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Sponsor Peter Zhou
Coach Peter Zhou
Champion XXXXX
Leader XXXX
TeamMember
XXXX, XXXXXXXX
ABCD Product AOI First Time Yield
Improvement
Oct 13, 2008 1
Continental/Tianjin - Chrysler
ALCOA
AM I CD
2
CTQ & CTP Chart
CTQ CCR Customer Issues
VOC
Pin Position return ppm
No Positioning defects during AOI test (Meet Spec: +/- 0.4mm)
Pin positioning problem will cause ALCOA assembly line problem
TIPM board not reliable enough
VOB Business Issues
CBR CTP
High scrap rate(14%FYI)
Low output rate with high cost
Improve FTY% by 10% at least from current 86%
Reduce Misalignment defect rate
Remark1. Voice of customer and voice of business to be prioritized to those which are related to project objective2. Use VOB or VOC or both depending on the project objectives
AM I CD
3
F/E Process AOI and Packing process
ICT
PC BoardLoading
Screen Print
ComponentPlacement
Solder Reflow
UMG MachineLoading
2nd UMG Machine
Coating Machine
Function test
AOI Tester for Complaint pins
AOI Tester for Tuning fork pins
Finished Good Packing
Shipping to customer
Process Flow AM I CD
4
Yield Current Performance – Pin Misalignment
Y = Scrap Rate
TIPM Product AOI First Time Yield Performance Trend
75.00%
80.00%
85.00%
90.00%
95.00%
100.00%
28-O
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29-O
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30-O
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31-O
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1-N
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2-N
ov-0
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3-N
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4-N
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5-N
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6-N
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7-N
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8-N
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9-N
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10-N
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% Average 86%
y = Pins Position Defect Rate
AM I CD
5
96%
May’08Yiel
d Pe
rfor
man
ce
86%
Nov’07
Project Target
AM I CDTarget
6
Team Charter Project Selection
ID CCR
TeamCharter
Build Team
Map Process
FinancialEstimation
Goal StatementIndicator Baseline Target Target Date
Process Output 86% 96% Aug 1st 2008
Finance …… Saving 200k Aug 1st 2008
Subsequent
Team SelectionSponsor/Champion: Scott Stryker/Chrysler, Angie Liu/ContinentalTeam leader.: XXX 35% - Con%Team member: Michael Quality engineer 35% Wang Test engineer 10% Cao line leader 5% Han Quality engineer 5% Zhang Process engineer 5% White Production super. 5%
Project SchedulePhase Start End Remark
Define 11/30/2007 12/15/2007
Measure 12/15/2007 01/15/2008
Analyze 01/15/2008 04/28/2008
Improve 04/28/2008 05/30/2008
Control 05/30/2008 07/30/2008
Business CaseChrysler is the biggest customer for XXX factory. TIPM for Chrysler has been launched since end 2006. It is brand-new design product for Continental/Tianjin, which has two sides pin on the top and bottom PCB slide. As the pin straightness (perpendicular to the board) is very important to customer assembly process, therefore Tianjin factory install AOI test for inspection, but the first time yield FTY% can’t meet the target which is above 96%.
Opportunity StatementIf we can meet FTY target 96%, we can achieve saving at least 200k and meet customer requirement accordingly. On time delivery will also be assured.
Project ScopeProcess Front End Process
Start Point UMG Station
End Point Packing process
Scope Focus on Tianjin facility for TIPM product
7
TIPM Product AOI First Time Yield Daily Performance Trend
65.00%
70.00%
75.00%
80.00%
85.00%
90.00%
95.00%
28-O
ct-0
7
29-O
ct-0
7
30-O
ct-0
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31-O
ct-0
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1-N
ov-0
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2-N
ov-0
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3-N
ov-0
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4-N
ov-0
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5-N
ov-0
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6-N
ov-0
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7-N
ov-0
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8-N
ov-0
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9-N
ov-0
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10-N
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11-N
ov-0
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12-N
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13-N
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19-N
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20-N
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21-N
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22-N
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23-N
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24-N
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7
% 86%
88%
Quick Win Opportunity
Yield Improved to 88% by Implement three
Opportunities from Quick Win
AM I CD
8
Pin Misalignment Position Complaint Bent pin TIPM Medium
The complaint pin use the mechanical connective design, The tail of complain pin directly contact PCB through hole without any soldering. So they are more easily bent during normal production process.
X Direction
Y Direction
Bent Pins
AM I CD
9
Pin Misalignment Position
J4-37J4-11
J2-17
Bent Pin Most Happened Position Is On Then Edge of PCB Board
AM I CD
10
Pin Misalignment Position
Position Pareto chart for Real bent pin
The Pareto chart show the major bent pin issue are from the compliant pin and occurred more frequently at position J4-37 & J2-17.
AM I CD
11
MachineManpower
Drop to The Ground
Transportation Shock
Material
Tilted Pin
Wrong Handling
Mounting Machine
Temperature Chamber
ICT MachineOperator Touch Up
Separation Machine
Coating Machine
Function Fixture
Method
Unsafe Package In Process
Process Flow
Pin Handing
Temp Test Time
Oven Temp,Time
PCB Hole Tilt
Pin Roller Defect
Fishbone Diagram
Pin Snap Slot Defect
(Top Layer pin may be touched accidentally)
Unsafe Package after AOI
AM I CD
Different Pin Position
12
Identify Critical Process
Characteristics and Input Indicators
AM I CD
13
MachineManpower
Drop to The Ground
Transportation Shock
Material
Tilted Pin
Wrong Handling
UMG Mounting Machine
Temperature Test
ICT MachineOperator Touch Up
Separation Machine
Routing Machine
Function Fixture
Method
Unsafe Package In Process
Process Flow
Pin Handing
Temp Test Time
Oven Temp,Time
PCB Hole Tilt
Pin Roller Defect
Fishbone Diagram
Pin Snap Slot Defect
(Top Layer pin may be touched accidentally)
Unsafe Package after AOI
AM I CD
Different Pin Position
14
UMG Mounting Machine
Temperature Test
ICT Machine
Operator Touch Up
Routing Machine
Unsafe Package In Process
Pin Snap Slot Defect
AM I CDScreening
Function Fixture
15
Data Collection Plan ID IPO Indicators Collect Data MSA
Process Capability
Remarks:Other data refers to additional information from stratification perspective.
Performance measure (Y)
Operational definition
Data source and location
Sample
size
Who will collect the data
When will data be
collected
How will data be
collected
Other data that should be
collected at the same time
PIN Misalignment
Rate
Pin Straightness Requirement (+/- 0.4mm)
AOI Tester 100% QA Nov 07 AOI Tester
Process / Input (X)
Operational definition
Data source and location
Sample
size
Who will collect the data
When will data be
collected
How will data be
collected
Other data that should be
collected at the same time
Pin Position Measure Pin Position
Jasper System 100% Jasper System Every Shift Jasper System -
16
MSA ResultsMSA study on these test itemsTo ensure the data are reasonable, we will do MSA study for AOI 1 testerThese AOI Tester GR&R% are all less than 10% , acceptable!See the MSA_Demo.PPT for the GR&R% study demonstration.
Microsoft PowerPoint Presentation
AM I CD
17
Pin Misalignment distributionCheck the TOP defect data distribution, The P-value is more than 0.05. It is normal distribution. But the mean value deviation to spec center, which need further analysis.
300225150750-75
Median
Mean
11010510095908580
1st Quartile 23.500Median 99.5003rd Quartile 168.750Maximum 308.000
84.558 107.163
82.113 113.000
88.722 104.768
A-Squared 0.72P-Value 0.061Mean 95.861StDev 96.076Variance 9230.529Skewness -0.082150Kurtosis -0.688619N 280Minimum -130.000
Anderson-Darling Normality Test
95% Confidence Interval for Mean
95% Confidence Interval for Median
95% Confidence Interval for StDev95% Confidence I ntervals
Summary for Y_ j2-17
-60-120-180-240-300-360
Median
Mean
-160-165-170-175-180-185-190
1st Quartile -214.75Median -169.503rd Quartile -134.25Maximum -21.00
-186.81 -170.63
-187.00 -163.00
61.01 72.50
A-Squared 0.70P-Value 0.066Mean -178.72StDev 66.26Variance 4389.96Skewness -0.295591Kurtosis -0.063028N 260Minimum -352.00
Anderson-Darling Normality Test
95% Confidence I nterval for Mean
95% Confidence I nterval for Median
95% Confidence I nterval for StDev95% Confidence I ntervals
Summary for X_ j2-17
3002001000-100-200-300
Median
Mean
1051009590858075
1st Quartile 25.500Median 84.0003rd Quartile 154.500Maximum 369.000
76.747 100.411
75.485 104.545
93.773 110.569
A-Squared 0.72P-Value 0.058Mean 88.579StDev 101.477Variance 10297.505Skewness -0.240282Kurtosis 0.998535N 285Minimum -319.000
Anderson-Darling Normality Test
95% Confidence Interval for Mean
95% Confidence Interval for Median
95% Confidence Interval for StDev95% Confidence I ntervals
Summary for X_ j4-37
AM I CD
18
Indi
vidu
al V
alue
272421181512963
0
-200
-400
_X=-181.7
UCL=2.6
LCL=-366.0
Mov
ing
Rang
e
272421181512963
200
100
0
__MR=69.3
UCL=226.4
LCL=0
Observation
Valu
es
252015105
0
-150
-300
-50-100-150-200-250-300-350
0-200-400
Within
Overall
Specs
WithinStDev 61.43289Cp 2.17Cpk 1.18CCpk 2.17
OverallStDev 67.56258Pp 1.97Ppk 1.08Cpm *
Process Capability Sixpack of BeforeI Chart
Moving Range Chart
Last 25 Observations
Capability Histogram
Normal Prob PlotAD: 0.234, P: 0.775
Capability Plot
Bent pin AnalysisCp/Cpk study for “Bent pin ”:
CPK: 1.18
AM I CDCapability Analysis
19
Key Process Characteristics Identified During Measurement Phase Shows That Four Stations Need To Be Focus On…
AM I CDInitial Analysis
UMG Mounting Machine
Temperature Test/Chamber
ICT Machine
Operator Touch Up
Routing Machine
Unsafe Package In Process
Pin Snap Slot Defect
Function Fixture
20
UMG Machine
ICT Machine
Routing
Chamber & 3-temp. Testing
Same Lot PCB Board Go Through Four Processes, Pin Position Data Were Taken To Analysis & Identify The Key
Process
AM I CDANOVA
21
Bent Pin Analysis – Independent and Normality Test
300250200150100500-50
99
9590
80706050403020
105
1
Measure UMG
Perc
ent
Mean 119.8StDev 66.91N 30AD 0.435P-Value 0.281
Probability Plot of Measure UMGNormal
p-values > 0.05, normal distribution!
30282624222018161412108642
250
200
150
100
50
0
Observation
Mea
sure
UM
G
Number of runs about median: 13Expected number of runs: 16.0Longest run about median: 8Approx P-Value for Clustering: 0.132Approx P-Value for Mixtures: 0.868
Number of runs up or down: 20Expected number of runs: 19.7Longest run up or down: 3Approx P-Value for Trends: 0.559Approx P-Value for Oscillation: 0.441
Run Chart of Measure UMG
30282624222018161412108642
300
200
100
0
-100
Observation
Mea
sure
ICT
Number of runs about median: 17Expected number of runs: 16.0Longest run about median: 4Approx P-Value for Clustering: 0.645Approx P-Value for Mixtures: 0.355
Number of runs up or down: 21Expected number of runs: 19.7Longest run up or down: 3Approx P-Value for Trends: 0.724Approx P-Value for Oscillation: 0.276
Run Chart of Measure ICT
30282624222018161412108642
250
200
150
100
50
0
Observation
Mea
sure
Rou
ter
Number of runs about median: 13Expected number of runs: 16.0Longest run about median: 6Approx P-Value for Clustering: 0.132Approx P-Value for Mixtures: 0.868
Number of runs up or down: 22Expected number of runs: 19.7Longest run up or down: 2Approx P-Value for Trends: 0.851Approx P-Value for Oscillation: 0.149
Run Chart of Measure Router
3002001000-100
99
9590
80706050403020
105
1
Measure ICT
Perc
ent
Mean 125StDev 66.76N 30AD 0.378P-Value 0.385
Probability Plot of Measure ICTNormal
p-values > 0.05, normal distribution!
250200150100500
99
9590
80706050403020
105
1
Measure Router
Perc
ent
Mean 116.5StDev 54.66N 30AD 0.405P-Value 0.332
Probability Plot of Measure RouterNormal
p-values > 0.05, normal distribution!
All 4 p-values > 0.05, data are independent!
AM I CDData Analysis
22
ANOVA For All Related Process
Data
Measure 3-tempMeasure ICTMeasure RouterMeasure UMG
300
200
100
0
-100
Boxplot of Measure UMG, Measure Router, Measure ICT, Measure 3-temp
Proc
ess
95% Bonferroni Confidence Intervals for StDevs
Measure Router
Measure ICT
Measure 3-temp
Measure UMG
10090807060504030
Bartlett's Test
0.394
Test Statistic 7.43P-Value 0.059
Levene's TestTest Statistic 1.00P-Value
Test for Equal Variances for Measure
Measure 3 –Temp caused the most difference (Mean Shift a lot as compared with the other 3 process). Equal Variance showed at the test.
AM I CD
23
Why the 3-temp test process contribute the most
Put unit into the trays
Put into cold chamber
Cold temperature function test
Put unit into the trays
Put into hot chamber
Room temperature function test
AOI test equipment
Input From Front Line
To packing station
?3 – Temp Test Steps Breakdown
AM I CDTemperature Inspection
24
MachineManpower
Transportation Shock
Material
Tilted Pin
Wrong Handling
High Temp Chamber +85 Degree C
Function Test FixtureLow Temp Chamber -40 Degree C
Operator Touch Up
Conveyor
Method
Unsafe Package In Process
Process FlowTemperature PCB Hole Tilt
Pin Roller Defect
Fishbone Diagram
Pin Snap Slot Defect
AM I CD
25
SOV
Chamber
Mea
sure
8540
-50
-100
-150
-200
-250
Fixture12
Multi-Vari Chart for Measure by Fixture - Chamber
Chamber 1-40 Degree C
1
Chamber
Fixture
Chamber 2+85 Degree C
2
1
2
Conduct Source Of Variation Studies (SOV)
AM I CD
26
UMG Mounting Machine
Temperature Test/Chamber
ICT Machine
Operator Touch Up
Routing Machine
Unsafe Package In Process
Pin Snap Slot Defect
Screening
Chamber Temperature
Function Fixture
AM I CD
Function Fixture
Chamber
Mea
sure
8540
-50
-100
-150
-200
-250
Fixture12
Multi-Vari Chart for Measure by Fixture - Chamber
27
Fixture 1 Fixture 2 Comparison
Mfg Date Same Same
Maintenance Schedule
Same Same
Open Angle 85 degree 70 degree
Operation Force
16 Ib 20 Ib
Close Angle 6 degree 2 degree
Operator A B
Usage Rate Same Same
Couple of Factors
Are Different
Compared
Between Two
Fixtures!!!
AM I CDSetting Comparison
28
Objective of DOE
Condition I: -45 Degree C Condition II: 85 Degree C
Level 1 Level 2 Level 1 Level 2
Open Angle 85 degree 70 degree 85 degree 70 degree
Open Force 16 Ib 20 Ib 16 Ib 20 Ib
Close Angle 6 degree 2 degree 6 degree 2 degree
In order to minimize the pin bent possibility, plan to design an experiment to optimize all the factors…
AM I CD
29
DOE at -40 Degree C AM I CD
30
Step 1. View Data >> Data Is Normal ------ P Value > 0.05 >> No Outlier Point >> No Apparent Upward or Downward Trend
-60-80-100-120-140-160-180
Median
Mean
-100-110-120-130-140-150
Anderson-Darling Normality Test
Variance 1161.42Skewness 0.311887Kurtosis -0.532572N 18Minimum -179.91
A-Squared
1st Quartile -151.12Median -130.443rd Quartile -96.99Maximum -61.44
95% Confidence Interval for Mean-144.65
0.21
-110.7595% Confidence Interval for Median
-149.42 -104.8195% Confidence Interval for StDev
25.57 51.09
P-Value 0.825Mean -127.70StDev 34.08
95% Confidence Intervals
Summary for Measure -40
RunOrder
Mea
sure
-40
20151050
-50
-75
-100
-125
-150
-175
CenterPt01
Scatterplot of Measure -40 vs RunOrder
AM I CDDOE at -40 Degree C
31
Step 2 and 3. Create and Fit Model
Term
Standardized Effect
ABC
BC
AB
AC
B
C
A
121086420
2.23Factor NameA Open AngleB Close AngleC Operation Force
Pareto Chart of the Standardized Effects (-40 Degree)(response is Measure -40, Alpha = .05)
Factor Open Angle, Close Angle, Operation Force and interaction between Open Angle and Operation Force are signification a = 0.05
AM I CDDOE at -40 Degree C
32
Standardized Effect
Perc
ent
151050-5-10
99
9590
80706050403020
105
1
Factor NameA Open AngleB Close AngleC Operation Force
Effect TypeNot SignificantSignificant
AC
C
B
A
Normal Probability Plot of the Standardized Effects(response is Measure -40, Alpha = .05)
Normal probability plot of effects also shows the same effects to be significant.
AM I CDDOE at -40 Degree C
33
Open Angle
642 201816
-100
-150
-200
Close Angle
-100
-150
-200
Operation Force
Open
77.5 Center85.0 Corner
Angle Point Type70.0 Corner
Close
4 Center6 Corner
Angle Point Type2 Corner
Interaction Plot (data means) for Measure -40
Mea
n of
Mea
sure
-40
85.077.570.0
-100
-120
-140
-160642
201816
-100
-120
-140
-160
Open Angle Close Angle
Operation Force
Point TypeCornerCenter
Main Effects Plot (data means) for Measure -40
These plots are consistent with our previous conclusions about the effects.
AM I CDDOE at -40 Degree C
34
ANOVA indicates that at least one main effect is significant at a = 0.05. It also indicates that curvature is NOT significant.
AM I CDDOE at -40 Degree C
35
Estimated effects and coefficients indicate that Open Angle, Close Angle, Operation Force and interaction Open Angle*Operation Force are significant at a = 0.05. The results agreed with the earlier graphs R-Sq = 96.38% R-Sq(adj) = 93.85%
AM I CDDOE at -40 Degree C
36
Step 4. Perform Residual Diagnostics
The residual vs fitted (predicted) value and residual vs run order plots do not show any patterns or trends, and do not indicate any violations of the assumptions. The normal probability plot indicates residuals are normally distributed
Residual
Perc
ent
20100-10-20
99
90
50
10
1
Fitted ValueRe
sidua
l-50-100-150-200
10
0
-10
Residual
Freq
uenc
y
151050-5-10-15
4.8
3.6
2.4
1.2
0.0
Observation Order
Resi
dual
18161412108642
10
0
-10
Normal Probability Plot of the Residuals Residuals Versus the Fitted Values
Histogram of the Residuals Residuals Versus the Order of the Data
Residual Plots for Measure -40
AM I CDDOE at -40 Degree C
37
Open Angle
Resid
ual
868482807876747270
15
10
5
0
-5
-10
Residuals Versus Open Angle(response is Measure -40)
Close Angle
Resid
ual
65432
15
10
5
0
-5
-10
Residuals Versus Close Angle(response is Measure -40)
The residual vs each X do not show any pattern
Operation Force
Resid
ual
2019181716
15
10
5
0
-5
-10
Residuals Versus Operation Force(response is Measure -40)
AM I CDDOE at -40 Degree C
38
Step 6. Remove non-significant terms / Refit reduced model
Remove the non-significant terms
ANOVA indicates at least one main effect and at least one two-factor interactions are significant at a = 0.05 Also, curvature is not significant.
Step 5. Check for possible transformations.
AM I CDDOE at -40 Degree C
39
Term
Standardized Effect
AC
B
C
A
121086420
2.16Factor NameA Open AngleB Close AngleC Operation Force
Pareto Chart of the Standardized Effects(response is Measure -40, Alpha = .05)
P-values show that all effects in the model are significant. The value of R-Sq and R-Sq(adj) has decreased
Standardized Effect
Perc
ent
1050-5-10
99
9590
80706050403020
105
1
Factor NameA Open AngleB Close AngleC Operation Force
Effect TypeNot SignificantSignificant
AC
C
B
A
Normal Probability Plot of the Standardized Effects(response is Measure -40, Alpha = .05)
Reduced Model
Full Model
R Square 94.53% 96.38%
R Square-Adj 92.84% 93.85%
AM I CDDOE at -40 Degree C
40
Residual Diagnostics
Residual
Perc
ent
20100-10-20
99
90
50
10
1
Fitted ValueRe
sidua
l
-50-100-150-200
20
10
0
-10
-20
Residual
Freq
uenc
y
20151050-5-10-15
4
3
2
1
0
Observation Order
Resid
ual
18161412108642
20
10
0
-10
-20
Normal Probability Plot of the Residuals Residuals Versus the Fitted Values
Histogram of the Residuals Residuals Versus the Order of the Data
Residual Plots for Measure -40
The residual vs fitted (predicted) value and residual vs run order plots do not show any patterns or trends, and do not indicate any violations of the assumptions. The normal probability plot indicates residuals are normally distributed
AM I CDDOE at -40 Degree C
41
Open Angle
Resid
ual
868482807876747270
20
10
0
-10
-20
Residuals Versus Open Angle(response is Measure -40)
Close Angle
Resid
ual
65432
20
10
0
-10
-20
Residuals Versus Close Angle(response is Measure -40)
Operation Force
Resid
ual
2019181716
20
10
0
-10
-20
Residuals Versus Operation Force(response is Measure -40)
The residual vs each X do not show any pattern
AM I CDDOE at -40 Degree C
42
Model is adequate, therefore we can use it for predicting future responses at specified settings of control factors.
Chosen Model for the Fixture in uncoded units is:
Y (Pin Position) = 597.769 – 6.96360(Open Angle) + 7.18076(Close Angle) - 60.4389(Operation Force) + 0.628457(Open Angle)*(Operation Force)
Step 7. Choose Improved Model
AM I CDDOE at -40 Degree C
Pin Position Specification: 0 +/-0.4mm
43
Predict Pin Position at the following level of X’s Open Angle = 85 degree Close Angle = 6 degree Operation Force = 16 lb
AM I CDDOE at -40 Degree C
44
Mea
n of
Mea
sure
-40
85.077.570.0
-100
-120
-140
-160642
201816
-100
-120
-140
-160
Open Angle Close Angle
Operation Force
Point TypeCornerCenter
Main Effects Plot (data means) for Measure -40
Open Angle
642 201816
-100
-150
-200
Close Angle
-100
-150
-200
Operation Force
Open
77.5 Center85.0 Corner
Angle Point Type70.0 Corner
Close
4 Center6 Corner
Angle Point Type2 Corner
Interaction Plot (data means) for Measure -40
Step 8. Interpret Chosen Model
AM I CDDOE at -40 Degree C
45
6
ure -40
-120
4
-90
-60
Close Angle70 75 280 85Open Angle
Hold ValuesOperation Force 16
Surface Plot of Measure -40 vs Close Angle, Open Angle
Open Angle
Clos
e An
gle
-70-80
-90
-100
-110
-120
-130
8482807876747270
6
5
4
3
2
Hold ValuesOperation Force 16
Contour Plot of Measure -40 vs Close Angle, Open Angle
Contour plot shows at what different settings of X’s can
achieve the target Y. It also shows that the direction of meeting Y
requirement. (0+/-0.4mm)
AM I CDDOE at -40 Degree C
Look For Maximum46
Step 9. Implement New Process/Make Confirmation Runs
Plan to run 10pcs confirmation runs Predict response y=-63.7694 at the optimum settings above Compute the appropriate confidence interval of prediction based on the number of confirmation test run. Conduct 10 confirmation runs. Calculated average of the confirmation runs falls within the calculated confidence interval. (Average 10 confirmation run = - 59.95)
AM I CDDOE at -40 Degree C
47
Optimized Setting
Key parameters Current Range
Optimized Range
Open Force 16 Ib~20 Ib 16 Ib
Close Angle 2~6 6
Open Angle 70~85 85
AM I CD
48
Pilot Run Result
Sample
Sam
ple
Mea
n
121110987654321
0
-50
-100
-150
-200
-250
-300
__X=-64.9
UCL=7.3
LCL=-137.0
Before AfterXbar Chart of Data by Status
Tests performed with unequal sample sizes
3602401200-120-240-360
LSL USL
LSL -400Target *USL 400Sample Mean -178.719Sample N 260StDev(Within) 65.2126StDev(Overall) 66.2567
Process Data
Cp 2.04CPL 1.13CPU 2.96Cpk 1.13
Pp 2.01PPL 1.11PPU 2.91Ppk 1.11Cpm *
Overall Capability
Potential (Within) Capability
PPM < LSL 0.00PPM > USL 0.00PPM Total 0.00
Observed PerformancePPM < LSL 345.38PPM > USL 0.00PPM Total 345.38
Exp. Within PerformancePPM < LSL 419.27PPM > USL 0.00PPM Total 419.27
Exp. Overall Performance
WithinOverall
Process Capability of X_ j2-17
3752501250-125-250-375
LSL USLProcess Data
Sample?N 29StDev(Within) 47.18711StDev(Overall) 49.35170
LSL -400.00000Target *USL 400.00000Sample Mean -64.88374
Potential (Within) Capability
CCpk 2.83Overall Capability
Pp 2.70PPL 2.26PPU 3.14Ppk
Cp
2.26Cpm *
2.83CPL 2.37CPU 3.28Cpk 2.37
Observed PerformancePPM?<?LSL 0.00PPM?>?USL 0.00PPM?Total 0.00
Exp. Within PerformancePPM?<?LSL 0.00PPM?>?USL 0.00PPM?Total 0.00
Exp. Overall PerformancePPM?<?LSL 0.00PPM?>?USL 0.00PPM?Total 0.00
WithinOverall
Process Capability of After
CPK: 1.18 CPK 2.37
One month pilot run result shows before and after resolution implemented Pin bent position really improved !
AM I CD
49
Pilot run for FTY% trackingAfter improvement on the first time yield%, we got this trend chart:
Pilot Run Result
TIPM Product AOI First Time Yield Daily Performance Trend
75.00%
80.00%
85.00%
90.00%
95.00%
100.00%
18-J
un-0
8
19-J
un-0
8
20-J
un-0
8
21-J
un-0
8
22-J
un-0
8
23-J
un-0
8
24-J
un-0
8
25-J
un-0
8
26-J
un-0
8
27-J
un-0
8
28-J
un-0
8
%
FTY% is higher than 96%, and the average FTY value is 97%
达成目标
TIPM Product AOI First Time Yield Daily Performance Trend
75.00%
80.00%
85.00%
90.00%
95.00%
100.00%
28-O
ct-0
7
29-O
ct-0
7
30-O
ct-0
7
31-O
ct-0
7
1-N
ov-0
7
2-N
ov-0
7
3-N
ov-0
7
4-N
ov-0
7
5-N
ov-0
7
6-N
ov-0
7
7-N
ov-0
7
8-N
ov-0
7
9-N
ov-0
7
10-N
ov-0
7
%
97%
May’08Yiel
d Pe
rfor
man
ce
86%
Nov’07
AM I CD
50
Add NP chart for test defect counts control in test bay eSPC function: Subgroup size =30 upper limit =3
Add NP chart in Control plan
AM I CDControl Plan Update
51
Standardization and Documentation
Replication OpportunityReplication Standardization
Solution Focus Pilot Site Company-wide Similar process
TIPM Product Line TIPM Product Line Continental/Tianjin SMT Line
Continental/Tianjin and other Continental Electrical SMT Line
SMT Line and other product line using
UMG Pin Mounting Process
AM I CD
52
Updated the product handle procedure based on the corrective action and train related operator and release the WI into system9000:
AM I CDLesson Learned and Training
53