Demolding ENGR 1182.03 Pre Lab. Micro/Nanotechnology Tools One of the challenges of nanotechnology...
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Transcript of Demolding ENGR 1182.03 Pre Lab. Micro/Nanotechnology Tools One of the challenges of nanotechnology...
![Page 1: Demolding ENGR 1182.03 Pre Lab. Micro/Nanotechnology Tools One of the challenges of nanotechnology is the limitation of tools available to allow us to.](https://reader036.fdocuments.us/reader036/viewer/2022072013/56649e5e5503460f94b579a1/html5/thumbnails/1.jpg)
DemoldingENGR 1182.03Pre Lab
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Micro/Nanotechnology Tools
One of the challenges of nanotechnology is the limitation of tools available to allow us to “see” into this microscopic world.
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Wavelengths vs. Features SizeThe wavelength of a sinusoidal wave is the spatial period of the wave— the distance over which the wave's shape repeats. The smaller the wavelength of the wave the higher the energy of the wave.
Nanotechnology
100 10 10-2 10-4 10-6 10-8 10-10 10-12
Wavelength in meters
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MicroscopesAn optical microscope that uses
visible light through lenses can magnify up to 1,500 times!
A microscope that uses a beam of electrons instead of light can “magnify” millions of times!
Why the difference?
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ResolutionThe resolution of an image is limited by the
effects of diffraction (Bending of Light).
A good rule of thumb: an imaging system is able to resolve features to approximately half the wavelength of “wave” used
Therefore, the smaller the wavelength the higher the resolution of the microscope
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Microscopy using non-lightwavelengths
To obtain higher resolution than optical microscopes, imaging devices using other types of waves have been developed such as electron beam.
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Scanning Electron Microscope
An electron beam isfocused and scannedacross a specimen and then scattered electrons are detected. Those scatteredelectrons carry the image information .
Resolution is ~ 5 nm
Focusing
Scanning
Scattered electrons
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Cecropia Moth
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A close-up of the Cecropia Moth scale using a Scanning Electron Microscope –
Note scale of 1 micron
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Scanning Probe MicroscopesThe family of scanning probe
microscopes uses no lenses, but rather a probe that “interacts” with the sample surface.
Some examples are:Scanning Tunneling Microscope (STM)Atomic Force Microscopy (AFM)
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Learning Objectives of LabExpose students to a lab-on-a-chip
fabrication technique of demolding PDMS lid from the petridish.