BJT Characterization Laboratory Dr. Lynn Fuller - RIT - … · BJT Characterization Laboratory Dr....

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BJT Characterization Laboratory ROCHESTER INSTITUTE OF TECHNOLOGY MICROELECTRONIC ENGINEERING BJT Characterization Laboratory Dr. Lynn Fuller Microelectronic Engineering Rochester Institute of Technology © March 27, 2012 Dr. Lynn Fuller Page 1 Rochester Institute of Technology Microelectronic Engineering 82 Lomb Memorial Drive Rochester, NY 14623-5604 Tel (585) 475-2035 Fax (585) 475-5041 Email: [email protected] Dr. Fuller’s Webpage: http://people.rit.edu/lffeee MicroE Webpage: http://www.microe.rit.edu 3-27-2012 Lab_BJT_Intro.ppt

Transcript of BJT Characterization Laboratory Dr. Lynn Fuller - RIT - … · BJT Characterization Laboratory Dr....

Page 1: BJT Characterization Laboratory Dr. Lynn Fuller - RIT - … · BJT Characterization Laboratory Dr. Lynn Fuller Microelectronic Engineering Rochester Institute of Technology © March

BJT Characterization Laboratory

ROCHESTER INSTITUTE OF TECHNOLOGYMICROELECTRONIC ENGINEERING

BJT Characterization Laboratory

Dr. Lynn FullerMicroelectronic Engineering

Rochester Institute of Technology

© March 27, 2012 Dr. Lynn Fuller Page 1

Rochester Institute of Technology

Microelectronic Engineering

Rochester Institute of Technology82 Lomb Memorial DriveRochester, NY 14623-5604

Tel (585) 475-2035Fax (585) 475-5041

Email: [email protected]. Fuller’s Webpage: http://people.rit.edu/lffeee

MicroE Webpage: http://www.microe.rit.edu

3-27-2012 Lab_BJT_Intro.ppt

Page 2: BJT Characterization Laboratory Dr. Lynn Fuller - RIT - … · BJT Characterization Laboratory Dr. Lynn Fuller Microelectronic Engineering Rochester Institute of Technology © March

BJT Characterization Laboratory

OUTLINE

2N3904

BE Junction

BC Junction

IC-VCE Family of Curves

Beta at low, medium, high currents

© March 27, 2012 Dr. Lynn Fuller Page 2

Rochester Institute of Technology

Microelectronic Engineering

Beta at low, medium, high currents

SPICE Models

Temperature Effects

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BJT Characterization Laboratory

2N3904

2N

3904

Label

© March 27, 2012 Dr. Lynn Fuller Page 3

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Microelectronic Engineering

Flat

1

2

2N

3904

3

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BJT Characterization Laboratory

TEST EQUIPMENT

Switch Matrix

HP4145

Semiconductor Paramater

Analyzer

Computer

ICS (metrics)

Osprey

(video capture)

Microsoft Office

IEEE

488

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Microelectronic Engineering

Switch Matrix

Ultracision

Semi-Automatic

Wafer Prober

Microsoft Office

Test Fixture

and

Manual Probe Station

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BJT Characterization Laboratory

TEST STATION

Switch Matrix

PC Interface

Light Source

CCD Camera

Microscope

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Microelectronic Engineering

HP4145 tester

Semi-Auto

Probe Station

Microscope

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BJT Characterization Laboratory

OPERATION OF HP4145 AND SWITCH MATRIX

Turn on the HP4145, Switch Matrix, and PC

Select ICS icon on the desktop (close and message window)

Click on GPIB icon on the top of the screen select NI-32Thunk

Click on Instrument icon and select HP4145

Click on device icon and select PN Diode or BJT

Click on SMU1 then click on terminal (n-side of diode)

© March 27, 2012 Dr. Lynn Fuller Page 6

Rochester Institute of Technology

Microelectronic Engineering

Click on SMU1 then click on terminal (n-side of diode)

set SMU1 to zero volts ground

Click on SMU2 then click on terminal (p-side of diode)

set SMU2 to sweep from -10 to 10 Volts, measure

I and V

Click on done

Click on measure button

Wait for data to graph then add cursors, lines, titles, source conditions

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BJT Characterization Laboratory

2N3904 DATA SHEET

© March 27, 2012 Dr. Lynn Fuller Page 7

Rochester Institute of Technology

Microelectronic Engineering

Note: see page 12-15 of this document for more information on BJT SPICE parameters

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BJT Characterization Laboratory

THEORETICAL BE JUNCTION, BC JUNCTION, CE

I

V

I

V

I

V0.7

-8

0.7

-8

0.7

-8

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Microelectronic Engineering

Emitter

BaseI

V

+

-

Collector

BaseI

V+

-

Emitter

I

V+

-

Collector

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BJT Characterization Laboratory

BE AND BC DIODE CHARACTERISTICS

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Microelectronic Engineering

Identify BE junction, measure ISE and VBE. Identify BC junction

and measure IS. Identify Base, Emitter,

Collector leads and label on sketch.

2N

39

04

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BJT Characterization Laboratory

BETA MEASURED FROM FAMILY OF CURVES

Beta = 44 @ ~90mA

and Vce=5

© March 27, 2012 Dr. Lynn Fuller Page 10

Rochester Institute of Technology

Microelectronic Engineering

Early Voltage is measured to be 116 for IC ~ 15 mA

Beta = 180 @ ~5mA

and Vce=5

Beta = 160 @

~15mA and Vce=5

Beta = 121 @

~40mA and Vce=5

Beta = 116 @

~0.02mA and Vce=5

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BJT Characterization Laboratory

BETA VS IC – 2N3904

100

200

BE

TA

© March 27, 2012 Dr. Lynn Fuller Page 11

Rochester Institute of Technology

Microelectronic Engineering

1ma 10ma 100ma

Measured

SPICE SIMULATED

Ic0.1ma .01ma

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BJT Characterization Laboratory

SPICE SIMULATED

SPICE ModelSPICE Simulatin of

Beta vs Ic

200

© March 27, 2012 Dr. Lynn Fuller Page 12

Rochester Institute of Technology

Microelectronic Engineering

BE

TA

Ic

100

150

50

0 1mA 10mA 100mA100uA

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BJT Characterization Laboratory

2N3904 SPICE MODEL

From the datasheet above

© March 27, 2012 Dr. Lynn Fuller Page 13

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Microelectronic Engineering

Why does the SPICE model have Bf of 416 when the maximum Bf=300

Answer: It is a model parameter and when combined with other model

parameters give correct results. See next page.

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BJT Characterization Laboratory

BJT SPICE PARAMETERS EFFECT ON BETA

QRITNPN

NPN

BF 416

QRITNPN

Ic

BE

TA

When BF=419 is used by

itself it gives incorrect

results200

Adding IKF to the model

© March 27, 2012 Dr. Lynn Fuller Page 14

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Microelectronic Engineering

QRITNPN

NPN

BF 416

IKF .06678

QRITNPN

NPN

BF 416

IKF .06678

IS 6.734000E-15

ISE 6.734000E-15

NE 1.259

Ic

Ic

BE

TA

BE

TA

200

200

Adding IS, ISE and NE

makes the model give

correct results for all IC

Adding IKF to the model

helps reduce BF at high IC

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BJT Characterization Laboratory

IC=VCD FAMILY OF CURVES

QRITNPN

NPN

IS 6.734000E-15

BF 416

IKF .06678

ISE 6.734000E-15

NE 1.259

RB 10

SPICE MODEL

IC

© March 27, 2012 Dr. Lynn Fuller Page 15

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Microelectronic Engineering

RB 10

RC 1

VA 109

SPICE SIMULATIONVce

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BJT Characterization Laboratory

2N3904 FORWARD ACTIVE

© March 27, 2012 Dr. Lynn Fuller Page 16

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Microelectronic Engineering

What is Beta?

What is VA?

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BJT Characterization Laboratory

TEMPERATURE EFFECT ON FAMILY OF CURVES

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Microelectronic Engineering

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BJT Characterization Laboratory

2N3904 INVERSE MODE

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Microelectronic Engineering

What is Beta?

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BJT Characterization Laboratory

2N3904 VBE STEPS

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Microelectronic Engineering

What is gm?

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BJT Characterization Laboratory

PNP FORWARD ACTIVE

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Microelectronic Engineering

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BJT Characterization Laboratory

REFERENCES

1. MOSFET Modeling with SPICE, Daniel Foty, 1997, Prentice Hall, ISBN-0-13-227935-5

2. Operation and Modeling of the MOS Transistor, 2nd Edition, Yannis Tsividis, 1999, McGraw-Hill, ISBN-0-07-065523-5

3. UTMOST III Modeling Manual-Vol.1. Ch. 5. From Silvaco International.4. ATHENA USERS Manual, From Silvaco International.5. ATLAS USERS Manual, From Silvaco International.6. Device Electronics for Integrated Circuits, Richard Muller and Theodore

© March 27, 2012 Dr. Lynn Fuller Page 21

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Microelectronic Engineering

6. Device Electronics for Integrated Circuits, Richard Muller and Theodore Kamins, with Mansun Chan, 3rd Edition, John Wiley, 2003, ISBN 0-471-59398-2

7. ICCAP Manual, Hewlet Packard8. PSpice Users Guide.

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BJT Characterization Laboratory

LAB WORK

Obtain I-V plot for BE junctionObtain I-V plot for BC junctionObtain I-V plot for C-EObtain Ic-Vce family of curves for 2n3904 (for different Ib’s)Extract VA Early VoltageExtract Beta at 5 different IC values (0.1mA to 100mA)Obtain Ic-Vce family of curves at elevated temperature

© March 27, 2012 Dr. Lynn Fuller Page 22

Rochester Institute of Technology

Microelectronic Engineering

Obtain Ic-Vce family of curves at elevated temperatureObtain Ic-Vce family of curves for inverse operationExtract Beta InverseObtain Ic-Vce curves for different Vbe

Repeat some or all of above for 2n3906

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BJT Characterization Laboratory

HOMEWORK – BJT INTRO

Use SPICE to obtain the following:

1. Ic-Vce family of curves for 2N39042. Extract VA Early Voltage3. Extract Beta at 5 different IC values (0.1mA to 100mA)4. Obtain Ic-Vce family of curves at elevated temperature5. Obtain Ic-Vce family of curves for inverse operation

© March 27, 2012 Dr. Lynn Fuller Page 23

Rochester Institute of Technology

Microelectronic Engineering

5. Obtain Ic-Vce family of curves for inverse operation6. Extract Beta Inverse7. Obtain Ic-Vce curves for different Vbe