Circuit breaker arc analysis

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    l orclcc cv. and Dr. P. Scat-pa Liege Univcr.si ty for theopportunity to do va rious types of cperimcnts in their labor tories and to Prof L van der Sluis t l i Univ ersityfor discussion.8 Reterences DAMSIRA. G.C., and KERTtSZ. V.: Dcdopncnt and applicaon of a MHr digital vstcni for Cura,it.rcro TncsuraT cnW lEEP r- i Mnay. TcrhnrL 1995 142 , 2 . pp. l251322 SMEETh. RP P E1NlNK. AH and KERTESZ, V : A new highres olu tion high.frq .-y current-zero nxasu xirrg ast c1n. Pres ent ed atthe ERA coofcr cnc c on rrnei9 and calibratio n in high-idragrtc.r reit 1995 Paper [2CIGRE WOR.K.JNG GROUP 13.01,: Prtcal al iest ioa of rcpbys:ca rn icui t breakcr Surwy of cakuiat:on zrthods and zppliaton guidc, Eiccrra. May i S ii: pp.66-79 IGRE WORKING GROUP 13.0L: Apphcthara of btick bosrnodcflin to circuft brcakrs, Eiecrrrs. Augu..L 1994 149 pp. 41lI CIGRE WQR.jCJNj GR OUt 13.01, Sny on andticssJ andgraphicil tooR for circu it be ikr r behaviour desc rip tion 6 HABEDANK, Applknkm of a new arc rondd for the evaluationof shcit-cutuo b.-cak:n tests. iEEE Trrs, 1993 PWRf4, 4, pp.92 925 MAYR. 0,: t des iocn und anc rhung, ,4rc*ir/ii, retcchn ik, 1943. pp. 5886 88 CASSIL, AM: Arc rupture and cixnat tiit new tbeory.ClGRE report 1939

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    easy accsssible for me surement is a reasonable indicatorfor the margin o the interruption . Knowledge of the margin can be applied in the following fields: developmen t of CBs by manufacturing companies application of CBs in non-standard circuits and for nonstandard r tings estimation of the sta te of a breaker after caended service

    development of future standardsdcdcatcd high powcr testing and comparison ol tct-C1r cuils

    Given the wide range of the arc parameters describing thcactual sta te of the GB, it is our opinion that a generallyapp lic able arc model such as often offere d in networkanalysis softw re does not, exist, not even for a single GBdesic,7 AcknovvledgrnentThanks arc due to Dr. H. Knobloch S iemens AG and toDr . C. Neumann RWE Energic AG; for supply ing someof the test objects. Thanks are also due to Mr. A. Even

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