DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani

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1 DUDES - Async 2000 enter for eliable omput C R C DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani Subhasish Mitra Jo C. Ebergen 1 Marly Roncken 2 Center for Reliable Computing, Stanford University 1 Sun Microsystems Laboratories 2 Intel Corporation

description

DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani Subhasish Mitra Jo C. Ebergen 1 Marly Roncken 2 Center for Reliable Computing, Stanford University 1 Sun Microsystems Laboratories 2 Intel Corporation. Outline. Motivation and Background - PowerPoint PPT Presentation

Transcript of DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani

Page 1: DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani

1DUDES - Async 2000

enter for eliable omputing

CRCDUDES:

A Fault Abstraction and Collapsing Frameworkfor Asynchronous Circuits

Philip P. Shirvani Subhasish MitraJo C. Ebergen1

Marly Roncken2

Center for Reliable Computing, Stanford University1Sun Microsystems Laboratories

2Intel Corporation

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Outline

Motivation and Background Our Contributions DUDES Fault Model Fault Equivalence and Collapsing Conclusion

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Motivation: Fault Modeling Testing for Manufacturing Defects

Ensure high quality Fault Model Characteristics

Effectiveness in detecting defective parts Simplicity

Simulation ATPG complexity

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Motivation: ATPG Complexity Automatic Test Pattern Generation (ATPG)

High fault coverage Low test generation time

Too Many Faults to Cover Prune fault list

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Our Contributions Fault Modeling

Building block inputs/outputs Unified model New faults

Pattern-sequence-dependent faults DUDES

Fault Collapsing Basis for a formal technique

Towards ATPG

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Advantages Logic-Level

+ Fast simulation time Derived from Transistor Level Stuck-at Faults

+ Thorough Fault Equivalence & Dominance Relationships

+ Fault list reduction+ Speed-up ATPG

Uniform Model+ Hierarchical approach+ Applicable at system level

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Basic Elements

a

b

cC

C-element

ca

bM

ca

b c

ba

Inverse Toggle Toggle

Merge

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Down/Up-Disabled Output Faults Prohibited Transition

a; b; c; a; b; c; a; b; c; ... a; b; c; a; b; X ; X ; X ; X ; X ; ...

Vdd

a

b

c3

1 2

4

5

6

7

8

9

10

1112

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14

Vdd Vdd

T1

T2

T3

T4

5/1

c-dd

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Down/Up-Enabled Input Faults Premature Firing

a; b; c; b; a; c; ... a; b; c; b; c; ...

Vdd

a

b

c3

1 2

4

5

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7

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9

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1112

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Vdd Vdd

T1

T2

T3

T4

2/0

a-de

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Pattern Sequence Dependency PSD Prohibited Transition (Merge)

Initial state abc = 101 b; c; a; c; ... a; X ; X ; X ; X ; X ; ... PSD down-disabled fault on c

a

b

c3

1 2

4

5

6

78

9+

&

&

2/1c-dd (psd)

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DUDES Fault Model Down/Up-Disabled/Enabled and Stuck-at Basic Elements (Inputs x, y, Output z) Disabled Faults

z up-disabled, z down-disabled Enabled Faults

x up-enabled, x down-enabled y up-enabled, y down-enabled

Stuck-at Faults x/0, x/1, y/0, y/1, z/0, z/1

Pattern Sequence Dependency

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Fault Equivalence Example

c/0 : out = ab y/0 : out = ab

Keep Only One in Fault List

a

c

outa2

a1 x

y+

&

&

b

c/0

y/0

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Fault Dominance Test Set Comparison

y/1 : A = { abc = 000, 001, 010, 011, 100 } c/1 : B = { abc = 100 } B A c/1 dominated by y/1

Keep Only the Dominated in Fault List (c/1)

a

c

outa2

a1 x

y+

&

&

b

c/1

y/1

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Fault Collapsing 1: C-Element Up/Down-Disabled Output Faults

Test sequence = (a; b; c; a; b; c) Pin Stuck-at Faults

Same test sequence Up/Down-Enabled Input Faults

(a; <w>; b; c; a; <w>; b; c; b; <w>; a; c; b; <w>; a; c) Dominated by disabled and stuck-at faults

Keep Only the Up/Down-Enabled Input Faults

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Fault Collapsing 2: Inverse Toggle pref * [a; c; b; c; a; c; b; c] Initial state abc = 000 Test for a/0 and c/0 is (a; c)

a/0 and c/0 equivalent Test for b/0 is (a; c; b; c)

b/0 dominated by a/0 and c/0 Keep only b/0

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Formalizing Fault Collapsing Unrolled Trace Expressions

Transition directions Disjunction-free subexpressions

C-ElementC(x, y, z) = pref * [ (x; y) | (y; x) ; z ]C(x, y, z) = pref * [ (x; y; z; x; y; z)

| (x; y; z; y; x; z) | (y; x; z; x; y; z) | (y; x; z; y; x; z) ]

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Fault Collapsing 1: Stuck-At Faults x/0 in C-Element(x, y, z)

no transition on x no transition on z Remove z & z and following eventsC(x, y, z) = pref * [ (x; y; z; x; y; z)

| (x; y; z; y; x; z) | (y; x; z; x; y; z) | (y; x; z; y; x; z) ]

pref [ (x; y) | (y; x) ] Same Expression for y/0 and z/0

x/0, y/0 and z/0 are equivalent Keep only one of them

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Fault Collapsing 2: Up-Enabled Faults x Up-Enabled in C-Element(x, y, z)

x is already satisfied Remove x from sub-expressions

Need x Before x Weave with pref * [ x; x ]

pref * [ (y; z; x; y; z) | (y; z; y; x; z) ]

|| pref * [ x; x ]

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System-Level Fault Collapsing (1) F = C(x, w, m) || C(y, z, n) || C(m, n, p)

C(x, w, m) || pref [(y; z) | (z; y)] || C(m, n, p) Final expr.: one occurrence of x, w, y, z Same for w/0

y/0 and w/0 are equivalent

x

w

Cm

pCy

z

Cn

y/0

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System-Level Fault Collapsing (2) Equivalence Relationship

From low-level collapsing To high-level collapsing

y/0 n/0 and n/0 p/0 y/0 p/0

x

w

Cm

pCy

z

Cn

y/0n/0

p/0

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Conclusions DUDES Fault Model

Map internal stuck-at faults to pin faults PSD and <w> attribute used for ATPG

Supports Hierarchical Analysis at Logic Level Very effective for fault collapsing

From basic elements To system level

Work in Progress Formalization ATPG algorithms

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“Greetings from Stanford” Philip Shirvani & Subhasish Mitra

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Previous Work Stuck Faults on Building Block Inputs/Outputs

+ Fast simulation time+ Self-checking properties– Not thorough enough

Very High-Level Fault Modeling– Effectiveness not known

Transistor-Level Stuck-at Faults+ Thorough– Mainly for C-elements– Long simulation time