Atomic Force Microscope (AFM) - Welcome to BIT Mesra Force Microscope (AFM) Make and Model: NT-MDT,...

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Atomic Force Microscope (AFM) Make and Model: NT-MDT, Russia; Solver Pro-4 Specifications: Measurement mode: Contact Mode, Semicontact Mode, Tapping mode. Scanning Tunneling Microscopy (STM) Resolution: Atomic scale Applications: AFM measures the surface morphology of a sample by scanning of a cantilever on the optically smooth (< 0.5 micron) surface of the conducting or non-conducting sample. In STM method the atomic position of the sample is determined by tunneling current from a platinum tip to conducting surfaces like HOPG (highly oriented graphite film). Gel Permeation Chromatography (GPC) Make and Model: Waters Corporation, USA Specifications: Detectors: Refractive Index (RI) and UV-VISIBLE detectors Mol. weight: 5000 to 5, 00,000 Daltons Solvents: Toluene, THF, and Water Applications: Gel permeation chromatography (GPC) or size exclusion chromatography (SEC) is the chromatographic technique used for determination of molecular weight of the polymers. The principle that works behind GPC is that the retention time of polymeric molecules is dependent on their molecular weight (or size) when passed through a porous gel column. Differential Scanning Calorimeter (DSC) Make and Model: TA Instruments, USA; Q 10. Specifications: Temp. range: - 90 to 500 o C. Heating rate: 0.1 o C/min to 60 o C/min. Atmosphere: Inert and air. Crucible: Aluminum Applications: DSC measures the difference in energy inputs (heat flux) between a substance and a reference material as a function of temperature. Heat capacity ,Glass transition temperature, Phase or crystal transition temperatures, Reaction kinetics and percentage crystallinity can be measured. Light Scattering Make and Model: Malvern Inst. UK; Nano ZS. Specifications: Laser: 4.0 mW, 633 nm Measurement angle: 173 0 Temperature range: 2 o C to 90 o C Particle Size range: 0.6 nm – 6 μm Molecular weight range: 1000 to 2x107 Daltons Applications: Light scattering measures the particle size and Zeta potential of the solids and liquids in insoluble states. It also measures the molecular weight of the soluble organic compound.

Transcript of Atomic Force Microscope (AFM) - Welcome to BIT Mesra Force Microscope (AFM) Make and Model: NT-MDT,...

Page 1: Atomic Force Microscope (AFM) - Welcome to BIT Mesra Force Microscope (AFM) Make and Model: NT-MDT, Russia; Solver Pro-4 Specifications: Measurement mode: Contact Mode, Semicontact

Atomic Force Microscope (AFM)Make and Model: NT-MDT, Russia; Solver Pro-4Specifications:Measurement mode: Contact Mode, SemicontactMode, Tapping mode.Scanning Tunneling Microscopy (STM)Resolution: Atomic scaleApplications:AFM measures the surface morphology of asample by scanning of a cantilever on theoptically smooth (< 0.5 micron) surface of theconducting or non-conducting sample. In STMmethod the atomic position of the sample isdetermined by tunneling current from a platinumtip to conducting surfaces like HOPG (highlyoriented graphite film).Gel Permeation Chromatography (GPC)Make and Model: Waters Corporation, USASpecifications:Detectors: Refractive Index (RI) and UV-VISIBLEdetectorsMol. weight: 5000 to 5, 00,000 DaltonsSolvents: Toluene, THF, and WaterApplications:Gel permeation chromatography (GPC) or sizeexclusion chromatography (SEC) is thechromatographic technique used fordetermination of molecular weight of thepolymers. The principle that works behind GPC isthat the retention time of polymeric molecules isdependent on their molecular weight (or size)when passed through a porous gel column.Differential Scanning Calorimeter (DSC)Make and Model: TA Instruments, USA; Q 10.Specifications:Temp. range: - 90 to 500 oC.Heating rate: 0.1 oC/min to 60 oC/min.Atmosphere: Inert and air.Crucible: AluminumApplications:DSC measures the difference in energy inputs(heat flux) between a substance and a referencematerial as a function of temperature. Heatcapacity ,Glass transition temperature, Phase orcrystal transition temperatures, Reaction kineticsand percentage crystallinity can be measured.

Light ScatteringMake and Model: Malvern Inst. UK; Nano ZS.Specifications:Laser: 4.0 mW, 633 nmMeasurement angle: 1730

Temperature range: 2 oC to 90 oCParticle Size range: 0.6 nm – 6 µmMolecular weight range: 1000 to 2x107 DaltonsApplications:Light scattering measures the particle size andZeta potential of the solids and liquids in insolublestates. It also measures the molecular weight ofthe soluble organic compound.

Page 2: Atomic Force Microscope (AFM) - Welcome to BIT Mesra Force Microscope (AFM) Make and Model: NT-MDT, Russia; Solver Pro-4 Specifications: Measurement mode: Contact Mode, Semicontact

Fourier Transform InfraredSpectroscopy (FTIR)

Make and Model: Shimadzu Corpn. , Japan;IR-Prestige 21Specifications:Interferometer: Michelson interferometerBeam splitter: Germanium-coated KBr plateWave number range: 7500 – 350 cm-1

Sample state: Solid, Liquid, and GasMeasurement mode: Attenuated total reflection(ATR), Diffuse Reflectance Spectroscopy (DRS),%Transmittance.Applications:FTIR spectra are used to identify the functionalgroups. It offers quantitative and qualitativeanalysis for both organic and inorganic samples.

Electrochemical Analyzer (ECA)Make and Model: CH Instruments, USA; 680BSpecifications:Current: 50pA to 250mAPotential update rate: 5 MHzFrequency: 0.01 to 100 KHzRef. Electrode: Calomel, Ag/AgCl,PtApplications:ECA measures the current vs voltage of aelectrolyte solutions. It can work on multipleprinciples like Cyclic Voltametry, Tafel plot, LinearSweep Voltameter, AC Voltametry, PotentiometricStripping Analysis, etc.

ColorimeterMake and Model: Hunter Lab, USA; Color FlexSpecifications:Measurement time: <1secSpectral range: 400nm – 700nmSample state: Solid and LiquidMeasurement Principle: Dual beam xenon flashlampApplications:Colour of solid particles or solution is measured inthree dimensional scale (L,a,b).

Optical Contact Angle (OCA)Make and Model: Dataphysics, Germany; OCAH230Specifications:CCD Camera: 450 images /secInterferometer: 220 x 40 x70Applications:OCA measures the contact angle of the surfaces(liquids and bubbles). It measures static anddynamic contact angle with surface energies onthe most diverse solids and liquids and is alsoused to measure interfacial tension.

Page 3: Atomic Force Microscope (AFM) - Welcome to BIT Mesra Force Microscope (AFM) Make and Model: NT-MDT, Russia; Solver Pro-4 Specifications: Measurement mode: Contact Mode, Semicontact

Dynamic Contact Angle (DCAT)Make and Model: Dataphysics, Germany; DCAT21Specifications:

Measuring range: 1 … 1000 mN/m; ± 0.001 mN/mWeighing range: 10 µg … 210 gLifting speed: 0. 7 µm/s … 500 mm/minMaximum lifting range: 104 mmMeasuring methods: Modified Washburn method,Wilhelmy plate, Du Noüy ring methodApplications:DCA measures the surface tension and interfacialtension of liquids and Critical micelleconcentration of surfactants (CMC), Contactangle of powder, fibers and the adsorptionbehavior of liquids.Elemental Analyzer (C, H, N, S and O)

Make and Model: M/s Elementar, Germany;Vario EL IIISpecifications:Combustion Temperature: 950 – 1200oC SampleFeed: 79-place auto sampler Detector: TCD(Thermal conductivity Detector)Carrier Gas: HeliumApplications:Quantitative determinations of elements likeCarbon, Hydrogen, Nitrogen, Sulphur and Oxygenin organic compounds.

SpectroflurophotometerMake and Model: M/s Shimadzu, Japan;RF-5301 PCSpecifications:Wavelength Range: 220 to 750nmSample state: Powder and LiquidLight Source: 150W Xenon lamp.Temperature: Room temperatureApplications:Organic compound having fluorescent group isexcited with a particular frequency and then theemitted radiation is measured. For nonfluorescence compound a fluorescent marker isused to study their behavior.Thermo gravimetric Analyzer (TGA)

Make and Model: Shimadzu, Japan; DTG-60Specifications:Temperature range: Amb. to 1100 oC.Heating rate: 0.01 oC/min to 60 oC/min.Atmosphere: Nitrogen and air.Crucible: Aluminum, Platinum, Quartz, AluminaApplications:TGA measures the weight loss due to hightemperature with respect to temperature betweena substance and a reference material. This givesthe thermal stability of the sample, reactionkinetics and weight loss.

Page 4: Atomic Force Microscope (AFM) - Welcome to BIT Mesra Force Microscope (AFM) Make and Model: NT-MDT, Russia; Solver Pro-4 Specifications: Measurement mode: Contact Mode, Semicontact

EllipsometerMake and Model: Nano-View Inc., Korea; SE MG1000-VISSpecifications:Data Acquisition: 5 secSpectral Coverage: 1.45eV to 3.54eVSpectral range: 340 - 850 nmSample state: Thin film, Nanostructures.Source: HL – 2000 Tungsten Halogen lampApplications:Ellipsometer measures the refractive index andthickness of the thin film deposited on a smoothsolid surface by measuring the reflected light fromthe surface.

Scanning Electron Microscope(SEM)Make and Model: Jeol, Japan; JSM-6390LVSpecifications:Resolution: 3nm at 30Kv (high vacuum mode),4nm at 30 Kv (low vacuum mode)Magnification: 5X to 300,00XImage Mode: Secondary Electron & BackScattered ImageSample Stage: X=125mm, Y=100mmAccessories: Detectors (Secondary Electron (SE),Back Scattered Electron (BSE) and EnergyDispersive Spectroscopy (EDS),Coating unit: Au or Pt metalApplications:SEM measures the surface morphology ofconducting and non conducting materials byanalyzing BSE and SE. The Chemicalcompositions are analyzed by EDS.

Impedance AnalyzerMake and Model: Novocontrol Tech., Germany;ALPHA ATBSpecifications:Frequency range: 3µHz to 20 MHzImpedence Range: 10-2 to 1014 ΩCapacitance Range: 1fF to 1FAc voltage Range: 100µV to 3VApplications:The impedance analyzer measures the complexdielectric, conductivity and impedance function ofmaterials in dependence of frequency andtemperature.

PCB PrototypingMake and Model: LPKF Laser & Electronics AG,Germany; LPKF PCB Prototyping MachineSpecifications:

Max. Size of PCB: 229mm x 305mm x 38mmNo of layer: DoubleMin. drill diameter: 0.6mmApplications:All 1 and 2-sided types of circuit board with usualequipment density (FR3, FR4, FR5, G10), RF-substrates, drilling test adapters, structuring filmlayouts and solder frames for PCB assembly aredesigned.

Page 5: Atomic Force Microscope (AFM) - Welcome to BIT Mesra Force Microscope (AFM) Make and Model: NT-MDT, Russia; Solver Pro-4 Specifications: Measurement mode: Contact Mode, Semicontact

Universal testing machineMake and Model: Instron, United Kingdom;Instron 8801Specifications:100KN, Hydraulic Power Pack with maximumpressure of 207 bar,Grips: Flat, Round, clevis and Band FixtureSoftware : Blue hill, Fast track softwareApplications:UTM is useful for Tensile test, Bending test,Fatigue test and Fatigue crack propagationstudies.

PULSE ANALYZERMake and Model: OROS S. A. France; OR38/OROSSpecifications:Real time channel l: 16 Analyzer: Multifunctional,Accelerometer: Triaxial, andUniaxial icpApplications:Pulse Analyzer is used for structural dynamicsreporting, resonant vibration characterization,vibration reduction purposes, frequency damping,modal shape animations and system healthmonitoring.

MACHINERY FAULT SIMULATOR(MFS)

Make and Model: SpectraQuest, Inc. USA;Machinery Fault Simulator (MFS)Specifications:Applications:The Machinery Fault Simulator (MFS) is designedto study the signature of common machineryfaults, such as unbalance, alignment, resonance,bearing, rotor dynamics, crack shaft, gearbox, beltdrives, reciprocating mechanism, mechanical rubs,induction motors, pumps, compressors and fans.

LCMS/MSMake and Model:Specifications:Applications:

POLISHING MACHINEMake and Model: Struers, Denmark, Labopol-5Specifications: Labopol, LaboForce-3 andLaboDoser for manual/automatic specimenmovement along with manual/automatic dosing ofdiamond suspension and lubricant. The variablerotational speed (50-500) rpm is controlled by anelectronic servo system that keeps the selectedspeed constant, independent of the load. Theforce on each individual sample can be adjustedbetween 5 and 40 N.Applications:LaboPol-5 is suitable for grinding and polishing awide variety of materials.