8Sep 2003 Run2b Readout Meeting Qun Yu / Moreshwar Dhole Louisiana Tech University DJC Testing at...

8Sep 2003Run2b Readout Meeting

Qun Yu / Moreshwar DholeLouisiana Tech University

DJC Testing at LaTech:Update



Quality Control Tests of DJC’s

1. Continuity and shorts test2. Resistance testing3. High voltage standoff testing.

LaTech Testing Crew:Moreshwar DholeQun YuMatthew BellotHenry Hollins



Since our last report

• Updated and improved our database to reflect changes suggested last time and to include results of recent testing

• Received 168 50cm-test cables from Century– Commenced affixing backings to cables

as per procedure from Jim Fast– In parallel, ~80 of these have been

tested



On the following slide are sample data from SHEET 1 of the DJC database (http://caps.phys.latech.edu/~greenw/run2b/run2b_page.html)

http://caps.phys.latech.edu/~greenw/run2b/run2b_page.html

http://caps.phys.latech.edu/~greenw/run2b/run2b_page.html



ID Type Vendor Location Length_cm Tested Resistence Tester Date TestedCurrent Shorts-Open < 3 σ

CT 150 Test Century FermilabCT 151 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 152 Test Century Fermilab 50 Tested OK Yes Moreshwar 7/29/2003CT 153 Test Century Fermilab 50 Tested OK Yes Moreshwar 7/29/2003CT 154 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 155 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 156 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 157 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 158 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 159 Test Century LTU 50 Tested OK Yes Moreshwar 7/30/2003CT 160 Test Century Fermilab 50 Tested OK Yes Moreshwar 7/29/2003



• Also on the DJC database spreadsheet is SHEET 2 which has resistance measurements, mean resistances and standard deviations. Part of this sheet is on the next slide..



Line Line Board Resistance Resistance MEAN STANDARDNumber Description Resistance cable ct_19 cable ct_21 RESISTANCE DEVIATION

(CENTURY) (CENTURY)35 AVDD(S) 0.094 2.883 2.646 2.529 0.22837 AVDD 0.096 0.19 0.161 0.163 0.01839 AVDD 0.099 0.185 0.157 0.157 0.01241 GND 0.099 0.092 0.082 0.084 0.01543 DVDD(S) 0.098 2.932 2.726 2.614 0.25045 DVDD 0.102 0.183 0.143 0.146 0.01447 DVDD 0.105 0.18 0.144 0.150 0.022



Some Observations…

• We have tested ~125 Century cables.

• Of these, ~ 10 cables have some type of defect- shorts between lines, discontinuity, or high resistance. Shorts are the most common of these.



• END OF REPORT



• EXTRA SLIDES



Digital Jumper Cable Readout Setup:



3) High Voltage Standoff Test:

• The purpose of this test is to check whether there is any short or current leakage (Arcing) between HV (High Voltage) Cu trace and other adjacent Cu traces.

• For this testing here at LaTech we developed our own High Voltage Testing Jig and it is working fine.

• This High Voltage Testing Jig allows us to test 10 cables at a time for overnight.



Test procedure:

• Continuity: two multimeter probes are connected to both ends of the line in a given cable, if the line is good, there will be “beep” from multimeter.

• Short circuit tests: each line is tested against its nearest neighbor.



High Voltage Test Schematic



Complete Test Setup:

8Sep 2003 Run2b Readout Meeting Qun Yu / Moreshwar Dhole Louisiana Tech University DJC Testing at...

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