A review of the challenges and development of SMT Wave and ... · SMTA LA/OC Expo, Long Beach, CA,...

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SMTA LA/OC Expo, Long Beach, CA, USA A review of the challenges and development of SMT Wave and Rework assembly processes in SMT, Wave and Rework assembly processes in the electronics industry Jasbir Bath, Consulting Engineer Christopher Associates Inc./ Koki Solder Koki Solder Email: [email protected] www christopherweb com Lead Free SOLUTIONS you can TRUST Challenging New Technologies www.christopherweb.com http://www.ko-ki.co.jp

Transcript of A review of the challenges and development of SMT Wave and ... · SMTA LA/OC Expo, Long Beach, CA,...

Page 1: A review of the challenges and development of SMT Wave and ... · SMTA LA/OC Expo, Long Beach, CA, USA A review of the challenges and development of SMT Wave and Rework assembly processes

SMTA LA/OC Expo, Long Beach, CA, USA

A review of the challenges and development of SMT Wave and Rework assembly processes inSMT, Wave and Rework assembly processes in

the electronics industry

Jasbir Bath, Consulting Engineer

Christopher Associates Inc./Koki SolderKoki Solder

Email: [email protected]

www christopherweb comLead Free SOLUTIONS you can TRUST Challenging New Technologies

www.christopherweb.comhttp://www.ko-ki.co.jp

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Agenda

• IntroductionIntroduction• SMT • Wave• Wave • Rework• Test• Test• Conclusions

F t W k• Future Work

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Introduction3

• The electronics assembly industry has beenThe electronics assembly industry has been migrating from PTH to SMT over a number of years.

• This migration has seen a number of newThis migration has seen a number of new components and technologies faced by the industry.

• The presentation will review the various new pcomponents and assembly challenges faced.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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SMT Component Trends

– Move to miniaturization and System In Package type components

– Large System in Package components

– QFN/MLF/BTC components

– CSP/BGA components

– Chip components

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Large System in Package components

– Increase in use of System in Package (SIP) components:

Stacked Die in PackageStacked Package on Package (PoP)Modules

– Large BGAs/SIP sizes: 35mm to 55mm PoP

– 3000 to 3500 I/O with 0.8mm to 1mm pitch

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Issues with large component sizes (SiP, PoP)

• Solder paste printing issues• Component placement issues• Coplanarity issues of component and board during assembly• Potential for warpage of part during reflow (Head-in-Pillow defect)• Issues during area array rework (high component temperatures,

warpage during rework)

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Warpage related to PoP assembly7

• Component warpage during the reflow process can lead to solder joint opens.– More problematic with PoP components where each package

is made thinner to minimize overall height, making it more vulnerable to warpagevulnerable to warpage.

• Once solder bumps of PoP component separate from board pad land, even if they are in contact again, open solder joint failures , y g , p jresult due to depleted tacky flux performance during reflow.

Ref: J. Bath et. al,(Christopher/Koki)

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

SMTAI Conference, 2010.

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Reflow Issues Related to Package on Package (PoP) Componentsg g ( ) p

• Work needed to improve assembly yields: warpage of the part during reflow

• Tacky flux versus Low viscosity solder paste for package attachment during reflowattachment during reflow– Tacky flux: Would the solder joint reliability be acceptable

and potential for warpagep p g– Solder paste: Would solder bridging be an issue during

assembly

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Affect on Powder Size on solder paste transfer for PoPcomponents

9

• Tests with Type 4 (20-38um) solder powder size versus 10-25um versus 5-20um for PoP showed the best results with 5-20um in terms of good paste transfer. te s o good paste t a s e

• Good paste amount deposited helped reduce head-in-pillow component soldering issues.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

Ref: J. Bath et. al, (Christopher/Koki), SMTAIConference, 2010.

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Issues Related to Assembly of QFN/MLF/BTC (Micro Lead-Frame) Components

• Non-standard designs from component suppliers• Refer to IPC 7093 standard for general guidelines: Design andRefer to IPC 7093 standard for general guidelines: Design and

Assembly Guidelines for BTC/MLF/QFN components

• Need to optimize solder paste volumes to use: Large center pad (voiding)C t P d Vi Pl i O ti i t d V idi• Center Pad Via Plugging: Optimize to reduce Voiding

• Soldering to edge of QFN/MLF which would have oxidized copper:• Soldering to edge of QFN/MLF which would have oxidized copper: decide on need to rework

• Low QFN/MLF standoff height (flux entrapment/ unactivated flux)

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

g ( p )• Inspection difficulties for multiple rows of this component type

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Issues Related to Rework of QFN/MLF/BTC (Micro-Lead-Frame) Components

• Potential high temperature component related issues• Not very well standardized rework techniques (area array, hand y q ( y,

soldering)• Decide on use of solder paste or tacky flux during QFN rework

d h t l itand how to apply it.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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QFN/BTC/MLF Reflow problems (Voiding)

• Develop suitable solder paste reflow profile to reduce voiding• Assessment of solder paste to use.p• Solderability/ void exit issues under QFN/MLF component

• Voiding categories:– Greater than 25% voiding termed a defect (IPC 610 standard) – At what % over 25% will there be ATC or mechanical

reliability issues.

• Potential void issues in terms of electrical/ thermal requirements for QFN/MLF

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

– what void % is an issue

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Development of solder paste helps to reduce voiding in QFN/BTC/MLF. Tests on different board surface finishes on power transistor

component showing different levels of voiding %.

13

Improved Lead-free Paste COSP Sn NiAu HASL (SAC305)

Conventional Lead-free Paste D

5.4% 4.6%2.55% 3.6%

Conventional Lead free Paste D

OSP Sn NiAu HASL (SAC305)

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

25.2% 35.0% 17.5% 17.4%

Ref: J.Bath et al. (Christopher Associates/ Koki Solder) SMTAI 2010

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Development of solder paste to reduce voiding under QFN/MLF/BTC component

14

Model: behav ior of v oidsd i f lImproved wetting property for Lead free during ref low process• Improved wetting property for Lead-free

Paste C extends duration of fluid/active state of the flux:

Remov al of oxidized f ilm & f low off lux prompt bubbles to ev acuate.– Helps to push out more of the entrapped

gasg

– Enables component to come closer to board pad lowering component solder

New additiv e with good wettingproperties pulls the component and

helps to push out the bubbles.

board pad, lowering component solder joint standoff height.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

REF: J.Bath et al. (Christopher Associates. Koki solder) SMTAI 2010

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Assembly with CSP/WL-CSP Components

• Reduction in CSP pitch: From 0.5mm to 0.4mm to 0.3mm• Need to understand reliability implications for low volumeNeed to understand reliability implications for low volume

solder joints such as 0.3mm pitch CSP• Low profile CSP part (Potential flux activation issues)• Solder Joint Voiding• Warpage of part (Head in Pillow defect)• Solder paste volume deposited and solder powder size used

(Type 4 or 5 particle size paste for 0.3mm CSP versus Type 3 paste for coarser pitch components)paste for coarser pitch components)

• Board Pad and Stencil design guideline recommendations

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Assembly of Chip Components

From 0402 to 0201 to 01005 chip components• Board pad design considerations• Stencil design (stencil thickness and aperture)• Paste volume deposited and solder paste powder size used

(T 4 5 d i t f 01005 hi t )(Type 4 or 5 powder size paste for 01005 chip components)• Placement accuracy of chip components• Offset component placement in certain equipment dependent on• Offset component placement in certain equipment dependent on

paste location to board pad location • Reflow behaviour• Reworkability

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

• More challenges as movement is made from 0402 to 0201 to 01005

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Board Pad and Stencil Design Guidelines for existing and emerging components

Board Pad DesignFirst step to optimize:

P d d i b d IPC d i d d (IPC 3 1)– Pad designs based on IPC design standards (IPC 7351) or OEM/EMS guideline

– Understand how board pad designs were developed:Understand how board pad designs were developed: • Were they based on company evaluations or manufacturing

yield data.Stencil aperture design

• Dependant on board pad designs and components used• Refer to IPC stencil standards (IPC 7525) or OEM/EMS guidelines• Understand how stencil aperture designs were developed

U d t d t il ti d t ti f ff ti

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

• Understand stencil area ratios and aspect ratios for effective solder paste printing

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SMT Solder Paste Printing18

• As component sizes become smaller with smaller pad sizes, stencil area ratios guidelines are being challenged (Printing challenges when area ratios are < 0 66 and aspect ratios < 1 5)challenges when area ratios are < 0.66 and aspect ratios < 1.5).

• For a mix of large and small components on same board, more challenge to print large & small paste deposits on the board.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

Courtesy: DEK Printing Machines

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SMT Printing19

• Other solutions are being developed such as DEK Active Squeegee to print solder paste on a board with a mix of coarse and very fine pitch components (01005 0 3mmcoarse and very fine pitch components (01005, 0.3mm CSP) [e.g. mobile phone type applications).

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

Courtesy: DEK Printing Machines

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Paste Inspection Equipment

• As more focus is placed on printing large and small paste deposits on same board in addition to ensuring printing accuracy and deposition, more use of paste inspection equipment.

• Use of 2D or 3D paste inspection increasing (move towards 3D paste inspection)paste inspection).

• Used for prototype builds and manufacturing.

• More emphasis needed on use of paste inspection not just to filter out some low solder paste print deposited boards but as a way to improve process yield.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Use of AOI (Automated Optical Inspection) and X-ray equipment

• AOI equipment considerations:– AOI use after component placement (for high volume

d ti )production) – AOI use after reflow (for initial Prototype/NPI)

• X-ray equipment applications:– Voiding detection in BGA/CSP and QFN/MLF/BTC componentsVoiding detection in BGA/CSP and QFN/MLF/BTC components– Holefill analysis for wave soldered TH components

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Trend for Increased SMT Usage vs Wave Soldering with Paste-in-hole soldering – More paste in hole processes mainly for consumer type

products where board thickness is less than 63mil– Greater than 63 mils more paste needed for good holefill with

use of solder preforms but process window becomes more challenging to get good holefillchallenging to get good holefill

– Need to ensure paste in hole reflow soldered components are higher temperature rated for reflow versus wave soldering

– Need to ensure paste in hole soldered components can be reworked at lead-free reflow soldering temperatures

– Developments ongoing indicating that Paste in Hole can be used for thicker boards for assembly and rework [Ref:

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

used for thicker boards for assembly and rework [Ref: G.Subbarayan et. al: IPC APEX 2011, SMTAI 2011]

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Lead-free SMT Alloys and Reflow Profiles used

SMT solder pastes: Mainly Sn3 4Ag0 5CuMainly Sn3-4Ag0.5CuSome Sn1Ag0.5Cu and Sn0.7Cu based alloys

Reflow Profiles:• Tin-Lead: Time over 183ºC: 30-90 sec, Peak: 205- 215ºC,• Lead-free (Sn3-4Ag0.5Cu): Time over 217ºC: 30-90 sec, Peak:

235- 260ºC• Lead-free Low silver alloys (Sn0.3Ag0.7Cu): Time over 227ºC:

30-90sec, Peak: 240C-270ºC

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Issues transitioning to Low Silver Alloys for SMTHigher melting temperature– SnAgCu alloys

Sn3-4Ag0.5Cu (MP: 217ºC)

Sn1Ag0.5Cu (MP:225ºC) to Sn0.7Cu (MP: 227ºC)g ( ) ( )

Increased soldering temperatures, more likelihood of component and board temperature issuesboard temperature issues

Need for updated component rating standards for Low Ag solder pastes  [IPC/JEDEC J STD 020 d d]

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

[IPC/JEDEC J‐STD‐020 standard]

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Current Lead-free Alloys used and Issues Transitioning to Low Ag alloys for Wave g g y

Wave Alloys: Sn3-4Ag0.5Cu and Sn0.7Cu based alloysIncreased solder usage in Wave machines versus SMT with g

more SnCu based lead-free wave alloys used due to cost

Sn0.7CuNi, Sn0.7CuAg and Sn0.7CuAgNi (JEITA) alloysLower Ag amount, lower cost: MP 227ºC vs Sn3-4Ag0.5Cu MP

217ºC217ºC– JEITA alloys: Sn1Ag0.7Cu, Sn0.3Ag0.7Cu,

Sn0.3Ag0.7Cu0.03Nig– Sn0.7Cu based alloys– Thicker boards: Higher pot temperatures- potential

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

component and board issues and reduced wave holefill.

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Wave Flux, Flux Spray Assessment and Wave Preheat

Wave fluxesTrend to move to no-clean alcohol based wave fluxes for good

holefill on thicker boards for lead-freeFlux spray coverage assessment on board

Fl C /B d P t ti A t• Flux Coverage/Board Penetration Assessment– Good flux penetration

Even spray pattern across surface assessed using flux paper– Even spray pattern across surface assessed using flux paperWave Board Preheat • Important to consider amount of heat transfer into boardImportant to consider amount of heat transfer into board• Pre-heater:

– Pre-heater settings for optimized flux activation with more

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

g ptop-side preheat for better solder holefill

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Example of Lead-free Wave Soldering Evaluation

DCC

CAPCAP

CAPRJ-45, USB

125 mils (3.2mm) thick board 18 layers, 11 oz total copper OSP Board surface finish (High temperature rated) OSP Board surface finish (High temperature rated) Component types- Radial caps, LEDs, RJ45, USB & DCC Board size- 16 inch x 11inch High Tg FR4 laminate (175°C)

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

270°C solder pot temperature with Sn3Ag0.5Cu solder

Ref: S. Gopalkumar et al. (Brocade, Foxconn and BTC), SMTAI 2010

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Flux Screening Evaluation Results- 2D X-ray

C46 C126 CR6 CR15

1 (Signal) 50%~75%2 (GND) 25%~50%

1 (Signal) >75%

2 (GND) 25%~50% 1 (GND) >75%

2 (Signal) >75%

1 (Signal) 25%~50%

2 (Signal) 25%~50%

1 (Signal) >75%

1 (No Connect) >75%

2 (No Connect) >75%

3 (Signal) >75%

4 (Signal) >75%

5 (Signal) >75%

6 (Signal) >75%

7 (No Connect) >75%

8 (no Connect) >75%

9 G >75%

10 G >75%

1 (Signal) >75%

2 (Signal) >75%

3 (Signal) >75%

4 (Signal) >75%

5 (Signal) >75%

6 (Signal) >75%

7 (Signal) >75%

8 (Signal) >75%

9 (Signal) >75%

10 (GND) >75%

11 G >75%

12 G >75%

13 (Signal) 0%~25%

14 (Signal) >75%

15 (Signal) >75%

16 (Signal) >75%

2 (Signal) >75%

3 (Signal) >75%

4 (Signal) >75%

5 (Signal) >75%

6 (Signal) >75%

7 (Signal) >75%

8 (Signal) >75%

9 (Signal) >75%

10 (GND) >75%

11 G 25%~50%

12 G >75%

13 (Signal) >75%

14 (Signal) >75%

15 (Signal) >75%

16 (Signal) >75%

1 (Signal) >75%

2 (Signal) >75%3 (Signal) >75%

4 (GND) >75%

5 (No Connect) 50%~75%

6 (No Connect) 50%~75%

J12 J25 J27 J39

4 (GND) >75%1 (Signal) >75%

2 (GND) 50%~75%

U32_1 U32_2 U109 U181

1 (P48V_RTN) 50%~75%

2 (P48V_DCC_ON) >75%

3 (P48V_RTN) >75%

5 (P12V_CP) >75%1 (GND) 50%~75%2 (Signal) >75%

3 (Signal) >75%

4 (GND) 50%~75%

3 (Signal) >75%

4 (Signal) >75%

Incomplete wave solder barrel fill across most components on the pins

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved. 11/2/2011© 2010 Brocade Communications Systems, Inc. CONFIDENTIAL—For Internal Use Only 28

Incomplete wave solder barrel fill across most components on the pins connected to ground planesRef: S. Gopalkumar et al. (Brocade, Foxconn and BTC), SMTAI 2010

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Results of Lead-free Wave Process Optimization

Flux optimization Board redesign Preheat optimization Improved holefill with combination of above factors especially board

redesign

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

redesign Ref: S. Gopalkumar et al.(Brocade, Foxconn and BTC),SMTAI 2010

11/2/2011© 2010 Brocade Communications Systems, Inc. 29

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Lead-free Wave Soldering Confirmation Run Results

Cross-section results showed good barrel fill with no significant di l ti (C thi k >0 5 il [12 ])copper dissolution (Cu thickness>0.5 mils [12 um])

44 m

56 m

40 m 39 m 50 m40 mDCC

Ref: S. Gopalkumar et al.(Brocade, Foxconn and BTC),SMTAI 2010

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved. 11/2/2011© 2010 Brocade Communications Systems, Inc. CONFIDENTIAL 30

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Current Rework Alloys and Issues Transitioning to Low Ag Lead-free Rework Alloys

Rework Alloys: Sn3-4Ag0.5Cu, Sn3.5Ag, Sn0.7Cu based alloysHand soldering:Sn0.7Cu based alloys (lower cost)Potentially higher soldering iron tip temperatures especially for

thicker more thermally demanding boardthicker more thermally demanding boardBGA/CSP reworkSn0 7Cu based alloys (lower cost)Sn0.7Cu based alloys (lower cost)Higher board and component temperaturesMini-pot/solder fountain: Good holefill/ low copper dissolution p ppSn0.7Cu+Ni Sn0.7Cu0.3Ag0.03Ni(JEITA alloy)

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

Higher board and component temperatures

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Rework Flux Trends

Hand-soldering– Tacky flux versus liquid flux versus cored wire – General trend to cored wire or tacky flux– Hand soldering heat activation questions with use of liquid

flux and tacky fluxflux and tacky flux

BGA/CSP reworkBGA/CSP rework– Solder paste (typically for larger BGA) or tacky flux (CSP)

Mini-pot/ solder fountain– Liquid flux or tacky flux

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

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Example of Lead-free Wave Rework Evaluation

125 mils (3.2mm) thick board, 18 layers, 11 oz total copper OSP Board surface finish (High temperature rated) Component types used for rework- RJ45, LED & DCC RJ45 connector and LED connector low/medium complexity RJ45 connector and LED connector– low/medium complexity DCC component – high complexity Board size- 16 inch x 11inch, High Tg FR4 laminate (175ºC) 1st pass wave soldering with Sn3Ag0.5Cu using wave pot temperature of 270ºC.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

p g g g p p Rework with Sn0.7Cu0.05Ni alloy with solder fountain pot temperature of 270ºC.

Ref: S. Gopalkumar et al. (Brocade, Foxconn and BTC), SMTAI 2011

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Effect of Reduced Preheat Temperature on Holefill during Lead-free PTH Rework

Reduction of topside board temperature below 80ºC on DCC component Reduction of topside board temperature below 80 C on DCC component resulted in reduced hole fill (40%) for component that did not meet IPC610 standard requirements.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved. 3

Ref: S. Gopalkumar et al. (Brocade, Foxconn and BTC), SMTAI 2011

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DCC Component Lead-free Wave Rework Results with increased topside board preheat

35

X-ray image and cross-section of reworked DCC component showing good holefill (100%) and minimum copper knee barrel thickness of 18um (>12 um criteria).

Increased topside board preheat (>80ºC)

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.

Ref: S. Gopalkumar et al. (Brocade, Foxconn and BTC), SMTAI 2011

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Affect of Lead-free and Tin-Lead Soldering on In-Circuit Test (ICT)

• Potential issues with probing of lead-free no-clean flux residue– Chisel versus crown probe tips: p p

• Chisel tips have better flux residue probing • Limits on amount of probe force used

Ai Nit fl t h– Air versus Nitrogen reflow atmosphere: • Nitrogen atmosphere may make flux residue more probeable

– Time after assembly before ICT probe testing:Time after assembly before ICT probe testing:• Flux residue hardening over time

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Affect of Lead-free and Tin-Lead on Board Surface Finish during In-Circuit Test (ICT)

• Potential issues with board surface finishes used (e.g. OSP, Sn)– Lead-free paste spread during reflow on OSP test pads and p p g p

vias (Non-uniform solder spreading affecting ICT probing)– Unprinted test vias: exposed/oxidized OSP pads affecting ICT

biprobing. – Aged tin coated board surface finish (board surface finish

consumed as Copper-Tin Intermetallic compound)consumed as Copper Tin Intermetallic compound)• Difficult to solder to and rework and potentially difficult to probe test vias

and test pads

CHALLENGING NEW TECHNOLOGIES

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Conclusions38

• With the movement from Wave to SMT and increasing component miniaturization, many new components are emerging which need to be assembledemerging which need to be assembled.

• PoP component assembly requires optimized print, placement and reflow processes and optimized soldering materials in p p gassembly.

• QFN/BTC/MLF components need more optimization of solder t l d it d d ld i t i l t dpaste volume deposited and soldering materials to reduce

voiding in addition to more standardized component designs and rework processes.p

• Fine pitch CSP (0.3mm) and 01005 chip components need developments in paste printing techniques and stencil designs.

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• Board pad and stencil design play a critical role in successful assembly of these component types.

Page 39: A review of the challenges and development of SMT Wave and ... · SMTA LA/OC Expo, Long Beach, CA, USA A review of the challenges and development of SMT Wave and Rework assembly processes

Conclusions (cont.)39

• For lead-free wave soldering, optimization needed for board preheat, flux spray coverage and board design for good holefillon thicker boardson thicker boards.

• For lead-free wave rework soldering, board preheat and lead-free alloy optimization are needed for good holefill and reduced y p gcopper knee dissolution.

• Work on component board design, stencil apertures, solder materials, printer, placement, reflow, wave, rework and inspection/ test equipment all pay a role in successfulinspection/ test equipment all pay a role in successful assembly.

CHALLENGING NEW TECHNOLOGIES

Copyright (C) 2009 Koki Company Limited. All Rights Reserved.