Chapter 3 Section 1: Microscopes
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Transcript of Chapter 3 Section 1: Microscopes
Cells Under the Microscope
Objectives:• Describe how scientists measure the length of objects.
• Relate magnification and resolution in the use of microscopes.
• Analyze how light microscopes function
• Compare light microscopes with electron microscopes.
• Describe the scanning tunneling microscope.
Cells Under the MicroscopeMeasuring Cell Structures:
Measurements taken by
scientists are expressed in
metric. The official name of
metric system is the
International system of
measurements, abbreviated
SI.
Cells Under the Microscope• Magnification is the
quality of making an image appear larger than its actual size.
• Resolution is a measure of the clarity of an image.
Cells Under the Microscope
• Both high magnification and good resolution are needed to view the details of extremely small objects clearly.
Light Microscopes• Light Microscopes form an image when light
passes through one or more lenses to produce an enlarged image of a specimen.
Electron Microscopes• Electron Microscopes form an
image of a specimen using a beam of electrons rather than light.
• The electron beam and specimen must be in a vaccum so that the electron beam will not bounce off of gas molecules.
• Live organisms cannot be viewed with an electron microscope.
Transmission Electron Microscopes
• An electron beam is directed at a very thin slice of a specimen stained with metal ions. Some structures become more heavily stained than others.
Transmission Electron Microscope
• The heavily stained parts absorb electrons, those that are lightly stained allow electrons to pass through.
• The electrons that pass through strike a fluorescent screen, forming an image.
Scanning Electron Microscopes• An electron beam is focused on a specimen
coated with a very thin layer of metal.• The electrons that bounce off the specimen
form an image on a fluorescent screen.• The image shows a three-dimensional details
of the surface of specimen.
Scanning Tunneling Microscope• A needle-like probe measures
difference in voltage caused by electrons that leak, or tunnel, from the surface of the object being viewed.
• A computer tracks the movement of the probe across the surface of the object.