2006 Work Plan Y. Sugimoto 25-Apr-2006. Study Items Basic study of fully depleted CCD Simulation...
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Transcript of 2006 Work Plan Y. Sugimoto 25-Apr-2006. Study Items Basic study of fully depleted CCD Simulation...
![Page 1: 2006 Work Plan Y. Sugimoto 25-Apr-2006. Study Items Basic study of fully depleted CCD Simulation studies for FPCCD VTX Radiation damage Thin wafer and.](https://reader036.fdocuments.us/reader036/viewer/2022082819/56649f335503460f94c50652/html5/thumbnails/1.jpg)
2006 Work Plan
Y. Sugimoto
25-Apr-2006
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Study Items
Basic study of fully depleted CCD Simulation studies for FPCCD VTX Radiation damage Thin wafer and the support structure Conceptual design of FPCCD for ILC Readout ASIC
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Basic study of fully-dep. CCD
Charge spread Back-illumination CCD (S7170-0909-deep2) LASER / Fe55 April – May
Lorentzs angle From May 8th – 2 weeks at KEK cryogenic center S7170-0909-deep2 with S5466 as a reference
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Simulation studies for FPCCD VTX
Background rejection with cluster shape Tracking efficiency with beam background Flavor tagging Vertex charge
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Radiation damage study
Clock dependence of CTI Using standard CCD irradiated before
Electron annealing Verify Nick’s report Using CCDs irradiated with neutron before Irradiate with -source or beam?
Radiation damage of fully-depleted CCD Irradiate with -source or beam?
Radiation damage of FPCCD When can we get the FPCCD? – Up to HPK
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Thin wafer and the support structure
Consider 2 options Partially thinned wafer Si-RVC-Si sandwich
Simulation with FEA program Measurement of flatness for partially thinned
wafer (S7170-0909-deep2) Can we get RVC sample?
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Conceptual design of FPCCD
Simulation using FEMLAB Discussion with HPK Simulation using ENEXSS-TCAD
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Readout ASIC Goal (3 years):
16/32 ch Amp-CDS-ADC with 0.635 mm pitch System noise < 50 electrons (depends on CCD) 4 – 6 bit 20 Mpix/sec Power: < 10 mW/ch (depends on thermal design of VTX)
Target of this year: 1ch sample device
Organization Osaka Univ. group is also doing R&D of CP-CCD and the R.O. A
SIC for X-ray astronomy Ikeda-san (JAXA) is collaborating with Osaka group for the ASIC Collaboration with Ikeda-san would be efficient for our R&D
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R&D Schedule
Charge spread /Lorentz angle
WS
Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Jan Feb
Study of radiation damage
Clock v.s. CTI, Damage of full-dep. CCD,etc,
B.G. rejection by cls shape Flavor tagging efficiency, etc.
Tracking efficiency
Machine-time?
R&D of r.o. ASIC
Thin wafer / Support
FPCCD Conceptual design
Deadline for proposal to LNS
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Funding sources TOKUTEI-KOUBO – “T” KIBAN-(C) – “C” GAKUJYUTU-SOSEI – “G” KEK Annual budget – “A”
Basic study of fully depleted CCD C
Simulation study for FPCCD VTX for ILC C
Radiation damage Standard size C, A
Fine Pixel T, G
Electronics A, T
Thin wafer / support structure C
FPCCD conceptual design C, G
Readout ASIC G
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Expected manpowerBasic study of fully depleted CCD Y.S., K.N., all
Simulation study for FPCCD VTX for ILC T.N., PD-A, A.M., PD-B
Radiation damage Standard size Y.S., K.N., PD-B, T.N., PD-A, St-A, and all
Fine Pixel
Electronics K.N.
Thin wafer / support structure Y.S.
FPCCD conceptual design Y.S., PD-B
Readout ASIC PD-A, St-A, K.I.
PD-A: Post-doc at Tohoku (Oct.06~)PD-B: Post-doc at KEK (Oct.06~)St-A: Student at Tohoku
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Summary
We have won satisfactory level of funding for sensor R&D (not enough for all of R&D items of VTX)
We have a lot of things to do We now need manpower
At least 2 post-docs (Tohoku and KEK) by “GAKUJUTSU-SOSEI” grant
We anticipate more post-docs supported by “Postdoctoral fellowships for foreign researchers” of JSPS ( http://www.jsps.go.jp/english/e-fellow/fellow.html )
We also hope many graduate students to join