Experiments about carbon removal and codeposit inhibition J.A. Ferreira, F.L. Tabarés, W. Bohmeyer...
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Transcript of Experiments about carbon removal and codeposit inhibition J.A. Ferreira, F.L. Tabarés, W. Bohmeyer...
Experiments about carbon removal and codeposit inhibition
J.A. Ferreira, F.L. Tabarés, W. Bohmeyer and J.A. Ferreira, F.L. Tabarés, W. Bohmeyer and A. Markin, I. Tanarro, V. HerreroA. Markin, I. Tanarro, V. Herrero
Introduction
Tritium Retention
Problem
Removal of Codeposits
Prevent the codeposition
Different techniques for
removal (Thermooxidation, GD cleaning, laser
ablation, etc)
Remove CFC´s
Scavenger technique
ELM’s, plasma operation?
Efficiency? Availability?
Does it work in ITER?
Cleaning (Experiments carried out at CIEMAT)
Cleaning chamber QMS chamber
Carbon layers (~200nm) were produced using a
He/CH4 or a He/C2H4 mixture by DC glow
discharge
Films were monitored using laser interferometry ( =
670 nm)
Residual gas was sampled using a differential pumped
mass spectrometer
2d
n
Cleaning with N2 GD
Nitrogen-containing DC glow discharge plasmas have shown erosion rates ~ 3 nm/min
Lower reactivity than He/O2 plasmas (similar conditions 12 nm/min)
Time (s)
0 1000 2000 3000 4000 5000 60000
0.1
0
0.5
1
1.5
2 x 10-7
16 17 25 52
18 26 27
C2N2
C2H2
HCN
H2O
a
b
Does it depend on the chemical form?
Cleaning with NH3 GD
Time (s)
Par
tial p
ress
ure
(A
.U.)
0 200 400 600 800 1000 12000
1
x 10-4 4 17 16 2
LaserH2
He
NH3
Time (s)
Par
tial p
ress
ure
(A
.U.)
0 200 400 600 800 1000 12000
1
x 10-4
Time (s)
Par
tial p
ress
ure
(A
.U.)
0 200 400 600 800 1000 12000
1
x 10-4 4 17 16 2
LaserH2
He
NH3
Time (s)
Par
tial p
ress
ure
(A.U
.)
0 200 400 600 800 1000 12000
2
4
6
8x 10
-6
182827262552
HCN
Time (s)
Par
tial p
ress
ure
(A.U
.)
0 200 400 600 800 1000 12000
2
Time (s)
Par
tial p
ress
ure
(A.U
.)
0 200 400 600 800 1000 12000
2
4
6
8x 10
-6
182827262552
HCN
He: 18,80 sccm, NH3: 13,50 sccm (42%). 200 mA, 450V
Erosion rate: 16,68 nm/min
Main product: HCN
Minor products: C2H2, C2N2
Some hydrogen of the film is released as H2
High erosion rate comparable
Rate HCN/C2H2 = 4,7318th PSI (Toledo) J.A. Ferreira et al P1-53
3 2 2 2982NH N 3H 91,86 kJ/molH
Thermooxidation with NO2
18th PSI (Toledo) I. Tanarro et al P3-51
Left: Hard a-C:H film (~100 nm), deposited on a stainless steel sample.
Right: After 1 hour thermal oxidation with O2, 50 mbar, at 400ºC, the a-C:H film was nearly completely eliminated. In the case of NO2 / N2 (1:1), the films were completely eliminated even at 300ºC.
1 mm gap
Scavenger
18th PSI (Toledo) W. Bohmeyer et al O-15
What is it?gas phase reactions of nitrogen or nitrogen
containing species with the growth precursors. Formation of non-reactive species that can be pumped
away
CxHy NX+Stable non-
reactive species
F.L.Tabarés, V. Rohde and the AUG TeamNucl. Fusion 45 (2005) L27-L31.
Scavenger (PSI-2)
No uncontrolled CxHy losses at cold walls
The behavior of re-eroded species is studied
Ions can not reach the collector plates
18th PSI (Toledo) W. Bohmeyer et al O-15
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
20.00 40.00 60.00 80.00 100.00 120.00distance to neutra lizer p late / cm
-0.40
0.00
0.40
0.80
depo
sitio
n n
m/m
in
2 sccm m ethane
0.5 sccm m ethane
no m ethane
QMS:CH4:C2H2:C2H6=3:4:2
High sticking species
Pump Duct Deposition Profile
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
220 240 260 280 300 320 340 360time (min)
54
55
56
57
58
thi c
k nes
s(n
m)
2 sccm CH4
2 sccm N2
-0.044 nm/min
-0.044 nm/min
2 sccm N2
no injection
Tcoll =330 K
+0.031nm/min -0.043 nm/min
220 240 260 280 300 320 340 360time (min)
54
55
56
57
58
thi c
k nes
s(n
m)
2 sccm CH4
2 sccm N2
-0.044 nm/min
-0.044 nm/min
2 sccm N2
no injection
Tcoll =330 K
+0.031nm/min
220 240 260 280 300 320 340 360time (min)
54
55
56
57
58
thi c
k nes
s(n
m)
2 sccm CH4
2 sccm N2
-0.044 nm/min
-0.044 nm/min
2 sccm N2
no injection
Tcoll =330 K
+0.031nm/min -0.043 nm/min
Strong influence of nitrogen during methane injection
No influence of nitrogen for clean plasma (not enhanced erosion by nitrogen)
Scavenger effect: yes, it works !
Pump duct / nitrogen
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
Pump duct: Collector temperature 310 and 330 K
0 5E+3 1E+4 2E+4 2E+4 3E+4 3E+4time / s
67
68
69
70
71
72
73
74
75
76
thic
knes
s/n
m
PLASMAON
310 K 330 K
2 sccm CH4
2 sccm N2
collector temperature:
0 5E+3 1E+4 2E+4 2E+4 3E+4 3E+4time / s
67
68
69
70
71
72
73
74
75
76
thic
knes
s/n
m
PLASMAON
310 K 330 K
2 sccm CH4
2 sccm N2
collector temperature:
0 5E+3 1E+4 2E+4 2E+4 3E+4 3E+4time / s
67
68
69
70
71
72
73
74
75
76
thic
knes
s/n
m
PLASMAON
310 K 330 K
2 sccm CH4
2 sccm N2
collector temperature:
Nitrogen effect:Reduction of
deposition (310 K)
Shift to from deposition to erosion (330 K)
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
Pump duct : deposition profile
Ex situ thickness measurement
(Tcoll not fixed , about 320 K)
Strong influence of nitrogen
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
0 5000 10000 15000Time (sec)
67
68
69
70
71
72
73
74
Pro
be th
ickn
ess
(nm
)
H plasma 150A
2 sccm CH4
N2to dump(sccm)
2 1 0,5
N2to nozzle(sccm)
0,5 0,2
0 5000 10000 15000Time (sec)
67
68
69
70
71
72
73
74
Pro
be th
ickn
ess
(nm
)
H plasma 150A
2 sccm CH4
N2to dump(sccm)
2 1 0,5
N2to nozzle(sccm)
0,5 0,2
0 5000 10000 15000Time (sec)
67
68
69
70
71
72
73
74
Pro
be th
ickn
ess
(nm
)
H plasma 150A
2 sccm CH4
N2to dump(sccm)
2 1 0,5
N2to nozzle(sccm)
0,5 0,2
1.Into the pump duct:
Weak effect
2.Into the hot tube:
Stronger effect
Nitrogen injection at
different positions
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
Neon injection
Neon has no influence !
8000 12000 16000 20000 24000 28000 32000time / s
60
62
64
66
68
70
72
74
fi lm
thi c
knes
s / n
m
PlasmaON
PlasmaOFF
310 K 330 K 350 K
2 sccm CH4
1.4 sccm Ne
collector temperature:
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
vacuum chamber wall
Optical system:in-situ film thickness
He/H2/D2/Ar plasma
Si collector
Injection ofCH4/N2/H2
QMS
vacuum chamber wall
Optical system:in-situ film thickness
He/H2/D2/Ar plasma
Si collector
Injection ofCH4/N2/H2
QMS
Protection of the collector area
against ions by an additional limiter Ions are not included
in the deposition process
Main chamber experimental set-up
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
Main chamber. He plasma
0 25 50 75 100 225 250 275
0
10
20
30
40
50
60
70
80
90
0
10
20
30
40
50
60
70
80
90
0 25 50 75 100 225 250 275
0
10
20
30
40
50
60
70
80
90
0
10
20
30
40
50
60
70
80
90
thic
knes
s [n
m]
time [min]
CH4 N2
0.5sccm0.5 sccm 1.0 sccm
0.220 nm/min
0.466
0.4820.527
No atomic hydrogen no HCN and NHx
Deposition is not influenced no volume process
No erosion no surface effect
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
Main chamber. H2 discharge, methane, nitrogen
25 50 75 100 125 150
70
80
90
100
110
120
70
80
90
100
110
120
thic
knes
s [n
m]
time [min]
CH4
N2
-0.746
2.351 nm/min
-0.303
-1.630
0.115
0.999
-0.318
substrate: 330K
1 1 sccm1 sccm
I II III IV V VI VII
25 50 75 100 125 150
70
80
90
100
110
120
70
80
90
100
110
120
25 50 75 100 125 150
70
80
90
100
110
120
70
80
90
100
110
120
thic
knes
s [n
m]
time [min]
CH4
thic
knes
s [n
m]
time [min]
CH4
N2
-0.746
2.351 nm/min
-0.303
-1.630
0.115
0.999
-0.318
substrate: 330K
1 1 sccm1 sccm
I II III IV V VI VII
Enhanced erosion Surface
Reaction
Reduced depositionSurface and volume
process
Scavenger (PSI-2)
18th PSI (Toledo) W. Bohmeyer et al O-15
Nitrogen molecules are stable and don’t influence film formation, but they are decomposed in the plasma.
Close to the plasma (where energetic neutrals are included) enhanced erosion was detected (surface process) as well as a reduction of the deposition rate by a volume process
Far away from the plasma was detected only a volume effect, the conversion of (high sticking) hydrocarbons to inert ones, the so called scavenger effect. Enhanced erosion was not found.
Scavengers (CIEMAT)
Tiempo (s)
Pre
sió
n p
arc
ial (
U.A
.)
1000 1500 2000 2500 3000 3500 40000
0.2
0.4
0.6
0.8
1x 10-5
521618252627282930
Tiempo (s)
Pre
sión
par
cial
(U
.A.)
1500 2000 2500 3000 350010
-10
10-9
10-8
10-7
10-6
10-5
b)a) Residual gas analysis and CTAMS spectra
show a strong production of hydrocarbons (HCN/C2=0,1 C2H2/C2H4=3)
A second peak of acetylene is also observed. Could not be explain as temperature is too high for being acetylene (unstable species???)
Contribution of acetonitrile
Time (min)
Par
tial P
ress
ure
20 30 40 50 600
1
2
3
4x 10
-8
3940414243
Carbon walls
Scavengers (CIEMAT)
Scavenger mixtures (H2:N2:CH4) on metallic walls show a very different ratio of products (ammonia and acetonitrile are the main products!)
In our small set-up surface chemistry prevails
Pa
rtia
l Pre
ssu
re (
A.U
.)
200 400 600 8000
0.5
1
1.5x 10-5
16171825262728394041
Desorption of condensible products at liquid nitrogen
temperature (CTAMS)
Conclusions
Some alternatives based on nitrogen compounds could be of interest not only for tritium recovery (codeposition cleaning) but also for inhibition of the formation of codeposits
Experiments carried out in PSI-2 have shown that nitrogen containing mixtures are able to stop codeposition in hidden areas (not reached by ions)
Nitrogen reacts to form ammonia in hydrogen plasmas. Last results suggest that ammonia related molecules (NHx) could be responsible of scavenger effect
3 3 4 2CH NH CH NH ???? 3N+CH HCN+2H????