Accredited Testing Laboratory under the terms of ISO/IEC ... · It should not be reproduced except...

It should not be reproduced except in full, without the written approval of ONETECH Corp. SAFETY-CE:DoC(Rev.2) HEAD OFFICE: 301-14 Daessangnyeong-ri, Chowol-eup, Gwangju-si, Gyeonggi-do 464-862 Korea (TEL: 82-31-799-9500, FAX: 82-31-799-9599)

Accredited Testing Laboratory under the terms of ISO/IEC 17025

CE CONFORMANCE REPORT EMC DIRECTIVE 2004/108/EC

for

PRODUCT: HIGH DEFINITION NETWORK CAMERA

“MODEL NAME: LND5110”

AUTHORIZED

LG Electronics Inc. 222 LG-ro, Jinwi-Myeon, Pyeongtaek -Si, Gyeonggi-Do, 451-713, Korea

April 03, 2014

SUMMARY The equipment complies with the standards;

• EN 55022: 2010 (Class A)

• EN 61000-3-2: 2006 + A1: 2009 + A2: 2009

• EN 61000-3-3: 2008

• EN 50130-4: 2011

(signature)

Gea-Won, Lee / Managing Director

This is only valid in connection with Test Report: E144R-009

of 52 Report No.: E144R-009

It should not be reproduced except in full, without the written approval of ONETECH Corp. EMC-009(Rev.2) HEAD OFFICE : 301-14 Daessangnyeong-ri, Chowol-eup, Gwangju-si, Gyeonggi-do 464-862 Korea (TEL: 82-31-799-9500, FAX: 82-31-799-9599) EMC Testing Div. : 307-51 Daessangnyeong-ri, Chowol-eup, Gwangju-si, Gyeonggi-do 464-862 Korea (TEL: 82-31-765-8289, FAX: 82-31-766-2904)

ELECTROMAGNETIC

COMPATIBILITY TEST REPORT

Test Report No. : E144R-009

AGR No. : A143A-070R

Applicant : LG Electronics Inc.

Address : 222 LG-ro, Jinwi-Myeon, Pyeongtaek -Si, Gyeonggi-Do, 451-713, Korea

Manufacturer : LG Electronics Inc.

Address : 222 LG-ro, Jinwi-Myeon, Pyeongtaek -Si, Gyeonggi-Do, 451-713, Korea

Type of Equipment : High Definition Network Camera

Model Name : LND5110

Multiple Model Name : N/A

Serial number : N/A

Total page of Report : 52 pages (including this page)

Date of Incoming : March 10, 2014

Date of Issuing : April 03, 2014

SUMMARY The equipment complies with the standard; EN 55022: 2010 (Class A), EN 61000-3-2: 2006 + A1: 2009 + A2:

2009, EN 61000-3-3: 2008 and EN 50130-4: 2011.

This test report contains only the results of a single test of the sample supplied for the examination.

It is not a general valid assessment of the features of the respective products of the mass-production.

Prepared by: Approved by: Dong-Youl, Lim / Asst. Chief Engineer Gea-Won, Lee / Managing Director ONETECH Corp. ONETECH Corp.



CONTENTS

PAGE

1. APPLICANT AND MANUFACTURER INFORMATION ........................................................................................... 7

2. TEST SUMMARY .............................................................................................................................................................. 7

2.1 TEST STANDARDS AND RESULTS ..................................................................................................................................... 7

2.2 ADDITIONS, DEVIATIONS, EXCLUSIONS FROM STANDARDS ........................................................................................... 7

2.3 PURPOSE OF THE TEST ................................................................................................................................................... 7

2.4 TEST FACILITY ............................................................................................................................................................... 7

2.5 ENVIRONMENTAL CONDITIONS ...................................................................................................................................... 8

2.6 INFORMATION OF THE INSTRUCTION FOR CLASS A EQUIPMENT .................................................................................. 8

3. EUT (EQUIPMENT UNDER TEST) ............................................................................................................................... 9

3.1 IDENTIFICATION OF THE EUT ....................................................................................................................................... 9

3.2 ADDITIONAL INFORMATION ABOUT THE EUT .............................................................................................................. 9

3.3 PERIPHERAL EQUIPMENT ............................................................................................................................................... 9

3.4 MODE OF OPERATION DURING THE TEST....................................................................................................................... 9

3.5 CRITERION DESCRIPTION ............................................................................................................................................. 10

3.6 CABLE DESCRIPTION ................................................................................................................................................... 10

3.7 ALTERNATIVE TYPE(S)/MODEL(S) ............................................................................................................................... 10

4. EUT MODIFICATIONS ................................................................................................................................................. 10

5. EMISSION TESTS ........................................................................................................................................................... 11

5.1 MAINS TERMINAL CONTINUOUS DISTURBANCE VOLTAGE ................................................................ 11

5.1.1 Operating environment ......................................................................................................................................... 11

5.1.2 Test set-up ............................................................................................................................................................. 11

5.1.3 Measurement uncertainty ..................................................................................................................................... 11

5.1.4 Test equipment used ............................................................................................................................................. 11

5.2 CONDUCTED COMMON MODE DISTURBANCE AT TELECOMMUNICATION PORTS ................... 14


5.2.2 Test set-up ............................................................................................................................................................. 14



5.2.5 Test data ................................................................................................................................................................ 15

5.3 RADIATED ELECTROMAGNETIC FIELD ....................................................................................................... 19




5.3.2 Test set-up ............................................................................................................................................................. 19



5.3.5 Test data ................................................................................................................................................................ 20

5.4 HARMONICS CURRENT EMISSIONS .................................................................................................................. 23


5.4.2 Test set-up ............................................................................................................................................................. 23



5.4.5. Test data ............................................................................................................................................................... 23

5.5 VOLTAGE CHANGES, VOLTAGE FLUCTUATIONS AND FLICKER ........................................................... 25


5.5.2 Test set-up ............................................................................................................................................................. 25



5.5.5 Test data ................................................................................................................................................................ 25

6. IMMUNITY TESTS ......................................................................................................................................................... 28

6.1 ELECTROSTATIC DISCHARGE IMMUNITY TEST ......................................................................................... 28


6.1.2 Test set-up ............................................................................................................................................................. 28



6.1.5 Test data ................................................................................................................................................................ 29

6.1.6 ESD Test Point & Test Result .............................................................................................................................. 30

6.2 RADIATED RF-ELECTROMAGNETIC FIELD IMMUNITY TEST ................................................................. 31


6.2.2 Test set-up ............................................................................................................................................................. 31



6.2.5 Test data ................................................................................................................................................................ 32

6.3 ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST ......................................................................... 33


6.3.2 Test set-up ............................................................................................................................................................. 33





6.3.5 Test data ................................................................................................................................................................ 34

6.4 SURGE IMMUNITY TEST ....................................................................................................................................... 35


6.4.2 Test set-up ............................................................................................................................................................. 35



6.4.5 Test data ................................................................................................................................................................ 36

6.5 CONDUCTED RF FIELDS IMMUNITY TEST ...................................................................................................... 37


6.5.2 Test set-up ............................................................................................................................................................. 37



6.5.5 Test data ................................................................................................................................................................ 38

6.6 MAINS SUPPLY VOLTAGE DIPS AND SHORT INTERRUPTIONS IMMUNITY TEST .............................. 39


6.6.2 Test set-up ............................................................................................................................................................. 39



6.6.5 Test data ................................................................................................................................................................ 40

6.7 MAINS SUPPLY VOLTAGE VARIATIONS IMMUNITY TEST ........................................................................ 41


6.7.2 Test set-up ............................................................................................................................................................. 41



6.7.5 Test data ................................................................................................................................................................ 42

APPENDIX I - TEST SET-UP PHOTOS: (MAINS TERMINAL CONTINUOUS DISTURBANCE VOLTAGE) ... 43

APPENDIX II - TEST SET-UP PHOTOS: (CONDUCTED COMMON MODE DISTURBANCE AT

TELECOMMUNICATION PORTS) ................................................................................................................................. 44

APPENDIX III - TEST SET-UP PHOTOS: (RADIATED ELECTROMAGNETIC FIELD) ..................................... 45

APPENDIX IV - TEST SET-UP PHOTO: (HARMONICS & VOLTAGE FLUCTUATIONS ON AC MAINS) ...... 47

APPENDIX V – TEST SET-UP PHOTO: (ESD) .............................................................................................................. 48

APPENDIX VI – TEST SET-UP PHOTO: (RF E- FIELD) ............................................................................................. 49



APPENDIX VII - TEST SET-UP PHOTO: (EFT/BURST) ............................................................................................. 50

APPENDIX VIII - TEST SET-UP PHOTO: (SURGE) .................................................................................................... 51

APPENDIX IX - TEST SET-UP PHOTO: (C.S) ............................................................................................................... 52

APPENDIX XI - TEST SET-UP PHOTO: (MAINS SUPPLY VOLTAGE DIPS, SHORT INTERRUPTIONS) ...... 53

APPENDIX XI - TEST SET-UP PHOTO: (POWER SUPPLY SHORT TERM VARIATION) ................................. 54

APPENDIX XII - PHOTOGRAPHS OF THE PRODUCT ............................................................................................. 55



Revision History

Issued Report No. Issued Date Revisions Effect Section

E144R-009 April 03, 2014 Initial Issue All



1. APPLICANT AND MANUFACTURER INFORMATION

-. Applicant : LG Electronics Inc.

-. Address : 222 LG-ro, Jinwi-Myeon, Pyeongtaek -Si, Gyeonggi-Do, 451-713, Korea

-. Manufacturer : LG Electronics Inc.

-. Address : 222 LG-ro, Jinwi-Myeon, Pyeongtaek -Si, Gyeonggi-Do, 451-713, Korea

2. TEST SUMMARY

2.1 Test standards and results

STANDARDS RESULTS

EN 55022: 2010

Radiated Electromagnetic Field Met Class A / PASS

Mains Terminal disturbance voltage Met Class A / PASS

Conducted Common Mode Disturbance at Telecommunication Ports Met Class A / PASS

EN 61000-3-2: 2006

+A1: 2009 + A2: 2009 Harmonics Current Emissions Met / PASS

EN 61000-3-3: 2008 Voltage changes, Voltage fluctuations and Flicker Met / PASS

EN 50130-4: 2011

Electrostatic Discharge Immunity PASS

Radiated RF E-Field (80 to 2 700 MHz) PASS

Electrical Fast Transient/Burst Immunity PASS

Surge Immunity PASS

Conducted Disturbance induced by RF fields Immunity PASS

Mains Supply Voltage Dips, Short Interruptions PASS

Mains Supply Voltage Variations PASS Note1. The margin to the limit is within the uncertainty interval of the measured value.

2.2 Additions, deviations, exclusions from standards

No additions, deviations or exclusions have been made from standard.

2.3 Purpose of the test

To determine whether the equipment under test fulfills the EMC requirements of the standards stated in section 2.1.

2.4 Test Facility

The Electromagnetic compatibility measurement facilities are located on at 301-14, Daessangnyeong-ri, Chowol-eup,

Gwangju-si, Gyeonggi-do, 464-862 Korea. Description details of test facilities were submitted to the FCC (KR0013) and

IC (Registration No: IC3736A-2), accredited by KOLAS (Korea Laboratory Accreditation Scheme, No: 85) and approved

by TUV, DNV and KCC (Korea Communications Commission) according to the requirement of ISO 17025.



2.5 Environmental conditions

Unless otherwise indicated in the basic standard or test procedure, the tests shall be carried out within the rated supply

voltage for the EUT and the following standard atmospheric conditions for measurements and tests, as specified in IEC

60068-1, Subclause 5.3.1.

-. Temperature: 15 °C to 35 °C.

-. Relative humidity: 25 % R.H. to 75 % R.H.

-. Air pressure: 86.0 kPa to 106.0 kPa

2.6 Information of the instruction for class A equipment

Class A equipment shall be included the following warning in the instructions for use:

WARNING: This is a class A product. In a domestic environment this product may cause radio interference in which

case the user may be required to take adequate measures.



3. EUT (Equipment Under Test)

3.1 Identification of the EUT

-. Equipment : High Definition Network Camera

-. Model Name : LND5110

-. Brand Name : LG Electronics

-. Serial number : N/A

-. Manufacturer : LG Electronics Inc.

3.2 Additional information about the EUT The LG Electronics Inc., Model LND5110 (referred to as the EUT in this report) is an High Definition Network Camera.

Product specification information described herein was obtained from product data sheet or user’s manual.

CHASSIS TYPE Plastic & Metal

LIST OF EACH OSC. OR

CRY. FREQ.(FREQ.>=1 MHz) 400 MHz

ELECTRICAL RATING DC 12 V, 490 mA (Adapter : AC 100 - 240 V ~, 50/60 Hz)

NUMBER OF LAYERS -

TEMPERATURE RANGE -40 °C ~ 85 °C

EXTERNAL CONNECTOR Main Input Power, LAN, Audio In/Out, Alarm

3.3 Peripheral equipment Defined as equipment needed for correct operation of the EUT, but not considered as tested:

Model Manufacturer Description Connected to

LND5110 LG Electronics Inc. High Definition Network Camera (EUT) -

XPS 14z DELL Notebook PC EUT

DA90PM11 DELL Adapter Notebook PC

DA-18C-12 LG AC/DC Adapter EUT

3.4 Mode of operation during the test -. The LAN port on the EUT was connected to the notebook PC and then the EUT was observed the state of video output

on the monitor during the testing.

-. The power of the EUT was fed from a power adaptor (230 V~, 50 Hz).



3.5 Criterion description There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the

conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be

interpreted by associated equipment as a change,

The EUT shall meet the acceptance criteria for the functional test, after the conditioning.

For Radiated electromagnetic fields

and no such flickering of indicators occurs at a field strength of 3 V/m.

For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the

picture is allowed at 10 V/m, providing:

a) there is no permanent damage or change to the EUT (e.g. no corruption of memory or changes to programmable settings

etc.);

b) at 3 V/m, any deterioration of the picture is so minor that the system could still be used; and

c) there is no observable deterioration of the picture at 1 V/m.

For Conducted disturbances induced by electromagnetic fields

and no such flickering of indicators occurs at U0 = 3 V.

For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the

picture is allowed at U0 = 10 V, providing:

a) there is no permanent damage or change to the EUT (e.g. no corruption of memory or changes to programmable settings

etc.);

b) at U0 = 3 V, any deterioration of the picture is so minor that the system could still be used; and

c) there is no observable deterioration of the picture at U0 = 1 V.

-. Mains supply voltage variations

There shall be no damage, malfunction or change of status due to the different supply voltage conditions.

3.6 Cable Description Ports Name Shielded Ferrite Bead Metal Shell Length (m) Connected to

DC IN Y N N 1.0 AC/DC Adaptor

LAN N N N 3.0 Notebook PC

3.7 Alternative type(s)/model(s)

-. None

4. EUT MODIFICATIONS

-. None



5. EMISSION TESTS

5.1 MAINS TERMINAL CONTINUOUS DISTURBANCE VOLTAGE

5.1.1 Operating environment

Temperature : 21 °C

Relative humidity : 35 % R.H.

5.1.2 Test set-up

The EUT was placed on a non-conductive table, 0.8 m height above the floor. The EUT was connected to adapter and the

power of adapter was fed through a 50 Ω/ 50 μH + 5 Ω Artificial Mains Network (AMN). The ground plane was

electrically bonded to reference ground system and all power lines were filtered from ambient.

The test set-up photos are included in appendix I.

5.1.3 Measurement uncertainty

Mains terminal continuous disturbance voltage, quasi-peak detection : ± 2.93 dB

Mains terminal continuous disturbance voltage, average detection : ± 2.93 dB

Measurement uncertainty is calculated in accordance with CISPR 16-4-2. The measurement uncertainty is given with a

confidence of 95 % with the coverage factor, k = 2.

5.1.4 Test equipment used

Model Number Manufacturer Description Serial Number Last Cal. (Interval)

- ESHS10 Rohde & Schwarz Test Receiver 834467/007 Jul. 02, 2013 (1Y)

- NSLK 8126 Schwarzbeck AMN 8126-404 May 29, 2013 (1Y)

- NSLK 8128 Schwarzbeck AMN 8128-216 Jun. 07, 2013 (1Y)

- 3825/2 EMCO AMN 9109-1867 May 20, 2013 (1Y)

- 3825/2 EMCO AMN 9109-1869 May 20, 2013 (1Y)

All test equipment used is calibrated on a regular basis.



5.1.5 Test data

-. Test Date : March 19, 2014

-. Resolution bandwidth : 9 kHz

-. Frequency range : 0.15 MHz ~ 30 MHz

Frequency Line Peak (dBμV) Margin (MHz) Emission level Q.P Limits (dB)

0.15 N 51.39 79.00 27.61

0.18 H 46.85 79.00 32.15

0.56 N 40.23 73.00 32.77

0.57 H 38.13 73.00 34.87

13.39 N 41.73 73.00 31.27

13.58 H 42.03 73.00 30.97

Frequency Line Average (dBμV) Margin (MHz) Emission level Limits (dB)

- - - - -

- - - - -

Remark : “H”: Hot Line, “N”: Neutral Line

See next page for an overview sweep performed with peak detector.

Tested by: Jong-Jin. Lee / Engineer



HOT LINE

NEUTRAL LINE



5.2 CONDUCTED COMMON MODE DISTURBANCE AT TELECOMMUNICATION PORTS




5.2.2 Test set-up

The EUT and other support equipment were placed on a non-conductive table, 0.8 m height above the floor.

Telecommunication line for the EUT connected to associated equipment through an Impedance Stabilization Network

(ISN) which has a common mode termination impedance of 150 Ω to the telecommunication port under test. The ground

plane was electrically bonded to the reference ground system and all power lines were filtered from ambient.

The test set-up photos are included in appendix II.


Conducted emission, quasi-peak detection : ± 2.93 dB

Conducted emission, average detection : ± 2.93 dB

Measurement uncertainty is calculated in accordance with CISPR 16-4-2.. The measurement uncertainty is given with a



Model Number Manufacturer Description Serial Number Last Cal.(Interval)

- ESHS10 Rohde & Schwarz EMI Test Receiver 834467/007 Jul. 02, 2013 (1Y)

- NSLK 8126 Schwarzbeck AMN 8126-404 May 29, 2013 (1Y)

- 3825/2 EMCO AMN 9109-1867 May 20, 2013 (1Y)

- ENY41 Rohde & Schwarz ISN 100021 May 30, 2013 (1Y)




5.2.5 Test data



-. Frequency range : 0.15 MHz ~ 30 MHz

-.Remark : ISN 10 Mbps

Frequency Port Peak (dBμV) Margin Average (dBμV) Margin

(MHz) Emission

Level Detector

Mode Q.P Limits (dB) Emission Level Limits (dB)

0.15 Four 55.32 P 97.00 41.68 - - -

0.59 Four 50.51 P 87.00 36.49 - - -

5.06 Four 58.68 P 87.00 28.32 - - -

8.55 Four 62.05 P 87.00 24.95 - - -

10.0 Four 69.41 P 87.00 17.59 - - -

19.43 Four 51.65 P 87.00 35.35 - - -

Remark : “Four”: Two Unscreened Balance Pair, “P”: Peak detect





-.Remark : ISN 100 Mbps

Frequency Port Peak (dBμV) Margin Average (dBμV) Margin

(MHz) Emission

Level Detector

Mode Q.P Limits (dB) Emission Level Limits (dB)

0.57 Four 50.44 P 87.00 36.56 - - -

1.42 Four 47.86 P 87.00 39.14 - - -

2.19 Four 47.74 P 87.00 39.26 - - -

14.15 Four 53.66 P 87.00 33.34 - - -

18.25 Four 54.77 P 87.00 32.23 - - -

23.13 Four 55.42 P 87.00 31.58 - - -

Remark : “Four”: Two Unscreened Balance Pair, “P”: Peak detect





5.3 RADIATED ELECTROMAGNETIC FIELD




5.3.2 Test set-up

The radiated emissions measurements were on the 10 m, semi anechoic chamber. The EUT and all local support equipment

were placed on a non-conductive turntable approximately 0.8 m above the ground plane.

The frequency spectrum from 30 MHz to 2 000 MHz was scanned and emission levels maximized at each frequency

recorded. The system was rotated 360°, and the antenna was varied in height between 1.0 m and 4.0 m in order to

determine the maximum emission levels. This procedure was performed for both horizontal and vertical polarization of the

receiving antenna.

The test set-up photos are included in appendix III.


Radiated emission electric field intensity, 30 MHz ~ 300 MHz : ± 4.43 dB

Radiated emission electric field intensity, 300 MHz ~ 1 000 MHz : ± 3.80 Db Radiated emission electric field intensity, 1 GHz ~ 6 GHz : ± 4.20 dB

Measurement uncertainty is calculated in accordance with CISPR 16-4-2. The measurement uncertainty is given with a




- ESCI Rohde & Schwarz EMI Test Receiver 101013 Oct. 14, 2013 (1Y)

- ESU Rohde & Schwarz EMI Test Receiver 100261 May 27, 2013(1Y)

- 310N Sonoma Instrument Amplifier 312544 May 21, 2013 (1Y)

- 310N Sonoma Instrument Amplifier 312545 May 21, 2013 (1Y)

- VULB9163 Schwarzbeck TRILOG Broadband Antenna 9163-420 Mar. 27, 2012(2Y)

- VULB9163 Schwarzbeck TRILOG Broadband Antenna 9163-255 Apr. 24, 2012 (2Y)

- BBHA9120D Schwarzbeck Horn Antenna BBHA9120D295 Sep. 05, 2013 (2Y)

- SCU 18 Rohde & Schwarz Signal Conditioning Unit 10041 Nov. 07, 2013 (1Y)

- CO2000 Innco System Controller 619/27030611/L N/A

- DT3000 Innco System Turn Table 930611 N/A

- MA4000-EP Innco System Antenna Master 3320611 N/A

- MA4000-EP Innco System Antenna Master 3350611 N/A




5.3.5 Test data



-. Frequency range : 30 MHz ~ 1 000 MHz

-. Measurement distance : 10 m

Graphical representation of Radiated Disturbance

Tabulated Results for Radiated Disturbance

Remark: Margin (dB) = Limit – Result and Result = Reading Peak + Antenna Factor + Loss – Gain Loss and Gain in above table means Cable Loss and Pre-amplifier gain.



-. Resolution bandwidth : 1 MHz

-. Frequency range : 1 000 MHz ~ 2 000 MHz

-. Measurement distance : 3 m

Detector Mode: Peak



Remark: Margin (dB) = Limit – Result and Result = Reading Peak + Antenna Factor + Loss – Gain Loss and Gain in above table means Cable Loss and Pre-amplifier gain.



Detector Mode: Average



Remark: Margin (dB) = Limit – Result and Result = Reading Average + Antenna Factor + Loss – Gain Loss and Gain in above table means Cable Loss and Pre-amplifier gain.




5.4 HARMONICS CURRENT EMISSIONS




5.4.2 Test set-up

Harmonics of the fundamental current were measured up to 2 kHz using a universal power analyzer. The measurements

were carried out under steady conditions and using average.

Before making measurements, it is necessary for the EUT to decide which class the EUT fulfills into; A, B, C or D.

The test set-up photo is included in appendix IV.


The uncertainty of our equipments for harmonic measurement is ± 0.2 %.

Measurement uncertainty is calculated in accordance with EN 61000-4-7. The measurement uncertainty is given with a




- PM6000 Voltech Universal Power Analyzer 1000067 00196 May 28, 2013 (1Y)

- 134350 Pacific Power Magnetics Module 1512 Jun. 24, 2013 (1Y)

- UPC32-413 Pacific Power Waveform Generator 0002 Apr. 15, 2013 (1Y)

- 360AMXT/UPC-32 Pacific Power AC Power Source 0222 Jun. 24, 2013 (1Y)


All test equipments used are calibrated on a regular basis.

5.4.5. Test data


-. Class : A

-. Remark : The input power of the EUT is lower than 75 W.

According to the cause 7 in EN 61000-3-2, no limit applies for the EUT.

See next page for Harmonics on AC Mains and DC test data.




5.5 VOLTAGE CHANGES, VOLTAGE FLUCTUATIONS AND FLICKER




5.5.2 Test set-up The voltage changes at the supply terminals were measured across the complex reference impedance Z = (0.4 + j0.25) Ω.

The short-term flicker values are measured during a time interval of 10 min. Dc = relative voltage change between two

steady states and Dmax = maximum single voltage change, are measured over the reference impedance.

The test set-up photo is included in appendix IV.

5.5.3 Measurement uncertainty The uncertainty of our equipment for flicker measurement is ± 5 %.

Measurement uncertainty is calculated in accordance with EN 61000-3-3. The measurement uncertainty is given with a




- PM6000 Voltech Universal Power Analyzer 1000067 00196 May 28, 2013 (1Y)

- IEC 61000-3 Voltech Reference Impedance Network IG 203/3401 May 28, 2013 (1Y)

- IEC 61000-3 Voltech Reference Impedance Network IG 119/3228 May 28, 2013 (1Y)

- IEC 555 Voltech Reference Impedance Network IB13/9886 May 28, 2013 (1Y)



- UPC32-413 Pacific Power Waveform Generator 0002 Apr. 15, 2013 (1Y)



All test equipments used are calibrated on a regular basis.

5.5.5 Test data -. Test Date : March 22, 2014

-. Test Result : Pass

-. Remark : See next page for Voltage Fluctuations on AC mains test data.

Tested by: Jong-Jin, Lee / Engineer



6. IMMUNITY TESTS

6.1 ELECTROSTATIC DISCHARGE IMMUNITY TEST

The measurement of the Immunity Against Electrostatic Discharge was performed in a shield room. Date: March 21, 2014

6.1.1 Operating environment Ambient temperature 22 [°C] Relative humidity 34 [% R.H.] Atmospheric pressure 100.8 [kPa]

6.1.2 Test set-up

The EUT and all local support equipment were placed on a non-conductive support 0.1 m above a reference ground plane

(RGP) and were put into operation according to the specified operating mode.

The test set-up photo is included in appendix V.


It has been demonstrated that the ESD generator meets the specified requirements in the standard with at least a 95 %

confidence.



- ESS-2002EX NOISEKEN ESD Simulator ESS0898812 May 28, 2013(1Y)




6.1.5 Test data

Test levels : Contact discharge 6 kV, Air discharge 2 / 4 / 8 kV

Number of discharges : 10 at all test points.

Polarity : Positive / Negative

EUT-position : Floor Standing (Wall and Ceiling mounted Equipment)

Required performance criterion : See section 3.5 of this report

Test result : Pass

The EUT met the acceptance criteria for the functional test, after the conditioning.

Monitoring of the EUT : Observed the state of video output of the EUT on screen of notebook pc via LAN.

The test points of the EUT are each location on the surface touchable by hand (see test point in next page) and VCP -0.1

m from the four sides of the EUT.

The results of selected test points of the EUT are listed in below table.

Point Test level [± kV] Pass / Fail Description

Enclosure 2 / 4 / 8 (Air) Pass There was no deviation from normal operating condition

during and after test. VCP 6 (Indirect) Pass




6.1.6 ESD Test Point & Test Result

ESD Point Discharge voltage[± kV] Results

(1) Enclosure 2 / 4 / 8 (Indirect) Pass

VCP 6 (Indirect) Pass

(1) (1)



6.2 RADIATED RF-ELECTROMAGNETIC FIELD IMMUNITY TEST

The measurement of the Immunity Against Radiated RF-Electromagnetic Field was performed in an anechoic

chamber. Date: April 01, 2014


6.2.2 Test set-up

The EUT and all local support equipment were placed on a non-metallic support 0.8 m above a reference ground plane


The test set-up photo is included in appendix VI.


The measurement uncertainty is ± 0.23 V/m for 1 V/m, ± 0.70 V/m for 3 V/m and ± 2.30 V/m for 10 V/m.

Measurement uncertainty is calculated in accordance with UKAS Lab34. The measurement uncertainty is given with a

confidence of 95 %. The measurement uncertainty is calculated as the uncertainty of the electric field intensity detected by

the probe(s). The uncertainty calculations exclude influence of phenomena like inhomogeneity of the electric field intensity.



- SML 03 Rohde & Schwarz Signal Generator 102602 May 21, 2013 (1Y)

- NRVD Rohde & Schwarz Power Meter 101448 May 21, 2013 (1Y)

- HL046 Rohde & Schwarz Log Periodic Antenna 100053 Jan. 28, 2014 (1Y)

- AT4002A Amplifier Research Microwave Horn Antenna N/A Jan. 28, 2014 (1Y)

- 120S1G4M1 Amplifier Research Power Amplifier 333101 Feb. 22, 2013 (1Y)

- 500W1000A Amplifier Research Power Amplifier 332911 Jan. 28, 2014 (1Y)

- DC6180A Amplifier Research Directional Coupler 332598 Jan. 28, 2014 (1Y)

- DC7144M1 Amplifier Research Directional Coupler 313662 Jan. 28, 2014 (1Y)

- TA-EMS Rohde & Schwarz System Communication 11017 Jan. 28, 2014 (1Y)




6.2.5 Test data

Test level : 1 V/m, 3 V/m, 10 V/m

(AM 80 %, 1 kHz, sine wave / PM 50%, 1 Hz (0.5 s ON: 0.5 s OFF))

Frequency range : 80 MHz ~ 2 700 MHz

Frequency step : 1 %

Dwell time at each frequency : 3 s

Exposed side : Front / Back / Left / Right

Distance of antenna – EUT : 3 m

EUT-position : Table top


Test result : Pass



The results of test are listed in below table.

Freq. Range [MHz]

Exposed side Pass/Fail Description

80 ~ 1 000 Front / Back / Left / Right

Pass There was no deviation from normal operating condition

during and after test. 1 000 ~ 2 700 Pass




6.3 ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST

The measurement of the Immunity Fast Transient/Burst was performed in a shield room. Date: March 24, 2014


6.3.2 Test set-up

The EUT was placed on non-metallic support 0.1 m above a reference ground plane (RGP) and was put into operation

according to the specified operating mode. If the manufacturer provides a non-detachable supply cable more than 0.5 m

long with the equipment, the excess length of this cable shall be folded to avoid a flat coil and situated at a distance of 0.1

m above the ground reference plane.

The test set-up photo is included in appendix VII.


It has been demonstrated that the burst generator meets the specified requirements in the standard with at least a 95 %

confidence.



- UCS 500 M4 S1 EM Test Ultra Compact Generator 0304-20 May 30, 2013(1Y)

- CNI 503-32A EM Test Combined Coupling Decoupling Net 0304-02 Jul. 16, 2013(1Y)

- H.F.K EM Test Capacitive Coupling Clamp N/A May 28, 2013(1Y)

- AC2716 EM Test Power Source 93. 30. 1037 May 30, 2013(1Y)




6.3.5 Test data

Test level : 2 kV (AC-mains supply), 1 kV (Other supply / Signal lines > 3 m)

Burst frequency : 100 kHz

Rise time/Hold time : 5/50 ns


Coupling time : 72 s

Coupling methods : AC mains - Coupling/decoupling network (CDN)

Signal lines - Capacitive Coupling Clamp (CCC)

Lines for test : AC Mains of the Adaptor

Signal lines of the EUT

Type of line & length : Unshielded, 0.5 m (AC Mains)

Unshielded, 3.0 m (RJ-45 - Signal line)



Test result : Pass




Line for test Coupling Method

Test level [± kV]

Pass/Fail

Description

AC-mains (L/N) CDN 2 PassThere was no deviation from normal operating

condition during and after test. AC-mains (L+N) CDN 2 Pass

Signal line CCC 1 Pass




6.4 SURGE IMMUNITY TEST

The measurement of the Immunity Surge Transients was performed in a shield room. Date: March 24, 2014


6.4.2 Test set-up



The test set-up photo is included in appendix VIII.


It has been demonstrated that the surge generator meets the specified requirements in the standard with at least a 95 %

confidence.




- CNI 503-32A EM Test Combined Coupling Decoupling Net 0304-02 Jul. 16, 2013(1Y)

- CNV508 EM Test Coupling Network N/A N/A


- HV Gun SQS HV Gun N/A N/A

All test equipments used is calibrated on a regular basis.



6.4.5 Test data

Test level : 0.5 kV, 1 kV (Common mode of AC mains)

0.5 kV, 1 kV (Signal lines > 30 m)

Number of surge : 5 surges/ polarity


Angle : 0° / 90° / 180° / 270°

Repetition rate : 60 s


Signal lines – Coupling/decoupling network (CDN)

Lines for test : AC Mains of the Adapter

Signal line of the EUT


Shielded, 30.0 m (Signal cable - RJ-45)


Required performance criterion: See Item 3.5 of this report

Test result : Pass




Line for test Coupling Method

Test level [± kV]

Pass/ Fail

Description

AC-mains (L+N) CDN 0.5 / 1 Pass There was no deviation from normal operating

condition during and after test Signal lines CDN 0.5 / 1 Pass




6.5 CONDUCTED RF FIELDS IMMUNITY TEST

The measurement of the Immunity Against Conducted RF Field was performed in the anechoic chamber. Date: March 24, 2014


6.5.2 Test set-up



The test set-up photo is included in appendix IX.


The measurement uncertainty is ± 0.17 V for 1 V, ± 0.50 V for 3 V and ± 1.70 V for 10 V.

Measurement uncertainty is calculated in accordance with EN 61000-4-6 Annex G. The measurement uncertainty is given

with a confidence of 95 %.



- CWS 500 N1 EM Test Continuous Wave Generator P1247105431 Aug. 27, 2013 (1Y)

- CDN-M2/M3 EM Test Coupling Decoupling Net P1312115835 Aug. 27, 2013 (1Y)

- EM 101 Fisher Custom Injection Clamp 35364 May 06, 2013 (1Y)

- 100-A-FFN-06 Bird Technologies Group Attenuator 751 May 21, 2013 (1Y)




6.5.5 Test data

Test level : 1 V, 3 V, 10 V

(AM 80 %, 1 kHz sine wave / PM 50 %, 1 Hz (0.5 s ON: 0.5 s OFF))

Frequency range : 0.15 MHz ~ 100 MHz

Frequency step : 1 %

Dwell time at each frequency : 3 s


Various input/output ports >3 m - EM clamp

Lines for test : Power line of the Adaptor

Signal line of the EUT


Shielded, 3.0 m (Signal cable - RJ-45)


Required performance criterion: See Item 3.5 of this report

Test result : Pass




Lines for test

Freq. Range [MHz]

Test level [V]

Pass/Fail

Coupling Method Description

AC mains 0.15 ~ 100 1 / 3 / 10 Pass CDN There was no deviation from normal operating

condition during and after test. Signal lines 0.15 ~ 100 1 / 3 / 10 Pass EM clamp




6.6 MAINS SUPPLY VOLTAGE DIPS AND SHORT INTERRUPTIONS IMMUNITY TEST

The measurements of the Immunity Mains Supply Voltage Dips and Interruptions were performed in a shield room. Date: March 24, 2014


6.6.2 Test set-up



The test set-up photo is included in appendix X.


It has been demonstrated that the voltage dips and interruptions generator meets the specified requirements in the standard

with at least a 95 % confidence.








6.6.5 Test data

Nominal Mains Voltage (VNOM) : 230 V~, 50 Hz

Level of Reduction (dip) : 200 ms at 60 % of VNOM, 500 ms at 30 % of VNOM, 5 000 ms at 20 % of VNOM

No. of dips/interruption : 3

Interval : 10 s

Type of line & length : AC mains of the adapter – Unshielded, 1.0 m



Test result : Pass




Test Reduction (% of VNOM)

Duration in time (ms)

Pass / Fail Description

Voltage dips

20 5 000 Pass There was no deviation from normal operating condition

during and after test. 30 500 Pass

60 200 Pass

Voltage Interruptions 100 5 000

N/A

(See Note)

The power of EUT is off during the test. After the test,

EUT is getting back to normal operation.

Note.: “It fully recorded using ancillary Power source equipment to content with Manufacturer`s set up manual.”




6.7 MAINS SUPPLY VOLTAGE VARIATIONS IMMUNITY TEST

The measurement of the Immunity Mains Supply Voltage Variations was performed in a shield room. Date: March 24, 2014


6.7.2 Test set-up



The test set-up photo is included in appendix XI.


It has been demonstrated that the Mains Supply Voltage Variations generator meets the specified requirements in the

standard with at least a 95 % confidence.








6.7.5 Test data

Nominal Mains Voltage (VNOM) : 230 V~

Voltage variations : VNOM + 10 %, VNOM – 15 %

Interval : 10 s

Type of line & length : AC mains of the Adaptor – Unshielded, 1.0 m



Test result : Pass




Test Voltage (% of VNOM) Pass / Fail Description

Voltage Variations +10 Pass There was no deviation from normal operating condition

during and after test. -15 Pass




APPENDIX I - TEST SET-UP PHOTOS: (Mains Terminal Continuous Disturbance Voltage)



APPENDIX II - TEST SET-UP PHOTOS: (Conducted Common Mode Disturbance at Telecommunication Ports)



APPENDIX III - TEST SET-UP PHOTOS: (Radiated Electromagnetic Field)

30 MHz ~ 1 000 MHz



1 000 MHz ~ 2 000 MHz



APPENDIX IV - TEST SET-UP PHOTO: (Harmonics & Voltage Fluctuations on AC Mains)



APPENDIX V – TEST SET-UP PHOTO: (ESD)



APPENDIX VI – TEST SET-UP PHOTO: (RF E- FIELD)



APPENDIX VII - TEST SET-UP PHOTO: (EFT/BURST)



APPENDIX VIII - TEST SET-UP PHOTO: (SURGE)



APPENDIX IX - TEST SET-UP PHOTO: (C.S)



APPENDIX XI - TEST SET-UP PHOTO: (MAINS SUPPLY VOLTAGE DIPS, SHORT INTERRUPTIONS)



APPENDIX XI - TEST SET-UP PHOTO: (Power Supply Short Term Variation)



APPENDIX XII - PHOTOGRAPHS OF THE PRODUCT

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