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2014

MWI Laboratories

1002 E. Vista Del Cerro Dr. Tempe, AZ 85281

480-478-9398 www.mwilab.com

Presented By: Jeffrey Peebles, CO-Founder 1

Non-destructive testing: powders, ceramic, oils, & other composite materials

http://www.mwilink.com/

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Objective

Objective

- Introduce Gaussian Beam Technologies

- Describe how they can save the user TIME and MONEY in a variety

of Non-destructive (NDT) applications.

- Laboratory Quality Assurance (QA)

- In-process Quality Control (QC)

- Maintenance & Repair

- Understand theories of material measurement in a NDT application

- Find the suitable solution for your application and its benefits

2

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Agenda

Agenda

Introduction of MWI Lab’s Gaussian Beam capability

Customer Benefits

Competition

Microwave {0.7 – 50 GHz} Non-destructive / Non-contact Technology

Antenna design

Application Implementation

Solutions

UHF / VHF Non-destructive Epod & MEpod

Antenna design


Solutions

Dielectric Powder Testing

Theory of design


Solution

References 3

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Pain of our Customer

Customer Pain

Needs to test the actual deliverable composite part

Needs Non-Destructive (NDT) inspection capabilities

Needs real time & tighter In process Quality Control

Determining Composite material variability & Uniformity

Product cure verification of anisotropic material

Needs to reduce scrap / waste while increasing Production efficiencies

Needs real-time Material Properties

In liquid state

In powder state

In-process high temp conditions

In solids; pre or post “cooking”

Needs to inspect for defect;

Moister Levels

Surface; dents, strikes, F.O.D.

Composite material repair quality

4

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Typical Material Vs Freq.

Typical

Material

40Hz 1MHz 50 MHz 100 MHz 500 MHz 1GHz 10GHz 20GHz 30GHz 40GHz 50GHz

5

Powders Powders {release early 2015}

Plastics {Films, Solids, Webs}

Moister Level {Food, drug, and related packaging …etc.}

Ceramics {Tiles, mesh and webs}

Composite structures {Radomes, Air foils, propeller blades …etc.}

Foams, Non-conductive & Conductive {Radome, EMC / RF absorbers}

Honeycomb cores, Non-conductive & Conductive {Radome, EMC / RF absorbers}

Films / webs, Non-conductive & Conductive {Fiber glass, Kapton, Kevlar…etc.}

Plastics; Ceramic, Teflon, Lexan, Rexolite, Glass Epoxy, Resin, Quartz Glass, Silicon dioxide, Si02…..etc. Powders; Talcum, Salt, Potash, Additives, Sugar, Quartz, Ceramics, Drug mixtures….etc.

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Equip. Selection Vs Freq.

MWI LAB

Equip Solution

40Hz 1MHz 50 MHz 100 MHz 500 MHz 1GHz 10GHz 20GHz 30GHz 40GHz 50GHz

6

Capacitor {QA}

MEpod {QA, QC, Hand held}

Large Tunnel {QA}

High Temp. Test Capability

Hand Held Reflectometers

In Process 3D Test/ Scan Capability

Mini / Micro Arch {QA, QC, Robotic}

Mini / Micro Tunnels {QA, QC, Robotic}

QA = Quality Assurance Application QC = Quality Control / In Process Applications

Epod {QA, QC, Hand held}

Large Arch {QA}

Non-Contact / Non-destructive Applications Non-destructive Application

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MWI Lab Solutions

MWI Lab

Solutions

7

Engineering Services

Design & Implement -Custom Test systems -System Evaluation -Control Software

QA Lab Equipment

QC In-process Equipment

Material Test Services

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Proven Customer Benefits

Aerospace

Benefits

Automotive Food & Drug / Bio-Med

• Product Liability • Microwaveable packaging • Moister level detection • In-process 100% QC

• Powder Testing

• Mixture density • Uniformity {within Lot or Lot-to-Lot}

• EMC testing • 58% Cost reduction for

emergency braking • Beam Uniformity

• In-process QC Inspection • Composite curing

uniformity • Hand held defect detection for repair / uniformity

• Non-destructive Quality Control (QC) • In-process material fabrication • Improve product uniformity control from

48% to 92% • Reduce Scrap rates by 80% from current

methods

• Non-destructive Quality Assurance (QA) • Cost reduction of 310% compared to

competitor’s methods • Reduced sample test size, from sq. yards to

sq. inches in specifically UHF/VHF testing • Implement Uniformity testing where none

previously existed

• Maintenance & Reliability • Inspecting & detection for Maintenance &

Bird strikes

• Reduce inspection time from hours to minutes or seconds

8

Other Industries

Oil & Gas, Circuit Board, Printed / Flex circuit (RFID), Cell Phone, Infrastructure; (Wire Dielectrics, Pipe corrosion), Alternative Energy, ….. Etc.

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Comparison to Competition

Competition

Gaussian Beam Technology

• Produces a stable, planar wave <1.5” from tip

• Application Diversity

• In-process Quality Control (QC)

• Laboratory Quality Assurance (QA)

• Calibration; simple (Iso. & response) seconds

• Single S-par math for precision cal. & data

reduction

• Test times / point: typically < 7 sec./pt. for N9928

• Tunnels & Arches

• Smaller (ft3) & lighter (15 to 187 lbs.)

• Dynamic Range ~70 dB @ 10 GHz

• Very portable, do not require laser alignment

• Test sample

• Can test in-process / during fabrication

• The actual deliverable parts (100% inspection)

9

Focus Beam (FB), Standard Gain Horn (SGH),

Coax or Waveguide Technologies

• Wave form is not stable;

• SGH must be in Far-field and has edge diffraction

• FB focus plan changes with frequency

• Primarily Quality Assurance (QA) Devices ONLY

• Calibration times are a minute to hours

• Requires complex full S-parameter math for precision

calibration & data reduction

• Test times / point typically: > 30mpp to hours

• FB & SGH Tunnels & Arches

• Larger (yds3) & heavier (~1ks lbs.) systems

• Dynamic Range ~35 – 40 dB @ 10 GHz

• FB systems must maintain laser alignment

• Coax & Waveguide

• Are destructive measurements

• Require precision machining of test samples

• Test sample - Test representative samples only.

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Our Technology

Our primary devices use free space, Gaussian Beam Technology for performing

non-destructive testing (NDT) and include but are not limited to Admittance

Tunnels, NRL Reflection Loss Arches, hand held Reflectometer.

New revolutionary family of sensors called the E-pods or Electro-Magnetic

Linear Polarized Resonate Sensors and ME-pods for Multi-Resonate Sensors.

New / unique powder test capability, using the E4990A Impedance analyzer

combined with the 16451B fixture. Early 2015, to release E4991B Impedance

analyzer combined with the 16453A fixture.

Technology

10

Gaussian Beam Antennas

R. E. Diaz, J. W. Peebles, R. LeBaron

Arizona State University

11

Motivation

• The Gaussian Beam Antennas fills the need for a stable, narrow, uniform beam that does not change with frequency when testing for material properties at microwave frequencies.

• Focus beam (FB) test systems have an inherent issues that the beam’s focusing spot size and position changes with frequency.

• Standard Gain Horns (SGH) require very large systems in order to be in the far field for achieving a planar wave. They typically over illuminate the sample being tested. Requires an iris plate.

• Typical Iris / reflective test system have issues with beam scattering / diffraction due to sample over illumination.

12

High Fidelity Admittance Tunnel

Why not a focusing lensed tunnel? •The field on the focal plane contains a longitudinal E-field that can be as high as 30% of the desired transverse field.

•Focal plane changes with frequency. - It can be before or after the material

plane. - Thus requiring additional S-par math

for calibration correction and data reduction.

•Spot shrinks proportional to the frequency, sampling less and less of the material.

•Over focusing causes a split beam effect.

13

So can we create a quasi-plane wave in the Fresnel Zone close to the iris?

• A Polyrod can.

• The idea is to couple the wave guided by the ridges into a surface waveguide that then releases the wave gently into free space.

• For broad bandwidth need to use the TM01 dielectric slab mode with zero frequency cutoff. 14

The ideal polyrod horn is a polyrod on a Vivaldi Horn

Top View E-field Side View H-field

Vivaldi Top Hat Vivaldi

Dielectric center layer

Outer Dielectric Layer

1.75”

17.5”

15

Tim

e s

tep

s

Time history t=182dt to 546dt

• Top view, E-field 16

Tim

e s

tep

s

Time history t=364dt to 546dt

• Side view, H-field 17

Tim

e s

tep

s

250

200 150

100

50

4 2 0 2 40

0.024

0.048

0.072

0.096

0.120.12

0

F12ik

F11ik

F10ik

F09ik

F08ik

3.63.3 Positionik

The concentration of field on axis can occur as low as 165 MHz

• E-plane beam profile produced by the polyrod horn

• (c) 8 GHz, 9 GHz, 10 GHz, 11 GHz,12 GHz.

• (d) 13 GHz, 15 GHz, 17 GHz, 19 GHz, 20 GHz

4 2 0 2 40

0.024

0.048

0.072

0.096

0.120.12

0

F20ik

F19ik

F17ik

F15ik

F13ik

3.63.3 Position ik

(c) (d)

7”

7”

18

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HFSS Antenna Far Field at 3GHz

(x-axis) (y-axis) (z-axis)

19

20

The aperture: •Chokes the wave at low frequency. •Diffraction adds non-plane wave interference

The admittance tunnel is one of the most important material measurement tools

Measurement of Amplitude, Phase as f(polarization,w) plus material thickness yields

complex e,m

The incident wave is not plane

The polyrod design enables a very compact tunnel, increasing the Dynamic Range

Thru Response

Isolation

50MHz 20 GHz

Below 2GHz: 50 dB

70 dB

21

Polyrods 1ft tip to tip yield measurement results equivalent to horn antennas 6ft apart

• A slab of rexolite from Cal Plastics 3.5mm thick. No Iris

0 2 4 6 8 10 12 14 16 18 202

2.1

2.2

2.3

2.4

2.5

2.6

2.7

2.8

2.9

3

Rexolite (gated in empty)

Re

al p

art

of P

erm

itti

vit

y

3 .0

2.0

0

2.55

epr3 i

200 fGHz i

0 2 4 6 8 10 12 14 16 18 201

0.8

0.6

0.4

0.2

0

0.2

0.4

0.6

0.8

1

Imag

. pa

rt o

f P

erm

itti

vity

1

1

edp3 i

200 fGHz i

Result from Horn antennas Result from Horn-Polyrods

22

23

Poly-probe Antenna

• Analysis Shows • Spot size is less than (2.5” x 2.5”)

• Conical beam pattern

• Scalable to any size of waveguide

Near Field Far Field

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Gaussian Beam Tunnels

Large & Mini / Micro

Tunnel Tunnels

24

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Large Tunnel

Applications Specifications

Tunnels

• Laboratory QA environments • Mobility for program areas use • Material testing ranges

• Low loss / Low Dielectric materials

• Radomes • Webs; S-glass, Kevlar, etc. • Honeycomb cores • FR4 type foams

• Absorbing structures • Lossy / Conductive material • Resistive films / R-cards • Absorbers • Magrams

• Uniformity testing

• Frequency from 0.7 to 16 GHz

• Beam Size 12.5"@10 GHz

• 70 dB dynamic range @ 10 GHz

• Off-angle (45o) Insertion Loss Capable

• Dimensions 40” x 40” x 84“

• Sample size depends upon desired freq. range of test.

• Low diffraction sample table

• TMACS Supports all Keysight PNAs, and Field Foxes… PXI-VNA & ENA coming soon.

25

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Mini & Micro Tunnel

Specifications Applications

Tunnels

• Frequency range is banded from 7 to 50 GHz and is dependent on PRA antennas ordered

• Beam Size range; 1” to 2.5" dia

• Off-Angle (60o) insertion Loss capable

• Minimum sample is 3.0” for normal or 6.0” for off-angle.

• Dimensions; • Mini =26x 40 x 36“ Micro =12x 24 x 36”

• Optional probe mounts • Dual Polarity /Multi Probe for freq.


• Laboratory QA environments • Table Top / Mobility for program areas • Material testing ranges




• Uniformity testing • FOD & Defect Detection

26

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Gaussian Beam Reflection Arches

Arches

27

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Large Arch


Arches

• Laboratory QA environments • Mobility for program areas • Material testing ranges




• Uniformity testing

• Frequency from 0.7 to 16 GHz

• Beam Size 12.5"@10 GHz

• Angle range (TE & TM) • +10º to +85º • Cross talk reduction baffle

• Dimensions 50” x 40” x 84“

• Sample size depends upon desired freq. range of test.

• Low diffraction sample table


28

Options available • Customized sample tables • Automated positioning &

calibration • Space saving applications

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Mini Arch


Arches

• Laboratory QA environments • Table Top / Mobility for program areas • Material testing ranges




• Uniformity testing • FOD & Defect Detection

• Frequency range is banded from 7 to 50 GHz and is dependent on PRA antennas

• Beam Size range; 1 to 2.5" dia • Angle range (TE & TM)

• +5º to +85º • Cross talk reduction baffle

• Minimum sample is 3.0” for 0 – 25o or 6.0” for full range of reflection angles.

• Dimensions; 26” x 30” x 36“ table top • Options

• Probe mounts for Dual Polarity / Multi Probe for freq.

• Automated Positioning


29

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Epods & MEpods Table

Epods

Epod is a single resonate frequency probe

MEpod is a multi-resonate frequency probe

30

Fieldable inspection tools operating at the frequency of

use for risk reduction of composite structural

platforms, from manufacturing through

repair

R. E. Diaz, J. W. Peebles, R. Le Baron Arizona State University

31

The electromagnetic properties of absorbers are frequency dependent, thus they must be measured at the frequency of use

• RF absorbing structures incorporating resistive films depend for their per-formance not only on the accuracy with which the components hit the targeted design value but also on their uniformity.

• Therefore their statistical variation from manufacture through their final incorporation into composite parts and even after repair must be measured.

• This characterization is only meaningful when performed at the intended frequency of use.

Log (Freq GHz)

Log (Freq GHz)

(manufacturing variation)

32

How small a spot-size can a wave be focused

in order to inspect a material? • Since the antenna aperture and focal spot must be

proportional to l, focused waves are viable only in the GHz range.

• When conventional waveguide methods are employed to “certify” materials at the frequency of use, say VHF, the waveguide structures can be as large as 4 feet in cross section by 20 feet long. Of necessity the material properties certified in those fixtures are the average properties of the sample over that large area.

• Yet we know that sub-wavelength inhomogeneities in an absorbing material will produce undesired scattering that can raise the noise floor of the design.

33

A linearly polarized eddy-current probe operating at VHF

• Resolution of approximately 1” at ~200MHz.

• Sidesteps the issue of the wavelength by operating in the reactive near field of a higher-order multipole antenna.

• Because its electric field is induced electrodynamically, it is not blocked by intervening dielectric skins.

• Its linear polarization implies that it can readily detect the well known anisotropy of loaded honeycomb.

• Resonant operation makes it very sensitive.

-10-20

-10

0

+10

-6dB -20dB

-10-20

-10

0

+10

-6dB -20dB

Hot spot ~ 20mm by 30mm where a mostly linearly polarized electrodynamic field is created.

E-Field

34

• A commercially available process deposits a very uniform carbon coating on plastic substrates.

• A stripe was measured and then damaged with 4 X-Acto Knife cuts:

2”, 1”, 0.5” and 0.25” long.

• The X-Band measurement just sees system noise variation before and after (~0.2dB)

What about detecting localized defects?

X-Band

35

• We can even detect cuts at 45 and 80 degrees to the field, scratches, and a damaging fold of the R-Card.

The VHF Probe clearly sees all cuts.

E-Field perpendicular to cuts

This is being measured through 0.09” of plexiglas, so measuring through a “skin” is no problem

Fold

80o

45o

scratch

Possible handling damage 36

Conclusion

• The linearly polarized eddy current probe constitutes a new family of sensors that can be applied to monitor the quality of RF absorbing structural materials from “cradle to grave” at the frequency of use.

• Applications range from in-line statistical process control monitoring systems through post-repair inspection tools in the field.

• Both the VHF and GHz probes used in these demonstrations are robust enough to be used in a depot environment or incorporated into a robotic in-process inspection system.

37

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EPODs

Applications Specifications • Laboratory QA environments • In-process QC environments • Hand held repair • Material testing ranges

• Low loss / Low Dielectric materials • Radomes • Webs; S-glass, Kevlar, etc.

• Absorbing structures • Lossy / Conductive material • Resistive films / R-cards

• Uniformity testing • FOD & Defect detection • RF power field probing

• Resonate frequency range • Epod; Any single resonate freq.

from 90 MHz to 1.5 GHz • MEpod; Up to 12 Multi-resonate

freq. from 40 MHz to 600 MHz

• Resonate Beam Size 1.5" dia. x2“ tall

• Dimensions; • Epod = 6 x 4 x 4“ • MEpod = 4 x 4 x 4”

• TMACS Supports all Keysight PNAs, and

Field Foxes… PXI-VNA & ENA coming soon.

38

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EPODs

Dual Epod Table


• Resonate frequency range • Epod 90 MHz to 1.5 GHz • MEpod 40 MHz to 600 MHz

• Resonate Beam Size 1.5" dia. x2“ tall

• Dimensions; 30 x 36 x 60“

• TMACS Supports all Keysight PNAs,

and Field Foxes… PXI-VNA & ENA coming soon.

• Laboratory QA environments • Mobility for program areas • Material testing ranges


• Radomes • Webs; S-glass, Kevlar, etc.

• Absorbing structures • Lossy / Conductive material • Resistive films / R-cards • Absorbers

• Uniformity testing • FOD & Defect detection

39

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On-line Scanners & Sensors

40

Non-Destructive / Non-Contact

• Target contacts • QA Managers • Production Managers • Program Leads

• Competing tech. Methods • Destructive; 4-point probes, Pin-tables • Non-Destructive; Coax Probe, Slotted

Waveguide, Stripline, Twin-lead, Eddy current probe, Std. gain horn, X-ray, photo-bit map for defect detection

• MWI Advantages • Testing actual deliverables

• Reduced sample waist by >85%

• Increased uniformity by >92%

• Production ready software (SPC)

• Sample prep. Reduction

• No stopping line for QA sample

• No waist due to restarts

• Control Uniformity at freq. interest

• Down / Cross Web variability

• Anisotropic materials

41

In Process QC Test Services

• Gaussian Beam Test method – Freq. Range

• Broad band (0.7-16 GHz) • Banded (7 - 50 GHz) • Higher Freq. upon request

– Non-contact test Methods • (Insertion Loss) - Tunnel • Reflection Loss - Arch • XYZ- Scanners / Uniformity

– Operating Temperature (Room ~ 130 of) {3,000 of under development}

• Production Test Quality – Full-automation – Collection Speed (2 – 30sec.) – SPC run charts – Real-time data output – Collection Data

• dB & Phase / Smith Chart

– Calculation / Data Reduction • Permittivity, Permeability,

Ohms/sq., Zo, C, L, R

Non-Destructive Low Frequency

42

In Process QC Test Services • Open Cavity Resonator method

– Agilent Equipment • Field Fox, PXI-VNA • PNA or ENA

– Freq. Range • Single point (0.01- 3.5 GHz) • Multi-point band • Swept Frequency • Higher Freq. upon request

– Near Proximity test Methods • Sheet admittance • Material Uniformity • Defect Detection • XYZ- Scanners / Uniformity

• Production Test Quality – Full-automation – Collection Speed (0.1 – 30sec.) – SPC run charts (Avg, min., max) – Real-time data output – Collection Data

• dB & Phase / Smith Chart

– Calculation / Data Reduction • Admittance, Conductance, Ohms/sq., Zo, C, L, R

• Target contacts – QA Managers – Production Managers – Program Leads

• Competing tech. Methods • Destructive; 4-point probes, Pin-tables,

Split-post resonator, Cavity Resonator • Non-Destructive; Eddy current probes,

X-ray, Dielectric probe

• MWI Advantages • Testing actual deliverable • Reduced sample waist by >85%

• Increased uniformity by >92%

• Production ready software (SPC)

• Sample prep. Reduction

• No stopping line for QA sample

• No waist due to restarts

• Control Uniformity at UHF/VHF freq.

• Down / Cross Web variability

• Anisotropic materials

Engineer Services – “In Process QC”

We have the ability to model any RF test device and system that interacts with RF

energy.

• High Frequency Selective Surfaces (HFSS) • Finite Difference Time Domain (FDTD) • PHD support staff from ASU • Experienced Machine shop capability •Proven “Gen-5” Prototyping process

Customer problem: Develop high speed test method for product Liability testing of microwaveable food containers burning up. Support Provided: • Evaluate customer product & determine pass / fail criteria for container’s defects.

• Recommend implementation of in-process test system that can test for defects & pass / fail decision in less than 2 seconds.

• Develop customized prototype system for a minimum of 7 production lines and 62 different produces.

43

In-process QC

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Hand-Held Devices

Hand-Held Configurations

Applications

Specifications

• Repair, Defect, and FOD inspection • Material testing ranges Low loss / Low Dielectric materials

• Radomes • Webs; S-glass, Kevlar, etc.

• Absorbing structures • Lossy / Conductive material • Resistive films / R-cards

• Uniformity testing • FOD & Defect detection

• Resonate frequency range • Epod; Any single resonate freq. from 90 MHz to 1.5 GHz • MEpod; Up to 12 Multi-resonate freq. from 40 MHz to 600 MHz

• Dimensions; • Epod = 6” x 4” x 4“ , MEpod = 4” x 4” x 4” • Reflectometers = 6” x 6” x 12” and wt. < 3 lbs

• Supports all Keysight; Field Fox NA or PNAs

44

Measuring Dielectric Properties Using Impedance Analyzers

Speaker Name Jeff Peebles

Updated July 17, 2014

Keysight E4990A & 16451B fixture with MWI dielectric sample holder

46

Dielectric sample holder

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Powder Testing

Dielectric Powder Testing

Applications

Equip. Specifications

• QA Powder measurements for incoming inspection • Material testing ranges

• Aerospace Composite High Temp. Ceramics • Food & Drug Low loss / Low Dielectric additives • Earth soaked with oils

• Uniformity testing • Lot to Lot and within a lot • mixtures

• E4990A Combined with the 16451B test fixture • Frequency range; 30 Hz to 30MHz • E4991B Combined with the 16453A test fixture Coming in early 2015

• Frequency range; 1MHz to ~1-2 GHz

• Dimensions; • 16451B, Sample size = 2.5 in3 • 16453A, Sample size = 1.5 in3

47

Page

Solid

Cp G

Equivalent Circuit

Thickness = t

Electrodes (Area=A)

Permittivity Evaluation

Co : Air Capacitance

00

0C

Gj

C

CCj

CjGY

p

p

ww

w

00

*

C

Gj

C

C p

rw

e

eew

e

ee

tan.0

0

rr

p

r

A

Gt

A

Ct

Dielectric Material Measurement Parallel Plate Technique

48

Page

Dielectric Material Measurement Guard Electrode & Dielectric Technique

Lines of Electric Field Lines of Electric Field

Edge capacitance Guard

+ +

– –

Permittivity Evaluation

49

Lines of Electric Field

Stay inside Fixture

MWI Lab

Fixture

+

–

The holder’s volumes of the circuit model are represented by the regions below:

Region 1: Bottom of Dish

Region 2: Variable thickness dish lid

Reg

ion

3: D

ish

sid

e-w

alls

Region 4: Variable depth of powder dish

The electric field is assumed to be vertical and contained by the four regions.

50

The side walls are in parallel with three series capacitors: lid, powder and dish bottom respectively.

Air Filled Volume

Powder Filled Volume

There are undetermined differences between the Simulation Model and the Real fixture.

• We accurately remove the unknowns from both real and simulated fixtures.

• backing out the capacitance of the surrounding environment, feed cables, and test fixture.

• The post-processed capacitance remaining is due to an ideal air volume between the electrodes, partially filled with powder.

Fringing is removed

• The Morphology function is back to the ideal case, air and powder, only, and the flux is contained!

51

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The simulation model of the Dielectric test fixture

Powder Volume

More details of this model are shown in the online Presentation. 52

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MWI Lab’s Morphology measured Results

.0001 .001 .01 .1 1 .00001

1

1.5

2.0

2.5

3.0

3.5

4.0

Air

Quartz @ 75of

(at 27 MHz)

er

= tan er’ er”

Sulfur @75of

Fluorite @ 75of

Sugar @75of

Salt-non-iodized @ 75of

Salt-iodized @ 75of

Result Match from other published methods www.Honeywell.com www.cnt.com www.deltacnti.com

Alumina (granulated) @ 75of

53

http://www.honeywell.com/

http://www.cnt.com/

http://www.deltacnti.com/

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Dielectric Mixture Test Results {Oil/Salt/Air}

2

2.5

3

3.5

4

4.5

5

5.5

0 2 4 6 8 10 12 14

Oil 83/0/17

Salt 0/86/14

49/51/0

42/53/5

20/80/0

87/6/7

85/13/2

81/19/1

74/25/1

68/30/2

62/38/0

55/45/0

I suspect error in the results were caused by problems with accurately measuring the volume of salt particles (salt was falling into the interior of the scale) as well as the air bubbles need to be removed.

54

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presentation. Test Material ε' effective ε" effective ε' ε" ε' ε"

Number Name (Measured) (Measured) (Morphology Method) (Morphology Method) (Capacitance Method) (Capacitance Method)

1 Control_Dish 1.0000 0.0000 1.0000 0.0000 0.9004 0.0119

2 Control_Dish 1.0000 0.0000 1.0000 0.0000 0.8994 0.0118

3 Control_Dish 1.0000 0.0000 1.0000 0.0000 0.9088 0.0113

4 Control_Air 1.0000 0.0000 1.0000 0.0000 1.0000 0.0114

5 Air 1.0001 0.0002 1.0001 0.0002 1.0001 0.0112

6 MaterialX 1.1420 0.0017 1.1469 0.0018 1.0467 0.0119

7 MaterialX 1.2498 0.0032 1.2633 0.0034 1.1494 0.0123

8 MaterialX 1.3305 0.0037 1.3553 0.0041 1.2403 0.0126

Sensitivity comparison between MWI Lab’s Morphology verses traditional Capacitive method.

Losses differences between the

dielectric and air are not

distinguishable (in the noise)

Losses differences between the

dielectric and air are distinguished

Low dielectric/loss material are differentiated from air with Morphology Reduction Method

X= Baby Powder

55

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0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

Frequency (MHz) Frequency (MHz)

Per

mit

tivi

ty

Per

mit

tivi

ty

0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

trace 1

trace 2

trace 3

trace 4

trace 5

trace 6

trace 7

trace 8

A0 A1 A2 A3 A4 A5 A6 A7

0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

trace 1

trace 2

trace 3

trace 4

trace 5

trace 6

trace 7

trace 8

A0 A1 A2 A3 A4 A5 A6 A7

Four different measurements of the permittivity of the empty powder cup region vs. depth: The error peaks at about 10%. The error tends to decrease

as the air gap decreases (with the exception of A7, depth of ~1mm).

This phenomena may be caused by the electric field flux preferring the side-walls of the dish. 56

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0 5 10 15 20 25 300123456789

10

0 5 10 15 20 25 300123456789

10

0 5 10 15 20 25 300123456789

10

0 5 10 15 20 25 300123456789

10

0 5 10 15 20 25 300123456789

10

0 5 10 15 20 25 300123456789

10

0 5 10 15 20 25 300123456789

10

0 5 10 15 20 25 300123456789

10

Here we are concerned with the precision and repeatability of measurements using the Keysight test device with MWI’s

measurement dish. We plot the error in permittivity (or percent difference) with

respect to the first measurement (Test 1). Error between measurements is less than 2% for most of the lids.

A0 A1 A2 A3

A4 A5 A6 A7

Percent Error of Permittivity (y-axis) vs. Frequency (MHz)

Lids A0, A1, and A2 were used on most for powder compression: The error between measurements with these lids is very close to 1%.

Test

2Te

st 3

Test

4

57

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We have been reporting primarily on the real part of data reduced, however, the imaginary component of the powder permittivity is

equally important. • There are losses in the system, as well as noise, so there is some error in the measured

imaginary permittivity of the empty dish/holder (should be free space).

Frequency (MHz)

Pe

rmit

tivi

ty (

Ima

gin

ary

)

Noise and Error: Imaginary Component of the Permittivity of Empty Dish

0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

trace 1

trace 2

trace 3

trace 4

trace 5

trace 6

trace 7

trace 8

A0 A1 A2 A3 A4 A5 A6 A7

Losses have no relationship with depth of empty dish.

0 5 10 15 20 25 300.01

5 103

0

5 103

0.01

0.015

0.02

0.025

0.03

0.035

0.04

0.045

0.05

0.055

0.06

58

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0 5 10 15 20 25 300

0.010.020.030.040.050.060.070.080.09

0.10.110.120.130.140.150.160.170.180.19

0.2

The good news is that, when measurable, the imaginary component follows the same trends as the real components.

Empty puck maximum error/noise in the imaginary component of permittivity

0 5 10 15 20 25 300.89

0.90.910.920.930.940.950.960.970.980.99

11.011.021.03

trace 1

trace 2

trace 3

trace 4

trace 5

trace 6

trace 7

trace 8

A0 A1 A2 A3

• Powder data is above the noise across the band. • Imaginary component increases with compression.

Frequency (MHz)

Per

mit

tivi

ty (

Ima

gin

ary

)

Powder Test 3: Baby Power

59

Summary

• For more information on the powder testing or determine if we can help measure your specific materials with a non-destructive method.

• Contact MWI Lab via the following: • MWI Laboratories…… Website: www.mwilab.com

• Email: Sales Product Information [email protected]

60

http://www.mwilab.com/

Page

Web page:

http://www.mwilab.com …Email: Sales Product Info <[email protected]>

http://www.asu.edu/ …….. ASU, dept. Electrical Engineering, Dr. Rodolfo Diaz, Morphology, Dielectric Testing

http://www.keysight.com/find/impedance

http://www.keysight.com/find/materials

5952-1430E:

LCR Meters, Impedance Analyzers,

and Test Fixtures Selection Guide

5950-3000:

Impedance Measurement

Handbook

5965-4792E:

Accessories Selection Guide For

Impedance Measurements

5980-2862EN: Solutions for Measuring Permittivity

and Permeability with LCR Meters and

Impedance Analyzers

References Application Notes and Selection Guides:

61

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