CDC Readout

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1 CDC Readout CDC Readout - upgrade for Higher Luminosity - Y.Sakai (KEK) 29-Oct-2002 TRG/DAQ WS @OCU Review of Status/Plan (based on materials from S.Uno/M.Tanaka)

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CDC Readout. - upgrade for Higher Luminosity -. Y.Sakai (KEK). Review of Status/Plan (based on materials from S.Uno/M.Tanaka). 29-Oct-2002. TRG/DAQ WS @OCU. Introduction. CDC will work at L = 10 35 → ?? x10 35. with some mod/improvement (a la S.Uno) [ small cell type CDC with R>15cm]. - PowerPoint PPT Presentation

Transcript of CDC Readout

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CDC ReadoutCDC Readout- upgrade for Higher Luminosity -

Y.Sakai (KEK)

29-Oct-2002 TRG/DAQ WS @OCU

Review of Status/Plan (based on materials from S.Uno/M.Tanaka)

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IntroductionIntroduction

CDC will work at L = 1035 → ?? x1035

with some mod/improvement (a la S.Uno)[ small cell type CDC with R>15cm]

CDC readout Electronics to be designed to work up to CDC Hardware Limit

(Basic assumption)

(T0 Timing device is not included here)

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Requirement: CDCRequirement: CDC

• Tracking: Position Resolution (~130um)• P-id: dE/dx (~6% for MIPS)

[ Trigger signals → not issue here (Y.Iwasaki)]

Higher Lum. Machine : higher beam current

High hit rate : 100~200KHz

Smaller Cell (~7mm? ← 15~18mm)Fast Gas (80~100um/ns ← <40)

Max. Drift time (Tmax) : ~100 ns ← 400ns

Basically same as present one

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CDC Hit Rate (present)CDC Hit Rate (present)

Radius = 15cm

• Hit rate of innermost part > 100KHz chamber itself is working

• Other layers: ~5KHz → OK with higher beam current (>20 times higher BG)

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QT Deadtime & EfficiencyQT Deadtime & Efficiency

QT conv. Dead time~700ns

~200ns

June-2002

Oct-2002

Innermost 2 layers QT board replaced

Num

ber

of h

its u

sed

in tr

ack

ChamberEfficiencyitself is OKwith >100KHzhit rate

Belle CDC

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Fast Gas : CHFast Gas : CH44

• dE/dx resolution : similar to He(50)/C2H6(50)

80~100us/ns

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CDC Readout RequirementCDC Readout Requirement

Time Info.T~130um/vdrift → 1.3~1.6ns (v=80~100um/ns) ~0.5 ns LSB (1 ns maybe OK), Range ~ 2Tmax

Charge Info.

Basically same as present one (except dead time)

Dynamic range: >40MIPSQ ~ PED << sig ~20%Linearity : < 0.5~1%

Min. 10 bits(11~12 preferred)

Dead Time/hit : CDC intrinsic = Tmax ~100ns < 500ns (10% @200KHz , ~Tmax preferred)Dead Time/trig. : < 3us (10%@30KHz)

Normal !a la Tanaka-san

“Pipeline”

CDC hardware limit

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Possible ChoicesPossible ChoicesTotal number of channels : ~15K (← 8.4+1.8K)

Preamp/Shaper : conventional one is OK

Digitizers

(I) FADC only - 100MHz, 8~9bit, data compression

(III) TDC + slow ADC - TMC based TDC + 10~20MHz FADC (10bit)

(II) “QTC” + TDC [TDC only] - Charge integ. QT: conversion dead time - TOT type: accuracy ok for dE/dx ?

thin & smaller : small cell size, less material

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(I) (II) (III)(I) (II) (III)

(A)(B)

M.Tanaka

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• 10bit 200MHz FADC• Performance : no problem• Power : problem ~1W/ch

• 100MHz,8bit? Possible just do it. No R&D required

• Alternative solution : Analog memory with deconvolution function ASIC low power!

Component for T & dE/dx measurements(I)Component for T & dE/dx measurements(I)

R&Dgoing on

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Component for T & dE/dx measurements(II)Component for T & dE/dx measurements(II)

(K.Tauchi)

Analog: preamplifier (Gain=1.5 mV/fC, 1.5ns rise)

Shaping: Pole-zero cancel. (25 mV/fC, 5ns 0-paek, <2% undershoot)

Discriminator: Baseline Restorer (fully differencial, AC cpoupling)

Q-measurement: Time-over-Theshold, Width ~log(Q) Full range 120 fC

ASDQ on Flex circuit

Chip: 5.4x3.9mm2 PQFP, Rad-hard analog bipoler 8ch, 40mW, Noise ~2300e (10pF inp.cap)

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• ASDQ+TDC(TMC based) System

is working• Enough performance for

timing measurement

• Need detailed study for

dE/dx measurement

&&

Timing resolution<1nsec

Component for T & dE/dx measurements(II)Component for T & dE/dx measurements(II)

(K.Tauchi)

(continued)

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FINESS

User I/O board COPPER (DAQ platform)COPPER (DAQ platform)

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• Conventional way– TDC TMC core 24ch/FINESS

96ch/COPPER– ADC 10bit 20MHz HFADC

8ch/FINESS 32ch/COPPER

FINESS development is on going (Trigger out to be considered)

Dense implementation ASIC(next. step)

Component for T & dE/dx measurements(III)Component for T & dE/dx measurements(III)

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• HFADC core (for ADC FINESS )– ~10bit– <20MHz– 0.5~4.5V

• TMC core (for TDC FINESS)– 0.2~1ns

• AMC core (for waveform sampler FINESS)– 64 samples– Analog BW < ??

ASIC core developmentASIC core development

TADC FINESS

ASIC with(ADC+TDC)

(goal)

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• L1 pipeline storage T.Higuchi talk• One example

This will be implementedin FINESS-proto for debug of COPPER

Component for COPPER I/FComponent for COPPER I/F

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Data Size Data Size (comments)(comments)

Belle CDC: ~ 2KB + 50 * cdccur0

→ ~10KB @L=1035

(~1250 hits)

(~3KB=375 hits @L=3x1033 (cdccur0=20uA)

(May-2001)

(now it is smaller)

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SummarySummary

We are looking for person/group to work on CDC upgrade for Electronics R&D and implement (work with Tanaka-san) and for Construction / installation

CDC upgrade for Higher Luminosity

Readout Electronics: requirements can be satisfied with available technology

R&D in progress, but still need more work

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• Possibility of new TMC development project using 0.18um CMOS processModification for our purpose may be…..

• Y. Arai san’s talk !!!Specification should be discussed asap

Additionally…Additionally…

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Belle CDC (schematic)Belle CDC (schematic)