Enabling the Supply Chain Accelerate R&D and Stay...
Transcript of Enabling the Supply Chain Accelerate R&D and Stay...
Gopal Rao
Technology & Manufacturing Consulting
email:[email protected]
Tel: (505) 504 2620
Enabling the Supply Chain Accelerate R&D and
Stay in Sync with the IC Scaling Cadence and Consumer Demand
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Device Makers
Customers
Develop New Capabilities
And Mitigate Risk
Time Money/Market
Technology Cadence
Reduce Cost of Technology
And Manufacturing
Reduce Cost of Sales
Reduce Cost of Manufacturing
Supply
Chain
Consumer
Demand
Supply Chain Integration: Push/Pull Roadmaps
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Powered By Moore’s LawPowered By
Imagination
Source: Intel
Example: End Result – Integrated Performance of Supply Chain
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ITRS Roadmap – Helped Industry Stay On Moore’s Law
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Evolution of ITRS: From More of Moore to More Than More
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Imagination Inspired Products: Dramatic Impact on HVM
Source: Intel
Cost of Technology
Cost of Manufacturing
Time to Market
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Leveraging Digital Revolution In HVM
Source: GE
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Research
Development
Manufacturing
Source: ITRS
Sequential Flow to Integrated R-D-M: Faster Cycles of Learning
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Buildings
Sub Fab, Systems, Facilities
Roadmap
Standards
Fab (Clean Room)
Roadmaps
Standards
Equipment/Materials
RoadmapsStandards
FactoryOperations
ProductionEquipment AMHS
Factory Information& Control Systems Facilities
UI
Sub Systems
Components
Supply
Chain
Case For Integrated Roadmap & Standards Development
FYI : SEMI has 870 Standards (Source SEMI.org)Roadmaps & Standards6/25/2014
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Some Attributes of a Fab
SECS Control Line
Equipment Data Acquisition (EDA) Standards to get Rich Equipment Data
Manufacturing Execution Systems
Predictive Factory Scheduler
And Material Control
Full Wafer Level Tracking &
Recipe/Parameter Changes
100% Direct Tool
Delivery AMHS
Ubiquitous APC; Rapid Process Matching &
New Product Qualification
Standard, Detailed Equipment
Performance Tracking (EPT) Data
Systems Scaled for
> 50k wspm
Data standards and
Systems for Rapid
Mask Set Creation
Aggressive NPW Reduction &
Efficient Spares Mgmt
Very Fast Cycle time
Fabs for Hot &
Normal lots
Wafer Data Standard
For Packaging
Offline tools to test
schedule rules and rapidly
put in Mfg.
Predictive Maint. and PM
scheduling.
Pervasive
E-Diagnostics
SPCR2R FDC
Yield VM EPT
Equipment Engineering Capabilities
Recipes
E-Diag
EquipmentControl Systems
Partner, Customer
Or Supplier
Equipment & Systems
designed for High Mix
operation & “Mega Fabs”
Equipment &
Process Data
Source: Gopal Rao, International Technology Roadmap for Semiconductors
PPM
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Product Reliability
Form, FIT, Function
Process
Transistor & Interconnect
Metrics
Equipment
Input & Output
Parameters
Materials
Quality, Purity,
Defectivity
Facilities
Integrated Metrics
Symptom
Low Deposition Rate
Condition 1
Contamination
Condition 2
Gas
Condition 3
Pressure
Condition 4
Temperature
Condition 1.1
Chamber
Contamination
Condition 1.2
Load Lock
Contamination
Condition 2.1
Gas lines
Condition 2.2
Flow Control
Condition 2.3
Cylinder
Condition 3.1
Vacuum pump
Condition 3.2
Chamber Leak
Condition 3.3
Pump Lines
Condition 3.4
Pressure control
Condition 4.1
Heating coils
Condition 4.2
T.C.
Condition 4.3
Temp controler
Condition 2.2.1
MFC calibration
Condition 2.2.2
MFC functionalityCondition 2.2.3
Controller functionality
Cause & Effect – Problem Solving CapabilityComponent Impact on Yield, Output, Cost
Example of Problem TraceabilityInteraction & Interdependency of Metrics6/25/2014
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Source: Intel
Need For Faster Integration of
Supply Chain in R&D and HVM
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So What Does This All Mean?
Culture Challenges Opportunities for
The ConFab
AccelerateFocus on
Entire Supply Chain
Interception of the Imagination Inspired,
Consumer Driven Products
The Fabs Make it Happen: Expand Discussions Beyond
the SEMI Industry
Collaborate Faster Time To Market
Effective Supply Chain Integration into R&D and
HVM
Build on your success – What is the vision for the next 10
years?
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