A 6.1mW Dual-Loop DLL with 4.6ps RMS Jitter Paritosh Bhoraskar and Yun Chiu
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Transcript of A 6.1mW Dual-Loop DLL with 4.6ps RMS Jitter Paritosh Bhoraskar and Yun Chiu
A 6.1mW Dual-Loop DLL with 4.6ps RMS JitterParitosh Bhoraskar and Yun Chiu
Illinois Center forWireless Systems
DLL Applications• Delay-variation
compensation in Fiber-Optic Comm.
• Integral part of Clock-Data Recovery (CDR) Blocks in Wireline and Wireless Communication Solutions
• Target Application: Interleaved ADC array require multiple phases of a clock aligned with another clock at different frequency
Window Based Phase Detector
• Replica delay line and DAC used to generate timing window that tracks input reference
• Three state PD with UP/DN and HOLD state. Digital control word frozen in HOLD state
• Relaxed PD design spec due to timing window• Power saving in Digital Control in HOLD state
Q
QSET
CLR
D
Q
QSET
CLR
D
Ref
In
Window
Dn
Up
Ref
Out
Window UP: Low, DN: High(Shift Right)
UP: High, DN: High(Lock)
UP: High, DN: Low(Shift Left)
Major Tradeoffs
• Control-word limit cycle dominates Jitter
• Fine LSB and high power required for low jitter
• Window-ed PD eliminates limit cycle based jitter
• Low Jitter and low power solution
• Cost: Larger static phase error
LSB sizeA
rea/
Pow
er C
onsu
mpt
ion
Jitter
PowerJitterJitter (window PD)
Digital Control Logic
• Startup Successive Approximation Binary search
• Harmonic Lock avoided by starting with min delay using reset. Duty-cycle free harmonic lock detection also implemented to eliminate false lock
• Underflow/Overflow based stuck locks corrected by confining delay-line delay s.t. T/2 < Delay <3T/2
• Implemented by inverting Phase Detector decision based on ‘Monitor’ signal
0.5 Tref 1.5 Tref
Ref
Stuck Lock
False Lock
Stuck LockResolved
Ref
Out
PD_UP
PD_DN
Sys_clk
Underflow
Monitor
Inc
Dec
Stuck Lock
Measurement Results
DAC2
DAC1DACrep
DL1DLrep
LF
DL
2
PD
Output Driver
0.83mm
0.84m
m
6.15.65.14.8Power (mW)
4.64.76.19.1RMS Jitter (ps)
1.20.80.40.2f2(GHz)
120804020f1(MHz)
Results at Vdd = 1.25V, T = 25°C across 5 working chips
• DLL fabricated in 0.13um process• Active die area
400 X 600 m2
• Total Die Area 830x840 m2
• Low RMS jitter attained for low power
Proposed Architecture
• One loop completely inside another approach as opposed to usual cascaded loop dual-loop architecture
• Inner Loop generates 10 uniform output phases for interleaved ADC channels
• Outer Loop aligns all these phases to faster reference clock used by Sample and Hold of the ADC fouter
PD1 LF1 DAC1
PD2LF2DAC2
CLK
Phase1 Phase 10Phase 2
Replica Delay Cell
Main Delay CellCLK
Inner Loop
Delay Cell
DACrepOffset
finner