16/1-13 MENA3100

Probes used for analysis

• Photon• Electron • Neutron

Waves/particles

UiO IFE

Wave length

Monochromatic

Amplitude and phase

Coherence

16/1-13 MENA3100

What to learn about• Imaging/microscopy

– Visible light/Optical– Electron

• SEM• STEM• TEM

• Diffraction– X-rays– Electrons– Neutrons

• Spectroscopy– EDS

• X-rays

– EELS• Electrons

– XPS, AES• Electrons (surface)

• Sample preparation– Mechanical grinding/polishing– Chemical polishing/etching– Ion bombardment– Crunching etc……

Mapping of elements or chemical states of elements.

The same basic theory for allwaves.

Different imaging modes.

Waves and lenses

16/1-13 MENA3100

r1

r2

αr1

r2

Spherical aberration

α

vv - Δv

Chromatic aberration

y-focus

x-focus

y

xAstigmatism

Back focal plane

Object 1. imagef

S1 S2

Thin lens

http://www.physicsclassroom.com/class/refrn/u14l5f.cfm

Probe-specimen interactions

• Wave length dependence– Diffraction

• Z- and structure dependence– Scattering factors

• Orientation dependence

• Energy dependent– Ineleastic scattering/

energy transfere

16/1-10 MENA3100

electron

photon

neutron

Probe dependent

19/1-10 MENA3100

Basic principles, electron probeValence

K

L

M

Electronshell

Characteristic x-ray emitted or Auger electron ejected after relaxation of inner state. Low energy photons (cathodoluminescence)when relaxation of outer stat.

K

L

M

1s2

2s2

2p2

2p43s2

3p2

3p4

3d4

3d6

Auger electron or x-ray

Secondary electron

Electron

16/1-10 MENA3100

Basic principles, x-ray probe

K

L

M

Auger electron

Photo electron

X-ray Valence

K

L

M

Electronshell

Characteristic x-ray emitted or Auger electron ejected after relaxation of inner state. Low energy photons (cathodoluminescence)when relaxation of outer stat.

Secondary x-rays

16/1-13 MENA3100

Probes

• Photon

Visible light – Optical microscopy (OM), Ch. 1

X-ray– X-ray diffraction (XRD), Ch. 2– X-ray photo electron spectroscopy

(XPS), Ch. 7

• Neutron– Neutron diffraction (ND) (IFE)

• Electron– Scanning electron microscopy

(SEM), Ch. 4– Transmission electron microscopy

(TEM), Ch. 3– Electron diffraction (ED), Ch. 3– Electron energy loss spectroscopy

(EELS)– Energy dispersive x-ray

spectroscopy (EDS), Ch. 6– Auger electron spectroscopy

(AES), Ch. 7

16/1-13 MENA3100

Basic principles

Electrons X-rays

E<Eo(EELS)

BSE

SEAE

X-rays (EDS)

AE PE

(XD)X-rays

E=Eo

(XPS)

SE

(SEM)

(TEM and ED)

You will learn about:- the equipment-imaging-diffraction -the probability for different events to happen-energy related effects-element related effects-etc., etc., etc……..