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    Ultracompact 2 g Dual-Axis Acceleromet

    ADXL3

    Rev. BInformation furnished by Analog Devices is believed to be accurate and reliable.However, no responsibility is assumed by Analog Devices for its use, nor for anyinfringements of patents or other rights of third parties that may result from its use.Specifications subject to change without notice. No license is granted by implicationor otherwise under any patent or patent rights of Analog Devices. Trademarks andregistered trademarks are the property of their respective owners.

    One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 2005 Analog Devices, Inc. All rights reserved.

    FEATURESHigh resolutionDual-axis accelerometer on a single IC chip5 mm 5 mm 2 mm LCC packageLow power

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    TABLE OF CONTENTSSpecifications..................................................................................... 3

    Absolute Maximum Ratings............................................................ 4

    ESD Caution.................................................................................. 4

    Pin Configuration and Function Descriptions............................. 5

    Typical Performance Characteristics .............................................6

    Theory of Operation ........................................................................ 8

    Applications...................................................................................8

    Design Trade-Offs for Selecting Filter Characteristics:The Noise/BW Trade-Off...............................................

    Using the ADXL311 withOperating Voltages Other than 3 V ................................ Using the ADXL311 as a Dual-Axis Tilt Sensor ............

    Outline Dimensions...........................................................

    Ordering Guide ..............................................................

    REVISION HISTORY1/05Rev. A to Rev. B

    Changes to Specifications................................................................ 3Change to Pin Configuration.......................................................... 5Change to Table 5 ............................................................................. 8Changes to Self Test Section............................................................ 8Removed R BIAS Selection Section ....................................................8Change to Design Trade-Offs for Selecting Filter Characteristics:

    The Noise/BW Trade-Off Section...............................................8Changes to Using the ADXL311 with

    Operating Voltages Other than 3 V Section .............................. 9Updated Outline Dimensions.......................................................10Changes to Ordering Guide..........................................................10

    7/03Rev. 0 to Rev. A

    Change to OUTLINE DIMENSIONS..........................................10

    Revision 0: Initial Version

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    SPECIFICATIONSTA = 25C, VDD = 3 V, acceleration = 0 g , unless otherwise noted.Table 1.Parameter Conditions Min Typ Max Unit

    SENSOR INPUT Each axisMeasurement Range 2 gNonlinearity Best fit straight line 0.2 % of FSAligment Error1 1 DegreesAligment Error X sensor to Y sensor 0.1 DegreesCross-Axis Sensitivity2 2 %

    SENSITIVITY Each axisSensitivity at XFILT, YFILT VDD = 3 V 174 mV/g Sensitivity Tolerance (part to part) 15 %Sensitivity Change due to Temperature3 from 25C 0.02 %/C

    0 g BIAS LEVEL Each axis0 g Voltage XFILT, YFILT VDD = 3 V 1.2 1.5 1.8 V0 g Offset vs. Temperature from 25C 1.0 mg/C

    NOISE PERFORMANCENoise Density @ 25C 300 g/Hz rms

    FREQUENCY RESPONSE3 dB Bandwidth @ Pin XFILT and Pin YFILT 3 kHzSensor Resonant Frequency 5.5 kHz

    FILTERRFILT Tolerance 32 k nominal 15 %Minimum Capacitance @ Pin XFILT and Pin YFILT 1000 pF

    SELF TESTXFILT, YFILT Self Test 0 to Self Test 1 50 mV

    POWER SUPPLYOperating Voltage Range 2.4 5.25 VQuiescent Supply Current 0.4 1.0 mATurn-On Time4 160 CFILT + 4 ms

    TEMPERATURE RANGEOperating Range 0 70 C

    1 Alignment error is specified as the angle between the true and indicated axis of sensitivity.2 Cross axis sensitivity is the algebraic sum of the alignment and the inherent sensitivity errors.3 Defined as the change from ambient to maximum temperature, or ambient to minimum temperature.4 CFILT in F.

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    ABSOLUTE MAXIMUM RATINGSTable 2.Parameter RatingAcceleration(Any Axis, Unpowered)

    3,500g, 0.5 ms

    Acceleration(Any Axis, Powered, VDD = 3 V) 3,500g, 0.5 ms

    VDD 0.3 V to + 6 VAll Other Pins 0.3 V to VDD + 0.3 VOutput Short-Circuit Duration,(Any Pin to Common)

    Indefinite

    Operating Temperature Range 55C to +125CStorage Temperature 65C to +150C

    Stresses above those listed under Absolute Maximum Ratimay cause permanent damage to the device. This is a stresrating only; functional operation of the device at these or

    other conditions above those indicated in the operationalsection of this specification is not implied. Exposure to abmaximum rating conditions for extended periods may affedevice reliability.

    Table 3. Package CharacteristicsPackage Type JA JC Device Weight

    8-Lead LCC 120C/W 20C/W

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    PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

    1

    2

    34

    8

    5

    6

    7XOUT

    YOUT

    NC

    V D D

    N C

    ADXL311BOTTOM VIEW

    NC = NO CONNECT

    ST

    NC

    COM

    0 3 5 8 2

    - 0 1 0

    Figure 2. 8-Lead LCC Pin Configuration

    Table 4. Pin Function DescriptionsPin No. Mnemonic Description1 ST Self Test2, 4, 5 NC Do Not Connect3 COM Common6 YOUT Y Channel Output7 XOUT X Channel Output

    8 VDD 2.4 V to 5.25 V

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    TYPICAL PERFORMANCE CHARACTERISTICS

    0 3 5 8 2

    - 0 0 2

    VOLTS1.611.33 1.37 1.41 1.491.45 1.53 1.57

    P E R C E N T O F P A R T S

    16

    14

    12

    10

    8

    6

    4

    2

    0

    Figure 3. X-Axis 0 g BIAS Output Distribution

    0 3 5 8 2

    - 0 0

    3

    VOLTS1.611.33 1.37 1.451.41 1.49 1.571.53

    P E R C E N T O F P A R T S

    14

    12

    10

    8

    6

    4

    2

    0

    Figure 4. Y-Axis 0 g BIAS Output Distribution

    0 3 5 8 2

    - 0 0 4

    V/g0.1870.163 0.167 0.171 0.175 0.1830.179

    P E R C E N T O F P A R T S

    30

    25

    20

    15

    10

    5

    0

    Figure 5. X-Axis Output Sensitivity Distribution at X OUT

    0 3 5 8 2

    - 0 0 5

    V/g0.1910.163 0.167 0.171 0.1790.175 0.183 0.187

    P E R C E N T O F P A R T S

    30

    25

    20

    15

    10

    5

    0

    Figure 6. Y-Axis Sensitivity Distribution at Y OUT

    0 3 5 8 2

    - 0 0

    6

    TEMPERATURE (C)800 20 40 60

    S E N S I T I V I T Y ( % )

    110

    108

    106

    104

    102

    100

    98

    96

    94

    92

    90

    Figure 7. Normalized Sensitivity vs. Temperature

    0 3 5 8 2

    - 0 0 7

    NOISE DENSITY ( /g Hz)550150 200 250 350 450300 400 500

    P E R C E N T O F P A R T S

    30

    25

    20

    15

    10

    5

    0

    Figure 8. Noise Density Distribution

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    0 3 5 8 2

    - 0 0 8

    TEMPERATURE (C)800 20 40 60

    C U R R E N T ( m A )

    0.50

    0.45

    0.40

    0.35

    0.30

    0.25

    0.20

    0.15

    0.10

    0.05

    0

    Figure 9. Typical Supply Current vs. Temperature

    0 3 5 8 2

    - 0 0 9

    TIME (ms)0 0.4 0.8 1.2 1.4

    V

    3

    2

    1

    0

    CFILT = 0.01 F

    VDD

    XOUT

    Figure 10. Typical Turn-On Time

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    THEORY OF OPERATIONThe ADXL311 is a complete, dual-axis acceleration measurementsystem on a single monolithic IC. It contains a polysilicon, surface-micromachined sensor and signal conditioning circuitry toimplement an open-loop acceleration measurement architecture.The output signals are analog voltage proportional to acceleration.The ADXL311 is capable of measuring both positive and negativeaccelerations to at least 2 g . The accelerometer can measurestatic acceleration forces, such as gravity, allowing it to be usedas a tilt sensor.

    The sensor is a polysilicon, surface-micromachined structurebuilt on top of the silicon wafer. Polysilicon springs suspend thestructure over the surface of the wafer and provide a resistanceagainst acceleration forces. Deflection of the structure is measuredusing a differential capacitor that consists of independent fixedplates and central plates attached to the moving mass. The fixedplates are driven by 180 out-of-phase square waves. Accelerationdeflects the beam and unbalances the differential capacitor,resulting in an output square wave whose amplitude is propor-tional to acceleration. Phase-sensitive demodulation techniquesare then used to rectify the signal and determine the directionof the acceleration.

    The output of the demodulator is amplified and brought off chipthrough a 32 k resistor. At this point, the user can set the signalbandwidth of the device by adding a capacitor. This filteringimproves measurement resolution and helps prevent aliasing.

    APPLICATIONSPower Supply Decoupling

    For most applications, a single 0.1 F capacitor, CDC, adequatelydecouples the accelerometer from noise on the power supply.However, in some cases, particularly where noise is present atthe 140 kHz internal clock frequency (or any harmonic thereof),noise on the supply can cause interference on the ADXL311output. If additional decoupling is needed, a 100 (or smaller)resistor or ferrite beads can be inserted in the supply line of theADXL311. Additionally, a larger bulk bypass capacitor (in the1 F to 4.7 F range) can be added in parallel to CDC.

    Setting the Bandwidth Using C X and C Y The ADXL311 has provisions for band limiting the XOUT andYOUT pins. Capacitors must be added at these pins to implemlow-pass filtering for antialiasing and noise reduction. Thequation for the 3 dB bandwidth is

    ( )Y X C F ,dB3 k322/1 =

    or, more simply,

    ( ) X,Y C /F5F dB3 =

    The tolerance of the internal resistor (R FILT) can vary, typicallyas much as 15% of its nominal value of 32 k, and the bwidth varies accordingly. A minimum capacitance of 1000for CX and CY is required in all cases.Table 5. Filter Capacitor Selection, C X and C Y Bandwidth Capacitor (F)10 Hz 0.4750 Hz 0.10100 Hz 0.05200 Hz 0.027500 Hz 0.01

    SELF TESTThe ST pin controls the self-test feature. When this pin is sVDD, an electrostatic force is exerted on the beam of the acometer. The resulting movement of the beam allows the ustest if the accelerometer is functional. The typical change in is 290 m g (corresponding to 50 mV). This pin can be left opcircuit or connected to common in normal use.

    DESIGN TRADE-OFFS FOR SELECTING FILTERCHARACTERISTICS: THE NOISE/BW TRADE-OFFThe accelerometer bandwidth selected ultimately determinthe measurement resolution (smallest detectable acceleratiFiltering can lower the noise floor, which improves the resoof the accelerometer. Resolution is dependent on the analogbandwidth at XOUT and YOUT.

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    The output of the ADXL311 has a typical bandwidth of 3 kHz.The user must filter the signal at this point to limit aliasingerrors. The analog bandwidth must be no more than half theA/D sampling frequency to minimize aliasing. The analogbandwidth can be further decreased to reduce noise andimprove resolution.

    The ADXL311 noise has the characteristics of white Gaussiannoise that contribute equally at all frequencies and are describedin terms of g/ Hz, i.e., the noise is proportional to the squareroot of the bandwidth of the accelerometer. It is recommendedthat the user limits the bandwidth to the lowest frequencyneeded by the application to maximize the resolution anddynamic range of the accelerometer.

    With the single-pole roll-off characteristic, the typical noise ofthe ADXL311 is determined by

    ( ) ( )6.1Hz/300 = BW g NoiseRMS At 100 Hz the noise will be

    ( ) ( ) g g NoiseRMS m8.36.1100Hz/300 == Often the peak value of the noise is desired. Peak-to-peak noisecan only be estimated by statistical methods.Table 6shows theprobabilities of exceeding various peak values, given the rms value.Table 6. Estimation of Peak-to-Peak NoisePeak-to-PeakValue

    % of Time That Noise Exceeds NominalPeak-to-Peak Value

    2 rms 324 rms 4.66 rms 0.278 rms 0.006

    The peak-to-peak noise value gives the best estimate of theuncertainty in a single measurement.Table 7gives the typicalnoise output of the ADXL311 for various CX and CY values.Table 7. Filter Capacitor Selection, C X and C Y Bandwidth(Hz)

    CX, CY(F)

    RMS Noise(m g)

    Peak-to-Peak NoiseEstimate (m g)

    10 0.47 1.2 7.250 0.1 2.7 16.2

    100 0.047 3.8 22.8500 0.01 8.5 51

    USING THE ADXL311 WITH OPERATINGVOLTAGES OTHER THAN 3 VThe ADXL311 is tested and specified at VDD= 3 V; however, it canbe powered with VDD as low as 2.4 V, or as high as 5.25 V. Someperformance parameters change as the supply voltage varies.

    The ADXL311 output is ratiometric, so the output sen(or scale factor) varies proportionally to the supply voVDD = 5 V, the output sensitivity is typically 312 mV/ g .

    The 0 g bias output is also ratiometric, so the 0 g output isnominally equal to VDD/2 at all supply voltages.

    The output noise is not ratiometric, but absolute in voltherefore, the noise density decreases as the supply voincreases. This is because the scale factor (mV/ g ) increaseswhile the noise voltage remains constant.

    The self-test response is roughly proportional to the sqthe supply voltage. At VDD = 5 V, the self-test response isapproximately equivalent to 750 m g (typical).

    The supply current increases as the supply voltage incTypical current consumption at VDD = 5 V is 750 A.

    USING THE ADXL311 AS A DUAL-AXISTILT SENSOROne of the most popular applications of the ADXL31measurement. An accelerometer uses the force of gravinput vector to determine the orientation of an object i

    An accelerometer is most sensitive to tilt when its senis perpendicular to the force of gravity, i.e., parallel to surface. When the accelerometer is oriented parallel to vector, i.e., near its +1 g or 1 g reading, the change in outpacceleration per degree of tilt is negligible. When the ometer is perpendicular to gravity, its output changes n17.5 m g per degree of tilt, but at 45 degrees, it change12.2 m g per degree, and resolution declines.Dual-Axis Tilt Sensor: Converting Acceleration to TiltWhen the accelerometer is oriented so both its X-axis aare parallel to the earths surface, it can be used as a twsensor with a roll axis and a pitch axis. Once the outpfrom the accelerometer has been converted to an accthat varies between 1 g and +1 g , the output tilt in degreecalculated as follows:

    g ASIN Pitch X 1/A=

    g ASIN Roll Y 1/A=

    Be sure to account for overranges. It is possible for thaccelerometers to output a signal greater than 1 g due to vibration, shock, or other accelerations.

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    OUTLINE DIMENSIONS

    BOTTOM VIEW

    1

    35

    7

    0.64

    1.90

    2.50

    2.50

    0.38 DIAMETER

    0.50 DIAMETER1.27

    1.27

    1.27

    4.50SQ

    5.00SQ

    TOP VIEW

    R 0.38 0.20

    1.78

    R 0.20

    Figure 11. 8-Terminal Ceramic Leadless Chip Carrier [LCC](E-8)

    Dimensions shown in millimeters

    ORDERING GUIDE

    ModelNumber ofAxes Specified Voltage

    TemperatureRange Package Description

    PackageOption

    ADXL311JE 2 3 V 0C to 70C 8-Lead Ceramic Leadless Chip Carrier E-8ADXL311JEREEL 2 3 V 0C to 70C 8-Lead Ceramic Leadless Chip Carrier E-8ADXL311EB Evaluation Board

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    NOTES

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    NOTES

    2005 Analog Devices, Inc. All rights reserved. Trademarks andregistered trademarks are the property of their respective owners.

    C0358201/05(B)