing structure is shaped or otherwiseadapted to permit passage of the testinglight rays.

SEE OR SEARCH THIS CLASS, SUB-CLASS:311+, for sample holders which include

heating or burner structure for spec-troscopic analysis of the sample.

421, for color charts or standards.


501+ for geometrical gauges.108, Horizontally Supported Planar Sur-

faces, subclasses 59+ for pluralrelated horizontal support surfacesgenerally.

204, Chemistry: Electrical and WaveEnergy, subclasses 600+ for electro-phoretic or electro-osmotic appara-tus, including the combination of suchapparatus with optical measuring ortesting means.

211, Supports: Racks, subclasses 13.1+for special article supports usually ofthe framework type.

248, Supports, subclasses 127+ and 200+for stands and brackets respectively.

250, Radiant Energy, subclasses 453.11+for article or object supports for rayenergy generally.

269, Work Holders, for holders for sup-porting work during a treating opera-tion.

359, Optical: Systems and Elements, sub-classes 396+ for transparent micro-scope slides.

245 Cotton graders:This subclass is indented under subclass 244.Subject matter including a plurality of recepta-cles arranged in a unit for holding cotton stan-dards, together with structure for facilitatingthe comparison of a selected standard with acotton sample.

246 Fluid containers (e.g., cells or cuvettes):This subclass is indented under subclass 244.Subject matter wherein the holder has sidewalls for restraining the fluid to be tested.


1February 2011

(1) Note. The holder may be completelyenclosed as to contain gaseous fluids.The holder may be of the flow-throughtype as by having an input and outputorifice.

SEE OR SEARCH THIS CLASS, SUB-CLASS:239.6+, for detection or examination of a

specimen in a transparent or translu-cent container.

427, for the inspection of container con-tents in motion.

441+, for liquid particle suspension testing,such as turbidity.


61.41+ for strip cups.206, Special Receptacle or Package,

appropriate subclasses for receptaclesof general use which are not restrictedto use in optical testing of materials.

250, Radiant Energy, subclasses 428+ forfluent material containers, supports ortransfer means for subjecting thematerial to radiation.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 547 for labora-tory fluid containers and 561 for aholder for a sample or specimen con-tainer.

247 FIDUCIAL INSTRUMENTS:This subclass is indented under the class defini-tion. Subject matter wherein an optical instru-ment establishes an optical axis whereby anobserver may precisely orient the opticalinstrument relative to some remote pointtoward which the optical axis is directed, orand usually whereby the observer may orientsome device such as a gun to which the opticalinstrument is attached.

(1) Note. Where a reticle is recited in con-junction with a compound optical systemclassification is generally in Class 359,Optical: Systems and Elements, sub-class 428. However, where the reticle orreticle image is adjustable for the pur-pose of changing the observer’s line ofsight relative to the central optical axis

of the instrument, classification will bein this class.


227+, for similar subject matter whereno significant optical structure isclaimed.

248 Artificial reference:This subclass is indented under subclass 247.Subject matter including, for the purpose ofestablishing a stabilized optical axis, meanswhich tends to maintain its orientation in spaceirrespective of changes in the orientation of thesupporting structure for this means.

SEE OR SEARCH THIS CLASS, SUB-CLASS:143, for similar subject matter used in

angle measuring means where a scaleand target are simultaneously observ-able.

148, for similar subject matter used inangle measuring means.

249 Liquid surface (e.g., bubble level):This subclass is indented under subclass 248.Subject matter where the artificial reference isdetermined by the surface of a fluid.

250 Pendular suspension of optical element orreticle:This subclass is indented under subclass 248.Subject matter where the artificial reference isdetermined by a pendulously suspended opticalelement or a reticle.

251 Reticle lies outside viewing path:This subclass is indented under subclass 247.Subject matter where the lines of sight from thetarget and from a reticle converge and are opti-cally combined.

252 Reticle image transversely adjustable rela-tive to optical axis:This subclass is indented under subclass 251.Subject matter wherein a reticle or an opticalelement is movable in order that the image ofthe reticle may be adjusted transversely to theprincipal optical axis of the instrument.


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SEE OR SEARCH THIS CLASS, SUB-CLASS:29, for similar subject matter where the

reticle or optical element is controlledin response to the relative velocity ofthe observer and a remotely sightedpoint.

253 Deflection of line of sight:This subclass is indented under subclass 247.Subject matter where the line of sight isdeflected.

254 Two or more deflections:This subclass is indented under subclass 253.Subject matter where there are two or moredeflections of the line of sight.


classes 402+ for periscopes includinga compound optical system, and sub-classes 857+ for systems for viewinga remote object by means of pluralreflections.

255 By reflection:This subclass is indented under subclass 253.Subject matter where the line of sight isdeflected by reflection.


classes 838+ for reflectors in general.

256 MISCELLANEOUS:This subclass is indented under the class defini-tion. Subject matter which is not provided forin any of the preceding subclasses of this class.

SEE OR SEARCH CLASS:351, Optics: Eye Examining, Vision Test-

ing and Correcting, subclasses 200+for examining and testing apparatusinvolving optical testing apparatusspecifically designed for eye exami-nation.

352, Optics: Motion Pictures, subclass244 for miscellaneous apparatus deal-ing with the taking and projection ofmotion pictures.

359, Optical: Systems and Elements, sub-class 896 for miscellaneous opticalsystems and elements not provided forelsewhere.

300 BY DISPERSED LIGHT SPECTROS-COPY:This subclass is indented under the class defini-tion. Subject matter for the examination of adispersed beam of light or selected portionsthereof as by a prism or diffraction gratingfrom a narrow beam of light as from a slit, orfor utilizing a portion of a dispersed beam,such as from a monochromator, for examina-tion of substances by transmitting light throughor reflecting light from the substances or forthe examination of the dispersed beam from astimulated light emissive sample.

(1) Note. Included in this subclass are spec-troscopes.

(2) Note. The line between Class 250, Radi-ant Energy, and the spectroscopic exami-nation found in this class is: Claims to aspectroscopic arrangement whichinclude only the examination of visibleradiation will be found in subclasses300+; claims to a spectroscopic arrange-ment which include optical limitationswhich are usable in the infrared, ultravi-olet, and visible light range will be foundin subclass 51 in this class providing nosignificant nonvisible radiation or exam-ining structure is involved in the claims;claims to a spectroscopic arrangementincluding a source of invisible radiationsuch as infrared or ultraviolet, or a par-ticular material operative for the pur-poses of the disclosure only in theinvisible radiation range, or a detectorresponsive only to invisible radiationwill be classified in Class 250.

(3) Note. The line between Class 345, Com-puter Graphics Processing and SelectiveVisual Display Systems, and Class 356with respect to spectroscopy and withrespect to the remaining portions ofClass 356 is: where a Class 356 device isclaimed in combination with a recorderof the Class 346 type, Class 356 will takecombinations including a broad opticaltest for Class 356 combined with a broad


1February 2011

Class 346 recorder. However, a nameonly optical test device in combinationwith a specific recorder will be classifiedin Class 346. Any details of the opticaltest device whether patentable or notwith a specific recorder will be classifiedin Class 356.

(4) Note. Diffraction crystals used to dis-perse X radiation when used with thecombination of elements forming a spec-trometer or spectropscope will not beclassified here. See Class 378, X-Ray orGamma Ray Systems or Devices, sub-class 70.

SEE OR SEARCH THIS CLASS, SUB-CLASS:402+, for filter photometers which analyze

the wave length and the intensity ofemitted light or the light of specificwave lengths absorbed by materials asa result of reflective or transmissivetests, where filters rather than dispers-ing mediums are used to isolate vari-ous wave lengths of light.


photocell circuits which do notinvolve the measurement of light orthe testing of material by means ofvisible light; subclasses 336.1+ formethods and apparatus involvingemission or absorption infrared orultraviolet spectrometers.

359, Optical: Systems and Elements, sub-classes 558+ for diffraction gratingsand mounts; subclass 615 for lightdispersion systems which do notinvolve the analysis of the dispersedlight; subclasses 831+ for prisms andmountings for the prisms; subclasses362+ for compound lens systems;subclasses 811+ for lenses and theirsupports; and subclasses 894+ foroptical apertures including slits.

378, X-Ray or Gamma Ray Systems orDevices, subclasses 70+ for X-raydiffraction analysis.

399, Electrophotography, subclasses 9+for diagnostics of electrophotographicdevices, particularly subclasses 31+for image-forming components.

301 With Raman type light scattering:This subclass is indented under subclass 300.Subject matter which includes a directed beamof light, means to support transparent gaseous,liquid, or solid substances for transmission ofthe beam through the substance, and meanstransverse to the direction of the beam fordetecting the light reflected or scattered by themolecules of the substance, and including thedetection of the light caused by change of therotational and vibrational energy of the mole-cules due to the light energy directed throughthe substance.

SEE OR SEARCH THIS CLASS, SUB-CLASS:331+, for visible light monochromators of

the prism and grating type which maybe utilized in this test.

337+, for particle and molecular light scat-tering tests where no Raman spectra isinvolved.


for methods and apparatus which mayinvolve Raman effect and utilizeinfrared or ultraviolet radiation.

302 For spectrographic (i.e., photographic)investigation:This subclass is indented under subclass 300.Subject matter which includes an entrance slit,a dispersing means, an aperture, and a photo-graphic medium associated with the aperturefor recording the dispersed spectrum or por-tions thereof.


infrared or thermal pattern recordingmethods and apparatus; and sub-classes 580+ for methods and appara-tus photographing invisible radiationor materials subjected to invisibleradiation generally.

346, Recorders, subclasses 107.1+ for opti-cal recording of phenomenal informa-tion.

347, Incremental Printing of SymbolicInformation, subclasses 224+ forapparatus and processes using light orbeam to mark the record receiver.


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378, X-Ray or Gamma Ray Systems orDevices, subclass 70 for X-ray dif-fraction analysis.

396, Photography, for photographic cam-eras for exposing photographic film.

430, Radiation Imagery Chemistry: Pro-cess, Composition, or ProductThereof, for process, product, andcomposition used in radiation imag-ery.

303 With spectral analysis:This subclass is indented under subclass 302.Subject matter which includes, additionally, thedevelopment of the spectrograph and the quali-tative and quantitative analysis of the devel-oped spectrograph, as by transmissivephotometric examination.

SEE OR SEARCH THIS CLASS, SUB-CLASS:404, for the analysis for the various colors

of a developed color negative in orderto correct for the exposure variables inthe production of colored prints.

443+, for the analysis of black and whitedeveloped negatives of spectrograms.


photographic infrared detection oranalysis of material; and subclasses580+ for photographic detection ofinvisible radiation or analysis of mate-rial where an examination of a devel-oped spectrogram may be involved.

304 With sectored disc:This subclass is indented under subclass 302.Subject matter which includes a stepped or sec-tored opening therein to provide a light mask-ing structure interposed between the light to beexamined and the entrance slit of the spec-trograph.

(1) Note. The light masking means gener-ally includes means to move the maskingstructure and an aperture configurationwhich is a logarithmic configurationalong the slit from some fixed point.

305 With diffraction grating:This subclass is indented under subclass 302.Subject matter which includes a diffractiongrating as the dispersing element.


classes 566+ for diffraction grating,per se.

306 With internal standard comparison:This subclass is indented under subclass 300.Subject matter which includes means to detectand measure the intensity of a spectral line of asought for element or composition relative to asecond spectral line of the same or a secondelement or composition that is present inknown amounts.

(1) Note. This second component may beadded to the sought for constituent or bepresent as a constituent of the sampletested.

SEE OR SEARCH THIS CLASS, SUB-CLASS:307, for similar subject matter wherein the

intensity of the total emitted radiationis compared against the radiation of aspecific wavelength inherent in thetotal radiation.

307 With background radiation comparison:This subclass is indented under subclass 300.Subject matter which includes means to detectand measure the intensity of at least one spec-tral line present in emitted radiation relative tothe total emitted radiation present.

SEE OR SEARCH THIS CLASS, SUB-CLASS:306, for the comparison involving emitted

radiation of a known spectral lineintensity and wavelength of an ele-ment with the intensity of the spectralline or lines of a tested chemical ele-ment, both the known and unknownelement being present in the sameemitted radiation.


1February 2011

308 With synchronized spectrum repetitivescanning (e.g., cathode-ray readout):This subclass is indented under subclass 300.Subject matter which includes the periodicscanning of a dispersed light beam over theoptical frequency spectrum, detecting thescanned dispersed beam, synchronizing avisual readout with the various wavelengthspresent in the detected dispersed beams, andcorrelating the intensity of the detected readoutwith each wavelength present in the dispersedbeam.

(1) Note. The readout is usually a cathode-ray tube.

(2) Note. The synchronization of the scan-ning of the dispersed beam is with themovement of the dispersing means, theoptical means associated with the dis-persing means, or the electronics of thedetection and readout circuitry.

SEE OR SEARCH THIS CLASS, SUB-CLASS:319, for spectrophotometers which use a

cathode-ray tube readout where norepetitive scanning is involved.


for methods and apparatus having aninvisible radiant energy responsiveelectric signalling device and a cath-ode-ray tube responsive to the device.

315, Electric Lamp and DischargeDevices: Systems, subclasses 1+ forcathode-ray tube circuit, generally,including deflection systems for theelectron beam of the cathode-ray tube.

358, Facsimile and Static Presentation Pro-cessing, subclasses 500 through 540 and 400-304 for facsimile systemswhich utilize a cathode-ray oscillo-graph tube which do not involve aspectrum analysis of light or the lightanalysis of a substance reflectively ortransmissively.

309 Using plural beams:This subclass is indented under subclass 308.Subject matter wherein there are plural beamsof light, and there is means to support a sample

or a substance to be tested in one or morebeams.

SEE OR SEARCH THIS CLASS, SUB-CLASS:319+, for plural beam spectrophotometers

which use a cathode-ray tube readoutwhere no repetitive scanning isinvolved.

310 With aperture mask:This subclass is indented under subclass 300.Subject matter including means for passinglight, usually of a selected group of spectralwavelengths, between the light dispersingmeans and the light detection means.

311 With sample excitation (e.g., burning):This subclass is indented under subclass 300.Subject matter including structure for heating,burning, or otherwise stimulating the sample tocause the emission of radiation for analysis.

(1) Note. For classification here as opposedto subclasses 244+ some portion of theapparatus for heating, burning, or stimu-lating the samples or for analyzing therays emitted by the specimen should beclaimed.

(2) Note. The combination of the heating orcombustion of a sample and the spectro-graphic analysis of the heated sample isin this class (356) rather than in Class 23.

SEE OR SEARCH THIS CLASS, SUB-CLASS:244+, for sample holders for materials to be

excited for spectrographic analysis,which do not include a heating meanssuch as a flame, an arc, or sparkdevice for the heating of the sample.See also (1) Note above.

302, for sample electrical or flame excita-tion when combined with a spectro-graphic recorder.

306, for sample electrical or flame excita-tion which additionally excites a sub-stance whose wavelength andemission intensity at this wavelengthare known.

307, for electrical or flame sample excita-tion which utilized the total emissiveradiation produced as a standard of


February 2011

comparison against the intensity oflight emitted by the sample at certainwavelengths.

308, for electrical or flame excitation ofsamples whose emitted radiation isdetected by a repetitive, electro-opti-cal scanning system.

417, for filter photometers which analyzecertain wavelengths of light emittedas a result of electrical or flame exci-tation of a sample.

312 By electrical resistance heating (e.g., graph-ite tube):This subclass is indented under subclass 311.Subject matter wherein the sample is heated toan excited state by passing an electrical currentthrough the sample cell or support.

SEE OR SEARCH CLASS:219, Electric Heating, subclasses 600+ for

inductive heating, subclasses 678+ formicrowave heating, and subclasses764+ for capacitive dielectric heating;subclasses 65 and 162 for apparatusand methods for the electron beamheating and disintegration of metals;subclasses 50+ for the methods andapparatus for resistive heating of met-als; subclasses 260+ for resistiveigniters of solid material; and sub-classes 271+ for electrical resistiveheater-type vaporizers.

313 By arc or spark:This subclass is indented under subclass 311.Subject matter wherein the heating structureincludes an arc or spark.

(1) Note. Included herein are the subcombi-nations including the electrical arc orspark excitation unit which includes thesupport for the sample to be analyzedeven though optical elements of thespectrophotometer are not claimed.

SEE OR SEARCH CLASS:219, Electric Heating, subclass 69 for the

arc cutting or disintegration of metals;subclasses 121.11+ for the heating ofmetals by electric arc; subclasses271+ for arc-type electric heaters withvaporizers; and subclasses 383+ forarc-type nonmetal heating devices.

313, Electric Lamp and Discharge Devices, subclass 243 for arc-type devices ofthe general usage type; and subclasses326+ for electrode structure not of theconsumable electrode type.

314, Electric Lamp and DischargeDevices: Consumable Electrodes, forstructure to support and feed elec-trodes of the consumable electrodetype, and particularly subclass 60 forconsumable electrodes not of the elec-trical welding type.

314 Including sputtering:This subclass is indented under subclass 313.Subject matter wherein sample material isremoved, as though by evaporation, from theelectrodes of a gas discharge tube.

315 By flame:This subclass is indented under subclass 311.Subject matter including a flame producerwhose flame heats or burns the sample to causethe emission of radiation to be analyzed.

(1) Note. See the Search Class notes belowfor the line between this class (356) andthe class for all methods of burning offuel not classified elsewhere.

(2) Note. A light source and means to mod-ify the light for general illumination pur-poses are classified elsewhere.

SEE OR SEARCH THIS CLASS, SUB-CLASS:417, for excitation photometers where fil-

ters rather than light dispersing struc-ture are used to select the wavelengthof the emitted light to be examinedthat is present in the excited sample.

SEE OR SEARCH CLASS:137, Fluid Handling, subclasses 205 and

604 for devices which utilize a sepa-rating apparatus to move a liquid orgaseous sample from a supply toanother location.

239, Fluid Sprinkling, Spraying, and Dif-fusing, see subclasses 144 and 422;see subclasses 398+ for the combiningof separately supplied fluids whichare emitted from a nozzle.


1February 2011

250, Radiant Energy, subclass 554 forflame source combined with a photo-cell where a physical characteristic ofthe flame is detected.

362, Illumination, for general illuminationdevices which include a light sourceand means to direct the light. A lightsource and a chimney, for example,without means to limit the light sourcespecifically for examination purposes,such as a monochromator or means tohold additionally the material to beexamined, would be classifiable inClass 362.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 50+ for appara-tus having means to burn the materialbeing analyzed.

431, Combustion, subclasses 4 and 126 forthe methods and apparatus pertainingto the burning of a combustible fluid.See Notes 1, 2, and 3 below

(1) Note. Class 431, Combustion,will take all methods of burning offuel not classified elsewhere.Class 431 will take the combina-tion which includes a burner hav-ing a nozzle or a pipe outlet meansto feed a fuel, a combustion sup-porting fluid to the pipe or nozzleoutlet to produce a flame, andmeans to feed a sample fluid intothe flame produced by the burnerso that the heat of the burner willincrease the energy of the sampleto the point whereby the samplewill emit radiation.

(2) Note. The combination of a spec-tral flame burner such as recited inNote 1 above with an optical ele-ment necessary to inspect theflame such as a “chimney” or“means to view the flame” whereit is more than inspection of theflame and involves the examina-tion of the color intensity or wave-length of the light of the flame, isclassified in Class 356 rather thanClass 431.

(3) Note. Class 431 will not take thefeeding of powdered materialentrained in a fluid.

436, Chemistry: Analytical and Immuno-logical Testing, subclasses 1+ for pro-cesses involving the burning of mate-rial which involves a chemicalreaction, or the analysis or treatmentof the products of combustion wherenot elsewhere classified. See also (2)Note of subclass 311.

316 By high frequency field (e.g., plasma dis-charge):This subclass is indented under subclass 311.Subject matter wherein the sample is excitedby the field generated by a high frequency sig-nal.

SEE OR SEARCH CLASS:219, Electric Heating, subclass 121 for

electric heating by a plasma arc dis-charge, per se.

317 By light:This subclass is indented under subclass 311.Subject matter wherein the sample is excitedby radiation in the visible spectrum.

318 Monochromatic (e.g., laser):This subclass is indented under subclass 317.Subject matter wherein the light is of a singlewavelength.

319 Utilizing a spectrophotometer (i.e., pluralbeam):This subclass is indented under subclass 300.Subject matter wherein there are formed twobeams of light, one or both beams may bemonochromatic, means to support a substancein one or both beams to modify one or bothbeams, means to detect and compare the inten-sities of the two beams as modified by the sub-stance or substances simultaneously orsequentially, and means responsive to the com-parison means to indicate the relative intensi-ties of the two beams.

SEE OR SEARCH THIS CLASS, SUB-CLASS:213+, for photometers which examine the

intensity of visible light by visual andphotoelectric methods.


February 2011

416+, and 425, for colorimeters which uti-lize filters rather than a dispersingarrangement to determine the inten-sity of light at specific wavelengths orthe absorption characteristics of sub-stances which modify the light trans-mitted through or reflected from thesubstances.

432, for photometers which examine lighttransmitted through a substance.

445+, for photometers which examine lightreflected from the surface of a sub-stance.

320 Having plural wavelengths:This subclass is indented under subclass 319.Subject matter wherein each beam is of a dif-ferent wavelength.

321 Having servo equalization:This subclass is indented under subclass 319.Subject matter which generally includes in atleast one of the beams an optical member, suchas a wedge, responsive to the comparisonmeans to automatically equalize the intensitiesof both beams, or which includes an electricalmember responsive to the comparison means toelectrically create a null condition in the com-parison means.

SEE OR SEARCH THIS CLASS, SUB-CLASS:434+, for similar detection and comparison

circuits which control the equalizationof the light intensity only of pluralbeams, at least one beam being trans-mitted through a sample.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 204 for

photo-electric circuits which adjust anoptical system to balance light inten-sity in plural paths; and subclasses336.1+ for methods and apparatusinvolving similar devices responsiveto invisible radiation.

315, Electric Lamp and DischargeDevices: Systems, subclasses 151 and158 wherein a radiant energy devicecontrols an electric lamp load device.

318, Electricity: Motive Power Systems, subclasses 560+ for electric motorfollow-up systems which include aself-balancing network.

322 With polarized light beams:This subclass is indented under subclass 321.Subject matter in which two beams of visibleradiation are polarized and vary in intensitycyclically with time, and the two beams are outof phase with each other; and wherein the opti-cal member is of the magneto-optical type, acontrolled vibrating mirror, a wedge, or an iris.

(1) Note. Integrating spheres are generallypart of the combination claimed.

(2) Note. Included in the combinationclaimed is an indicator or recorder tonote the change necessary to cause equalbrightness in each path.

SEE OR SEARCH THIS CLASS, SUB-CLASS:236, for integrating spheres, per se.323+, for spectrophotometers with beam

modulation, per se.367+, for polarimeters generally which may

involve plural beams and servo equal-ization of the light intensities of bothbeams.


photo-electric optical or prephotocellsystems which include integratingspheres.

323 Having beam modulation:This subclass is indented under subclass 319.Subject matter which includes in the light pathstructure for periodically varying or blockingthe light path in both beams as by a rotatingshutter.


light interrupters combined with pho-tocells, and subclasses 336.1+ formethods and apparatus including atleast an invisible radiant energyresponsive electric signalling deviceresponsive to plural modulated energybeams, especially subclasses 340 and345+.

359, Optical: Systems and Elements, sub-classes 227+ for opaque optical mem-bers controlling the passage of light.


1February 2011

324 With plural dispersion:This subclass is indented under subclass 323.Subject matter which includes dispersingmeans and wherein the dispersion takes placein at least two distinct stages, in series.

325 Prior to testing:This subclass is indented under subclass 323.Subject matter where the modulation of thebeam occurs before the radiation enters thetested specimen.

326 Utilizing a spectrometer:This subclass is indented under subclass 300.Subject matter wherein the spectroscopicexamination is performed with an instrumenthaving an entrance slit, a dispersing device,and one or more exit slits with which measure-ments are made at selected wavelengths withinthe spectral range or by scanning over therange.

SEE OR SEARCH THIS CLASS, SUB-CLASS:300, for spectroscopes.331+, for monochromators.

327 Having light polarizing means:This subclass is indented under subclass 326.Subject matter including polarizing apparatusto examine visible light or to examine articlesor material by means of visible polarized light.

SEE OR SEARCH THIS CLASS, SUB-CLASS:364+, for polarized light examination, per

se.

328 Having diffraction grating means:This subclass is indented under subclass 326.Subject matter wherein the dispersive elementis a diffraction grating.

329 Including servo slit adjustment means:This subclass is indented under subclass 328.Subject matter wherein there is included aknown frequency light source which may bepart of the test emission source, an entranceslit, a dispersing means, a plurality of exit slits,one of which is associated with the known fre-quency dispersed by the dispersing means, aphotosensitive detector responsive to theknown light frequency received through its exit

slit, and servo control means responsive to thedetector to adjust the relative position of thedispersing means and the entrance or exit slits.

(1) Note. This subclass excludes recordingspectrophotometers having a movabledispersing element to allow succes-sively different light wavelengths toappear at the same exit slit, and havingits movement mechanically synchro-nized to move the recorder and adjust theexit slit for the various wavelengths. Seesubclasses 321+ for this type of mechan-ically synchronized slit adjustment.

330 Having optical gating means:This subclass is indented under subclass 326.Subject matter wherein the entrance and exitmeans contain areas which alternately transmitor block the passage of light.

331 With monochromator structure:This subclass is indented under subclass 300.Subject matter including a light dispersing ele-ment such as a prism or diffraction gratingtogether with a slit for selecting a narrow por-tion of the dispersed spectrum to provide alight beam which is essentially monochromaticor of narrow frequency bandwidth.

(1) Note. Usually an entrance slit is pro-vided between a source of light and thedispersing element, or a light source hav-ing a narrow beam width may be pro-vided.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for monochromators with optical limi-

tations used in the infrared or ultravio-let range.

326+, for spectroscopes generally as where aviewing device is used for examiningthe light from the dispersing elementeither directly or through a test samplein place of an output slit. See also (1)Note under subclass 326.

420, for color light standards as where lightfilters rather than dispersing elementsare combined with the light source.


invisible radiation monochromators


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exclusive of the infrared and ultravio-let optical types.

362, Illumination, subclasses 257+ formiscellaneous illuminating lamps;and subclasses 318+ for inspectionlamps.

378, X-Ray or Gamma Ray Systems orDevices, subclasses 84+ for X-raydevices including monochromators.

399, Electrophotography, subclasses 9+for diagnostics of electrophotographicdevices, particularly subclasses 31+for image-forming components.

332 Having adjustable color or bandwidth:This subclass is indented under subclass 331.Subject matter including structure to vary thebandwidth or to vary the average or medianfrequency of the band over the range of thelight emitted from the monochromator.

(1) Note. The variation may be obtained bychanging the width of one of the slits orby changing the reflection angle of thedispersing element.

333 In a double monochromator:This subclass is indented under subclass 332.Subject matter wherein a plurality of dispersingelements with an intervening slit or equivalentfiltering structure are provided between the dis-persing elements, as for providing a narrowerband of light.

(1) Note. This subclass provides for twomonochromators, generally in series,wherein the exit slit of one of the mono-chromators is also the entrance slit of theother monochromator.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for double monochromators includ-

ing optical limitations for use in theultraviolet or infrared range of theelectromagnetic spectrum.

319+, for plural beam spectrophotometerswhich include a double monochroma-tor.

SEE OR SEARCH CLASS:399, Electrophotography, subclasses 9+

for diagnostics of electrophotographic

devices, particularly subclasses 31+for image-forming components.

334 With diffraction grating means:This subclass is indented under subclass 332.Subject matter wherein the dispersive elementis a diffraction grating.

335 FOR SIZE OF PARTICLES:This subclass is indented under the class defini-tion. Subject matter for determining in a groupof discrete particles the size of individual parti-cles or the average size of the particles in thegroup.

SEE OR SEARCH THIS CLASS, SUB-CLASS:39+, for the size, numbers, or volume of

blood particles not provided for else-where.

432+, for light interference tests includingdiffraction patterns of microscopicbodies generally where the size of thediscrete bodies is not involved.

439, for the number of particles in a gas-eous suspension.

441+, for the number of particles in a liquidsuspension.

625, for the measurement of articles orindefinite length materials by meansof variation in visible light as affectedby the articles or indefinite lengthmaterials.

SEE OR SEARCH CLASS:73, Measuring and Testing, subclass

865.5 for miscellaneous measure-ment of the size of particles.

250, Radiant Energy, subclass 222.1 forthe sizing of discrete particles bymethods involving visible and invisi-ble light.

377, Electrical Pulse Counters, PulseDividers, or Shift Registers: Circuitsand Systems, subclass 10 for the sizedetermination and the number of par-ticles present in samples where theparticles are numerically counted.See also the general note to the linebetween Class 377 and this class.


1February 2011

336 By particle light scattering:This subclass is indented under subclass 335.Subject matter to visually or photoelectricallyinspect or measure the scattering of light byparticles or molecules entrained in a static orflowing medium.

337 BY PARTICLE LIGHT SCATTERING:This subclass is indented under the class defini-tion. Subject matter to visually or photoelectri-cally inspect or measure the atmospheric scat-tering of light, or the scattering by molecules ofa gas or liquid media or by particles entrainedin a flowing or static medium, which includessupport means for the media or medium capa-ble of transmitting light into and out of the sup-port means, lighting means to direct light intoand through a flowing or static gas or liquidwith or without the entrained particles, andmeans to visually examine and measure or pho-toelectrically detect and indicate the intensityof the light scattered from the medium or fromthe particles in the medium at some angle otherthan the direction of the inspection light.

(1) Note. In this subclass, the scattering isby reflection of light from discrete parti-cles within a medium, as opposed tomere diffusion by scattering from anirregular surface in subclass 372.

(2) Note. See subclasses 437+ and 441+where suspended particles are notviewed for scattered light reflected fromsuspended particles, but for the reductionin the light intensity, and wherein lightand the observation point lie in a directline with the observed fluid between thelight source and the observation point.

(3) Note. Tyndallometers, nephelometers,and devices to measure the Rayleichratio are included in this section.

(4) Note. The light used in the test may bemonochromatic, polarized, or whitelight.

(5) Note. Where particles in a fluid arecounted one by one, see Class 377, sub-class 10. Where the number of particlesin a fluid is found by sensing the overallradiation reflected by light scattering

from the particles within the medium,the claims will be classified here in sub-class 337.

SEE OR SEARCH THIS CLASS, SUB-CLASS:301, for detection of light scattering of the

Raman type.335+, for the determination of the size and

number of particles in a test mediumby statistical methods.

437+, see (2) Note above.441, see (2) Note above.446, for scattered light tests caused by the

reflection of light from a surfacewhich causes a diffused light ratherthan a specular light condition.

SEE OR SEARCH CLASS:250, Radiant Energy, for photocell circuits

or preoptical systems, which maysense fluent material in the opticalpath, which is responsive to scatteredlight from the fluent material.

340, Communications: Electrical, sub-classes 627+ for signal systemsresponsive to fluent or pulverizedmaterial which may respond to scat-tered light reflected from the fluent orpulverized material.

338 With photocell detection:This subclass is indented under subclass 337.Subject matter which includes photosensitivemeans activated by the scattered light received.

339 At right angles to the light beam (e.g.,nephelometer):This subclass is indented under subclass 338.Subject matter wherein the photosensitivemeans detects light scattered at an angle of sub-stantially 90° to the incident light beam.

340 At variable angle to the light beam:This subclass is indented under subclass 338.Subject matter wherein the angle between theincident light beam and the detected scatteredlight is variable.

341 For light comparison means:This subclass is indented under subclass 338.Subject matter wherein the scattered light iscompared with (a) a standard light, (b) a stan-dard scattered light, (c) the directly transmitted


February 2011

light, or (d) with the light prior to its scatteringor transmission through the medium.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for testing by means of infrared or

ultraviolet energy when the subjectmatter is of an optical nature and isused alone or in combination with vis-ible light.

433+, for scattered light tests which measurethe directed light through the fluidrather than the scattered light.

446, for devices which compare the lightscattering from a surface rather thanthe reflection of light from particlessuspended in a fluid, or colloids, orthe molecules of a gas or liquid.

342 Of back-scattered light:This subclass is indented under subclass 338.Subject matter wherein light scattered from theincident beam is detected at an angle greaterthan 90° to the direction of the incident beam.

343 Using plural photocells:This subclass is indented under subclass 338.Subject matter wherein more than one photo-sensitive device is used to detect the scatteredlight.

344 BY ELECTROPHORESIS:This subclass is indented under the class defini-tion. Subject matter which includes an electro-phoresis cell for containing a fluid to be tested,generally means transmitting light through thefluid, and examination means to indicate ornote the modification of the light due to themovement of particles suspended in the testfluid from the refractive index, the interferencephenomenon, the absorption of light within thevarious layers of the fluid in the cell, or theSchlieren patterns.

SEE OR SEARCH THIS CLASS, SUB-CLASS:128+, for refraction of light tests of material

under examination where electro-phoresis is not involved.

129, for Schlieren test apparatus notinvolving electrophoresis.

450, for interference apparatus testing therefraction of light not involving elec-trophoresis, per se, in the claims.

SEE OR SEARCH CLASS:204, Chemistry: Electrical and Wave

Energy, subclasses 450+ for processesand subclasses 600+ for apparatusinvolving electrophoresis or electro-osmosis as defined therein, includingthe combination of electrophoresis orelectro-osmosis with optical measur-ing or testing. Also, see the searchclass note to Class 356 in Class 204,subclass 450.

364 BY POLARIZED LIGHT EXAMINA-TION:This subclass is indented under the class defini-tion. Subject matter including polarizing appa-ratus to examine visible light or to examinearticles or material by means of visible polar-ized light; or including apparatus to compare,when polarization is involved, light, per se, orlight transmitted through or reflected from anarticle or material with a light standard.

SEE OR SEARCH THIS CLASS, SUB-CLASS:30+, for crystal or gem examination where

polarized light is involved.33+, for stress-strain examination of arti-

cles or material.453, 487, and 491, for light interference

measuring or testing involving polar-ized light.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 204 for pho-

toelectric, servo electric systems ofthe visible light type which utilizepolarized light; and subclass 225 forpreoptical visible light systems of thepolarized light type where no light orarticle testing is involved.

359, Optical: Systems and Elements, sub-class 437 for scales or indicia readingwhich utilize a polarizer element; andsubclasses 483.01 through 494.01 foroptical elements of the polarizer type.

362, Illumination, subclass 19 whichincludes polarizers used with generalillumination devices.


1February 2011

365 With birefringent element:This subclass is indented under subclass 364.Subject matter including a doubly refractive orbirefringent element, that is, an element havingthe property of dividing a ray of light into twopolarized rays (known as the ordinary andextraordinary rays) the directions of polariza-tion being at right angles to each other.

(1) Note. A birefringent material which hasbeen treated with a dichroic dye toabsorb the ordinary or extra-ordinary rayis no longer considered to be birefringentwithin the meaning of this definition.However, a birefringent element in theform, for example, of a Nicol prismwhere the unwanted ray is deflectedwould be classified here.

SEE OR SEARCH CLASS:359, Optical: Systems and Elements, for

polarization systems or elements hav-ing a birefringent element.

366 With polariscopes:This subclass is indented under subclass 364.Subject matter providing structure for examin-ing articles or material and including a polar-izer, a polarized light analyzer, a supportusually for the article or material for examina-tion between the polarizer and analyzer, and avisual viewer or photoelectric detector andindicator, the polarized light from the polarizerbeing transmitted through the article or mate-rial to the visual viewer or the photoelectricdetector and indicator.

SEE OR SEARCH THIS CLASS, SUB-CLASS:30+, for polariscopes used in gem exami-

nation.33+, for polariscopes used in stress-strain

examination.


classes 483.01 through 494.01 whichincludes series polarizers relativelyadjustable.

367 Including polarimeters:This subclass is indented under subclass 366.Subject matter including either a null type ordirectly indicating instrument for determiningthe amount of polarized light rotation causedby the article or material being examined.

368 With electro-optical light rotation:This subclass is indented under subclass 367.Subject matter including an electrically oper-ated rotator of the polarization plane.

(1) Note. Where an electro-optical rotatingmeans is used to vary the intensity of thelight, rate of the pulsations of light, orchange the plane of polarization of thelight of an article or material beingexamined without indicating the changein the polarization of the light, searchsubclasses 366, 369, and 370.


classes 246+, 281+, and 483.01through 494.01 for electromagneticand electrostatic type optical elementswhich rotate the plane of polarizationof polarized light.

369 Of surface reflection:This subclass is indented under subclass 364.Subject matter wherein a material or article isexamined for surface reflection characteristicsby means of polarized light.

SEE OR SEARCH THIS CLASS, SUB-CLASS:445+, for light reflection testing generally.

370 With light attenuation:This subclass is indented under subclass 364.Subject matter wherein the light to be tested orthe light transmitted through or reflected froma sample or standard is reduced in intensity bymeans of polarizers and analyzers.

SEE OR SEARCH THIS CLASS, SUB-CLASS:213+, for photometers generally.402+, for shade or color measurements gen-

erally.432+, for light absorption measuring gener-

ally.


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388 BY CONFIGURATION COMPARISON:This subclass is indented under the class defini-tion. Subject matter including means for com-paring a given configuration such as an article,record, or scale with a standard either visuallyor by means of a photocell, both the precedingbeing effected by noting the light from the mar-gins or surfaces of the specimens and standardsto an observation point.

(1) Note. The standard may be only anotherarticle of the same type.

(2) Note. In patents where a visual compari-son is made of an article with a standard,the two images must be superimposed oradjacent each other for simultaneouslyviewing. If the images are farther apartso that they are viewed alternately, thepatent is in Class 359, subclass 373; or inClass 353 if projection is claimed.

(3) Note. This subclass and those indentedthereunder provide for comparing ofarticles where an image of the article anda scale, or the image of two articlesbeing compared are viewed. If only theimage of a scale is viewed, the patent isclassified in Class 359, subclasses 436+;or Class 353 if projection is involved. Ifonly the image of the article is viewed,the patent is classified in Class 359, sub-class 373, where a compound lens sys-tem is employed; or in Class 353 ifprojection of an image is present.

(4) Note. Class 33 provides for patents onarticle testing devices where a mechani-cal pickup or feeler engages or contactsthe workpiece even though significantoptical structure is recited in the claims.

(5) Note. Class 250, especially in sub-classes 216+, provides in general forphotocells together with optical structurein the light path. For classification inClass 356, subclass 388 the photocelland optical combination must be sorelated as to or must include structure togive an indication of the comparison,such as being within or without the rangeof tolerance when the light beam is

passed to the profile of the master or arti-cle under test.

SEE OR SEARCH CLASS:33, Geometrical Instruments, especially

subclasses 501+ for testing devicesincluding a feeler which contacts thearticle. See (4) Note above.

209, Classifying, Separating, and Assort-ing Solids, for devices for inspectingand sorting articles.

359, Optical: Systems and Elements, sub-class 373 for object comparison com-pound lens systems; subclasses 436+for scale readers; and subclasses 798+and 804+ for object viewing structureinvolving lenses generally, i.e., notcompound.

382, Image Analysis, subclasses 181+ forpattern recognition, for exampleprinted circuit recognition by analysisof the image information.

389 With photosensitive film or plate:This subclass is indented under subclass 388.Subject matter wherein the image of the con-figuration or the standard is photographicallyrecorded for comparison purposes.

SEE OR SEARCH CLASS:396, Photography, for photographic

recording where the invention lies inthe manner of recording the subjectmatter.

390 With two images of single article compared:This subclass is indented under subclass 388.Subject matter including optical elements topermit the simultaneous viewing of two por-tions of a single configuration, such as oppositesides of a threaded screw, or two images of thesame portion of a configuration one usuallybeing inverted, for comparison thereof.

391 With projection on viewing screen:This subclass is indented under subclass 388.Subject matter including a viewing screen andmeans to project an image thereon of the con-figuration or the standard.


1February 2011

392 For comparison with master or desired con-figuration:This subclass is indented under subclass 391.Subject matter including means to simulta-neously view and compare the configurationand a standard configuration of the same type,or a pattern showing a desired or standardshape, or another configuration of the sametype.

(1) Note. In this subclass a representation ofthe master is usually a part of or adjacentthe viewing screen, and an image of thetest configuration is projected thereon;while in indented subclass 393 below, animage of the master and usually also animage of the test configuration are pro-jected on the viewing screw.

393 Having master or desired configuration pro-jection:This subclass is indented under subclass 392.Subject matter including means to project amaster or desired shape on the viewing screenin addition to an image of the test configura-tion.

(1) Note. In the case of a contact compari-son between an article and the gauge ormaster a beam of light may be projectedbetween the gauge or master and the testconfiguration, and an image of the lightbetween the gauge and test configurationthen projected on a screen is in this sub-class 393.

394 With comparison to master, desired shape,or reference voltage:This subclass is indented under subclass 388.Subject matter including optical elements topermit the simultaneous viewing and compari-son by the eye or by a photocell of the configu-ration and (a) a standard configuration of thesame type, or (b) a pattern or gauge having adesired or standard shape, (c) another configu-ration of the same type, or (d) a reference volt-age generated as an electrical analog of adesired configuration.

(1) Note. Light may be projected betweenan article and a gauge and the test madeby detecting the amount of that lightwith a photocell.

SEE OR SEARCH THIS CLASS, SUB-CLASS:622, for an article compared indirectly with

a master as by testing the master firstand setting up the results to comparethe article to.

395 With relatively movable optical grids:This subclass is indented under subclass 388.Subject matter comprising plural optical gridswhich are relatively movable.

(1) Note. One or more of the grids may bean image of the actual grid.

SEE OR SEARCH THIS CLASS, SUB-CLASS:151, for similar subject matter utilized in

measuring angles.618, for mensuration of article displace-

ment by “moire” fringe generation.

396 With scale or optical grid displaced relativeto remote fiducial mark:This subclass is indented under subclass 388.Subject matter wherein a scale or optical grid isdisplaced relative to a remote reference point.

(1) Note. The reference point could be forexample, a mark on the reticle of an eyepiece or a photocell.

SEE OR SEARCH THIS CLASS, SUB-CLASS:150+, or similar subject matter used in mea-

suring angles.


miscellaneous photocell circuits.359, Optical: Systems and Elements, sub-

classes 436+ where the fiducial markis immediately adjacent to the scaleand an optical element such as a mir-ror or lens is used to facilitate readingthe scale.

397 With object being compared and scalesuperimposed:This subclass is indented under subclass 388.Subject matter where a scale and the objectmeasured are viewed in a superimposed rela-tionship.


February 2011

SEE OR SEARCH THIS CLASS, SUB-CLASS:391, where the object and/or scale are pro-

jected on a viewing screen.394, where the object is compared with a

master or desired shape.

398 With object being compared and light beammoved relative to each other (e.g., scan-ning):This subclass is indented under subclass 388.Subject matter including means to scan orsweep a configuration with a light beam, orincluding means to translate or rotate a config-uration in a light beam to facilitate determina-tion of the size or shape of the configuration,usually by means of at least one photocell.


ing Solids, subclasses 577+ for opti-cal testing in combination with sort-ing.

250, Radiant Energy, subclasses 229+ forphotocells with light control membersof the light interrupting type.

348, Television, subclass 142 for objectmeasurement with camera and objectmoved relatively to each other, sub-classes 195-205 for mechanical opti-cal scanning, subclasses 209.99 forflying spot scanning.

358, Facsimile and Static Presentation Pro-cessing, subclasses 474 through 498 for optical scanning systems includingflying spot scanners of the cathode-ray tube.

359, Optical: Systems and Elements, sub-classes 227+ for light control byopaque members movable in the lightpath.

399 BY ALIGNMENT IN LATERAL DIREC-TION:This subclass is indented under the class defini-tion. Subject matter where two objects or anobject and a light beam are laterally aligned bydisplacing the objects along an axis essentiallynormal to the line connecting them or displac-ing the object and light beam along an axisessentially normal to the light beam.

SEE OR SEARCH THIS CLASS, SUB-CLASS:138+, where the alignment involves rotation

about an axis.614, where the amount of displacement is

measured.


such systems involving photocells andan optical system and with control ofthe optical system by the photocells.

400 With light detector (e.g., photocell):This subclass is indented under subclass 399.Subject matter including means responsive tolight.

401 With registration indicia (e.g., scale):This subclass is indented under subclass 399.Subject matter wherein visual marking are usedto determine the degree of alignment.

402 BY SHADE OR COLOR:This subclass is indented under the class defini-tion. Subject matter wherein light (emanatingdirectly from a light source, or transmittedthrough or reflected from a substance) is ana-lyzed for its frequency content by dividing thelight into its component frequencies or bandsof frequencies (which are usually of as prede-termined character), or by comparison in fre-quency or intensity with standard lights(emanating directly from a light source, ortransmitted through or reflected from a sub-stance).

(1) Note. The first mentioned light is thelight sample or from the sample to betested while the second mentioned lightis the standard or from the standard.

(2) Note. Search subclass 51 if either infra-red or ultraviolet light is utilized in thetest.

(3) Note. When complementary colors areutilized to produce a gray-type visualresponse they will be classified in theappropriate portion of this color section.

(4) Note. Where lamps including photoresponsive detectors, per se, such as pho-


1February 2011

totubes are tested for color response asan indication of their operating charac-teristics, see Class 324, especially sub-classes 24+ for space discharge-typetubes and subclass 158.1 for solid-state-type devices. However, this Class 356provides for color determination of lightfrom a lamp where the lamp operatingcharacteristics are not involved.

SEE OR SEARCH THIS CLASS, SUB-CLASS:43+, for optical pyrometers which correlate

the color of a light source or a heatedlight emissive substance with the tem-perature of the light source or theheated light emissive substance.

300+, for spectroscopes, spectrometers, andspectrophotometers which analyzelight or substance for color and lightintensity which involve the use of adispersing element, such as a prism ordiffracting medium, rather than a filteror filters to isolate the different colorspresent in the light or substancesbeing tested.


23.35 and 53+ for the testing of efflu-ents of a mixture of gases or liquidssuch as chromatography tests whichhave contacted a solvent or sorbentcomponent successively and selec-tively to determine the quantity, qual-ity, or identity of a component of theeffluent.

95, Gas Separation: Processes, sub-classes 82+ for processes of gas sepa-ration using chromatography.

96, Gas Separation: Apparatus, sub-classes 101+ for chromatography typeapparatus for gas separation.

209, Classifying, Separating, and Assort-ing Solids, subclasses 580 through582 for assorting articles based uponcolor sensing of articles.

250, Radiant Energy, subclass 226 forphoto-electric preoptical systemsdealing with color.

346, Recorders, see (3) Note of subclass74 for the line between Classes 356and 346.

374, Thermal Measuring and Testing, sub-classes 106 and 162 for temperaturedetermination by color, other than bythermally emitted radiation.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 50+ for analyti-cal apparatus having color changeindicating means.

436, Chemistry: Analytical and Immuno-logical Testing, subclasses 1+ forchemical analytical tests involvingcolor changes.

403 With merging colors or patterns (e.g., Max-well disc):This subclass is indented under subclass 402.Subject matter which includes a plurality ofdifferent colored light sources or reflectivestandards, and means to optically or mechani-cally rotate the light source or the standards sothat the optical or mechanical rotation causesthe sources or standards of different colors toblend together to produce a visual sensation ofanother color, shade, or tint so that the mergedcolor can be visual compared simultaneouslywith an unknown light or color sample.

(1) Note. The mechanically rotating stan-dards known as “Maxwell’s Discs” areincluded in this subclass.

SEE OR SEARCH THIS CLASS, SUB-CLASS:243.1+, for optical standards.420, for colored light standards which uti-

lize filters.421+, for color charts and standards not of

the Maxwell disc type.

SEE OR SEARCH CLASS:434, Education and Demonstration, sub-

classes 98+ for the same subject mat-ter used for display or educationalpurposes rather than for testing.

404 Photography:This subclass is indented under subclass 402.Subject matter involving color photographysuch as: the examination of the color proper-ties of negatives as for copying purposes, theexamination of sensitometric colored strips forthe purpose of controlling the making of prints,all testing subcombinations dealing with color


February 2011

printing not provided for elsewhere, and theexamination of the color characteristics of thescenes to be photographed in color.

(1) Note. All patents dealing with the test-ing of colored light which involve tem-perature determination and photographywill be found under pyrometry in sub-classes 43+.

(2) Note. Under this section are visual andphotoelectric reflection and transmis-sion tests of colored prints or negativesto correct the color balance of one ormore colors in the negative, and the testsmay be sequentially or simultaneouslyperformed when more than one test isperformed.

SEE OR SEARCH THIS CLASS, SUB-CLASS:43+, for optical pyrometers. See also (1)

Note above.443+, for light transmission or absorption of

photographic film, per se.

SEE OR SEARCH CLASS:346, Recorders, subclasses 29 and 33 for

recorders which are designed for usewith color negative tests which haveno specific optical test structurerecited in the claim.

355, Photocopying, subclasses 32+ forcolor projection printers whichinclude plural color transmissionexamination of negatives for the pur-pose of color balancing a projectiontype print of the tested color negative;and subclasses 78+ for color printersof the contact type which measure theintensity of a plurality of different col-ors transmitted through a negative inaddition to the contact printing struc-ture.

358, Facsimile and Static Presentation Pro-cessing, subclasses 500 through 540, particularly subclasses 518-523 and527 for color correction systems asapplied to facsimile devices and forfacsimile type.

359, Optical: Systems and Elements, sub-classes 885+ for color filters, per se,which are used for photographic pur-poses.

399, Electrophotography, subclasses 31+for electrophotographic devices usingoptical measurement and test appara-tus for diagnostic testing.

430, Radiation Imagery Chemistry: Pro-cess, Composition, or ProductThereof, appropriate subclasses forradiation imagery involving color.

405 Tristimulus examination:This subclass is indented under subclass 402.Subject matter wherein there are devices whichexamine light, per se, or the light reflectedfrom or transmitted through substances, andwhich include means to examine the light orthe light modified by reflection or transmissionfrom the substances, simultaneously or sequen-tially for hue, saturation, and intensity as basedupon the response of the human eye.

(1) Note. The devices may be of the visualor the photosensitive type.

SEE OR SEARCH THIS CLASS, SUB-CLASS:300, for devices which examine a sub-

stance for tristimulus values where adispersing element is used rather thancolor filters to construct the tristimu-lus curves.

406, for devices which examine light orsubstances reflectively or transmis-sively for at least three different col-ors but not for the tristimulus values.


ing Solids, subclasses 577+ for appa-ratus which physically separates onesubstance from another based uponthe tristimulus factors of light.

235, Registers, subclasses 61 and 184 fordevices which utilize the tristimulusfactors obtained in the devices of thissubclass 405 to obtain mechanicallyand electrically the analogue compu-tations necessary to utilize the inte-grated responses of the tristimulusvalues.

406 Trichromatic examination:This subclass is indented under subclass 402.Subject matter wherein there is apparatus toexamine sequentially or simultaneously for at


1February 2011

least three colors of light either directly orwhen reflected from or transmitted through asubstance to be tested.

(1) Note. The devices may be of the visualor the photosensitive type.

SEE OR SEARCH THIS CLASS, SUB-CLASS:300+, for apparatus which may examine

light emitted from substances or theabsorption of light by substances orthe examination of light, per se, byspectroscopes, spectrometers, or spec-trophotometer which utilize mono-chromators which permit the entirevisual spectrum of light to be used toexamine substances or to examinelight for any or all of the colors whichmay be inherent in the light examined.

405, for test structure similar to that usedhere but differing only in the type offilters used to examine the light or thesubstances.

407, for apparatus wherein the light from asubstance or light itself is examined atthe same time for two different colors.

419, for similar subject matter where thedisclosure or the claims do not exam-ine light or substances for at leastthree distinct colors, but use test struc-ture similar to that found here and insubclass 405.

407 With sample responsive to plural colorsapplied simultaneously:This subclass is indented under subclass 402.Subject matter which includes means to simul-taneously transmit or reflect at least two differ-ent colored bands or frequencies of light,through or from the sample, means to filter themodified light into two different bands of light,and detector and indicating means responsiveto the light modified by the sample and afterfiltering to note the intensity of the differentbands of light.

SEE OR SEARCH THIS CLASS, SUB-CLASS:45, for plural color responsive optical

pyrometers including photographicand metallurgical types.

300, for spectroscopic examination ofapparatus which uses a dispersing

means rather than a filter to detect orexamine the various bands of light.

366+, for devices which use an analyzer anda polarizer in the light path of a devicetesting light or a substance optically.


ing Solids, particularly subclass 582for the physical separation of articlesbased on a color test, which involvesat least two different colors.

235, Registers, subclasses 61+ and 150+for apparatus responsive to a color testwhich performs a mathematical func-tion to indicate a quantity correlatedto the color test.

250, Radiant Energy, subclasses 201.1+,206+, and 226 for plural photosensi-tive color circuits where no supportfor a sample is included in the claimsor where no indicator for the lightused in the test is included in theclaims.

359, Optical: Systems and Elements, sub-classes 885+ for colored filters.

408 With sequential comparison of sample andstandard:This subclass is indented under subclass 402.Subject matter wherein there is a light sourceand optical means to produce a beam or beamsof visible light which may be monochromatic;(a) means to hold, move, and position sequen-tially either at least two samples or a sampleand a standard into the path of the beam, or (b)means to cause the beam or beams to sweep orswitch between fixed samples and standards;and electrical detecting and indicating means tonote the light transmitted through or reflectedfrom the samples and standards.

409 Fluid color transmission examination:This subclass is indented under subclass 402.Subject matter wherein a fluid substance, a sol-ute in a solvent, or a miscible liquid is exam-ined by a transmissive light test (quantitativelyor qualitatively) for the purpose of notingcolor, different shades or tints of colors, or theconcentration of a solute in a solvent.

(1) Note. Patents dealing with chromatogra-phy include a mass or masses of chemi-cally absorptive material supported in a


February 2011

transparent conduit so that a confinedflow of liquid or gaseous materialthrough the chemically absorptive mate-rial may produce a selective coloredband or bands held in layers by absorp-tive phenomena. The layers and theirinterfaces may be examined visually orby radiation sensitive instruments to fur-nish qualitative determinations withrespect to the chemical composition ofthe material analyzed. Those patentswith significant claimed subject matterinvolving an optical color test followingthe absorption of a constituent of a liquidor gaseous material are included as origi-nals in this schedule.


23.35 and 53.01+ for the methods andapparatus for examining the band orbands of the chromatography columnto determine the quantity, quality, orthe substances of the band or bands ina gas or liquid chromatography test.

95, Gas Separation: Processes, sub-classes 82+ for processes of gas sepa-ration using chromatography.

96, Gas Separation: Apparatus, sub-classes 101+ for chromatography typeapparatus for gas separation.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 50+ for analyti-cal apparatus involving chromatogra-phy or a colorimeter wherein areactive reagent is used to developcolor.

436, Chemistry: Analytical and Immuno-logical Testing, for processes involv-ing the combination of a gas or liquidchromatography test with a colorime-try test of the colored band or bandsfrom the chromatography columnwhere a chemically reactive reagent isnecessary to develop the color for thecolorimetry test.

410 Of flowing liquids:This subclass is indented under subclass 409.Subject matter including apparatus whichforms part of a liquid circulation system whichpermits constant or intermittent flow of the liq-uid being examined, and a support for the liq-

uid contained, and which is constructed toallow light to pass through the contained liquidfor a visual or photosensitive examination.

(1) Note. Included herein are a comparisonof a test fluid with a light standard orwith a standard of the same fluid, or acomparison of a voltage which is theresult of the detected light transmittedthrough the fluid tested with a voltagelevel used as a standard as in a bridgecircuit in null type recording and indicat-ing instruments.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for infrared energy or filters utilized

in the test circuitry.246, for flow cells, per se.319+, for spectrophotometers which utilize a

dispersing element to produce thelight radiation utilized in the sametype of selective absorption test.

436+, for light transmission of liquids whereno monochromatic light is involved inthe test.

SEE OR SEARCH CLASS:137, Fluid Handling, subclasses 3 and 93

for methods and apparatus for thecontrol of flowing fluids whichinvolve a color test of this Class 356.

250, Radiant Energy, subclasses 356 and357 for the detection or measurementof invisible radiation used to test flu-ent material; subclasses 564+ for flu-ent material in the optical path and aphotocell circuit; and subclasses 573+for the detection of a fluent material inthe optical path.

340, Communications: Electrical, sub-classes 603+ for electrical conditionresponsive systems responsive to flu-ent material which utilize an electricalsignalling device such as a light orbell rather than a meter or a recorder.

346, Recorders, particularly subclasses 31through 33 for recorders operated byfollow-up or rebalancing systemsalone or in combination with a nomi-nal optical test where the noveltyalone is in the recorder, per se.


1February 2011

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 50+ for contin-uous flowing fluid apparatus involv-ing a color test and in which achemical reaction occurs.

436, Chemistry: Analytical and Immuno-logical Testing, subclasses 1+ for pro-cesses involving continuous flowingfluid systems which include a colortest wherein a chemical reactionoccurs.

411 With plural light detectors (e.g., photocells):This subclass is indented under subclass 410.Subject matter including more than one photo-sensitive device.

412 With ionic determination:This subclass is indented under subclass 409.Subject matter including an unknown solutionand one or more standards (which may be atransmissive liquid or solid or a reflective stan-dard or any combination thereof) for the simul-taneous comparison of the unknown solutionwith the standard or standards for similar coloror slight differences in the same color whichcolor standard or standards are correlated toionic conditions existing in the solution exam-ined.

(1) Note. Included in this group are appara-tus which involves the finding of the pHvalue of solutions in terms of hydroxylor hydrogen ion concentration, and titra-tion apparatus in which no reagent isrecited in the claims; and also includedare other tests which involve the correla-tion of the tint or shade of a color withrespect to the color of the standard solu-tion in which the ion content is known.

(2) Note. The disclosure of the tests recitedin (1) Note above is sufficient for place-ment in this subclass.

(3) Note. Included are optical tests to deter-mine the concentration of solute in sol-vents.

SEE OR SEARCH THIS CLASS, SUB-CLASS:414, for filters which include solid and liq-

uid filters and standards of the trans-

missive type where no ionic analysisis involved and no concentration ofthe solute and solvent is involved.

416+, for transmissive filters involved in acomparison test of gases or solidmaterial.

SEE OR SEARCH CLASS:422, Chemical Apparatus and Process Dis-

infecting, Deodorizing, Preserving, orSterilizing, subclasses 50+ for chemi-cal apparatus having means for per-forming color tests involving pH andtitrations which claim the reagents,including the indicators, which chem-ically react in the tests.

436, Chemistry: Analytical and Immuno-logical Testing, subclasses 1+ forchemical test processes which includecolor tests involving pH and titrationswhich claim the reagents, includingthe indicators, which chemically reactin these tests.

413 With variable light path length:This subclass is indented under subclass 409.Subject matter wherein the length of the lightpath through the liquid may be varied, as byinserting a light-transmitting member of con-stant light-transmitting length into the liquid toa desired depth and passing light through theliquid and the light-transmitting member inseries.

(1) Note. Scales correlated with the changein the amount of the liquid in the lightpath are present in the disclosed devicebut are not always included in theclaims.

(2) Note. Subcombinations of the devicesare classified herein when they are notprovided for elsewhere.

(3) Note. Included in this subclass are colo-rimeters of the “Duboscq” type.

SEE OR SEARCH THIS CLASS, SUB-CLASS:441+, for turbidity measurements which

may utilize the same structure asfound in 413.


February 2011

414 With color transmitting filter:This subclass is indented under subclass 409.Subject matter including a filter element in thevisible range positioned in the light transmis-sion path of visual and photosensitive testingapparatus.

(1) Note. Included in the group are visualextinction type, sequential and simulta-neous comparison tests involving at leastone known color standard and oneunknown liquid. The standard may be acolored light source or light source plusa colored light transmissive filter.

(2) Note. An infrared filter for the purposeof transmitting infrared or for preventingthe heat rays of a light source from enter-ing the liquid tested is not a filter underthe definition of this subclass.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for liquid colorimeters which include

an infrared filter in the test or for thepurpose of removing heat radiationfrom affecting the test results. See (2)Note above.

416+, for color-transmitting filters used inmeasuring shade or color, per se.

432+, for light transmission tests where nocolor or concentration of a solute in asolvent is involved in the optical test.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 211 for cir-

cuitry having photocells with inherentcolor sensitivity; subclass 226 foroptical or prephotocell systems whichinclude filters within the visible spec-trum.

359, Optical: Systems and Elements, sub-classes 577+ for interference type fil-ters; and subclasses 885+ for filtersgenerally which may be used to pro-duce monochromatic bands of radia-tion within the visible spectrum.

415 Including liquid filter comparison:This subclass is indented under subclass 414.Subject matter which includes at least two liq-uid light transmissive containers of the sametype, the liquid in all of the containers differing

only in shade or tint from each other, and sup-port means for the containers to permit thesimultaneous viewing of all the contained liq-uids axially or laterally of the containers.

(1) Note. Here the filters are the containedliquids which are standards of varyingtint or shade of the unknown color or thefilters are formed of a standard solutionsuch as distilled water which is used inconjunction with colored transmissivesolid filters which form various colors,tints, or shades. One of the liquids maybe the tested colored solution.

416 With color transmitting filter:This subclass is indented under subclass 402.Subject matter wherein a light filter having aparticular light transmission characteristic topass light of a particular color is disposed inthe light path of the testing device.

(1) Note. The filter may be in the light pathbetween the sample and the light sourceor between the sample and the viewingposition path.

(2) Note. Included are visual devices of theextinction type, and of the equal inten-sity comparison type involving coloredlight, per se, or involving colored lightreflected from or transmitted through asubstance.

(3) Note. Comparison types utilizing col-ored light standards are placed hererather than in subclass 190.

SEE OR SEARCH THIS CLASS, SUB-CLASS:43+, for optical pyrometers which may uti-

lize colored light filters to determinethe temperature of a light emissivesource.

213, for photometers which measure theintensity of light without regard to thefrequencies of light present in thelight tested.

300+, for spectroscopes, spectrometers, andspectrophotometers which utilize adispersing element such as a prism ora diffraction grating rather than a filterto separate collimated light into bands


1February 2011

of the various colors present in thelight.

414+, for color-transmitting filters used inthe examination of color transmissionby fluids.

SEE OR SEARCH CLASS:250, Radiant Energy, subclass 226 for pre-

photocell optical systems which mayutilize a visible colored light filter inthe system where no indicator isclaimed or disclosed and no supportfor object tested is included in theclaims.

359, Optical: Systems and Elements, sub-classes 885+ for filters, per se.

417 Included with sample excitation:This subclass is indented under subclass 416.Subject matter including a flame producer oran electrical excitation means wherein a speci-men is burned or excited to produce visibleradiation for analysis by light intensity or illu-mination measurement means.

SEE OR SEARCH THIS CLASS, SUB-CLASS:213+, for photometers, per se.315, for flame spectroscopy.

418 Including rotating sequential filters:This subclass is indented under subclass 416.Subject matter wherein there are rotatingsequential filters positioned in the light path torotate during the test.

SEE OR SEARCH THIS CLASS, SUB-CLASS:217, for modulating photometers for the

examination of the intensity of light.434, for light transmission tests of the

sequential type which may involvemechanical, electrical, or electro-opti-cal modulating means, and whereonly the intensity of the light transmit-ted through a substance is involved.

447, for light reflection tests which includemodulation of the reflected light froma substance where only the intensityof the reflected light is involved.

419 Including multicolor filters:This subclass is indented under subclass 416.Subject matter wherein more than one filter isprovided for the purpose of additively usingmore than one filter at the same time to pro-duce a desired tint or shade for the purpose ofcomparing this produced tint or shade with anunknown color, or wherein a plurality of filtersare provided, one of which is available at atime, as for the purpose of selecting only onevisible band of radiation at a time from thelight reflected from or transmitted through thesample.

(1) Note. This sub will take wedge-shapedfilters which pass different wavelengths.

SEE OR SEARCH THIS CLASS, SUB-CLASS:43, for optical pyrometers which measure

the temperature of a light emissiveobject by means of filters.

51, for optical tests which use infrared orultraviolet radiation in the claimedtest.

319+, for absorption spectrophotometerswhich utilize a dispersing membersuch as a prism or a diffraction gratingrather than a filter to produce a plural-ity of narrow bands of visible radia-tion before or after radiation isreflected from or transmitted througha substance.

404, for photographic color test deviceswhich may use a plurality of filtersadditively or sequentially for copyingpurposes such as color correction, col-ored negative examination, and col-ored light meters. However, see thepyrometric subclasses 43+ of thisclass where the claims or disclosureindicate the light reading to be interms of temperature.

405, for tristimulus apparatus which utilizethree filters, sequentially or simulta-neously, corresponding to the stimulusreceived by the human eye.

406, for apparatus using three or more col-ored filters, sequentially, which iscapable of trichromatic examinationof light or material.


February 2011

SEE OR SEARCH CLASS:348, Television, subclasses 655+ for appa-

ratus which may use a plurality of fil-ters to adjust the color balance incolor television systems.

351, Optics: Eye Examining, Vision Test-ing and Correcting, subclasses 216+and 233+ for filters which are selec-tively interposed in the line of vision.

434, Education and Demonstration, sub-class 102 for color comparison chartswhich utilize filters to show the effectof the addition of various colors onlight.

420 Included with colored light sources:This subclass is indented under subclass 416.Subject matter including devices to producecolored light standards which utilize a filter toprovide colored light for test purposes asopposed to general illumination purposes.

(1) Note. Light standards which utilize adispersing device such as a prism or adiffraction grating along with a slit toform the various monochromatic lightsource are placed in the monochromatorsubclass 331.

(2) Note. Where a colored light standardcapable of use as a Class 362 generalillumination device is claimed in combi-nation with a support for a substance tobe examined by this light standard, theoriginal classification is in subclass 414.

(3) Note. A colored light or its subcombina-tions capable of use as a test light stan-dard which cannot be distinguishedstructurally as a colored general illumi-nation device is classified in Class 362,rather than in Class 356.


classes 291+ for electron beamdevices which vary the angle that thebeam hits a diffraction surface to pro-duce colored and black and whitelight producing systems.

434, Education and Demonstration, sub-classes 98+ for colored light projec-tors and the mixing of colored light

when the claims state the purpose ofthese devices is for educational orartistic purposes.

421 With reflective multicolor chart or stan-dard:This subclass is indented under subclass 402.Subject matter including one or a plurality ofsurfaces which reflect different colors or tintsof a color for comparison with the color of thesamples to be tested.

(1) Note. The surface may be a liquid. Thesurfaces of the standard need not be ofthe same material as the sample to betested.

(2) Note. This group of subclasses includesboth the chart and standards, per se, asdefined in the above definition as well ascolor testing devices incorporating suchcharts or standards and not classifiableabove.

(3) Note. The standards and the compara-tive devices of this group are the typewherein a comparison of known andunknown is made simultaneously andmay be of manipulative or hand heldvisual type; but these subclasses alsoprovided for the photoelectric type.

SEE OR SEARCH THIS CLASS, SUB-CLASS:43+, for reflective standards where color is

involved to determine the temperatureof a heated object or emissive source.

243.1+, for optical standards generally aswhere color is not involved.

244+, for supports for liquid or solid stan-dards generally.

SEE OR SEARCH CLASS:43, Fishing, Trapping, and Vermin

Destroying, subclass 1 for fishingimplements which utilize color to testfor the most effective colored lure forthe existing water conditions.

422 Plate:This subclass is indented under subclass 421.Subject matter wherein the surfaces are formedas flat, platelike colored structures.


1February 2011

SEE OR SEARCH THIS CLASS, SUB-CLASS:229, for the comparison of light intensities

where no color is involved and wherethe unknown light is compared withflat, platelike structures forming lightreflecting standards.

243.1+, for visual standards other than the col-ored type.

433+, for the comparison of light transmit-ted through an unknown substancewith light reflective standard plateswhere color is not involved.

448, for the comparison of light reflectedfrom an unknown substance with lightreflective standard plates where coloris not involved.

SEE OR SEARCH CLASS:422, Chemical Apparatus and Process Dis-

infecting, Deodorizing, Preserving, orSterilizing, subclass 430 for analyticalapparatus which may be in the form ofkits which utilize flat, plate-like col-ored standards as a basis for a visualor photoelectric comparison with acolored substance reactively producedin order to determine the presence of achemical element, anion, or cation.

423 Disk:This subclass is indented under subclass 422.Subject matter wherein the surfaces are disksor sectors which form disks.

SEE OR SEARCH THIS CLASS, SUB-CLASS:243.1+, for reflective standards which do not

involve color testing.

SEE OR SEARCH CLASS:434, Education and Demonstration, sub-

classes 98+ for multicolor chartswhich may be in the form of a disc,which are used for display andinstruction purposes, and which mayalso be used as a standard for the com-parison of an unknown color with thecolors and their tints and shadesformed in or on the disc.

424 Drum or endless tape:This subclass is indented under subclass 421.Subject matter wherein the surfaces are in theform of a endless member such as a tape or adrum.

425 With color determination by light intensitycomparison:This subclass is indented under subclass 402.Subject matter wherein the color comparison oftwo masses is made by comparing the intensityof the light from the two masses (either trans-mitted or reflected).

(1) Note. This type of comparison has beendesignated in the literature as hetero-chromatic photometry. It is usuallyrestricted to comparing different shadesor tints of the same color. Usually filtersare not used in color determination ofthis type.

(2) Note. Subclasses 432+ and 445+ pro-vide for the reflection and transmissivetesting of materials by noting the inten-sity of the reflected or transmitted light.The distinction between subclass 425and subclasses 432+ and 445+ is that thearticles examined in subclass 425 are ofthe same color and differ only in tint orshade from one another, while subclasses432+ and 445+ have no color involved atall.

(3) Note. Where a liquid is tested for con-centration of a solute in a solvent and thecomparison is made with a light intensitysource and where no color is involved atall and where the liquid is claimed, theoriginal patent is placed under the appro-priate subclasses of 409+ and is cross-referenced in 422.

(4) Note. Where a plurality of reflectivecolored standards are claimed in thecomparison of a gaseous or solid coloredsubstance and the comparison is notedvisually or photoelectrically without theinclusion of filters, the original is classi-fied under subclass 421 and cross-refer-enced in subclass 425.


February 2011

SEE OR SEARCH THIS CLASS, SUB-CLASS:409+, for analyzing chemical solutions by

comparing colors on the basis ofintensity alone. See (3) Note above.


ing Solids, particularly subclass 581,where articles are physically sepa-rated on the basis of color by usingonly a light intensity test.

250, Radiant Energy, subclass 214 for cir-cuits responsive to photosensitivedevices which do not claim a supportfor articles examined for color by alight intensity test or do not claim anindicator.

362, Illumination, subclass 249.08 for lightprojectors which include a source ofillumination together with means tomodify the direction of the light fromthe source and structure to house thelight arrangement.

426 BY INSPECTION WITH AGITATION ORROTATION:This subclass is indented under the class defini-tion. Subject matter wherein there is apparatusto inspect articles of manufacture, includingcontainers and contained fluids for foreign par-ticles such as dirt, and which includes means tosupport and rotate, agitate, or otherwise movethe containers or the fluid contents to causemotion of the article or of the particles in thefluid contents as part of the test procedure andnot as a condition of transporting the article toand from the test location; and means to illumi-nate the article so that the illumination may betransmitted through the articles, containers orcontained fluid or reflected from the article orcontainer, or transmitted around portions of anarticle for the purpose of testing for defects,blemishes, flaws or any other type of imperfec-tion.

(1) Note. Conveyors may be utilized tobring the articles to and beyond the testposition and may be part of the test com-bination claimed where no specific classprovides for the combination.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.1+, for apparatus which visually inspects

materials or articles for imperfections.

427 Of container contents:This subclass is indented under subclass 426.Subject matter wherein the supported androtated or agitated articles are containers hold-ing fluids, and the inspection is directed to thefluid itself, the inspection of the containerbeing incidental.

(1) Note. Subclasses 337+ deal with fluidswhich have uniformly entrained withinthem particles which cause scatteringwhen tested by a directed beam of lighttransmitted through the fluid. Here theparticles entrained do not create a uni-form condition, but a localized undesiredimperfection within the encapsulated orcontained fluid.


61.41+ for the testing of suspensionsof solids in liquids for determining theratio of solid and like foreign mattersto the liquid.

250, Radiant Energy, subclasses 564+ forfluent material in the optical path anda photocell circuit; and subclasses573+ for the detection of a fluentmaterial in the optical path.

428 Of containers:This subclass is indented under subclass 426.Subject matter wherein the article is a containeror receptacle which is tested by means of lighttransmitted through or reflected from the con-tainer or receptacle.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for the transmission or reflective test-

ing of containers for flaws or dirtwhich uses ultraviolet or infrared radi-ation in addition to visible light.

240.1+, for visual and photoelectric examina-tion of containers for flaws or dirtwherein no rotation of the container isinvolved.


1February 2011


61.41+ for sediment or foreign con-tent testing where the ratio or amountof the sediment or the foreign contentto the liquid would be determined.

209, Classifying, Separating, and Assort-ing Solids, subclasses 524+ for thetesting of containers for flaws by theuse of visible light and the automaticrejection of the flawed containers as aresult of this test.

250, Radiant Energy, subclass 224 foroptical or prephotocell systems whichinclude a support for an article to betested and structure to relatively movethe light ray and the article during thetest; subclasses 336.1+ for methodsand apparatus having an electric sig-nalling device responsive to invisibleradiation for testing articles; and sub-classes 453.11+ for supports for irra-diated objects.

429 BY MONITORING OF WEBS ORTHREAD:This subclass is indented under the class defini-tion. Subject matter for inspecting or testingwebs or threads of material including apparatusto support and transport the web under, over, orthrough an inspection station; a light sourcewith optical means (which may include flyingspot scanners) to direct the light through,around, or reflective from the web or thread;visual and photoelectric means (including com-parator types) to detect changes in the lightintensity produced by the light coacting withthe web or thread; and with the photoelectricalternative an indicator responsive to the pho-toelectric means to not quantitatively or quali-tatively variations in optical properties orcondition.

(1) Note. When an optical test is claimed ona web or thread including an indicator,qualitative or quantitative, actuated inresponse to the test, classification is hererather than in Class 250, subclasses 548and 559.01+.

(2) Note. When the claims include a lightsource for the test, a support for thematerial tested, and a photosensitive

detector without the indicator classifica-tion is in this Class 356 as opposed toClass 250.

(3) Note. The claimed terms “rejectmeans,” “reject mechanism,” or “indica-tor means” do not necessarily qualify asan indication means for this class asthese terms could be a relay mechanismor other switch mechanism which is nota qualitative or quantitative signallingmeans for this class. A single disclosureto an indicator, qualitative or quantitativewith the term reject means claimed willbe classified in this subclass 429 pro-vided its indicator is not part of a morecomprehensive arrangement classifiedelsewhere. For example, see Class 209.

SEE OR SEARCH THIS CLASS, SUB-CLASS:242.1, for the counting of threads in woven

fabrics where the fabric is stationary.384+, for the determination of the width or

diameter of a web or filament.


159+ for the testing or inspection ofsheet material, including woven fabricmaterials where no optical tests, perse, are performed.

162, Paper Making and Fiber Liberation, subclasses 198 and 252+ for processand apparatus wherein an optical testmay be utilized to control a papermaking or fiber liberation process.

226, Advancing Material of IndeterminateLength, subclasses 3 and 15+ for pro-cesses and apparatus which utilizeoptical tests to laterally position amoving web.

250, Radiant Energy, subclasses 439+ forray energy devices combined with asupport for an article; subclasses 361+for testing articles by using fluores-cent or phosphorescent radiation; sub-classes 336+ for the testing of articlesby invisible radiations; subclasses548, 559, and 571 for apparatus to sig-nificantly illuminate weblike materialand to detect the illumination as modi-fied by the weblike material; sub-classes 229+ for adjustable light


February 2011

masking devices; and subclass 237where the light masking devices arenot adjustable. See also (1) and (2)Notes above.

340, Communications: Electrical, sub-classes 227+ and 259+ for deviceswhich are responsive to visible lighttests to denote and indicate, by meansof an electrically operated bell orlight, the condition of a web, includ-ing motion picture film.

346, Recorders, subclass 33 for nominaloptical test devices which operate arecorder of the Class 346 type wherethere is novelty in the recorder, per se.

352, Optics: Motion Pictures, subclasses105+ for continuously moving filmswith optical viewers involving a peri-odic displacement of the optical axisfor the purpose of inspecting thefilms, including flaw detection.

396, Photography, subclasses 567+ forfluid-treating apparatus where a lighttest is made to determine the value oflight contrast of the exposed film toregulate the apparatus.

430, Radiation Imagery Chemistry: Pro-cess, Composition, or ProductThereof, process involving exposureof a radiation imagery receiver.

430 For flaws or imperfections:This subclass is indented under subclass 429.Subject matter wherein the web or thread istested for flaws or imperfections.

(1) Note. The test for flaws or imperfectionsis usually manifested by a local variationin an optical characteristic of the mate-rial which stands out in contrast with thegeneral or normal optical characteristics.This test is in contrast with the testingfor the general reflecting or transmissionproperties of the web, and which is pro-vided for in the generic subclass 429.

SEE OR SEARCH THIS CLASS, SUB-CLASS:238, for cloth inspection for flaws where

the cloth is stationary.

SEE OR SEARCH CLASS:250, Radiant Energy, subclasses 548 and

559.01+ for web, strand, or records in

the optical path where the lightresponsive element is not combinedwith an indicator; and subclass 237for diaphragms, masks, or gratingscombined with a photocell.

359, Optical: Systems and Elements, sub-classes 894+ for a light mask, per se,where there is not intentional devia-tion of the light as by refraction or dif-fraction.

431 Including transverse scanning:This subclass is indented under subclass 430.Subject matter including means for scanning ina direction other than the line of travel of amoving web or thread.

432 FOR LIGHT TRANSMISSION ORABSORPTION:This subclass is indented under the class defini-tion. Subject matter wherein visible radiationis passed directly or with internal reflectionthrough solid, liquid, or gaseous substances orany mixture thereof including coated solids,and detected visually or photoelectrically afterit has passed through the substance for the pur-pose of determining the intensity, the change ofintensity, the extinction of the radiation, or theoutline of the radiation source or image.

(1) Note. As between this class (356) andClass 250, the claimed combination of alight source, a support for a substance tobe tested by a transmission test, and aphotosensitive detector with or withoutindicating structure is classified in thisclass (356) providing there is the disclo-sure of an indicator responsive to thedetector not provided for elsewhere. Ifan indicator of the quantitative type suchas a meter is present in the claimed com-bination, classification is in class (356)regardless of the claiming of the support.

(2) Note. The patents claiming a lightsource with the transmission of this lightthrough a substance and detected (usu-ally quantitatively) are in subclasses432+. If no light source is claimed andonly the light intensity of a specific loca-tion or locations is involved and not theamount of light attenuated in the passageof the light through a medium or a sub-stance, or only the intensity or a light


1February 2011

source is desired without regard to theattenuation of the light in its passagethrough a medium, see subclasses 213+on photometry.

SEE OR SEARCH THIS CLASS, SUB-CLASS:213+, for photometers. See also (2) Note

above.402+, for colorimetry.445+, for light reflection measuring and test-

ing.


ing Solids, subclass 588 for automati-cally assorting articles by light trans-mission inspection.

250, Radiant Energy, especially sub-classes 218 and 219 for photocell sys-tems with articles or material in theoptical path. See also (1) Note above.

433 By comparison:This subclass is indented under subclass 432.Subject matter wherein light is passed througha specimen to be tested and compared in inten-sity with some other light, whose intensity isknown or may be determined.

(1) Note. The light may be in beam formand the standard light may also bepassed through a light-modifyingmedium. The specimen and standardlight may emanate from a commonsource.

SEE OR SEARCH THIS CLASS, SUB-CLASS:46+, for optical pyrometers with incandes-

cent standards.229+, for visual comparison photometers.402+, for shade or color comparison.443+, for film density determination involv-

ing comparison.

434 Photoelectric (e.g., sequential viewing):This subclass is indented under subclass 433.Subject matter including a photosensitivedevice which is responsive to the light passingthrough the specimen.

SEE OR SEARCH THIS CLASS, SUB-CLASS:218+, for photoelectric photometers of the

comparator type.402+, for colorimeters of the photoelectric

comparator type.


photocell circuits of the comparatortype with optical or prephotocell sys-tems; and subclasses 204+ for controlof the light used by the systemdirectly or indirectly as by controllingthe optical elements in the light pathto the photocell detector.

435 With plural detectors (e.g., simultaneousviewing):This subclass is indented under subclass 434.Subject matter including a plurality of photode-tectors, usually one being stimulated by thelight from the specimen and the other beingstimulated by the standard light.

SEE OR SEARCH THIS CLASS, SUB-CLASS:222, for photometers with plural detectors.


plural photocell controlled circuits;and subclass 578 for optical or pre-photocell systems containing pluralphotocells.

436 Of fluent material:This subclass is indented under subclass 432.Subject matter wherein visible radiation isdetected after passing through a fluid sub-stance.

SEE OR SEARCH THIS CLASS, SUB-CLASS:246, for fluid containers, per se, peculiar to

testing.335+, for determining the size of the parti-

cles or the size and the number of theparticles present in a turbid solution.

337+, for particle light scattering whereinthe light detected is that reflectedfrom the particles in the turbid sus-pension.


February 2011


64.41+ for the testing of the settlingrate of a liquid suspension of solids.

250, Radiant Energy, subclasses 564+ forcircuits for evaluating a fluent mate-rial; and subclasses 573+ for photocelldetection of fluent material in an opti-cal path.

437 Gas:This subclass is indented under subclass 436.Subject matter wherein the fluent material is agaseous substance.

438 Exhaust, dust or smoke:This subclass is indented under subclass 437.Subject matter wherein there is a gas whichincludes entrained solid particles of dust orsmoke.

(1) Note. Both visual and photoelectricdetection devices of the static and theflowing type are here.

(2) Note. For light transmission testsinvolving chemical concentration ofgases which do not contain particulatematerial, see the colorimeters in sub-classes 402+ above.

(3) Note. This subclass only provides fortesting the transmission characteristic ofa gas with particles of dust or smoke uni-formly distributed therethrough. Fortesting the transmission characteristic ofgases, per se, see subclasses 402+ wherecolor is involved, or subclass 437 above.

(4) Note. Included are the apparatus todetermine the particle count in gases bymeans of light transmitted through theparticle-containing gas.

SEE OR SEARCH THIS CLASS, SUB-CLASS:36+, for the preparation of sample gases

which may include entrained moistureand/or particles such as “condensationnuclei,”

246, for fluid containers, per se.

337+, for the detection of light scattered bythe entrained particles or moisture in aflowing or static gas.

441+, for liquid particle suspension testing.

439 Contained:This subclass is indented under subclass 438.Subject matter wherein there is structure toenclose, at least partially, a gas which hasentrained dust or smoke particles.

440 With significant sample holder or supply:This subclass is indented under subclass 436.Subject matter including particular structuralmeans to constrain, contain, move, or guidefluent material in the light beam.

SEE OR SEARCH THIS CLASS, SUB-CLASS:239+, for the detection of flaws or imperfec-

tions in motionless containers bypassing light therethrough.

246, for sample holders for fluids, per se,peculiar to testing.

428, for the inspection of containers inmotion.


864.91 for strip cups.206, Special Receptacle or Package,

appropriate subclasses or receptaclesof general use which are not restrictedto use in optical testing of materials.

250, Radiant Energy, subclasses 428+ forfluent material containers, supports,or transfer means for subjecting thematerial to radiation; and subclass 576for sample holders or supply means offluent material in an optical path.

422, Chemical Apparatus and Process Dis-infecting, Deodorizing, Preserving, orSterilizing, subclasses 500 through555 for laboratory apparatus ele-ments which may include fluid con-tainers. An alternative electronicsearch of U.S. patents based upon amodification of the European PatentOffice Classification (ECLA) Systemfor certain subject matter in this sub-class may also be found in Class 422Cross-Reference Art Collections 908 -948. (There are no definitions associ-ated with these Cross-Reference Art


1February 2011

Collections. The most available dis-closure as to the types of documentscontained herein is given in any notesassociated with the titles.)

441 Having particles suspended in liquid:This subclass is indented under subclass 436.Subject matter including in the light path, liq-uid particle suspensions, such as turbid orcoloidal suspensions, paint, or milk; andincluding a detector and indicator of the trans-mitted radiation through the liquid which iscorrelated to the turbidity of the solution or thenumber of the particles causing the turbidity.

(1) Note. Both static and through-flow typetest devices are included.

(2) Note. In visual turbidity devices of thestatic and extinction type, scales areassociated with the devices to note thedepth at which the extinction of lightoccurs.

SEE OR SEARCH THIS CLASS, SUB-CLASS:39, for determining characteristics of

blood particles present in a sample.246, for fluid containers, per se, peculiar to

testing.335+, for determining the size of the parti-

cles or the size and the number of theparticles present in a turbid solution.

337+, for particle light scattering whereinthe light detected is that reflectedfrom the particles in the turbid sus-pension.


64.66 for the testing of the settlingrate of a liquid suspension of solids.

250, Radiant Energy, subclasses 564+ forcircuits for evaluating a fluent mate-rial; and subclasses 573+ for photocelldetection of fluent material in an opti-cal path.

442 With light detector:This subclass is indented under subclass 441.Subject matter including photosensitive meansresponsive to light passing through the fluentmaterial.

443 Of photographic film:This subclass is indented under subclass 432.Subject matter wherein structure is provided totransmit light through a sheet, strip, or othertranslucent solid medium of a photographicnature, with provision to position the mediumso that the light is transmitted either through allor selected portions of the medium, togetherwith means to visually or photoelectricallydetermine the intensity of the transmitted light.

(1) Note. Included in this subclass are pho-toelectric apparatus and visual apparatuswhich permit the visual comparison ofthe intensity of the light transmittedthrough a photographic negative withbrightness standards or with lightsources whose intensity can be varied ina calibrated manner by means of variableapertures or light attenuating mediumsor with variable light sources.

(2) Note. For photographic enlargers of thelight projection type, see Class 355, Pho-tocopying. The apparatus of these sub-classes 443+ when claimed incombination with the structure of suchan enlarger or when claimed as control-ling the light of such an enlarger is clas-sified in Class 355, Photocopying,subclasses 67+.

(3) Note. For printers of the contact type,see Class 355, Photocopying, subclasses78+; and for processes of this type whichinvolve the exposure of a visible lightsensitive medium or use of developednegative, see Class 430, Radiation Imag-ery Chemistry: Process, Composition,or Product Thereof. If as claimed theapparatus of subclasses 443+ is com-bined with a contact-type printer appara-tus, or controls the exposing light of acontact printer, classification is in Class396. For methods which involve thecomparison of optical densities of thetype found in subclasses 443+ in combi-nation with an exposure of a visible lightsensitive film, see particularly Class 96,subclasses 27+.

(4) Note. The photometers which analyzethe spectrographs such as formed by the


February 2011

instruments of subclasses 302+ of thisclass are classified in these subclasses443+.

SEE OR SEARCH THIS CLASS, SUB-CLASS:51, for instruments responsive to infrared

or ultraviolet and visible radiationbeing transmitted through a translu-cent solid medium in combinationwith means to measure the intensity ofthe light transmitted through themedium.

220, for photoelectric apparatus to measurelogarithmically the intensity of light atsome specific location.

243.1+, for light density standards, per se.244, for specimen or standard supports for

passing light through a solid.404, for examination of the color proper-

ties of photographic negatives.405, for photographic printing apparatus of

the color type which includes colorcorrection whereby light of at leastthree different colors is transmittedthrough a developed negative and theintensities of the various colors neces-sary to make a duplicate of the nega-tive.

SEE OR SEARCH CLASS:355, Photocopying, subclasses 67+ for

photographic enlargers of the projec-tion type with apparatus to measurethe minimum and maximum opticaldensities of the developed negativefrom which copies are to be made.See also (2) Note above and sub-classes 78+ for printers of the contacttype. See (3) Note above.

396, Photography, subclasses 213+ for act-inometer with camera, and subclass563 for making of optical wedges byexposing photographic material.

444 With scanning, sweeping, or moving detec-tor over film:This subclass is indented under subclass 443.Subject matter wherein directed light transmit-ted through the sheet, strip, or other translucentsolid medium is moved in a predeterminedmanner either by electronic means or bymechanically moving optical means; orwherein the sheet, strip, or other solid medium

is moved past the light source; or wherein thephotoelectric means is moved selectively aboutthe surface of the film sheet, strip, or mediumin order to obtain the intensity of the lighttransmitted at a plurality of locations throughthe film sheet, strip, or other solid medium.

SEE OR SEARCH THIS CLASS, SUB-CLASS:429+, for apparatus which monitors moving

webs of the translucent, transparent,or opaque type.

614, where the amount of displacement ismeasured.

SEE OR SEARCH CLASS:250, Radiant Energy, subclasses 555+ and

566+ for photoelectric apparatus todetect records such as photographicfilm; and subclasses 336.1+, espe-cially subclasses 359.1 and 360.1, formethods and apparatus to inspect rela-tively moving objects with respect toinvisible radiant energy with a radia-tion responsive electric signallingdevice.

358, Facsimile and Static Presentation Pro-cessing, subclasses 474 through 498 and 500-540 for optical devices of thefacsimile type which utilize flyingspot scanner light beams for transmis-sion through a film or films for thepurpose of detecting the optical den-sity for reproducing a facsimile typepicture.

396, Photography, subclasses 567+ forfluid-treating apparatus whichincludes a photocell for performing anoptical density check on the filmbeing processed, and means for con-trolling the apparatus.

445 OF LIGHT REFLECTION (E.G., GLASS):This subclass is indented under the class defini-tion. Subject matter which includes either amaterial or a sample designed to be placed nextto or upon a material or sample to be examinedon the basis of reflected light intensity; andwhich includes either light generating and opti-cal means to direct the generated light, or opti-cal means to direct natural light onto thematerial or sample to be examined, so that thelight is reflected therefrom for examination byvisual or photosensitive means to indicate or


1February 2011

record, when so desired, the intensity or differ-ences of intensity of the reflected light.

(1) Note. This subject matter is limited tosurface reflection.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.1+, for visual light inspection apparatus

which check for local variations in theoverall light intensity from articles ormaterial as caused by imperfections orflaws.

300+, for dispersion type test apparatuswhich reflects light from standards orunknown substances at selected fre-quencies.

369, for measuring or testing surfacereflection using polarized light.

402+, for devices which measure the inten-sity of light reflected from materialsor the comparison of colors by meansof reflective standards.

625, for mensuration devices with whichmeasurement is based upon the inten-sity of light reflected from an articleor material.


for the determination of vapor contentof a gas by light scattering of a lightbeam reflected from a test surface;subclasses 104+ for surface testing;and subclass 160 for measuring thelight intensity of a reflected beam oflight from a dyed thread sample whichis indicative of the color of the sam-ple.

209, Classifying, Separating, and Assort-ing Solids, subclasses 580+ and 587for radiant energy devices which sep-arate articles physically on the basisof the intensity of reflected radiationwhich is correlated to the surface orthe color of the article.

250, Radiant Energy, subclasses 216+wherein light reflected from articles,material, or animate beings controls aphotosensitive detector.

340, Communications: Electrical, sub-classes 227, 234, and 235 for electri-cal signalling apparatus which utilizethe intensity of reflected light to note

a change of condition including iceformation, moisture, or humidity con-ditions.

446 With diffusion:This subclass is indented under subclass 445.Subject matter wherein the light reflected fromthe material or sample is scattered by reason ofthe surface irregularities of the material or sam-ple alone; or wherein the reflected light is acombination of the scattered light and specu-larly reflected light; or wherein the reflectedlight is scattered from particles distributed onthe surface of the material.

SEE OR SEARCH THIS CLASS, SUB-CLASS:237.1+, for inspection of material or articles

for flaws which include the detectionof contaminants such as dirt within abottled fluid.

337+, for light scattering caused by more orless uniformly distributed particlesinternally in a fluid, liquid, or gaswhich may be moving or static.

427, for light scattering caused by contami-nants, such as dirt or other particles,which are entrained in encapsulated orbottled fluids, where agitation or rota-tion is used to cause the unwantedparticles to move about within thefluid.

448, for comparison apparatus of thereflected light type which does notinvolve light diffusion.

447 With modulation (e.g., flicker beam):This subclass is indented under subclass 445.Subject matter including devices which modifythe light reflected from the material or article ina repetitive manner, mechanically or otherwise.

(1) Note. Comparative reflecting devices ofthe modulator type are classified here.

SEE OR SEARCH THIS CLASS, SUB-CLASS:217, for photometers of the modulating

type both visual and photoelectricwherein the light intensity at somelocation alone is desired.

314+, for spectrophotometers which utilizemechanical, electrical, or optical mod-ulators including the polarized light


February 2011

type to obtain the light intensities orthe difference in light intensities forone or more frequencies of visiblelight where a dispersing means is usedto obtain the various frequencies oflight.

418, for colorimeters which utilize lightmodulators.

448 By comparison:This subclass is indented under subclass 445.Subject matter including visual or photoelectricapparatus which compares the reflected light inintensity from the sample or material with thelight from a standard material or article.

(1) Note. The usual comparator typeincludes regular and stereomicroscopeswherein a comparison of the reflectedlight intensity is made with a standard,which may be a photograph, where nodimensional length, profile, color pluslight intensity, or flaw check is involved.

SEE OR SEARCH THIS CLASS, SUB-CLASS:402+, for comparison systems of the visual

and photoelectric type which arebased upon the frequency and theintensity of light reflected from atleast the unknown material or sample.

SEE OR SEARCH CLASS:250, Radiant Energy, subclasses 208 and

578 for plural light sources and photo-cells which may be used in a compar-ator of light intensity as reflected froma sample or material with a standardlight intensity where no indicator ortest material support is claimed.

340, Communications: Electrical, sub-classes 146.3 and 5.1-5.92 which mayutilize the intensity of light asreflected from documents to note theposition of identifying marks or itemson the documents.

359, Optical: Systems and Elements, sub-class 373 for compound lens systemsof the object comparator type.

382, Image Analysis, subclass 112 whichmay utilize the intensity of light asreflected from the document to denotethe information content.

450 BY LIGHT INTERFERENCE (E.G.,INTERFEROMETER):This subclass is indented under the class defini-tion. Subject matter in which plural coherentlight beams interact to produce a cancellationor reinforcement of wave energy, for measur-ing or testing.

SEE OR SEARCH THIS CLASS, SUB-CLASS:4.09+, for range or remote distance measur-

ing wherein a photo detector isresponsive to light interferencefringes.

28.5, for light interference measurement ofvelocity.

35.5, for material strain analysis by lightinterference measurement and testing.

242, for moire pattern templates for thedetermination of the number ofthreads in a fabric such as a stocking.


700 for an interferometer combinedwith a mechanical arrangement forcontacting the work piece.

73, Measuring and Testing, subclass 655for interferometric vibration measur-ing.

250, Radiant Energy, subclass 231.13 forshaft angle transducers, 237 forhoods, grating, baffles, diaphragms,and masks, 227.11 for light conduc-tors, and 550 for interference patterndetection.

318, Electricity: Motive Power Systems, subclass 640 for a positional Servosystem for optical adjustment by feed-back from a light or optical measuringinstrument.

359, Optical: Systems and Elements, sub-class 370 for an interference micro-scope; subclass 489.19 for an opticaldevice using interference effects withpolarized light, not limited to measur-ing or testing; and subclass 577 for anoptical modifying device, in general,which utilizes the phenomenon oflight interference.

399, Electrophotography, subclass 9 fordiagnostics of electrophotography


1February 2011

devices, particularly subclass 31 forimage-forming components.

451 Spectroscopy:This subclass is indented under subclass 450. Measuring and testing by light interferencewherein an interference phenomenon is used toanalyze the spectral characteristics of light.

(1) Note. See Search Notes under subclass300 above.

SEE OR SEARCH THIS CLASS, SUB-CLASS:300, for dispersed light spectroscopic mea-

suring and testing. 402, for filter photometers which analyze

the wavelength and intensity of emit-ted or absorbed light by materials as aresult of reflective or transmissivetests, where filters rather than disper-sive mediums are used to isolatewavelengths of light.


an infrared spectrometer.324, Electricity: Measuring and Testing,

subclass 95 for measuring or testingelectricity having a wave guide orelectrically long line and 96 for mea-suring or testing electricity utilizingradiant energy.

452 Having particular linear mirror drive orconfiguration:This subclass is indented under subclass 451. Spectroscopy further comprising specificdetails of a linear mirror drive or mirror con-figuration of a spectrometer.

SEE OR SEARCH THIS CLASS, SUB-CLASS:455, for spectroscopic measuring further

comprising a rotating, pendulous, orwedge scanning element.


class 871 for mirrors with supportingstructure.

453 Polarization:This subclass is indented under subclass 451. Spectroscopy wherein the interfering beamsare created using a polarized interferometer.

SEE OR SEARCH THIS CLASS, SUB-CLASS:487, for measuring and testing by light

interference wherein the interactinglight waves are polarized and of dif-fering frequencies.

491, for measuring and testing by lightinterference wherein an interactinglight wave of the interferometer ispolarized.

454 Fabry-Perot type or Etalon type:This subclass is indented under subclass 451. Spectroscopy wherein the interfering beamsare created by at least two parallel surfaces inoptical alignment, at least one of which is par-tially transmissive, forming a resonant cavity.

SEE OR SEARCH THIS CLASS, SUB-CLASS:480, for a Fabry-Perot interferometer fur-

ther comprising a passive opticalwaveguide to conduct one interferingbeam.

506, for a gap measurement using a Fabry-Perot interferometer.

519, for measuring and testing by lightinterference using a Fabry-Perot inter-ferometer having a specific structureor configuration.


classes 577+ for interference filters.

455 Having a rotating, pendulous, or wedgescanning element:This subclass is indented under subclass 451. Spectroscopy wherein scanning is accom-plished by rotating or moving a transmissiveelement in one of the beam paths, or by rotat-ing or pendulously moving a reflector.

SEE OR SEARCH THIS CLASS, SUB-CLASS:452, for a particular linear mirror drive

configuration.


February 2011


classes 871+ for mirrors with support-ing structures.

456 Imaging:This subclass is indented under subclass 451. Spectroscopy matter wherein an interferencephenomenon is used to analyze spectral charac-teristics of light over an entire scanned image.

SEE OR SEARCH CLASS:382, Image Analysis, subclass 280 for

Fourier image transform.

457 Holography:This subclass is indented under subclass 450. Measuring and testing by light interferencewherein at least one of the interference lightbeams is reconstructed from a record of phaseand amplitude information of that light beamwavefront.


interference by wavefront division.499, for measuring and testing a displace-

ment or distance by wavefront divi-sion.

521, for measuring and testing by lightinterference by wavefront division.


for holograms used in vibration test-ing.

250, Radiant Energy, subclass 550 forholographic pattern detection.

359, Optical: Systems and Elements, sub-classes 1+ for basic subject matter inthe field of holography.

458 For optical configuration:This subclass is indented under subclass 457. Holography including means to determine arelative distribution of parts, elements, orexternal form of an object.


classes 15+ for a hologram used as anoptical element.

459 Rotation rate (e.g., ring laser gyros):This subclass is indented under subclass 450. Measuring and testing by light interferencewherein counter-rotating beams are interferedproducing a signal indicative of a rotation dueto rotation of a gyro about its sensitive axis.

SEE OR SEARCH CLASS:372, Coherent Light Generators, subclass

94 for a resonant cavity having a ringconfiguration.

460 By fiber or waveguide interferometer (e.g.,Sagnac effect):This subclass is indented under subclass 459. Rotation rate wherein beams of differing phaseare generated as a result of counter-propagationof beams in a fiber coil interferometer due torotation of a coil around its sensitive axis.

SEE OR SEARCH THIS CLASS, SUB-CLASS:477+, for measuring and testing by light

interference using a fiber orwaveguide interferometer.

483, for a non-rotation rate Sagnac inter-ferometer.

SEE OR SEARCH CLASS:385, Optical Waveguides, subclass 12 for

an optical waveguide sensor and 14for an integrated optical circuit.

461 Resonant loop:This subclass is indented under subclass 460. Fiber or waveguide interferometer whereinbeams of differing frequency are generated as aresult of counter-rotation of beams in a reso-nant fiber or waveguide cavity.

SEE OR SEARCH CLASS:372, Coherent Light Generators, appropri-

ate subclasses for laser structure notlimited to measuring or testing.

462 Multi-axis (X-Y-Z) having multiplexing:This subclass is indented under subclass 460. Fiber or waveguide interferometer wherein anoutput is generated as a result of rotation ofmultiple fiber coil interferometers, each havinga different axis of sensitivity, and further com-prising a processing means shared between thedifferent interferometers.


1February 2011

463 Multiple harmonic output:This subclass is indented under subclass 460. Fiber or waveguide interferometer whereinmultiple harmonic outputs of a bias modulationfrequency are generated.

464 Having null feedback loop:This subclass is indented under subclass 460. Fiber or waveguide interferometer wherein afeedback loop is used to null a phase differencedue to a coil rotation.

465 Fiber coil winding:This subclass is indented under subclass 460. Fiber or waveguide interferometer wherein aspecific coil winding is used to compensate fornon-reciprocal effects on a fiber coil.

SEE OR SEARCH CLASS:242, Winding, Tensioning, or Guiding,

appropriate subclass for a process orapparatus for progressively windingelongated flexible material more than360° about an axis of a take-up ofrestricted length.

466 Having m x n loop coupler where m isgreater than 2 and n is greater than or equalto 2 (e.g., passive bias):This subclass is indented under subclass 460. Fiber or waveguide interferometer wherein apassive phase bias between counter-rotatingbeams is produced by a coil coupler.

467 Four frequency, multi-oscillator, non-pla-nar cavity:This subclass is indented under subclass 459. Rotation rate wherein at least four counter-rotating frequencies co-exist within an interfer-ometer cavity.

SEE OR SEARCH CLASS:385, Optical Waveguides, subclasses 15+

for optical waveguides with opticalcouplers.

468 Cavity output beam combiner:This subclass is indented under subclass 459. Rotation rate wherein specific beam combiningstructure is used to combine counter-rotatingbeams outside a cavity.

469 Cavity mirror details:This subclass is indented under subclass 459. Rotation rate including specific cavity mirrorstructure.

SEE OR SEARCH CLASS:310, Electrical Generator or Motor Struc-

ture, subclasses 311+ for piezoelec-tric elements and devices.

372, Coherent Light Generators, subclass107 for a particular resonant cavityhaving mirror support or alignmentstructure.

470 Passive cavity (laser source outside cavity):This subclass is indented under subclass 459. Rotation rate wherein a beam source is locatedoutside of a resonant interferometer cavity.

471 Multi-axis cavity:This subclass is indented under subclass 459. Rotation rate wherein different interferometercavities share at least one common mirror.

472 Lock-in prevention:This subclass is indented under subclass 459. Rotation rate wherein a bias is used to separatefrequencies of beams at low rotation rates.

473 Path length control (PLC):This subclass is indented under subclass 472. Lock-in prevention wherein a path length of acavity is maintained at a specific frequency.

474 Having dither signal removal from output:This subclass is indented under subclass 472. Lock-in prevention wherein a system oscillat-ing signal is extracted from an output signal.

475 Having dither signal control:This subclass is indented under subclass 472. Lock-in prevention further comprising a meansto control oscillating of a system.

476 By dithering (suspensions, drives, flexures):This subclass is indented under subclass 472. Lock-in prevention wherein specific mechani-cal structure is used in biasing the interferome-ter by dithering (oscillating) the interferometer.


February 2011

SEE OR SEARCH CLASS:310, Electrical Generator or Motor Struc-

ture, subclasses 311+ for piezoelec-tric elements and devices.

477 Using fiber or waveguide interferometer: This subclass is indented under subclass 450. Measuring and testing by light interferencehaving a passive optical waveguide to conductat least one of the interfering beams.

(1) Note. The term 'passive' is intended toexclude interferometers in which thefiber or waveguide includes a laser.

SEE OR SEARCH THIS CLASS, SUB-CLASS:460+, for the generation of beams of differ-

ing phase as a result of counter-propa-gation of the beams in a fiber coilinterferometer due to rotation of thecoil around its sensitive axis.


light conductors.372, Coherent Light Generators, appropri-

ate subclasses for laser structure notlimited to measuring or testing.

385, Optical Waveguides, appropriate sub-class for optical waveguides.

478 Multiplexed sensor array:This subclass is indented under subclass 477. Fiber or waveguide interferometer wherein aplurality of sensors are connected in an array.

479 Having a short coherence length source:This subclass is indented under subclass 477. Fiber or waveguide interferometer wherein thecoherence length of a light source is such thatinterference occurs only within a very narrowrange of path length difference.

480 Resonant cavity:This subclass is indented under subclass 477. Fiber or waveguide interferometer wherein thebeams to be interfered are created by a resonantcavity or resonant loop.

SEE OR SEARCH THIS CLASS, SUB-CLASS:454, for the spectral analysis of light using

a Fabry-Perot or Etalon interferome-ter.

461, for a resonant loop for rotation ratedetection.

519, for measuring or testing by light inter-ference using a Fabry-Perot interfer-ometer having a specific structure orconfiguration.

481 Refraction indexing:This subclass is indented under subclass 477. Fiber or waveguide interferometer wherein achange in phase between interfering beams isdue to some change in refraction index in oralong at least one of the beam paths.


interference using refractive indexing.

482 For distance or displacement measurement:This subclass is indented under subclass 477. Fiber or waveguide interferometer wherein thefiber interferometer is arranged to measuresmall changes in position of an article or smalllength of space between two points.

SEE OR SEARCH THIS CLASS, SUB-CLASS:486, for measuring displacement or dis-

tance having light beams of differentfrequencies.

493, for measuring displacement or dis-tance having a polarized beam.

498, for measuring displacement or dis-tance by light interference.

483 Plural counter-propagating beams (e.g.,non-motion Sagnac device):This subclass is indented under subclass 477. Fiber or waveguide interferometer wherein anoptical fiber or waveguide forms a closed loopthrough which the interacting light beamstravel in opposite directions.

484 Having light beams of different frequencies(e.g., heterodyning):This subclass is indented under subclass 450. Measuring and testing by light interference


1February 2011

wherein the coherent light beams are of differ-ent frequency.

485 For dimensional measurement (e.g., thick-ness gap, alignment, profile):This subclass is indented under subclass 484. Measuring and testing using light beams of dif-ferent frequency wherein the interference pat-tern is indicative of the height, width, depth,thickness or change in a position of an object.

SEE OR SEARCH THIS CLASS, SUB-CLASS:482, for measuring distance or displace-

ment using a fiber or waveguide inter-ferometer.

492, for measuring dimensions furthercomprising a polarized beam.

496, for measuring dimensions by lightinterference.


for the use of radiant energy in mea-suring dimensions.

486 Displacement or distance:This subclass is indented under subclass 485. Dimensional measurement wherein the inter-ferometer is arranged to measure small changesin position of an article or small length of spacebetween two points.

SEE OR SEARCH THIS CLASS, SUB-CLASS:482, for measuring distance or displace-

ment using a fiber or waveguide inter-ferometer.

493, for measuring displacement or dis-tance further comprising polarizedlight.


the use of radiant energy in longitudi-nal measurements.

487 Polarization:This subclass is indented under subclass 486. Distance or displacement measurement inwhich interacting light waves of a heterodyn-ing interferometer are polarized.


interference wherein an interactinglight wave of the interferometer ispolarized.

493, for measuring displacement or dis-tance having a polarized beam.

488 Having wavefront division (e.g., by diffrac-tion):This subclass is indented under subclass 487. Polarization wherein the beams to be combinedare obtained by dividing the wavefront of aninput beam.

SEE OR SEARCH THIS CLASS, SUB-CLASS:494, for measuring and testing displace-

ment or distance with wavefront divi-sion wherein the interacting lightbeams are polarized and of the samefrequency.

499, for measuring and testing displace-ment or distance with wavefront divi-sion wherein the interacting lightbeams are of the same frequency.

521, for measuring and testing by wave-front division by light interference.


for shaft angle transducers and 237 forhoods, grating, baffles, diaphragms,or masks.

489 Contour or profile:This subclass is indented under subclass 485. Dimensional measurement including means fordetermining a contour, profile, or shape of asurface.

SEE OR SEARCH THIS CLASS, SUB-CLASS:495, for measuring a contour or profile

using polarized light.511, for measuring a contour or profile by

light interference.


the measurement of a surface contourusing radiant energy.


February 2011

490 Alignment:This subclass is indented under subclass 485. Dimensional measurement further comprisinga means to determine an alignment of a surfacerelative to a reference line or plane.

491 Having polarization:This subclass is indented under subclass 450. Measuring and testing by light interferencewherein an interacting light wave of the inter-ferometer is polarized.

SEE OR SEARCH THIS CLASS, SUB-CLASS:453, for spectral analysis.487+, for measuring and testing by light

interference wherein the interactinglight waves are polarized and of dif-fering frequencies.


measuring position using radiantenergy.

359, Optical: Systems and Elements, sub-class 498 for an optical device usinginterference effects with polarizedlight, not limited to measuring or test-ing.

492 For dimensional measurement:This subclass is indented under subclass 491. Polarized light wherein the interference patternis indicative of the height, width, depth, thick-ness or change in a position of an object.


tance using a fiber or waveguide inter-ferometer.

485+, for measuring displacement or dis-tance using light beams of differentfrequencies.

496, for a measuring dimensions by lightinterference.




486+, for measuring displacement or dis-tance using light beams of differentfrequencies.

498+, for measuring displacement or dis-tance by light interference.



494 Having wavefront division (e.g., by diffrac-tion):This subclass is indented under subclass 493. Displacement or distance wherein the beams tobe combined are obtained by dividing thewavefront of an input beam.


tance using light beams of differentfrequencies and further comprisingwavefront division.

499, for measuring displacement or dis-tance further comprising wavefrontdivision.

521, for measuring and testing by lightinterference with wavefront division.


for shaft angle transducers and 237 forhoods, grating, baffles, diaphragms,and masks.


SEE OR SEARCH THIS CLASS, SUB-CLASS:489, for a contour or profile measurement

using a light beams of different fre-quencies.


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511+, for a contour or profile measurementby light interference.



496 For dimensional measurement:This subclass is indented under subclass 450. Measuring and testing by light interferencewherein an interference pattern is indicative ofa height, width, depth, thickness or change in aposition of an object.

SEE OR SEARCH THIS CLASS, SUB-CLASS:482, for measuring a displacement or dis-


485+, for measuring a dimension using lightbeams of different frequencies.

492+, for measuring and testing a dimensionusing polarized light.



497 Having short coherence length source:This subclass is indented under subclass 496. Dimensional measurement wherein the coher-ence length of a light source is such that inter-ference occurs only within a very narrow rangeof path difference.


SEE OR SEARCH THIS CLASS, SUB-CLASS:482, for measuring a displacement or dis-


486+, for measuring a displacement or dis-tance using light beams of differentfrequencies.

493+, for measuring a displacement or dis-tance using polarized light.


the use of radiant energy in longitudi-nal measurements.

499 Having wavefront division (e.g., by diffrac-tion):This subclass is indented under subclass 498. Displacement or distance wherein the beams tobe combined are obtained by dividing a wave-front of an input beam.

(1) Note. This is in contrast to a division ofamplitude at a partially reflecting sur-face.

SEE OR SEARCH THIS CLASS, SUB-CLASS:488, for measuring and testing with light

beams of different frequencies furthercomprising wavefront division.

494+, for measuring and testing using polar-ized light with wavefront division.

521, for measuring and testing by lightinterference with wavefront division.


for shaft angle transducers and 237 forhoods, grating, baffles, diaphragms,or masks.

500 X-Y and/or Z table:This subclass is indented under subclass 498. Displacement or distance having specific struc-ture allowing movement in two spacial direc-tions.

SEE OR SEARCH CLASS:33, Geometrical Instruments, subclass 1

for geometrical instruments havingmotion in the x-y direction.

250, Radiant Energy, subclasses 559.19+for the use of radiant energy in mea-suring dimensions.

318, Electricity: Motive Power Systems,subclass 640 for photoelectric or opti-cal-type measuring instruments.

501 Of probe head (e.g., atomic force micro-scope):This subclass is indented under subclass 498. Displacement or distance wherein a displace-


February 2011

ment is due to a force exerted on a measuringor sensing probe head.


700+ for geometrical instrumentsused for measuring distance.

250, Radiant Energy, subclass 309 for anelectron probe.

502 Surface displacement due to acoustic wavepropagation:This subclass is indented under subclass 498. Displacement or distance in which a distancemeasuring interferometer determines smallchanges in article position due to propagationof an ultra sonic wave in a test sample.

SEE OR SEARCH THIS CLASS, SUB-CLASS:432, for measuring and testing using light

transmission and absorption.


655+ for using vibratory techniques tomeasure or test an article furtherincluding a light beam indicator.

503 Thickness:This subclass is indented under subclass 496. Dimensional measurement including measure-ment of an extent of an object in its smallestdirection.


the use of radiant energy in thicknessmeasurements.

504 Refraction from surfaces of different refrac-tive index:This subclass is indented under subclass 503. Thickness measurement wherein refractions ofwavefronts from different surfaces due toSnells law are used to produce an interferencepattern.

505 Gap:This subclass is indented under subclass 496. Dimensional measurement including anarrangement for measuring (a) small changesin a space between articles or (b) a small spacebetween two surfaces.

506 Fabry-Perot type:This subclass is indented under subclass 505. Gap measurement wherein a gap is created byat least two surfaces in optical alignment, atleast one of which is partially transmissive,forming a resonant cavity.

SEE OR SEARCH THIS CLASS, SUB-CLASS:454, for spectral analysis using a Fabry-

Perot interferometer.480, for measuring and testing using a fiber

or waveguide Fabry-Perot interferom-eter.

507 Between slider/disc (e.g., flying height):This subclass is indented under subclass 505. Gap measurement wherein the gap is formedby a read/write head and a record carrier ele-ment.

SEE OR SEARCH CLASS:360, Dynamic Magnetic Information Stor-

age or Retrieval, subclass 75 for theactive control of a recorder or repro-ducer mechanism further includinghead position control and 102+ for afluid bearing head.

508 For orientation or alignment:This subclass is indented under subclass 496. Dimensional measurement including means fordetermining an alignment or orientation of asurface relative to a reference line or plane.


365+ for a level indicating device.250, Radiant Energy, subclass 559.29 for


509 Between mask and wafer:This subclass is indented under subclass 508. Orientation or alignment wherein a referenceplane is a mask and a surface is a wafer.

SEE OR SEARCH CLASS:438, Semiconductor Device Manufactur-

ing: Process, subclass 8 for semicon-ductor manufacture combined with ameasurement or test.


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510 Tilt:This subclass is indented under subclass 508. Orientation or alignment wherein a change inangle of the surface is determined.


SEE OR SEARCH THIS CLASS, SUB-CLASS:489, for a contour or profile measurement

using a light beams of different fre-quencies.

495, for a contour or profile measurementusing polarized light.


the measurement of a surface contourusing radiant energy.

512 By wavefront detection:This subclass is indented under subclass 511. Contour or profile measurement wherein awavefront representative of an area of a surfaceis one of the interfering beams.

513 Of highly reflective surface (e.g. mirror):This subclass is indented under subclass 512. Wavefront detection wherein the wavefront isspecularly reflected from a highly reflectivesurface such as a mirror.

514 Planar surface:This subclass is indented under subclass 513. Highly reflective surface having a physicalcharacteristic of being confined to two dimen-sional space.

515 Of transmission (e.g., lens):This subclass is indented under subclass 512. Wavefront detection wherein the wavefront istransmitted through an object under test.

516 Step height (differential, between points):This subclass is indented under subclass 511. Contour or profile measurement wherein pointson a surface are measured and the differencebetween points is indicative of the profile.

517 For refractive indexing:This subclass is indented under subclass 450. Measuring and testing by light interferencewherein the beams are phased in accordancewith a refractive index to be measured.

SEE OR SEARCH THIS CLASS, SUB-CLASS:481, for measuring and testing using a fiber

or waveguide interferometer furtherincluding refractive indexing.

518 Having Schlieren effect:This subclass is indented under subclass 517. Refractive indexing wherein the interferomet-ric determination of refractive index is com-bined with a Schlieren test.

519 Having partially reflecting plates in series(e.g., Fabry-Perot type):This subclass is indented under subclass 450. Measuring and testing by light interferencewherein the beams to be interfered are createdby at least two surfaces in optical alignment, atleast one of which is partially transmissive, soas to form a resonant cavity.

520 Having shearing:This subclass is indented under subclass 450. Measuring and testing by light interferencewherein the beam to be tested is combined withitself after an introduction of either a radial orlateral shear.

521 Having wavefront division (by diffraction):This subclass is indented under subclass 450. Measuring and testing by light interferencewherein the beams to be combined are obtainedby dividing the wavefront of an input beam.

(1) Note. This is in contrast to a division ofamplitude at a partially reflecting sur-face.

SEE OR SEARCH THIS CLASS, SUB-CLASS:488, for measuring and testing with light

beams of different frequencies furthercomprising wavefront division.

494, for measuring and testing using polar-ized light with wavefront division.


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499, for dimensional measuring and testingby light interference further includingwavefront division.

600 SURFACE ROUGHNESS:This subclass is indented under the class defini-tion. Subject matter for measuring irregular-ity of a surface.

SEE OR SEARCH THIS CLASS, SUB-CLASS:124 through 127, for lens testing or reflec-

tive image former testing.237, for inspection of flaws or interperfec-

tion in material, generally.359, for interferometer type flatness

testers.432, through 444, for optical transmission

testing, generally.445, for optical reflection testing, gener-

ally.446, for measuring diffuse reflection, per

se.601, for measuring shape or surface con-

figuration.


290 through 299 for using a light raytype instrument to indicate the hori-zontal of the line of sight of a device.

601 SHAPE OR SURFACE CONFIGURA-TION:This subclass is indented under the class defini-tion. Subject matter for determining the gen-eral shape of an object or surface.

SEE OR SEARCH THIS CLASS, SUB-CLASS:2, for contour plotting.124 through 127, for lens testing or reflec-

tive image former testing.237, for inspection for flaws or interperfec-

tion in material.359, for interferometer type flatness

testers.388 through 398, for measuring by config-

uration comparison, per se.432 through 444, for optical transmission

testing.445, for optical reflection testing.446, for measuring diffuse reflection.

601, for measuring the shape or surfaceconfiguration of a surface.


290 through 299 for using a light raytype instrument to indicate the hori-zontal of the line of sight of a device.

602 Triangulation:This subclass is indented under subclass 601. Subject matter wherein the measurement isperformed by projecting a beam or pattern oflight onto the surface and detecting the imageof the surface with a spot or pattern thereon andusing triangulation to determine a shape.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3.01 through 3.09, for triangulation rang-

ing to a point with one projectedbeam.

3.1 through 3.12, for triangulation rang-ing with photodetection, but with noprojected beam.

623, for using triangulation to determineposition or displacement.

631, for using triangulation to determinethickness.

603 Projection of structured light pattern:This subclass is indented under subclass 602. Subject matter wherein the projected light pat-tern has structure beyond a point or single lineof sight.

604 Pattern is series of non-intersecting lines:This subclass is indented under subclass 603. Subject matter wherein the projected pattern isa series of non-intersecting lines, such as pro-jected grating.

605 Moire:This subclass is indented under subclass 604. Subject matter wherein an image of the pro-jected pattern of lines is viewed through a grat-ing to create a moire pattern.

SEE OR SEARCH THIS CLASS, SUB-CLASS:618, for moire pattern with scale or grid.


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606 Line of light projected:This subclass is indented under subclass 602. Subject matter wherein a single line of light isprojected unto the surface.

607 Scan:This subclass is indented under subclass 606. Subject matter wherein means such as a rotat-ing or oscillating mirror is used to scan theprojected line of light over the surface beingmeasured.


classes 196.1 through 226.3 for opti-cal scanning means, per se.

608 Scan:This subclass is indented under subclass 602. Subject matter wherein means such as a rotat-ing or oscillating mirror is used to scan the pro-jected line of light over the surface beingmeasured.


classes 196.1 through 226.3 for opti-cal scanning means, per se.

609 By focus detection:This subclass is indented under subclass 601. Subject matter wherein shape or surface con-figuration is determined by focusing a lightbeam or projected pattern onto a surface.

610 By projection of coded pattern:This subclass is indented under subclass 601. Subject matter wherein a coded pattern is pro-jected onto the surface and the location ofpoints onto determine on the surface relative tothe coded pattern is used to determine theshape of the surface.

611 By stereo:This subclass is indented under subclass 601. Subject matter wherein two images from twocameras or other view in are compared todetermine the shape of the surface.

SEE OR SEARCH THIS CLASS, SUB-CLASS:2, for determining a contour plot of a

surface, generally land, through theuse of two stereo images.

388 through 398, for measuring by config-uration comparison, per se.

612 By specular reflection:This subclass is indented under subclass 601. Subject matter wherein the shape of the surfaceof the surface is determined by measuring theangle or direction that a beam of light is specu-larly reflected from the surface.

613 Silhouette:This subclass is indented under subclass 601. Subject matter wherein the shape of the objectis determined from measurements of one ormore silhouettes of the object.

614 POSITION OR DISPLACEMENT:This subclass is indented under the class defini-tion. Subject matter wherein (a) a position orlocation, or (b)a change in position or locationis measured.

SEE OR SEARCH THIS CLASS, SUB-CLASS:3 through 22, for range or remote dis-

tance measurement.4.09, and 4.1, for light interference mea-

surement of displacement or distanceover large distances.

138 through 155, for axial or angularalignment by optical measuring andtesting.

356, and 358, for light interference mea-surement of small displacement ordistance.

399, for alignment in a lateral direction byoptical measuring and testing.

615 Position transverse to viewing axis:This subclass is indented under subclass 614. Subject matter wherein a position or locationgenerally transverse to a viewing axis of themeasuring arrangement is determined.

616 Having scale or grid:This subclass is indented under subclass 615. Subject matter wherein a scale or grating is


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placed on the object to determine position ordisplacement.


707, for measurement of distanceusing optical grid counting.

617 Coded scale:This subclass is indented under subclass 616. Subject matter wherein the scale is coded toindicate a position of the scale relative to aviewing position.

618 Moire:This subclass is indented under subclass 616. Subject matter wherein the scale or grid isviewed through a scale or grid that createsmoire fringes.

SEE OR SEARCH THIS CLASS, SUB-CLASS:605, for use of moire pattern to determine

shape or configuration.

619 Quadrature detection:This subclass is indented under subclass 618. Subject matter wherein moire fringes aredetected at two or more out-of-phase positions.

620 Special mark or target on object:This subclass is indented under subclass 615. Subject matter wherein a target or other markon an object is viewed to determine the posi-tion of the object.

SEE OR SEARCH THIS CLASS, SUB-CLASS:401, for the use of marks or targets to

effect alignment of two objects.

621 Occulting a projected light beam: This subclass is indented under subclass 615. Subject matter wherein a position of an objectis determined by a shadow created when theobject moves into, out of, or through a lightbeam.

622 Position of detected arrangement relative toprojected beam:This subclass is indented under subclass 615. Subject matter wherein a beam of projectedlight strikes a detector or other means, such as

a retro-reflector, and the position of the beamon the detector is indicative of the position.

623 Triangulation:This subclass is indented under subclass 614. Subject matter wherein an image of a projectedbeam or pattern of light on a surface of anobject is viewed from an angle other than alongthe projected beam and the position of the sur-face is determined from the apparent shift inposition of the image of the beam or pattern.



3.1 through 3.12, for triangulation rang-ing with photodetection, but with noprojected beam.

602, for using triangulation to determineshape or surface configuration.

631, for using triangulation to determinethe thickness of an object.

624 Focus:This subclass is indented under subclass 614. Subject matter wherein the position of anobject is obtained from a determination of thedegree of focus of a surface being measured orof a light of pattern projected onto the surface.

625 DIMENSION:This subclass is indented under the class defini-tion. Subject matter wherein a physical dimen-sion of an object is measured.

626 Cavities:This subclass is indented under subclass 625. Subject matter wherein a dimension of a holeor cavity, such as its depth or diameter, isdetermined.

627 Volume: This subclass is indented under subclass 625. Subject matter wherein the volume of anobject is determined.

628 Area:This subclass is indented under subclass 625. Subject matter wherein an area of a generallyplanar configuration is determined.


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629 Light scanning:This subclass is indented under subclass 628. Subject matter wherein an area is determinedby light scanning a surface.

630 Thickness:This subclass is indented under subclass 625. Subject matter comprising means to measurethe distance between opposite surfaces in adirection perpendicular to the length and breathof an object.

631 By triangulation:This subclass is indented under subclass 630. Subject matter comprising means to project abeam or pattern of light onto a surface andusing apparent shift of an image of the beam orpattern to determine thickness of an object.



3.1 through 3.12, for triangular rangingwith photodetection, but with no pro-jected beam.

602, for using triangulation to determineshape or surface configuration.

623, for using triangulation to determineposition or displacement.

632 Of light permeable material:This subclass is indented under subclass 630. Subject matter wherein the thickness of a lightpermeable material is measured.

(1) Note. This subclass includes materialnot completely transparent. The absorp-tion of light as it passes through thematerial is used to determine thickness.

634 Length:This subclass is indented under subclass 625. Subject matter comprising means to measurethe largest dimension of an article, or if thearticle is moving, the dimension in the direc-tion of movement.

635 Width or diameter:This subclass is indented under subclass 625. Subject matter comprising means for measur-ing width or diameter of an object.

636 Line width:This subclass is indented under subclass 635. Subject matter comprising means for measur-ing the width of a feature on a surface.

637 Web:This subclass is indented under subclass 635. Subject matter comprising means for measur-ing the width of a web.

SEE OR SEARCH THIS CLASS, SUB-CLASS:249 through 431, for general monitoring a

web, such as for defects.

638 Shadow or beam blocking:This subclass is indented under subclass 635. Subject matter wherein measurement is deter-mined from an object’s occlusion of a lightbeam.

639 Scanning:This subclass is indented under subclass 638. Subject matter wherein a projected beam oflight is scanned over a surface or a light fromthe object is scanned over a detection arrange-ment by means of an optical scanner, such as arotating or oscillating mirror.

640 Single beam scans entire width or diameter:This subclass is indented under subclass 639. Subject matter wherein the scanning of thebeam is such that it passes across the entirewidth or diameter of the object, being occultedby one edge thereof, and is later unocculted asif passes by the opposite edge of the object.

FOREIGN ART COLLECTIONS

The definitions below correspond to abolished sub-classes from which these collections were formed. Seethe Foreign Art Collection schedule of this class for spe-cific correspondences. [Note: The titles and definitionsfor indented art collections include all the details of theone(s) that are hierarchically superior.]

FOR 100 INSPECTION FOR FLAWS ORIMPERFECTIONS (356/237):Subject matter for determining differencesin the appearance over the surface or over orthrough internal structure of the material(liquid or solid) forming an article or recep-tacle contents, by viewing the surface or


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interior by light reflected from the surface orpassing through the interior of the material,such differences representing flaws, cracks,imperfections, foreign substances or dirt.

FOR 101 Cloth or thread inspection (356/238):Subject matter wherein the article or mate-rial viewed is a woven or knitted fabric or anarticle formed from fabric such as an articleof clothing, the partial transparency of thefabric being provided by the spaces betweenthe fibers.

FOR 102 Passing light through a transparent ortranslucent article (356/239):Subject matter involving structure for pass-ing light through a transparent or translucentmaterial forming an article.

FOR 103 Containers (e.g., bottles) or contents (356/240):Subject matter wherein the transparent ortranslucent articles are formed as recepta-cles, and the receptacles or their liquid con-tents are inspected or examined.

FOR 104 Bore inspection (e.g., borescopes) (356/241):Subject matter which includes optical meanssuch as prisms, mirrors and the like togetherwith their supports providing a light direct-ing means into one end of a bore for facili-tating the inspection of the interior surfaceof the bore from the other end; or lightingmeans combined with the supported meansonto the interior of the bore and to direct thereflected light from the interior surface ofthe bore to the exterior of the bore forinspection purposes.

FOR 105 THREAD COUNTING (356/242):Subject matter for facilitating the visualcounting of threads in a fabric or registeringthe count of the variation produced bythreads on light passing over the threads of afabric.

FOR 106 STANDARDS (356/243):Subject matter including structure forming abasis for optical comparison with the speci-men or portions thereof under test.

FOR 107 BY LIGHT INTERFERENCE (E.G.,INTERFEROMETERS):

Subject matter wherein measuring or testing,coherent light beams interact to pro a can-cellation or reinforcement of wave energy.

FOR 108 Spectroscopy:Subject matter wherein the interference pheis used to analyze the spectral charac oflight.

FOR 109 Holography:Subject matter wherein at least one of theinter light beams is reconstructed from arecord of the phase and amplitude informa-tion of that light beam wavefront.

FOR 110 For optical configuration:Subject matter including means to determinethe relative distribution of the parts or ele, orthe external form of an object.

FOR 111 With light beams of different frequency(e.g., heterodyning):Subject matter wherein light beams of dif-ferent frequency are mixed together in theformation of an interference pattern.

FOR 112 For rotation rate (e.g., ring laser):Subject matter wherein the beams of differ-ing frequency are generated as a result of therota of the interferometer.

FOR 113 With polarization:Subject matter wherein the interacting lightwaves of the interferometer are polarized.

FOR 114 With partially reflecting plates in series(e.g., Fabry-Perot type):Subject matter wherein the beams to be interare created by at least two surface in optialignment, at least one of which is partiallytransmissive.

FOR 115 With shearing:Subject matter wherein the beam to be testedis combined with itself after the introductionof either a radical or lateral shear.

FOR 116 With wavefront division (e.g., by diffrac-tion):Subject matter wherein the beams to be comare obtained by dividing the wavefront of aninput beam.


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FOR 117 For dimensional measurement (e.g.,thickness):Subject matter wherein light interference isexamined to determine the height, width,depth, or change in position of an object.

FOR 118 Of displacement or distance:Subject matter including means for determinsmall changes in position of an article orsmall length of space between two points.

FOR 119 For dimensional measurement (e.g.,thickness):Subject matter wherein the interference pat-tern is indicative of the height, width, depth,or change in position of an object.

FOR 120 Of displacement of distance:Subject matter including means for measur-ing small changes in position of an article orsmall length of space between two points.

FOR 121 For optical configuration:Subject matter wherein one of the lightbeams is reflected from or transmittedthrough an object, to determine the relativedisposition of the parts or elements, or theexternal form of the object.

FOR 122 With two light beams (e.g., Twyman-Green):Subject matter including a reference beam inaddition to the object beam.

FOR 123 For refractive indexing:Subject matter wherein the beams arephased in accordance with a refractive indexto be mea.

FOR 124 With Schlieren effect:Subject matter wherein the interferometricdetermination of refractive index is com-bined with a Schlieren test.

FOR 125 For orientation and alignment:Subject matter including means for determinthe alignment or orientation of a surface rel-ative to a reference line or plane.

FOR 126 FOR FLATNESS:Foreign art collection including opticalstructure to indicate the deviations in lightrays which are reflected from or transmitted

through a material, which deviations are inturn due to deviations in the flatness of thematerial.

(1) Note. The flatness deviation may resultfrom surface or thickness irregularitiesin the material or bends or wrinkles inotherwise flat sheet material.

FOR 127 BY MENSURATION:Foreign art collection including means fordetermining quantifiable characteristics ofan article, such as a dimension, the area of asurface or its precise position with respect toa reference.

(1) Note. This subclass and those indentedthereunder provide for the actual mea-suring or comparing of articles where animage of the article and a scale areviewed. If only the image of a scale isviewed the patent is classified in Class359, subclasses 436+; or Class 353 ifprojection is involved. If only the imageof the article is viewed the patent is clas-sified in Class 359, subclass 373, wherea compound lens system is employed; orin Class 353 if projection of an image ispresent.

(2) Note. Article testing devices where amechanical pickup or feeler engages orcontacts the workpiece even though sig-nificant optical structure is recited in theclaims are classified elsewhere.

(3) Note. In general photocells together withoptical structure in the light path areclassified elsewhere. For classification inthese subclasses 372+ of Class 356, thephotocell and optical combination mustbe so related as to or must include struc-ture to give an indication of the measure-ment such as being within or without therange of tolerance when the light beam ispassed to the profile of the master or arti-cle under test.

FOR 128 Of article displacement:Foreign art collection wherein changes to anarticle either by movement or by replace-ment are measured.

FOR 129 Including moire fringe generation:


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Foreign art collection wherein moiré fringesare created in response to interferencebetween regular patterns in or on the articleand a superimposable grid or light pattern.

FOR 130 Of position:Foreign art collection including means tomeasure the distance or direction or anobject to a reference.

FOR 131 Of contour or profile:Foreign art collection including means tomeasure the shape of an object.

FOR 132 With curve readers:Foreign art collection wherein the object is atwo-dimensional curve.

FOR 133 Of cavities:Foreign art collection including means tomeasure the internal dimensional propertiesof holes.

FOR 134 Of area or volume:Foreign art collection including means fordetermining the area of a configuration orthe volume of a mass.

(1) Note. This subclass includes also inte-grating means where this involves nomore than optically determining the areaunder a curve.

FOR 135 By scanning:Foreign art collection wherein the total areaor volume of a configuration is determinedby sequentially determining elemental areasof the configuration and summing them.

FOR 136 Of thickness:Foreign art collection including means formeasuring between opposite surfaces ordepth or in a direction perpendicular to thelength and breadth of an object.

FOR 137 Of light permeable material:Foreign art collection for measuring thethickness of light permeable material, themeasuring operation depending upon thefact that the material is light permeable.

FOR 138 Of length:Foreign art collection including means formeasuring the largest dimension of an arti-

cle, or it the article is moving, the dimensionin the direction the article is traveling.

FOR 139 Of width or diameter:Foreign art collection including means formeasuring the width or diameter of anobject.

FOR 140 Of moving object:Foreign art collection wherein the objectbeing measured changes position.

FOR 141 By scanning or light interruption:Foreign art collection including means forsequentially moving a light beam across thearticle, or for periodically interrupting alight beam directed toward the article.

FOR 142 By scanning or light interruption:Foreign art collection including means forsequentially moving a light beam across thearticle, or for periodically interrupting alight beam directed toward the article.

END

February 2011 CLASSIFICATION DEFINITIONS 356 - 1 CLASS 356, … · 2019-10-22 · or configurations...

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Transcript of February 2011 CLASSIFICATION DEFINITIONS 356 - 1 CLASS 356, … · 2019-10-22 · or configurations...