2011 May Pubs Digest
-
Upload
fidel-gil-valeriano -
Category
Documents
-
view
219 -
download
0
Transcript of 2011 May Pubs Digest
-
7/22/2019 2011 May Pubs Digest
1/18
PUBLICATIONS CONTENTS
DIGEST
MAY 2011
-
7/22/2019 2011 May Pubs Digest
2/18
IEEE Communications Mazine
IEEE Communications Society periodicals tables of content:May 2011
Direct links to magazine and journal abstracts and full paper pdfs via IEEE Xplore
ComSoc Vice President - Publications - Len CiminiDirector - Journals Larry GreensteinDirector - Magazines - Andrzej Jajszczyk
Magazine Editors
EIC, IEEE Communications Magazine - Steve GorsheEIC, IEEE Network Magazine - Tom ChenEIC, IEEE Wireless Communications Magazine - Michael FangAEIC, IEEE Wireless Communications Magazine - Dilip KrishnaswamyEditor, The Global Communications Newsletter- Stefano BregniEditor, Design and Implementation Series - Sean MooreArea Co-Editors, Optical Communications Series - Hideo Kuwahara | Osman Gebiziligoglu | Vijay Jain | John SpencerArea Editor, Radio Communications - Joseph Evans | Zoran Zvon
Journal EditorsEIC, IEEE Transactions on Communications - Michele ZorziEIC, IEEE Journal on Selected Areas In Communications (J-SAC) - Martha SteenstrupCo-EIC, IEEE/OSA Journal of Optical Communications & Networking (JOCN) - Vincent Chan
EIC, IEEE/ACM Transactions on Networking- Roch GuerinEIC, IEEE Communications Letters - Sarah Kate WilsonEIC, IEEE Transactions on Network & Service Management (TNSM) - Raouf BoutabaEIC, IEEE Transactions on Wireless Communications - Chengshan XiaoEIC, IEEE Journal of Communications & Networks (JCN) - Ezio BiglieriEditor, IEEE Communications Surveys & Tutorials - Nelson FonsecaMembers of Steering Committees for Co-Sponsored JournalsSteering Committee, IEEE/OSA Journal of Lightwave Technology- Karen Liu | Pat TrischittaSteering Committee, IEEE/OSA Journal of Optical Communications & Networking- Nim Cheung | Hideo KuwaharaSteering Committee, IEEE/ACM Transactions Networking- Victor Frost (Chair) | Marco Ajmone Marsan | IzhakRubinSteering Committee, IEEE Transactions on Mobile Computing- Tom La Porta(Chair) | Chiara PetrioliSteering Committee, IEEE Transactions on Multimedia - Byeong Gi Lee | Wenjun Zeng | Qian ZhangSteering Committee, Transactions on Wireless Communications - Zhi Ding (Chair) | Andrea Goldsmith | KhaledLetaief | Ted Rappaport
Submission and editorial instructions can be found on each publications home page.
For IEEE Communications Society membership and subscription information, please visit www.comsoc.org
IEEE Communications Society3 Park Avenue
New York, NY 10016 USA212 705 8900
http://www.comsoc.org/http://www.comsoc.org/http://www.comsoc.org/http://www.comsoc.org/ -
7/22/2019 2011 May Pubs Digest
3/18
IEEE Communications Magazine - CoverFull Text:PDF(290KB)
Table of contentsFull Text:PDF(200KB)
Nominations and elections: open to all [The President's Page]Lee, B.G. Zuckerman, D. Greenstein, L.
Abstract| Full Text:PDF(1015KB)
Magazine update May 2011 [Note from the Editor-in-Chief]Gorshe, S.
Abstract| Full Text:PDF(216KB)
IEEE WCNC 2011 explores the latest wireless communicationsadvancements in Cancun, Mexico [Conference Report]
Abstract| Full Text:PDF(1106KB)
Training professionals worldwide [Certification Corner]Catis, M.
Abstract| Full Text:PDF(1159KB)
Conference calendarAbstract| Full Text:PDF(1060KB)
Global Communications NewsletterDilhac, J.-M. Baal-Schem, J. Correia, L.M. Mohamad, H. Ali,B.M. Judja-Sato, B. Pioro, M. Rak, J. Szczypiorski, K.
Abstract| Full Text:PDF(762KB)
Book reviews [review of "Wireless Communications, SecondEdition" (Molisch, A.; 2011) and ("The Essential Guide to VideoProcessing" (Bovik, A., Ed.; 2009)]Wagrowski, M. Leszczuk, M.
Abstract| Full Text:PDF(1035KB)
New productsAbstract| Full Text:PDF(60KB)
Product spotlightsAbstract| Full Text:PDF(724KB)
Lighting up copper [History of Communications]Cioffi, J.M.
Abstract| Full Text:PDF(1477KB)
Candidates announced for Board of Governors [Society News]Abstract| Full Text:PDF(119KB)
Advances in cooperative wireless networking: Part I [GuestEditorial]Zhang, X. Wang, J. Qian, Y.
Abstract| Full Text:PDF(352KB)
Network localization and navigation via cooperationWin, M.Z. Conti, A. Mazuelas, S. Shen, Y. Gifford, W.M.Dardari, D. Chiani, M.
Abstract| Full Text:PDF(328KB)
Cooperative wireless networks: from radio to network protocoldesignsSheng, Z. Leung, K.K. Ding, Z.
Abstract| Full Text:PDF(874KB)
Cooperative cellular networks using multi-user MIMO: trade-offs, overheads, and interference control across architecturesRamprashad, S.A. Papadopoulos, H.C. Benjebbour, A.Kishiyama, Y. Jindal, N. Caire, G.
Abstract| Full Text:PDF(528KB)
Distributed MIMO technologies in cooperative wireless
networksMa, S. Yang, Y. Sharif, H.
Abstract| Full Text:PDF(229KB)
Mobile association and load balancing in a cooperative relaycellular network
Yu, Y. Hu, R.Q. Bontu, C.S. Cai, Z.Abstract| Full Text:PDF(823KB)
Optical access and transport networks: advances in standardsand services [Series Editorial]Gebizlioglu, O.S. Kuwahara, H. Jain, V. Spencer, J.
Abstract| Full Text:PDF(402KB)
Virtualized optical network services across multiple domainsfor grid applicationsWang, Y. Jin, Y. Guo, W. Sun, W. Hu, W.
Abstract| Full Text:PDF(1555KB)
Power and cost reduction by hybrid optical packet switchingwith shared memory bufferingJune-Koo Kevin Rhee Chan-Kyun Lee Ji-Hwan Kim Yong-Hyub Won Jin Seek Choi Jungyul Choi
Abstract| Full Text:PDF(208KB)
Hybrid networking: evolution toward combined IP and dynamiccircuit services [Guest Editorial]Jukan, A. Veeraraghavan, M. Hasan, M.Z.
Abstract| Full Text:PDF(270KB)
Hybrid networks: lessons learned and future challenges basedon ESnet4 experienceMonga, I. Guok, C. Johnston, W.E. Tierney, B.
Abstract| Full Text:PDF(212KB)
Multilayer networks: an architecture frameworkLehman, T. Yang, X. Ghani, N. Gu, F. Guok, C. Monga, I.Tierney, B.
Abstract| Full Text:PDF(294KB)
Advance reservation frameworks in hybrid IP-WDM networksCharbonneau, N. Vokkarane, V.M. Guok, C. Monga, I.
Abstract| Full Text:PDF(890KB)
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762784http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762784http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762784http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762785http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762785http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762785http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762786http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762786http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762786http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762786http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762786http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762786http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762786http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762787http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762787http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762787http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762787http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762787http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762787http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762787http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762788http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762788http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762789http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762789http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762789http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762789http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762789http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762789http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762789http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762790http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762790http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762790http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762790http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762790http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762790http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762790http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762791http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762791http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762791http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762791http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762791http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762791http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762791http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762792http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762792http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762793http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762793http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762793http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762793http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762793http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762793http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762793http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762794http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762794http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762794http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762794http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762794http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762794http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762794http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762795http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762795http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762795http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762795http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762795http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762795http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762795http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762796http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762796http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762796http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762796http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762796http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762796http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762796http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762797http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762797http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762798http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762798http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762798http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762798http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762798http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762798http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762798http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762799http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762799http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762800http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762800http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762801http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762801http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762802http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762802http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762803http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762803http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762804http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762804http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762805http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762805http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762806http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762806http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762807http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762807http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762808http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762808http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762808http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762808http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762808http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762808http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762808http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762809http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762809http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762809http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762809http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762809http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762809http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762809http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762809http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762809http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762809http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762808http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762808http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762808http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762807http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762806http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762805http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762804http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762803http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762802http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762801http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762800http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762799http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762798http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762798http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762798http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762797http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762796http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762796http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762796http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762795http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762795http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762795http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762794http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762794http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762794http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762793http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762793http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762793http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762792http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762791http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762791http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762791http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762790http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762790http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762790http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762789http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762789http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762789http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762788http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762787http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762787http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762787http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762786http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762786http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762786http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762785http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762784 -
7/22/2019 2011 May Pubs Digest
4/18
Shared backup router resources: realizing virtualized networkresiliencePalkopoulou, E. Schupke, D.A. Bauschert, T.
Abstract| Full Text:PDF(232KB)
Standard-based approach to programmable hybrid networksCafini, R. Cerroni, W. Raffaelli, C. Savi, M.
Abstract| Full Text:PDF(746KB)
Topics in automotive networking [Series Editorial]Chen, W. Delgrossi, L. Kosch, T. Saito, T.Abstract| Full Text:PDF(1043KB)
Research challenges in intervehicular communication: lessonsof the 2010 Dagstuhl SeminarDressler, F. Kargl, F. Ott, J. Tonguz, O.K. Wischhof, L.
Abstract| Full Text:PDF(1020KB)
Design and evaluation of a two-tier peer-to-peer trafficinformation systemShiao-Li Tsao Chien-Ming Cheng
Abstract| Full Text:PDF(237KB)
Traffic information systems: efficient message disseminationvia adaptive beaconingSommer, C. Tonguz, O.K. Dressler, F.
Abstract| Full Text:PDF(1094KB)
Supporting mobility for internet carsZhu, Z. Zhang, L. Wakikawa, R.
Abstract| Full Text:PDF(565KB)
IP mobility management for vehicular communicationnetworks: challenges and solutionsCespedes, S. Shen, X. Lazo, C.
Abstract| Full Text:PDF(223KB)
Beyond Shannon: the quest for fundamental performancelimits of wireless ad hoc networksGoldsmith, A. Effros, M. Koetter, R. Medard, M. Ozdaglar, A.Zheng, L.
Abstract| Full Text:PDF(766KB)
Wireless community networks: an alternative approach for
nomadic broadband network accessFrangoudis, P.A. Polyzos, G.C. Kemerlis, V.P.Abstract| Full Text:PDF(699KB)
A critical survey and analysis of RFID anti-collisionmechanismsZhu, Lei Yum, Tak-Shing Peter
Abstract| Full Text:PDF(308KB)
Interaction patterns between P2P content distribution systemsand ISPsDan, G. Hossfeld, T. Oechsner, S. Cholda, P. Stankiewicz, R.Papafili, I. Stamoulis, G.D.
Abstract| Full Text:PDF(191KB)
A potential evolution of the policy and charging control/QoSarchitecture for the 3GPP IETF-based evolved packet core
Ouellette, S. Marchand, L. Pierre, S.Full Text:PDF(59KB)
Advertisers' indexFull Text:PDF(59KB)
IEEE Network Full Text:PDF(173KB)
Table of contents Full Text:PDF(84KB)
In memoriam: Paul BaranCerf, V.G. Full Text:PDF(217KB)
Network traffic monitoring, analysis and anomaly detection[Guest Editorial]Wang, W. Zhang, X. Shi, W. Lian, S. Feng, D.
Abstract| Full Text:PDF(1425KB)
Experiences of internet traffic monitoring with tstatFinamore, A. Mellia, M. Meo, M. Munafo, M.M. Torino, P.D.Rossi, D.
Abstract| Full Text:PDF(1693KB)
Packet traffic: a good data source for wireless sensor networkmodeling and anomaly detectionWang, Q.
Abstract| Full Text:PDF(891KB)
Measurement and diagnosis of address misconfigured P2Ptraffic
Li, Z. Goyal, A. Chen, Y. Kuzmanovic, A.Abstract| Full Text:PDF(158KB)
Dynamic measurement-aware routing in practiceGuanyao Huang Chen-Nee Chuah Raza, S. Seetharaman, S.
Abstract| Full Text:PDF(279KB)
Multimedia traffic security architecture for the internet ofthingsLiang Zhou Han-Chieh Chao
Abstract| Full Text:PDF(747KB)
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762810http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762810http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762811http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762811http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762811http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762811http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762811http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762811http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762811http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762812http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762812http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762812http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762812http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762812http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762812http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762812http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762813http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762813http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762814http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762814http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762815http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762815http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762816http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762816http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762816http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762816http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762816http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762816http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762816http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762817http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762817http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762818http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762818http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762819http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762819http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762820http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762820http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762821http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762821http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762822http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762822http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762822http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772053http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772053http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772053http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772054http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772054http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772055http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772055http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772055http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772055http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772055http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772055http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772055http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772056http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772056http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772057http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772057http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772058http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772058http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772058http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772058http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772058http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772058http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772058http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772059http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772059http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772059http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772059http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772059http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772058http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772058http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772058http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772057http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772056http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772055http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772055http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772055http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5772054http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772053http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5772051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762823http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762822http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762822http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762821http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762820http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762819http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762818http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762817http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762816http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762816http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762816http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762815http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762814http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762813http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762812http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762812http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762812http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762811http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762811http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762811http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5762810 -
7/22/2019 2011 May Pubs Digest
5/18
Table of contentsFull Text:PDF(64KB)
Staff ListFull Text:PDF(58KB)
High-Rate and Full-Diversity Space-Time Block Codes withLow Complexity Partial Interference Cancellation Group
DecodingShi, Long Zhang, Wei Xia, Xiang-Gen
Abstract| Full Text:PDF(245KB)
Performance of Weighted Nonbinary Repeat-AccumulateCodes over GF(q) with q-ary Orthogonal ModulationKim, Yongsang Cheun, Kyungwhoon Lim, Hyuntack
Abstract| Full Text:PDF(275KB)
On (n,n-1) Punctured Convolutional Codes and Their TrellisModulesKatsiotis, Alexandros Kalouptsidis, Nicholas
Abstract| Full Text:PDF(163KB)
Pseudocodeword Weights for LDPC Codes under DifferentialPSK Transmission over the Noncoherent AWGN ChannelMo, Elisa Armand, Marc A.
Abstract| Full Text:PDF(248KB)
On Adaptive Lattice Reduction over Correlated FadingChannelsNajafi, Hossein Jafari, Mohammad Erfan Danesh Damen,Mohamed Oussama
Abstract| Full Text:PDF(236KB)
Joint Precoding Optimization for Multiuser Multi-AntennaRelaying Downlinks Using Quadratic ProgrammingXu, Wei Dong, Xiaodai Lu, Wu-Sheng
Abstract| Full Text:PDF(376KB)
Efficient LLR Calculation for Non-Binary Modulations overFading Channels
Yazdani, Raman Ardakani, Masoud
Abstract| Full Text:PDF(283KB)
Refined Routing Algorithm in Hybrid Networks with DifferentTransmission RatesShin, Won-Yong
Abstract| Full Text:PDF(588KB)
Performance Analysis of Double-Weight Optical CDMA Underthe Same-Bit-Power AssumptionChen, Chih-Hao Chu, Han-Yun Yang, Guu-Chang Chang,Cheng-Yuan Kwong, Wing C.
Abstract| Full Text:PDF(249KB)
Allele Gene Based Adaptive Genetic Algorithm to the CodeDesignDai, Xiaoming
Abstract| Full Text:PDF(202KB)
Performance of Opportunistic Epidemic Routing on Edge-Markovian Dynamic GraphsWhitbeck, John Conan, Vania de Amorim, Marcelo Dias
Abstract| Full Text:PDF(209KB)
Efficient Use of Multicast and Unicast Channels for MulticastService TransmissionLee, Seung Joon Tcha, Yongjoo Seo, Sang-Yong Lee,Seong-Choon
Abstract| Full Text:PDF(198KB)
MISO Capacity with Per-Antenna Power ConstraintVu, Mai
Abstract| Full Text:PDF(230KB)
Constellation Precoded Multiple BeamformingPark, Hong Ju Li, Boyu Ayanoglu, Ender
Abstract| Full Text:PDF(724KB)
Symbol-Level Synchronization and LDPC Code Design forInsertion/Deletion ChannelsWang, Feng Fertonani, Dario Duman, Tolga M.
Abstract| Full Text:PDF(669KB)
On the Distribution of the Sum of Gamma-Gamma Variates andApplications in RF and Optical Wireless CommunicationsChatzidiamantis, Nestor D. Karagiannidis, George K.
Abstract| Full Text:PDF(942KB)
Distribution of the Demmel Condition Number of WishartMatricesZhong, Caijun McKay, Matthew R. Ratnarajah, Tharm Wong,Kai-Kit
Abstract| Full Text:PDF(516KB)
Performance Analysis of OFDM with Wiener Phase Noise and
Frequency Selective Fading ChannelMathecken, Pramod Riihonen, Taneli Werner, StefanWichman, Risto
Abstract| Full Text:PDF(521KB)
A Novel Approach to the Statistical Modeling of WirelineChannelsGalli, Stefano
Abstract| Full Text:PDF(477KB)
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766668http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766668http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766668http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766669http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766669http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766669http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733449http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733449http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723043http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723043http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723045http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723045http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753989http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753989http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723044http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723044http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715842http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715842http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719289http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719289http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719281http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719281http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733456http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733456http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733456http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733456http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733456http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733456http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733456http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766670http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766670http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766670http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766670http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766670http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766670http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766670http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733455http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733455http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719282http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719282http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766671http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766671http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733452http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733452http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739161http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733452http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766671http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719282http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733455http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766670http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766670http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766670http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733456http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733456http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733456http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719281http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719289http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739163http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719288http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5715842http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723044http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753989http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723045http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723052http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719286http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723043http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733449http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766669http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766668 -
7/22/2019 2011 May Pubs Digest
6/18
MMSE-Based Distributed Beamforming in Cooperative RelayNetworksChoi, Jinho
Abstract| Full Text:PDF(388KB)
Adaptive UWB Pulse Allocation for Distributed Detection inSensor NetworksWang, Tsang-Yi
Abstract| Full Text:PDF(397KB)
Adaptive Subcarrier PSK Intensity Modulation in Free SpaceOptical SystemsChatzidiamantis, Nestor D. Lioumpas, Athanasios S.Karagiannidis, George K. Arnon, Shlomi
Abstract| Full Text:PDF(962KB)
Capacity and Delay Analysis of Next-Generation PassiveOptical Networks (NG-PONs)Aurzada, Frank Scheutzow, Michael Reisslein, MartinGhazisaidi, Navid Maier, Martin
Abstract| Full Text:PDF(627KB)
Hybrid Optical/RF Channel Performance Analysis for TurboCodesTapse, Hrishikesh Borah, Deva K. Perez-Ramirez, Javier
Abstract| Full Text:PDF(465KB)
Beat Noise Compensation in OCDMA Systems Using SoftDecoding Based FECSahuguede, S. Julien-Vergonjanne, A. Cances, J.P.
Abstract| Full Text:PDF(490KB)
New Bounds and Optimal Binary Signature Sets - Part II:Aperiodic Total Squared CorrelationGanapathy, Harish Pados, Dimitris A. Karystinos, George N.
Abstract| Full Text:PDF(427KB)
Load-Balanced Combined Input-Crosspoint Buffered PacketSwitchesRojas-Cessa, Roberto Dong, ZiqianAbstract| Full Text:PDF(863KB)
Optimization of Amplify-and-Forward Multicarrier Two-HopTransmission
Zhang, Wenyi Mitra, Urbashi Chiang, MungAbstract| Full Text:PDF(641KB)
Resource Management in Spectrum-Sharing Cognitive RadioBroadcast Channels: Adaptive Time and Power AllocationAsghari, Vahid Aissa, Sonia
Abstract| Full Text:PDF(595KB)
On the Performance of OFDM-Based Amplify-and-ForwardRelay Networks in the Presence of Phase NoiseRabiei, Payam Namgoong, Won Al-Dhahir, Naofal
Abstract| Full Text:PDF(850KB)
Cyclic Prefixed OQAM-OFDM and its Application to Single-Carrier FDMAGao, Xiqi Wang, Wenjin Xia, Xiang-Gen Au, Edward K. S.
You, Xiaohu
Abstract| Full Text:PDF(522KB)
Degrees of Freedom of Multiple Broadcast Channels in thePresence of Inter-Cell InterferencePark, Seok-Hwan Lee, Inkyu
Abstract| Full Text:PDF(559KB)
Staff ListFull Text:PDF(68KB)
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733448http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733448http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733451http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733451http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723049http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723049http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733453http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733453http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766672http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766672http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719283http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719283http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766673http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766673http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723048http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723048http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723046http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723046http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733450http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733450http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766674http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766674http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766674http://www.facebook.com/IEEEComSochttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766674http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739160http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5739162http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733450http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723046http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723048http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766673http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5719283http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5766672http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723051http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733453http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5723049http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733451http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5733448 -
7/22/2019 2011 May Pubs Digest
7/18
IEEE Consumer Communications & Networking Conference, sponsored by the IEEE Communications Society, is a major annual international conferenceorganized with the objective of bringing together researchers, developers, and practitioners from academia and industry working in all areas of consumercommunications and networking.
IEEE CCNC 2012 will present the latest developments and technical solutions in the areas of home networking, consumer networking, enabling technologies(such as middleware), and novel applications and services. The conference will include a peer-reviewed program of technical sessions, special sessions,workshops, panels, demonstrations and tutorials.
PRELIMINARY CALL FOR TECHNICAL SESSION PAPERS
Wireless Consumer Communicationsand Networking
Wireless Home Networks Wireless LANs, WiMax, Cellular Networks UWB and OFDM Multi-Channel, Multi-Hop and Cooperative
Communications Cross-Layer Design, Interactions and Optimization Seamless Roaming Techniques and Technologies Frequency and Channel Allocation Algorithms Modulation, Coding and Diversity Physical and MAC Layers Design Issues Energy Efficiency and optimization Emerging Standards Network QoS
Peer-to-Peer Networking and ContentDistribution P2P Platforms, Algorithms and Architectures for
Consumer Communications Overlay and Application Layer Multicast Peercasting and Overlay Content Distribution Peer-to-Peer SIP Novel Consumer Applications Enabled by P2P
Computing Resource and Data Sharing Incentive Mechanisms in P2P Networks Reputation and Trust Mechanisms Overlay Networks Cloud Computing for Consumer-oriented Content
Distribution
Portability and Mobility of Content in IntermittentConsumer Networks
Smart Spaces and Personal Area Networks Body and Personal Area Networks
IEEE 802.15 and Bluetooth-Based Networks Power Control and Conserving Approaches Pricing Models Service Discovery RFID for CE Ad-hoc and Sensor Networks Vehicle Networks Delay tolerant Networks QoS and Service Reliability Data Management and Query Processing Middleware for Smart Spaces and PANs Context- and Situation-awareness for Smart
Spaces and PANs Real systems and measurement results for smart
space and PANs
Emerging and Innovative ConsumerTechnologies and Applications Green and Environmentally-conscious Design and
Consumer Technology Humanitarian uses of Consumer Electronics Advances in Display Technology and their Practical
Usage HCI and Design Considerations Consumer Device Design and Innovation Design of e-Health and Mobile Health Technologies
(Home Automation, etc.) Studies of Consumer Technology for Well-being Consumer Technologies in Emerging Markets and
Challenged Economies Consumer Technologies for Social Benefit (e.g.,
Voting, Reporting, Education, etc.) Personalization Techniques Uses of Multimodal input and Data Pervasive and Contextual Computing Systems in
Practice Wearable Computing Systems Smart Devices, Ambient & Intelligent Applications Middleware and Embedded Platforms
Multimedia & EntertainmentNetworking and Services
Multimedia Communication and Streaming Multimedia QoS and Protocols Distributed Network Protocols for Multimedia Image/Video Multimedia Networks Streaming Protocols High-Definition Audio, Image and Video Proces Distributed Coding and Network Coding Entertainment Networks Multimedia Services Multimedia Support over Multi-hop Networks Wireless Multimedia Field Trials and Measurements Networking for Multi-player Gaming
Security and Content Protection Security for Home Networks, PANs & BANS Firewalls and Intrusion Detection Worm and Malware Defences Combating Phishing and Spam Secure Configuration Consumer-friendly Security Models & Tools Portable Devices Disinfection Control of Personal Data Reputation and Trust Mechanisms Authentication, Authority and Auditing for CE Copyright and Privacy Protection Digital Rights Management Streaming and Network Anonymity
6 TECHNICAL TRACKS
TECHNICAL PAPERS DUE June 3, 2011
ACCEPTANCE NOTIFICATION September 2, 2011
FINAL CAMERA READY ARTWORK September 30, 2011
TECHNICAL PROGRAM CHAIRBehrooz Shirazi
Washington State University, USA
For more information on Tutorials, Special Sessions,Demonstrations, Workshops, Panels and Paper SubmissionGuidelines; please visit www ieee ccnc org/2012
- In Conjunction with the 2012 International Consumer Electronics Show -
c o n s u m e r c o m m u n i c a t i o n s& n e t w o r k i n g c o n f e r e n c e
CCNC 2012
Dont Miss the 9th AnnualIEEE Consumer Communications &
Networking Conference
January 14 - 17, 2012Planet Hollywood Las Vegas, Nevada USA
IMPORTANT DATES
IEEE CCNC COMMITTEE
-
7/22/2019 2011 May Pubs Digest
8/18
Table of contents Full Text:PDF(122KB)
Staff List Full Text:PDF(67KB)
Guest Editorial Trading Rate for Delay at the Application andTransport Layers
Abstract| Full Text:PDF(112KB)
Delaying Transmissions in Data Communication Networks toImprove Transport-Layer PerformanceCai, Yan Wolf, Tilman Gong, Weibo
Abstract| Full Text:PDF(552KB)
The Asymptotic Behavior of Minimum Buffer SizeRequirements in Large P2P Streaming NetworksShakkottai, Srinivas Srikant, R. Ying, Lei
Abstract| Full Text:PDF(399KB)
TERSE: A Unified End-to-End Traffic Control Mechanism toEnable Elastic, Delay Adaptive, and Rate Adaptive Services
Ye, Lei Wang, Zhijun Che, Hao Lagoa, Constantino M.Abstract| Full Text:PDF(1106KB)
Delay-Aware Cross-Layer Design for Network UtilityMaximization in Multi-Hop NetworksXiong, Haozhi Li, Ruogu Eryilmaz, Atilla Ekici, Eylem
Abstract| Full Text:PDF(1189KB)
Value-Aware Resource Allocation for Service Guarantees inNetworksParag, Parimal Sah, Sankalp Shakkottai, SrinivasChamberland, Jean-Francois
Abstract| Full Text:PDF(1011KB)
NUM-Based Fair Rate-Delay Balancing for Layered VideoMulticasting over Adaptive Satellite NetworksPradas, David Vazquez-Castro, M. A.
Abstract| Full Text:PDF(816KB)
Scheduling for Optimal Rate Allocation in Ad Hoc NetworksWith Heterogeneous Delay ConstraintsJaramillo, Juan Jose Srikant, R. Ying, Lei
Abstract| Full Text:PDF(304KB)
Trading Rate for Balanced Queue Lengths for Network DelayMinimization
Yang, Jing Ulukus, SennurAbstract| Full Text:PDF(414KB)
Leveraging the Rate-Delay Trade-Off for Service Differentiationin Multi-Provider NetworksPodlesny, Maxim Gorinsky, Sergey
Abstract| Full Text:PDF(980KB)
On the Impact of Link Scheduling on End-to-End Delays inLarge NetworksLiebeherr, Jorg Ghiassi-Farrokhfal, Yashar Burchard, Almut
Abstract| Full Text:PDF(872KB)
Exploiting the Path Propagation Time Differences in MultipathTransmission with FECKurant, Maciej
Abstract| Full Text:PDF(935KB)
An End-to-End Virtual Path Construction System for StableLive Video Streaming over Heterogeneous Wireless NetworksHan, Sangchun Joo, Hyunchul Lee, Dongju Song, Hwangjun
Abstract| Full Text:PDF(799KB)
Diversity Embedded Streaming Erasure Codes (DE-SCo):Constructions and OptimalityBadr, Ahmed Khisti, Ashish Martinian, Emin
Abstract| Full Text:PDF(756KB)
Optimal Delay-Reconstruction Tradeoffs in Peer-to-PeerNetworksAhmed, Ebad Wagner, Aaron B.
Abstract| Full Text:PDF(685KB)
Avoiding Interruptions A QoE Reliability Function forStreaming Media ApplicationsParandehGheibi, Ali Medard, Muriel Ozdaglar, AsumanShakkottai, Srinivas
Abstract| Full Text:PDF(839KB)
Multicast Queueing Delay: Performance Limits and Order-
Optimality of Random Linear CodingCogill, Randy Shrader, Brooke
Abstract| Full Text:PDF(282KB)
On the Delay Distribution of Random Linear Network CodingNistor, Maricica Lucani, Daniel E. Vinhoza, Tiago T. V. Costa,Rui A. Barros, Joao
Abstract| Full Text:PDF(556KB)
On The Capacity of Immediately-Decodable Coding Schemesfor Wireless Stored-Video Broadcast with Hard DeadlineConstraintsLi, Xiaohang Wang, Chih-Chun Lin, Xiaojun
Abstract| Full Text:PDF(842KB)
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753553http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753553http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753553http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753554http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753554http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753554http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753555http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753555http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753555http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753555http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753555http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753555http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753555http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753555http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753556http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753556http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753556http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753556http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753556http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753556http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753556http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753556http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753557http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753557http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753557http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753557http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753557http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753557http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753557http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753557http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753558http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753558http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753558http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753558http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753558http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753558http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753558http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753558http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753559http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753559http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753559http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753559http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753559http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753559http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753559http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753559http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753560http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753560http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753560http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753560http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753560http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753560http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753560http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753560http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753561http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753561http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753561http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753561http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753561http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753561http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753561http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753561http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753562http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753562http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753562http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753562http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753562http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753562http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753562http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753562http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753563http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753563http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753563http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753563http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753563http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753563http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753563http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753563http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753564http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753564http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753564http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753564http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753564http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753564http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753564http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753564http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753565http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753565http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753565http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753565http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753565http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753565http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753565http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753565http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753566http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753566http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753566http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753566http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753566http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753566http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753566http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753566http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753567http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753567http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753567http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753567http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753567http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753567http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753567http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753567http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753568http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753568http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753568http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753568http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753568http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753568http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753568http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753568http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753569http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753569http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753569http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753569http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753569http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753569http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753569http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753569http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753570http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753570http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753570http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753570http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753570http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753570http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753570http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753570http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753571http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753571http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753571http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753571http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753571http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753571http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753571http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753571http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753572http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753572http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753572http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753572http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753572http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753572http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753572http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753573http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753573http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753573http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5753573http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber