BQ76952 High Voltage Stress Report - Texas Instruments
20
Application Report BQ76952 High-Voltage Stress Report ABSTRACT The BQ76952 family of battery monitors data sheet (SLUSE13) specifies an absolute maximum voltage of 85 V on select high-voltage pins. However, questions arise regarding the effect of higher voltage being applied to these pins during operation. While TI does not warranty device operation outside specified data sheet limits, this document provides experimental data obtained by exposing a sampling of devices to excessive voltage. Table of Contents 1 Introduction............................................................................................................................................................................. 2 2 Setup........................................................................................................................................................................................ 3 3 Measurement Data.................................................................................................................................................................. 4 3.1 Graphical Data................................................................................................................................................................... 4 4 Summary............................................................................................................................................................................... 18 5 References............................................................................................................................................................................ 19 Trademarks All trademarks are the property of their respective owners. www.ti.com Table of Contents SLUAAD4 – FEBRUARY 2021 Submit Document Feedback BQ76952 High-Voltage Stress Report 1 Copyright © 2021 Texas Instruments Incorporated
Transcript of BQ76952 High Voltage Stress Report - Texas Instruments
Application ReportBQ76952 High-Voltage Stress Report
ABSTRACT
The BQ76952 family of battery monitors data sheet (SLUSE13) specifies an absolute maximum voltage of 85 Von select high-voltage pins. However, questions arise regarding the effect of higher voltage being applied tothese pins during operation. While TI does not warranty device operation outside specified data sheet limits, thisdocument provides experimental data obtained by exposing a sampling of devices to excessive voltage.
Table of Contents1 Introduction.............................................................................................................................................................................22 Setup........................................................................................................................................................................................33 Measurement Data..................................................................................................................................................................4
3.1 Graphical Data................................................................................................................................................................... 44 Summary............................................................................................................................................................................... 185 References............................................................................................................................................................................ 19
TrademarksAll trademarks are the property of their respective owners.
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1 IntroductionThe BQ76952 family of battery monitors supports battery pack configurations with up to 16-series cells. Theproduction data sheet for this family specifies an absolute maximum voltage limit of 85 V on select high voltagepins, with a recommended maximum voltage level of 80 V. A stack of 16 lithium-ion cells with maximum voltageof, for example, 4.2 V, would result in a top-of-stack voltage of 67.2 V.
The device also incorporates high-side NFET drivers with an integrated charge pump, which has aprogrammable typical voltage of 5.7 V or 11 V, and a maximum level of 7 V or 13 V, respectively. This meanswith a fully charged battery pack and NFET drivers enabled, the voltage on the driver pins can reach a maximumlevel of 67.2 V + 7 V = 74.2 V or 67.2 V + 13 = 80.2 V during operation.
However, in some systems the top-of-stack voltage may experience transients due to dynamic charge ordischarge events, which may result in brief voltages exceeding these levels during operation. TI does notwarranty device operation under conditions in excess of the limits specified in the production data sheet. Forinformational purposes, an experiment was performed by exposing a population of BQ76952 devices toexcessive voltage levels, with the results described in the following sections.
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2 SetupTo evaluate the effect of high-voltage stress on the device, a set of 35 devices were tested using the proceduredescribed below.
1. The devices were first tested, and selected parameters were logged for later comparison.2. The OTP in each device was programmed such that the charge pump would be powered and the high-side
CHG and DSG protection FET drivers would be enabled by default during the testing.3. Selected pins on each device were connected through passive components to a single voltage source
(initially set to 0 V), as shown in the schematic in Figure 2-1.4. The circuit was placed into an oven and the voltage source was slowly ramped from 0 V to 120 V with a rise
time of approximately 5 seconds. The voltage source was limited to an output current of 5 mA.5. With the 120-V source held constant, the oven was heated to 85°C over the course of approximately 10
minutes.6. The voltage source was powered down, and the devices were removed from the oven.7. Devices were retested, and the selected parameters were logged and compared to those taken earlier.
VC7
VC6
VC5
VC4
VC10
VC9
VC8
VC11
VC12
VC13
VC14
VC15
BREG
PCHG
PDSG
PACK
FUSE
VC16
CHG
DSG
BAT
CP1
LD
NC
REG18
TS1
TS2
NC
TS3
VC3
VC0
SRP
VC2
VC1
SRN
VSS
SDA
REG1
RST_SHUT
DDSG
DCHG
DFETOFF
SCL
REG2
CFETOFF
HDQ
REGIN
ALERT
100� 470
nF
+
–
100�
100�
22n
F
10M
�
22
nF
10
M
�
1
0k
�
10k
�
10M
�
10M
�
2.2µF
Applied
stress
voltage
Figure 2-1. Schematic of System Used for Voltage Stress
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3 Measurement DataDuring the testing, no incidents of component breakdown or latchup were observed on any of the devices. Thefollowing plots show the pre-stress and post-stress results for each cell voltage measurement using a 1-V and 4-V input, as well as selected Short Circuit in Discharge (SCD), Overcurrent in Discharge 1 (OCD1), andOvercurrent in Charge (OCC) thresholds. The plots titled "Delta in …" show the difference in the post-stress andpre-stress measurements on each specific device.
3.1 Graphical Data
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.9975
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-1. VC1-VC0 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
1.5
Figure 3-2. Delta in VC1-VC0 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
4.002
Pre-stress
Post-stress
Figure 3-3. VC1-VC0 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
1.5
Figure 3-4. Delta in VC1-VC0 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
4.002
4.0025
Pre-stress
Post-stress
Figure 3-5. VC2-VC1 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.2
-0.9
-0.6
-0.3
0
0.3
0.6
0.9
Figure 3-6. Delta in VC2-VC1 Measurements with 4-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
1.002
1.0025
Pre-stress
Post-stress
Figure 3-7. VC2-VC1 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
Figure 3-8. Delta in VC2-VC1 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
4.002
Pre-stress
Post-stress
Figure 3-9. VC3-VC2 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
Figure 3-10. Delta in VC3-VC2 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-11. VC3-VC2 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.2
-0.9
-0.6
-0.3
0
0.3
0.6
Figure 3-12. Delta in VC3-VC2 Measurements with 1-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
Pre-stress
Post-stress
Figure 3-13. VC4-VC3 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
1.5
Figure 3-14. Delta in VC4-VC3 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-15. VC4-VC3 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
1.5
Figure 3-16. Delta in VC4-VC3 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
4.002
Pre-stress
Post-stress
Figure 3-17. VC5-VC4 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.2
-0.9
-0.6
-0.3
0
0.3
0.6
0.9
Figure 3-18. Delta in VC5-VC4 Measurements with 4-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-19. VC5-VC4 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-20. Delta in VC5-VC4 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
4.002
Pre-stress
Post-stress
Figure 3-21. VC6-VC5 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
Figure 3-22. Delta in VC6-VC5 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-23. VC6-VC5 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-24. Delta in VC6-VC5 Measurements with 1-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
4.002
4.0025
Pre-stress
Post-stress
Figure 3-25. VC7-VC6 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.2
-0.9
-0.6
-0.3
0
0.3
0.6
0.9
Figure 3-26. Delta in VC7-VC6 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-27. VC7-VC6 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-28. Delta in VC7-VC6 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
Pre-stress
Post-stress
Figure 3-29. VC8-VC7 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-30. Delta in VC8-VC7 Measurements with 4-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-31. VC8-VC7 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.2
-0.9
-0.6
-0.3
0
0.3
0.6
0.9
Figure 3-32. Delta in VC8-VC7 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
Pre-stress
Post-stress
Figure 3-33. VC9-VC8 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1
-0.5
0
0.5
1
Figure 3-34. Delta in VC9-VC8 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
Pre-stress
Post-stress
Figure 3-35. VC9-VC8 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1
-0.5
0
0.5
1
Figure 3-36. Delta in VC9-VC8 Measurements with 1-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
Pre-stress
Post-stress
Figure 3-37. VC10-VC9 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-2
-1.5
-1
-0.5
0
0.5
1
Figure 3-38. Delta in VC10-VC9 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
Pre-stress
Post-stress
Figure 3-39. VC10-VC9 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-40. Delta in VC10-VC9 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
Pre-stress
Post-stress
Figure 3-41. VC11-VC10 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.2
-0.9
-0.6
-0.3
0
0.3
0.6
Figure 3-42. Delta in VC11-VC10 Measurements with 4-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-43. VC11-VC10 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-44. Delta in VC11-VC10 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
Pre-stress
Post-stress
Figure 3-45. VC12-VC11 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-46. Delta in VC12-VC11 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
Pre-stress
Post-stress
Figure 3-47. VC12-VC11 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-48. Delta in VC12-VC11 Measurements with 1-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
Pre-stress
Post-stress
Figure 3-49. VC13-VC12 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.9
-0.6
-0.3
0
0.3
0.6
0.9
1.2
Figure 3-50. Delta in VC13-VC12 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-51. VC13-VC12 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-52. Delta in VC13-VC12 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.997
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
4.001
4.0015
Pre-stress
Post-stress
Figure 3-53. VC14-VC13 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
Figure 3-54. Delta in VC14-VC13 Measurements with 4-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
Pre-stress
Post-stress
Figure 3-55. VC14-VC13 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
Figure 3-56. Delta in VC14-VC13 Measurements with 1-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.997
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
Pre-stress
Post-stress
Figure 3-57. VC15-VC14 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1.5
-1
-0.5
0
0.5
1
Figure 3-58. Delta in VC15-VC14 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
Pre-stress
Post-stress
Figure 3-59. VC15-VC14 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1
-0.5
0
0.5
1
Figure 3-60. Delta in VC15-VC14 Measurements with 1-V Input
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3.1 Graphical Data (continued)
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
3.996
3.9965
3.997
3.9975
3.998
3.9985
3.999
3.9995
4
4.0005
Pre-stress
Post-stress
Figure 3-61. VC16-VC15 Measurement with 4-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
1
Figure 3-62. Delta in VC16-VC15 Measurements with 4-V Input
Device
Measu
red
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
0.998
0.9985
0.999
0.9995
1
1.0005
1.001
1.0015
1.002
Pre-stress
Post-stress
Figure 3-63. VC16-VC15 Measurement with 1-V InputDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-1
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
Figure 3-64. Delta in VC16-VC15 Measurements with 1-V Input
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
4.9
4.902
4.904
4.906
4.908
4.91
4.912
Pre-stress
Post-stress
Figure 3-65. VC4-VC3 COV Threshold = 4.9082 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-4
-2
0
2
4
Figure 3-66. Delta in VC4-VC3 COV Threshold = 4.9082 V
Measurement Data www.ti.com
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3.1 Graphical Data (continued)
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
4.902
4.904
4.906
4.908
4.91
4.912
Pre-stress
Post-stress
Figure 3-67. VC8-VC7 COV Threshold = 4.9082 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-4
-2
0
2
4
Figure 3-68. Delta in VC8-VC7 COV Threshold = 4.9082 V
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
4.902
4.904
4.906
4.908
4.91
4.912
Pre-stress
Post-stress
Figure 3-69. VC12-VC11 COV Threshold = 4.9082 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-6
-4
-2
0
2
4
Figure 3-70. Delta in VC12-VC11 COV Threshold = 4.9082 V
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
4.902
4.904
4.906
4.908
4.91
Pre-stress
Post-stress
Figure 3-71. VC16-VC15 COV Threshold = 4.9082 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-6
-4
-2
0
2
4
6
Figure 3-72. Delta in VC16-VC15 COV Threshold = 4.9082 V
www.ti.com Measurement Data
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3.1 Graphical Data (continued)
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
1.0105
1.011
1.0115
1.012
1.0125
1.013
1.0135
1.014
1.0145
1.015
1.0155
Pre-stress
Post-stress
Figure 3-73. VC4-VC3 CUV Threshold = 1.012 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-4
-2
0
2
4
Figure 3-74. Delta in VC4-VC3 CUV Threshold = 1.012 V
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
1.0105
1.011
1.0115
1.012
1.0125
1.013
1.0135
1.014
1.0145
1.015
1.0155
1.016
Pre-stress
Post-stress
Figure 3-75. VC8-VC7 CUV Threshold = 1.012 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-3
-2
-1
0
1
2
3
Figure 3-76. Delta in VC8-VC7 CUV Threshold = 1.012 V
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
1.0105
1.011
1.0115
1.012
1.0125
1.013
1.0135
1.014
1.0145
1.015
1.0155
Pre-stress
Post-stress
Figure 3-77. VC12-VC11 CUV Threshold = 1.012 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-4
-2
0
2
4
Figure 3-78. Delta in VC12-VC11 CUV Threshold = 1.012 V
Measurement Data www.ti.com
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3.1 Graphical Data (continued)
Device
Th
resh
old
Vo
ltag
e (
V)
0 5 10 15 20 25 30 35
1.0105
1.011
1.0115
1.012
1.0125
1.013
1.0135
1.014
1.0145
1.015
1.0155
1.016
Pre-stress
Post-stress
Figure 3-79. VC16-VC15 CUV Threshold = 1.012 VDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-4
-2
0
2
4
Figure 3-80. Delta in VC16-VC15 CUV Threshold = 1.012 V
Device
Th
resh
old
Vo
ltag
e (
mV
)
0 5 10 15 20 25 30 35
8.5
9
9.5
10
10.5
11
11.5
12
12.5
13
Pre-stress
Post-stress
Figure 3-81. SCD Threshold = 10 mVDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.9
-0.6
-0.3
0
0.3
0.6
0.9
1.2
Figure 3-82. Delta in SCD Threshold = 10 mV
Device
Th
resh
old
Vo
ltag
e (
mV
)
0 5 10 15 20 25 30 35
450
460
470
480
490
500
510
520
Pre-stress
Post-stress
Figure 3-83. SCD Threshold = 500 mVDevice
Delt
a V
olt
ag
e (
mV
)
0 5 10 15 20 25 30 35
-0.5
0
0.5
1
1.5
2
2.5
3
Figure 3-84. Delta in SCD Threshold = 500 mV
www.ti.com Measurement Data
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4 SummaryWhile TI cannot warranty device operation beyond specified datasheet limits, an experiment was performed toexpose selected high voltage pins of set of 35 devices to a 120 V level at a temperature of 85°C. Pertinentparametric data was collected on each device before and after the stress was applied, with results and changesin parameters described by device.
In evaluating the resulting data, no systemic changes were observed pre-stress to post-stress, with errorsremaining within specifications. No analysis was performed to ascertain the effect of the stress on long termdevice reliability. This data should not be interpreted to assume that all devices will exhibit similar results whenexposed to similar conditions. TI recommends customers operate devices only within conditions as specified inthe production datasheet.
Summary www.ti.com
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5 ReferencesFor additional information, see the following related documents:• BQ76952 3S-16S Battery Monitor and Protector Data Sheet• BQ76952 Technical Reference Manual• BQ76952 Evaluation Module User's Guide
www.ti.com References
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BQ76952 High-Voltage Stress Report 19
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