Data Sheet Flick Standard Final - EMI Gage Files/Data Sheet_Flick_Standard_Final.pdfDATA SHEET FLICK...

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EMI GAGE 28W144 Industrial Ave Suite # 100 Lake Barrington, IL 60010-5939 Tel: (847) 277-7511 Fax: (847) 277-7911 DATA SHEET FLICK STANDARD DYNAMIC VERIFICATION EASY TO USE AFFORDABLE PRICE PRECISION STANDARD IMMEDIATE DELIVERY ISO/IEC 17025 CERTIFIED Above photo shows a dynamic vericaon using the Flick Standard. This procedure is a rapid vericaon of the probe gain and can be used daily to ensure proper system funcon. FLICK_50.PLN 90° 180° 270° Filter: Gaussian 50 UPR Reference: Least Squares Circle Roundness 418.950 μm RMS Roundness 75.351 μm Peak 60.422 μm Valley -358.528 μm Sector Roundness 50.111 μm (Window = 10° @ 216.8°) Sector Roundness 145.268 μm (Window = 30° @ 217.1°) Runout 418.889 μm Eccentricity 0.724 μm Ecc. Angle -89.452 ° Concentricity 1.448 μm EMI GAGE LABORATORY Typical roundness measurement of Flick detailing measured value for the calibrated Flick Standard. The operator can determine if the gage’s gain is correct by simply looking at the measured value and comparing to the calibrated value. FLICK WITH BASE NOMINAL SIZES TYPE I: 15-20μm (590-787μin) TYPE II: 300-400μm (11800-15700μin) FLICK STANDARD Two versions of the Flick Standard are available – custom Flick sizes available upon request. The Flick Standard comes complete with holder, case and calibraon cercate. ORDER INFORMATION ART_FLICKA01 Type I Standard Holder ART_FLICKB01 Type I with Base ART_FLICKA02 Type II Standard Holder ART_FLICKB02 Type II with Base Modern roundness instruments are normally set up to calibrate probe amplicaon stacally through known heights most commonly achieved through the use of gage blocks. This stac approach makes it necessary to perform a dynamic vericaon of the frequency response of the probing system. The best method of vericaon of this dynamic vericaon is made through the use of a “Flick” standard. The “Flick” standard is a cylindrical arfact with a known nominally at area. EMI Gage produces high precision “Flick” standards that have been calibrated through our ISO/IEC 17025 cered laboratory. These “Flick” standards are provided with a cercate that details the values of the “Flick” with respect to standard lters and p radii combinaons*. The calibrated “Flick” allows the user to easily determine that the roundness measuring gain sengs are performing correctly. The dynamic vericaon using the “Flick” standard is rapidly performed and can be implemented into daily vericaon protocols allowing the user to have an increased condence that the instrument is funconing correctly.

Transcript of Data Sheet Flick Standard Final - EMI Gage Files/Data Sheet_Flick_Standard_Final.pdfDATA SHEET FLICK...

EMI GAGE 28W144 Industrial Ave Suite # 100 Lake Barrington, IL 60010-5939 Tel: (847) 277-7511 Fax: (847) 277-7911

DATA SHEET

FLICK STANDARD

DYNAMIC VERIFICATION EASY TO USE AFFORDABLE PRICE PRECISION STANDARD

IMMEDIATE DELIVERY ISO/IEC 17025 CERTIFIED

Above photo shows a dynamic verification using the Flick Standard. This procedure is a rapid verification of the probe gain and can be used daily to ensure proper system function.

FLICK_50.PLN

90°

180°

270°

Filter: Gaussian 50 UPRReference: Least Squares Circle

Roundness 418.950 µmRMS Roundness 75.351 µmPeak 60.422 µmValley -358.528 µmSector Roundness 50.111 µm

(Window = 10° @ 216.8°)Sector Roundness 145.268 µm

(Window = 30° @ 217.1°)

Runout 418.889 µmEccentricity 0.724 µmEcc. Angle -89.452 °Concentricity 1.448 µm

EMI GAGE LABORATORY

Typical roundness measurement of Flick detailing measured value for the calibrated Flick Standard. The operator can determine if the gage’s gain is correct by simply looking at the measured value and comparing to the calibrated value.

FLICK WITH BASE

NOMINAL SIZESTYPE I: 15-20µm (590-787µin)

TYPE II: 300-400µm (11800-15700µin)

FLICK STANDARDTwo versions of the Flick Standard are available – custom Flick sizes available upon request. The Flick Standard comes complete with holder, case and calibration certificate.

ORDER INFORMATIONART_FLICKA01 Type I Standard Holder ART_FLICKB01 Type I with Base ART_FLICKA02 Type II Standard Holder ART_FLICKB02 Type II with Base

Modern roundness instruments are normally set up to calibrate probe amplification statically through known heights most commonly achieved through the use of gage blocks. This static approach makes it necessary to perform a dynamic verification of the frequency response of the probing system. The best method of verification of this dynamic verification is made through the use of a “Flick” standard. The “Flick” standard is a cylindrical artifact with a known nominally flat area.

EMI Gage produces high precision “Flick” standards that have been calibrated through our ISO/IEC 17025 certified laboratory. These “Flick” standards are provided with a certificate that details the values of the “Flick” with respect to standard filters and tip radii combinations*. The calibrated “Flick” allows the user to easily determine that the roundness measuring gain settings are performing correctly.

The dynamic verification using the “Flick” standard is rapidly performed and can be implemented into daily verification protocols allowing the user to have an increased confidence that the instrument is functioning correctly.