1 Electromagnetic waves: Reflection, Transmission and Interference Monday October 28, 2002.
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Transcript of 1 Electromagnetic waves: Reflection, Transmission and Interference Monday October 28, 2002.
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Electromagnetic waves: Reflection, Transmission and Interference
Monday October 28, 2002
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Amplitude Transmission & Reflection
022
21
1
21
212
nn
n
vv
v
12
1212 nn
nn
For For normalnormal incidence incidence
Amplitude Amplitude reflectionreflection Amplitude Amplitude transmissiontransmission
Suppose these are plane wavesSuppose these are plane waves
itxkioR
txkioT
txkio eeEgeEfeEf 121121
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3
Intensity reflection
12
1212 nn
nnee
E
E iio
oR
Amplitude reflection co-efficientAmplitude reflection co-efficient
and intensity reflectionand intensity reflection
2
12
12212
2
11
2
11
12
2121
nn
nn
I
I
Ev
EvR
o
R
o
oR
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4
Intensity transmission
2
1
2
2
11
2
22
12
2121
o
oT
o
oT
o
T
E
E
n
n
Ev
Ev
I
IT
Intensity transmissionIntensity transmission
and in generaland in general
21122
121
212
n
nT
R + T = 1R + T = 1
(conservation of energy)(conservation of energy)
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Two-source interference
1r
What is the nature of the superposition of radiation What is the nature of the superposition of radiation from two from two coherentcoherent sources. The classic example of sources. The classic example of this phenomenon is this phenomenon is Young’s Double Slit ExperimentYoung’s Double Slit Experiment
aa
SS11
SS22
xx
LL
Plane wave (Plane wave ())
2r
PP
yy
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Young’s Double slit experiment
MonochromaticMonochromatic, , planeplane wave wave Incident on slits (or pin hole), SIncident on slits (or pin hole), S11, S, S22
separated by distance separated by distance aa (centre to centre) (centre to centre) Observed on screen Observed on screen L >> a L >> a ((LL- meters, - meters, aa – –
mm)mm) Two sources (STwo sources (S11 and S and S22) are ) are coherentcoherent and and in in
phasephase (since same wave front produces both (since same wave front produces both as all times)as all times)
Assume slits are very narrow (width Assume slits are very narrow (width b ~ b ~ ) ) so radiation from each slit alone produces so radiation from each slit alone produces
uniformuniform illumination across the screen illumination across the screen
AssumptionsAssumptions
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Young’s double slit experiment
slits at x = 0 The fields at S1 and S2 are
Assume that the slits might have different width Assume that the slits might have different width and therefore and therefore EEo1o1 E Eo2o2
tio
tio eEEeEE 2211
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Young’s double slit experiment
What are the corresponding E-fields at P?What are the corresponding E-fields at P?
trkioP
trkioP e
r
EEe
r
EE 21
2
22
1
11
Since Since L >> a (L >> a ( small) small) we can put we can put r = |rr = |r11| = |r| = |r22||
We can also put We can also put |k|k11| = |k| = |k22| = 2| = 2// ( (monochromatic sourcemonochromatic source))
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Young’s Double slit experiment
PPP EEE 21
22
2
1oPEvEvI PP
The total amplitude at PThe total amplitude at P
Intensity at PIntensity at P
**22
**21
*2
122121
21
PPPPPP
PP
P
EEEEEE
EEEE
EEE
PP
PP
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Interference Effects
Are represented by the last two terms
If the fields are perpendicular
then,
and,
**
1221 PPPPEEEE
222
21 PPPEEE
PPPIII
21
222
21 PPPEvEvEv
In the absence of interference, the total intensity is a simple sumIn the absence of interference, the total intensity is a simple sum
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Interference effects
Interference requires at least parallel components of E1P and E2P
We will assume the two sources are polarized parallel to one another (i.e.
PPPPPPEEEEEE
212121cos
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12
Interference terms
12
2
221
*1 ____________________________
rrkioo
P
er
EE
EEP
12
21
221
* ____________________________
rrkioo er
EE
EEPP
12221
**
cos2
_________________2121
r
EE
EEEE
oo
PPPP
1212 rrk
where,where,
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Intensity – Young’s double slit diffraction
122121 cos2 PPPPP IIIII
1212 rrk
PhasePhase difference of beams occurs because of a difference of beams occurs because of a pathpath difference difference!!
12222 cos2
2121
PoPoPoPooPEEEEE
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Young’s Double slit diffraction
I1P = intensity of source 1 (S1) alone
I2P = intensity of source 2 (S2) alone
Thus IP can be greater or less than I1+I2 depending on the values of 2 - 1
In Young’s experiment r1 ~|| r2 ~|| k Hence
Thus r2 – r1 = a sin
122121 cos2 PPPPP IIIII
2112 rrkrkrk
rr22-r-r11
aa
rr11
rr22
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15
Intensity maxima and minima
m2...4,2,012
2
12...3,12 m
am
2
1sin
Maxima for,Maxima for,
Minima for,Minima for,
...2,1,0sin2sin ma
mormka
If IIf I1P1P=I=I2P2P=I=Ioo
If IIf I1P1P=I=I2P2P=I=Ioo 0cos2 122121 PPPPMIN IIIII
oPPPPMAX IIIIII 4cos2 122121
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Fringe Visibility or Fringe Contrast
MINMAX
MINMAX
II
IIV
To measure the contrast or visibility of these fringes, one To measure the contrast or visibility of these fringes, one may define a useful quantity, the fringe visibility:may define a useful quantity, the fringe visibility:
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Co-ordinates on screen
Use sin ≈ tan = y/L Then
These results are seen in the following Interference pattern
amLy
amLy
2
1min
max
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Phasor Representation of wave addition
Phasor representation of a wave E.g. E = Eosint is represented as a vector of
magnitude Eo, making an angle =t with respect to the y-axis
Projection onto y-axis for sine and x-axis for cosine
Now write,
tEE
as
trkEE
o
o
sin
,
sin
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Phasors
Imagine disturbance given in the form
222
111
sin
sin
tEE
tEE
Po
Po
==φφ22--φφ11
φφ11
φφ22
Carry out addition at t=0Carry out addition at t=0
1212
2121
212
22
12
,
cos2
,
180cos2
rrkwhere
IIIII
or
EEEEE PoPoPoPo
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Other forms of two-source interference
1r
Lloyd’s mirrorLloyd’s mirror
screenscreenSS
S’S’
2r
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Other forms of two source interference
Fresnel BiprismFresnel Biprism
ss22
SS11
SS
dd ss
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Other sources of two source interference
nn
Altering path length for rAltering path length for r22 rr11
rr22
With dielectric – thickness dWith dielectric – thickness d
krkr22 = k = kDDd + kd + koo(r(r22-d)-d)
= nk= nkood+ ko(rd+ ko(r22-d)-d)
= k= koorr22 + k + koo(n-1)d(n-1)d
Thus change in path length = k(n-1)dThus change in path length = k(n-1)d
Equivalent to writing, Equivalent to writing, 22 = = 11 + k + koo(n-1)d(n-1)d
Then Then = kr = kr22 – k – koorr1 1 = k= koo(r(r22-r-r11) + k) + koo(n-1)d(n-1)d
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Incidence at an angle
ii
a sin a sin
a sin a sin ii
1r
2r
Before slitsBefore slitsDifference in path lengthDifference in path length
After slitsAfter slitsDifference in path lengthDifference in path length
= = a sin a sin II in r in r11
= = a sin a sin in r in r22
Now k(rNow k(r22-r-r11) = - k a sin ) = - k a sin + k a sin + k a sin ii
Thus Thus = ka (sin = ka (sin - sin - sinii))
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Reflection from dielectric layer
Assume phase of wave at O (x=0, t=0) is 0
Amplitude reflection co-efficient (n1n2) = 12
(n2 n1) ’=21
Amplitude transmission co-efficient (n1n2) = 12
(n2 n1) ’= 21
Path O to O’ introduces a phase change
nn22nn11 nn11
AA
O’O’
OO
ttx = 0x = 0 x = tx = t
A’A’’’
’’
'cos
2
222
tSk
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Reflection from a dielectric layer
At O: Incident amplitude E = Eoe-iωt
Reflected amplitude ER = Eoe-iωt
At O’: Reflected amplitude Transmitted amplitude
At A: Transmitted amplitude Reflected amplitude
tSkioeE
22' tSki
oeE 22'
tSkioeE
222'' tSki
oeE 222''
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Reflection from a dielectric layer
tSkioA eEE 11''
AA
A’A’
z = 2t tan z = 2t tan ’’
and and ΔΔSS11= z sin = z sin = 2t tan = 2t tan ’ sin ’ sin
•At A’
96.0'2.0'12
12
andnn
nn
Since,Since,
The reflected intensities ~ 0.04IThe reflected intensities ~ 0.04Ioo and both beams (A,A’) will have and both beams (A,A’) will have
almost the same intensity.almost the same intensity.Next beam, however, will have ~ |Next beam, however, will have ~ |||33EEoo which is very small which is very small
Thus assume interference at Thus assume interference at , and need only consider the two , and need only consider the two beam problem.beam problem.
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Transmission through a dielectric layer
At O’: Amplitude ~ ’Eo ~ 0.96 Eo
At O”: Amplitude ~ ’(’)2Eo ~ 0.04 Eo
Thus amplitude at O” is very small
O’O’
O”O”