A High-Level Tool for Bit-level SEU Sensitivity Analysis ... - Katkoori_Srinivas_mapld08_pres_1.pdfA...
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MAPLD 20081
A High-Level Tool for Bit-level SEU Sensitivity Analysis of DSP Filters
Andrew Mast, Jamie Montealegre, Luke Jenkins, and Srinivas Katkoori*
Computer Science and Engg.,University of South Florida, Tampa, FL
Andrew White and Cliff KimmerySpace Electronic Systems Div.,Honeywell Inc, Clearwater, FL
*Contact Author: [email protected]
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MAPLD 20082
OverviewOverview
• Motivation• Problem Formulation• Proposed Approach• Implementation• Experimental Results• Conclusions and Future Work
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MAPLD 20083
Space Electronic Systems Space Electronic Systems –– Radiation Radiation EffectsEffects
• Space Electronic Systems– Radiation effects can be fatal to the mission
• System hardening by redundancy– Triple Modular Redundancy (TMR)
• Spatial TMR incurs 200% area overhead• Temporal TMR incurs 200% performance overhead
• Redundancy is too costly!!– Can we do better?– Can we exploit the function properties?
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MAPLD 20084
Single Event Upset (SEU)Single Event Upset (SEU)• A momentary flip in a bit value due to radiation• If latched can become permanent
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MAPLD 20085
• DSP Filters widely used in space missions widely– noise removal– tuning to frequency ranges of interest – signal extraction, etc
• Representation– Data Flow Graph
• Filter characteristics– Frequency Response– Normalized (typically)
Digital Signal Processing (DSP) FiltersDigital Signal Processing (DSP) Filters
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MAPLD 20086
Problem FormulationProblem FormulationGiven a DSP Filter, identify the SEU sensitive
nodes of the Filter- Such sensitive nodes can then be hardened
SEU Sensitivity Analysis Tool(This Work)
SEU Sensitivity Analysis Tool(This Work)
List of SEUSensitive
DFG Edges
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MAPLD 20087
Scope of this workScope of this work
• Functionality: Limited to DSP FIR Filters• Radiation Effects: Single Event Upsets• Target Architecture: None
• Early analysis tool
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MAPLD 20088
Step 1: Examine the effects of an SEU on a filter.
Step 2: Compare these effects with normal filter behavior.
Proposed ApproachProposed Approach
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MAPLD 20089
Step 2: Compare these effects with normal filter behavior.
• How do we compare behavior?
Step 1: Examine the effects of an SEU on a filter.• How do we…
• Represent a filter?• Model an SEU on a filter?• Examine the effects of an SEU on a filter?
Proposed ApproachProposed Approach
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MAPLD 200810
• Represent a filter with a data flow graph.
X(n) h(n)
y(n)
X(n‐1) h(n‐1)
Step 1: SEU Effect on DSP FilterStep 1: SEU Effect on DSP Filter
• Model an SEU by flipping edge bit values.
5 2
88
8 1
11 8
4’b - 10104’b - 1011
BinaryAn SEU occurred on the LSB of this edge
80
10
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MAPLD 200811
• Compare filter behavior by using root mean square error on amplitude responses.
Frequency
Gain
Amplitude ResponsesA Filter affected by an SEU
A Normal Filter
Step 2: Comparing Frequency ResponseStep 2: Comparing Frequency Response
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MAPLD 200812
FIR FILTERSEU On Edge/BitFIR FILTER
SEU On Edge/Bit
InputPure TonesInput
Pure Tones
FFT OutputFFT Output
Fourier Transform
Analyzing a DSP Filter with an SEUAnalyzing a DSP Filter with an SEU
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MAPLD 200813
SEU Analyze(Filter, Frequency Range)beginNormal_Response = FrequencyResponse(Filter, FrequencyRange);foreach edge in the DFGforeach bit in the edgeSetSEU(edge,bit)SEU_Response = FrequencyResponse(Filter, edge, bit, Frequency Range)SensitivityList[edge, bit] =
CompareFrequencyResponses(Normal_Response, SEU_Response)ClearSEU(edge,bit)end foreachend foreachreturn SensitivityListend algorithm
SEU Sensitivity AnalysisSEU Sensitivity Analysis
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MAPLD 200814
• “Simulating” A Filter with a DFG• AIF File• Coefficient File• Sine Wave Generation• Generate the frequency response and compare the result with Matlab’s Filter Designer Tool
Software FunctionsSoftware Functions
• SEU Function• Store edge values as an integer variable• Add or subtract 2^k from edge value.
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MAPLD 200815
• Introduces an SEU on a given bit of a given edge– Example of concept: edge = 3; bit = 2;
• Current value of edge = 0101• Shift • 0001• Check if LSB is even or odd• Flip the bit by adding or subtracting 2bit to original value
SEU FunctionSEU Function
// SEU functionm = EdgeValue / (int)2bit;if (m % 2 == 0) //If m is even
EdgeValue = EdgeValue + (int)2bit;else //else m is odd
EdgeValue = EdgeValue - (int)2bit;//Reset edge and bit to nulledge = null;bit = null;
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MAPLD 200816
Software ImplementationSoftware Implementation
• Created a Java based program that reads in:– .aif files describing the DFG Structure– .txt files containing coefficient list
• Resources:– Michael Thomas Flanagan's FFT Java Scientific Library**
– Non-Commercial use only! – We recommend JMSL Numeric Library for commercial operation.
– Java.Math Library
• Program outputs a text file containing:– Amplitude Response– RMSE values
**Flanagan, Michael T. "Michael Thomas Flanagan's Java Library." Fourier Transforms. 18 Feb. 2006. University College London. 28 Mar. 2008 http://www.ee.ucl.ac.uk/~mflanaga/java/FourierTransform.html.
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MAPLD 200817
Experimental ValidationFilter Type Low Range Medium Range High RangeBand Pass 10 – 20 KHz 100 – 200 KHz 1 – 2 MHzHigh Pass 10 KHz 100 KHz 1 MHzLow Pass 10 KHz 100 KHz 1 MHz
Low pass test #1. Pass-band from 0 to 0.2
Low pass test #2Pass-band from 0 to 0.3
Low pass test #3. Pass-band from 0 to 0.7
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MAPLD 200818
Effect of an SEU on Amplitude Response
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MAPLD 200819
3D Error Plots 3D Error Plots %
Erro
r
Primary Inputs…… Intermediate…… Primary OutputsDFG Edges LSB……MSB
Bits
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MAPLD 200820
Test Results: Low Pass FilterTest Results: Low Pass Filter
Low Frequency Medium Frequency
High Frequency
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MAPLD 200821
Test Results: High Pass FilterTest Results: High Pass Filter
Low Frequency Medium Frequency
High Frequency
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MAPLD 200822
Low Frequency Medium Frequency
Test Results: Band Pass FilterTest Results: Band Pass Filter
High Frequency
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MAPLD 200823
RMSE vs. Overhead RMSE vs. Overhead RMSE vs. Triple Modular Redundancy
Highpass Filter, Total Edges (483)
RMSE ≤ 1 ≤ 2 ≤ 5 ≤ 10 ≤ 15 ≤ 20# of Edges to Protect 418 359 242 97 25 0Redundancy % 173% 149% 100% 40% 10% 0%
• 200% Redundancy is unnecessary for our test filters.• High RMSE values can still result in acceptable filter
behavior.
0%
50%
100%
150%
200%
0 5 10 15 20 25
RMSE
% O
verh
ead
% Redundancy
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MAPLD 200824
SEU Analysis Tool SEU Analysis Tool –– Implementation Implementation SummarySummary• Automatic Filter Simulation Software that simulates a DSP
filter via a DFG.– Accept a data flow graph representation of DSP filter as input in AUDI
Intermediate Format (AIF).– Provide correct output based on the test vector and filter in a format
defined by the team.• Automatic Response Extraction Effects of SEU on Filters
Performance• Extensibility The software will be designed to be extensible by
creating separate modules for input, simulation, and SEU sensitivity analysis.
• Extensive Documentation - Users and Developers.– User documentation should include instructions on how to input the DFG,
run the program, and interpret the output.– Developer documentation should include a list of classes and a description
of their methods and properties, as well as an explanation on how and why they were designed.
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MAPLD 200825
ConclusionsConclusions
For DSP FIR Filters, full TMR may not necessaryOverhead due to redundancy is a function of
error tolerance on Filter Performance
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MAPLD 200826
Future WorkFuture Work
• Program Extension– Explore response comparison methods
• Characteristic Comparison• Weighted
– Phase Response
• Test on different Filter forms– Are some DSP Filter structures are better than others?
• Batch support
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MAPLD 200827
ReferencesReferences
• S. Katkoori Tutorial on AUtomatic Design Instantiation (AUDI) A Behaviroal Synthesis System. WWW Document,http://www.csee.usf.edu/~ljjenkin/newPage/background/audi_tutorial.pdf.
• P. K. Samudrala, J. Ramos, and S. Katkoori. Selective Triple Modular Redundancy (STMR) Based Single-Event Upset (SEU) Tolerant Synthesis for FPGAs. WWW Document, http://www.csee.usf.edu/~ljjenkin/newPage/background/01344451.pdf.
• K. A. LaBel. SEECA.: Single Event Effect Criticality Analysis. WWW Document, http://radhome.gsfc.nasa.gov/radhome/papers/seecai.htm.
• B. James, P. Patel, M. Shahabuddin, K. D. Smith, and J. Wall. "Chapter Four: Design for Radiation Tolerance." The NASA ASIC Guide. 1993. NASA. Jan. 2008 http://parts.jpl.nasa.gov/asic/Sect.3.4.html.