A Discrete Event Systems Approach to Failure Diagnosis ...Stéphane Lafortune, Dept. of EECS Meera...

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Eleventh International Workshop on Principles of Diagnosis 2000/06/08 1 Meera Sampath, Wilson Center for Research & Technology Stéphane Lafortune, Dept. of EECS A Discrete Event Systems Approach to Failure Diagnosis: Theory & Applications Stéphane Lafortune Department of EECS, University of Michigan & Meera Sampath Joseph C.Wilson Center for Research & Technology Xerox Corporation DX-00 -Eleventh International Workshop on Principles of Diagnosis 2000/06/08

Transcript of A Discrete Event Systems Approach to Failure Diagnosis ...Stéphane Lafortune, Dept. of EECS Meera...

Page 1: A Discrete Event Systems Approach to Failure Diagnosis ...Stéphane Lafortune, Dept. of EECS Meera Sampath, Wilson Center for Research & Technology PON PON POFF POFF P1 P2 PUMP FON

Eleventh International Workshop on Principles of Diagnosis2000/06/08

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

A Discrete Event Systems Approach to Failure Diagnosis:

Theory & Applications

Stéphane LafortuneDepartment of EECS, University of Michigan

&Meera Sampath

Joseph C.Wilson Center for Research & TechnologyXerox Corporation

DX-00 -Eleventh International Workshop on Principles of Diagnosis2000/06/08

Page 2: A Discrete Event Systems Approach to Failure Diagnosis ...Stéphane Lafortune, Dept. of EECS Meera Sampath, Wilson Center for Research & Technology PON PON POFF POFF P1 P2 PUMP FON

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Diagnostics in the Industrial World

• The Three C’s: Cost, Computation, and Customer Satisfaction

- Downtime is unproductive and undesirable. - Service is costly and competitive.

• Safety• Health Regulations

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Requirements for Industrial Systems

• Diagnostic engine must be easy to develop.

• Diagnostic engine must be simple to implement.

• Diagnosis must be achieved with minimal, cost-effective set of sensors.

• Diagnosis may need to be achieved with decentralized information

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

The “Academic” Viewpoint

Automated Diagnostic Methodologies that:

• Are formal and model-based• Are applicable to dynamic systems• Allow analysis of diagnosability properties• Are “easy” to implement• Are extensible and versatile

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

The “DES” Diagnostic Methodology

• Modeling: languages and automata

• Dynamic tracking and state-based inferencing: Diagnosers

• Ability to incorporate sensor information from multiple sources: real and virtual sensors

• Automated design of diagnostic inference engine

• Simple on-line implementation

DES: Discrete-Event Systems

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Conceptual View for Automated Systems

SYSTEM

SYSTEM SENSORSSYSTEM CONTROLLERS

INTERFACE

REAL-TIME CONTROL DIAGNOSTICS FAILURE RECOVERY

SUPERVISORY CONTROLLER

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Implementation

SYSTEM

SYSTEM SENSORSSYSTEM CONTROLLERS

EVENT GENERATOR

REAL-TIME CONTROL DES DIAGNOSER FAILURE RECOVERY

SUPERVISORY CONTROLLER

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Motivating Example 1:Heating, Ventilation, and Air Conditioning Systems

• Components hard to access, few sensors

• Valve, pump, controller faults, etc.

• Sinnamohideen,Sampath et al., JCI

Courtesy, Johnson Controls, Inc.

Variable Air-Volume Controller

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Motivating Example 2:Document Processing Systems

• Complex processes, few sensors

• Electro-mechanical and image quality faults

• Sampath et al., Xerox Corp.

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Motivating Example 3:Automated Highway Systems (AHS)

• Platoons of vehicles

• Transmitterand receiverfaults

• Sengupta et al., PATH, UC-Berkeley

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Contents of Presentation• “Basic” theory

– Notion of diagnosability – Model construction – Diagnosers: synthesis and analysis

• Industrial applications– “Hybrid” techniques for Document Processing

Systems• Decentralized architectures

– Coordinated architectures– Performance – Complexity tradeoff

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Diagnosability: The Premise

• Event-based model: traces of events

• Language: set of traces of events

• Fault or failure events: unobservable

• Partition failures into types

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Diagnosability: Intuitive Statement

A language (i.e., DES) is diagnosable with respect to a partition of the failure events and with respect to a set of observable events if

it is possible to detect occurrences of any type of failure with finite delay, based on

observed event sequences only

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

s

fi

t

• trace s ends with unobservable failure event fi• trace t is a sufficiently long continuation of trace s

• “any trace of the system that looks like st must contain a failure event of same type as fi”

• multiple failures may occur

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Definition of Diagnosability

A prefix-closed and live language L is said to be diagnosable with respect to the projection P and with respect to the partition Πf on Εf if the following holds:( ∀ i ∈ Π f ) ( ∃ ni ∈ Ν) ( ∀ s ∈ Ψ(Ε fi) )

( ∀ t ∈ L/s) [ || t || ≥ ni ⇒ D ]

where the diagnosability condition D is: ω ∈ PL

-1 [P(st)] ⇒ Ε fi ∈ ω .

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Explanation of Notation

• Projection P : “erases” unobservable events

P( o1 uo1 uo2 o2 uo3 o3 ) = o1 o2 o3

• Inverse Projection PL-1 :

PL-1 (y) = { s ∈ L : P(s) = y }

• Traces ending in failure of type i :

Ψ(Εfi) = { sa ∈ L : a ∈ Ε fi }

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Diagnosability: Illustrative Example

b fa

fc

fb

uo c

d

• If F1 = {fa}, F2 = {fb}, and F3 = {fc}, then not diagnosable

• If F1 = {fa, fb} and F2 = {fc}, then diagnosable

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Why a Formal Notion of Diagnosability?

! Analysis:

! Is this DES diagnosable?

! Design:

! What sensors to use

! How to use them

! What changes to make to the system

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Steps in the DES Approach

Fault SymptomTables

ComponentModels

DiagnoserSystemModel Diagnoser

Diagnostic Requirements

Test Sequence/Controller Model

Step 1: Build Discrete Event Model of SystemStep 1: Build Discrete Event Model of System Step 2: Build Diagnoser

Analysis: Is it Diagnosable?

Design: How to Diagnose?

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Building Discrete-Event Model of System

• Use automata (or state machines) as basic building blocks to model components

• Obtain the parallel composition of components

• Incorporate the sensor information in the event set

• Obtain the complete model as an automaton

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OPEN_VALVE, CLOSE_VALVE

CLOSE_VALVE

STOP_PUMP

SC

VC

C1 C3

C4

C2

POFF PON

VO

SO

OPEN_VALVE, CLOSE_VALVE

OPEN_VALVE

OPEN_VALVE

OPEN_VALVE

CLOSE_VALVE

CLOSE_VALVE

START_PUMP

START_PUMP

START_PUMP

STOP_PUMP

STOP_PUMP

STUCK_OPEN

STUCK_CLOSED

Simple Pump-Valve-Controller Example

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

The Global Sensor Map

STATES SENSOR MAP 1-6, 10-12: (POFF, -, -) NP, NF 7: (PON, VO,C3) PP, F 8: (PON, SO,C3) PP, F 9: (PON, SC,C3) PP, NF

Flow Sensor (NF/F)

Pump Pressure Sensor (NP/P)

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3

6

SC

SC

<OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF>

<STOP_PUMP,NP,NF>

9

12

SC

SC <START_PUMP,PP,F>

1 2

4 5

S0

S0

<OPEN_VALVE, NP,NF><OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF>

7 8

10 11

S0

S0

<START_PUMP,PP,F>

<START_PUMP,PP,F>

<STOP_PUMP,NP,NF>

<STOP_PUMP,NP,NF>

< F -> NF >

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

The Event Set of the Composite Model

• Observable events:– Commands issued by controller (with sensor

readings)– Changes in sensor readings– “Generalized events”: changes in virtual sensor

readings, test outcomes, etc.• Unobservable events:

– Failures of components, controllers, sensors– Changes in system state not recorded by sensors

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

(Part of) HVAC System

FAN

PUMP

BOILER CONTROLLER

VALVE

HTG. COIL

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PON

PON

POFF

POFF P1 P2

PUMP

FON

FONFOFF

FOFF

F1 F2

FAN

L1 L2

FOFF FOFF

SPD

LOADL0

SPD SPISPI

OV

OV

CV

CV V1 V2

VALVE

V3

V4

CV, OV

CV, OV

SO1

SC1

S02

SC2

BON

BONBOFF

BOFF

B1 B2

BOILER

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C11 C12

C13 C14 C15 C16

C17C18C19C20

C21 C22

C23

C24

C1 C2 C3 C4 C5 C6

C7C8C9C10

FOFF

FONSPD

SPDSPI

SPIFOFFCFOFF

FON SPI

SPISPDFOFF SPD

SPI

CFON

FON

BOFF POFF CV

SPD

OV PON BON

SPISPD

OV PON BON

OV PON BON

CONTROLLER

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Steps in the DES Approach

Fault SymptomTables

ComponentModels

DiagnoserSystemModel Diagnoser

Diagnostic Requirements

Test Sequence/Controller Model

Step 1: Build Discrete Event Model of System Step 2: BuildStep 2: Build DiagnoserDiagnoser

Analysis: Is it Diagnosable?

Design: How to Diagnose?

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Tool for Analysis and On-line Diagnosis

!Let the composite model generate language L

!Pick any automaton G that generates L

!The diagnoser Gd is an automaton built from G

!Think of Gd as a “refined” observer:

! Gd carries state estimates

! Gd carries failure labels

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Illustrative Example: Gd1 N

4 N 5 F2 6 F1

7 N 8 F2

10 N 11 F2

1 N 2 F2 3 F1

9 F1

12 F1

3 F1

6 F1

<OPEN_VALVE, NP,NF>

<OPEN_VALVE, NP,NF>

<OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF> <CLOSE_VALVE, NP,NF>

<START_PUMP,PP,F>

<START_PUMP,PP,NF>

<START_PUMP,PP,NF>

<STOP_PUMP,NP,NF> <STOP_PUMP,NP,NF>

< F -> NF >

F1: SC

F2: SO

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3

6

SC

SC

<OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF>

<STOP_PUMP,NP,NF>

9

12

SC

SC <START_PUMP,PP,F>

1 2

4 5

S0

S0

<OPEN_VALVE, NP,NF><OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF>

7 8

10 11

S0

S0

<START_PUMP,PP,F>

<START_PUMP,PP,F>

<STOP_PUMP,NP,NF>

<STOP_PUMP,NP,NF>

< F -> NF >

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Construction of the Diagnoser

• States are of the form: {(x1,l1), …, (xn, ln)}

• xi are states of system G

• li are labels: N or subsets of {F1 ,…, Fn}

• Transitions are due to observable events only

• Update of state estimates: similar to conversion of nondeterministic automaton to deterministic one

• Failure labels are propagated and updated by failures encountered along unobservable subtraces

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

State Transition Function of Diagnoser

7 N 8 F2

10 N 11 F2

9 F1<STOP_PUMP,NP,NF>

< F -> NF >

7 8 9

10 11

S0

S0

SC

<STOP_PUMP,NP,NF><STOP_PUMP,NP,NF>

< F -> NF >F1: SC

F2: SO

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Diagnoser Gd

1 N

4 N 5 F2 6 F1

7 N 8 F2

10 N 11 F2

1 N 2 F2 3 F1

9 F1

12 F1

3 F1

6 F1

<OPEN_VALVE, NP,NF>

<OPEN_VALVE, NP,NF>

<OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF> <CLOSE_VALVE, NP,NF>

<START_PUMP,PP,F>

<START_PUMP,PP,NF>

<START_PUMP,PP,NF>

<STOP_PUMP,NP,NF> <STOP_PUMP,NP,NF>

< F -> NF >

F1: SC

F2: SO

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Information in Diagnoser States

28N 29F1 30F2 49F3 50F1F3 51F1F2 88F4 89F1F4 90F2F4

52F3 53F1F3 54F2F3

Uncertain for:

F1, F2, F3, F4

Uncertain for: F1, F2

Certain for F3

(from HVAC example)

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

What Should We Worry About?1 N

9 F1

12 F1

3 F1

6 F1

<OPEN_VALVE, NP,NF>

<OPEN_VALVE, NP,NF>

<OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF> <CLOSE_VALVE, NP,NF>

<START_PUMP,PP,NF>

<START_PUMP,PP,NF>4 N 5 F2 6 F1

7 N 8 F2

10 N 11 F2

1 N 2 F2 3 F1

<START_PUMP,PP,F>

<STOP_PUMP,NP,NF> <STOP_PUMP,NP,NF>

< F -> NF >

F1: SC

F2: SO

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Formal Result

• The language L is diagnosable iff the diagnoser Gd does not contain any indeterminate cycles

• Indeterminate cycles in Gd are cycles of uncertain states that have corresponding cycles in G involving their failed states

• This necessary and sufficient condition is implementable (polynomial complexity)

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Example of Indeterminate Cycle

4 N 5 F2 6 F1

7 N 8 F2

10 N 11 F2

1 N 2 F2 3 F1

<START_PUMP,PP,F>

<STOP_PUMP,NP,NF>

<OPEN_VALVE, NP,NF><CLOSE_VALVE, NP,NF>

1 2

4 5

S0

S0

<OPEN_VALVE, NP,NF>

<OPEN_VALVE, NP,NF>

<CLOSE_VALVE, NP,NF>

7 8

10 11

S0

S0

<START_PUMP,PP,F>

<START_PUMP,PP,F>

<STOP_PUMP,NP,NF>

<STOP_PUMP,NP,NF>

<CLOSE_VALVE, NP,NF>

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

The Notion of Indeterminate Cycle

• Intuition: An indeterminate cycle corresponds to the situation where there are two traces in L, of arbitrary long length, that have the same observable projection, and where

" one trace contains a failure event of a certain type

" the other trace does not

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

The Notion of Indeterminate Cycle

• Formally: An Fi-indeterminate cycle in Gd is a cycle of Fi-uncertain states for which there exists:

" a corresponding cycle (of observable events) in G involving only states that carry Fi in their labels in the cycle in Gd

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Not all Uncertain Cycles are Indeterminate!

fbgdbgt

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Steps in the DES Approach

Fault SymptomTables

ComponentModels

DiagnoserSystemModel Diagnoser

Diagnostic Requirements

Test Sequence/Controller Model

Step 1: Build Discrete Event Model of System Step 2: BuildStep 2: Build DiagnoserDiagnoser

Analysis: Analysis: Is it Diagnosable?Is it Diagnosable?

Design: How to Diagnose?

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

On-Line Diagnosis Using Diagnosers• Store transition function of diagnoser• Update state after each observable event• Report failure status based on labels in state• Formal Result:

• If a given system (language) is diagnosable, then the diagnoser detects occurrences of failure events of any type in a bounded number of events after the occurrence of the failure event

• “Detects” h Enters a Certain State

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Steps in the DES Approach:Case of “On-the-Fly” Computations

Fault SymptomTables

ComponentModels

Test Sequence/Controller Model Diagnoser

On-the-fly calculationof diagnoser state

Diagnostic Requirements

Diagnostic decisionDiagnostic decision

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

On-Line Diagnosis Using Diagnosers:Case of “On-the-Fly” Computations

• Store component models and sensor tables• Calculate current diagnoser state after each

observable event:• Using component models and sensor

tables, build current state of system plus some limited lookahead (until next observable event)

• Build current diagnoser state

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

How to Achieve Diagnosability?

Fault SymptomTables

ComponentModels

DiagnoserSystemModel Diagnoser

Diagnostic Requirements

Test Sequence/Controller Model

Step 1: Build Discrete Event Model of System Step 2: Build Diagnoser

Analysis: Analysis: Is it Diagnosable?Is it Diagnosable?

Design:Design:How to make systemHow to make system

diagnosable?diagnosable?

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

How to Make System Diagnosable?

• Select new set of sensors (i.e., observable events), and repeat process of building and testing diagnoser

• Problem of optimal sensor selection:– Given set A of available sensors, select minimum-

cost subset of A for which system is diagnosable" Need efficient testing strategy" See Debouk et al., CDC 99

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

How to Make System Diagnosable?

• Integrate supervisory control and failure diagnosis:• Design a control protocol that makes system

diagnosable and that achieves control objectives

• Different control protocols lead to different diagnosability properties!

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

OPEN_VALVE, CLOSE_VALVE

CLOSE_VALVE

STOP_PUMP

SC

VC

C1 C3

C4

C2

POFF PON

VO

SO

OPEN_VALVE, CLOSE_VALVE

OPEN_VALVE

OPEN_VALVE

OPEN_VALVE

CLOSE_VALVE

CLOSE_VALVE

START_PUMP

START_PUMP

START_PUMP

STOP_PUMP

STOP_PUMP

STUCK_OPEN

STUCK_CLOSED

Modified Pump-Valve-Controller Example

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Active Diagnosis Problem

• Need results from supervisory control theory• See Sampath et al., CDC 97 and TAC 98

System

Controller

P

Observable events

Controllableevents

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

How to Make System Diagnosable?

• Do more “intelligent” processing of available information, using complementary diagnostic techniques" Concept of virtual sensor

Sampath et al., Xerox Corp.

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Contents of Presentation• “Basic” theory

– Notion of diagnosability – Model construction – Diagnosers: synthesis and analysis

• Industrial applications– “Hybrid” techniques for Document Processing

Systems• Decentralized architectures

– Coordinated architectures– Performance – Complexity tradeoff

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Industrial Applications: Hybrid Techniques for Document Processing Systems

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Requirements for Industrial Systems

• Diagnostic engine must be easy to develop.

• Diagnostic engine must be simple to implement.

• Diagnosis must be achieved with minimal, cost-effective set of sensors.

• Diagnosis may need to be achieved with decentralized information

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

A Hybrid Approach to Failure Diagnosis

SYSTEM

VIRTUAL SENSORSSYSTEM SENSORSSYSTEM CONTROLLER(S)

EVENT GENERATOR

FAILURE OUTPUTDIAGNOSTIC INFERENCE ENGINE

Qualitative Model based Diagnostic Engine +

Quantitative Analysis based “Virtual Sensors”

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Virtual Sensor Examples• Signal Processing

Signature Analysis, Spectrum Analysis, Vibration Analysis

• Statistical Analysis Means, Variance, Whiteness, Clustering

• State Estimation TechniquesKalman Filter

• Qualitative Techniques Qualitative Calculas, Constraint Propagation

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Other Hybrid Approaches to Diagnosis

• Passino & Antsaklis - Expert Systems & FDI Schemes (1988) • Frank, P.M. - Expert Systems & FDI Schemes (1990)• Pomeroy et. al. - Model based Diagnosis & FDI Schemes

(1990)• McIlraith et al. - Model based Diagnosis & Parameter

Estimation (1999)• Zhao et. al - Model based Diagnosis & Signal Processing

(2000)

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Two Examples from the Document Processing Industry

• Embedded Diagnostics of the Paper Feeder System in a Digital Copier

- Signature Analysis based Virtual Sensor

• A System for Automated Diagnosis of Image Quality Problems

- Image Processing based Virtual Sensor

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Application 1: Real Time Diagnosis of the Paper Feeder System in a Digital Copier

The Xerox Document Center DC265

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

The DC265 Paper Feeder System ComponentsPaper Trays Feed Roll CartridgeWait Station Sensor Stack Height Sensor Drives Plate - Feed & Elevator Motors, Nudger Solenoid,

Paper Size Sensors

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

DIGITAL DATA STREAM

EVENT GENERATOR

ANALOG DATA STREAM

FEATURE EXTRACTION

DISCRIMINANT ANALYSIS

DIAGNOSER LOCAL UI REMOTE UI

Cluster 2

Event 1: Feed_Motor_OnEvent 5: Stack Ht. Counter Low

Broken Feed Roll Cartridge

FAILURE

Failure 2

Paper Feeder Diagnostic System

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

• Drives Plate ground current is a “good” diagnostic indicator• Feature extraction based analysis computationally less expensive• Choice of Features for Paper Feeder Assembly:

- Peak Current - Power Spectral amplitudes

• Feature Extraction followed by Statistical Discriminant Analysis• Choice of Classifiers:

- Linear Classifiers- Quadratic classifiers

Signature Analysis & Feature Extraction based Virtual Sensor

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Discriminant Analysis -Sample Results

iiSi;iMiXiSimxiSimxxid

Cluster of CovarianceCluster of MeannObservatio Sample

ClassifierQuadratic −−−

+−−−= ;

ln)()1(')()(2:

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

DIAGNOSER DESIGN

Fault SymptomTables

ComponentModels

DiagnoserSystemModel Diagnoser

DiagnosticRequirements

Test Sequence/Controller Model

Step 2: Build Diagnoser

Analysis: Is it Diagnosable?

Design: How to Diagnose?

Step 1: Build Discrete Event Model of System

SENSOR MAPS & VIRTUAL SENSOR OUTPUTS

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

(Part of The) Diagnoser for the Paper Feeder System

N F1 F2 F3 F4 F5 F6

Feed Motor OnN F1 F2 F3 F4 F5 F6

Solenoid OnN F1 F2 F3 F4 F5 F6

Feed Motor Off, Wait Sensor Low

F1 F2 F3 F4 F6Peak Current High

F1 F3 F6Stack Height Counter High

F1 F6

Start Feed CycleF1 - Out Of Paper

F2 - Stalled Feed Motor

F3- Stalled Elev Motor

F4 - Broken Solenoid

F5 - Degraded Solenoid

F6 - Broken Feed CRU

CONTROL/SENSOR

DATA

VIRTUALSENSOR

DATA

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Experimental Setup

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Diagnostic System Output

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Key Concepts Addressed

• Real-Time Embedded Diagnosis • Diagnosis with Minimal Sensor Requirements• Component/FRU/CRU Level Diagnosis• Predictive Diagnosis• Customer Repair• Remote Notification

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Application 2: Automated Image Quality Diagnostics System

• An automated diagnostic system to resolve IQ related problems in printing systems

• A tool for the customer

• Designed to diagnose machine failures resulting in common IQ problems such as Banding, Mottle, Spots, etc.

• IQ Defect Diagnosis non-trivial due to many-one failure mapping

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Image Quality Diagnostics System

Scanner Interface

User Interface

Repair PlanningDiagnostic Inference Engine

Machine Interface

Xerographic Tests

IQ Defect Analysis

Event Generator

This is a test pattern

Feature Extraction

Test Pattern

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Image Quality Diagnostics System

• Image Processing based Virtual Sensor

• The IQAF tool suite for Image Quality Analysis developed at the Wilson Center for Research at Xerox

• Techniques include Filtering, Transformations, FFTs, Statistical Analysis

• “On-Demand” Virtual Sensors

• Integrated DES / Bayesian Analysis based diagnostic engine

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Image Quality Diagnostics-Prototype System

• Prototype System on the Xerox DC265 with UMax Scanner• Image Quality Defect - Bands & Streaks• 10 Failures - Xerographic Engine & Optics

- Degradation, Wear & Tear, Contamination

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Image Quality Defect Examples

A

B

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Image Quality Analysis OutputsScratched Photo Receptor

0

0.5

1

1.5

2

2.5

3

0 1000 2000 3000 4000 5000 6000

Xpro

file

Scratched Photo Receptor

-202468

1012141618

0 1000 2000 3000 4000 5000 6000

Visu

ally

Tra

nsfo

rmed

Dat

a

Failed Charge Corotron

-0.20

0.20.40.60.8

11.21.41.6

0 2000 4000 6000Vis

ua

lly T

ran

sfo

rme

d

Failed Charge Corotron

-2.00E-02

0.00E+00

2.00E-02

4.00E-02

6.00E-02

8.00E-02

1.00E-01

0 50 100 150 200 250

Am

plitu

de S

pect

rum

IQ Virtual Sensor Outputs: Defect Presence, Defect Orientation,Defect Polarity, Defect Spread, etc.

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(Part of the) Diagnostic Inference EngineN 0.04 F1 0.16 F2 0.04 F3 0.24 F4 0.16 F5 0.04 F6 0.04 F7 0.04 F8 0.24

N 0.04 F1 0.09 F2 0.04 F3 0.26 F4 0.17 F5 0.04 F6 0.04 F7 0.04 F8 0.26

Uniformity Test, Pass

Charge Test, Pass

N 0.05 F1 0.12 F2 0.03 F3 0.19 F4 0.12 F5 0.03 F6 0.05 F7 0.05 F8 0.33

N 0.00 F1 0.21 F2 0.00 F3 0.31 F4 0.21 F5 0.05 F6 0.09 F7 0.09 F8 0.01

Defect Presence, All Pages

Defect Type, Streak

N 0.04 F1 0.21 F2 0.00 F3 0.31 F4 0.21 F5 0.05 F6 0.09 F7 0.09 F8 0.01

Defect Spread, Uniform

N 0.04 F1 0.02 F2 0.00 F3 0.91 F4 0.02 F5 0.00 F6 0.01 F7 0.01 F8 0.00

F3 - Failed Charge Corotron

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Highlights of The Hybrid Diagnostic Scheme

• A unified framework to integrate a variety of diagnostic techniques

• Generalized notion of an event• A hybrid extension that retains the analytical

properties of the DES methodology• A diagnostic technique motivated by industrial

considerations

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Contents of Presentation• “Basic” theory

– Notion of diagnosability – Model construction – Diagnosers: synthesis and analysis

• Industrial applications– “Hybrid” techniques for Document Processing

Systems• Decentralized architectures

– Coordinated architectures– Performance – Complexity tradeoff

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Motivating Example 3:Automated Highway Systems (AHS)

• Platoons of vehicles

• Transmitterand receiverfaults

• Sengupta et al., PATH, UC-Berkeley

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

AHS: Platoon Communication

n 3 2 Lead

• Wireless LAN, TDMA, 20 msec, for velocity and acceleration data

• Separate (reliable) communication channel to exchange diagnostic information about LAN

• Model considered: leader and two followers

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

l: leader

fi: follower i

Partial system model

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Questions:

• Can the vehicles “jointly” diagnose the LAN faults, by sharing “some” information

• How to proceed? " Sengupta et al." Debouk et al.

Issue:• LAN faults cannot be diagnosed “individually” (namely, by running three independent diagnosers)

• A centralized diagnostic scheme is not practical

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Decentralized Diagnosis with Coordinator

SITE 2SITE 1

INTERFACE 1

DIAGNOSTICS

SUPERVISORY CONTROLLER 1

INTERFACE 2

DIAGNOSTICS

SUPERVISORY CONTROLLER 2

COORDINATOR FAILURE RECOVERY

Local Observations

Communications

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Key Ingredients

• Local processing for diagnostics• Communication rule• Decision rule at coordinator

We call these a PROTOCOL

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Diagnosability in this New Architecture

A language (i.e., DES) is diagnosable with respect to a protocol, a partition of the failure events, and sets of locally observable events if

under this protocol, the coordinator site can detect the occurrence of any type of failure

with finite delay

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Meera Sampath, Wilson Center for Research & TechnologyStéphane Lafortune, Dept. of EECS

Modified Definition of Diagnosability

A prefix-closed and live language L is said to be diagnosable with respect to the given protocol, the projections P1 and P2, and the partition Πf on Ef if the following holds:( ∀ i ∈ Π f ) ( ∃ ni ∈ Ν) ( ∀ s ∈ Ψ(Ε fi) )

( ∀ t ∈ L/s) [ || t || ≥ ni ⇒ C is Fi-certain ]

C: register holding diagnostic information at the coordinator site

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Key Assumptions

• System is diagnosable in a centralized set up• One site alone cannot diagnose all faults• Communication is reliable:

– Global ordering is preserved at the coordinator– No raw data is communicated– Communication may be interrupted

• Coordinator should be “simple”memory, processing, no system model

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Objective

• Design a set of protocols and analyze their “complexity – performance” tradeoff

• Compare their performance to the centralized diagnoser

The centralized scheme is the “only” one available for comparison purposes…

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Work Done So Far

Protocol 1

Protocol 2

Protocol 3

Perfo

rman

ce d

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ases

Perfo

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ases

Com

plex

ity in

crea

ses

Com

plex

ity in

crea

ses

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Brief Description of Protocol 3

• Diagnosers are used at local sites• Communicate nothing but failures detected

(Fi-certain)• Coordinator is “trivial”• Test to determine if protocol works

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Brief Description of Protocol 2

• Diagnosers are used at local sites• Communicate current diagnoser state to

coordinator– Communicate after each observable event– May interrupt communication

• Do simple “intersections” at coordinator

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Protocol 2: A Few More Details

• Communicate also:• status bit (common event or not)• the unobservable reach

• Coordinator only stores most recent messagefrom each site

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Protocol 2: Decision Rule:Upon Reception of Message R1 from Site 1

0R1 3 R211Decision Rule 5

1Wait10Decision Rule 3

0R1 3 R400Decision Rule 1

Status Bit

UpdateCoordinatorStatus Bit

Received

Current Status

BitRule

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Protocol 2: Decision Rule:Upon Reception of Message R1 from Site 1

R2: last message from site 2 w/out

unobservable reach

R4: last message from site 2 with unobservable

reach

obs. by 2 unobs.

obs. by 1

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AHS: Platoon Communication

n 3 2 Lead

Protocol 3 does not work

Protocol 2 works!

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AHS: Platoon Communication – Protocol 2Trace: ltf tick tick tick tick

F1 certainF1,F6 uncertain

F1,F3 uncertain

F1,F2 uncertaintick

F1 certainF1,F6 uncertain

F1,F3 uncertain

F1,…,F4 uncertaintick

F1 certainF1,F6 uncertain

F1,F3 uncertain

F1,…,F6 uncertaintick

F1 certainF1,F6 uncertain

F1,F3 uncertain

F1,…,F6 uncertaintick

1N1N1N1Nltf

1N1N1N1N✒

Coord.Foll 2Foll 1LeadEvent

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Analytical Results

• Protocol 2 does not always work!• Test available to verify if it will detect all

failures• Sufficient condition available

" failure-ambiguous traces

• Communication can be interrupted: coordinator could do polling

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Example where Protocol 2 fails

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Protocol 1

Protocol 2

Protocol 3

Perfo

rman

ce d

ecre

ases

Perfo

rman

ce d

ecre

ases

Com

plex

ity in

crea

ses

Com

plex

ity in

crea

ses

Uses extendeddiagnosers and 1-step memory at coordinator

Diagnosers + state

intersection

Diagnosers but trivial/no

coordinator

Summary

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Decentralized Diagnosis with Coordinator

SITE 2SITE 1

INTERFACE 1

DIAGNOSTICS

SUPERVISORY CONTROLLER 1

INTERFACE 2

DIAGNOSTICS

SUPERVISORY CONTROLLER 2

COORDINATOR FAILURE RECOVERY

Local Observations

Communications

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Communication Delays

• Time stamps appended to messages

• “Ordering” of messages at coordinator:

• Store messages (need upper bound on delay)

• Sort out all possible orders

• Apply earlier decision rule to each order

" Requires more memory and processing at coordinator…

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Contents of Presentation• “Basic” theory

– Notion of diagnosability – Model construction – Diagnosers: synthesis and analysis

• Industrial applications– “Hybrid” techniques for Document Processing Systems

• Decentralized architectures– Coordinated architectures– Performance – complexity tradeoff

• Concluding remarks

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Salient Features of Approach

• Formal: model-based, diagnosability• Applicable to dynamic systems• Analytical foundations:

• diagnosers, indeterminate cycles, failure-ambiguous traces

• Amenable to design:• sensor selection, active diagnosis

• Easy of implementation• Extensible, versatile

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Other Extensions of “Basic” Theory

• Timed models of DES– Chen & Provan, Rockwell, ACC 97 – Zad et al., Univ. of Toronto, CDC 99 (see also CDC 98)

• Decentralized DES– Sengupta et al., PATH–U.C. Berkeley,WODES 98– Rozé and Cordier, IRISA, WODES 98– Pencolé, IRISA, DX-00

• Modular DES– Ricker et al., IRISA

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Other DES Approaches to Diagnostics

• Bouloutas et al., Columbia, 1992[ automata, telecommunication networks ]

• Lin, WSU, 1994[ automata, automotive ]

• Holloway et al., Kentucky, 1994 - present[ time templates, manufacturing ]

• Benveniste et al., IRISA, 1997 - present[ stochastic Petri nets and automata,

telecommunication networks ]• Baroni et al., Brescia, Italy, 1999

[ communicating automata ]

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Challenges Ahead

• Large-scale systems:• Decoupling, modularity

• Decentralized-information systems• Novel architectures

• Imprecise information• Probabilistic extension

• More industrial applications

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Acknowledgements

Xerox Corporation- Charles Coleman - Ashok Godambe- Eric Jackson- Edward Mallow- Rene Rasmussen- Ronald Rockwell

University of Michigan- Rami Debouk- Demosthenis Teneketzis- UMDES-LIB Group

University of Californiaat Berkeley- Raja Sengupta

Johnson Controls Inc. - Kasim Sinnamohideen

Rockwell Science Center- Yi-Liang Chen- Gregory Provan

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THE END

FIN

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Taoism says: S… happens.

Hinduism says: This s… happened before.

Buddhism says: If s… happens, it isn't really s...

Some Words of Wisdom