ABSORBER COATINGS FOR MID-INFRARED ASTROPHYSICS · OBSERVATIONAL COSMOLOGY LAB, NASA GODDARD SPACE...
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ABSORBER COATINGS FOR MID-INFRARED ASTROPHYSICS DAHLIA BAKER 1 , EDWARD WOLLACK 2 , KARWAN ROSTEM 2,3 1. COE COLLEGE, DEPARTMENT OF PHYSICS 2. OBSERVATIONAL COSMOLOGY LAB, NASA GODDARD SPACE FLIGHT CENTER 3. DEPARTMENT OF PHYSICS AND ASTRONOMY, THE JOHNS HOPKINS UNIVERSITY
Transcript of ABSORBER COATINGS FOR MID-INFRARED ASTROPHYSICS · OBSERVATIONAL COSMOLOGY LAB, NASA GODDARD SPACE...
ABSORBERCOATINGSFORMID-INFRAREDASTROPHYSICS
DAHLIABAKER1,EDWARDWOLLACK2 ,KARWAN ROSTEM2,3
1.COECOLLEGE,DEPARTMENTOFPHYSICS
2.OBSERVATIONALCOSMOLOGYLAB,NASAGODDARDSPACEFLIGHTCENTER
3.DEPARTMENTOFPHYSICSANDASTRONOMY,THEJOHNSHOPKINSUNIVERSITY
• PhysicsandMathematicMajor
• PhysicsClubandOutreach
• StudiedComputationalBiophysics,movingontoPlanetaryScienceresearch
ABOUTME
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BACKGROUND
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• HIRMES- HighResolutionMid-InfrarEd Spectrometer• Functioninginthe20-200micrometerrange
• Eliminate
• SOFIA– StratosphericObservatoryforInfraredAstronomy
APPROACH• Goals
• Createamaterialthatabsorbsstraylight• Lightweight,easyapplicable• Knowndielectricfunction
• Whatisthis?Describestheelectricresponsetoincidentradiation
• Diffusivelyreflectsratherthanspecularly reflects• Withstandcryogenictemperatures(µK)
• FirstStep- Characterizethematerials• Dielectricfunctions
• SecondStep- Matlab Model• Modeleachsamplelayerwithfounddielectricfunction
• ThirdStep- Manufacturing• Createsampleplates
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APPROACH
3MGlassMicrospheres~100micronsindiameter
Epotech 377HGraphene- LoadedEpoxysC(5):377(65):SiOx(30)
Aeroglaze Z306
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Specular Diffuse
SAMPLES
SampleLetter
ThicknessofEpoxy(µm) FinalLayerCount Composition(LayerOrder)
A 579 2 Epoxy,Z306B 644 3 Epoxy,Z306,K1C 449 3 Epoxy,K1,Z306D 505 4 Epoxy,K1,Z306,K1E 707 1 EpoxyF 494 2 Epoxy,K1
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DIELECTRICCHARACTERIZATION
Frequency (GHz) 22 26 30 34 38 42
Res
pons
e (d
B)
-40
-30
-20
-10
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WR28.0 Sampleholder: K1 Microspheres
Average: S11 & S22Theory: S11, S22Average: S12 & S21Theory: S12, S21
Ø Frequencyresponsedatatakenwithamicrowavenetworkvectoranalyzer
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TransmissionthroughwaveguideReflectionfromsample
• Periodicstructureofreflectionshowsconstructiveanddestructiveinterference
• Showsthe“truedensity”asseenbyanincidentelectromagneticwave
• Lossisduetodielectricpropertiesofmicrospheres,scatteringduetogeometryisnotconsidered
THEMODEL
Material Thickness(µm) Dielectric(-)
Aluminum 500 1+1x108i
Epoxy377H 500 7.4+0.4i3MK1
Microspheres 100 1.1 +0.002i
Aeroglaze Z306 50 2.6+0.6i
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Responsevs.Wavelength
RESULTS
• Conclusions• Ourproposedmaterialcanbe
manufacturedatasmallscale• Modelpredictscorrectresponse• Drawback– modelcannotpredict
responsefromdiffusescatteringduetomicrospheres
• FurtherStudies• Measureoptical
frequency-dependentresponsewithaFourierTransformSpectrometer
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Transmittancevs.FrequencyforEpoxy
Reflectancevs.FrequencyforEpoxy
ACKNOWLEDGEMENTS
CoeCollegeAdvisors
SteveFeller Ugur Akgun Firdevs Duru MarioAffatigato
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ACKNOWLEDGEMENTS
AIP/SPS
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ACKNOWLEDGEMENTS
NASAandCollaboratorsIwouldliketogivespecialthankstotheObservational
CosmologyLabatNASAGoddardSpaceFlightCenterandmymentors
EdwardJ.Wollack Karwan Rostem
Fortheirsupportofmyproject:
• DaveChuss andRileyMcCarten,VillanovaUniversity
• PaulMirel,ObservationalCosmologyLab,NASAGSFC
• KyleJohnson,GeorgeWashingtonUniversity
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