Capabilities of NIST/SURF calibrations for SSI UV...

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Capabilities of NIST/SURF calibrations for SSI UV instruments Synchrotron radiation research since 1963.

Transcript of Capabilities of NIST/SURF calibrations for SSI UV...

Page 1: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Capabilities of NIST/SURF calibrations for SSI UV

instruments

Synchrotron radiation research since 1963.

Page 2: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Synchrotron Ultraviolet Radiation Facility

BL-1

BL-2

BL-3 BL-4

Beam current monitor

Page 3: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Why is Synchrotron Radiation useful?

• Electromagnetic radiation emitted by highly relativistic electrons or positrons bend onto an orbit by magnets (Magneto-Bremsstrahlung).

• Emitted spectrum: broadband from microwave (harmonics of driving RF field) to x-rays, highly collimated, polarized, calculable.

• Output scales with electron beam current.

• Extremely clean lightsource operated in oil-free vacuum, which avoids photo-activated polymerization of hydrocarbons.

• Synchrotron radiation provides an absolute source!

Presenter
Presentation Notes
A better name for synchrotron radiation is magneto-bremsstrahlung, which is self-exlpanatory. The spectrum braodband from microwaves to x-rays, highly collimated in the forward direction, polarized, and calculable. The only other calculable source is the blackbody. The storage ring vacuum is extremely clean and the electrons orbit in an oil-free vacuum, which extends to the beamlines and avoids photo-activated polymerization of hydrocarbons. SURF is an absolute source of radiation.
Page 4: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

SURF as an Absolute Source

• Magnetic Flux Density B • Radio-frequency νrf

• Electron Beam Current IB

• Source Point Distance d • Aperture Size ∆X, ∆Y • Angle Relative to Orbit Plane ψ0

2 2

0 0

e

rf

m cE ce B c B e

βρπ ν ⋅

= = − ⋅ ⋅ 2 744 @ 380 MeV

e rf e

E B em c m

γπ ν

⋅= = ≈

⋅ ⋅

xy

z

∆ψ/2

d

∆ξ

X∆

Y∆A

ψ0

Bending Magnet

Electron Orbit

Page 5: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Custom-Tailored Output Spectrum

1 10 100 1000 10000

103

104

105

106

107

EUV DUV VIS

3000 K Blackbody

D2 L

amp

34 MeV

78 MeV

134

MeV

183

MeV

234

MeV

284

MeV

331

MeV

380

MeV

Rad

iant

Pow

er P

(nW

) 10

0 m

A, 5

0 m

rad,

λ/∆λ=

100

Photon Wavelength λ (nm)

416

MeV

1000 100 10 1

Photon Energy hν (eV)

Presenter
Presentation Notes
Since we are a small facility with few simultaneous users, we have the freedom to change operating parameters as we please. For most calibrations based on broadband synchrotron radiation, it is useful to change the energy of the stored electrons, which will shift the output spectrum. That gives us a handle on higher orders.
Page 6: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Combined Relative Standard Uncertainty

10-1 100 101 102 103 104

10-8

10-7

10-6

10-5

10-4

10-3

10-2

10-1R

elat

ive

Stan

dard

Unc

erta

inty

σE(λ)

/ E(λ)

Wavelength λ (nm)

104 103 102 101 100

100

101

102

103

104

105

106SSI

dE(λ)/dλ

Σ

10-4 ∆Y 10-4 ∆Y

10-4 d2· 10-3 IB

10 -8 νRF

Spec

tral

Irra

dian

ce d

E(λ)

/dλ

(nW

nm

-1 c

m-2)

Photon Energy hν (eV)

10 -3 B

E=380 MeV B=1.5142 T νrf=114 MHz IB=1 mA d=10000 mm ∆X=7.071 mm ∆ Y=7.071 mm

E=380 MeV B=1.5142 T νrf=114 MHz IB=300 mA d=10538 mm R = 6.5 mm

Page 7: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Absolute source based Radiometry: Calibrate different standard sources, spectrometers

Storage Ring

Absolute Radiometry: Source Based

Monochromator Detector

Page 8: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Absolute source based Radiometry: Calibrate different standard sources, spectrometers

Storage Ring

Absolute Radiometry: Source Based

Monochromator Detector

Page 9: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Absolute Radiometry: Detector Based

Absolute Detector based Radiometry: Calibration of detectors, filter detector packages

Detector Under Test DUT

Storage Ring

Absolute Detector AD

Monochromator

Page 10: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Absolute Radiometry: Detector Based

Absolute Detector based Radiometry: Calibration of detectors, filter detector packages

Storage Ring

Absolute Detector AD

Monochromator Detector Under

Test DUT

Page 11: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Beamlines at SURF III/NIST # Wavelength range Calibration Accuracy

1a 13 nm Resist sensitivity (EUV)

1b 5 nm – 20 nm Photoresist prequalification testing (EUV) Optics lifetime (EUV)

2 0.3 nm - 400 nm EUV/UV spectrometer calibrations <1.0 %

3 200 nm – 400 nm 200 nm – 2000 nm

Light sources (D2 and other UV) Filtered radiometers (UV, VIS, NIR)

<1.0 % <0.5 %

4 140 nm - 320 nm (110 nm – 320 nm)

Detector calibrations (DUV, UV) Detector radiation damage (DUV, UV) Optical properties (DUV, UV)

< 0.5 % (AXUV) < 1.0 % < 1.0 %

5 100 nm - 400 nm Index measurements (DUV) < 0.0001 %

6 Beam Current Monitor 0.2 %

7 7 nm - 35 nm Reflectometry (EUV) Optical properties (EUV) Detector calibrations (EUV)

< 1 % < 1 % < 2 %

8 13 nm Optics lifetime(EUV) EUV-induced surface chemistry

9 5 nm - 50 nm Detector calibrations (EUV) < 5 %

10 550 nm Beam imaging < 5 %

Page 12: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

BL-2: UV/EUV Spectrometer Calibrations

• Undispersed synchrotron radiation and instrument aperture are used as a standard of irradiance.

• Class 10,000 clean room access to large chamber.

• Calibrations provided from 2 nm to 400 nm with uncertainty from 0.6% to < 0.1%

EVE (Extreme Ultraviolet Variability Experiment) of NASA’s Solar Dynamics Observatory (SDO) Mission prepared for calibration Continuous calibration of twin-instruments using rocket underflights

Page 13: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

BL-2: Large chamber and clean room

Houses instrumentation 1 m 1 m 2 m, translates +- 20 cm vertical and horizontal -+ 2.5 yaw pitch Clean oil free vacuum

Presenter
Presentation Notes
Houses instrumentation 1 m × 1 m × 2 m, translates +- 20 cm vert hor -+ 2.5° yaw pitch
Page 14: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

BL-9: EUV Detector Calibrations

• Grazing incidence monochromator • SURF used as continuum source from

5 nm to 50 nm • Accuracy

– Working standard Photodiodes are calibrated by

comparing them to a rare-gas

ionization chamber: 2σ ≈5 %. (Not true if ACR is used on BL-7)

– Transfer standards Calibrated against a working standard

of the same type: 2σ ≈8 %. • Capabilities:

– Photodetector Efficiency – Filter Transmission – End-to-End Calibration of Small

Instruments – Low-Dose-Rate Radiation Hardness

SURF III Radiation

Experimental Chamber Ionization

Chamber Monitor Diode

Monochromator

Page 15: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

SURF III/NIST Measurement Competences • Detector efficiency

– BL-4 ultraviolet, BL-7/BL-9 extreme-ultraviolet

• Filter transmission – BL-4 ultraviolet, BL-7/BL-9

extreme-ultraviolet • Mirror reflectivity

– BL-4 ultraviolet, BL-7 extreme-ultraviolet

• Whole-instrument efficiency (detector-based or source-based) – BL-2 extreme-ultraviolet to

visible, BL-3 ultraviolet

Page 16: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Transfer of Scale from Photodiode to PMT

10-4 10-3 10-2 10-1 100 101 10210-11

10-10

10-9

10-8

10-7

Det

ecto

r C

urre

nt I D

(A

)

Electron Beam Current IB (mA)

Photodiode Signal

PMT Signal

λ = 260 nm, VPMT = 765 V

Page 17: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Photomultiplier Tube Uniformity

-10-8

-6-4

-20

24

68

-4-202468101214

0.0

0.2

0.4

0.6

0.8

1.0

Vertical Position Y (mm)R

elat

ive

Res

pons

e

Horizontal Positio

n X (mm)

0.000

0.1000

0.2000

0.3000

0.4000

0.5000

0.6000

0.7000

0.8000

0.9000

1.000

Uniformity Scan LM0159

Page 18: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

200 250 300 350 400 450 5000.0

5.0x104

1.0x105

1.5x105

2.0x105

2.5x105

3.0x105

3.5x105

Res

pons

ivity

S (

A/W

)

Wavelength λ (nm)

(-3.5,-0.5)

(0.5, 8.5)

PMT LM0159 at 765 VPMT Absolute Responsivity

-10 -8 -6 -4 -2 0 2 4 6 8

-4

-2

0

2

4

6

8

10

12

14

Horizontal Position X (mm)

Ver

tical

Pos

ition

Y (

mm

)

0.000

0.1000

0.2000

0.3000

0.4000

0.5000

0.6000

0.7000

0.8000

0.9000

1.000

Page 19: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Photo Current and Counting Measurements

200 250 300 3500.0

-1.0x10-8

-2.0x10-8

-3.0x10-8

-4.0x10-8

-5.0x10-8

-6.0x10-8

-7.0x10-8

BL-4 @ 2 µA ∼ 80,000 photons / s @ 220 nm

Current

Counts

Wavelength λ (nm)

PTM

Cur

rent

I PMT /

I B (A

/µA

)

0.0

2.0x104

4.0x104

6.0x104

8.0x104

1.0x105

1.2x105

PMT

Cou

nts

C /

I B (H

z/µA

)

Page 20: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Transfer of NRL’s x24c to NIST

• NRL maintains beamline X24C • Monochromator-based beamline with an absolute-

cryogenic radiometer – Beamline covers 1 nm to 400 nm with a combination of

grazing and normal incidence gratings (can use multilayers)

– Several large chambers are available

• When NSLS II comes online in 2015 X24C will not be transferred

Page 21: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

NSLS Beamline Layout and Chambers

Loadlock Chamber

Page 22: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Monochromator Optics

Page 23: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm

Capabilities of X24C Located at SURF III

• Enable cryogenic radiometry with 1% uncertainty by delivering at least 0.5 μW / 100 mA and resolving power of at least 100 from 3.5 nm (354 eV) to 300 nm (4.1 eV). – Covers entire calibration range with state-of-the-art cryogenic radiometry. – Extends wavelength range: current limits are 5 nm (250 eV) and 254 nm (4.9

eV). – Usable over broader wavelength range at somewhat larger uncertainty,

including the entire water window between 2.3 nm (O-K; 540 eV) and 4.4 nm (C-K; 280 eV).

– Fills gap between 92 nm and 116 nm where there is no current detector standard.

• Establish EUV calibration center for detectors and space research instrumentation in a single synchrotron beamline facility at NIST.

• Complements existing source-based radiometric capability at SURF III BL-2

Page 24: Capabilities of NIST/SURF calibrations for SSI UV instrumentslasp.colorado.edu/.../2a_Arp_NIST_Capabilities.pdf · Capabilities of X24C Located at SURF III ... 540 eV) and 4.4 nm