Center for Probing the Nanoscale - NSF NSEC Grant 0830228PI: Kathryn Moler, Co-PI: David Goldhaber-GordonStanford University, Stanford, CA 94305

About the Center for Probing the Nanoscaleapply these novel probes to answer fundamental questions in science and technology transfer our technology to industry in order to make these novel probes widely availableinspire students, teachers and the public about nanotechnologyStanford University and IBM Corporation, with funding from National Science Foundation, founded the Center for Probing the Nanoscale to achieve five principal goals, to:develop novel probes that dramatically improve our capability to observe, manipulate, and control nanoscale objects and phenomenaeducate the next generation of scientists and engineers regarding the theory and practice of these probes50

Teacher ProgramsIndustrial Outreach Summer Institute for Middle School TeachersInspire middle school students in science by educating and training their teachers

Development of low-cost classroom activities with Bay Area distribution through Resource Area for Teachers (RAFT)Annual Nanoprobes Workshop Bring together academic and industrial scientists to exchange knowledge and ideasBroaden the horizons of participantsInitiate research projects with industryProvide venue for interaction between industry and graduating students~200 participants13 companies

Industrial Affiliates ProgramSponsored research programsParticipation in Center activitiesOnline Teacher Resources

Activities linked to Science StandardsClassroom MaterialsTeacher Preparation MaterialsLending Library

Industry Field-trips for studentsCareer Workshops and SeminarsPartnerships with Formal and Informal Science Education Centershttp://nanoteachers.stanford.eduMeasure electronic properties of materials at 10 nm resolutionNanoprobe tools under developmentNear-field Scanning Microwave Microscopy (NSMM): electric or magnetic coupling of a microwave signal from a tip to a sampleScanning Gate Microscopy (SGM): Electrostatic coupling of a quasi-DC tip voltage to sampleDevelopment of a new batch-processed coaxial tip with piezoresistor sensingdevelop and demonstrate techniques with the magnetic sensitivity and spatial resolution to characterize individual nanomagnetsTools under development: Scanning SQUID Microscope, Scanning Hall Bar Microscope, Magnetic Force Microscope, Near-field Sagnac MicroscopeFuse the high spatial resolution of STM with spectroscopy and high-frequency excitations yielded by optical channelsPerform spatially localized combined electronic and optical imaging and spectroscopyTarget spatial resolutions of 0.110 nm and frequency ranges of 1012-1015 HzPlasmonic STM geometryNovel multi-layer SQUID sensor demonstrated ~60 B spin sensitivity Improved Sagnac microscope to measure hysteresis loopsAdvancing development of Magnetic Force Resonance Microscopy (MFRM) toward a molecular structure microscopeNon-destructive and elementally selective 3D imaging techniqueGoal: extending spatial resolution to below 1 nmDemonstrated 4 nm 3D spatial resolution using Tobacco Mosaic VirusMeasure the forces, mechanical properties, and dynamics of biological membranes with critical resolutions of nanometers, microseconds, and pN by developing and employing novel probes. Nanoscale Electrical ImagingGoldhaber-Gordon, Shen, Kelly, PruittBio-ProbesMelosh, Cui, SolgaardPlasmonic STMBrongersma, Jones, ManoharanIndividual Nanomagnet CharacterizationMoler, Kirtley, Kapitulnik, MoernerNanoscale Magnetic Resonance ImagingRugar, PruittCPN in the NewsEducational and Industrial Outreachhttp://cpn.stanford.eduFunctionalized probe tips to measure membrane penetration dynamicsNovel ultra-fast cantilevers for dynamic force measurementRecently completed experimental setup of the Plasmonic STM system.

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