Atom Identification by AFM
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Transcript of Atom Identification by AFM
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Single atom identification and manipulation using atomic force microscopy
Yoshiaki Sugimoto
GeSn
JST-DFG workshop on Nanoelectronics
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Introduction
M. AbeAssociate Professor
S. MoritaProfessor
Japan
Osaka
O. CustanceVisiting Associate
Professor
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Bottom-up nanotechnology
Invention of STMInvention of STM
R.P. Feynman R.P. Feynman
There's Plenty of There's Plenty of Room at the Bottom Room at the Bottom
1982 1982
T=5 K
CO molecule
Cu(111) surface
Atom manipulationAtom manipulation
The technology for atomThe technology for atom--byby--atom construction of atom construction of nanonano--devicesdevices
Logic gate constructedLogic gate constructedby atom manipulationby atom manipulation
A.J. Heinrich, et al., A.J. Heinrich, et al., ScienceScience 298298 (2002) 1381.(2002) 1381.
D.M. D.M. EiglerEigler, et al., , et al., NatureNature 344344 (1990) 524.(1990) 524.
19591959
G. G. BinnigBinnig H. Rohrer H. Rohrer
T=4 K
Ni(100) surface
Xe atom
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Our approach
Using Atomic force microscopy (AFM)Using Atomic force microscopy (AFM)At room temperatureAt room temperatureEvaporation of
various atom species various atom species
Atom Atom ManipulationManipulation
Atom Atom IdentificationIdentification
At cryogenic temperatureUsing Scanning tunneling microscopy (STM)
PreviousPrevious atom manipulation and assemblyatom manipulation and assembly
Our approachOur approach
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Outline
Atom imaging
Atom discrimination
Atom identification
Atommanipulation
At room temperature
A A AB
A A AB
Using AFM
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Atom imaging
Atom discrimination
Atom identification
Atommanipulation
Atom imaging
At room temperature
A A AB
A A AB
Using AFM
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Experimental setup
Commercial Si cantilever (Nano World)f0=160 kHz, k=30 N/m, Q=13000, A=20 nm (Typical values)Ar ion sputtering UHV
Top view
Side viewTop view of AFM unit
Base pressure
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AFM images of various surfacesSi(111)-(7x7) Si(100)-(2x1) Ge(111)-c(2x8)
KCl(100)Pb/Si(111)-(1x1)
Metal
Semiconductor
Insulator
Si atom Si atom Ge atom
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Atom discrimination
Atom identification
Atommanipulation
Atom imaging
Atom discrimination
At room temperature
A A AB
A A AB
Using AFM
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Discrimination between Sn and Si atoms
Sn:50% Si:50% Sn:75% Si:25% Sn:99% Si:1%
SiSn
The amount of evaporated Sn atoms increases
Sn/Si(111)-(33)
Si surface
Sn atoms
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The limitation of atom discrimination from image
SiIn
SbSi
In and Si Sb and SiSn and Ge
GeSn
Si, Sn, and Pb mixed surface
Only twoatomic contrasts?
More than threeatomic contrasts?
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Atom identificationAtom
manipulation
Atom imaging
Atom discrimination
Atom identification
At room temperature
A A AB
A A AB
Using AFM
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Atom identification based on force measurementSi, Sn, Pb mixed surface
SiSn Pb
Si
Si
Sn
Si
Pb
SiFSi-Si FSi-Sn FSi-Pb
The chemical bonding force between tip apex atoms and surface atoms can be measured by AFM.
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The method for measuring the interaction force
0 2 4 6 8 10 12 14 16 18 20 22 24
-24-22-20-18-16-14-12-10-8-6-4-20
f
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f -2-1
0
1
2
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Z[]0 2 4 6 8 10 12 14 16 18 20 22 24
-4
-3
F
[
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FNumerical
Z[]
Totalcalculation
=A
A zAzzFdz
kAff
2220 )(
0 2 4 6 8 10 12 14 16 18 20 22 24-4-3
-2
-1
0
1
2
3
F
[
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Z[]
FvdW
26ZRAF HvdW =
0 2 4 6 8 10 12 14 16 18 20 22 24-4
-3
-2
-1
0
1
2
3
F
[
n
N
]
Z[]
Subtraction
FShort=FTotal-FvdW
The chemical bonding force between tip apex atoms and surface atoms can be measured.
NC-AFM
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-2 -1 0 1 2 3-3
-2
-1
0
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2
F
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Distance []
Si
Sn
We repeated force measurements using different tip apex states.
Different cantilevers
Different tip structure and compositionby intentional tip-surface contact
-2 -1 0 1 2 3-3
-2
-1
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Distance []-2 -1 0 1 2 3
-3
-2
-1
0
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F
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Distance []-2 -1 0 1 2 3
-3
-2
-1
0
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F
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Distance []-2 -1 0 1 2 3
-3
-2
-1
0
1
2
F
[
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Distance []-2 -1 0 1 2 3
-3
-2
-1
0
1
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F
[
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]
Distance []
SSnn
SiSi
The chemical bonding force: Sn and Si
Lateral precision: 0.1M. Abe, et al., M. Abe, et al., ApplAppl. Phys. . Phys. LettLett..
8787 (2005) 173503.(2005) 173503.
Atom tracking technique
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Marked tip-apex dependence
-2 -1 0 1 2 3-3
-2
-1
0
1
2
F
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Distance []-1 0 1 2 3
-2.0
-1.5
-1.0
-0.5
0.0
0.5
F
[
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N
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Distance []
Pb/SiPb/SiSn/SiSn/Si
SSnnSiSi
PbPbSiSi
5 sets by various tip states5 sets by various tip states
Absolute values of the chemical bonding force is uselessfor atom identification
Absolute values of the chemical bonding force strongly depend on the tip apex structure or composition.
Different force
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-2 -1 0 1 2 3-1.0-0.8-0.6-0.4-0.20.00.20.40.60.81.0
F
/
F
S
i
(
S
e
t
)
Distance []
-2 -1 0 1 2 3-3
-2
-1
0
1
2
F
[
n
N
]
Distance []-1 0 1 2 3
-2.0
-1.5
-1.0
-0.5
0.0
0.5
F
[
n
N
]
Distance []
-1 0 1 2 3
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
F
/
F
S
i
(
S
e
t
)
Distance []
Sn/Si Sn/Si relativerelative
interaction ratio:interaction ratio: 77%
Pb/SiPb/Si relativerelative
interaction ratio:interaction ratio: 59%
Averaged relative interaction ratioSn/SiSn/Si Pb/SiPb/Si
The The relative interaction ratiorelative interaction ratio of the maximum attractive chemical bonding forcesof the maximum attractive chemical bonding forcesfor the same tip for the same tip remains nearly constant independently on the tipremains nearly constant independently on the tip
SSnn PbPbSiSi
5 sets by various tip states5 sets by various tip states
SiSi
Finger
prints f
or the
single
atom i
dentific
ation
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Atom fingerprints
Si Sn PbFSn FPbFSi
Si Sn PbFSn FPbF Si
FSn / FSi=0.77
FPb / FSi=0.59
FSn / FSi=0.77
FPb / FSi=0.59
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-0.1 0.0 0.1 0.2 0.3 0.4 0.5 0.60
1
2
3
4
5
6
A
t
o
m
c
o
u
n
t
s
Topographic height []
1
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
2
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
3
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
4
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
5
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
6
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
7
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
8
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
9
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
10
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
11
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
12
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
13
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
14
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
15
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
16
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
17
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
18
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
19
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
20
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
21
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
22
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
23
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
24
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
25
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
26
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
27
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
28
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
29
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
30
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
31
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
32
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
33
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
34
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
35
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
36
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
37
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
38
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
39
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
0.0 0.4 0.8 1.2 1.6 2.0 2.401234567
A
t
o
m
c
o
u
n
t
s
Maximum attractive total force [nN]
77%59%
100%
Only 10 f(Z) averaged per force curve
-0.1 0.0 0.1 0.2 0.3 0.4 0.5 0.60
1
2
3
4
5
6
A
t
o
m
c
o
u
n
t
s
Topographic height []
Pb Sn Si
-1 0 1 2 3 4 5 6 7 8 9 10-2.5
-2.0
-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
-3 -2 -1 0 1 2 3 4 5 6 7 8-22-20-18-16-14-12-10
-8-6-4-20
f
[
H
z
]
Distance []
0.0 0.4 0.8 1.2 1.6 2.0 2.401234567
A
t
o
m
c
o
u
n
t
s
Maximum attractive total force [nN]
Pb Sn Si
Atom identification: Si, Sn, PbLow Si local chemical coordination
Y. Sugimoto, et al., Y. Sugimoto, et al., NatureNature 446446 (2007) 64.(2007) 64.
-
Only 10 f(Z) averaged per force curve
-2 -1 0 1 2 3 4 5 6 7 8-25
-20
-15
-10
-5
0
f
[
H
z
]
Distance []-0.1 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7
0
1
2
3
4
5
6
A
t
o
m
c
o
u
n
t
s
Topographic height []
Pb Sn Si
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6012345678
A
t
o
m
c
o
u
n
t
s
Maximum attractive total force [nN]
Pb Sn Si
77%59%
100%
-1 0 1 2 3 4 5 6 7 8 9 10-1.5
-1.0
-0.5
0.0
T
o
t
a
l
f
o
r
c
e
[
n
N
]
Estimated tip-surface distance []
Atom identification: Si, Sn, PbHigh Si local chemical coordination
Y. Sugimoto, et al., Y. Sugimoto, et al., NatureNature 446446 (2007) 64.(2007) 64.
-
Atom manipulationAtom
manipulation
Atom imaging
Atom discrimination
Atom identification
At room temperature
A A AB
A A AB
Using AFM
-
Conventional lateral manipulation
Interchange lateral manipulation
Instrument STMOnly conductive surface
AFMAll surface
Method On top In plane
Temperature Cryogenic temperature Room temperature
Nanostructure
Ge atom Sn atom
New manipulation method
-
The direction of Sn migration is same as the scan direction.
Ge atomSn atom
Interchange lateral manipulation
Y. Sugimoto, et al., Y. Sugimoto, et al., Nature materialsNature materials 44 (2005) 156.(2005) 156.
The procedure of creatingatom letters at room temperature
-
The atom lettersA B C
D E F
G H I
-
Application to other systems
SiIn
SbSiSiSn
Sn/Si(111)-(33) In/Si(111)-(33) Sb/Si(111)-(77)
-
Interchange vertical manipulation
IInterchange lateral manipulationnterchange lateral manipulation IInterchange vertical manipulationnterchange vertical manipulation
Construction time: 9 hours
-
Conclusion and future plans
Atommanipulation
Atom imaging
Atom discrimination
Atom identification
At room temperature
A A AB
A A AB
Using AFM
Quantum wireQuantum wire
NanoclusterNanocluster
Quantum computerQuantum computer
A AB
BA
Single atom identification and manipulation using atomic force microscopy