Lecture 19 - Delay-Locked Loops - Electrical & Computer Engineering
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Oscillation Control in CMOS Phase-Locked Loops A Thesis
Presented toThe Academic Faculty
by
Bortecene TerlemezPhD Candidate in School of ECE
11/04/2004
Dr. Martin Brooke, Advisor
Georgia Institute of TechnologySchool of Electrical and Computer Engineering
Microelectronics Research CenterAtlanta, GA 30332-0269
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Outline
PLL history and fundamentals
PLL Architectures
Oscillation control in CMOS charge-pump PLLs
Single-ended control for multi-GHz charge-pump PLLs Design of a low-noise 1.8 GHz charge-pump PLL
Design of a low-noise 5.8 GHz charge-pump PLL
Differential control for multi-GHz charge-pump PLLs
Performance comparison
Pulse-stream coded PLLs
Summary/Conclusions/Contributions
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Brief Phase-Locked Loop (PLL) History 1932: Invention of “coherent communication” (deBellescize) 1943: Horizontal and vertical sweep synchronization in
television (Wendt and Faraday) 1954: Color television (Richman) 1965: PLL on integrated circuit 1970: Classical digital PLL 1972: All-digital PLL PLLs today: in every cell phone, TV, radio, pager, computer, …
Clock and Data Recovery Frequency Synthesis Clock Generation Clock-skew minimization Duty-cycle enhancement
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Phase-Locked Loop
Phase Detector (PD): This is a nonlinear device whose output contains the phase difference between the two oscillating input signals.
Voltage Controlled Oscillator (VCO): This is another nonlinear device which produces an oscillation whose frequency is controlled by a lower frequency input voltage.
Loop Filter (LF or LPF): While this can be omitted, it is always conceptually there since PLLs depend on some sort of low pass filtering in order to function properly
A feedback interconnection: Namely the phase detector takes as its input the reference signal and the output of the VCO. The output of the PD, the phase error, is used as the control voltage for the VCO.
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PLL Architectures
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PLL Architectures – Linear PLL vs Digital PLL
No frequency tracking Input amplitude dependency Nonlinear phase detector gain
No frequency tracking Duty-cycle sensitivity (can
be solved by edge triggered phase detector
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PLL Architectures – All-digital PLL
Lower sensitivity to digital-switching noise
Easier to transfer a design between technologies
Faster lock-in times
Higher complexity Bigger die size No true frequency
synthesis (in general)
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PLL Architectures - Charge Pump PLL
Zero phase error (ideally) Unlimited capture range
(ideally)
Stability: Two poles at the origin Zero in LPF Auxiliary charge pump
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Oscillation Control in Charge Pump PLLs
Charge Pump PLL: contemporary applications PFD and charge pump nonidealitites: 45% of the output phase
jitter1
Phase-Frequency Detector Possible dead zone Possible duty-cycle dependency Possible unbalanced output generation
Charge Pump Possible current asymmetry Possible current leakage
1 V. Kaenel, D. Aebicher, C. Piguet, and E. Dijkstra, “A 320 MHz 1.5mW @ 1.35 V CMOS PLL for microprocessor clock generation,” in Journal of Solid-State Circuits, Vol. 31, No.11, Nov. 1996.
Clock skew in Clock/Data Recovery
Reference spur in Frequency Synthesis
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Phase-Frequency Detector - Behavior
Three-state device PLL capture range
Maximum operating frequency: orthogonal inputs Reset pulse
Too short = dead zone Too wide = VCO control perturbation
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Charge Pump - Behavior
Effective charge pump requirements: Equal charge/discharge current at any CP output voltage Minimal charge-injection and feed-through (due to
switching) at the output node Minimal charge sharing between the output node and any
floating node, i.e. MOS switches at off position
Iup: charging current Idn: discharging current S1, S2: switches
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Single-ended control for multi-GHz charge-pump PLLs
Design of a low-noise 1.8 GHz charge-pump PLL
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0.18μ TSMC CMOS Differential outputs Reset pulse = 0.2ns
Phase-Frequency Detector - Design
Maximum frequency ≈ 600 MHz
Significant power dissipation above 100 MHz
VDD=1.8V
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Single-Ended Charge Pump – Design
No charge sharing No charge injection
Replica Biasing
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Differential VCO with Single-Ended ControlSaturated Gain Stage with Regenerative Elements
Delay Stage : C.H. Park, and B. Kim, “A Low-Noise, 900-MHz VCO in 0.6-m CMOS,” IEEE J. Solid State Circuits, vol. 34, pp.
586-591, May 1999.
Delay control by varying latch strength
Two sets of inputs for multiple-pass architecture
Tuning range control by varying M3 and M4 sizing
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Differential VCO with Single-Ended Control9-Stage Multiple-Pass Loop
Auxiliary loops nested inside main loop Frequency Improvement
Effective stage delay reduced
Noise Improvement Slew rate increased
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Current-mode logic dividers: 1/2 to 1/64 of actual frequency
Current-mode logic buffers
DTOS: Differential to single-ended conversion
Driver chain Turn-off circuitry to
reduce cross-talk
Differential VCO with Single-Ended ControlTesting Issues
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Differential VCO with Single-Ended ControlLayout
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Differential VCO with Single-Ended ControlSimulation vs Measurement
VCO Range Simulation: 1.16 – 1.93 GHz Measurement: 1.10 – 1.86 GHz
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PLL with 9-stage ring VCO
VCO Range (MHz) 1120 - 1860
Lock-in Range (MHz) 124.4 – 128.5
Internal Freq. (MHz) 1180 - 1840
Division Ratio 16
VCO Gain (MHz/V) 770
ICP (μA) 100
Open-Loop Phase Margin
81
Closed-Loop BW (KHz) 625.5
RMS jitter (ps) 1.7
Phase Noise (-dBc/Hz) 116
1.8 GHz Low-Noise PLL Measurement Summary
Off-chip LPF: flexibility in testing
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Single-ended control for multi-GHz charge-pump PLLs
Design of a low-noise charge-pump PLL for maximum frequency
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Differential VCO with Single-Ended Control3-Stage Multiple-Pass Loop
VCO Range Simulation:
5.18 – 6.11 GHz Measurement:
5.35 – 6.11 GHz
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Differential VCO with Single-Ended ControlPhase Noise for the 3-Stage Multiple-Pass Loop
Measurement Simulation: SpectreRF
Power Spectrum at ¼ Output of the 3-Stage Ring
Power Spectrum at 5.79 GHz center frequency
Simulation: -99.5 dBc/Hz @ 1 MHz offset from ~6 GHz central frequency Measurement: -99.4 dBc/Hz @ 1 MHz offset from ~6 GHz central frequency
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5.8 GHz Low-Noise PLL Measurement Summary
PLL with 3-stage ring VCO
VCO Range (MHz) 51620 - 5930
Lock-in Range (MHz) 166 - 182.5
Internal Freq. (MHz) 5310 – 5840
Division Ratio 32
VCO Gain (MHz/V) 793
ICP (μA) 100
Open-Loop Phase Margin
73.4
Closed-Loop BW (KHz) 248.4
RMS jitter (ps) 2.6
Phase Noise (-dBc/Hz) 110
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Differential control for multi-GHz charge-pump PLLs
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Differential Charge Pump – Design
Output linear range (0.315V, 1.390V)
Differential outputs: FST and SLW
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Charge Pump – Common-Mode Feedback (CMFB)
Sampled data CMFB CMFB transconductance gain: 40µA/V CMFB bandwidth: 3KHz CMFB phase-margin: 76º
100µA
Capacitors DC voltage stability
Diodes No effect on operation Discharging metal
during the etching process
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Charge Pump - Layout
150 x 130 µm2
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Charge Pump – Post Layout Simulation
High output resistance No charge sharing Decreased charge injection
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Differentially Controlled LC Oscillator - I
Differential fine tuning: Accumulation mode MOS varactors
Digital coarse tuning: MiM capacitors Three-turn inductor
2.4 nH, 1.7mm, Q~9.5 Thick top metal Frequency goal: 2.5GHz
Accumulation mode MOS varactor
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1/16 outputfo = 157.8 MHzPN@100KHz = -83.8 dBc/Hz
Differentially Controlled LC Oscillator - II
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PLL – Test Setup
Stable nested loops CMFB BW ≈3KHz << Loop BW
≈200KHz << Reference ≈150 MHz
2.5 GHz PLL with LC VCO
Output lock-in range (MHz) 2402-2518
Input lock-in range (MHz) 150.1-157.4
Division ratio 16
C1 (nF) 10
C2 (pF) 50
C3 (pF) 50
R1 (Ω) 680
R2 (Ω) 1500
Phase margin 54.92
PLL bandwidth (kHz) 194.36
Output RMS jitter (ps) 3.5
Phase noise @ 1MHz offset (-dBc/Hz) 123
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PLL - Measurement
Phase lock @ 2.5 GHz internal frequency
Phase Noise @ 1MHz offset from 2.5 GHz: as low as –123 dBc/Hz
Reference ½ Output
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Prototype Chip in 0.18μm TSMC CMOS
Analog Layout Techniques Common centroid topology Stacked parts with dummy components Guard rings
Routing Matched and short busses Decoupled parallel analog and digital lines Complimentary digital signals crossing
analog buses
Power Analog and digital supplies merging as
close to the pad as possible Wide supply busses at the top metal
Pads Electrostatic discharge protection within
the custom designed analog I/O pads
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PLL Performance Comparison
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Single-Ended vs Differential Control
ttVAK
tA mFRmFRm
mVCOFR )cos()cos(
2cos
)sincos()cos()( tV
KtAdtVKtAtV mm
mVCOFR
t
ctrlVCOFRout
For a given frequency range
Vdd KVCO
Increased KVCO causes a higher sensitivity to the control line perturbation
For Vctrl = Vmcosωmt
Differential Control Line Doubles Dynamic Range to drop the spur
level by 50% Common mode rejection lowers the spur
levels
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PLL Measurement SummaryPLL at 1.8 GHz PLL at 5.8 GHz PLL at 2.5 GHz
Control path single-ended single-ended differential
VCO type 9-stage multi-pass ring 3-stage multi-pass ring LC
VCO range (MHz) 1120-1860 5160-5930 2392-2525
Output lock-in range (MHz)
1180-1840 5310-5840 2402-2518
Input lock-in range (MHz) 74-115 166-182.5 150.1-157.4
VCO gain (MHz/V) 770 793 68
Division ratio 16 32 16
Charge-pump gain (μA/rad)
11.14 11.14 11.14
C1 (nF) 10 10 10
C2 (pF) 50 50 50
C3 (pF) 50 50 50
R1 (Ω) 680 680 680
R2 (Ω) 1500 1500 1500
Phase margin 68.66 73.38 54.92
PLL bandwidth (kHz) 529.58 248.37 194.36
Output RMS jitter (ps) 1.7 2.6 3.5
Phase noise @ 1MHz offset (-dBc/Hz)
116 110 123
Power (mW) 112 50 5
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PLL Performance Comparison - I
Maximum frequencies of published PLLs Phase noise versus maximum frequency
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PLL Performance Comparison - II
Reported output jitter vs measured jitter Reported normalized jitter vs measured jitter
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PLL Type Oscillation control pathRMS phase jitter (ps)
clean supply voltage noisy supply voltage
1.8 GHz single-ended 1.7 60
5.8 GHz single-ended 2.6 50
2.5 GHz differential 3.5 20
Clean vs Noisy Supply Voltage
Increase in jitter Single-ended: 20-35
times Differential: 6 times
Periodic cycle-to-cycle jitter in noisy environment: significance of the
control line noise
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Control Line Noise Reduction
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PLL Phase Noise Improvement - I
↑ Temperature → ↑ Leakage ≡ Loss of lock at low frequencies Solution: Multiple reset pulses in lock: up’, dn’ Solution: Adaptive multiple pulses in lock: up’’, dn’’
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PLL Phase Noise Improvement - II
Best case phase skew for ICP = 70 µA
ILEAKAGE = 0.01 ICP
ICP modulation by CMFB: up to 30µA
Static Phase Error Improvement
leak
CMFBreset
offset
offset
I
I
T
tM
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M = 8 ~6dB improved
output spur level
M = 32 ~20dB improved
output spur level
PLL Phase Noise Improvement - III
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Oscillation Control Summary in Charge Pump PLL
Periodical disturbance of the VCO control line Process, voltage, and temperature (PVT) variations of the LPF components Large area consumption by LPF components Limited acquisition time Analog control drawbacks determined by CMOS trends
Reduced linear range (decreasing supply voltage) Significant leakage and weak-inversion currents (decreasing feature size) Power supply and substrate noise (increasing integrity)
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Digital Control and Analog Oscillator
Immune to current leakage Immune to supply/substrate noise Tolerant to process variations Semi-custom loop design Monitoring of the internal loop states Quantization noise introduced by the DAC
Precision in oscillation control
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Pulse-Stream Coded Phase-Locked Loop
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Pulse-Stream Coded Phase-Locked Loop
A novel method to render digital control:
Phase/frequency comparison coded by pulse trains
REF
VCO
DN
UPVCO Leads In Phase VCO Lags
Dual Pulse-Stream PFD: Single Pulse-Stream PFD:
REF
VCO
DIR
MOD
VCO Leads In Phase VCO Lags
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A Simplified Pulse-Stream Coded PLL Prototype
Single Pulse-Stream PFD: 0.18μ TSMC CMOS Highly parameterized for testing
basic characteristics 3-stage current-controlled oscillator
Active load differential pair stages
4-bit shift register
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Control 1: pulse width (1-1.6ns) Control 2,3: delay (0.2-1.5ns) Control 4: DAC step current Control 5: CCO bias (100-200 MHz)
A Simplified Pulse-Stream Coded PLL Prototype
Control Signals:
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Control line characteristic Frequency modulated reference VCO lagging= current increase VCO leading= current decrease
A Simplified Pulse-Stream Coded PLL Prototype
Slow frequency tracking Equally weighted control
word
No phase lock due to very low resolution Low number of bits Equally weighted control
word
Simplified psc-PLL:
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Next Generation Pulse-Stream Coded PLL
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Monotonic binarily-weighted DAC and Counter Faster capture Higher resolution Larger area
Next Generation Pulse-Stream Coded PLL
Quantization noise:
0 200 400 600 800 1000 12000
1
2
3
4
5
6
7
8x 10
-11
CCO Control Current (uA)
Qua
ntiz
atio
n no
ise
(s)
10-bit
9-bit
8-bit
7-bit
CCO gain= 100 KHz/μA Tuning range= 100 MHz
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Single-Pulse Train PFD - Behavior
MODIFY output
Overall (MODIFY + DIRECTION) Response
Discrete Characteristic
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Single-Pulse Train PFD - Implementation
Gated oscillator
Pulldown strength Low: big dead zone High: noise sensitive
operation Low dead zone (80ps) High power dissipation in lock
(1.4mW)
Dead zone is a random variable
tdead-zone,min < tdz < tdead-zone,min + Tclk (1-duty cycle)
Low dead zone when output negative edge is utilized (70ps)
Low power dissipation in lock (20μW)
sptPFD1 sptPFD2 sptPFD3
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Truncated UP/DOWN Counter - Implementation
Counter Length (bits) Minimum TCLK (ps)
4 570
5 700
8 1200
Manchester-like carry look ahead adder
Worst case propagation delay for 8-bit UP/DN counter
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DAC and CCO - Implementation
pealtopeakJitter
N
ffn )
11(log
maxmin2
After continuous time VCO characterization, number of bits can be determined by:
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Pulse-Stream Coded PLL - Stability
1)( zT
mzH sptPFD
1, 1)(
z
TzH CCODAC
11
1
1)()(
z
zFKzzH loopopen
T
TmNK
F(z): digital filter
m: number of short pulses that would fit within a
reference period T
Root-locus plot for F(z) = 1/ (1 - z-1) Root-locus plot for F(z) = (1 – 0.5z-1)/ (1 - z-1)
UNSTABLE 8.2T
TmNSTABLE FOR
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Pulse-Stream Coded PLL – Control Line at Lock
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PLL Design Procedure
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Conclusions
Basics of PLL operation were shown in a unique control centric flow Single-ended CPPLLs with ring VCOs were designed and tested for low-noise
multi-GHz applications that previously required CPPLLs with LC-VCOs Design of a low-noise 1.8 GHz CPPLL Design of a low-noise 5.8 GHz CPPLL
An exceptionally performing differential CPPLL was implemented with a unique charge pump and a unique CMFB scheme
Physical design considerations were summarized for low-jitter PLLs The significance of the control line noise at lower frequencies was addressed
along with possible solutions A novel method for digitizing the control line was described: Pulse-Stream
Coded PLL
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Future Research
Limits of a single-ended PLL design when used along with a voltage regulator
The differential control with the unique CMFB scheme can be utilized to drive higher-Q oscillators to note top-notch measurements
The control line noise reduction techniques can be further studied along with various test structures
Pulse-stream coded PLLs can be considered in dual-loop PLLs as coarse-tuning blocks
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Questions